CY74FCT541TQSOP中文资料
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8-Bit Buffers/Line Drivers CY54/74FCT540TCY54/74FCT541T
SCCS029 - May 1994 - Revised March 2000
Data sheet acquired from Cypress Semiconductor Corporation.Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments IncorporatedFeatures•Function, pinout, and drive compatible with FCT andF logic•FCT-C speed at 4.1 ns max. (Com’l)FCT-A speed at 4.8 ns max. (Com’l)•Reduced VOH (typically = 3.3V) versions of equivalentFCT functions•Edge-rate control circuitry for significantly improvednoise characteristics•Power-off disable feature•ESD > 2000V•Matched rise and fall times•FullycompatiblewithTTLinputandoutputlogiclevels•Sink current64 mA (Com’l), 48 mA (Mil)Source current32 mA (Com’l), 12 mA (Mil)•Extended commercial range of−40˚C to +85˚CFunctional DescriptionTheFCT540Tinvertingbuffer/linedriverandtheFCT541Tnon-invertingbuffer/linedriveraredesignedtobeemployedasmemoryaddressdrivers,clockdrivers,andbus-orientedtransmitters/receivers.Thedevicesprovidespeedanddrivecapabilitiesequivalenttotheirfastestbipolarlogiccounterpartswhilereducingpowerdissipation.TheinputandoutputvoltagelevelsallowdirectinterfacewithTTL,NMOS,and CMOS devices without external components.
Theoutputsaredesignedwithapower-offdisablefeaturetoallow for live insertion of boards.
LogicBlockDiagram—FCT540TPinConfigurations12345678910111216171819201314VCC15CERDIP/SOIC/QSOPTop ViewGNDO0D1D2D3D4D5D6D7D0O1O2O3O4O5O6O7OEBOEAO0D1D2D3D4D5D6D7D0O1O2O3
O4
O5
O6
O7
OEB
OEA
FCT540T
12345678910111216171819201314VCC15CERDIP/DIP/SOIC/QSOPTop ViewGNDO0D1D2D3D4D5D6D7D0O1O2O3O4O5O6O7OEBOEAO0D1D2D3D4D5D6D7D0O1O2O3
O4
O5
O6
O7
OEB
OEA
LogicBlockDiagram—FCT541T
FCT541T
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2Maximum Ratings[2, 3](Abovewhichtheusefullifemaybeimpaired.Foruserguide-lines, not tested.)
Storage Temperature.................................–65°C to +150°CAmbient Temperature withPower Applied.............................................–65°C to +135°C
Supply Voltage to Ground Potential...............–0.5V to +7.0VDC Input Voltage...........................................–0.5V to +7.0VDC Output Voltage.........................................–0.5V to +7.0VDC Output Current (Maximum Sink Current/Pin)......120 mAPower Dissipation..........................................................0.5WStatic Discharge Voltage............................................>2001V(per MIL-STD-883, Method 3015)
Function Table FCT540T[1]InputsOutputOEAOEBDLLHLLHLHXHLZ
Function Table FCT541T[1]InputsOutputOEAOEBDLLHLLHLHXLHZ
Operating Range
RangeRangeAmbientTemperatureVCC
CommercialT, AT, CT–40°C to +85°C5V± 5%
Military[4]All–55°C to +125°C5V± 10%
Electrical CharacteristicsOver the Operating Range
ParameterDescriptionTest ConditionsMin.Typ.[5]Max.UnitVOHOutput HIGH VoltageVCC= Min., IOH= –32 mACom’l2.0VVCC= Min., IOH= –15 mACom’l2.43.3VVCC= Min., IOH= –12 mAMil2.43.3VVOLOutput LOW VoltageVCC= Min., IOL= 64 mACom’l0.30.55VVCC= Min., IOL= 48 mAMil0.30.55VVIHInput HIGH Voltage2.0VVILInput LOW Voltage0.8VVHHysteresis[6]All inputs0.2VVIKInput Clamp Diode VoltageVCC= Min., IIN= –18 mA–0.7–1.2VIIInput HIGH CurrentVCC= Max., VIN= VCC5µAIIHInput HIGH CurrentVCC= Max., VIN= 2.7V±1µAIILInput LOW CurrentVCC= Max., VIN= 0.5V±1µAIOZHOff State HIGH-Level OutputCurrentVCC= Max., VOUT= 2.7V10µA
IOZLOff State LOW-LevelOutput CurrentVCC=Max., VOUT= 0.5V–10µAIOSOutput Short Circuit Current[7]VCC= Max,. VOUT= 0.0V–60–120–225mAIOFFPower-Off DisableVCC= 0V, VOUT= 4.5V±1µANotes:1.H = HIGH Voltage LevelL = LOW Voltage LevelX = Don’t CareZ = High Impedance2.Unless otherwise noted, these limits are over the operating free-air temperature range.3.Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.4.TA is the “instant on” case temperature.5.Typical values are at VCC=5.0V, TA=+25˚C ambient.6.This parameter is specified but not tested.7.Notmorethanoneoutputshouldbeshortedatatime.Durationofshortshouldnotexceedonesecond.Theuseofhigh-speedtestapparatusand/orsampleandholdtechniquesarepreferableinordertominimizeinternalchipheatingandmoreaccuratelyreflectoperationalvalues.Otherwiseprolongedshortingofahighoutputmayraisethechiptemperaturewellabovenormalandtherebycauseinvalidreadingsinotherparametrictests.Inanysequenceofparametrictests, IOS tests should be performed last.
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