PASAN太阳模拟器测试仪

Factory Acceptance Test (FAT) reportCustomer:Jinneng (tianjin) Coal Sales Co.,Ltd.Customer address:Economic and Technological Development Zone in the fist street No.79 MSD Block C1,No903 000000 Tianjin City P.R. ChinaEquipment:SunSim3BOrder Number:ORD.1046159This report complies with the IEC 62381:2006(E) standard for the factory acceptance tests.ORD.1046159 Page 1 / 15Summary1. FAT checklist 2. FAT measurement procedures 3. FAT measurement conditions 4. FAT measurement results 5. Equipment traceability 6. Appendix - FAT punch list - FAT certificate - EC certificateORD.1046159 Page 2 / 151. FAT checklist1.1. Scope of supply- Delivery as per Pasan packing list YAll items included in the package have been tested according to Pasan's internal test and acceptance procedures.1.2. Installation- Installation completed - Optional temperature measurement channels (IR, PT100/1000) controlled - Laser printer controlled - Label printer controlled Y Y N NA1.3. Tests and measurements- 20 flashes at 1.2 kW/m² with 95% load capacity - Uniformity measurement - Spectrum measurement - System's repeatability measurement - Long-term temporal instability (LTI) measurement - I-V measurement at different irradiance levels - Low irradiance tests using attenuation masks - Spectral response measurement using band-pass filters Y Y Y Y Y Y NA NAComments: Y N = = Yes No Not applicableORD.1046159 Page 3 / 15NA =2. FAT measurement procedures2.1. Uniformity measurementThe uniformity is measured, according to the IEC 60904-9:Ed2.0 2007-10 standard, using a polycrystalline Si encapsulated reference sample. Special requests of the customer are taken into account. The shortcircuit current of this reference sample is measured on 64 points of the illuminated area, as illustrated on the figure below. This test is carried out when the system is calibrated at 1kW/m2. Due to the fact that the optical design of the PASAN's simulator enables a continuous correction of the non-uniformity, the number of the measurement points is smaller than the one requested by the IEC standard. This approach reduces considerably the measurement time and has been largely proven to be representative of the simulator's non-uniformity. However, the number of the measurement points can be increased upon request.Lamp box8 7 6 5 4 3 2 1 E F G HABCDIlluminated area2.2. Spectrum measurementPasan uses a spectrometer based on a two channel configuration in combination with a 2D high quality silicon CMOS camera. Calibration lamps traceable to Swiss Federal Office of Metrology (METAS) are used for calibration. This measurement is performed, after system calibration, in the wavelength range of 400-1100 nm at 1000 W/m², at nominal working distance and at the center of the illuminated area. The measurement is an average of 5 flashes.2.3. Repeatability measurementThe repeatability is determined, with a calibrated system, using a reference module mounted at the center of the illuminated area. It indicates the measurement dispersions, under certain conditions: First, 10 consecutive measurements are carried out, on the same DuT, without disconnecting the DuT cable. The irradiance is regulated using the monitor cell. The system is then turned off and cooled down during 10 minutes. After the restart, again 10 measurements are performed with the irradiance regulated using the optical sensors. The standard deviations of Isc, Voc and Pmax are taken into account to determine the repeatability and the system's capability.ORD.1046159 Page 4 / 152.4. Short-term temporal instability (STI)As the measuring channels current, voltage and irradiance are each provided with an own A/D converter and all 3 measurements are carried out simultaneously, short-term temporal instability (STI) complies with Class A of IEC 60904-9:Ed2.0 2007-10.2.5. Long-term temporal instability (LTI) measurementThe long-term temporal instability (LTI) was analyzed on the basis of the high speed measurement of the irradiance during a flash pulse. Temporal instability of irradiance was evaluated during an I-V data acquisition period, from the Isc measurement point until the end of the flash. The LTI is evaluated in both irradiance regulation modes, using the monitor cell and the integrated optical sensors.2.6. I-V measurement at different irradiance levelsI-V measurements at 0.7, 1 and 1.2 kW/m² are carried out after system calibration with a reference module mounted at the center of the illuminated area. The capability of the machine to perform measurements at these irradiance levels and the coherence of the measurements are checked.2.7. Measurements with low-irradiance masksI-V measurements at 0.1, 0.2, 0.4, 0.7 and 1 kW/m² are carried out using the low-irradiance masks. Irradiance regulation is performed using the integrated optical sensors. The capability of the machine to perform measurements at these irradiance levels and the coherence of the measurements are checked.2.8. Spectral response measurementThe calibration factors of the band-pass filters are determined using a reference whose spectral response (SR) is known. SR measurement results are compared with those provided by an accredited laboratory for another reference device.3. FAT measurement conditions3.1. Technical requirementsPASAN's simulators provide accurate measurements under certain conditions that need to be fulfilled according to the user manual. The main requirements are as follows: - The calibration of the system must be performed with a reference module provided by an accredited laboratory. - The reference module's spectral response must correspond to the one of the devices under test. - The sensitivity indicated on the monitor cell is a an indicative value and must be adjusted using the reference module. - In order to obtain a reliable fill factor, the module cable must be adapted using appropriate connectors. - The average number of flashes for the flash tubes must be respected for reliable measurements.ORD.1046159 Page 5 / 153.2. Measurement equipmentN° Name 1 Reference sample 2 Reference module 1 3 Reference module 2 4 SpectroSolar Type Calibrated reference sample 3S monocrystalline module 3S polycrystalline module Spectrometer ID PAS057 PV10100031-8002 PVP0018-091120 SI0101743.3. Ambient conditionsTemperature: Humidity: 23.0 60.7 ± ± 0.4 2.2 [°C] [%rH]4. FAT measurement resultsAll acceptance tests are done when the simulator's irradiance is calibrated. To this end, the Isc of a reference device is taken into account to set the control and/or monitor cells' sensitivities. Monitor cell type: Monitor cell ID: Monitor cell sensitivity: Optical sensor gain: Poly-cSi 10-0191-02 104.87 6.8 [mV/(kW/m2)]The sensitivity was determined under very specific conditions. The real sensitivities of the control cell and the monitor cell must be determined, using a reference device provided by the customer and under the real conditions of use. Periodic re-calibrations are necessary.4.1. Uniformity measurement8 7Non-uniformity =0.565%6 5 4 3 26.94-6.96 6.92-6.94 6.9-6.92 6.88-6.9 6.86-6.88 6.84-6.86 6.82-6.84Pasan's acceptance criterion: - Non-uniformity < 1%A B C D E F G H1ORD.1046159 Page 6 / 154.2. Spectrum measurementThe spectral match classification according to IEC 60904-9 is shown below. The spectral irradiance distribution is illustrated and compared with the reference AM1.5 in the secound figure.Evaluation of the simulator's spectrum according to IEC125112.5Ratio to AM1.5 [%]Simulator's spectrum AM1.5100IEC Class A Min IEC Class A Max TÜV A+ Min TÜV A+ Max87.575 400 500 600 700 800 900 1000 1100Wavelength [nm]AM1.5 vs Simulator's spectrumAM1.5 [norm.]0.003Simulator's spectrum [norm.]Irradiance [norm.]0.0025 0.002 0.0015 0.001 0.0005 0 395 495 595 695 795 895 995 1095Wavelength [nm]Pasan's acceptance criterion: - 100nm bands are within ± 12.5% compared with the reference AM1.5ORD.1046159 Page 7 / 154.3. Repeatability measurementDuT type: DuT ID:Poly-cSi PVP0018-091120Isc Average [A, V, W] 2σ [A, V, W] 2σ / average Ĉp 7.648 0.005 0.071% 1.885Voc 24.324 0.009Mpp 135.268 0.1130.038% 0.083% 3.469 3.993∑( 1̂)is the standard deviation."# !Where:$%& &%& 6∙is the measurement process capability.xi is the ith measurement result. n is the number of measurement points. û is the sample average. USL is the upper specification limit which is +0.2%·û for Isc and Voc and +0.5%·û for Pmax. LSL is the lower specification limit which is -0.2%·û for Isc and Voc and -0.5%·û for Pmax.Repeatability evaluation: - 2σ covers approximately 95% of the measurement results. 2σ/û is the dispersion of approximately 95% of the results from the average value. - When Ĉp>1.33, 99.99% of the measurement results are within the specification limit. - When Ĉp>1, 99.73% of the measurement results are within the specification limit.Pasan's acceptance criteria: - 2σ / average < 0.2% for Isc and Voc, 2σ / average < 0.5% for Mpp - ĈpIsc > 1.33, ĈpVoc > 1.33, ĈpPmax > 1ORD.1046159 Page 8 / 154.4. Long-term temporal instability (LTI) measurementIrradiance regulated by monitor cell MinIrradiance = MaxIrradiance = LTI = 1000.977 1002.930 0.097% [W/m²] [W/m²]Irradiance regulated by optical sensors MinIrradiance = MaxIrradiance = LTI = 998.047 1005.859 0.390% [W/m²] [W/m²]&) Pasan's acceptance criterion: - LTI < 1%4.5. I-V measurement at different irradiance levelsIrr. nom. [W/m²] 700 1000 1200Isc [A] 5.354 7.645 9.181Voc [V] 23.954 24.339 24.51Mpp [W] 96.025 135.408 160.186Av. Irr. [W/m²] 699.16 1001.901 1203.3934.6. Measurements with low-irradiance masksIrr. nom. [W/m²] 100 200 400 700 1000Isc [A] NA NA NA NA NAVoc [V] NA NA NA NA NAMpp [W] NA NA NA NA NAAv. Irr. [W/m²] NA NA NA NA NATransmission factor NA NA NA NA NAORD.1046159 Page 9 / 154.7. Spectral response measurementReference type: Reference IDNA NASpectral response measurementPASAN SR1 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 400 500 600 700 800 900 1000 1100Reference SRrel. SR [norm.]Wavelength [nm]ORD.1046159 Page 10 / 154.8. Comparison between FAT results and the standardThe table below contains our results compared to the requirements of standard IEC 60904-9:Ed2.0 2007-10.Measurement 400-500 Spectral match to all intervals ratio 500-600 600-700 700-800 800-900 900-1000 1000-1100 Non-uniformity STI LTIRequirements for IEC Requirements for TÜV* class A+ class A 0.75-1.25 0.75-1.25 0.75-1.25 0.75-1.25 0.75-1.25 0.75-1.25 0.75-1.25 <2% <0.5% <2% 0.875-1.125 0.875-1.125 0.875-1.125 0.875-1.125 0.875-1.125 0.875-1.125 0.875-1.125 <1% <0.5% <1%FAT measurement results 0.9559 0.9925 1.019 0.9778 1.0328 1.0335 1.0335 0.565% <0.5% by construction 0.097%* TÜV Rheinland Energie und Umwelt GmbHTÜV certification process, confirmed that the requirements for the standards were clearly fulfilled and could even be defined as a “A+” rating (meaning twice better than IEC class A). The assessment covers the irradiance range of Pasan simulators. The examination also includes variations in technical performance between different systems of the same type, possible effects caused by lamp replacements and effects that may occur during the specified lamp life.ORD.1046159 Page 11 / 155. Equipment traceabilityDesignation Electronic load Flash pilot Logic USB Voltage + Monitor measurement* Electronic load card* Cell + Temp. Pasan ID BV66-11, 200273 BV66-9, 400010 BV67-2, 400001 BV67-3, 400003 BV66-4, 401140 Serial number 00200273000000270 004000100000201368 00400001M50201666 00400003040201525 00401140010200767Generator Power supply Unit Main power supply unit Safety unit Control unit for capacitor charging Control unit for tubesBV85, 201107 BV77-4, 400007 BV77-1, 400008 BV85-4, 400012 BV85-3, 400011 BV85-81, 400027002010130010032889 400007M101515 400008M101474 4000120200627 4000110001430 4000270200201Lamp boxBV85-99, 200980002009970010032890Options Thermal measure for IR probe* BV66-14, 400022 00400022000200426Thermal measure for contact probe (PT BV66-8, 400440 1000)* Thermal measure for contact probe (PT BV66-27, 401386 100)*NANASoftwareSLABVersion 2.9.2* These cards are calibrated. The relative uncertainty for all measurement channels are reported on the calibration report : ORD.1046159_CLR_1436ORD.1046159 Page 12 / 156. AppendixFAT punch listAny incomplete work or non-conformities shall be recorded on the FAT punch list and categorized as follows:a) to be cleared on the spot, FAT to continue after rectification b) ongoing rectification during FAT c) FAT to be repeated d) modifications to be made after FAT, before the machine are shipped to site e) remaining work to be rectified i.e. on the customer site Item Description Responsible Type Complete12345678ORD.1046159 Page 13 / 15FAT certificateACCEPTEDXNOT ACCEPTEDCustomer Equipment Order number Venue of FAT FAT finished onJinneng (tianjin) Coal Sales Co.,Ltd. SunSim3B ORD.1046159 Neuchâtel, Switzerland September 10, 2014Person in chargePasan operator Customer repr. (if present)Christian RiccardiSignatureNASignatureSpecial requirementsNo punch list items were found Punch list items were found Re-check necessary System ready for shipmentX See FAT punch list Not necessary X XRemarksORD.1046159 Page 14 / 15EC Declaration of ConformityAccording to the “Low Voltage” Directive 2006/95/EC, Annex III BManufacturer :PASAN SA Rue Jaquet-Droz 8 CH-2000 Neuchâtel SwitzerlandWe herewith declare that the product hereunder meets in its design and construction the basic safety and health requirements of the EC regulation. In case the product is modified after delivery and without our approval, this declaration becomes invalid.Product description: Serial number:SunSim3B ORD.1046159Applicable EC directives:2006/95/EC Low Voltage 2004/108/EC Electromagnetic CompatibilityApplied harmonized standards:EN 60904-1 (Measurement of photovoltaic current-voltage characteristics) EN 60904-9 (Solar simulator performance requirements) EN 60891 (Procedures for temperature and irradiance corrections to measured I-V characteristics)Place, date:Neuchâtel,September 10, 2014Name, function, signature:Patrick Volluz, Head of R&DAndréas Von Kaenel, CEOORD.1046159 Page 15 / 15。