TR—8001和TR—6020测试系统
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单相变压器变比测试仪RaytechTR-1技术参数Ask for more.TR-1 /TR-1P90211.FL.1513.? y0.8 ... 4000± 0.08% Rdg 5 Digits 0 A ...1 A -10°C to 60°C 3.2 kg (7.0 lbs.)85 to 264 V AC 47... 63 Hz 12 V DC charging 产品简介全自动测试,电池供电,极性反转功能,连续性测试,Pass/fail 判断功能,带充电适配器,TR-1P 内置打印机模块。
单相测试线 3 meters ?操作手册Toolbox软件(需TRO 107一起使用)技术参数接口RS232串口 (with optional interface adapter)内存50 组测试数据显示LCD 图形显示带背光前面板密封电镀处理型号TR-1 andTR-1P (with printer)尺寸(field case)L: 270 mm (10.62”) W: 245 mm (9.68”) H: 125 mm (4.87”)重量3.2 kg (7 lbs.)TRO 10110 meters 延长线?TRO 106DC 车充?TRO 107带线的串口通用规格附件选件0.8...100±0.08%Rdg ±1LSD5 Digits TR-1 / TR-1P变比量程精度分辨率电流量程重量操作温度供电电源德国GMC-Instruments集团高美测仪(天津)科技有限公司/ GMC-Instruments (TianJin) Co., LTD.电励士(上海)电子有限公司/ GMC-I(ShangHai)Power Measurement CO., LTD.。
全功能电脑型耐受性测试器TRANSIENTRA2000使用说明书1、说明1.0 瞬态干扰源1.0.1开关切换感应EFT群脉冲工业测量和控制设备(继电器、电流接触器等)通常与传统控制单元一起工作,如荧光灯、镇流器、半自动咖啡研磨机、吸尘器、演示机组、电吹风、普通发动机等在任何电源系统中,在开关机转换时,所有这些设备主要会产生干扰感应电、脉冲波形如下图所示:脉冲参数为:脉冲的上长时间Ts为 ns级;重复频率f4从KHz到MHz;能量:几毫焦(mJ);电压振幅Ubmax可达几KV;一个脉冲时间为几毫秒;不同的EFT源产生不同的脉冲波形,一种典型的脉冲波形如下图所示:一般EFT源的阻抗较高,因此连接电缆的电容量将会影响上长时间。
1.0.2 静态放电ESD什么原因导致静态放电?当人走在绝缘地面上会带有静电,人体的电容量可被充至几千伏。
当身体与其它带电元件或系统接触时这个容量会被放电。
很多情况下,这种放电象火花一样明显,并且使被接触的人有一种触电的感觉,对人体没有伤害,但对于敏感的现代电子设备,放电的电流会给系统带来干扰,或导致整个系统坏死。
25年来,电子行业一起很清楚:每天都会发生的静态放电问题会给电子设备带来灾难性的后果。
由此带来的损失很难统计,世界范围内大约可致数十亿美元。
受影响的范围大致可为:集成电路的生产制造业(芯片生产厂家)化学工业,如由静态放电火花引起的爆炸、火灾;由1.0.3 间接闪电冲击此冲击是一种带有高能量,相应低频可达几KV的瞬时现象。
闪电是一种日常现象,在世界上大约44,000个暴风雨中心里可能会出现8百万次。
大约每秒放电100次。
飞机上的测量记录设备在每1000个飞行小时中记录下一次闪电现象。
在许多工业领域中,产品的实现往往依赖于现代电子,最常见的导致损害的原因是过压,这种过压是由机器本身转换而产生的,或者由大气放电如闪电引起的。
为使过压不至于损坏电子设备,往往在其输入或者输出中加入电路保护元件。
YTC-1000微机继电保护测试仪用户操作手册目录第一章继电保护测试仪说明 (3)1.1主要技术特点 (3)1.2主要技术指标 (4)1.3面板说明 (7)1.4硬件结构 (8)1.5仪器的操作使用 (9)1.6注意事项 (11)第二章继电保护测试仪使用方法 (13)2.1递变试验×7 (13)2.2递变试验×12 (18)2.3状态序列 (22)2.4谐波试验 (25)2.5整组试验 (30)2.6差动保护试验 (35)2.7频率试验 (41)2.8同期试验 (44)2.9电流-时间特性试验 (47)2.10电压-时间特性试验 (50)2.11故障再现 (53)2.12距离保护试验 (62)2.13零序保护试验 (67)2.14阻抗特性试验 (71)附录1:试验方法 (76)附录2:差动保护知识 (85)附录3:配置清单 (89)附录4:售后服务 (90)前言YTC1000微机继电保护测试仪是在参照中华人民共和国电力行业标准《继电保护微机型试验装置技术条件》(DL/T 624 ─ 1997)的基础上,广泛听取用户意见,总结目前国内同类产品优缺点,充分使用现代先进的微电子技术和器件实现的一种新型小型化微机继电保护测试仪。
它采用可单机独立运行,亦可联接其它电脑运行的先进结构,主机内置高性能工控机和高速数字信号处理器,真16位DAC 模块、新型模块式高保真大功率功放,自带TFT真彩色LCD显示器和嵌入式微机键盘。
既可以单机独立操作,也可以连接笔记本电脑操作。
操作功能强大,体积小,精度高。
既具有大型测试仪优越的性能、先进的功能,又具有小型测试仪小巧灵活、操作简便、可靠性高等优点,性能价格比高。
是继保工作者得心应手的好工具。
第一章继电保护测试仪说明1.1 主要技术特点微机型继电保护测试仪其主要特点表现为:●经典的Windows XP操作界面,人机界面友好,操作简便快捷,为了方便用户使用,定义了大量键盘快捷键,使得操作“一键到位”;●高性能的嵌入式工业控制计算机和8.4〞大屏幕高分辨力彩色TFT液晶显示屏,可以提供丰富直观的信息,包括设备当前的工作状态、下一步工作提示及各种帮助信息等;●配备有超薄型工业键盘和光电鼠标,可以象操作普通PC机一样通过键盘或鼠标完成各种操作;●配备有外接USB接口,可以方便地进行数据存取和软件维护;●无需外接其它设备即可以完成所有项目的测试,自动显示、记录测试数据,完成矢量图和特性曲线的描绘;●采用高性能D/A转换器,产生的波形精度高、线性好,并且具备良好的瞬态响应和幅频特性。
1.前言2.测试波形格式3.测试功能说明4.测试信道动作说明5.I C测试程序制作6.连接P r o b e r或H a n d l e r量产测试7.测试统计报表分析8.测试问题与讨论1.前言非常感谢您采用T R-6020I C测试机,本I C测试机随货附有”T R-6020硬件使用手册”及”T R-6020软件使用手册”,但为了让您加快对T R-6020 I C测试机的学习及应用脚步,特别编写了”T R-6020实用手册”,本手册将会针对1.测试波形2.测试机测试原理3.测试机测试信道4.测试程序的编写及除错5.测试相关问题的讨论等内容,由浅入深的介绍给您。
本手册的内容将会陆续增加,我们会将有关I C测试的一些测试原理、技巧及经验加入本手册,同时也欢迎I C测试界的先进们,也能提供您宝贵的测试经验加入本手册,让我们相互分享I C测试的乐趣。
本手册的内容将会放进本公司的网站内,欢迎D o w n l o a d。
我们的连络资料:E-Mail:*************.twTel:886-2-28328918Fax:886-2-28310567德律科技股份有限公司2. 测试波形格式2.1. T R -6020 I C 测试机提供N F (N o -F o r m a t ),R T Z (R e t u r n t oZ e r o ), R T O (R e t u r n t o O n e ),S B C (S u r r o u n d B yC o m p l e m e n t )4种波形格式,其详细波形格式如图(一)所示:2.2. 一个实际的测试波形,除了N F ,R T Z ,R T O ,S B C 波形格式的设定,还需要设定该波形T e s t P e r i o d 值,T i m i n g G e n e r a t o r 的S t a r t 及S t o p 值,V i h 值及V i l 值。
美国Credence公司Electra MSR 100MHz概述·100MHz量测速率的功能验证性设备,具有Funtional Pattern产生、仿真、测试,DC参数量测等功能。
·非常适合IC设计公司进行样片芯片验证性测试及分析特性:·4M的向量存储深度/通道完整的功能Pattwen和DC参数测试系统·UNIX系统的操作软件,可视化友好界面·Shmoo Plot工具, 用于器件特性分析 ·可连接LABVIEW辅助性工具·直接连接到工作站服务器系统规格·时钟频率:100 Mhz·数据速率:200 Mbits/Sec·1.5 ns的上升和下降时间(ECL、CMOS 电路)·每个管脚的电压和负载可编程·每个管脚可编程边缘分辨率50 ps·7 bits per Channel for Simultaneous Real-time·Compare and Data Acquisition·时钟线形稳定,偏差≦±100 ps·系统偏差≦±1ns (ATS1)·每个管脚可选用直流精密测量单元·Window、Edge和Dual-Edge 采样·128个I/O管脚(ATS1)·APMU:直流精密测量单元·2.1 Gb扩展图形存储器·PCI-GPIB 和PCI-VXI接口板·Sun Ultra 10 工作站系统软体功能·TestEnv:基于Xwindows的测试软件环境,包括·IMS Screens、IMS-Shmoo、TestLITE和·MATSS测试服务器·IMS-Link:提供脱机向量转换软件编辑能力和通用仿真器支持·TestVIEW (V7.2e) :图形测试编程语言系统模组Module·Control Module x1·Timing module x1· Data module x8·Analytical DC PMU module x1Socket Card 种类及数量·DIP Auto Socket Card 40 *1·ATS1/MSTS1 Anolog Interface Board *1·Force Autocal Interface Board *1·Open Custom DUT Interface Board *13·ATS1/MSTS Fixture Board *1·Force Autocal *1·Compare Autocal *1·IMS Adapter Board *1概述:·专为10MHz逻辑IC测试机, 具有Function Pattern测试, Dc参数量测等功能硬件结构:特性:·2M的向量存储器深度·可4组并行测试·完整的功能Pattwen和DC参数测试·驱动电压:+-8V,比较电压:6V·具有Shmoo Plot工具, 用于器件特性分析·测试程序调试工具·完善的测试诊断报告和柱状图·TTL和GPIB接口, 可直接连接至prober和handler·紧凑小型,易安装资源配置:·测试控制器:奔腾III以上PC·系统软件:MS-DOS·电源要求:(1)单相交流,AC 110V 10A /50-60Hz(2)单相交流,AC 220V 6A /50-60Hz性能参数:·测试频率:10MHz·周期速率:100nS-1.31mS·周期分辨率:20nS·测试通道:最大128个·多组测试:2/4组并行测试·定时器:4Pins/TG·定时器分辨率:10nS·闸门模式:边沿式·测试向量深度:2M·驱动器:VIH:+-8V 分辨率:5mV·VIL:+-8V 分辨率:5mV·比较器:VOH:+-8V 分辨率:5mV·VOL:+-8V 分辨率:5mVPMU:1组/板卡,最大8组施加电压/ 测量电流范围:级别电压精确度分辨率0 10V +%+-5mV 2.5mV1 10V +%+-5mV 2.5mV2 10V +%+-5mV 2.5mV3 10V +%+-5mV 2.5mV施加电流/ 测量电压范围:HVPMU:2组/板卡,最大16组施加电压/ 测量电流范围:施加电流/ 测量电压范围:概述·10MHz的测试频率,128个测试通道,4M字节向量深度的大规模LSI测试系统系统尺寸·主框架:580(W),750(D),1200(H)或1850(H)毫米·测试头:580(W),340(D),250(H)毫米·电缆长度:4 米测试器控制器·处理器AMD-K6-500·操作系统MS/DOSV·内存32MB·硬盘4.0GB·软盘3.5英寸1.44MB接口板·标准接口板针对探针机和机械手·GPIB 接口板选项PIN电子性能·标准64 PIN·全系统128 PIN 或64PIN*2DUTS软件包·语言 C (库:TURBO C)·工具软件SCHMOOHISTOGRAMWAFERMAP·测试程序转换器ANDO-SUMMIT 至V7100 (主程序和波形程序)SENTRY 至V7100 (波形程序)CREDENCE-SC212 至V7100 (波形程序)ADVANTEST-MOSPL 至V-7100 (波形程序)驱动器·输出电压VIH 0V 至+11V VIL -2V 至+8V·电压摆幅100mVp-p 至11Vp-p·精度0.5% + 5mV·分辨率2.7mV·最大DC 电流输出="H"±20mA 输出= "L"±20mA·阻抗50 ± 5%ohm·升/ 降时间驱动器模式< 5ns/5Vp-p(20% 至80%) I/O 模式< 5ns/5Vp-p·总时钟精度 (NRZ 格式) ±5ns ( 最大 )·时滞 (NRZ 格式 ) 有关PINS ±5ns ( 最大 )·有关TGS ±4ns ( 最大 )·上突波 / 下突波 3%+50mV· VIH/VIL 级别 4 级别·驱动器模式 FIX-HI, FIX-LO, NRZ, /NRZ,RZ, /RZ, R1, EXOR, /EXOR,·无调制·时钟的限制参照图 1条件: 10Mohm 和 15pF 载荷描述:特性和用途:·用于Credence的Electra MSR 100MHz机台上,根据客户器件封装尺寸设计制作专用的定制型测试接口板,有效解决高速信号干扰之问题。
用户手册TektronixTR210线路板综合测试仪(以英文手册为准)保修本产品享受泰克公司生产上的所有条件,自您从我们授权经销商处购买之日起,享受一年免费保修。
如果在保修期内,本产品非人为故障,出现质量问题,泰克公司将免费提供零件和维修费用。
但是电池不在保修范围之内。
目录目录一、安全注意事项………………………………………………………………………………………………… 1-1二、产品介绍和性能……………………………………………………………………………………………… 2-12-1 什么是“V-I曲线分析”……………………………………………………………………………… 2-2 2-2 设置外接电源……………………………………………………………………………………………2-32-3 更换仪器保险管…………………………………………………………………………………………2-42-4 选择外接电源50/60HZ频率……………………………………………………………………………2-42-5 检查TR210附件(装箱单)…………………………………………………………………………… 2-4 2-6 安装与连接测试线………………………………………………………………………………………2-52-7 操作………………………………………………………………………………………………………2-62-8 说明………………………………………………………………………………………………………2-72-9 附件与选件………………………………………………………………………………………………2-8三、快速操作 ……………………………………………………………………………………………………… 3-13-1 前面板……………………………………………………………………………………………………3-23-2 后面板……………………………………………………………………………………………………3-43-3 示波器显示………………………………………………………………………………………………3-5 开机………………………………………………………………………………………………………3-53-6 范围选择…………………………………………………………………………………………………3-63-7 测试频率选择……………………………………………………………………………………………3-63-8 通道选择…………………………………………………………………………………………………3-63-9 脉冲源……………………………………………………………………………………………………3-7四、具体使用TR210 ………………………………………………………………………………………… 4-14-1 V-I模拟曲线分析——它如何测试……………………………………………………………………4-24-2 水平轴……………………………………………………………………………………………………4-34-3 垂直轴……………………………………………………………………………………………………4-44-4 基本模拟曲线——开路和短路…………………………………………………………………………4-54-5 四种基本的“元件模拟曲线” …………………………………………………………………………4-7 五、测试无源元件………………………………………………………………………………………………5-15-1 电阻……………………………………………………………………………………………………5-15-1-1 短路与开路,电阻故障……………………………………………………………………………… 5-4 5-1-2 论述……………………………………………………………………………………………………5-45-1-3 故障分析应用…………………………………………………………………………………………5-2-1 电容模拟曲线………………………………………………………………………………………… 5-75-2-2 在Low2(低电压)范围时,不同同容的曲线 …………………………………………………… 5-8 5-2-3 了解电容的模拟曲线………………………………………………………………………………… 5-95-2-4 电容故障——泄漏……………………………………………………………………………………5-105-2-5 论述 ………………………………………………………………………………………………… 5-115-2-6 应用……………………………………………………………………………………………………5-115-3 电感 ………………………………………………………………………………………………… 5-115-3-1 电感模拟曲线 ……………………………………………………………………………………… 5-125-3-2 在Low2(低电压)范围时,不同电感的曲线…………………………………………………… 5-13 5-3-3 电感曲线上,Fs频率的响应 ……………………………………………………………………… 5-135-3-4 了解电感的模拟曲线 ……………………………………………………………………………… 5-145-3-5 论述 ………………………………………………………………………………………………… 5-145-3-6 应用 ………………………………………………………………………………………………… 5-155-4 机电开关元件 ……………………………………………………………………………………… 5-165-4-1 手动操作机械开关 ………………………………………………………………………………… 5-165-185-4-3 机电继电器 …………………………………………………………………………………………5-185-4-4 继电器线圈测试 ……………………………………………………………………………………5-185-4-5 用脉冲发生器,测试5V簧15继电器 …………………………………………………………… 5-19 5-4-6 论述 …………………………………………………………………………………………………5-20六、测试分立半导体………………………………………………………………………………………… 6-16-1 二极管…………………………………………………………………………………………………6-16-1-1 二极管模拟曲线………………………………………………………………………………………6-16-1-2 二极管曲线上,频率Fs的响应 …………………………………………………………………… 6-3 6-1-3 混合二极管曲线 ……………………………………………………………………………………6-36-1-4 二极管故障 …………………………………………………………………………………………6-46-1-5 二极管内部电阻缺陷……………………………………………………………………………… 6-4 6-1-6 二极管内部泄漏缺陷……………………………………………………………………………… 6-6 6-1-7 齐纳二极管………………………………………………………………………………………… 6-7 6-1-8 论述………………………………………………………………………………………………… 6-8 6-1-9 应用………………………………………………………………………………………………… 6-8 6-2 晶体管……………………………………………………………………………………………… 6-9 6-2-1 三极管曲线………………………………………………………………………………………… 6-9 6-2-2 三极管基极曲线…………………………………………………………………………………… 6-10 6-2-3 确定不熟悉三极管………………………………………………………………………………… 6-12 6-2-4 达令顿三极管曲线………………………………………………………………………………… 6-14 6-2-5 使用脉冲发生器,测试晶体管…………………………………………………………………… 6-15 6-2-6 分析晶体管的激活特性…………………………………………………………………………… 6-166-5-1 光耦合器曲线……………………………………………………………………………………… 6-20 6-6 可控硅和三端双向可控硅开关元件(Triass)………………………………………………… 6-21 6-6-1 可控硅……………………………………………………………………………………………… 6-21 6-6-2 可控硅的激活特性………………………………………………………………………………… 6-23 6-6-3 Triass(三端双向可控硅开关元件)…………………………………………………………… 6-24 6-6-4 Triass激活特性 ………………………………………………………………………………… 6-25 6-6-5 论述………………………………………………………………………………………………… 6-26 6-6-6 应用………………………………………………………………………………………………… 6-26 七、测试集成电路……………………………………………………………………………………………7-17-1 数字集成电路……………………………………………………………………………………… 7-1 7-1-1 数字集成电路的故障……………………………………………………………………………… 7-1 7-1-2 数字集成电路的曲线……………………………………………………………………………… 7-2 7-1-3 数字IC芯片的曲线…………………………………………………………………………………7-3 7-1-4 不同逻辑芯片文件的曲线………………………………………………………………………… 7-4 7-1-5 对二个TTL元件比较测试………………………………………………………………………… 7-4 7-1-6 CMOS逻辑元件……………………………………………………………………………………… 7-5 7-1-7 CMOS元件和测试信号频率Fs……………………………………………………………………… 7-7 7-1-8 排除数字逻辑IC片的故障………………………………………………………………………… 7-8 7-1-9 数字芯片(ICS)的比较测试……………………………………………………………………… 7-9 7-1-10 论述 ……………………………………………………………………………………………… 7-10 7-1-11 应用 ……………………………………………………………………………………………… 7-10 7-2 模拟电路…………………………………………………………………………………………… 7-11 7-2-1 运算放大器………………………………………………………………………………………… 7-11 7-2-2 运算放大器曲线…………………………………………………………………………………… 7-12 7-2-3 排除运算放大器电路故障………………………………………………………………………… 7-13 7-2-4 线性电压调节器…………………………………………………………………………………… 7-14 7-2-5 论述………………………………………………………………………………………………… 7-15 7-2-6 应用………………………………………………………………………………………………… 7-15一、安全注意事项为了保证本产品正常使用,而非人为操作损害;同时操作者为了自身安全考虑和避免火灾发生,请注意以下几个问题。
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TR-8001OperationTest Research, Inc.A-2 Operation (3)A-2-1How to Enter the TR-8001 Test Screen (3)A-2-1-1Turning on the Machine (3)A-2-1-2 Entering the Test Screen (4)A-2-1-3 Turning Off the Machine (6)A-2-2 Testing the DUT Board (6)A-2-2-1 Selecting the DUT Board (6)A-2-2-2 Testing Screen (10)A-2-2-3 Testing Control Box (13)A-2-2-4 How to Test (15)A-2-3 Replacing Fixtures (17)A-2-3-1 Installing the Fixture (17)A-2-3-2 Removing Fixture (17)A-2-4 Emergency Switch (19)A-2-5 Test (20)A-2-5-1 Day Report (20)A-2-5-2 Testing Defective Report (22)“ATE POWER”3. Continue to click on “Quit’ to enter the next screen (as shown inFigure A-2-1-2-Fig04).Figure A-2-1-2-Fig04A-2-1-3 Turning Off the Machine1. Close all windows of this system, and terminate the ATE testprogram2. Turn off the computer.3. Turn off the SRS power switch on the right side of theinstrument table.4. Turn off the power switch on the left side of the instrumenttable.A-2-2 Testing the DUT BoardA-2-2-1 Selecting the DUT Board(as shown in Figure A-2-2-1-Fig01)Figure A-2-2-1-Fig01down menu, which are the commonly used functions: <Board Select> and <Test> to facilitate the user’s operation. We can use the left button of the mouse to direclty click on such function. Select the <File> and <Board Select> or directly click on the <Board Select> icon, and then the following window will appear and list the selected boards. Each line shows three data: board name, test data filename, and working directory path (you may select the option at the lower left corner of the window to show the path). Double click the left button of the mouse to select the board as the DUT Board, or move the blue rod to the desire board and then select <OK> (as shown in Figure A-2-2-1-Fig02).Figure A-2-2-1-Fig022. Board Select-Bar Code/ID: After <File> and <Board Select-BarCode/ID> are selected, the following window will appear (as shown in Figure A-2-2-1-Fig03).*Note: If we click on the icon for the selection, we must go to the system parameter setup and enter the screen of the Board Select-Bar Code/ID first (as shown in Figure A-2-2-1-Fig04).The following window will appear and list the selected board (Bar Code/ID) Each line has four data: board name, path, Fixture Bar Code/ID, and the DUT Bar Code. There are two bar code inputs at the lower left corner of the window, and you canshown in Figure A-2-2-1-Fig05).Figure A-2-2-1-Fig034. Delete the test baord: In the pull-down menu, select<File><Delete Board> and then the following window will appear (as shown in Figure A-2-2-1-Fig07). Select the desiredprogram for uninstallation.*Cautions: The existing working directory cannot be deleted directly. If you want to delete the directory, please change directory and then delete.Figure A-2-2-1-Fig07A-2-2-2 Testing ScreenSelect <Test> and <ICT Test> or directly click on the (ICT Test) or <Test> icon to display the following test window and start testing. Such window is divided into 5 parts, and the test procedure at upper left corner, the test time at the upper right corner, the test stauts and result in the middle, the test statistical data at the lower left corner, and the accessory function at the lower right corner (as shown in Figure A-2-2-2-Fig01).Figure A-2-2-2-Fig011. Testing ProcedureIt displays the DUT Board name, test sequence, and total test steps. The test sequence includes four sections: open circuit test, short circuit test, IC open test, and parts test. It displays the test procedure set by the user, and the total number of the test steps includes the steps of testing all parts.Test Time StatisticsIt displays the number of tests, total test time, and test time for this time. In addtition, it also displays the skip, real, and fail steps.System Test Status and Test ResultThe test status is shown in the upper left section of this area, and mainly divided into:a. Ready to start testing: The system is ready. Press the TESTor RETEST button of the machine to perform the circuit board test .b. Failed Open Circuit: The open circuit test of the circuit boardis failed.c. Failed Short Circuit: The short circuit test of the circuit boardis failed.d. Failed Parts: The parts test of circuit board is failed.e.IC Parts Fail: The IC compontnet test is failed.f. Passed Item: The circuit board is passed.g. Operator Aborts Test.When the system test status is ready for testing, users may press the TEST button of the machine to perform the board test. The system test status will show the messages of the open ciriuit test, short circuit test, IC open test, and parts test according to the current test progress. If there is a fail in the testing procedure, the system test status will show the messages of failed open circuit, failed short circuit, failed IC Open, and failed parts according to the failed conditions.A complete circuit board test is divided into 5 sections: Discharge, Open, Short, IC Open, and Parts. If the test completes a certain section, then the corresponding light on the left side of this area will change color. The light was yellow, and green light indicates the normal procedure of the test and red light indicates the abnormal procedure of the test. The test result will be shown on the right side of the window, and the current test procecure is shown in the middle of the window.2. Test Data StatisticsIt displays the number of tests, number of passes, number of failed open circuits, number of failed short circuits, number of failed parts and their percentage for today. For each tested circuit board, the test statistical data will be computed and shown in this area.3. Accessory Functionsa. Testing Circuit Board (F5): When the pressing machine ispressed, we can perform the test directly.b. Stoping the Test (F6): Do not stop testing the board during thetest while the pressing machine is raised.c. Saving the Day Report (F1): The day report is saved into thehard disk. When user finishes with this system, the day report will be saved to the hard disk automatically.d. Printing Failed Component List (F12): The failed test reportis printed. When users sets at the <Edit> and <Test Parameter > not to automatically print the failed component list, the usermay press “F12” to print the failed component list after thetest.f. Printing the Day Report (F3): The day report is printed out.g.Displaying failed parts list (CTRL-F): After the test iscompleted, it shows the data of the failed parts. In thiswindow, you can set up the dipslay types: All, Component, ICDiode, IC Empty Solder, and high pressure.h. Editing the Test Data (F11): Entering the editor to edit thetest data.i. Displaying Failed Open/Short Circuit List (CTRL-O): Afterthe test is completed, it displays the failed open/short circuit data.j. Showing the Diagram of the Failed Parts Position (CTRL-R):The x-axis of the circuit board is divided into at most 8 rowsA-H, and the y-axis into 8 columns 1-8. The screen shows thecorresponding position of the failed components to facilitaterepair and maintenance. The number of rows and columns ofeach circuit board can be set up in <Edit> and <TestParameter>.k. Viewing the Diagram of the Componenet of the Circuit Board(CTRL-V): If the circuit board is tested to be failed, we canuse Board-View to quickly and conveniently locate the position of the failed component and reduce the time forlooking for the failed components. However, when using thisfunction, the CAD files such as PINS.ASC, NAILS.ASC, andFORMAT.ASC are needed. Users may use the followinginstruction to look for specified component and the test pinposition.If the user wants to exit the test, select <Exit> from the upperright section of the screen.A-2-2-3 Testing Control Box(As shown in Figure A-2-2-3-Fig01)1. VACUUM: If the VACUUM Light is on, it indicates VACUUMDOWN, and the fixture stand is either moving downward or thefixture stand has dropped on the Interface. If the VACUUM light is dimmed, it indicates VACUUM UP and the fixture stand is moving upward.2. HP/GR ADAPTOR: It will connect the interface of the fixtureand the interface of the adaptor.3. Press the TEST button to start testing (as shown in Figure A-2-2-4-Fig03).Figure A-2-2-4-Fig034. After the test is completed, lift the lid to remove the test baord(as shown in Figure A-2-2-4-Fig04).Figure A-2-2-4-Fig04Figure A-2-3-2-Fig012. Pull out the fixture in parallel (as shown A-2-3-2-Fig02).Figure A-2-3-2-Fig02A-2-4 Emergency Switch1. If there is a power failure, we should turn off the master power ofthe server. Turn the power on again when the power supply issteady.2. If there is abnormality on any system, press the emergency switchon the front left section of the instrument table and notice the related engineering staff. After the system emergency switch is pressed, the power required by the TR-8001 system will be turned off, but the power supply for the PC and monitor will continue.3. After the emergency switch is pressed, rotate the emergency switchthe pressing machine are pressed to perform the test, the statisitcal data of the test will be accumulated in the testing section. If both of the RETEST and DOWN bottons are pressed to perform the test, the statistical data of this test will be accumulated to the retest section. The difference between the two is to provide different statistical data for users. The DUT Board after repair can be used for retesting and distinguishing from general test. The last row has two numeric values representing the ratio of pass rates, having the significance as follows:PPY Yield Rate (First Time Test Yield Rate) = Number of Passed Items for the First Time/Total number of Tests for the First Time Passed Yield Rate = (Number of Passed Items for the First Time +Number of Retest Items)/Total Number of Tests for the First TimeThe statistical analysis of the above table is as follows:1. The number of DUT Boards for that day is 200 pieces, and thetest result shows there are 180 passed pieces (the rate is 90.0%),5 failed open circuit pieces (the rate is 2.5%), and 10 failedcomponent pieces (the rate is 5.0%).2. After the repair, retest the 20 pieces of original failed boardswherein 10 pieces are passed, 3 pieces are failed open circutit (rate is 15.0%), 2 pieces are short circuit (rate is 15.0%), and 5 pieces of failed components (rate is 25.0%).3. Therefore, the number of DUT Boards for that day is 220 pieces,wherein 190 pieces are passed item (rate is 86.4%), 8 pieces are open circuit boards (rate is 3.6%), 7 pieces of short circuit boards, (rate is 3.2%), and 15 pieces of failed components (rate is 6.8%).4. PPY Yield Rate = 180 / 200 = 90.0%Passed Yield Rate = (180+10) / 200 = 95.0%F2 U17 Pin 26Pin <642> ---> Component connected to test point 64228 E2 JP8-1-2 642 229 E2 JP9-1-2 642 2Pin <4> ---> Component connected to test point 41 A1 JFUSE 8 4440 A1 C6/C1 4 1Pin <5> ---> Component connected to test point 5394 A2 C18 5 1574 A1 L1 11 5Pin <11> ---> Component connected to test point 11208 A2 RN19-3-4 11 2574 A2 L1 11 5A3 U22 Pin 10A4 U34 Pin 27********** Component Fail *********1 R50_1 M_V:9999.99 Dev:+999.9% Test Step 1, Component R50_1,Real value 9999.99Deviated percentage +999.9%Act_V: 50.00 Std_V: 50.00 Loc: A1 Real component value 50.00Component standard value 50.00, Position A1 H-Pin:1 L-Pin:2 +LM:+8% -LM:-8% High test point is 1; low test point is 2.Upper limit of standard value is +8%Lower limit of standard value is -8%7 R100_1 M_V:9999.99 Dev:+999.9% Test Step 7, Component R100_1,Real value is 9999.99Deviated percentage +999.9%Act_V: 100.00 Std_V: 100.00 Loc: A1 Component real value 100.00Component Standard value 100.00, Position A1 H-Pin:4 L-Pin:5 +LM:+8% -LM:-8% High test point is 1; low test point is 2Upper limit of standard value is +8%Lower limit of standard value is -8%。
铁路维护及轨道检测仪器设备表1. 引言本文档旨在提供一份铁路维护及轨道检测仪器设备表,以便于对铁路设备进行清单和管理。
2. 仪器设备清单以下是铁路维护及轨道检测所需的仪器设备清单:3. 设备描述以下是对部分仪器设备的简要描述:3.1 轨道测量仪 (XYZ-100)轨道测量仪用于测量铁路轨道的几何参数,如轨距、轨向、高低等。
其精准度确保了轨道维护的标准化和安全性。
3.2 轨道探伤设备 (DEF-200)轨道探伤设备用于检测铁路轨道的内部缺陷,如裂纹、疲劳等。
通过非破坏性检测,及时发现潜在的安全隐患。
3.3 绝缘电阻检测仪 (GHI-300)绝缘电阻检测仪用于检测轨道电气绝缘的状况,确保轨道电气系统的可靠性和耐久性。
3.4 磨轮机 (JKL-400)磨轮机用于轨道磨削,保持轨道表面的光滑度,从而提升列车的行车舒适度和安全性。
4. 设备维护与管理为确保仪器设备的可靠性和持续性运行,以下措施应得到落实:- 定期对仪器设备进行维护保养,包括清洁、校准、更换零部件等。
- 对设备进行定期的运行测试和质量检查,及时发现和排除故障。
- 建立仪器设备档案,包括设备型号、购买日期、维修记录等信息。
- 在使用过程中,严格遵循设备的操作手册和安全操作规程。
- 培训维护人员,确保其具备操作和维护设备的能力和技术。
5. 总结本文档提供了铁路维护及轨道检测仪器设备清单和简要描述,以及相关的维护与管理措施。
通过对设备的清晰管理,铁路维护工作将更加高效、安全和可靠。
> 注意:本文档仅作参考,实际需根据具体情况进行调整和完善。
TR—8001和TR—6020测试系统
周道南
【期刊名称】《世界产品与技术》
【年(卷),期】2001(000)010
【总页数】2页(P22-23)
【作者】周道南
【作者单位】德律泰电子(深圳)有限公司上海代表处
【正文语种】中文
【中图分类】TN407
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