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ANSI/EIA-364-1000.01AEIASTANDARDTS-1000.01AE NVIRONMENTAL TEST METHODOLOGY FOR ASSESSING THE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETS USED IN CONTROLLED ENVIRONMENT APPLICATIONSEIA/ECA-364-1000.01A(Revision of EIA-364-1000.01)APRIL 2006THE ELECTRONIC COMPONENTS SECTOR OF THE ELECTRONIC INDUSTRIES ALLIANCENOTICEEIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of EIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally.Standards and Publications are adopted by EIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication.This EIA Standard is considered to have International Standardization implication, but the International Electrotechnical Commission activity has not progressed to the point where a valid comparison between the EIA Standard and the IEC document can be made.This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use.(From Standards Proposal No. 5038 formulated under the cognizance of the CE-2.0 National Connector Standards Committee.Published by©ELECTRONIC INDUSTRIES ALLIANCE 2006Technology Strategy & Standards Department2500 Wilson BoulevardArlington, VA 22201PRICE: Please refer to the currentCatalog of EIA Electronic Industries Alliance Standards andEngineering Publicationsor call Global Engineering Documents, USA and Canada (1-800-854-7179)International (303-397-7956)All rights reservedPrinted in U.S.A.中国可靠性网 PLEASE !DON'T VIOLATETHELAW!This document is copyrighted by the EIA and may not be reproduced without permission.Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, contact:Global Engineering Documents15 Inverness Way EastEnglewood, CO 80112-5704 or callUSA and Canada (1-800-854-7179), International (303-397-7956)iCONTENTSClause Page (1)1 Introduction (1)1.1 Scope2 Test specimen (1) (1)2.1 Condition2.2 Sample (2)size (2)3 Testgroups4 Details to be specified (11) (11)documentation5 TestTable1 Test Group 1 (required for all connectors or sockets) (3)2 Test Group 2 (required for all connectors and sockets) (4)3 Test Group 3 (required for all connectors or sockets) (5)4 Test Group 4 (required for connectors or sockets with a precious metal platingon the contacts) (6)5 Test Group 5 (required for connectors or sockets with a tin-based platingon the contacts and optional for connectors or sockets with < 0.38 micronsof gold plating on the contacts) (8)6 Test Group 6 (required for connectors or sockets with a surface treatmenton the contacts or for connectors or sockets with a wipe length of0.127 mm or less) (9)7 Test Group 7 (required for connectors or sockets rated for> 50 mating/unmating cycles) (10)8 Test durations (hours) for temperature life (13)9 Test durations (hours) for temperature life (preconditioning) (14)ii中国可靠性网 CONTENTS (continued)Annex Page................................................................................................................. A-1 A Normative................................................................................................................ B-1 B Informativeiii中国可靠性网 EIA-364-1000.01APage 1TEST SEQUENCE No. 1000.01AENVIRONMENTAL TEST METHODOLOGY FOR ASSESSINGTHE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETSUSED IN CONTROLLED ENVIRONMENT APPLICATIONS(From EIA Standards Proposal No. 5038, formulated under the cognizance of EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-364-1000.01.)1 Introduction1.1 ScopeThis standard establishes the test procedures and test sequences to be followed when evaluating the performance of electrical connectors and sockets used in controlled environments. 1) Furthermore, it applies to contacts operating under low level circuit conditions. 2)The assumption is made that the contacts are metal. Polymer contacts, or other contact types, may require a different test methodology.2 Test specimen2.1 ConditionConnectors or sockets to be tested may be prototype parts to assess their design, or production parts to evaluate against an end user’s criteria. In either case, preparation of them for testing should consider board carrier or cable assembly processes. When access to a production or prototype soldering process to attach test specimens to a board carrier is not available, chemical and temperature exposure may be simulated by the procedures of EIA-364-11 (Resistance to Solvents Test Procedure for Electrical Connectors); and EIA-364-56, procedure 3 test condition E for a wave solder process, procedure 4 for a vapor phase reflow process, or procedure 5 level #3 for an infrared reflow process (Resistance to Soldering Heat Test Procedure for Electrical Connectors). When pressing test specimens to a board carrier or when terminating test specimens to a cable, appropriate tools should be used.1) Controlled environments are classified as no more severe than class number G1.2, according to the latest revision of EIA-364 (Electrical Connector/Socket Test Procedures Including Environmental Classifications).2) The applied voltage, generally < 50 millivolts, is not sufficient to break through any surface film. For contacts not operating under low level circuit conditions, such as those used in power applications; see the latest revision of EIA-364-70 (Test Procedure for Current vs. Temperature Rise of Electrical Connectors).EIA-364-1000.01APage 2NOTE ⎯Board carrier assembly operations are typically setup to attach all solderable components before press-fit connectors. Even so, the connectors may still besubjected to manual or automated soldering conditions during componentrework. This circumstance should be considered by the test engineer whenpreparing test specimens.2.2 Sample size2.2.1 For the test sequences in each of the test groups of clause 3, at least 100 separable contact interfaces from at least 5 connector or socket systems (plug/receptacle) should be evaluated. For low contact counts, at least 10 connector or socket systems should be tested. If Option #1A and Option #1B of test group 4 are chosen, then twice this sample size for that test sequence is required. If the connector or socket contains contacts that differ in the design of the critical area, then the sample size requirement should be applied to each design and the test results should be distinguishable.2.2.2 When a failure rate is desired, a significantly larger sample size for the test sequence in test group 4 should be tested. The user may require a larger sample size for other test groups, as well. The increase is dictated by the method of calculation chosen by the user.3 Test groupsFor an understanding of the objective of each test contained in the test groups; see annex B.中国可靠性网 EIA-364-1000.01APage 3 Table 1 - Test Group 1 (required for all connectors or sockets)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperature life EIA-364-17, method A (see table 8for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userEIA-364-1000.01APage 4Table 2 - Test Group 2 (required for all connectors and sockets)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Thermal shock EIA-364-32, test condition I(10 cycles with the exception ofexposure times. Place athermocouple in the center of thelargest mass component of theconnector or socket that is in thecenter of the test chamber to insurethat the contacts reach thetemperature extremes beforeramping to the other temperature. )Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Cyclic temperature &humidity EIA-364-31 (Cycle the connector orsocket between 25 °C ± 3 °C at80 % ± 3% RH and 65 °C ± 3 °C at50 % ± 3% RH. Ramp times shouldbe 0.5 hour and dwell times shouldbe 1.0 hour. Dwell times start whenthe temperature and humidity havestabilized within the specifiedlevels. Perform 24 such cycles.)Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user中国可靠性网 Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Vibration EIA-364-28, test condition VII, testcondition letter D (15 minutes ineach of 3 mutually perpendiculardirections. Both mating halvesshould be rigidly fixed so as not tocontribute to the relative motion ofone contact against another. Themethod of fixturing should bedetailed in the test report.) Mated No evidence of physicaldamage6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by usera precious metal plating on the contacts)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Mixed flowing gas EIA-364-65, class IIA (5 days tosimulate a 3-year field life; 7 days tosimulate a 5-year field life; or 14days to simulate a 10-year field life)See note None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Thermal disturbance Cycle the connector or socketbetween 15 °C ± 3 °C and 85 °C ±3 °C, as measured on the part.Ramps should be a minimum of 2°C per minute, and dwell timesshould insure that the contacts reachthe temperature extremes (aminimum of 5 minutes). Humidityis not controlled. Perform 10 suchcycles.Mated None8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by usera precious metal plating on the contacts) (continued)Test Order Test Test procedure Condition oftest specimensTest criteria9 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage10 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userNOTE ⎯ For 1-piece connectors or sockets: 1) expose unmated for 2/3 of the test duration; 2) mate each connector or socket to the same part that it was mated to during temperature life (preconditioning); and 3) expose for the remainder of the test duration. For 2-piece connectors, select either Options #1A and #1B or select Option #2.⎯Option #1A (plugs): 1) expose 1/2 of the specimens unmated for 2/3 of the test duration; 2) mate each specimen to the same receptacle that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.⎯Option #1B (receptacles): 1) expose 1/2 of the specimens unmated for 2/3 of the test duration; 2) mate each specimen to the same plug that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.⎯Option #2: 1) expose all plugs and receptacles unmated for 2/3 of the test duration; 2) mate each piece to the same piece that it was mated to during temperature life (preconditioning); and, 3) expose for the remainder of the test duration.Table 5 - Test Group 5 (required for connectors or sockets with a tin-based plating on the contacts and optional for connectors or sockets with< 0.38 microns of gold plating on the contacts)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Temperaturelife(preconditioning) EIA-364-17, method A (see table 9for durations and temperatures)Mated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user5 Thermal cycling Cycle the connector or socketbetween 15 °C ± 3°C. and 85 °C ±3 °C, as measured on the part.Ramps should be a minimum of2 °C per minute, and dwell timesshould insure that the contacts reachthe temperature extremes (aminimum of 5 minutes). Humidityis not controlled. Perform 500 suchcycles.Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by userTable 6 - Test Group 6 (required for connectors or sockets with a surface treatment on the contacts or for connectors or sockets with a wipe length of 0.127 mm or less)Test Order Test Test procedure Condition oftest specimensTest criteria1 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated None(base line measurements)2 Durability(preconditioning) EIA-364-09 (perform 5 unplug/plugcycles if the application requires upto 25 over the life of the connectoror socket; 20 cycles if theapplication requires 26-200; or, 50cycles if the application requires201 or greater)No evidence of physicaldamage3 Dust EIA-364-91 (benign dustcomposition)Unmated None4 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)5 Thermal disturbance Cycle the connector or socketbetween 15 °C ± 3 °C and 85 °C ±3 °C , as measured on the part.Ramps should be a minimum of20C./minute, and dwell times shouldinsure that the contacts reach thetemperature extremes (a minimumof 5 minutes). Humidity is notcontrolled. Perform 10 such cycles.Mated None6 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)7 Reseating Manually unplug/plug the connectoror socket. Perform 3 such cycles. No evidence of physical damage8 Low level contactresistance EIA-364-23 (termination ofconnector or socket to board carrieror cable shall be included inmeasurements)Mated Change in measurementsevaluated against criteriaspecified by user (see note)NOTE ⎯ Failure to meet the criteria does not necessarily disqualify the connector or socket. Rather, it may indicate the need for protection against particulate contamination, such as that afforded by a dust cover. For a connector or socket with a surface treatment on the contacts, a comparison of the test results to those obtained for the same connector or socket without a surface treatment on the contacts should be made. Only then can the impact of the surface treatment be determined.Table 7 - Test Group 7 (required for connectors or sockets rated for> 50 mating/unmating cycles)Test Order Test Test procedure Condition of test specimensTest criteria 1 Dielectric withstanding voltage EIA-364-20 (voltage level, ac or dc,and the orientation of the connectoror socket should be defined in thedetails of the test report)Mated No disruptive discharge No leakage current in excess of the maximum specified by user 2 Low level contact resistance EIA-364-23 (Termination of theconnector or socket to the boardcarrier or cable shall be included in the measurements. The orientation of the connector or socket should be defined in the details of the test report.)Mated None (base line measurements) 3 Durability EIA-364-09 (Perform the ratednumber of unplug/plug cycles.Retention features, such as latches, should not be deactivated. The orientation of the connector or socket should be defined in the details of the test report.)No evidence of physical damage 4 Low level contact resistance EIA-364-23 (Termination of theconnector or socket to the boardcarrier or cable shall be included inthe measurements. The orientation of the connector or socket should be defined in the details of the test report.)Mated Change in measurements evaluated against criteria specified by user 5 Dielectric withstanding voltage EIA-364-20 (voltage level, ac or dc,and the orientation of the connectoror socket should be defined in thedetails of the test report)Mated No disruptive discharge No leakage current in excess of the maximum specified by user NOTES1 Separate sets of test specimens may be used to assess dielectric withstanding voltage and the change in low level contactresistance.2 Dielectric withstanding voltage testing should involve different contacts than low level contact resistance testing.4 Details to be specifiedThe following details shall be specified in the referencing document:4.1 Rated number of durability cycles4.2 Temperature and duration for temperature life test; see table 84.3 Temperature and duration for temperature life (preconditioning) test; see table 94.4 Option used for test group 4 (see note at the bottom of table 4) and the duration of exposure to mixed flowing gas4.5 Connector or socket to be tested (supplier part number and family name)4.6 Contact plating types and thicknesses (with measurement location and technique to be used) 4.7 Plastic material(s) (generic type, color, and glass and/or mineral content)4.8 Contact alloy (CA number or other industry material designation)4.9 Surface treatment (lubricant or other, if any)NOTE ⎯If present, do not remove during preparation of test specimens.4.10 Pass/Fail criteria (if any)4.11 Any information that differs from that described in this standard.5 Test documentationDocumentation shall contain the following. Some items may be provided by the connector or socket supplier. Others may be determined by the testing laboratory.5.1 Description of test specimen(s)5.1.1 Supplier part number(s)5.1.2 Supplier family name5.1.3 Applicable industry standards5.1.4 Contact count and spacing5.1.5 Number of rows of contacts5.1.6 Plastic material (generic type, color, and glass and/or mineral content)5.1.7 Contact alloy (CA number or other industry material designation)5.1.8 Contact plating types5.1.9 Test specimen plating thicknesses, including statistical summary of the measurements 5.1.10 Surface treatment, if any5.1.10.1 Supplier name and/or generic description5.1.10.2 How and when applied to contacts5.1.11 For card edge connectors, thickness and bevel of mating card5.1.12 Photographs (optional)5.2 Preparation of test specimens5.2.1 Description of board carrier attachment method5.2.1.1 Chemical (flux, solvent, rinse, etc.) and temperature exposure5.2.1.2 Application tools used5.2.2 Description of cable/wire termination method5.2.2.1 Application tools used5.2.2.2 Cable/wire size5.2.2.3 Cable/wire type5.2.2.3.1 Plating5.2.2.3.2 Number of strands5.3 Test equipment used, and date of last and next calibration5.4 Test procedures used5.4.1 Deviation(s) to those specified, if any, including explanation(s)5.5 Schematic diagram of the circuit used to measure low level contact resistance5.6 Test results5.6.1 Mean, minimum, and maximum change in low level contact resistance, and the standard deviation of the changes, as calculated at each interval of measurement in each of the test groups5.6.2 Plots of the change in low level contact resistance (y-axis) versus cumulative % of the readings less than that change (x-axis) for each interval of measurement in each of the test groups (if requested)5.6.3 Tabulated data of the change in low level contact resistance of each circuit that includes a separable contact interface, as calculated at each interval of measurement in each of the test groups (if requested)5.6.4 Photographs (optional)5.7 A discussion of the test results5.8 Name of operator and date of testsTable 8 - Test durations (hours) for temperature lifeField temperatureTest temperatureand field life 90 °C 105 °C 115 °C57 °C for 3 years 192 24 857 °C for 5 years 288 48 1257 °C for 10 years 552 72 2460 °C for 3 years 288 48 1260 °C for 5 years 456 72 2460 °C for 10 years 840 120 4865 °C for 3 years 600 96 2465 °C for 5 years 960 120 4865 °C for 10 years 1,848 240 7285 °C for 3 years 4,176 528 14485 °C for 5 years 6,912 840 24085 °C for 10 years 13,680 1,584 432 NOTES1 Test durations pertaining to field temperatures of 57 °C, 60 °C, and 65 °C. are based on theassumption that the contact spends its entire field life at that temperature, whereas those associated with a field temperature of 85 °C are based on the assumption that the contact spends 1/3 of its field life at that temperature.2 The materials used in the construction of the connector or socket and in the components ofthe test vehicle (e.g., printed circuit cards, wiring, etc.) should be considered when selectinga test temperature.。
卡类电气性能要求SIM Card60Express Card260PCMCIA Card680三、卡座连接器的测试连接器常用的测试规范MIL-STD-1344A(美国军用规范)EIA-364C(美国电子工业学会)IEC-512(国际电子委员会)四、连接器的要紧测试项目电气特性测试机械特性测试环境测试1、绝缘阻抗测试(Insulation Resistance)量测目的:评估连接器之绝缘材料在通过直流电压后,其表面产生漏电流状况,以判定其绝缘程度.量测依据:IEC512-2-3A量测方法:测试位置为最靠近之相邻两端子或端子与铁壳,如果是同轴连接器则为内部与外部之端子.测试时刻:1分钟.测试电压:500V DC或专门规定.测试结果：MS/SD/MMC Card:测试前≥1000MΩ；测试后：≥100MΩxD-Picture Card：≥100MΩ2、耐电压测试(Dielectrics Withstanding V oltage)量测目的:评估连接器之安全额定电压及承担瞬时脉冲电压之安全性,进而评估连接器的绝缘材料与其组成绝缘间隔是否适当.量测依据:IEC512-2-4A量测方法:量测点为最接近的相邻两端子,及shell与最接近shell的端子间测试时刻:1分钟.测试电压:500V AC或专门规定测试结果：漏电流3、接触阻抗（Contact Resistance）量测目的:测试测试卡与端子间的接触阻值,以作为连接器端子之总体性评估.量测依据:512-2-2A.量测方法:在1mA,20mV,1kHz频率的驱动电路下测试测试结果：Memory Stick Card：测试前:≤40mΩ；测试后:≤500 mΩSD/MMC Card:测试前:≤100mΩ；测试后:变异量40 mΩxD-Picture Card：测试前:≤100mΩ；测试后:≤140m Ω4、插拔力测试（Insertion/Extraction force）量测目的:评估连接器在不同环境应力下,测试前及测试后的插入力与拔出力。
TestSpecification109-19709Aug02 Rev H EC 0990-1216-02AMP Test Specifications vs EIA and IEC Test Methods©2002 Tyco Electronics Corporation * TrademarkFor latest revision call AMP FAX*/Product Info number 1-800-522-6752. 1 of 91.SCOPEThis specification is intended to provide engineers with test conditions contained within the most commonly used EIA and IEC test methods for electrical connectors. It also lists the AMP 109 Test method which has either been superseded by the EIA and IEC document, or is used when no EIA or IEC equivalent test exists. This document can be used to assist in determining the appropriate test conditions and lists the details which need to be specified on a test request. This specification is not intended to provide adequate detail for the person running the test. Anyone who is actually conducting a test must be familiar with the appropriate EIA or IEC document.2.EIA and IEC DOCUMENT NUMBERING 2.1.EIA MethodsTest methods are numbered within the EIA 364 series of documents. Revision levels of EIAdocuments are indicated by a letter. If there is no letter following the number (e.g., 364-106), this indicates the initial release of the document. If a letter follows the number (e.g., 364-28C), this indicates that the document is at revision level C; i.e., three revision levels beyond the original release.2.2.IEC MethodsTwo numbering formats are used, the original format and the rationalized format. In the mid-to-late 1990's, the IEC revised all document numbering to a rationalized format and the documents areofficially identified in this format, although they may not yet have been reissued under the rationalized number. In the rationalized format, the original document numbered as IEC 512-4, Test 6d, becomes IEC 60512-6-4. At the present time, both numbers are used to identify the same document. If, at some time in the future, IEC 512-4, Test 6d, undergoes a significant revision, it will be reissued totally as IEC 60512-6-4 and the original number will be obsoleted.In this document, the existence of both numbers (original and rationalized) for a specific IEC method indicates that the document has not yet undergone a significant revision that would warrant reissuing it totally under the rationalized number and obsoleting the original number.Revision levels of IEC documents are indicated by date, which may be in the form of a year and month (e.g., 1994-09) or only a year (e.g. 1997). The absence of a revision date after a document number in the rationalized format of this document is also an indication that the document has not yet been reissued under the rationalized number.3.TEST CONDITIONS FOR COMMON EIA AND IEC TEST METHODSThe following table lists the most common conditions used when testing to the EIA 364 and IEC 60512standards. It also gives a cross reference to the former AMP 109 Test Specification number. Within a specific test, the EIA or IEC may contain additional condition options that are not contained within this document. If you are required to perform to conditions not specified in this document, please refer to the appropriate EIA 364 or IEC 60512 document available from Engineering Practices and Standards (EPS). Also, there are a few AMP 109 Test Specifications which have no EIA or IEC equivalent, or the equivalent EIA or IEC has not yet been released. In these cases you can obtain a copy of the 109document form REDC to check test conditions.ELECTRICAL TESTS (except high speed)Contact Resistance EIA 364-6B DC or AC current as specified in the referencing document.109-25IEC 60512-2-2(512-2: 1985 Test 2b, 512-2 Amendment 1: 1994)DC or AC current as specified in the referencing document.109-25Current Carrying CapacityIEC 60512-5-1Stabilize at a single current level for 1 hour after 3 consecutive|readings at 5 minute intervals are within 1°C.|109-45-3 Dry Circuit Resistance EIA 364-23A100 milliamperes maximum, 20 millivolts maximum.109-6-6IEC 60512-2-1|100 milliamperes maximum, 20 millivolts maximum.109-6-6Insulation ResistanceEIA 364-21C At 500 volts DC or as specified, and hold for 2 minutes or asspecified.109-28IEC 60512-3-1|At 10, 100, or 500 volts DC and hold for 1 minute.109-28Temperature Rise vs Current EIA 364-70AMethod 1Stabilize at a single current level until 3 readings at 5 minuteintervals are within 1°C.109-45-1EIA 364-70A Method 2Increment through a minimum of 4 current levels, stabilizingeach until 3 readings at 5 minute intervals are within 1°C.109-45-2Voltage Proof IEC 60512-4-1(512-2: 1985 Test 4a,512-2 Amendment 1: 1994)Ramp at 500 volts per second maximum and hold for 1 minuteat the voltage specified in the referencing document.109-29Withstanding Voltage EIA 364-20BCondition I At sea level, ramp at 500 volts per second and hold for 1 minuteat the voltage specified in the referencing document.109-29EIA 364-20B Condition II At 30,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.NoneEIA 364-20B Condition III At 50,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.109-29EIA 364-20B Condition IV At 70,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.109-29EIA 364-20B Condition V At 100,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.109-29EIA 364-20B Condition VI At 656,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.NoneEIA 364-20B Condition VII At 15,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.109-29EIA 364-20B Condition VIII At 150,000 feet simulated altitude, ramp at 500 volts per secondand hold for 1 minute at the voltage specified in the referencing document.109-29ELECTRICAL TESTS, HIGH SPEEDAttenuationEIA 364-101Insertion technique and time domain method. Specify type ofdrive signal (single ended or differential). Also specifyenvironment impedance if other than 50 ohms for single endedor 100 ohms for differential.109-174Capacitance EIA 364-30A|Specify frequency, standards are 1 kHz and 1 MHz.109-47IEC 60512-22-1 (512-9: 1992 Test 22a)Specify frequency, preferred are 1 kHz and 1 MHz.109-47Connector Return Loss or SWR Using NATDR NoneNoneUse 109-181Contact DisturbanceIEC 60512-2-5(512-2: 1985 Test 2e,512-2 Amendment 1: 1994)Contacts can be series wired with circuit not to exceed 3 ohms. Discontinuity is defined a voltage exceeding 50% of sourcevoltage for 1 microsecond or a time specified in the referencing document.109-31Crosstalk EIA 364-90Method A Digital cable assembly, time domain.109-163EIA 364-90 Method B Analog, frequency domain, specify spectrum or networkanalyzer.109-179Eye Pattern and Jitter Testingfor Electrical ConnectorsEIA 364-107For Eye Pattern specify Method A (mask test) or Method B (eyeopening test) For Jitter, specify Method C (Pseudo-Random Bit Sequence test (PRBS)) or Method D (pulse test (singlepattern)). Must specify signal rise time, amplitude, and clock frequency, data pattern, single-ended or differential, andtermination value with tolerances.NAMicrosecond DiscontinuityEIA 364-46A Contacts can be series wired with circuit not to exceed 3 ohms. Discontinuity is defined as a resistance of 10 ohms or greaterfor 1 microsecond or longer.109-31Nanosecond Event DetectionEIA 364-87Method I Uses AnaTech 64EHD, 32EHD or equivalent (recommendedmethod). Must specify duration at Test Condition: A, 1 ns; D, 10ns; F, 50 ns (recommended). Also in EIA 364-87 but notrecommended are Test Condition B, 2 ns; C, 5 ns; and E, 20ns; and Test Method 2 which uses separate power supply,detector, pulse generator, and scope.109-188Near End Crosstalk (NEXT),Terminated Open Circuit (TOC)TIA/EIA 568BSpecify Category 3, 4, or 5. Category 5 is the most common,since Categories 3 and 4 are less severe, meeting Category 5also meets Categories 3 and 4.109-194Propagation Delay, Cable Assemblies EIA 364-103Specify environment impedance if other than 50 ohms forsingle-ended and 100 ohms for differential.109-168RF Leakage None None Use 109-182Rise Time DegradationEIA 364-102Specify Method A (single-ended), Method B (differentiallydriven) or both. Specify environment impedance if other than 50ohms for single-ended and 100 ohms for differential.109-138Shielding Effectiveness No EIA Method None Use 109-90IEC 60512-23-3Specify minimum value of shielding effectiveness in dB ormaximum transfer impedance and frequency or frequencyrange.NoneTransfer Impedance of Connectors EIA 364-80Method BSpecify frequency range if other than 30 to 500 MHz. Specifymarker frequencies and if phase plots are desired.109-175Impedance and VSWR ofCoaxial Connectors and LeadAssemblies EIA 364-108Specify parameters to be measured such as impedance,reflection coefficient, VSWR and/or return loss. Specify systemrise time, single ended or differential measurements,signal/ground pattern, and specimen environment impedance ifother than 50 ohms single ended and 100 ohms differential.109-9109-174 MECHANICAL TESTSCable Pull-Out IEC 60512-17-3(512-9:1992 Test 17c)Apply force at a rate of 20 N per second to the specified valueand hold for 1 minute.109-46-2(Used in Mfg)EIA 364-38B Condition A Apply force at a rate of 89 N per minute to 222 N and hold for 1hour.109-46-1(Used in Mfg)EIA 364-38B Condition B Apply force at a rate of 89 N per minute to 333 N and hold for 1hour.109-46-1(Used in Mfg)EIA 364-38B Condition C Apply force at a rate of 89 N per minute to 445 N and hold for 1hour.109-46-1(Used in Mfg)EIA 364-38B Condition D Apply force at a rate of 89 N per minute to 556 N and hold for 1hour.109-46-1(Used in Mfg)EIA 364-38B Condition E Apply force at a rate of 89 N per minute to 111 N and hold for 1hour.109-46-1(Used in Mfg)Contact RetentionEIA-364-29B Apply specified load at a rate of 4.4 N per second and hold for 6seconds.109-30-1(Used in Mfg)IEC 60512-15-1(512-8:1993 Test 15a)Apply specified load at a rate of 10 N per second and hold for 10 seconds.109-30-2(Used in Mfg)Durability for Electrical ConnectorsEIA 364-9C Cycle at 500 cycles per hour for automatic, 300 cycles per hour for manual, and 250 to 300 cycles per hour for automatic circular connectors.109-27Engaging and Separating ForceIEC 60512-13-1 (IEC 512-13-1: 1996)Rate of engaging and separating shall be specified in the referencing document.109-42Housing Locking Mechanism StrengthEIA-364-98Apply force to failure. Specify rate if other than 0.5 inch per minute.109-50Insert Retention In Housing IEC 512-8, Test 15BForce is applied at 50N/s or 5kPa/s and held at specified value for 1 minute.NA Mating and Unmating Force EIA 364-13B Rate of mating and unmating shall be specified in the referencing document.109-42Mechanical Operation IEC 60512-9-1(512-5: 1992 Test 9a)Cycle rate and mounting method shall be specified in the referencing document.109-27Mechanical ShockEIA 364-27B Method A Three shocks x 3 axis x 2 directions = 18 shocks, 490 m/s 2 (50g’s), 11 ms, half-sine, 3.44 m/s velocity change.109-26-1EIA 364-27B Method B Three shocks x 3 axis x 2 directions = 18 shocks, 735 m/s 2 (75g’s), 6 ms, half-sine, 2.81 m/s velocity change.109-26-2EIA 364-27B Method C Three shocks x 3 axis x 2 directions = 18 shocks, 980 m/s 2 (100g’s), 6 ms, half-sine, 3.75 m/s velocity change.109-26-3EIA 364-27B Method D Three shocks x 3 axis x 2 directions = 18 shocks, 2941 m/s 2(300 g’s), 3 ms, half-sine, 5.61 m/s velocity change.109-26-12EIA 364-27B Method E Three shocks x 3 axis x 2 directions = 18 shocks, 490 m/s 2 (50g’s), 11 ms, sawtooth, 2.68 m/s velocity change.109-26-7EIA 364-27B Method F Three shocks x 3 axis x 2 directions = 18 shocks, 735 m/s 2 (75g’s), 6 ms, sawtooth, 2.20 m/s velocity change.109-26-8EIA 364-27B Method G Three shocks x 3 axis x 2 directions = 18 shocks, 980 m/s 2 (100g’s), 6 ms, sawtooth, 2.96 m/s velocity change.109-26-9EIA 364-27B Method H Three shocks x 3 axis x 2 directions = 18 shocks, 294 m/s 2 (30g’s), 11 ms, half-sine, 2.07 m/s velocity change.109-26-10EIA 364-27B Method I Three shocks x 3 axis x 2 directions = 18 shocks, 294 m/s 2 (30g’s), 11 ms, sawtooth, 1.62 m/s velocity change.109-26-11EIA 364-27B Method J Three shocks x 3 axis x 2 directions = 18 shocks, 4903 m/s 2(500 g’s), 11 ms, half-sine, 3.11 m/s velocity change.109-26-4EIA 364-27B Method K Three shocks x 3 axis x 2 directions = 18 shocks, 9806 m/s 2(1000 g’s), 0.5 ms, half-sine, 3.11 m/s velocity change.109-26-5EIA 364-27B Method LThree shocks x 3 axis x 2 directions = 18 shocks, 14709 m/s 2(1500 g’s), 0.5 ms, half-sine, 4.69 m/s velocity change.109-26-6NOTE : A large range of conditions can be selected by choosing values in the tables. The following arerecommended conditions. Conditions shall be specified in the referencing document.IEC 60512-6-3|Three shocks x 3 axis x 2 directions = 18 shocks, 294 m/s 2 (30g’s), 11 ms, half-sine, 2.07 m/s velocity change.109-26-13Three shocks x 3 axis x 2 directions = 18 shocks, 294 m/s 2 (30g’s), 11 ms, sawtooth, 1.62 m/s velocity change.109-26-14Three shocks x 3 axis x 2 directions = 18 shocks, 490 m/s 2 (50g’s), 11 ms, half-sine, 3.44 m/s velocity change.109-26-15Three shocks x 3 axis x 2 directions = 18 shocks, 490 m/s 2 (50g’s), 11 ms, sawtooth, 2.68 m/s velocity change.109-26-16Three shocks x 3 axis x 2 directions = 18 shocks, 980 m/s 2 (100g’s), 6 ms, half-sine, 3.75 m/s velocity change.109-26-17Three shocks x 3 axis x 2 directions = 18 shocks, 980 m/s 2 (100g’s), 6 ms, sawtooth, 2.96 m/s velocity change.109-26-18Normal Force Test ProcedureEIA 364-04Spring Rate Technique - Requires deflection distance to be specified where at which normal force is recorded. This can be done in housing or on contacts out of the housing.109-98-2109-98-3EIA 364-04A Normal Force Gage Technique. Specify gage size.|109-98-1Terminal StrengthEIA-364-62Specify bending, or torque and bending. Specify number of bends if other than 2.109-64Termination Tensile StrengthEIA 364-8B 25 ± 6 mm per minute cross head speed.109-16-1IEC 60512-16-4(512-8: 1993 Test 16d)25 to 50 mm per minute cross head speed.109-16-2IEC 60512-16-20(512-16-20: 1996Method A)Torque Mechanism Strength None NoneUse 109-183VibrationEIA 364-28D Test Condition I 10-55 Hz sinusoidal, 0.06 inch peak-to-peak, 120 cycles (2hours) on each axis.109-21-1EIA 364-28D Test Condition II 10-500 Hz sinusoidal, 0.06 inch peak-to-peak or 10 g peak, 12cycles (3 hours) on each axis.109-21-2EIA 364-28D Test Condition III 10-2000 Hz sinusoidal, 0.06 inch peak-to-peak or 15 g peak, 12cycles (4 hours) on each axis.109-21-3EIA 364-28D Test Condition IV 10-2000 Hz sinusoidal, 0.06 inch peak-to-peak or 20 g peak, 12cycles (4 hours) on each axis.109-21-4EIA 364-28D Test Condition V50-2000 Hz random levels, select condition letter for rms g where: A, 5.35; B, 7.56; C, 9.26; D, 11.95; E, 16.91; F, 20.71;G, 23.91; H, 29.28; I, 37.8; and K, 46.30. Duration shall be specified as 3 minutes, 15 minutes, 1.5 hours or 8 hours in each direction.109-21-5EIA 364-28D Test Condition VI50-2000 Hz random levels, select condition letter for rms g where: A, 6.21; B, 8.78; C, 10.76; D, 13.89; E, 19.64; F, 24.06;G, 27.78; H, 34.02; I, 43.92; and K, 53.79. Duration shall be specified as 3 minutes, 15 minutes, 1.5 hours or 8 hours in each direction.109-21-6EIA 364-28D Test Condition VII20-500 Hz random levels, select condition letter for rms gwhere: A, .98; B, 1.55; C, 2.19; D, 3.10; E, 4.90; F, 6.93; and G,9.80. Duration shall be specified as 3 minutes, 15 minutes, 1.5hours or 8 hours in each direction.109-21-8NOTE : A large range of conditions can be selected by choosing values in the tables. The following arerecommended conditions. Conditions shall be specified in the referencing document.IEC 60512-6-4|10-55 Hz sinusoidal, 0.06 inch peak-to-peak, 10 cycles (approximately 45 minutes) on each axis.109-21-910-500 Hz sinusoidal, 0.06 inch peak-to-peak or 10 g peak, 10cycles (approximately 2 hours) on each axis.109-21-1010-2000 Hz sinusoidal, 0.12 inch peak-to-peak or 20 g peak, 10cycles (approximately 2.5 hours) on each axis.109-21-115-500 Hz random, specify acceleration spectral density at 0.05,0.1, 0.5, or 1.0 (m/s 2)2/Hz. Duration shall be specified as 1, 3,10, 30, 100, or 300 minutes. Specify Method 1 (without initial response investigation), or Method 2 (with initial response investigation). Method 1 is recommended.109-21-1220-2000 Hz random, specify acceleration spectral density at 0.05, 0.1, 0.5, 1.0, 5.0, or 10.0 (m/s 2)2/Hz. Duration shall be specified as 1, 3, 10, 30, 100, or 300 minutes. Specify Method 1(without initial response investigation), or Method 2 (with initial response investigation). Method 1 is recommended.109-21-13ENVIRONMENTAL TESTSDamp Heat IEC-60512-11-3|40°C, 90 to 95% RH, 96 hours.109-23-2Damp Heat, Cyclic IEC-60512-11-12|25 to 40°C or 55°C, 90 to 100% RH, 10 cycles (10 days).109-23-6Dry Heat IEC 60512-11-9|Temperature, duration, and whether the connectors areenergized or not shall be specified in the referencing document.109-43Fluid ImmersionEIA 364-10A Condition A Hydraulic fluid per MIL-H-5606, 5 minutes at 85°C, 7 cycles.109-33Condition A EIA 364-10A Condition B Turbine fluid, grade JP-5 per MIL-T-5624, 5 minutes at 25°C, 7cycles.109-33Condition B EIA 364-10A Condition C Lubricating oil per MIL-L-7808, 5 minutes at 120°C, 7 cycles.109-33Condition C EIA 364-10A Condition D Lubricating oil per MIL-PRF-23699, 5 minutes at 120°C, 7cycles.109-33Condition D EIA 364-10A Condition E Defrosting fluid per MIL-A-8243, 5 minutes at 65°C, 7 cycles.109-33Condition E EIA 364-10A Condition F Cleaning compound diluted for cleaning per MIL-PRF-87937Type I alkaline base, 5 minutes at 65°C, 7 cycles.109-33Condition F EIA 364-10A Condition G Gasohol per ASTM-D-4814, 5 minutes at 65°C, 5 cycles.109-33Condition G EIA 364-10A Condition I One part isopropyl alcohol, per TT-I-735 grade A or B; and 3parts mineral spirits, per A-A-2904 type II grade A or P-D-680type I by volume, 5 minutes at 25°C, 5 cycles.109-33Condition I EIA 364-10A Condition K Coolant, dielectric fluid, synthetic silicate ester base MIL-PRF-47220 (Coolant 25) or equivalent, 1 minute at room temperature,1 cycle.109-33Condition K EIA 364-10A Condition L Hydraulic fluid M2-V Chevron oil ST0145LB0001 or equivalent,85 minutes at room temperature, 1 cycle.None EIA 364-10A Condition ZAs specified in the referencing document.109-33Condition ZIEC 60512-19-3: 1997Fuels at 40°C, 15 to 20 minutes, 5 cycles.109-33-2Hydraulic fluids at 85°C, 15 to 20 minutes, 5 cycles.Liquid lubricants at 120°C for minerals or 150°C for synthetics,15 to 20 minutes, 5 cycles.Cleaning products at 25°C, 15 to 20 minutes, 5 cycles.De-icing liquids at 50°C, 15 to 20 minutes, 5 cycles.Extinguishing liquids at -15°C, 15 to 20 minutes, 5 cycles.Cooling liquids at 50°C, 15 to 20 minutes, 5 cycles.Greases at 70°C, 15 to 20 minutes, 5 cycles.HumidityEIA 364-31B Method II 40°C, 90 to 95% RH. Test Condition A (96 hours) will be performed unless otherwise specified. Other options include Condition B, 240 hours; Condition C, 504 hours; Condition D,1,344 hours; or Condition E, 1,000 hours.109-23-2EIA 364-31B Method III 25 to 65°C, 80 to 100% RH, 10 cycles (10 days). Specify cold shock (step 7a) and/or vibration (step 7b) if desired.109-23-3EIA 364-31B Method IV 25 to 65°C, 80 to 100% RH, 10 cycles (10 days). Specify cold shock at -10°C (step 7a) if desired.109-23-4EIA 364-31B Method V25 to 71°C, 80 to 100% RH, 10 cycles (10 days). Specify cold shock at -10°C (step 7a) if desired.NAMixed Flowing GasEIA 364-65A Class II 70% RH, 30°C, 10 ppb Cl 2, 200 ppb NO 2, 10 ppb H 2S, for 20days unless otherwise specifiedNOT RECOMMENDED, USE Class IIA INSTEAD109-85-2EIA 364-65A Class IIA 70% RH, 30°C, 10 ppb Cl 2, 200 ppb NO 2, 10 ppb H 2S, 100 ppb SO 2, for 20 days unless otherwise specified.109-85-2A EIA 364-65A Class III 70% RH, 30°C, 20 ppb Cl 2, 200 ppb NO 2, 100 ppb H 2S, for 20days unless otherwise specified.NOT RECOMMENDED, USE Class IIIA INSTEAD 109-85-3EIA 364-65A Class IIIA 70% RH, 30°C, 20 ppb Cl 2, 200 ppb NO 2, 100 ppb H 2S, 200ppb SO 2, for 20 days unless otherwise specified.109-85-3A EIA 364-65A Class IV 75% RH, 40°C, 30 ppb Cl 2, 200 ppb NO 2, 200 ppb H 2S, for 20days unless otherwise specified.109-85-4IEC 60512-11-7: 1996Method 175% RH, 25°C, 100 ppb H 2S, 500 ppb SO 2 duration shall be specified in the referencing document.None IEC 60512-11-7: 1996Method 270% RH, 30°C, 10 ppb Cl 2, 200 ppb NO 2, 10 ppb H 2S, duration shall be specified in the referencing document.None IEC 60512-11-7: 1996Method 375% RH, 30°C, 20 ppb Cl 2, 200 ppb NO 2, 100 ppb H 2S,duration shall be specified in the referencing document.None IEC 60512-11-7: 1996Method 475% RH, 25°C, 10 ppb Cl 2, 200 ppb NO 2, 10 ppb H 2S, 200 ppb SO 2 duration shall be specified in the referencing document.None Rapid Change in Temperature IEC 60512-11-4|Temperature extremes, duration at each extreme, and number of cycles shall be specified in the referencing document.109-22Salt SprayEIA 364-26B Condition A 5% spray at 35°C for 96 hours.109-24Method A EIA 364-26B Condition B 5% spray at 35°C for 48 hours.109-24Method B EIA 364-26B Condition C 5% spray at 35°C for 500 hours.109-24Method C EIA 364-26B Condition D5% spray at 35°C for 1000 hours.109-24Method D Salt Mist IEC 60512-11-65% spray at 35°C, specify time.109-24|Temperature LifeEIA 364-17B Test is run as Method A (without electrical load); Method B (at rated current); or Method C (at an electrical load which causes the internal temperature of the connector to reach a stated level).The temperature is set at one of the following Test Conditions:1, 55°C; 2, 70°C; 3, 85°C; 4, 105°C; 5, 125°C; 6, 175°C; 7,200°C; 8, 350°C; 9, 500°C; 10, 150°C; or 11, 65°C.The duration of exposure is set to one of the following Test Time Conditions: A, 96 hours; B, 250 hours; C, 500 hours; D, 1000hours; E, 1500 hours; F, 2000 hours; G, 3000 hours; or H, 5000hours.109-43Thermal ShockEIA 364-32C Must select a test condition or specify the temperature limits.For each test condition, submersion in liquid nitrogen at -195.8°C can be specified in place of the low temperature extreme.Time at each temperature extreme is determined by thespecimen weight as follows: Up to 0.3 lb, 0.5 hour; 0.3 to 3 lb, 1hour; 3 to 30 lb, 2 hours; or 30 to 300 lb, 4 hours.Test Conditions are: I, -55 to 85°C; II, -65 to 105°C; III, -65 to 125°C; IV, -65 to 150°C; V, -65 to 175°C; VI, -65 to 200°C; VII -55 to 105°C; or VIII -40 to 105°C. The number of cycles shall be specified in the referencing document.109-22OTHER TESTSDetermination of Plating Thickness EIA 364-48Method AMetallographic Sectioning - Only good for plating thickness over100 microinches.109-52-1(Used in Mfg) EIA 364-48Method CX-Ray Fluorescence109-52-2(Used in Mfg) EIA 364-48Method B (Beta Backscatter Radiation), Method D (MagneticField or Electromagnetic), and Method E (Coulometric) are notrecommended.NAFlammability of ElectricalConnectors EIA 364-104A Condition A, 38 mm flame height for 60 seconds.Condition B, 3 8 mm flame height for 30 seconds.Condition C, 19 mm flame height for 10 seconds.109-12Magnetic PermeabilityEIA 364-54A Testing for 2 permeability unless otherwise specified.109-88(Used in Mfg)Protection Against Intrusion ofWaterIEC 60529: 1989 Amendment1 1999-11This document contains a series of tests for degrees ofprotection provided by enclosures. Tyco Electronics laboratorieshave conducted testing for Protection Against Intrusion of Water paragraph 14.2.5 (6.3 mm nozzle spray from all practicabledirections), paragraph 14.2.6 (12.5 mm nozzle spray from allpracticable directions), and paragraph 14.2.7 (water immersion0.15 to 1.0 m)109-191Protection Against Touch andIntrusion of Foreign ParticlesIEC 60529: 1989 Amendment1 1999-11This document contains a series of tests for degrees ofprotection provided by enclosures. Tyco Electronics laboratorieshave conducted testing for Protection Against Intrusion ofForeign Particles of Mated Connectors using paragraph 13.2which uses spheres which must be specified as 50, 12.5, 2.5,or 1 mm. Also using paragraphs 13.4, 13.5, and 13.6 which usea dust chamber with or without pressure.109-190Radial Hole Distortion Measurements EIA 364-96(Proposed)The EIA document has not been released.Use 109-136Resistance To Soldering HeatEIA 364-56AProcedure 1Solder Cup Method - Unless otherwise specified, the solderingiron will be 360°C and remain until the solder is liquid, 4 to 5seconds.109-63-1EIA 364-56A Procedure 2Solder Eyelet Tab or Post Terminations - Unless otherwisespecified, the soldering iron will be 360°C and remain until thesolder is liquid, 4 to 5 seconds.109-63-2EIA 364-56A Procedure 3Dip and Wave Solder Terminations - Condition A, 350°C for 3seconds with immersion rate at 25 mm/sec; Condition B, 260°Cfor 10 seconds with immersion rate at 25 mm/sec; Condition C,260°C for 10 seconds; Condition D, 260°C for 20 seconds;Condition E, 280°C for 30 seconds; or Condition F, 260°C for20 seconds.109-63-3EIA 364-56A Procedure 4Vapor Phase Reflow - Per fluorocarbon with boiling point of215°C for 60 to 65 seconds. NOT RECOMMENDED. Notavailable in Tyco Electronics laboratories.NAEIA 364-56A Procedure 5Reflow Soldering (Infrared) - Level 1, 215°C; Level 2, 235°C; orLevel 3, 250°C. Temperature duration shall be 30 to 35 secondsunless otherwise specified.109-63-4Resistance To Soldering Heat Solder Bath MethodIEC 60512-12-4(512-6, 1984 Test 12d)Solder bath at 260°C for 10 seconds unless otherwisespecified.109-63-5Resistance To Soldering HeatIron Method IEC 60512-12-5(512-6, 1984 Test 12e)Iron shall be 350°C and solder applied for 10 seconds. Specifyiron size A (8 mm bit diameter with 1.2 mm diameter solderwire) or size B (3 mm bit diameter with 0.8 mm diameter solderwire.109-63-6。
EIA STANDARD EIA/ECA-364-28E 第1 页共7 页电子工业协会标准电子零组件、组合体和材料协会（ECA）TP-28E电连接器及插座振动试验程序EIA/ECA-364-28E（依据EIA-364-28D修订）2006年8月28日颁布1 导言1.1 概述本试验标准阐述了一种用于电连接器振动试验的标准方法，以便评估电连接器及其组件承受特定强度振动的能力。
1.2 目的进行本试验是为了确定连接器及其组件在寿命期间可能遭遇在主要频段或随机振动频段范围内及其幅度上受振动的影响情况。
1.3 定义1.3.1 轴图1给出了轴的图示定义，如果使用不同于图1所示的轴,则在相关参考文件中应在试验装置进行要求或对轴进行定义。
3.1.1.1 X轴与样品纵向一致的方向3.1.1.2 Y轴与样品纵向相垂直的方向(横向)3.1.1.3 Z轴与测试装置的固定面(与试验桌的桌面接触的面)垂直的方向图1---安装轴向定义1.3.2 术语gngn是SI单位，表示标准的重力加速度，它本身随着高度和地理位置而变化。
备注：gn标准值为9.81m/s22 测试设备应传感器进行校准，其精度应达到±2%。
振动系统由振动试验机及辅助设备组成，整个系统应能产生正弦或随机的振动。
用于随机振动的测试设备所产生的随机振动的振动幅度应符合高斯分布，但加速度的峰值可限止到最小为3倍的均方根值（区间为3σ）。
3 测试样品3.1 振动试验的样品应是完全连接好连接器，包括一个连接器插头及匹配的插座，或者是一种印刷电路板及匹配的连接器，或者是一种具有完整功能的组合件。
3.2 每一试验样品都应准备好导线及其它材料，或作好模拟连接器的现场组装等工作。
如果规定的连接器插合是靠外力插合到连接器上，那么这些外力和安装方法应尽可能模拟实际使用方法。
如果是采用规定锁紧方法达到插合的目的，则只采用规定的锁紧方法。
3.3 安装方法3.3.1 试验条件I，II，III和试验条件IV连接器试验样品应固定到能传递规定振动条件的夹具上，夹具的设计应能保证它的固有共振频率在试验所规定的频率范围内达到最小。
