MB85344C-60中文资料

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CHIP 06 W A0-A9
CHIP 07 W A0-A9
DQ24 – DQ27
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
DQ28 – DQ31
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CHIP 14 W A0-A9
CAS RAS OE
CHIP 15 W A0-A9
CAS RAS OE
DQ8 – DQ11
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
DQ12 – DQ15
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CHIP 10 W A0-A9
CAS RAS OE
CHIP 11 W A0-A9
CAS RAS OE
CAS RAS OE
CAS RAS OE
CHIP 04 W A0-A9
s ABSOLUTE MAXIMUM RATINGS (See NOTE)
Parameter Supply Voltage Input Voltage Output Voltage Short Circuit Output Current Power Dissipation Storage Temperature
2
MB85344C-60/MB85344C-70
CAS0 RAS0
CAS1
CAS2 RAS2
CAS3
WE A0 – A9 VCC VSS
FUNCTIONAL BLOCK DIAGRAM
CAS RAS OE
CAS RAS OE
CHIP 00 W A0-A9
DQ0 – DQ3
I/O
I/O
I/O
I/O
I/O
VIL
–0.3

0.8
V
TA
0

70
°C
Note: *Undershoots of up to –2.0 volts with a pulse width not exceeding 20 ns are acceptable.
s DC CHARACTERISTICS (Recommended operating conditions unless otherwise noted.)
FUJITSU SEMICONDUCTOR DATA SHEET
DS05-11211-1E
MEMORY
CMOS 2M × 32 BIT HYPER PAGE MODE DRAM MODULE
MB85344C-60/-70
CMOS 2,097,152 × 32 Bit Hyper Page Mode DRAM Module
1
MB85344C-60/MB85344C-70
s PRODUCT LINE & FEATURES
Parameter
RAS Access Time
Random Cycle Time
Address Access Time
CAS Access Time
Hyper Page Mode Cycle Time
RAS CAS Address, WE
0 V ≤ VIN ≤ 5.5 V, 4.5 V ≤ VCC ≤ 5.5 V, VSS = 0 V, all other pins
not under test = 0 V
–30 30 II (L) –30 30 µA
–90 90
Output Leakage Current
Parameter
Test Condition
Symbol Min. Max. Unit
Output High Voltage*1
IOH = –5 mA
VOH 2.4 — V
Output Low Voltage*1
IOL = 4.2 mA
VOL
— 0.4 V
Input Leakage Current
Min.
Typ.
Max.
Unit
Supply Voltage Ground Input High Voltage, all inputs Input Low Voltage, all inputs* Ambient Temperature
VCC
4.5
5.0
5.5
V
VSS

0

V
VIH
2.4

6.5
V
NC
38 37
CAS0 CAS3
40 42
39 41
RAS0 NC
44 46
43 45
NC DQ24
48 50
47 49
DQ25 DQ26
52 54
51 53
DQ27 DQ28
56 58
55 57
DQ29 DQ30
60 62
59 61
DQ31 NC
64 66
63 65
PD2 PD4
68 70
67 69
s DESCRIPTION
The Fujitsu MB85344C is a fully decoded, CMOS dynamic random access memory (DRAM) module consisting of sixteen MB814405C devices. The MB85344C is optimized for those applications requiring high speed, high performance and large memory storage. The operation and electrical characteristics of the MB85344C are the same as the MB814405C which features hyper page mode operation providing extended valid time for data output and higher speed random access of upto 1,024-bit of data within the same row than the fast page mode. For ease of memory expansion, the MB85344C is offered in a 72-pad Single In-line Memory Module package (SIMM).
Symbol VCC VIN VOUT IOUT PD TSTG
Value –0.5 to +7.0 –0.5 to +7.0 –0.5 to +7.0
±50 16 –55 to +125
Unit V V V mA W °C
NOTE: Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields. However, it is advised that normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to this high impedance circuit.
CHIP 05 W A0-A9
DQ16 – DQ19
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
DQ20 – DQ23
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CHIP 12 W A0-A9
CAS RAS OE
CHIP 13 W A0-A9
CAS RAS OE
CAS RAS OE
CAS RAS OE
— 504
ICC1
mA
— 448
Standby Current (Power supply current)
TTL Level CMOS Level
RAS = CAS =VIH RAS = CAS ≥VCC–0.2 V
— 32
ICC2
mA
— 16
Refresh Current #1*2
MB85344C-60 CAS = VIH, RAS = cycling,
DQ0 DQ1
2 4
1 3
DQ2 DQ3
6 8
5 7
VCC A0
10 12
9 11
A2 A4
14 16
13 15
A6 DQ4
18 20
17 19
DQ5 DQ6