霍尔传感器EST248英文手册

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7. Pinning
3 Name No.
1 2 3
Status
P O P
Description
Power Supply Output Ground
48XXX
1 2
VDD Out Gnd
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Datasheet
CMOS Omnipolar High Sensitivity Micropower Hall Switch
Operating Parameters: TA = 25℃, VDD=2.75VDC Parameter
ESD Voltage
EST248
Symbol Min
VESD -
Unit Max
4 kV
Notes
13. Unique Features
CMOS Hall IC Technology The chopper stabilized amplifier uses switched capacitor techniques to eliminate the amplifier offset voltage, which, in bipolar devices, is a major source of temperature sensitive drift. CMOS makes this advanced technique possible. The CMOS chip is also much smaller than a bipolar chip, allowing very sophisticated circuitry to be placed in less space. The small chip size also contributes to lower physical stress and less power consumption. Installation Comments Consider temperature coefficients of Hall IC and magnetics , as well as air gap and life time variations. Observe temperature limits during wave soldering. Typical IR solder-reflow profile: No Rapid Heating and Cooling. Recommended Preheating for max. 2minutes at 150° C Recommended Reflowing for max. 5seconds at 240° C
Output Voltage(V) 3.0 2.5 2.0 BOPN 1.5 1.0 0.5 ON 0 -80 -60 -40 -20 0 20 40 60 80 BRPN BRPS BOPS OFF
Magnetic Flux (Gauss)
©2009-2012 Innosen Technology Co., Ltd.
Rev3.0.0.121127
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Datasheet
CMOS Omnipolar High Sensitivity Micropower Hall Switch 12. ESD Protection
Human Body Model (HBM) tests according to: Mil. Std. 883F method 3015.7: Limit Values Parameter
VDD
EST248
Sleep/Awake Logic
OUTCΒιβλιοθήκη opperHall Plate
GND
6. Internal Timing Circuit
Current Period Iaw Sample & Output Latched Iav Isp Awake Taw: 120μs 0 Sleep Tsl: 70ms Time
EST248
controlled clocking mechanism to cycle power to the Hall element and analog signal processing circuits. This serves to place the high current-consuming portions of the circuit into a “Sleep” mode. Periodically the device is “Awakened” by this internal logic and the magnetic flux from the Hall element is evaluated against the predefined thresholds. If the flux density is above or below the BOP/BRP thresholds then the output transistor is driven to change states accordingly. While in the “Sleep” cycle the output transistor is latched in its previous state. The design has been optimized for service in applications requiring extended operating lifetime in battery powered systems. The output transistor of the EST248 will be latched on (BOP) in the presence of a sufficiently strong South or North magnetic field facing the marked side of the package. The output will be latched off (BRP) in the absence of a magnetic field.
2. Features
Micropower consumption for battery powered applications Omnipolar, output switches with absolute value of North or South pole from magnet Operation down to 2.5V High sensitivity for direct reed switch replacement applications Chopper stabilized amplifier stage
©2009-2012 Innosen Technology Co., Ltd.
Rev3.0.0.121127
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Datasheet
CMOS Omnipolar High Sensitivity Micropower Hall Switch 1. Description
The EST248 Omnipolar Hall effect sensor IC is fabricated from mixed signal CMOS technology. It incorporates switch points. The circuit design provides an internally advanced chopper-stabilization techniques to provide accurate and stable magnetic
4. Typical Application Circuit
©2009-2012 Innosen Technology Co., Ltd.
Rev3.0.0.121127
1/8
Datasheet
CMOS Omnipolar High Sensitivity Micropower Hall Switch 5. Functional Block Diagram
EST248
Symbol
VDD IDD VOUT IOUT TA TS -
Value
5 5 5 5 -40 ~ 85 -50 ~ 150 4000
Units
V mA V mA ℃ ℃ V
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute-maximum rated conditions for extended periods may affect device reliability.
Symbol
VDD IDD IOUT VSAT TAW TSL
Test Conditions
Operating Average
Min
2.5
Typ
3 5
Max
5.5
Units
V μA
1.0 IOUT=1mA Operating Operating 175 70 0.4
mA V μS mS
10. Magnetic Characteristics
Datasheet
CMOS Omnipolar High Sensitivity Micropower Hall Switch 8. Absolute Maximum Ratings
Parameter
Supply Voltage(operating) Supply Current Output Voltage Output Current Operating Temperature Range Storage Temperature Rang ESD Sensitivity