安捷伦示波器使用方法备课讲稿

Agilent54621A/22A/24A示波器使用方法以Agilent54622A示波器为例，介绍一下Agilent示波器的使用方法：一、示波器的注意事项：使用示波器首先要保证，示波器和测试机器不能共地，否则会造成炸机或损坏示波器，所以我们为保证安全使用示波器，一般会将示波器电源线地线剪掉。

为保证测试波形的正确有效性，须根据所测试的波形，选择正确合适的频率、幅值范围；为保证所测试波形的正确有效性，尽量不要将已经抓住的波形展开，避免因将波形展开而造成波形失真，最好在测试时就选择好正确量程范围。

二、前面板纵览：如下图所示，54622A示波器的前面板：通过示波器的前面板的纵览，示波器主要包括显示和控制面板：1）、示波器显示包括通道采集、设置信息、测量结果，以及用于设置参数的软键，如图：通过上图可看出，示波器显示具体有以下内容：状态行：最上面一行，包括垂直、水平和触发设置信息；显示区：显示区包括波形采集、通道识别符，以及模拟触发和地电平指示器；测量行：测量行一般包括自动测量结果和游标测量结果，但它也能显示高级触发设置数据和菜单信息；软键：可以使用这些软键为前面板键设置其它参数。

2）、控制面板如图：我们首先看一下做出标识部分的旋钮、按键的功能，其它按键功能我们将在后面做详细讲解：标识1为水平扫描速度（时间/格）旋钮，当对其旋转时，注意所引起的状态行显示出扫描速度值的变化；标识2为延迟时间旋钮，旋转时注意在状态行中它的量值的变化，它是用于水平移动的，中心值为0.00s处，可以进行左右移动，移动显示数值为时基参考点（零位中心值）和触发点（旋钮所在位置）间的距离；标识3为扫描方式选择按键，可选择对波形采用何种方式扫描，在我们使用的这款示波器中，有三种选择方式：Main－采用主扫描模式测试波形，时间范围为50s～5ns;Roll－采用滚动模式测试波形，时间范围为50s～500ms;Delayed－采用延迟工作模式，此模式下波形分成两半，延迟扫描的图标会出现子阿显示屏首行中央，显示屏的上半部分显示主扫描，而下半部分显示延迟扫描；标识4为Entry旋钮，许多软键可使用此键来选择量值；标识5为2个通道的幅值调节范围，如果使用普通探棒，其幅值范围为50V～10MV，所以在测试超出此范围的波形时需使用差动探棒；标识6为位置旋钮，用来垂直移动信号，如果信号已过校准零位，会随着转动位置旋钮短时显示电压值，指示参考地电平与屏幕中心的距离，还应注意屏幕左端的参考地电平符号随位置旋钮的旋转而移动。

安捷伦示波器说明书解决multisim仿真速度慢multisim11.0中仿真时间步长的设定方法multisim10示波器的使用方法——同电子仿真软件MultiSIM 9中的虚拟示波器使用方法2011-06-13 22:16:43| 分类：IC -- 电子| 标签：|字号大中小订阅电子仿真软件MultiSIM 9中的虚拟示波器使用方法朱晓欣(原载《无线电》杂志07年第五期)在电子仿真软件MultiSIM 9中，除了虚拟双踪示波器和虚拟四踪示波器以外，还有两台高性能的先进示波器，它们分别是：跨国"安捷伦"公司的虚拟示波器"Agilent54622D"和美国"泰克"公司的虚拟数字存贮示波器"TektronixTDS2024"。

本刊06年第五期曾对Multisim7中的安捷伦虚拟示波器设置和显示有过简单介绍，读者可以参阅该文相关内容。

本文主要介绍安捷伦虚拟示波器的一些特殊其它功能和美国"泰克"公司的虚拟数字存贮示波器这两台高档次的示波器使用方法。

一、安捷伦虚拟示波器"Agilent54622D"的使用方法举例Agilent54622D虚拟示波器的带宽为100MHz，具有两个模拟通道和16个逻辑通道。

图一是它的放大面板图，它的各个开关、按钮及旋钮的排列和调节都和实物仪器完全一样，我们在自己的电脑里也能享受到使用高档次测量仪器的愉悦，且没有损坏仪器的担忧。

图一一、显示基本波形操作(这里以模拟通道1为例说明)首先在电子仿真软件MultiSIM 9电子平台上调出安捷伦虚拟函数信号发生器和安捷伦虚拟示波器各一台。

并按图二连好电路；双击安捷伦虚拟函数信号发生器图标"XFG1"打开电源开关，不作任何设置使用它的默认值，即：频率1kHz，幅值100mVpp的正弦波(可参阅上期介绍)。

MSO9254A示波器操作指引目錄:1 目的 (2)2 使用注意事項 (2)2.1 安全開關示波器 (2)2.2 禁止操作事項 (3)3 介面說明 (4)4 功能簡介 (5)5 基本操作 (7)5.1 快速測量 (7)5.1.1 Autoscale功能 (7)5.1.2 Multi-purpose功能 (9)5.1.3測量指定區域波形幅度平均值 (10)5.2 縮放波形 (12)5.2.1 Zoom 模式 (12)5.2.2 Waveform Zoom (13)5.3 保存和載入波形 (15)5.3.1 保存波形 (15)5.3.2 載入波形 (17)5.3.3 波形儲存設置 (18)5.4 Function信號分析 (19)5.4.1 峰值檢測 (19)5.4.2 平均化 (20)5.4.3 放大運算 (21)5.5 Markers功能 (22)5.5.1 脉衝測量 (23)5.6 觸發設置 (26)5.6.1 選擇觸發 (26)5.6.2 設定觸發 (27)MSO9254A示波器操作指引1.目的:掌握MSO9254A示波器的基本使用方法.2. 使用注意事項:2.1安全開關示波器.2.1.1安全地打開示波器.2.1.1.1 示波器電源要求為100至240 V, 50/60Hz.2.1.1.2 輕按(大約0.25 LBS.)示波器左下角開關按鈕.如下圖.電源開關鍵2.1.1.3在進入Windows操作系統前不准按F2鍵,以免進入硬盤數據恢復模式.引起誤操作.2.1.1.4等待示波器初始化一段時間,直至進入以下示波器圖形介面方可進行操作. Array2.1.2 安全地關閉示波器.2.1.2.1 關閉示波器時,不准直接斷開電源.2.1.2.2 先退出示波器軟件介面.點選主菜單欄File項,下拉菜單中點擊Exit.即退出示波器軟件.2.1.2.3在操作系統下, 點擊屏幕左下角開始按鈕,選擇關閉計算機.如下圖.后選擇關閉計算機先點擊屏幕左下角開始按鈕2.2 禁止操作事項2.2.1 禁止改變Windows操作系統設置,因爲這將影響示波器正確的操作.2.2.1.1 不准改變電源選項.2.2.1.2 不准改變系統正確的硬件欄設置.2.2.1.3 不准卸載字體.2.2.1.4 不准改變顯示設置.2.2.1.5 不准改變屏幕分辨率或者顔色bit率.2.2.1.6 不准改字體大小至最大.2.2.1.7 不准删除或修改示波器管理員帳戶.2.2.2 禁止用尖銳物或筆等接觸前控面板按鍵, 觸摸屏表面.2.2.3 使用鼠標操作,在圖形介面中點選, 調節波形, 避免頻繁使用前控面板按鍵旋鈕等,造成機械損壞.2.2.4 請關閉示波器觸摸屏功能,避免使用中時造成誤操作. 點選頂部菜單欄設定Setup項,下拉菜單中點擊Display.取消勾選Touch Screen.觸摸屏功能開關2.2.5 正確拔插探頭,因為此示波器的探頭針比較現有的其它示波器探頭要細.更容易彎曲或折.斷.如圖所示2.2.6 使用前注意檢查額定值,禁止過載使用. 不要超出最大輸入額定電壓. 對於50歐輸入阻抗,最大輸入電壓5伏特峰值. 對於1M歐輸入阻抗,最大輸入150Vrms,交流耦合250伏特.2.2.7 不要使用液體清潔示波器,水可以進入到示波器前控面板,損壞敏感電子元件.3. 介面說明選項 對應的前控面板按鍵 注釋運行 [Run/Stop]綠燈表示運行 連續採集波形. 停止 [Run/Stop]紅燈表示停止 停止採集波形. 單步[Single]單步採集波形.通道開關 垂直控制部份顯示為[1],[2],[3],[4]的通道開關 勾選"ON"下的方框,打開/關閉通道. 垂直控制 Vertical scale 旋鈕 包含4個通道的垂直刻度調節項. 窗口最小化 N/A 將程序最小化至工作欄,切換到桌面.數字通道開關 [Digital] Key 打開/關閉數字通道.顯示清除 [clear display] 在停止採集信號時,清除顯示區域的波形.打印鍵 N/A 打印當前圖面,未連接印表機時,保存為XPS 格式文件. 波形亮度調節 N/A調節波形顯示的亮度.水平控制 Horizontal scale 旋鈕 包含水平刻度調節項及offset 值. 電平[Level] 旋鈕電平調節. 運行 停止 單步打印鍵 波形亮度調節 水平控制部份通道開關 垂直控制部份波形測量選項部份窗口隱藏按鈕波形記憶欄 數字通道開關 軟體主菜單顯示清除 電平調節4. 功能簡介功能 簡介快速測量 使用Autoscale自動設定控制波形顯示,Muliti-purpose鍵測量波形基本指標.基本指標包含上升時間,下降時間,週期,頻率,峰峰值,最大/最小電壓,平均電壓值.波形放大 快速擴展波形的功能,有Zoom mode和Waveform zoom兩個方法.前者能使放大波形與原波形同時顯示.後者能用滑鼠直接框選,放大任意一處波形.保存,載入波形 使用這個功能可以在以後的時間裏來再現波形, 用來做信號的對比分析.可以查看比允許的輸入通道數量更多的波形.Function信號分析 運用各種運算方式,演算出你需要的波形,用來分析信號的詳細信息.運算方式附表1.Markers測量 又叫Cursors,通過二組光標做標記,測量不規則波形,脉衝寬度,上升/下降時間. 其包括追蹤波形模式,手動放置模式,測量追蹤模式.多種的觸發器 示波器提供多種觸發方式,通過設定觸發條件查找特定部份波形.觸發方式附表2.附表1: 運算方式NO. 運算法 注釋1 Absolute Value 絕對值此操作計算來源1波形的絕對值.2 Add 加法此操作相加來源1波形和來源2波形電壓值.3 Amplitude Demodulation 振幅解調此操作展示調幅輸入信號振幅包絡線.4 Average 平均化平均數學運算使示波器獲取波形數據的平均值.5 Common Mode 相加來源1波形和來源2波形電壓值.除以2.6 Delay 延時使原波形按照指定的延時數值水平移動.7 Differentiate 區分計算波形的離散點.8 Divide 除法用來源1波形除來源2波形.9 FFT Magnitude 快速傅氏變換10 FFT Phase 快速傅氏變換相位11 High Pass Filter 高通濾波器在來源波形上應用高通濾波器.12 Integrate 積分計算來源1波形的積分.13 Invert 反向顛倒來源1波形的電壓值.14 Low Pass Filter 低通濾波器15 Magnify 放大放大或衰減來源1的波形在垂直和水平方向.16 Max 最大值採集來源1波形的最大值.17 Meas Histogram 展示測量數值的柱狀圖.18 Meas Trend 展示測量數值的趨勢圖.19 Min 最小值採集來源1波形的最小值.20 Multiply 乘法來源1波形與來源2波形相乘.21 Square 平方計算來源1波形的平方值.22 Square Root 平方根計算來源1波形的平方根值.23 Subtract 減法計算來源1波形減去來源2波形.附表2: 觸發方式NO. 觸發類型 注釋1 Edge 邊沿2 Glitch 毛刺3 Width 脈寬4 Runt 矮波5 Windows 窗口6 Time-out 延時7 Interval 間隔8 Slew rate 斜率9 Pattern 碼型10 Setup and hold 建立和保持11 Video 視頻5. 基本操作5.1 快速測量通過使用Autoscale特性得到一個穩定的觸發.使用它自動地設定顯示控制以最好地顯示我們的波形.Multi-purpose當使用這個按鍵,示波器執行特定的快速測量操作.快速得到波形的基本指標.5.1.1 Autoscale功能5.1.1.1 首先設定使用者偏好設置.點擊主菜單Utilities,在下拉菜單中選擇User Preferences.5.1.1.2 在Autoscale一欄下,點選Displayed channels only.然後點close關閉.5.1.1.3 點擊主菜單Control, 在下拉菜單中選取Default Setup, 恢復默認設定. 這一步不會改變使用者偏好設定的內容.如下圖的提示.5.1.1.4 將未接入信號的通道關閉, 此時只連接通道1時,需將通道2, 3, 4關閉.將對應通道下面的勾選取消.5.1.1.5 再從Control菜單中選擇Autoscale. 示波器評估輸入的波形和調整示波器控制,得到一個穩定的波形顯示.另外,基于波形的輸入自動調整投入觸發控制,水平,垂直設置.5.1.2 Multi-purpose功能5.1.2.1 在得到穩定波形后, 點擊主菜單Utilities, 在下拉菜單中選取Multipurpose.示波器執行自動測量.5.1.2.2 測量結果被顯示在測量標籤欄.5.1.2.3 具體單項測量值.例如波形上升時間,如圖.鼠標拖放一個上升時間測量項到波形中,放置不同位置的上升沿時,會顯示相應位置的上升時間.如下圖.5.1.3 测量指定区域波形幅度平均值5.1.3.1 在波形顯示區域內,按住鼠標左鍵框選出需要測量的區域.虛線框內為指定需要測量的區域5.1.3.2 然後釋放鼠標,將出現一個下拉菜單,選擇Waveform Zoom波形放大.5.1.3.3 此時你指定區域的波形顯示在整個顯示區域內.5.1.3.4 在彈出的對話框中,選擇Entire Display,測量區域為整個顯示區域波形.然后點擊OK.5.1.3.5 測量值顯示在底部標籤內.點擊此圖示測量幅度平均值5.2 波形縮放功能波形縮放是用于快速查看一個擴展部分的波形的工具.能讓你觀察關鍵信號在特定位置的細節.5.2.1 Zoom Mode 縮放模式5.2.1.1 鼠標點擊菜單選項Setup,選擇Horizontal setup, 勾選Zoom項.勾選Zoom項,開啟Zoom Mode5.2.1.2 波形可視區域分爲兩個網格.頂部網格包含原始視圖的波形,底部的網格包含水平展開圖.這個部分的波形上的網格包含在框的部分波形顯示在底部的網格.5.2.1.3 觀察波形不同位置部份細節,通過使用介面內水平位置調節欄,可以移動到不同的部分高亮區域的波形.也可以用鼠標移動這個高亮的外框.將光標移動到上方或者下方的邊框,點鼠標左鍵,拖動窗口到它的新位置,然後釋放鼠標按鈕.通過使用水平標尺“秒/格”欄,可以更改擴張倍數.5.2.1.4 調節水平,鼠標點擊菜單選項Setup,選擇Horizontal setup, 分別勾選Main和Zoom區域的vernier進入微調模式, 數值將以藍色高亮顯示出來.如下圖.取消勾選則恢復到粗調控制.5.2.1.5 在Horizontal setup對話框中取消勾選Zoom,恢復到單個網格顯示波形.5.2.1.6 Zoom Mode注意點:即使縮放顯示波形,它們的垂直刻度是相同的.5.2.2 Waveform Zoom 波形縮放5.2.2.1 執行一個波形縮放,按住鼠標左鍵在波形可視區域,框選需要放大觀察的面積.高亮外框,可以用鼠標移動.波形放大顯示區域 藍色高亮顯示進入微調藍色高亮顯示進入微調原始視圖的波形區域 水平位置調節欄水平標尺調節欄5.2.2.2然後釋放鼠標,將出現一個下拉菜單,選擇Waveform Zoom波形放大.5.2.2.3 剛剛框選區域的波形信號將自動放大顯示出來.示波器將改變所有顯示波形的垂直刻度,垂直偏移,水平刻度,水平位置.5.2.2.4 退出Waveform Zoom,在屏幕空白區域點擊鼠標右鍵,菜單中選擇undo zoom.返回顯示原始波形.框選需要放大觀察的面積垂直刻度變化水平刻度,水平位置變化5.2.2.5 Waveform Zoom注意點:不同于縮放模式,它不創建兩個網格.相反它保持網格數量,但是波形的垂直刻度,垂直偏移,水平刻度,水平位置都會發生改變.此功能聚焦于你指定的那部分波形.它可以用來改變所有的輸入通道水平刻度和位置, 記憶波形,或目前顯示的波形運算通道.5.3 波形保存和載入功能使用這個功能可以在以後的時間裏來再現波形, 用來做信號的對比分析.可以查看比允許的輸入通道數量更多的波形,例如,如果你想要同時在屏幕上查看五個模擬波形, 你可以保存一個信號波形到存儲器, 通過存儲器顯示它,然後,再從輸入通道獲取其他四個波形.5.3.1 保存波形.5.3.1.1 保存波形至存儲器5.3.1.1.1 鼠標點擊主菜單選項File ,下拉菜單中選擇Save.5.3.1.1.2 在Save一欄下選擇To Memory1, channel 1. 則此時的波形就保存到存儲器1中的通道1.總共有四個存儲器可以保存.如下圖.5.3.1.2 保存為一個波形文件5.3.1.2.1 保存波形文件在示波器的硬盤中.這樣可以避免你的波形被其他人使用時從存儲器中替換掉.5.3.1.2.2 在Save一欄下選擇 Waveform波形,彈出以下對話框.5.3.1.2.3 選擇需要保存的波形所在通道. 輸入文件名, 點擊Save保存. 如下圖.5.3.1.2.4 保存路徑可以放在C盤下,Waveform資料夾內.路徑C盤下,Waveform資料輸入文件名要保存的波形所在通道5.3.2 載入波形5.3.2.1 從波形存儲器中載入5.3.2.1.1 載入一個波形從波形存儲器. 鼠標點擊菜單選項Setup ,選擇Waveform Memories.5.3.2.1.2 然後點擊一個按鈕在頂部選擇的四個波形儲存位置(m1﹑m2﹑m3或m4).5.3.2.1.3 勾選Display On, 之前保存在Memory1, channel1中的波形則顯示出現在屏幕中了.5.3.2.2 從文件載入波形5.3.2.2.1 從文件載入.鼠標點擊菜單選項File ,選擇Load.5.3.2.2.2 在對話框中選取需要載入的波形文件, 點擊載入. 選擇波形保存資料夾Waveform,從中選擇之前保存的文件.點擊Load 讀取.5.3.3.3 波形保存和載入注意點:在保存/載入波形文件時注意選擇通道,通道1至通道4. 同時僅能保存/載入某一個通道的波形.每條通道對應一個波形,如需保存四個波形,就需要分別保存在四個通道內. 兩種Data 保存選項.四個波形儲存位置從波形載入按鈕All Data —所有的數據,所有數據加載波形數據點進入波形存儲器作為顯示.數據加載到波形存儲器不包括Sin(x)/x插值數字濾波器的數據.On-Screen Data —屏幕上的數據加載只出現在波形可視區域的波形數據,進入到波形存儲器. 如果它是啓用的,加載的數據包括Sin(x)/x插值數字濾波器的數據.5.3.3 存儲器中波形設置軟件介面中,水平,垂直調節部份是通道中的波形,對Memory中的波形調節需要至存儲器波形設置Waveform Memories Setup中調節. 存入波形時無需調節.5.3.3.1 對存儲器中的波形進行調節. 鼠標點擊菜單選項Setup ,選擇Waveform Memories.5.3.3.2 Vertical Scale垂直刻度—控制選擇存儲的波形設置”伏/格”垂直刻度.垂直伸縮變化1-2-5步驟序列變化.勾選Vernier進入微調.5.3.3.3 Offset —偏移,偏移量控制移動波形垂直向上或向下爲選中的波形存儲器.這個控制設置電壓爲代表的中心十字綫的顯示.可以用鼠標拖動波形.使用鼠標左鍵,點擊一個波形,向上或向下拖動,然後釋放鼠標按鈕來調整垂直偏移.5.3.3.4 Horizontal Scale水平刻度—控制選擇存儲的波形設置”秒/格”水平刻度.水平擴展的變化在1-2-5步驟序列變換.你還可以輸入一個數值 ,點擊數值和使用彈出式鍵盤.您可以使用擴展或波形變焦放大存儲波形.E-06代表E的負六次方200us/格5.3.3.5 Horizontal Position—水平位置,位置移動存儲波形水平.也可以用鼠標拖動波形.使用鼠標左鍵,點擊一個波形,左、右拖動,然後釋放鼠標按鈕來調整水平位置偏移.5.3.3.6 Tie Horizontal to Timebase —綁定水平到時基,當啓用時,可以讓你改變波形存儲器波形水平刻度和位置, 使用通道的時基水平刻度位置.5.4 Function信號分析5.4.1 峰值檢測, 可以更好地分析噪聲.5.4.1.1 點選主菜單欄Analyze,選擇下拉菜單Math, 選擇Funtion1,勾選display on.5.4.1.2 在operator中選擇需要運算方式Max, 在Source中選擇信號源通道,通道1.5.4.1.3 此時,如果只要觀察運算波形,可以關閉通道1.5.4.2 平均化, 要分析信號形狀,並忽略噪聲,減少示波器顯示的隨機噪聲.5.4.2.1 點選菜單欄Analyze下Math, 選擇Funtion2, 勾選display on.5.4.2.2 在operator中選擇需要運算方式Average, 在Source中選擇信號源通道,channel1.取均值的個數.可以輸入自定義數量.5.4.2.3 示波器支持將不同的信號分析顯示在同一波形中,為避免混亂,可以將之前的Funtion1的display on勾選取消掉,則只單獨顯示Funtion2分析信息.如下圖.5.4.3 Magnify 運算放大5.4.3.1 點選介面菜單項Analyze, 選擇Math.5.4.3.2 在function1中的operator選取運算類型Magnify.信號源Source1選取channel1.選取運算類型Magnify選擇信號源5.4.3.3 選擇手動控制放大/縮小的水平或垂直刻度的數值, 在Scale欄中輸入一定的值.5.4.3.4 Magnify 運算放大注意點:通過設置Magnify運算放大/縮小的水平或垂直刻度的數值,控制將會更加精確,精准控制縮放比例.5.5 Markers功能應用:用於測量某些不規則的波形或者某脉衝的寬度和上升/下降時間等.兩組在波形顯示區水平和垂直標記, 用于指定的電壓和時間的測量.標記可以設置在任意顯示波形的位置.當你移動標記水平,波形的垂直振幅被跟踪和測量(垂直振幅顯示在標記選項卡底部的顯示區域).在該選項卡中,時間和電壓位置也顯示.垂直(Y)和水平(X)差异的標記顯示爲Δ值.計算并顯示1 /ΔX頻率值.5.5.1 測量某脉衝的寬度, 上升時間, 定位週期測量值.5.5.1.1 測量某脉衝的寬度.使用Markers測量, 點選菜單欄Measure下的Marker,打開Marker設置.Marker LED燈亮.5.5.1.2 在模式中選擇追踪波形模式Track waveforms.屏幕上會出現一組光標(Ax, Bx).在對話框中選擇標記的通道channel 1(即波形所在通道).5.5.1.3 使用滑鼠移動到光標上,點擊左鍵,拖動光標Ax置于脉衝的上升沿, 將另一光標Bx置於脈衝的下降沿.5.5.1.4 底部Marker下的數據△x就是要測的脈衝寬度. 如下圖:光標Bx 置於脈衝的下降沿拖動光標Ax 置于脉衝的上升沿數據△x5.5.1.5 測量某脉衝的上升時間. 點選主菜單Measure下的Markers,打開Markers設置.5.5.1.6 在模式中選擇手動放置模式Manual placement.在對話框中選擇標記的通道channel 1(即波形所在通道).屏幕上會出現兩組光標(Ax, Bx).(Ay, By).5.5.1.7 使用滑鼠移動到光標上,點擊左鍵,拖動光標Ax置于脉衝的底部, 將另一光標Bx置於脈衝的頂部.同樣地,分別將(Ay, By)光標移動至(Ax, Bx)與波形的交點處.5.5.1.8 底部Marker下的數據△x即爲波形的上升時間.△y為幅度.如下圖:拖動光標By拖動光標Ax拖動光標Ay拖動光標Bx5.5.1.9 定位週期測量值. 示波器自動測量了波形週期,通過Markers標記出週期測量位置.確定自動測量是正確與否.5.5.1.10 示波器自動測量後,測量值將顯示在底部欄內.在模式中選擇Track Measurements.5.5.1.11 在週期測量值上鼠標點擊右鍵,勾選Track with Markers5.5.1.12 關閉Markers功能, 打開Markers設置.在模式中選擇Off,即關閉了功能.5.5.1.13 Markers功能注意點:注意Track waveforms模式下,你只能控制水平位置的標記,因爲垂直位置跟踪波形.垂直光標無法拖動它的位置. 因爲它是跟踪波形.Manual Placement: 手動放置,也可以用于振幅測量,但跟踪波形標記Track waveforms模式能提供更好的垂直測量精度.如果沒有自動測量已經選定, Track Measurement Markers這些標記是不顯示的.光標跟縱的就是週期測量位置5.6 觸發功能應用:在波形中定位事件.獲得一個波形穩定的顯示.設置觸發條件,當條件達到時,示波器顯示觸發事件,幷開始尋找下一個觸發事件.這允許設置觸發條件來查找特定的各部分的波形.5.6.1 選擇觸發類型, 使用這些控件來快速確定和設置觸發條件. 可以通過兩種選擇方式(Trigger Gallery觸發器圖示,Trigger Shortcuts觸發器快捷方式) 來選擇.兩種選擇方式結果是一致的.5.6.1.1 通過Trigger Gallery觸發器圖示選擇.5.6.1.1.1 從主菜單選擇觸發Trigger, 單擊Gallery選項.會出現以下對話框.5.6.1.1.2 Trigger Gallery觸發器圖示.爲各種觸發方式顯示所有可能的圖標.通過粗略的瀏覽這些圖標,你可以找到一個適合您的特定需要,雙擊它,示波器將自動配置觸發器設置對話框來匹配你的選擇.5.6.1.2 通過Trigger Gallery觸發器圖示選擇.5.6.1.2.1 從主菜單選擇觸發Trigger,選擇Shortcuts,彈出一個Trigger列表5.6.1.2.2 Trigger Shortcuts —觸發器快捷方式. 當你點擊快捷鍵按鈕,彈出列表描述不同的觸發器.根據你的具體情况,可以從這個列表選擇. 示波器將自動配置觸發器設置對話框來匹配你的選擇.例如,我要設置觸發定格波形中一個很窄的脉衝, 可以通過Shortcuts菜單里選擇A pulse, that is too narrow. 如果我要設置觸發定格波形中一個較低的脉衝, 可以通過Shortcuts菜單里選擇A pulse, that isn’t tall enough.5.6.2 設定觸發5.6.2.1 從主菜單選擇觸發Trigger,單擊設置觸發Setup Trigger選項.如下圖.5.6.2.2 在對話框中有多種不同類型的觸發,選用最常用的是邊緣觸發.選擇Edge觸發類型.新示波器支持多種觸發類型,邊沿(Edge),毛刺(Glitch),脈寬(Width), 矮波(Runt),窗口(Windows),延時(Time-out),間隔(Interval),斜率(Slew rate), 碼型(Pattern).根據波形需求來選擇.5.6.2.3 選擇Source觸發波形通道,波形通道為channel 1.5.6.2.4 點擊Level觸發電平,可以直接輸入數值,也可以點擊旁邊的箭頭調節大小.5.6.2.5 觸發方式,讓你選擇是否觸發在上升沿或者下降沿,這裡選擇觸發上升沿.5.6.2.6 掃描方式Sweep,通過點選,在兩種模式之間進行切換Auto, Trig'd.默認設置為自動. Auto—自動掃描觸發模式使示波器在缺乏設定觸發條件的情況下觸發,示波器等待一段時間由示波器的自動設置觸發條件,當你不確定如何設置觸發條件來觸發示波器.Trig'd—僅當檢測到有效觸發條件時,才更新顯示波形.5.6.2.7 注意點:任何輸入通道,輔助輸入觸發,或綫輸入可作爲觸發源.在Single單步採集模式,通過按下主菜單Control中的[Single],在這種情况下它停止尋找下一個觸發事件.選擇觸發器觸發波形通道 觸發電平選擇觸發方式掃描方式。

輕鬆自如地運用邏輯分析儀應用手冊1337目錄前言35512172023示波器或邏輯分析儀什麼是邏輯分析儀時序分析儀的基本概念狀態分析儀的基本概念有效率地使用數位工具如何連接到標的系統結語用對工具可以幫助您在較短的時間內順利克服數位除錯挑戰，而在挑選適合的工具之前，務必先瞭解您可以使用的工具有哪些，以及它們最擅長的應用。

本應用手冊會帶您快速綜覽邏輯分析儀的基本概念，文中不會提到太多詳細的量測，但會清楚敘述邏輯分析儀的功用。

我們會探討諸如“為何必須使用邏輯分析儀？”及“邏輯分析儀可以幫我做些什麼？”之類的問題。

/find/logic 2? ?示波器或邏輯分析儀? 當有機會可以選擇使用示波器或邏輯分析儀時，許多工程人員都會選擇示波器，這是因為大多數的使用者都對示波器比較熟悉，但示波器在某些應用上會有一些限制。

依您想完成的作業而定，邏輯分析儀所產生的資訊可能更為有用。

由於示波器與邏輯分析儀有部分功能是重複的，因此在某些情況下兩者皆適用。

該如何決定哪一種儀器對您的應用更有利？讓我們看看幾個基本的原則。

何時應使用示波器當您要查看信號的細微電壓變化時當您要求較高的時間間隔準確度時 一般來說，當您需要較高的垂直或電壓解析度時，選用示波器就對了。

換言之，如果您要查看每個電壓的總改變值，如圖1所示，則應使用示波器。

包括新一代數位示波器在內的許多示波器，也能提供相當高的時間間隔解析度，亦即它們可以非常準確地量測兩個事件間的時間間隔。

總之，當您需要參數資訊時，請使用示波器。

圖1.示波器波形3何時應使用邏輯分析儀當您必須一次查看許多信號時當您必須如硬體一般來查看系統中的信號時當您必須在幾個高、低位準信號的碼型上觸發及查看結果時 邏輯分析儀是由示波器衍生而來，並以相同於示波器的一般方式來呈現資料：水平軸為時間，垂直軸為電壓振幅。

雖不像示波器能提供較高的電壓解析度或時間間隔準確度，但邏輯分析儀一次擷取及顯示幾百個信號的能力卻是示波器所不及的。

安捷伦U1600A 系列手持式数字示波器在同类手持式示波器中提供了最优异的功能和性能产品技术资料引言U1600A 系列手持式数字示波器拥有4.5英寸LCD 彩色显示器，能够清楚地区分两条通道之间的波形。

这一U1600A 系列为安装、维护、服务和汽车行业中的专业技术人员提供了高性能诊断和质量保证工具。

U1600A 系列由两种型号组成:U1602A-20 MHz 示波器和U1604A -40 MHz 示波器。

每种型号都提供了高达200 MSa/s 的实时取样速率。

用户可以使用双波形数学运算(DWM)和快速傅立叶变换(F F T )功能(在U1604A 中)，在时域和频域中进行快速波形分析。

内置6000点分辨率的真正RMS 数字万用表(DMM)标配自动量程功能，用户可以灵活地执行迅速准确的仪表测量功能，包括电压测量、电阻测量和辅助测量。

此主要特点三合一解决方案: 双通道示波器，真正的RMS DMM 和实时数据记录程序4.5"大型彩色LCD 显示器高达40 MHz 的带宽，支持高级触发高达200 MSa/s 的取样速率125,000点/通道的波形内存深度(最大记录长度)6000点DMM 分辨率，提供22种自动测量功能11种内置测量功能，包括电压表、电阻表和辅助仪表缩放和双波形数学运算功能(U1604A 中增加了FFT 功能及四种窗口技术)通过PC Link 应用软件全面进行远程控制和数据传送USB 1.1全速接口连接能力支持多语言快速帮助外，U1600A 系列还标配数据记录功能，用户可以合并一串数据点，进行数据记录。

在一部仪器中同时提供示波器、真正的RMS DMM 和实时数据记录程序U1600A 系列为当前极具挑战性的行业环境提供了强健、可靠的高性能手持式波形和仪表测量工具。

这一仪器不仅提供全功能示波器功能，而且提供了6000点的真正RMS DMM 及实时数据记录程序。

DMM 由11种测量功能组成，包括电压表(用于DC 电压测量、AC 电压测量、真正的RMS AC +DC 电压测量)、电阻表 (用于2线电阻、电容、二极管和连续性测试)和辅助仪表(用于温度测量、电流、湿度和压力测量)。

安捷伦⽰波器使⽤⽅法Jitter Analysis Techniques Using an Agilent Infiniium OscilloscopeProduct NoteIntroductionWith higher-speed clocking and data transmission schemes in the computer and communications industries, timing margins are becoming increasingly tight.Sophisticated techniques are required to ensure that timing margins are being met and to find the source of problems if they are not.This product note discussesvarious techniques for measuring jitter and points out theiradvantages and disadvantages. It describes how to set up an Agilent Infiniium oscilloscope to make effective jitter measure-ments and the accuracy of these measurements. Some of themeasurement techniques are only available on Agilent 54845A/B and 54846A/B oscilloscopes with version A.04.00 or later software.These measurement techniques are indicated as such in the text.Jitter FundamentalsJitter is defined as the deviation of a transition from its ideal time.Jitter can be measured relative to an ideal time or to another transition. Several factors can affect jitter. Since jitter sources are independent of each other,a system will rarely encounter a worst-case jitter scenario. Only when each independent jitter source is at its worst and is aligned with the other sources will this occur. As a result, jitter is statistical in nature. Predicting the worst-case jitter in a system can take time.Jitter can be broken down into two categories:Random jitter is uncorrelated jitter caused by thermal or other physical, randomprocesses. The shape of the jitter distribution is Gaussian.For example, a well-behaved phase lock loop (PLL) wanders randomly around its nominal clock frequency.?Deterministic or systematic jitter can be caused by inter-symbol interference,crosstalk, sub-harmonicdistortion and other spurious events such as power-supply switching. It is important to understand the nature of the jitter to help diagnose its cause and, if possible, correct it. Deterministic jitter is more easily reduced or eliminated once the source has been identified.Jitter Measurement TechniquesThis product note will discuss four methods that can be used to characterize jitter in a system:Infinite persistenceHistogramsMeasurement statisticsMeasurement functionsInfinite PersistenceAgilent’s Infiniium oscilloscopes present several different views of jitter. One way to measure jitter is to trigger on one waveform edge and look at another edge while infinite persistence is turned on. To use this technique, set up the scope to trigger on a rising or falling edge and set the horizontal scale to examine the next rising or falling edge. In the Display dialog box, set persistence to infinite.This technique measurespeak-to-peak jitter and does not provide information about jitter distribution. Infinite persistence is easy to set up and will acquire data quickly, giving you the best chance to see worst-case jitter. However, since the tails of the jitter distribution theoretically go on forever, it will take a long time to measure the worst-case, peak-to-peak jitter.It is important to understandtheerror sources of this measurement. This technique is subject to oscilloscope trigger jitter–the largest contributor to timingerror in an oscilloscope. Trigger jitter results from the failure to place the waveform correctly relative to when a trigger event occurs. Since the infinite persistence technique overlaps multiple waveform acquisitions onto the scope display, and each acquisition is subject to trigger jitter, the accuracy of this technique can be limited. If your jitter margins are being met using this technique, then more advanced measurement techniques are not necessary. This product note will discuss Infiniium’s timebase and trigger specifications in detail in alater section.HistogramsThis technique not only shows worst-case jitter, but also gives a perspective on jitter distribution. Histograms do not acquire infor-mation as quickly as infinite persistence since each acquisition must be counted in the histogram measurement.To set up a histogram, trigger on an edge and set the horizontalscale and position so that you canview the next rising or fallingedge. In the Histogram dialog box,turn on a horizontal histogramand set both Y window markersto the same voltage. For example,if a clock threshold is at 800 mV,set both Y markers to this voltage.Set the X markers to the left andright of the edge (figure 1). Figure 1. Histogram of edge showing bi-modal distribution23It is often possible to determine if the jitter is random or deter-ministic by the shape of the histogram. Random jitter will have a Gaussian distribution.Infiniium displays the percentage of points within mean +/- 1, 2,and 3 standard deviations to help in determining how Gaussian the distribution is. For a Gaussian distribution these values should be 68%, 95%, and 99.7%, respec-tively. Non-Gaussian distributions usually indicate that the jitter has deterministic components.This technique has the same limitation on accuracy as the infinite persistence technique.Multiple acquisitions contribute to the histogram and they all contain the oscilloscope trigger jitter mentioned above. Measurement StatisticsThe next method involvescomputing statistics on waveform measurement results. For example,the scope can measure the period of a waveform on successive acquisitions. Simply drag the period measurement icon to the waveform that is to be measured.The statistics will indicate the mean, standard deviation, and min and max of the period measurements. You can let the scope run for a while to determine the amount of clock jitter present. This measurement is not subject to trigger jitter because it is a delta-time or relative measure-ment. Even if the waveform is not placed correctly relative to the trigger, the edges are measuredaccurately relative to each other.Figure 2. Setting up a jitter measurementThis measurement is subject to the timebase stability of the instrument, which is typically very good. This is a valid measurement technique but is slow to gather statistical information. Since the scope acquires a waveform, makes a measurement, and then acquires a waveform at a later time, most clock periods are not measured.With this technique, it is impossible to see how the period jitter varies over short periods of time. For example, if you have spread-spectrum clocking, this measurement will lump the slowest and fastest periods together.The Agilent 54845A/B and54846A/B Infiniium oscilloscopes can compute statistics on every instance of a measurement in asingle acquisition. To enable this capability, select the Jitter tab,then check “Measure all edges” in the Measurement Definitions dia-log box (figure 2).For example, instead of only measuring the first period on every acquisition or trigger event,every period can be measured and statistics gathered. This greatly increases the speed at which statistics are gathered and reduces the overall time to make jitter measurements. Statistics are accumulated across allmeasurements in the acquisition and across acquisitions.Pressing “Clear Display” will reset the measurement statistics.This feature is useful if you are probing the clock at different locations and want to reset the measurements.It is important to set up the scope correctly to make effective jitter measurements. Set the vertical scale of the channel being measured to offer the largest waveform that will fit on screen vertically. This will make the most effective use of the scope’s A/D converter.The scope should be set toreal-time acquisition mode inthe Acquisition dialog box. Since equivalent-time sampling can combine samples from different acquisitions, the scope’s trigger jitter would adversely affect jitter measurements. The averaging function should be turned off since, again, this combines multiple acquisition data.You may want to set the scopeto its maximum memory depth. This will make the scope less responsive to operate, but the scope can make many measure-ments on a single acquisition. Since jitter measurements are statistical, many measurements are desirable. Taking many acquisitions of small records will give a more random selection but will take longer than fewer large acquisitions. Having extremely deep memory is not necessary to getting good jitter measurements. Normally, measurements aremade at 10%, 50%, and 90% of thewaveform amplitude. This isconvenient for quickly makingmeasurements; however, whenmaking measurements acrossacquisitions and combiningtheir statistics this is not thebest solution.In the Measurement Definitiondialog box, Thresholds tab, themeasurement thresholds shouldbe set to absolute voltages. Forexample, if you are makingcycle-cycle jitter or periodmeasurements, set the middlevoltage threshold to your clockthreshold. Set the upper andlower voltage thresholds toroughly +/- 10% of the signalamplitude in voltage. This willestablish a band around thethreshold that the edge must gothrough to be measured and willeliminate false edge detection.In addition to the period jitter measurement, the cycle-cycle jitter measurement uses the same technique. The cycle-cycle jitter measurement, available on Agilent 54845A/B and 54846A/B oscilloscopes, is the differenceof two consecutive period measurements.Pi – P(i-1), 2 ≤i ≤nWhereP is a period measurement and n is the number of periods inthe waveform.Cycle-cycle jitter is a measure of the short-term stability of a clock. It may be acceptable for the clock frequency to change slowly over time but not vary from cycle to cycle. For this measurement, every period in the acquisition is measured regardless of how the “Measure all edges” selection is set. In this case, the statistics represent all of the cycle-cycle jitter measurements in one acquisition, or all acquisitionsif the scope is running.If absolute clock stability is required, then a period measurement should be made. If your system can track with small changes in the clock frequency, then cycle-cycle jitter should be measured.Again, if your timing marginsare being met with thistechnique, more advancedtechniques are not necessary. Itis only fairly recently that tightertiming margins have causedengineers to need other jittermeasurement techniques.45Measurement FunctionAgilent 54845A/B and 54846A/B Infiniium oscilloscopes can plot measurement results correlated to the signal being measured. For example, if every period is meas-ured, as in the case above, the measurement function will plot period measurement results on the vertical axis, time-correlated to the waveform that the period measurement is measuring (figure 3).In this example, the secondperiod is slightly longer than the first. The third period is shorter than the second. Also notice that the lengths of the measurement function lines correspond to the period and their placement corresponds to channel 1 because we are measuring period on channel 1.Using this technique, the shape of the jitter is apparent. For example, with spread-spectrum clocking you can see the modulation frequency as the period gets progressively slower and faster. This allows you to see sinusoidal shapes or other patterns in the measurement function plot (figure 4). It is also possible to correlate poor jitter results with the source waveform that caused them. This can aid not only in your design but can also ensure that the scope is measuring appropriate voltage levels when gatheringjitter statistics.Figure 3. Measurement function on a few cyclesFigure 4. Measurement function on many cyclesTo turn on the measurement function, first turn on the desired measurement to track. Measurements that can be tracked with the measurement function are rise time, fall time, period, frequency, cycle-cycle jitter, + width, - width and duty cycle. The measurement function is enabled in the Waveform Math dialog box (figure 5). Select a function that is a different color than the channel you are measuring to make it easier to see. Set the function operator to “measurement.” Select the measurement you wish to track and turn on the measurement function. The math function now plots the measurement results on the vertical axis, time-correlated to the channel being measured. Only one measurement function can be enabled at a time; however, the function can beset to track any of the currently active measurements listed above.Set up the acquisition by selectingthe maximum memory depth inthe Acquisition dialog box. Turnoff averaging and Sin(X)/Xinterpolation in the Acquisitiondialog box. Set the sample rateso that you are getting at leastseveral sample points on theedges that you are measuring.Measurements are made on thedata that is windowed by thescreen. To see something slowerthat may be coupling into yourclock, for example, you will needto compress the channel data onthe screen.Now that the memory depth andsample rate are fixed, you canadjust the horizontal scale sothat all of the acquired data ison screen. In order to make fulluse of the A/D converter andseparate the waveforms on thedisplay, you may want to split thegrid into two parts. If you havea very dense waveform that isbeing measured, it will be nearlyimpossible to see the measurementfunction on top of it. Turn on thesplit grid in the Display dialog box. Figure 5. Setting up a measurement function6Sources of Measurement ErrorIn this section we will examine some of the principal sources of jitter measurement error. For best accuracy, the scope should be making measurements at the same temperature as when the scope was last calibrated. If the temperature has varied by more than 5 degrees, the softwareself-calibration should be performed again. The Calibration dialog box shows the change from the calibration temperature. Trigger JitterThe most common source of error across multiple acquisitions is trigger jitter. This is the error associated with placing the first point and all subsequent points of the waveform relative towhen the trigger occurs.For Infiniium models 54830B, 54831B, and 54832B, trigger jitter is 8 ps RMS. For the 54845A/B and 54846A/B, trigger jitter is8ps RMS. Figure 6 shows a 54845B measuring its trigger jitter using its own aux out signal. If the jitter is Gaussian, youcan convert RMS jitter topeak-to-peak jitter by multiplyingthe RMS jitter by 6. Trigger jitteris only relevant if you aremeasuring absolute times asopposed to relative times. Forexample, the histogram techniquedescribed above has this errorsource, but a period measurementdoes not since it is a delta-time orrelative measurement.Figure 6. Histogram of trigger jitterThis source of error can also bepresent in period measurementsif the scope is in equivalent time.In equivalent time, the scope maycombine data points from multipleacquisitions. The scope alsocombines points from multipleacquisitions in real-time averagingmode. If it is possible, jittermeasurements should be maderelative to other edges inreal-time, non-averaged mode.78Sources of Measurement Error (continued)Timebase StabilityInfiniium uses a highly stable crystal oscillator as a source for the sample clock. Errors resulting from instability of the timebase are the least significant. Timebase stability is not a specified quantity but is typically 5 ps RMS for the 54845 and 54846. For the 54830,54831, and 54832, it is typically 2ps RMS. These measurements were made at the sametemperature as the calibration.Vertical NoiseErrors in the vertical portion of the signal path including the A/D converter and preamplifier also contribute to the scope’s jitter.Any misplacement of thewaveform vertically will translate through the slew rate of the signal into time error (figure 7). If the slew rate of the signal atthe point of measurement issteep, then the vertical error will translate into a small time jitter.If the slew rate is slow, however,this can be the most significantsource of error.Figure 7. How vertical errors contribute to time errorsAliasing and InterpolationFrom the previous section, it is clear that the signal should have a high slew rate to alleviate vertical errors. However, this can lead to signal aliasing. If the signal is not sampled sufficiently, significant time errors will be present up to the sample interval. When the scope makes measurements, it interpolates the samples above and below the measurement threshold to get the time of the level crossing. If the interpolation filter is enabled, up to 16interpolated points may be placed between two adjacent acquisition samples. Beyond this, linearinterpolation is used to determine the threshold crossing times.However, samples will only be added if the record length is less than 16K samples.A Case StudyTo illustrate how to use the jitter analysis capability of an Agilent Infiniium oscilloscope, let’s examine a typical problem. You suspect that your power supply or another slower speed clock is coupling into the main clock on the board that you are designing. In order to understand how to eliminate the problem, you would like to know the frequency and wave shape of the signal that is coupling into your clock. Traditionally, you would use an FFT magnitude spectrum and look at the side bands from the fundamental. For example, in figure 8 we have acquired a long record of a number of clock pulses and computed the FFT magnitude with a waveform math function. After we zoom in on the fundamental frequency of the clock, you can see side bands.If we take the difference in frequency from the fundamental to the nearest side band, we can determine the frequency of the coupling signal. In this example, it is measured at 198 kHz. We can also notice the odd harmonics and guess that the coupling signal would not be a sine wave. The resolution of the FFT will not give us a great deal of accuracy in determining the frequency, and we can not really see the shape of the coupling signal.To solve this problem using thejitter analysis capability, we needto think about the problem in adifferent way. If a slower signalwere modulating a higherfrequency signal, then we wouldexpect the period of the higherfrequency signal to get slightlylonger, then slightly shorter, etc.,according to the slower signal(figure 8). The measurementfunction method described earlierin this product note could beused to plot how the periodchanges across the waveform.To set up the scope, acquirethe channel data with a longacquisition record in real-timeacquisition mode. Put all of thewaveform on screen by settingthe sample rate to manual andadjusting the time per division.This will allow you to see how theperiod varies across the entireacquisition. In the MeasurementDefinitions dialog box, Jitter tab,set the control to Measure AllEdges (figure 2). Now, turn ona period measurement. In theMath dialog box, turn on theMeasurement function and setto the period measurement. Figure 8. FFT of clock910A Case Study (continued)You can now see how the period measurement varies across the signal (figure 9). Adjust the time per division until you can see several periods of the slower speed signal in the measurement function. To measure the frequency, use the markers or simply drag the frequencymeasurement to the measurement function. Using this technique, we measure 197 kHz and we can see that the signal is a square wave.This confirms that another signal on the board is coupling into the clock. Armed with this knowledge,we are better equipped to find a solution.SummaryThis product note presents several methods for measuring jitter with Agilent’s Infiniium oscilloscopes. The following quick reference will help you choose the best method for a number of circumstances. Infinite PersistenceShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Sets up easily ?Acquires data quickly ?Measures only worst-case,peak-to-peak jitterFigure 9. Measurement function showing coupling signalHistogramsShows absolute time or edge jitter Works best when the jitter to be measured is greater than the scope’s jitter Shows a distribution of the jitterHelps determine if the jitter is random or deterministic Measures worst-case, peak-to-peak jitter Measures RMS jitterMeasurement StatisticsShows worst-case, peak-to-peak delta time or measurement jitter Sets up easily Measurement FunctionsShows how measurements vary as a function of timeShows the shape and frequency of a jitter source Helps determine if the jitter is random or deterministic/doc/e26170104431b90d6c85c778.htmlAgilent Technologies’ Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive, while minimizing your risk and problems. We strive to ensure that you get the test and measurement capabilities you paid for and obtain the support you need. Our extensive support resources and services can help you choose the right Agilent products for your applications and apply them successfully. Every instrument and system we sell has a global warranty. Support is available for at least five years beyond the production life of the product. Two concepts underlie Agilent's overall support policy: "Our Promise" and "Your Advantage."Our PromiseOur Promise means your Agilent test and measurement equipment will meet its advertised performance and functionality. When you are choosing new equipment, we will help you with product information, including realistic performance specifications and practical rec-ommendations from experienced test engineers. When you use Agilent equipment, we can verify that it works properly, help with product operation, and provide basic measurement assistance for the use of specified capabilities, at no extra cost upon request. 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Experienced Agilent engineers and technicians worldwide can help you maximize your productivity, optimize the return on investment of your Agilent instruments and sys-tems, and obtain dependable measurement accuracy for the life of those products./doc/e26170104431b90d6c85c778.html /find/emailupdatesGet the latest information on the productsand applications you select.By internet, phone, or fax, get assistance with all your test & measurement needsOnline assistance:/doc/e26170104431b90d6c85c778.html /find/assistPhone or FaxUnited States:(tel) 800 452 4844Canada:(tel) 877 894 4414(fax) 905 282 6495China:(tel) 800 810 0189(fax) 800 820 2816Europe:(tel) (31 20) 547 2323(fax) (31 20) 547 2390Japan:(tel) (81) 426 56 7832(fax) (81) 426 56 7840Korea:(tel) (82 2) 2004 5004(fax) (82 2) 2004 5115Latin America:(tel) (305) 269 7500(fax) (305) 269 7599Taiwan:(tel) 0800 047 866(fax) 0800 286 331Other Asia Pacific Countries:(tel) (65) 6375 8100(fax) (65) 6836 0252Email: tm_asia@/doc/e26170104431b90d6c85c778.htmlProduct specifications and descriptions in this document subject to change without notice. Agilent Technologies, Inc. 2002 Printed in USA October 15, 20025988-6109EN。