In circuit characterization of common-mode choke 2007

Digital Sampl ing Oscil l oscope•/scopes1•Digital Sampling Oscilloscope TDS8000BDigital Sampling OscilloscopeTDS8000BOscilloscopes-Sampling Oscilloscopes •3 The available optical modules providecomplete optical test solutions for bothtelecom (155Mb/s to 43Gb/s) and data-com (FibreChannel,InfiniBand and GigabitEthernet) applications as well as general-purpose optical signal testing.Unmatched TDR CapabilitiesWith the 80E04 TDR Sampling Module,the TDS8000B offers unmatched TDRperformance on up to eight channels simul-taneously.Each channel has an independentpolarity selectable step-generator offeringunmatched 35ps reflected rise time*2.The TDS8000B provides the only truedifferential TDR system available today.Automatic,transparent correction for varia-tions in step amplitude and baseline offsetguarantee accuracy and repeatability ofimpedance measurements.8000 Series SamplingOscilloscope PlatformThe TDS8000B is built on Tektronix’sampling oscilloscope platform thatcombines familiar MS Windows-basedPC technologies with world-class waveformacquisition technology.This platform provides a wide array of stan-dard instrumentation and communicationsinterfaces (such as GPIB,parallel printerport,RS-232-C and USB serial ports and anEthernet LAN connection).In addition,theplatform includes several mass storagedevices (floppy disk,removable hard driveand CD-ROM).The TDS8000B is equipped with a large,full-color display that helps you discriminatewaveform details.Color-grading of wave-form data adds a third dimension – sampledensity – to your signal acquisitionsand analysis.*2The observed rise time of a reflection from a short circuit.Gated triggering,a feature that allows theexclusion of selected time periods frombeing measured,is offered as an option.Because the system supports an openMS Windows environment,new levels ofdata analysis can be done directly on theinstrument using commercially availablesoftware packages.Additionally,TekVISA TM,a standard softwarefeature,allows the instrument to be placedunder the control of software applications(bView,LabWindows,Visual Basic,Microsoft Excel,C,etc.) running on theinstrument,or on external PC workstationsnetwork connected to the instrument,with-out the need for a GPIB hardware interface.Plug and play drivers for LabView and otherprograms are also supplied.8000 SeriesSampling OscilloscopeOptical Modules80C01 Multi-rate Telecom SamplingModule–The 80C01 module supportswaveform conformance testing of long-wavelength (1100 to 1650nm) signals at622,2488Mb/s and 9.953Gb/s as well asgeneral-purpose testing with up to 20GHzoptical bandwidth.With its clock recoveryoption,the 80C01 provides testingsolutions for 622 and 2488Mb/stelecom applications.80C02 High-performance TelecomSampling Module –The 80C02 moduleis optimized for testing of long-wavelength(1100 to 1650nm) signals at 9.953Gb/s(SONET OC-192/SDH STM-64).With itshigh optical bandwidth of 30GHz (typical),it is also well-suited for general-purposehigh-performance optical component testing.The 80C02 can be optionally configuredwith clock recovery that supports 9.953Gb/stelecom standards.80C07B Multi-rate,Datacom & TelecomOptical Sampling Module–The 80C07Bmodule is a broad wavelength (700 to1650 nm) multi-rate optical sampling moduleoptimized for testing datacom/telecomsignals from 155 to 2500 Mb/s.With itsamplified O/E converter design,this moduleprovides excellent signal-to-noise perform-ance,allowing users to examine low-poweroptical signals.The 80C07B can be optionallyconfigured with clock recovery that supports155,622,1063,1250,2125,2488,2500and 2666 Mb/s rates.80C08C Multi-rate,Datacom & TelecomOptical Sampling Module with 10 GbEForward Error Correction–The 80C08Cmodule is a broad wavelength (700 to1650 nm) multi-rate optical sampling moduleproviding datacom rate testing for 10GbEapplications at 9.953,10.3125,11.0957Gb/s and 10G FibreChannel applications at10.51875 Gb/s.The 80C08C also providestelecom rate testing at 9.953,10.664,and10.709 Gb/s.With its amplified O/E converterdesign,this module provides excellent signal-to-noise performance and high opticalsensitivity,allowing users to examinelow-power level optical signals.The 80C08Ccan be optionally configured with clockrecovery options that can support any stan-dard or user defined rate in the continuousrange from 9.8 to 12.6 Gb/s.80C10 65GHz 40Gbps Optical SamplingModule with 43Gbps ITU-T G.709Forward Error Correction–The 80C10module provides integrated and selectablereference receiver filtering,enabling confor-mance testing at either 1310nm or1550nm for 39.813Gbps (OC-768/STM-256)and 43.018Gbps (43Gbps ITU-T G.709FEC)rates.In addition to the filter rates,the usermay also choose selectable bandwidths of30GHz or 65GHz for optimal noise vs.bandwidth performance for accurate signalcharacterization.•/scopes4Digital Sampling OscilloscopeTDS8000B80C11 Multi-rate,Datacom & Telecom Optical Sampling Module –The 80C11module is a long wavelength (1100 to 1650nm) multi-rate optical sampling module optimized for testing 10 Gb/s datacom and telecom standard rates at 9.953,10.3125,10.51875,10.664,10.709,and 11.0957Gb/s.With its high optical bandwidth of up to 30 GHz (typical) it is well-suited for general purpose high-performance 10 Gb/s optical component testing.The 80C11 can be optionally configured with clock recovery options that can support any standard or user defined rate in the continuous range from 9.8 to 12.6 Gb/s.80C12 Multi-rate,Datacom & Telecom Optical Sampling Module –The 80C012module is a broad wavelength (700 to 1650nm) multi-rate optical sampling module providing multi-rate telecom and datacom testing.This highly flexible module can be configured to support either lower data rate applications (1 to 4 Gb/s) or a wide variety of 10Gb/s applications.The low data rate applications include:1,2,and 4 Gb/s FibreChannel and “by 4”wavelength divi-sion multiplex standards such as 10GBase-X4 and 4-Lane 10 Gb/s FibreChannel.The supported 10Gb/s application includes both datacom and telecom application.The sup-ported 10Gb/s datacom applications include 10GbE applications at 9.953,10.3125,11.0957 Gb/s and 10G Fibre Channel applications at 10.51875 Gb/s.The 80C12also provides telecom rate testing at 9.953,10.664,and 10.709 Gb/s.With its amplified O/E converter design,this module provides excellent signal-to-noise performance and high optical sensitivity,allowing users to examine low-power level optical signals.Clock recovery for the 80C12 is provided via the 80A05 (sold separately).8000 Series Sampling Oscilloscope Electrical Modules80E01 Sampling Module –The 80E01 is a single-channel,50GHz bandwidth sam-pling module.The 80E01 has a measured bandwidth of 50GHz or more and a calcu-lated rise time of 7.0ps or less.Displayed noise is typically 1.8mV RMS .The front-panel connector is female 2.4mm and an adapter is provided (2.4mm male to 2.92mm female) to maintain compatibility with SMA connector systems.80E02 Low-noise Sampling Module –The 80E02 is a dual-channel,12.5GHz sampling module specifically designed for low-noise measurements in digital commu-nications and device characterization appli-cations.It provides an acquisition rise time of 28ps and typically 400µV RMS of displayed noise.The 80E02 is the ideal instrument for low-noise mon applications for the 80E02 are capturing and displaying switching characteristics of high-speed communications circuits,making accurate statistical measurements of signal noise and signal timing jitter or obtaining stable timing measurements of fast digital ICs.80E03 Sampling Module –The 80E03 is a dual-channel,20GHz sampling module.This sampling module provides an acquisi-tion rise time of 17.5ps.80E04 TDR Sampling Module –The 80E04 is a dual-channel,20GHz sampling module with TDR capability.This sampling module provides an acquisition rise time of 17.5ps,with a typical 20GHz equivalent bandwidth.The TDR feature provides high resolution with true differential capability and fast 35ps reflected rise time of the TDR slope.80E06 70+GHz Sampling Module –The 80E06 is a single channel,70+GHz (typical bandwidth) sampling module with 5.0ps calculated rise time.Typical RMS noise is 1.8mV.This sampling module provides a 1.85mm (Type V) front-panel connector and a precision adapter to 2.92mm with a 50 termination.1meter or 2meter length Extender Cables can be ordered for remote operation of the sampling module from the sampling oscilloscope mainframe.80A05 Electrical Clock Recovery Module –The 80A05 enables clock recovery for elec-trical signals,as well as internal triggering on the recovered clock.The module recovers clocks from serial data streams for all of the most common electrical standards in the 50 Mb/s to 4.26 Gb/s range.Option 10G adds support for standard rates up to 12.6 Gb/s.The module accepts either single-ended or differential signals at its input,providing both single-ended and differential clock recovery.This module also serves as the clock recovery module for the 80C12.Oscilloscopes-Sampling Oscilloscopes •5Digital Sampling OscilloscopeTDS8000BCharacteristicsSignal AcquisitionAcquisition Modes – Sample (normal),envelope and average.Number of Sampling Modules Accommodated – Up to four,dual-channel electrical and two,single-channel optical sampling modules.Number of Simultaneously Acquired Inputs – Eight channels maximum (eight electrical or two optical and six electrical).Vertical SystemsRise Time/Bandwidth – Determined by the sampling modules used.Vertical Resolution – 14 bits over the sampling modules’ dynamic range.Horizontal SystemMain and Magnification View Timebases – 1ps/div to 5ms/div in 1-2-5 sequence or 1ps increments.Maximum Trigger Rate – 200kHz.Typical Acquisition Rate – 150Ksamples/sec.per channel.Time Interval Accuracy –Horizontal scale <21ps/div:1ps + 1% of interval.Horizontal scale ≥21ps/div:8ps +0.1% of interval (short-term optimized mode).8ps + 0.01% of interval (locked to 10MHz mode).Horizontal Deskew Range:–500ps to +100ns on any individual channel in 1ps increments.Record Length – 20,50,100,250,500,1000,2000 or 4000 samples.Magnification Views –In addition to the main timebase,the TDS8000B supports two magnification views.These magnifica-tions are independently acquired using separate timebase settings.Trigger SystemTrigger Sources – External direct trigger.External pre-scaled trigger.Internal clock trigger:internally connected to direct trigger.Clock recovery triggers (from optical sampling modules):internally connected to pre-scaled trigger.Trigger Sensitivity – External direct trigger input:50mV,DC to 4GHz (typical).100mV,DC to 3GHz (guaranteed).Pre-scaled trigger input:800mV,2 to 3GHz (guaranteed).600mV,3 to 10GHz (guaranteed).1000mV,10 to 12.5GHz (typical).Jitter –Short-term jitter optimized mode:≤0.8ps RMS +5ppm of position (typical).≤1.2ps RMS +10ppm of position (max.).Locked to 10MHz reference:1.6ps RMS +0.01ppm of position (typical).≤2.5ps RMS + 0.04ppm of position (max.).Internal Clock – Adjustable from 25 to 200kHz (drives TDR,internal clock output and calibrator).Trigger Level Range – ±1.0V.Trigger Input Range – ±1.5V.Trigger Holdoff – Adjustable 5 µs to 100ms in 2ns increments.External Trigger Gate (optional)– TTL logic 1enables acquisition,a TTL logic 0 disables acquisi-tion,maximum non-destruct input level ±5V.Display FeaturesTouch Screen Display – 10.4in.diagonal,color.Colors – 16,777,216 (24 bits).Video Resolution – 640 horizontal by 480 vertical displayed pixels.Math/Measurement System Measurements –The TDS8000B supports up to eight simultaneous measurements,updated three times per second with optional display of per measurement statistics (min,max,mean and standard deviation).Measurement Set –Automated measurements include RZ,NRZ,and Pulse Signal types and the following:Amplitude Measurements High,Low,Amplitude,Max,Mid,Min,+Width,Eye Height,Eye Opening Factor,Pulse Symmetry,Peak-to-Peak,Pk-Pk,+Overshoot,–Overshoot,Mean,+Duty Cycle,Cycle Mean,RMS,Cycle RMS,AC RMS,Gain,Extinction Ratio (Ratio,%,dB),Suppression Ratio (Ratio,%,dB),Peak to Peak Noise,RMS Noise,Q-Factor,SNR,Average Optical Power,(dBm,watts),Phase,Optical Modulation Amplitude.Timing Measurements Rise,Fall,Period,Bit Rate,Bit Time,Frequency,Crossing (%,Level,Time),+Cross,–Cross,Jitter (peak-to-peak,RMS),Eye Width,+Width,–Width,Burst Width,+Duty Cycle,–Duty Cycle,Duty Cycle Distortion,Delay,Phase.Area Measurements Area,Cycle Area.Cursors – Dot,vertical bar and horizontal bar cursors.Waveform Processing –Up to eight math waveforms can be defined and dis-played using the following math functions:Add,Subtract,Multiply,Divide,Average,Differentiate,Exponentiate,Integrate,Natural Log,Log,Magnitude,Min,Max,Square Root and Filter.In addition,measurement values can be utilized as scalars in math waveform definitions.TDR System (TDS8000B with 80E04 Electrical Module)TDR Channels – 2 per 80E04.TDR Amplitude – 250mV (polarity of either step may be inverted).TDR System Rise Time – <35ps.Time Coincidence Between TDR Steps – <1ps.Source Resistance – 50 ±0.5Ω.Typical Aberrations (at +250mV amplitude)– ±3% or less over zone 10ns to 20ps before step transition.+10%,–5% or less,for first 400ps following step transition.±3% or less over zone 400ps to 5ns following step transition.±1% or less over zone 5ns to 100ns following step transition.±0.5% after 100 ns following step transition.Power RequirementsLine Voltage and Frequency – 100 to 240VAC ±10% 50/60Hz.115VAC ±10% 400Hz.EnvironmentalTemperature –Operating:+10ºC to +40ºC.Nonoperating:–22ºC to +60ºC.Relative Humidity –Operating:Floppy disk and CD ROM not installed:20% to 80% at or below 40ºC (upper limit de-rates to 45% relative humidity at 40ºC).Nonoperating:5% to 90% at or below 60ºC (upper limit de-rates to 20% relative humidity at +60ºC).Altitude –Operating:3048m (10,000ft.).Nonoperating:12190m (40,000ft.).Safety – UL 3111-1,CSA-22.2 No.1010.1,EN 61010-1.Physical Characteristics for Optical Sampling ModulesDimensions Weight (mm/inches)(kg/lb)•/scopes6Digital Sampling OscilloscopeTDS8000BApplication TypeStandard and Supported Number of EffectiveCalibrated WavelengthsOscilloscopes-Sampling Oscilloscopes •7Digital Sampling OscilloscopeTDS8000B•/scopes8Digital Sampling OscilloscopeTDS8000BOscilloscopes-Sampling Oscilloscopes •9Digital Sampling OscilloscopeTDS8000BDimensions (mm/inches)Weight (kg/lb)Application TypeChannelsInput ImpedanceChannel Input Bandwidth*3*Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.*Rise time is calculated from the formula Rise time = 0.35/Bandwidth; bandwidth is calculated from the formula Bandwidth = 0.35/Rise time.Rise Time Maximum InputVertical Number *Rise time is calculated from the formula Rise time = 0.35/Bandwidth; bandwidth is calculated from the formula Bandwidth = 0.35/Rise time.•/scopes10Digital Sampling OscilloscopeTDS8000BVertical SensitivityDC Vertical Voltage Typical Step Response Aberrations*5RMS Noise*5RangeAccuracy, Single Point,Within ±2ºC of*Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.6*Values shown are warranted unless printed in an italic typeface which represents a non-warranted characteristic value that the instrument will typically perform to.Oscilloscopes-Sampling Oscilloscopes •11Digital Sampling OscilloscopeTDS8000BDigital Sampling OscilloscopeTDS8000BOur most up-to-date product information is available at:Copyright © 2004,Tektronix,Inc.All rights reserved.Tektronix products are coveredby U.S.and foreign patents,issued and pend rmation in this publicationsupersedes that in all previously published material.Specification and price changeprivileges reserved.TEKTRONIX and TEK are registered trademarks of Tektronix,Inc.All other trade names referenced are the service marks,trademarks or regis-tered trademarks of their respective companies.01/04 HB/WWW85W-13553-9Contact Tektronix:ASEAN / Australasia / Pakistan (65) 6356 3900Austria +43 2236 8092 262Belgium+32 (2) 715 89 70Brazil & South America55 (11) 3741-8360Canada1 (800) 661-5625Central Europe & Greece+43 2236 8092 301Denmark+45 44 850 700Finland+358 (9) 4783 400France & North Africa+33 (0) 1 69 86 80 34Germany +49 (221) 94 77 400Hong Kong(852) 2585-6688India(91) 80-2275577Italy+39 (02) 25086 1Japan81 (3) 6714-3010Mexico,Central America & Caribbean52 (55) 56666-333The Netherlands+31 (0) 23 569 5555Norway+47 22 07 07 00People’s Republic of China86 (10) 6235 1230Poland+48 (0) 22 521 53 40Republic of Korea82 (2) 528-5299Russia,CIS& The Baltics+358 (9) 4783 400South Africa+27 11 254 8360Spain +34 (91) 372 6055Sweden+46 8 477 6503/4Taiwan886 (2) 2722-9622United Kingdom & Eire+44 (0) 1344 392400USA1 (800) 426-2200USA(Export Sales) 1 (503) 627-1916For other areas contact Tektronix,Inc.at:1 (503) 627-7111Updated 23 December 2003 Oscilloscopes-Sampling Oscilloscopes •/scopes12。

蒸镀英文书籍Steaming Plating: A Comprehensive GuideIntroduction:Steam plating, also known as vapor deposition or steam plating, is a widely used industrial process for applying a thin layer of metallic coating onto various surfaces. This technique offers excellent adhesion, uniformity, and durability, making it suitable for a wide range of applications such as automotive parts, electronic devices, and even jewelry. In this book, we will explore the principles, processes, and applications of steam plating, providing a comprehensive guide for both beginners and professionals in the field.Chapter 1: Fundamentals of Steam Plating- Introduction to steam plating- Brief history and evolution of steam plating- Types of steam plating processes: physical vapor deposition (PVD) and chemical vapor deposition (CVD)- The importance of substrate preparation and cleaning- Overview of different steam plating methods: evaporation, sputtering, and ion plating- Factors influencing coating quality and thicknessChapter 2: Steam Plating Techniques- Principles of steam plating equipment: vacuum systems, pumps, and deposition sources- Comparison of different steam plating techniques: thermal evaporation, electron beam evaporation, magnetron sputtering, and arc vapor deposition- Step-by-step guide for conducting a steam plating process- Troubleshooting common issues in steam plating- Safety precautions and guidelines for working with steam plating equipmentChapter 3: Material Selection for Steam Plating- Overview of commonly used steam plating materials: gold, silver, platinum, titanium, chromium, etc.- Factors influencing material selection: desired appearance, mechanical properties, cost, and environmental considerations- Techniques for combining multiple layers or alloys in steam plating- Innovations in material selection for specialized applications: nanocomposite coatings, biocompatible coatings, etc.Chapter 4: Applications of Steam Plating- Automotive industry: decorative trim, badges, and wheel covers - Electronics industry: printed circuit boards, connectors, and memory devices- Aerospace industry: turbine blades, fuel cells, and thermal barrier coatings- Medical industry: surgical instruments, dental implants, and prosthetics- Jewelry industry: watches, rings, and pendants- Emerging applications: solar cells, flexible electronics, and wear-resistant coatingsChapter 5: Quality Control and Characterization Techniques- Non-destructive testing methods for coated surfaces: optical microscopy, scanning electron microscopy (SEM), X-raydiffraction (XRD), and energy-dispersive X-ray spectroscopy (EDX)- Analysis of coating properties: thickness, hardness, adhesion, and corrosion resistance- Characterization of coating microstructure and composition- Case studies and examples of quality control in steam plating Conclusion:Steaming plating, with its versatility and ability to provide high-quality thin films, has become an essential process in various industries. This book serves as a comprehensive reference guide, offering a deep understanding of the principles, techniques, and applications of steam plating. Whether you are a beginner or an experienced professional, this book will provide valuable insights into this fascinating field and help you achieve success in your steam plating endeavors.。

NotesA. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document.B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions.The Big Deal• Exceptional Power Handling, Up to 2W • Wide bandwidth, DC - 18 GHz • Small Size, 2 mm x 2 mmProduct OverviewYAT attenuators (ROHS compliant) are fixed value, absorptive attenuators fabricated using highly repeti-tive MMIC processing including thin film resistors on GaAs substrates. YAT attenuator die contain through-wafer Cu metallization vias to realize low thermal resistance and wideband operation. YATs are available with nominal attenuation values of 0 to 10 dB (in 1 dB steps), and 12, 15, 20, and 30 dB. Packaged in tiny 2 mm x 2 mm MCLP TMpackage fits into tiny spaces.50Ω Up to 2W DC to 18 GHzCASE STYLE: MC1630NotesA. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document.B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions.Product Features• miniature package MCLP™ 2 x 2 mm • wide bandwidth, DC-18 GHz• excellent attenuation accuracy & flatnessREV . E Typical Applications • Cellular • PCS• communications • radar • defense50Ω 2W 1dB DC to 18 GHzGeneral DescriptionYAT-1+ is a 1-dB absorptive attenuator fabricated using highly repetitive MMIC process including thin film resistors on GaAs substrate. YAT-1+ attenuator die contains through-wafer Cu metallization vias to real-ize low thermal resistance and wideband operation. Packaged in tiny 2 mm x 2 mm MCLP TM package fitsinto tiny spaces.CASE STYLE: MC1630Generic photo used for illustration purposes onlyNotesA. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document.B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions.Absolute Maximum RatingsOperating Case T emperature 3-40°C to 85°C Storage T emperature -65°C to 150°CRF Input Power2W3. Case is defined as ground lead.Permanent damage may occur if any of these limits are exceeded.Electrical Specifications 1 at 25°C, 50Ω (CPW)1. T ested on Mini-Circuits test board TB-621-1+ using coplanar wave guide (CPW) input and output traces (see suggested PCB layout on page 4 of this data sheet)2. RF Power at 25°C case temperature: 2.0 Watt. Derate linearly to 1.0 W at 85°C.YAT-1+ATTENUATION1.01.11.21.31.41.50369121518FREQUENCY (GHz)A T T E N U A T I O N (d B)YAT-1+VSWR1.01.11.21.31.41.50369121518FREQUENCY (GHz)V S W R Typical Performance Data at 25°CFrequency(GHz)Attenuation(dB)VSWR (:1)0.001 1.00 1.02 1.0 1.03 1.07 2.0 1.04 1.04 4.0 1.04 1.09 5.0 1.05 1.12 8.0 1.29 1.47 10.0 1.20 1.17 12.0 1.23 1.24 15.0 1.37 1.31 16.0 1.42 1.30 18.01.401.36Characterization Test CircuitFig 1. Block diagram of T est Circuit used for characterization, T est board TB-621-1+ Conditions: Attenuation, VSWR: Pin=-10 dBmNotesA. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document.B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions.Suggested PCB Layout (PL-349)ESD RatingHuman Body Model (HBM): 250V , Class 1A (JESD22-A114)Machine Model (MM): 200V , Class B (JESD22-A115)MSL RatingMoisture Sensitivity: MSL1 in accordance with IPC/JEDEC J-STD-020DProduct Marking。

CASE STYLE: MT1817The Big DealProduct Overview JSW3-23DR-75+ is a reflective SP3T RF switch, with reflective short on output ports in the off condition. Made using Silicon-on-Insulator process, it has very high IP3, a built-in CMOS driver and negative voltage generator. Its tiny 2x2mm, 14-lead case enables wideband performance in tight spaces and dense PCBlayouts.75Ω 5 to 2000 MHz• High Port count in super small size• Low Insertion Loss, 0.7 dB at 1 GHzReflective RF Switch with internal driver.Single Supply Voltage, +2.5V to +4.8VProduct Features • High Isolation, 38 dB typ. at 1 GHz• Low insertion loss, 0.7 dB typ. at 1 GHz• High IP3, 59 dBm typ. at 1 GHz• Low current consumption, 40 µA typ.Typical Applications • CATV systems• SATCOM system• Automated Test Stations• Telecom systemsGeneral Description JSW3-23DR-75+ is a reflective SPDT switch with integral driver, operates with single positive supply volt-age while consuming, 40 µA typical. It has been designed for very wideband operation of 5-2000 MHz. It is packaged in a tiny 14-lead 2mm x 2mm x 0.55mm package and is rated MSL1 and class 1B ESD.JSW3-23DR-75+CASE STYLE: MT1817Simplified Schematic and Pad DescriptionGroundGround Ground(1)1. As measured in Mini-Circuit’s test board TB-722-3-F+ (see Characterization Test Circuit, Fig.1).2. Insertion loss values are de-embedded from test board loss.3. Isolations for other port combinations, see Tables 1 & 24. Do not exceed RF input power as shown in Absolute Maximum Rating table.5. If V DD <2.7V, then Max Control Voltage high=V DD(6)(8)7. Derate linearly to 2.5W at 85°C.Characterization Test CircuitFigure 1: Block Diagram Of Test Circuit Used For Characterization.(DUT soldered on Mini-Circuits’ TB-722-3-F+)Test Equipment: For Insertion loss, Isolation, Return loss:Agilent’s N5230A Network Analyzer , E3631A power supply. Mini-Circuits matching pads UNMP-5075-33+ For Switching Time and Video Feed through Agilent’s HP81110A pulse generator, 54833A Oscilloscope, E3631A power supply.Agilent’s N9020A Spectrum Analyzer , E8257D Generator, E3631A power supplyFor Compression:R&S Network Analyzer ZVA24, E3631A power supply.Conditions: VDD = +2.5, +3.0 and +4.8V, Control= 0 and 1.35V. For Insertion loss, isolation and return loss: Pin=0 dBmFor Input IP3: Pin=+10dBm/tone at V DD =3VFor Switching time: RF frequency: DC at 200mV, Control Frequency: 10 KHz and 0 and +8V.Recommended Application CircuitProduct MarkingFig. 2: Evaluation board includes case, connectors and components soldered to PCB.1MSL Test Flow ChartESD RatingHuman Body Model (HBM): Class 1B (500 to < 1000V) in accordance with JESD22-A114 Machine Model (MM): Class A (Pass 100V) in accordance with JESD22-A115MSL Rating Moisture Sensitivity: MSL1 in accordance with IPC/JEDEC J-STD-020DAdditional Notes A. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document.B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions.C. The parts covered by this specification document are subject to Mini-Circuits standard limited warranty and terms and conditions (collectively, “Standard Terms”); Purchasers of this part are entitled to the rights and benefits contained therein. For a full statement of the Standard Terms and the exclusive rights and remedies thereunder, please visit Mini-Circuits’ website at /MCLStore/terms.jsp。

-+-V UCC28950-Q1ZHCS225A –APRIL 2011–REVISED JULY 2012支持同步整流的相移全桥控制器查询样品:UCC28950-Q1特性•V DD 欠压闭锁•宽温度范围，-40°C 至125°C•符合汽车应用要求•具有符合AEC-Q100的下列结果：应用范围–器件温度1级：-40°C 至125°C 的环境运行温•相移全桥转换器度范围•工业电源系统–器件人体模型(HBM)静电放电(ESD)分类等级H2•高密度电源架构–器件充电器件模型(CDM)ESD 分类等级C3B •太阳能逆变器和电动车辆•增强型宽范围谐振零电压开关(ZVS)功能说明•直接同步整流器(SR)控制UCC28950-Q1增强型相移控制器基于德州仪器(TI)•轻负载效率管理包括：的改进型工业标准UCCx895相移控制器系列产品，所–突发模式运行做出的改进提供了当前高效电源系统中同类产品中最佳–断续导通模式(DCM)，支持可编程阈值的动态效率。

UCC28950-Q1在对同步整流器输出级进行有SR 开关控制效控制的同时执行对全桥的高级控制。

–可编程自适应延迟•支持可编程斜坡补偿和电压模式控制的平均或者峰初级侧信号允许可编程延迟以确保宽负载电流和输入电值电流模式控制压范围内的ZVS 运行，而负载电流自然调整同步整流•闭环路软启动和使能功能器的次级侧开关延迟，从而大大提升了整体系统效率。

•支持双向同步的高达1MHz 的可编程开关频率•(±3%)支持断续模式的逐周期电流限制保护•150µA 启动电流UCC28950-Q1典型应用Please be aware that an important notice concerning availability,standard warranty,and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.UCC28950-Q1ZHCS225A–APRIL2011–REVISED These devices have limited built-in ESD protection.The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.说明（续）UCC28950-Q1还提供多重轻负载管理特性，其中包括进入和退出断续电流模式(DCM)运行时的突发模式模式和动态SR开/关控制，从而确保将ZVS运行扩展至更轻的负载。

Features & Benefits<100 ps Rise Time (Guaranteed)5.0 GHz Bandwidth (Typical) Dual SMA Inputs to Internal 50 ΩTermination Network Internal Differential Amplifier with High CMRRDC Bias Port for Common Mode Voltage Termination (LVPECL and CML Bias Capability) Good Differential Input Return Loss Low Input Skew Supplied with Low Loss Matched Delay Cables TekConnect TM InterfacePreserves Signal Integrity to 10 GHz and Beyond to Meet Present and Future Bandwidth NeedsApplicationsCommunications (Gigabit Ethernet,Fibre Channel, InfiniBand) Semiconductor Characterization and Validation(PCI-Express, Serial ATA,IEEE 1394, USB 2.0,RAMBUS, DDR)5.0 GHz Differential Probe with SMA Inp utP7350SMADifferential Probes •/accessories1Tektronix’ brings you the first-available high-speed differential SMA input probe.The P7350SMA provides a tool for meas-uring differential signals in a 50 Ωsig-naling environment.Before the introduction of the P7350SMA,most serial data com-pliance measurements required cabling a differential signal to two oscilloscope channels and applying waveform math to calculate the difference.By integrating a dual 50 Ωtermination network and a differ-ential amplifier in the probe head,the P7350SMA measures a differential signal pair on each channel of a multiple channel oscilloscope.Since many of the new high-speed serial data standards define differential signaling on multiple chan-nels,the P7350SMA provides a more efficient measurement solution.The P7350SMA probe architecture includes an input termination network,a differential buffer amplifier,and a common mode DC bias port.Since many differential data signals operate with a non-zero DC common mode voltage,the DC bias port allows for more flexible interfacing to these logic families.For applications requiring a common modeDC termination voltage,that voltage can be supplied to the P7350SMA DC bias port through a standard banana plug connector.For other differential measurement applica-tions,such as AC-coupled and some DC-coupled high frequency 8B/10B encoded data streams,the DC bias port can simply be left unconnected.Input signals use SMA connectors to attach to the input termination network,imple-mented on a laser-trimmed hybrid circuit for signal fidelity and high frequency responses.The linear buffer amplifier converts the differential inputsignal to a single-ended output and drives the output signal down the probe cable at full bandwidth.An active differential buffer amplifier in the probe head enables the P7350SMA probe to move the measurement interface from the oscilloscope front panel to the circuit-under-test.This can reduce the length of electrical interconnect cabling,which for multi-gigabit data signals also reduces frequency dependent loss distortion in signal measurements.Advanced Test Equipment Rentals 800-404-ATEC (2832)E s t a b l i s h e d 19815.0 GHz Differential Probe with SMA InputP7350SMAOur most up-to-date product information is available at:Copyright © 2003,Tektronix,Inc.All rights reserved.Tektronix products are covered by U.S.and foreign patents,issued and pend rmation in this publication supersedes that in all previously published material.Specification and price change privileges reserved.TEKTRONIX and TEK are registered trademarks of Tektronix,Inc.All other trade names referenced are the service marks,trademarks or regis-tered trademarks of their respective companies.04/03 HB/SFI60W-16671-0Differential Probes •/accessories2CharacteristicsRise Time –<100 ps 10% to 90% (guaranteed).<65 ps 20% to 80% (typical).Bandwidth (Probe Only)– 5.0 GHz (typical).Input – SMA.Attenuation – 6.25X.Differential Input Resistance – 100 Ω±2%.Common Mode Input Resistance – 50 Ω±1%.Input Skew – <1 ps.Differential Input Range – ±2.5 V (20 ºC to 30 ºC).Common Mode Input Range – +6.25 V to –5 V.Maximum Termination Resistor Power – <0.5 W per side*1.Max Voltage (Non-destruct)– ±15 V (DC plus peak AC).CMRR – >60 dB at DC,>55 dB at 1 MHz,>50 dB at 30 MHz,>30 dB at 1 GHz (typical).*1See manual for calculation.Differential Input Return LossFrequencyDifferential Return Loss 625 MHz>20 dB (fundamental for 1.25 Gbps)1.25 GHz>16 dB (fundamental for 2.5 Gbps)1.56 GHz>14 dB (fundamental for 3.125 Gbps)2.50 GHz >12 dB 3.125 GHz>10 dBNoise – Approximately 46 nV/root Hz.Interface – TekConnect.Cable Length – 1.2 m.Ordering InformationP7350SMA5.0 GHz Differential SMA Probe for TekConnect Interface.Includes50 ΩTerminator – Order 015-0122-xx,2 each.Matched Pair SMA Cables,12 in. –Order 174-4866-xx,1 set.Banana Plug Shorting Strap –Order 012-1667-xx,1 each.BNC-M to SMA-F Adapter –Order 015-0572-xx,1 each.Cable Marker Set (5 colors) –Order 016-1886-xx,1 each.Wrist Strap –Order 006-3415-xx,1 each.Certificate of Traceable Calibration –1 each.Instruction Manual –Order 017-1264-xx,1 each.Recommended AccessoriesSMA-M to SMA-M Adapter –Order 015-1011-xx,2 each.SMA Phase Adjuster Adapter –Order 015-0708-xx,2 each.BNC to Banana Adapter –Order 103-0090-xx,1 each.TekConnect Calibration Fixture –Order 067-0422-xx,1 each.Service OptionsOpt. C3 – Calibration service 3 years.Opt. C5 – Calibration service 5 years.Opt. D1 –Calibration data report.Opt. D3 –Calibration data report 3 years (with Option C3).Opt. D5 –Calibration data report 5 years (with Option C5).Opt. R3 –Repair service 3 years.Opt. R5 –Repair service 5 years.Contact Tektronix:ASEAN / Australasia / Pakistan (65) 6356 3900Austria +43 2236 8092 262Belgium +32 (2) 715 89 70Brazil & South America 55 (11) 3741-8360Canada 1 (800) 661-5625Central Europe & Greece +43 2236 8092 301Denmark +45 44 850 700Finland +358 (9) 4783 400France & North Africa +33 (0) 1 69 86 80 34Germany +49 (221) 94 77 400Hong Kong (852) 2585-6688India (91) 80-2275577Italy +39 (02) 25086 1Japan 81 (3) 3448-3010Mexico,Central America & Caribbean 52 (55) 56666-333The Netherlands +31 (0) 23 569 5555Norway +47 22 07 07 00People’s Republic of China 86 (10) 6235 1230Poland +48 (0) 22 521 53 40Republic of Korea 82 (2) 528-5299Russia,CIS & The Baltics +358 (9) 4783 400South Africa +27 11 254 8360Spain +34 (91) 372 6055Sweden +46 8 477 6503/4Taiwan 886 (2) 2722-9622United Kingdom & Eire +44 (0) 1344 392400USA 1 (800) 426-2200USA (Export Sales) 1 (503) 627-1916For other areas contact Tektronix,Inc.at:1 (503) 627-7111Updated 20 September 2002。

電子元件鑑定試驗(Reliabilty Qualification Test)前言電子元件鑑定的目的是於正式量產前或原料、製程變更時為了確認產品設計結構、使用原料到製造成品之產品能力是否達到設計及客戶(市場)的需求目標。

電子元件從產線製造出來除了確定功能符合需求外，尚需經歷搬運、儲存、PCB插件、PCB焊接、系統組裝、整機包裝、整機運輸、置架、銷售最後到消費者使用。

其間過程所經歷的外在力量、環境衝擊都有可能致使元件損傷乃至失效。

如果只是關注元件供應商的製程能力、良率對後續可能產生的損耗是潛存著極大的風險，以石英諧震(Crystal Resonator)/石英震盪(Crystal Oscillator)元件為例，在搬運、運輸過程的摔落及震盪衝擊，PCB插件時作業員不慎掉落地面，最後到消費者手上的手機中不慎墜落，都有可能造成石英諧震(Crystal Resonator)/石英震盪(Crystal Oscillator)元件中的石英晶片脫落，致使整機不良品的產出、產品使用壽命的減短或產品的失效，最終導致製造資源及自然資源的浪費。

另就PCB打件、焊接業者而言只是經過迴流焊測試過的元件未必能經得起超音波的焊接作業或手焊作業所產生的損壞及損傷影響。

所以只是以製程能力、良率或是實驗室度量的平均壽命(MTTF)來判斷元件的良莠是存在著相當大的盲點的。

即使良率100%的元件如果於PCB打件、(超音波)焊接中有30%的損壞，且也極可能有殘留的應力造成潛在的損傷，那，元件的製程能力、良率及壽命保證又有何意義呢？所以電子元件的製程能力、良率及平均壽命只有在通過各種可能的環境應力考驗才具有相對的意義。

電子元件的可鑑定測試除了功能及壽命測試(可靠度試驗)鑑定外，各種的環境應力模擬鑑定測試是完全不可或缺的。

相關規範1.AEC-汽車產業之行業標準規範AEC Component Technical Committee：一般性電子元件鑑定要求(Common electricalcomponent qualification requirements)1.1.積體電路(IC)元件相關文件說明：a.AEC-Q100 Rev - G是將各類IC產品的鑑定測試項目要求、方法及條件彙整的文件，並包括”設計、結購、能力證明(Certification of Design, Construction and Qualification)”和”鑑定測試計劃及結果(Q100G QUALIFICATION TEST PLAN)”的制式表格。

浙江省金砖联盟2024-2025学年高二上学期11月期中英语试题一、阅读理解It’s widely acknowledged that effective communication counts at work. That’s why our communication workshops, where multiple forms of presentations are offered, are so popular. Welcome to join us and here are the resumes (简历) of two potential presenters recommended for this year’s summer communication workshops.1．Who will probably be the target audience of the workshop’s presentations?A．Those desiring to improve interactions at work.B．Those longing to give public speeches to others.C．Those looking forward to having a job interview.D．Those aiming to upgrade their English writing skills.2．What do Martin and Sandra have in common in their resumes?A．A strong background on PR activities.B．Being fluent in Cantonese and Putonghua.C．Having been employed in a university.D．Working experience for more than 10 years. 3．What can be expected from the presentation of Sandra Wong?A．Corporate training in business English.B．One-to-one training in business writing.C．Tips on a good relationship with clients.D．Beneficial videos and technical support.O. Henry(1862-1910) was an American short story author whose real name was William Sydney Porter. Henry’s works reflected his wide-range of experiences and are distinctive for its witticism(俏皮话), clever wordplay, and unexpected twist endings.Like many other writers, O. Henry’s early career aims were unfocused and he wandered across different activities and professions before he finally found his calling as a short story writer. He started working in his uncle’s drugstore in 1879. Later, he moved to Texas where he lived on a farm and learned sheep shepherding, cooking, babysitting, and bits of Spanish and German fromthe many migrant farmhands.Over the next several years, he took a number of different jobs, from drafting to journalism, and banking, but he was careless with accounting, thus fired by the bank and charged with a crime in 1894. He fled the day before the trial in 1896, first to New Orleans, then to Honduras, where he learned his wife was dying and could not join him, so he returned to Austin and turned himself in to the court. His father-in-law helped him out so he could remain with his wife until her death in 1897. Later he was sentenced and served in Federal prison in Ohio from 1989-1902.The many twists and turns of O. Henry’s own life, including his travels in Latin America and time spent in prison, clearly inspired his stories’ twists and wordplay. His prolific writing period began in 1902 in New York City, where he wrote 381 short stories which show his obvious affection for this City and its diversity of people and places. O. Henry’s trademark is his witty, plot-twisting endings, and his warm characterization of the awkward and difficult situations and the creative ways people find to deal with them, which typically features in his work like The Last Leaf,The Gift of the Magi, etc. All of his stories are highly entertaining, whether read for pleasure or studied in classrooms around the world.Unfortunately, O. Henry’s personal tragedy was heavy drinking. He died in 1910 of several diseases. He was a gifted short story writer and left us a rich legacy of great stories to enjoy. 4．What happened to O. Henry in his early life?A．He took up writing as his lifelong profession early on.B．He had a pretty good command of Spanish and German.C．He engaged himself with numerous jobs to experience life.D．He failed to live a stable life and switched jobs for a living.5．What does the underlined word “prolific” in paragraph 4 mean?A．relevant B．productive C．profitable D．original 6．Which of the following words can best describe O. Henry’s works?A．Educational and tragic.B．Unpredictable and serious.C．Fascinating and twisty.D．Extraordinary and formal.7．What does O. Henry’s life story convey?A．More haste, less speed.B．Time and tide wait for no man.C．He who laughs last laughs best.D．Suffering is a stepping stone to genius.A recent study on New Scientist reveals that police can access a collection of data from smart speakers found at crime scenes that could be invaluable in solving murders or robberies. Data on recently recognised faces, internet searches and voice commands could be extracted even without the owner’s permission or assistance from the manufacturer.Jona Crasselt and Gaston Pugliese at the University of Erlangen-Nuremberg in Germany tested how much information can be pulled from such a device after seeing news report of Amazon refusing police access to smart speaker data in a murder case. “We not only obtained access to the local data, but also were able to access the data stored in the cloud,” says Crasselt. “The investigators would be able to access the data themselves without relying on Amazon to provide it to them.”The researchers focused on Amazon’s Echo Show 15, a smart assistant with a display screen, a camera, six microphones and a light sensor. They explored inside the Echo Show with a device designed to test what signals or data are flowing at various points on a circuit board. The pair were able to gain access to the unencypted (未加密的) file system. “Records of detected movement and faces recognized by the built-in camera and artificial intelligence are accessible,” says Pugliese, “as well as details of voice requests, calendars, contacts, conversations, photos and videos.” He added that it required some technical knowledge to obtain the local data, but it was surprising that the file system was not encrypted.An Amazon spokesperson told New Scientist: “The security of our devices and customer data is a top priority. In this case, the researcher’s findings required direct physical access to the Echo device and specialised expertise to extract data from internal device components. We appreciate the work the security research community does to help us further improve our devices.”Criminologist David Wilson at Birmingham City University, UK, says it’s a simple human reality that you’re most likely to be victims to someone you know. “We already have access to information from those domestic settings through mobile phones, Facebook, Instagram posts. In spite of the fact that smart speaker evidence may be useful, it is controversial,” he says. “because there are privacy issues.”8．What might be helpful in solving crimes according to the study?A．The smart speaker on the spot.B．The manufacturer’s assistance.C．The user’s or owner’s permission.D．The artificial intelligence system.9．What did Gaston Pugliese imply in paragraph 3?A．The file system is incredibly difficult to access.B．Sufficient information is stored in the speaker.C．Echo Show is equipped with various functions.D．Advanced techniques are needed to obtain data.10．What measures may Amazon take as a consequence of the researchers’ findings?A．To advocate the indirect physical access.B．To provide the files for the investigators.C．To better the security of the customer data.D．To extract the details of the users’privacy.11．What’s David Wilson attitude towards smart speaker evidence?A．Doubtful.B．Objective.C．Resistant.D．Optimistic.On Aug 20, the highly anticipated Black Myth: Wukong — A Chinese self-developed AAA game — made its first public appearance at home and abroad, immediately becoming a hit in the industry.Notably, the game has also sparked interest in Chinese culture, as it is greatly grounded in Chinese mythology and inspired by the legends of the Monkey King — or Sun Wukong — in Journey to the West, a Chinese classic novel that has been represented in numerous films, TV shows and cartoons. Another distinguishing characteristic of the game is that its art design has taken inspiration from ancient Chinese architecture and other traditional cultural heritages.This cultural feature of the game has resulted in additional benefits outside the game industry, arousing passionate enthusiasm from netizens to experience the Chinese cultural heritage displayed in the game. Thus, according to Chinese media reports, it has generated a new touring option — following in the footsteps of Wukong to see the Chinese cultural attractions.Shanxi is no doubt one of the biggest beneficiaries of this cultural tourism boom as the North China province boasts the largest number of locations where the game takes place. Of the 36 scenic spots featured in the game, 27 are located in Shanxi, according to Shanxi’s cultural and tourism officials. “Shanxi was selected by the game’s development team as the major destination for filming,” added the officials, “because it boasts some 28,000 sites of ancient buildings — thelargest number in China’s provincial-level regions.”The cooperation between Shanxi and Game Science has achieved a win-win result. As Black Myth: Wukong becomes a hit domestically and globally, Shanxi has seen an immediate rise in popularity in its tourism industry. Over the past two weeks after the game’s release, Huayan Temple in Datong, for instance, reported a 50 percent increase in tourist visits compared with the same period of last year, according to local officials.Latest media reports predicted that Shanxi will be among the hottest destinations during the coming National Day holiday in early October thanks to the game. On popular online travel platform Qunar, the number of searches of Shanxi soared by 1.2 times in August compared with the previous month.12．Why did the game immediately become a hit according to the passage?A．It appeals much to young game players.B．It is independently developed in China.C．It features varieties of cultural elements.D．It comes from an ancient classic novel. 13．What has the popular game brought about?A．A great enthusiasm about a Chinese novel.B．A keen interest in Chinese cultural heritage.C．A well-developed tourism industry in China.D．A deep exploration of the Chineselegends.14．What can be inferred from the statements of the officials of Shanxi?A．There was a rise of 50 percent in the tourist visits of Shanxi.B．Shanxi benefited the most from this phenomenal game craze.C．Shanxi owns the most ancient architectures in China’s regions.D．More than half of the scenic spots involved are located in Shanxi.15．What can be the best title of the text?A．Video Games Boost Local Tourism.B．Shanxi Tourism Sees Surprising Increase.C．Video Games Bring Digital Revival.D．Cultural Tourism Improves Video Games.The pros and cons of opening more drop-in centers for young night drifters(漂泊者)The issue of what to do with young night drifters has been much discussed. Many people think that the government ought to open more drop-in centers. 16 Following are the advantages and disadvantages of opening more drop-in centers for young night drifters.One advantage of opening more drop-in centers is that it would keep young night drifters safe. 17 For example, they may fall victim to gangs and drug dealers. Some young night drifters are also bullied. This is probably due to the fact that they are young and vulnerable.Another argument that is commonly heard is that having more drop-in centers would decrease night drifting. Drop-in centers provide an easy way to offer young night drifters professional advice. Counsellors can give young drifters advice about how to solve problems with their families. 18In addition to these advantages of opening more drop-in centers for young night drifters, however, there are also a number of disadvantages. 19 According to these people, if there are more safe places for night drifters to hang out in, there is no motive for these young people to give up their nocturnal(夜间的) habits. Moreover, the attraction of having a special place to go to may encourage others to become night drifters as well.It is also argued that resources should be focused on providing services for all young people rather than just a small proportion of them. In other words, it may not be fair to support only night drifters.20 However, personally, I believe that ensuring the safety of young people and giving night drifters counselling are both necessary. I therefore believe that more drop-in centers should be provided for young night drifters in the city.A．They can also help them to handle negative peer pressure.B．People believe that disadvantages outweigh advantages.C．It is clear that the issue is not black and white.D．However, it is an issue that still divides many people.E．Hence, more drop-in centers are of vital significance to them.F．Young people who walk the streets at night often fall into bad ways.G．Some people argue it actually fails to discourage night drifting.二、完形填空The day before we boarded the ship to London, father said goodbye to his five-year-old dog, Spider, who was 21 by us all. Father’s friend was to look after him while we were overseas.Three weeks later, news came that Spider had run away. I will always remember my father’s tears in eyes. My mom and I tried to 22 him, knowing in our hearts how useless this was. Our excitement at finally arriving in England quickly 23 . The whole family fell into deep sorrow. 24 advertised constantly on the radio and in the newspaper, Spider was never found.We came back to our home five months later. My father immediately began his own 25 for Spider, only to get some false calls. Disappointment 26 our household. We all thought the dog was gone — possibly shot or dead from hunger and exhaustion.One cold Saturday morning, my father had another 27 from Gin Gin, 375 kilometres from our home. An elderly lady told him there was a dog like Spider in her disused tennis court. That was 28 for us to drive there. Five and a half hours later, we found the lady. My father was 29 to see the dog, so we followed her to the tennis court.30 , it seemed that the dog wasn’t around. Where could he be? My father had a strange look in his eye. He put two fingers to his lips and did his special 31 for Spider. All of a sudden, Spider 32 over the tennis court fence with great force and certainty, flying right into my father’s arms. My father’s eyes shone. For so long, my father never lost 33 that he would find his dog.Spider 34 the rest of his days with us, content and satisfied. He always waited for me coming home from school. He then waited for my father by the garage door. We never left him anywhere 35 again.21．A．adopted B．named C．trained D．loved 22．A．support B．comfort C．persuade D．bless 23．A．switched B．released C．disappeared D．approached 24．A．Since B．While C．When D．Unless 25．A．search B．appeal C．travel D．desire26．A．took up B．went through C．hung over D．pulled in 27．A．letter B．mail C．poster D．call 28．A．remote B．enough C．difficult D．possible 29．A．anxious B．nervous C．worried D．excited 30．A．Luckily B．Apparently C．Hopelessly D．Sadly 31．A．gesture B．signal C．whistle D．expression 32．A．climbed B．leapt C．fell D．rolled 33．A．hope B．effort C．patience D．trust 34．A．stayed B．spared C．saved D．spent 35．A．disused B．upset C．alone D．dirty三、语法填空阅读下面短文，在空白处填入1个适当的单词或括号内单词的正确形式。

循环伏安法英文Cyclic voltammetry (CV) is a common electrochemical technique used to investigate the redox properties of a material or to determine its electrochemical behavior. It is widely used in various fields such as analytical chemistry, materials science, and biochemistry. In this technique, a potential is applied to the working electrode, and the resulting current is measured as a function of the applied potential. The potential is then cycled back and forth in a repetitive manner to obtain a cyclic voltammogram. This technique provides information about the thermodynamics and kinetics of electrochemical reactions and allows the determination of important parameters such as the redox potential, diffusion coefficient, and electron transfer rate.The experimental setup for cyclic voltammetry typically consists of three electrodes: a working electrode, a reference electrode, and a counter electrode. The working electrode is the electrode of interest, where the electrochemical reactions occur. Commonly used working electrode materials include glassy carbon, platinum, gold, and carbon nanotubes. The reference electrode is usually a stable electrode with a well-defined electrode potential, such as a saturated calomel electrode (SCE) or a Ag/AgCl electrode. The counter electrode completes the electrical circuit by allowing the current to flow between the working electrode and the reference electrode.During a cyclic voltammetry measurement, the potential is ramped linearly from a starting voltage (the initial potential) to an ending voltage (the final potential) and then back to the starting voltage in a repetitive manner. The scan rate, defined as the rate at which thepotential is changed, is an important parameter in cyclic voltammetry. A higher scan rate allows for faster measurement but may lead to some loss of information about slow electrochemical processes.The resulting cyclic voltammogram consists of a series of peaks and troughs representing the oxidation and reduction processes occurring at the working electrode. The peak current observed in the cyclic voltammogram is proportional to the concentration of the electroactive species involved in the redox reaction. The peak potential, on the other hand, provides information about the redox potential of the material. By analyzing the shape and position of the peaks, valuable information about the reaction mechanism, rate constants, and diffusion coefficients can be obtained.Cyclic voltammetry is a versatile technique that can be applied to a wide range of electrochemical systems. It is commonly used in the characterization of electrode materials, the study of electrochemical reaction mechanisms, and the determination of electrochemical kinetics. It is also a valuable tool in the field of electroanalysis, where it is used for the quantitative determination of analytes in various samples.In conclusion, cyclic voltammetry is a powerful electrochemical technique that provides valuable information about the redox properties and electrochemical behavior of materials. Its versatility and wide range of applications make it an essential tool in electrochemical research and analysis.。