E300 Electronic Overload RelayBulletin Numbers 193, 592Selection GuideE300 Electronic Overload RelayWhat’s InsideTopic Page Bulletin 193/592-E300 Overview3 Bulletin 193/592-E300 Product Selection11 Sensing Modules11 Control Modules12 Accessories13 Bulletin 193/592-E300 Specifications15 Bulletin 193/592-E300 Approximate Dimensions232Rockwell Automation Publication 193-SG010E-EN-P - January 2016OverviewBulletin 193/592-E300 OverviewThe E300 Electronic Overload Relay is the newest technology for overload protection. Its modular design, communication options, diagnostic information, simplified wiring, and integration into Logix technology make this the ideal overload for motor control applications in an automation system.E300 Electronic Overload Relays provide the following benefits:•Intelligent motor control (EtherNet/IP enabled)• Scalable solution• Diagnostic Information• Integrated I/O• Adjustable trip class 5 (30)• Wide current range• Test/Reset button• Programmable trip and warning settings• True RMS current/voltage sensing (50/60 Hz)• Protection for single- and three-phase motorsNOTE: Y our order must include 1) the Cat. No. of the sensing module, control module, and communication module selected, and 2)if required, Cat. No. of any accessories.Standards Compliance and CertificationsStandards Compliance CertificationsUL508UL ListedUL1053 (Class I and Class II)CE MarkedUL 60947-1CSA CertifiedUL 60947-4-1CCCEN 60947-1KCCEN 60947-4-1CSA22.2, No. 14CSA22.2, No. 60947-1CSA22.2, No. 60947-4-1GB 14048.4Product OverviewThe E300 relay consists of three modules: sensing, control and communications. You have choices in each of the three with additional accessories to tailor the electronic overload for your application’s exact needs.Rockwell Automation Publication 193-SG010E-EN-P - January 201634Rockwell Automation Publication 193-SG010E-EN-P - January 2016OverviewSensing ModuleSensing Options• Voltage/current/ground fault • Current/ground fault • Current Current Range [A]• 0.5...30• 6...60•10...100•20 (200)Control ModuleCommunication Module•EtherNet/IPExpansion Digital I/OYou can add up to four additional expansion digital modules to the E300 relay expansion bus. • 4 inputs/2 relay outputs •24V DC •120V AC •240V ACExpansion Analog I/OYou can add up to four additional expansion analog modules to the E300 relay expansion bus. • 3 universal analog inputs/1 analog output •0…10V •0…5V •1…5V •0…20 mA •4…20 mA•RTD (2-wire or 3-wire)•0…150 Ω•0…750 Ω•0…3000 Ω•0…6000 Ω (PTC/NTC)Control Voltage I/OI/O and Protection (1)(1)Includes PTC thermistor and external ground fault.Inputs Relay OutputsInputs Relay Outputs110…120V AC, 50/60 Hz 4322220…240V AC, 50/60 Hz432224V DC6342Product Selection Bulletin 193/592-E300 Product SelectionSensing ModulesDescription Mounting Options Current Range [A]For Use With Cat. No.CurrentIEC Contactors0.5 (30)100-C09…C23193-ESM-I-30A-C23100-C30…C55193-ESM-I-30A-C556…60100-C30…C55193-ESM-I-60A-C5510…100100-C60…100-C97193-ESM-I-100A-C9720…200100-D115…100-D180193-ESM-I-200A-D180DIN Rail / Panel Mount PowerTerminals0.5…30All contactors and external current transformers193-ESM-I-30A-T6 (60)All contactors193-ESM-I-60A-T10…100193-ESM-I-100A-T20…200193-ESM-I-200A-T DIN Rail / Panel Mount PowerTerminals.Directly replaces 193-ECPM_0.5…30All contactors and external current transformers.193-ESM-I-30A-E3T6 (60)All contactors193-ESM-I-60A-E3T10…100193-ESM-I-100A-E3T DIN Rail / Panel Mount Pass-thru0.5…30All contactors and external current transformers193-ESM-I-30A-P6 (60)All contactors193-ESM-I-60A-P10…100193-ESM-I-100A-P20…200193-ESM-I-200A-P NEMA Contactors0.5 (30)NEMA Size 0 (2)592-ESM-I-30A-S26…60592-ESM-I-60A-S210…100NEMA Size 3592-ESM-I-100A-S320…200NEMA Size 4592-ESM-I-200A-S4Current/Ground FaultIEC Contactors0.5 (30)100-C09…C23193-ESM-IG-30A-C23100-C30…C55193-ESM-IG-30A-C556…60100-C30…C55193-ESM-IG-60A-C5510…100100-C60…100-C97193-ESM-IG-100A-C9720…200100-D115…100-D180193-ESM-IG-200A-D180DIN Rail / Panel Mount PowerTerminals0.5 (30)All contactors193-ESM-IG-30A-T6…60193-ESM-IG-60A-T10…100193-ESM-IG-100A-T20…200193-ESM-IG-200A-TDIN Rail / Panel Mount PowerTerminals.Directly replaces 193-ECPM_0.5…30193-ESM-IG-30A-E3T6…60193-ESM-IG-60A-E3T10…100193-ESM-IG-100A-E3TDIN Rail / Panel Mount Pass-thru0.5…30193-ESM-IG-30A-P6…60193-ESM-IG-60A-P10…100193-ESM-IG-100A-P20…200193-ESM-IG-200A-P NEMA Contactors0.5 (30)NEMA Size 0 (2)592-ESM-IG-30A-S26…60592-ESM-IG-60A-S210…100NEMA Size 3592-ESM-IG-100A-S320…200NEMA Size 4592-ESM-IG-200A-S4Rockwell Automation Publication 193-SG010E-EN-P - January 201611。
The Designer’s Guide Community downloaded from A Test Bench for Differential CircuitsKen KundertDesigner’s Guide Consulting, Inc.Version 1d, 12 September 2006Introduces a new test bench constructed using ideal baluns that makes the simulation ofdifferential circuits easier and less error prone.Last updated on September 12, 2006. You can find the most recent version at www.designers-. Contact the author via e-mail at ken@.Permission to make copies, either paper or electronic, of this work for personal or classroom useis granted without fee provided that the copies are not made or distributed for profit or commer-cial advantage and that the copies are complete and unmodified. To distribute otherwise, to pub-lish, to post on servers, or to distribute to lists, requires prior written permission.Designer’s Guide® is a registered trademark of Kenneth S. Kundert. All rights reserved. Copyright©2002-2006, Kenneth S. Kundert – All Rights Reserved1 of 7A Test Bench for Differential Circuits The Traditional Test Bench2 of 7The Designer’s Guide Community 1.0The Traditional Test BenchConsider the test bench shown in Figure 1.This test bench, or some variation of it, iscommonly used when simulating differential circuits. While it does generally get the jobdone, it has a number of short comings. First, driving the device-under-test, or DUT,with a purely differential input requires that the stimulus be applied from two sources,V dm1 and V dm2. Doing so is somewhat of a bother, and represents a potential source oferror. If the stimulus is only applied to one source, or if the stimuli are applied differ-ently from both sources, then the signals that drive the DUT will contain an undesiredcommon-mode component that can cause erroneous results. In addition, determining thedifferential output signal requires measuring a floating voltage, again this is somewhatof a bother because many waveform viewing tools do not make displaying floating sig-nals as easy as they should.The differential source impedance seen by the DUT is R in1 + R in2 and the common-mode source impedance is R in0 + R in1 || R in2. Similarly, the differential load impedanceseen by the DUT is R out1 + R out2 and the common-mode load impedance is R out0 + R out1|| R out2. Thus, controlling the source and load impedance involves setting several resistorvalues. To maintain differential symmetry, one must always assure that R in1 = R in2 andR out1 = R out2. Again, maintaining these relationships is both a bother, and a potentialsource of errors. In addition, there is a lower bound on the common-mode impedancesthat is set by R x 1 || R x 2.This test bench is improved somewhat in Figure 2. In this case, the negative input to theamplifier is created using a controlled source that mimics the voltage on the positiveinput. In this way, to specify a differential input you only need set the voltage on onesource, which reduces the effort needed to adjust in the input and reduces the chance oferror. In addition, the floating output voltage is converted to a ground-referred signalwith a controlled source. This addresses some of the issues of the test bench of Figure 1,but not all. In particular, you would have to specify the input on the differential sourcesas half the desired differential input voltage, a possible source of confusion and error. Inaddition, while a ground-referred version of the output voltage is now available, onewould still have to go through the trouble of making differential measurements for the input voltage and both the input and output currents if they were desired.2.0The New Test BenchImagine that instead of constructing a test bench for differential circuits using a combi-nation of simple resistors and voltage sources as in Figure 1, that one had an ideal blockFIGURE 1.Traditional test set-up used when simulating a differential amplifier.+−+−+−+−V cm V dm1V dm2R in1R in2+−R out2R out1R out0R in0DUTThe New Test Bench A Test Bench for Differential Circuits 3 of 7The Designer’s Guide Community that maps between two distinct ground-referred signals and a balanced pair of signals.The two distinct signals would represent the differential- and common-mode compo-nents of the balanced signals. Thus, if v d and v c represent the distinct signals represent-ing the differential- and common-mode components, and v p and v n make up thebalanced pair of signals, thendifferential-mode voltagev d = v p – v n (1)common-mode voltagev c = ½(v p + v n )(2)positive voltagev p = v c + ½v d (3)negative voltage v n = v c – ½v d (4)Now, while we are dreaming, lets further imagine that the block does the same mappingfor the currents, and sodifferential-mode currenti d = ½(i p – i n )(5)common-mode currenti c = i p + i n (6)positive currenti p = ½i c + i d (7)negative current i n = ½i c – i d (8)These voltages and currents are shown in Figure 3.Then a test bench could be created for a differential circuit that allows you to easily cre-ate differential- and common-mode stimuli, probe differential- and common-moderesponses, and set the differential- and common-mode source and load impedances.Such a test bench is shown in Figure 4.This balanced/unbalanced converter, or balun, can be constructed with two ideal trans-formers, as shown in Figure 5. The implementation of an ideal balun using a Spectre 1subcircuit is given in Listing 1, and using a Spice subcircuit is given in Listing 2. FromFIGURE 2.Somewhat improved test set-up for simulating a differential amplifier.FIGURE 3.Balun voltages and currents.+−+−+−V cm V dm1V dm2=V dm1R in1R in2+−R out2R out1R out0R in0DUT +−+−V outd = v od v od p n d c v p v dv c v ni p i n i di cA Test Bench for Differential Circuits The New Test Bench 4 of 7The Designer’s Guide Communitywithin Artist, the ideal balun was made available in analogLib (ideal_balun ) in the 2002time frame. If you have an earlier version of Artist, you can build one as shown inFigure 5 using ideal transformers (xfmr from analogLib).Notice that the balun is bidirectional. Either the unbalanced signals (d for differentialmode and c for common mode) or the balanced signals (p for positive and n for nega-tive) can act as the inputs or the outputs. This means that the same circuit is used at the1.Spectre is a registered trademark of Cadence Design Systems.FIGURE 4.New test bench for differential circuits.FIGURE 5. A balun for converting ground-referred differential-mode (d) and common-mode (c) signals tobalanced positive (p) and negative (n) signals. Ideal transformers are used, and so the balun works and is accurate at all frequencies, including DC.LISTING 1.Balun for Spectre implemented using ideal transformers.// BALUN//// A bidirectional balanced-unbalanced converter.// Maps between the unbalanced signals ‘d’ and ‘c’ and the balanced signals ‘p’ and ‘n’.simulator lang=spectresubckt balun (d c p n)T1 (d 0 p c) transformer n1=2T2 (d 0 c n) transformer n1=2 ends balun V dm+−+−+−DUT p n d c p n d c R id +−V cm R ic R od R ocPCD N2:12:1Applying the Test Bench A Test Bench for Differential Circuits 5 of 7The Designer’s Guide Community input of a differential amplifier to convert the stimuli to the balanced form needed todrive the amplifier, and at the output to separate the balanced output into distinct differ-ential-mode and common-mode signals for easy measurement. Furthermore, since it isimplemented with ideal transformers the balun works for all frequencies, including DC.This is a feat that is not possible using real transformers.With this test bench, driving the DUT with a differential stimulus only requires settingthe stimulus on one source. Similarly, the differential- and common-mode input and out-put voltages and currents can all be observed by probing at one point. Finally, one con-trols the differential- and common-mode source and load impedances by specifying the value of a single resistor for each, and they are completely independent of each other.3.0Applying the Test BenchConsider a slightly enhanced test bench as shown in Figure 6. In this version, outputsources have been added so that the bias point at the load can be controlled. They willalso be used when measuring output impedance. The first step in tailoring the test benchto a particular DUT is to determine the needed differential- and common-mode sourceand load impedances, and setting R id , R ic , R od , and R oc accordingly. Then determine theneeded bias points and set the DC levels of V id , V ic , V od , and V oc accordingly. For exam-ple, if one were testing an LVDS buffer, one might set R id = R od = 100Ω, R ic = R oc =10k Ω, V id = V od = 0V , and V ic = V oc = 1.2V .LISTING 2.Balun for Spice implemented with controlled sources. This balun implements the idealtransformers using controlled sources. The resistors are present only to prevent Spice fromcomplaining about phantom topology errors.∗ BALUN∗∗ A bidirectional balanced-unbalanced converter.∗ Maps between the unbalanced signals ‘d=1’ and ‘c=2’ and the balanced signals ‘p=3’ and ‘n=4’..subckt balun (1 2 3 4)∗ Ideal transformer for the positive inputE1 5 2 1 0 0.5V1 3 5F1 1 0 V1 –0.5R1 1 0 1T∗ Ideal transformer for the negative inputE2 6 4 1 0 0.5V2 2 7F2 1 0 V2 –0.5R2 7 6 1u .ends balunA Test Bench for Differential Circuits Applying the Test Bench 6 of 7The Designer’s Guide Community3.1Gain To measure differential-mode gain using an AC analysis, set the AC magnitude on V id to1V and on all other sources to 0. For simplicity, assume that this is a low frequencyapplication and both R id and R ic are 0Ω. Perform the AC analysis. Then the differentialvoltage gain is identical to the voltage at the d terminal of B o (because the input ampli-tude was set to 1V). (If R id were not 0Ω, then the gain would be equal to the voltage ond of B o divided by the voltage on d of B i ). The differential-to-common-mode conversionis identical to the voltage at the c terminal of B o .To measure the common-mode gain, set the AC magnitude on V ic to 1V and on all othersources to 0. The common-mode voltage gain is then identical to the voltage at the c ter-minal of B o and The common-to-differential-mode conversion is identical to the voltageat the d terminal of B o .3.2Input and Output ImpedanceOne can measure the differential input impedance while measuring the differential gain(above). During this test the differential input admittance is identical to the currentthrough terminal d of B i . Simply take the reciprocal of this current to compute theimpedance. (If R id were not 0Ω, then the input impedance would be equal to the voltageon d divided by the current through d .) Similarly, one measures the common-mode inputimpedance during the common-mode gain test by taking the reciprocal of the currentthrough terminal c of B i .To measure the differential output impedance, set the AC magnitude on V od to 1V andon all other sources to 0. The output impedance is then equal to the voltage on terminald divided by the current through terminal d , both of B o . Measure the common-mode out-put impedance by setting the AC magnitude on V oc to 1V and on all other sources to 0.The output impedance is then equal to the voltage on terminal c divided by the currentthrough terminal c , both of B o .3.3Other Quantities of InterestAll interesting performance metrics of a differential amplifier can be measured with thetest bench of Figure 6. For example, one can apply pulses to either input to determinethe differential- or common-mode step response, one can perform a noise analyses, onecan perform s -parameter analysis [2], or one could even use the ideas in Section 3.4.1 of[1] to measure the 4 feedback parameters (open-loop gain, closed-loop gain, loop gain, and feedback factor) of a feedback amplifier.FIGURE 6.Test bench for differential circuits (somewhat enhanced from that in Figure 4).V id+−+−+−DUT p n d c p n d c R id +−V icR ic V od +−R od +−V oc R oc B o B iSummary A Test Bench for Differential Circuits7 of 7The Designer’s Guide Community 4.0SummaryFigure 6 is a general purpose test bench for differential circuits that in general is easierand less error prone to use than other, more traditional, test benches.4.1If You Have QuestionsIf you have questions about what you have just read, feel free to post them on the Forumsection of The Designer’s Guide Community website. Do so by going to www.designers-/Forum .AcknowledgementsI would like to thank Giang Hu and Murat Eskiyerli for pointing out errors in the S PICEnetlist of Listing 2 and equations (5)-(8), and I would like to thank John Broderick for pointing out sign errors in (5)-(8).References[1]Kenneth S. Kundert. The Designer’s Guide to SPICE and Spectre . Kluwer Aca-demic Publishers, 1995.[2]Ken Kundert. Measuring S-Parameters of a Differential Mixer . Available from/Analysis .。
1模拟芯片（Analog ICs）放大器（Amplifiers) 比较器（Comparators) 显示驱动器（Display Drivers)过滤器（Filters）杂类（Miscellaneous) 数据选择器（Multiplexers)稳压器（Regulators）定时器（Timers) 基准电压（Voltage Reference)2电容（Capacitors)可动态显示充放电电容（Animated) 音响专用轴线电容(Audio Grade Axial)轴线聚苯烯电容（Axial Lead Polypropene) 轴线聚苯烯电容（Axial Lead Polystyrene) 陶瓷圆片电容（Ceramic Disc) 去耦片状电容（Decoupling Disc) 普通电容（Generic) 高温径线电容（High Temp Radial)高温径线电解电容（High Temperature Axial Electrolytic)金属化聚酯膜电容（Metallised Polyester Film) 金属化聚烯电容（Metallised Polypropene）金属化聚烯膜电容（Metallised Polypropene Film) 云母射频Mica RF Specific小型电解电容（Miniture Electrolytic) 多层陶瓷(Multilayer Ceramic)Multilayer Ceramic COG Multilayer Ceramic NPO Multilayer Ceramic X5R Multilayer Ceramic X7R Multilayer Ceramic Y5V Multilayer Ceramic Z5U多层金属化聚酯膜电容（Multilayer Metallised Polyestern Film)聚脂膜电容（Mylar Film) 镍栅电容（Nickel Barrier) 无极性电容（Non Polarised) Poly Film Chip聚脂层电容（Polyester Layer) 径线电解电容（Radial Electrolytic)树脂蚀刻电容（Resin Dipped) 钽珠电容（Tantalum Bead) 钽SMD(Tantalum SMD) 薄膜电容(Thin film) 可变电容（Variable)VX轴线电解电容（VX Axial Electolytic)3 CMOS 4000系列(CMOS 4000 series)加法器(Adders) 缓冲器/驱动器(Buffers&Drivers) 比较器（Comparators)计数器(Counters) 解码器（Decoders) 编码器(Encoders)触发器/锁存器(Flip-Flop&Latches) 分频器/定时器(Frequency Dividers & Timers)门电路/反相器(Gates&Inverters) 存储器(Memory) 杂类逻辑芯片(Misc.Logic)数据选择器（Multiplexers) 多谐振荡器(Multivibrators) 振荡器(Oscillators)锁相环(Phrase-Locked-Loop,PLL) 寄存器(Registers) Signal Switches4连接器（Connectors)音频接口（Audio) D 型接口（D-Type) 双排插座（DIL)FFC / FPC连接器(FFC/FPC Connectors)插头（Header Blocks)头/插座(Headers/Receptacles)IDC头(IDC Headers)杂项(Miscellaneous)PCB转接器（PCB Transfer)PCB Transition Connectors带线（Ribbon Cable）(Ribbon Cable /Wire Trap Con)单排插座（SIL)连线端子（Terminal Blocks)USB PCB装配(USB for PCB Mounting)5数据转换器(Data Converter)模/数转换器(A/D converters) 数/模转换器(D/A converters) 光传感器（Light Sensors）采样保持器(Sample & Hold) 温度传感器(Temperature Sensore)6调试工具(Debugging Tools)断点触发器(Breakpoint Triggers) 逻辑探针(Logic Probes) 逻辑激励源(Logic Stimuli)7二极管（Diodes)整流桥(Bridge Rectifiers) 普通二极管(Generic) 整流管(Rectifiers)肖特基二极管(Schottky) 开关管(Switching) 瞬态抑制管(Transient Suppressors)隧道二极管(Tunnel) 变容二极管(Varicap) 齐纳击穿二极管(Zener)8 ECL 10000系列(ECL 10000 Series)各种常用集成电路9机电(Electromechanical)各种直流和步进电机10电感(Inductors)铁氧体磁珠(Ferrite Beads) 固定电感器(Fixed Inductors) 普通电感(Generic)贴片式电感(SMT Inductors) 表面贴装电感器(Surface Mount Lnductors)严格的公差RF电感器(Tight Tolerance RF inductor) 变压器(Transformers)11拉普拉斯变换(Laplace Primitives)一阶模型(1st Order) 二阶模型(2st Order) 控制器(Controllers)非线性模式(Non-Linear) 算子(Operators) 极点/零点(Poles/Zones)符号(Symbols)12 Mechanics无子分类13存储芯片(Memory Ics)动态数据存储器(Dynamic RAM) 电可擦除可编程存储器(EEPROM)可擦除可编程存储器(EPROM) I2C总线存储器(I2C Memories)存储卡(Memory Cards) SPI总线存储器(SPI Memories)静态数据存储器(Static Memories) UNI/O Memories14微处理器芯片(Microprocess ICs)6800 系列(6800 Family) 8051 系列(8051 Family) ARM 系列(ARM Family)AVR 系列(AVR Family) BASIC Stamp Modules DSPIC33 FamilyHC11 系列(HCF11 Family) I86 Family MSP430 Family CPU 外设(Peripherals) PIC10 系列(PIC10 Family）PIC12 系列(PIC12 Family) PIC16 系列(PIC16 Family) PIC18 系列(PIC18 Family) PIC24 系列(PIC18 Family) Stellaris FamilyTMS320 Piccolo FamilyZ80系列(Z80 Family)15杂类（Miscellaneous)含天线、ATA/IDE硬盘驱动模型、单节与多节电池、串行物理接口模型、晶振、动态与通用保险、模拟电压与电流符号、交通信号灯16建模源(Modelling Primitives)模拟(仿真分析）(Analogy-SPICE) 数字(缓冲器与门电路）(Digital--Buffers&Gates)数字(杂类)(Digital--Miscellaneous) 数字(组合电路)(Digital--Combinational)数字(时序电路）(Digital--Sequential) 混合模式(Mixed Mode)可编程逻辑器件单元(PLD Elements) 实时激励源(Realtime Actuators)实时指示器(Realtime Indictors)17运算放大器(Operational Amplifiers)二路运放(Dual) 理想运放(Ideal) 大量使用的运放(Macromodel)八路运放(Octal) 四路运放(Quad) 单路运放(Single) 三路运放(Triple)18光电子类器件(Optoelectronics)(14-Segment Displays) (16-Segment Displays) 七段数码管(7-Segment Displays)英文字符与数字符号液晶显示器(Alphanumeric LCDs)条形显示器(Bargraph Displays) 点阵显示屏(Dot Matrix Display)图形液晶(Grphical LCDs) 灯泡(Lamp) 液晶控制器(LCD Controllers)液晶面板显示(LCD Panels Displays) 发光二极管(LEDs) 光耦元件(Optocouplers)串行液晶(Serial LCDs)19 PICAXEPICAXE ICs20可编程逻辑电路与现场可编程门阵列(PLD&FPGA)无子分类21电阻(Resistors)0.6W金属膜电阻(0.6W Metal Film) 10W 绕线电阻(10Watt Wirewound)2W 金属膜电阻(2Watt Metal Film) 3W绕线电阻(3 Watt Wirewound)7W绕线电阻(7 Watt Wirewound) 贴片电阻(Chip Resistor)贴片电阻(Chip Resistor 1/10W 0.1%) 贴片电阻(Chip Resistor 1/10W 1%)贴片电阻(Chip Resistor 1/10W 5%) 贴片电阻(Chip Resistor 1/16W 0.1%)贴片电阻(Chip Resistor 1/16W 1%) 贴片电阻(Chip Resistor 1/16W 5%)贴片电阻(Chip Resistor 1/2W 5%) 贴片电阻(Chip Resistor 1/4W 1%)贴片电阻(Chip Resistor 1/4W 10%) 贴片电阻(Chip Resistor 1/4W 5%)贴片电阻(Chip Resistor 1/8W 0.05%) 贴片电阻(Chip Resistor 1/8W 0.1%)贴片电阻(Chip Resistor 1/8W 0.25%) 贴片电阻(Chip Resistor 1/8W 0.5%)贴片电阻(Chip Resistor 1/8W 1%) 贴片电阻(Chip Resistor 1/8W 5%)贴片电阻(Chip Resistor 1W 5%) 贴片防浪涌电阻(Chip Resistor anti-surge 5%)通用电阻符号(Generic) 高压电阻(High Voltage) 负温度系数热敏电阻(NTC)集成电阻(Resistor Network) 排阻(Resisters Packs) 滑动变阻器(Variable)可变电阻(Varistors)22仿真源(Simulator Primitives)触发器(Flip-Flop) 门电路(Gates) 电源(Sources)23扬声器与音响设备(Speaker&Sounders)无子分类24开关与继电器(Switch&Relays)键盘(Keypads) 普通继电器(Generic Relays) 专用继电器(Specific Relays)按键与拨码(Switchs)25开关器件(Switching Devices)双端交流开关元件(DIACs) 普通开关元件(Generic) 可控硅(SCRs) 三端可控硅(TRIACs) 26热阴极电子管(Thermionic Valves)二极真空管(Diodes) 三极真空管(Triodes)四极真空管(Tetrodes) 五极真空管(Pentodes)27转换器(Transducers)Distance Humidity/Temperature Light Dependent Resistor(LDR)压力传感器(Pressures) 温度传感器(Temperature)28晶体管(Transistors)双极性晶体管(Bipolar) 普通晶体管(Generic)绝缘栅场效应管(IGBY/Insulated Gate Bipolar Transistors 结型场效应晶体管(JFET)金属-氧化物半导体场效应晶体管(MOSFET) 射频功率LDMOS晶体管(RF Power LDMOS) 射频功率VDMOS晶体管(RF Power VDMOS) 单结晶体管(Unijunction)29 TTL 74系列(TTL 74 series)加法器Adders 缓冲器Buffers & Drivers 比较器Comparators 计数器Counters解码器Decoders 编码器Encoders Flip-Flops & LatchesGates & lnverters杂类逻辑芯片(Misc.Logic) 多路复用器Multiplexers 多谐振荡器Multivibrators寄存器Registers30 TTL 74增强型低功耗肖特基系列(TTL 74ALS Series)31 TTL 74增强型肖特基系列(TTL 74AS Series)32 TTL 74高速系列(TTL 74F Series)33 TTL 74HC系列/CMOS工作电平(TTL 74HC Series)34 TTL 74HCT系列/TTL工作电平(TTL 74HCT Series）35 TTL 74低功耗肖特基系列(TTL 74LS Series)36 TTL 74肖特基系列（TTL 74S Series)AND 与门ANTENNA 天线BATTERY 直流电源BELL 铃,钟BVC 同轴电缆接插件BRIDEG 1 整流桥(二极管) BRIDEG 2 整流桥(集成块) BUFFER 缓冲器BUZZER 蜂鸣器CAP 电容CAPACITOR 电容CAPACITOR POL 有极性电容CAPVAR 可调电容CIRCUIT BREAKER 熔断丝COAX 同轴电缆CON 插口CRYSTAL 晶体整荡器DB 并行插口DIODE 二极管DIODE SCHOTTKY 稳压二极管DIODE VARACTOR 变容二极管DPY_3-SEG 3段LED DPY_7-SEG 7段LED DPY_7-SEG_DP 7段LED(带小数点) ELECTRO 电解电容FUSE 熔断器INDUCTOR 电感INDUCTOR IRON 带铁芯电感INDUCTOR3 可调电感JFET N N沟道场效应管JFET P P沟道场效应管LAMP 灯泡LAMP NEDN 起辉器LED 发光二极管METER 仪表MICROPHONE 麦克风MOSFET MOS管MOTOR AC 交流电机MOTOR SERVO 伺服电机NAND 与非门NOR 或非门NOT 非门NPN NPN三极管NPN-PHOTO 感光三极管OPAMP 运放OR 或门PHOTO 感光二极管PNP 三极管NPN DAR NPN三极管PNP DAR PNP三极管POT 滑线变阻器PELAY-DPDT 双刀双掷继电器RES1.2 电阻RES3.4 可变电阻RESISTOR BRIDGE ? 桥式电阻RESPACK ? 电阻SCR 晶闸管PLUG ? 插头PLUG AC FEMALE 三相交流插头SOCKET ? 插座SOURCE CURRENT 电流源SOURCE VOLTAGE 电压源SPEAKER 扬声器SW ? 开关SW-DPDY ? 双刀双掷开关SW-SPST ? 单刀单掷开关SW-PB 按钮THERMISTOR 电热调节器TRANS1 变压器TRANS2 可调变压器TRIAC ? 三端双向可控硅TRIODE ? 三极真空管VARISTOR 变阻器ZENER ? 齐纳二极管DPY_7-SEG_DP 数码管SW-PB 开关7407 驱动门 1N914 二极管74Ls00 与非门 74LS04 非门 74LS08 与门 74LS390 TTL 双十进制计数器7SEG 4针BCD-LED 输出从0-9 对应于4根线的BCD码7SEG 3-8译码器电路BCD-7SEG转换电路 AlterNATOR 交流发电机 AMMETER-MILLI mA安培计AND 与门 BATTERY 电池/电池组 BUS 总线 CAP 电容 CAPACITOR 电容器CLOCK 时钟信号源 CRYSTAL 晶振 Compim 串口D-FLIPFLOP D触发器 FUSE 保险丝GROUND 地 LAMP 灯 LED-RED 红色发光二极管LM016L 2行16列液晶可显示2行16列英文字符，有8位数据总线D0-D7，RS，R/W，EN三个控制端口（共14线），工作电压为5V。
