FPGA外文资料100

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I.
INTRODUCTION来自FPGA test is divided into two categories, manufacture test process (MTP) and application test process (ATP). FPGA vendors concentrate on MTP, while FPGA users are more interested in ATP. The research approach adopted in the paper is MTP-oriented. Generally, test for a FPGA is supposed to consist of two steps. The first step is to configure a FPGA-under-test due to the fact that a FPGA cannot perform any logic function without configuration. Then, the configured FPGA-under-test can be scanned after applied by a testbench in the second step. Usually, time spent on configuration is much greater than time spent on scanning. Traditionally, Automatic Test Equipment (ATE) is utilized to test a FPGA. However, function of FPGA configuration is not available for ATEs. Therefore, a test circuitry with configuration chips for FPGA-under-test is required to be designed and fabricated on PCB. Then a PC is employed to generate and download configuration file to the configuration chips before the PCB is mounted on an ATE to be tested. Due to configuration needed to be conducted many times, power supply should be switched off before the PCB is disconnected from an ATE and configured again by the PC. The aforementioned procedure has to be repeated many times until a FPGA is tested fully. Moreover, a large amount of manual work has been involved. In addition, the time spent on FPGA test is dominated by the number of configurations for FPGA. As FPGA array size grows, the number of configurations will increase exponentially. Consequently, the test time will reach astronomical numbers if every resource in FPGA will be covered. Therefore, ATE test scheme is much more expensive for start-up companies, universities and research institutes engaging in FPGA design and test. The problem of automatic FPGA test can be addressed by our in-house SOC (System-on-a-chip) co-verification technology based FPGA functional test system [5].
SOC HW/SW Co-Verification Technology for Application of FPGA Test and Diagnosis
A.W. Ruan, Y. Wang, Shi. K, Z.J. Zhu, Q.Wu, X. Han, Y.B. Liao
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China Chengdu, 610054, China
This keynote is organized as follows. In Section II, an in-house developed FPGA test and diagnosis system based on the HW/SW co-verification technique is introduced. We have investigated algorithms for FPGA test and diagnosis covering all FPGA resources such as logic resources, interconnect routings (IRs), input/output blocks (IOBs), RAMs, et al with minimum configuration numbers in Section III. The last section is conclusion for the paper. II. HW/SW CO-VERIFICATION BASED SYSTEM FOR FPGA TEST SOC HW/SW co-verification is defined as two different simulator coupled to each other to complete the simulation of a single design. As for FPGA-based simulation acceleration, software HDL simulator and FPGA emulator are used as these two simulator, working together to verify a single large design. The major benefit of FPGA-based co- verification is that simulation speed is increased since a design-under-test (DUT) is executed by high-performance FPGA emulator, while good debug capability is preserved by logic simulator. Our FPGA test system shares the identical low-level architecture of our in-house SOC Co-verification system [4]. The differences between the two systems lie in two aspects. First, a configuration module has been added in hardware part of the FPGA test system. Second, automatic configuration and automatic scan for FPGAs have been realized in the system. As shown in Figure 1, the FPGA functional test system is composed of a PC and associated software tools, a mother board as hardware subsystem and a daughter board for a FPGA-under-test. The hardware subsystem consists of three blocks, or PCI interface, test control circuitry and socket for the FPGA-under-test.
Abstract-Process of configuration and fault scan is required to be repeated many times before all resources of a FPGA-under-test are tested and diagnosed. Both FPGA test system and test schemes have been studied and presented in the keynote. Construction of the in-house developed FPGA test system is based on SOC HW/SW co-verification technology. Algorithms for FPGA test and diagnosis covering all FPGA resources such as, configurable logic blocks (CLBs), interconnect resources (IRs), input/output blocks (IOBs), wide edge decoder, et al with minimum configuration numbers are also discussed. Not only multiple faults in FPGA can be detected, but location and type of the multiple faults can also be determined by the FPGA test system and associated test schemes. Furthermore, 100% fault coverage can be achieved in experiment.