CY7C1041DV33-12VXE中文资料
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4-Mbit (256K x 16) Static RAMCY7C1041DV33Features•Pin- and function-compatible with CY7C1041CV33•High speed —t AA =10 ns •Low active power—I CC = 90 mA @ 10 ns (Industrial)•Low CMOS standby power —I SB2 = 10 mA •2.0 V data retention•Automatic power-down when deselected •TTL-compatible inputs and outputs•Easy memory expansion with CE and OE features•Available in lead-free 48-ball VFBGA, 44-lead (400-mil) Molded SOJ and 44-pin TSOP II packagesFunctional Description [1]The CY7C1041DV33 is a high-performance CMOS Static RAM organized as 256K words by 16 bits. Writing to the device is accomplished by taking Chip Enable (CE) and Write Enable (WE) inputs LOW. If Byte LOW Enable (BLE) is LOW, then data from I/O pins (I/O 0–I/O 7), is written into the location specified on the address pins (A 0–A 17). If Byte HIGH Enable (BHE) is LOW, then data from I/O pins (I/O 8–I/O 15) is written into the location specified on the address pins (A 0–A 17).Reading from the device is accomplished by taking Chip Enable (CE) and Output Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If Byte LOW Enable (BLE) is LOW,then data from the memory location specified by the address pins will appear on I/O 0 – I/O 7. If Byte HIGH Enable (BHE) is LOW, then data from memory will appear on I/O 8 to I/O 15. See the truth table at the back of this data sheet for a complete description of Read and Write modes.The input/output pins (I/O 0–I/O 15) are placed in a high-impedance state when the device is deselected (CE HIGH), the outputs are disabled (OE HIGH), the BHE and BLE are disabled (BHE, BLE HIGH), or during a Write operation (CE LOW, and WE LOW).The CY7C1041DV33 is available in a standard 44-pin 400-mil-wide body width SOJ and 44-pin TSOP II package with center power and ground (revolutionary) pinout, as well as a 48-ball fine-pitch ball grid array (FBGA) package.Note1.For guidelines on SRAM system design, please refer to the “System Design Guidelines” Cypress application note, available on the internet at .1415Logic Block DiagramA 1A 2A 3A 4A 5A 6A 7A 8COLUMN DECODERR O W D E C O D E RS E N S E A M P SINPUT BUFFER256K × 16A 0A 11A 13A 12A A A 16A 17A 9A 10I/O 0–I/O 7OE I/O 8–I/O 15CE WE BLEBHECY7C1041DV33Selection Guide–10 (Industrial)–12 (Automotive)[2]Unit Maximum Access Time 1012ns Maximum Operating Current 9095mA Maximum CMOS Standby Current1015mAPin ConfigurationsNote2.Automotive product information is Preliminary.48-ball Mini FBGAWE V CC A 11A 10NC A 6A 0A 3CE I/O 2I/O 0I/O 1A 4A 5I/O 3I/O 5I/O 4I/O 6I/O 7V SS A 9A 8OE V SSA 7I/O 8BHE NC A 17A 2A 1BLE V CC I/O 9I/O 10I/O 11I/O 12I/O 13I/O 14I/O 15A 15A 14A 13A 12NC NCNC326541D E B A C F G HA 16Top ViewSOJTSOP II WE 1234567891011143132363534333740393812134144434216152930V CC A 5A 6A 7A 8A 0A 1OE V SS A 17I/O 15A 2CE I/O 2I/O 0I/O 1BHE A 3A 418172019I/O 32728252622212324V SS I/O 6I/O 4I/O 5I/O 7A 16A 15BLE V CC I/O 14I/O 13I/O 12I/O 11I/O 10I/O 9I/O 8A 14A 13A 12A 11A 9A 10NC (Top View)CY7C1041DV33Maximum Ratings(Above which the useful life may be impaired. For user guide-lines, not tested.)Storage Temperature .................................–65°C to +150°C Ambient Temperature withPower Applied.............................................–55°C to +125°C Supply Voltage on V CC to Relative GND [3]....–0.3V to +4.6V DC Voltage Applied to Outputsin High-Z State [3].....................................–0.3V to V CC +0.3V DC Input Voltage [3]..................................–0.3V to V CC +0.3VCurrent into Outputs (LOW).........................................20 mA Static Discharge Voltage............................................>2001V (per MIL-STD-883, Method 3015)Latch-up Current......................................................>200 mAOperating RangeRange Ambient Temperature V CC Speed Industrial –40°C to +85°C 3.3V ± 0.3V 10 ns Automotive–40°C to +125°C3.3V ± 0.3V12 nsNote3.Minimum voltage is–2.0V and V IH (max) = V CC + 2V for pulse durations of less than 20 ns.DC Electrical Characteristics Over the Operating RangeParameter Description Test Conditions–10 (Industrial)–12 (Automotive)Unit Min.Max.Min.Max.V OH Output HIGH Voltage V CC = Min., I OH = –4.0 mA 2.42.4V V OL Output LOW Voltage V CC = Min., I OL = 8.0 mA0.40.4V V IH [3]Input HIGH Voltage2.0V CC + 0.3 2.0V CC + 0.3V V IL [3]Input LOW Voltage–0.30.8–0.30.8V I IX Input Leakage Current GND < V I < V CC –1+1–1+1µA I OZ Output Leakage Current GND < V OUT < V CC , Output Disabled –1+1–1+1µA I CCV CC Operating Supply CurrentV CC = Max., f = f MAX = 1/t RC 100MHz90-mA 83MHz 8095mA 66MHz 7085mA 40MHz6075mA I SB1Automatic CE Power-downCurrent—TTL InputsMax. V CC , CE > V IH V IN > V IH orV IN < V IL , f = f MAX2025mAI SB2Automatic CE Power-down Current—CMOS Inputs Max. V CC , CE > V CC – 0.3V,V IN > V CC – 0.3V,or V IN < 0.3V, f = 01015mACY7C1041DV33Capacitance [4]Parameter DescriptionTest ConditionsMax.Unit C IN Input Capacitance T A = 25°C, f = 1 MHz, V CC = 3.3V8pF C OUTI/O Capacitance8pFThermal Resistance [4]ParameterDescription Test Conditions FBGA Package SOJ Package TSOP II Package Unit ΘJA Thermal Resistance (Junction to Ambient)Still Air, soldered on a3 × 4.5 inch,four-layer printed circuitboard27.8957.9150.66°C/W ΘJCThermal Resistance (Junction to Case)14.7436.7317.17°C/WAC Test Loads and Waveforms [5]90%10%3.0V GND90%10%ALL INPUT PULSES * CAPACITIVE LOAD CONSISTS OF ALL COMPONENTS OF THE TEST ENVIRONMENT Rise Time: 1 V/nsFall Time: 1 V/ns30 pF*OUTPUTZ = 50Ω50Ω1.5V(b)(a)3.3V OUTPUT5 pF(c)R 317ΩR2351ΩHigh-Z Characteristics10 ns deviceNotes4.Tested initially and after any design or process changes that may affect these parameters.5.AC characteristics (except High-Z) are tested using the load conditions shown in Figure (a). High-Z characteristics are tested for all speeds using the test load shown in Figure (c).CY7C1041DV33 AC Switching Characteristics Over the Operating Range[6]Parameter Description–10 (Industrial)–12 (Automotive)Unit Min.Max.Min.Max.Read Cyclet power[7]V CC(typical) to the first access100100µst RC Read Cycle Time1012nst AA Address to Data Valid1012nst OHA Data Hold from Address Change33nst ACE CE LOW to Data Valid1012nst DOE OE LOW to Data Valid56nst LZOE OE LOW to Low-Z00nst HZOE OE HIGH to High-Z[8, 9]56nst LZCE CE LOW to Low-Z[9]33nst HZCE CE HIGH to High-Z[8, 9]56nst PU CE LOW to Power-Up00nst PD CE HIGH to Power-Down1012nst DBE Byte Enable to Data Valid56nst LZBE Byte Enable to Low-Z00nst HZBE Byte Disable to High-Z66ns Notes6.Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specifiedI OL/I OH and 30-pF load capacitance.7.t POWER gives the minimum amount of time that the power supply should be at typical V CC values until the first memory access can be performed.8.t HZOE, t HZCE,t HZBE and t HZWE are specified with a load capacitance of 5 pF as in part (c) of AC Test Loads. Transition is measured when the outputs enter a highimpedance state.9.At any given temperature and voltage condition, t HZCE is less than t LZCE, t HZOE is less than t LZOE, t HZBE is less than t LZBE, and t HZWE is less than t LZWE for anygiven device.CY7C1041DV33Write Cycle [10, 11]t WC Write Cycle Time 1012ns t SCE CE LOW to Write End 78ns t AW Address Set-Up to Write End 78ns t HA Address Hold from Write End 00ns t SA Address Set-Up to Write Start 00ns t PWE WE Pulse Width78ns t SD Data Set-Up to Write End 56ns t HD Data Hold from Write End 00ns t LZWE WE HIGH to Low-Z [9]33ns t HZWE WE LOW to High-Z [8, 9]56ns t BWByte Enable to End of Write78nsData Retention Characteristics Over the Operating RangeParameter DescriptionConditions [12]Min.Max.Unit V DR V CC for Data Retention 2.0V I CCDRData Retention CurrentV CC = V DR = 2.0V,CE > V CC – 0.3V,V IN > V CC – 0.3V or V IN < 0.3VInd’l 10mA Auto15mA t CDR [4]Chip Deselect to Data Retention Time 0ns t R [13]Operation Recovery Timet RCnsData Retention WaveformAC Switching Characteristics Over the Operating Range [6](continued)ParameterDescription–10 (Industrial)–12 (Automotive)UnitMin.Max.Min.Max.3.0V 3.0V t CDRV DR >2VDATA RETENTION MODEt RCEV CC Notes10.The internal Write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a Write, and the transition ofeither of these signals can terminate the Write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the Write.11.The minimum Write cycle time for Write Cycle No. 4 (WE controlled, OE LOW) is the sum of t HZWE and t SD .12.No input may exceed V CC + 0.3V.13.Full device operation requires linear V CC ramp from V DR to V CC(min.) > 50 µs or stable at V CC(min.) > 50 µsCY7C1041DV33Switching WaveformsRead Cycle No. 1[14, 15]Read Cycle No. 2 (OE Controlled)[15, 16]PREVIOUS DATA VALIDDATA VALIDt RCt AAt OHAADDRESSDATA OUT50%50%DATA VALIDt RCt ACEt DOE t LZOE t LZCE t PUHIGH IMPEDANCEt HZOEt HZBEt PDHIGHOE CEICC ISB IMPEDANCEADDRESSDATA OUT V CC SUPPLY t DBE t LZBEt HZCE BHE,BLECURRENTI CCI SBNotes14.Device is continuously selected. OE, CE, BHE and/or BHE = V IL .15.WE is HIGH for Read cycle.16.Address valid prior to or coincident with CE transition LOW.CY7C1041DV33Write Cycle No. 1 (CE Controlled)[17, 18]Switching Waveforms (continued)t HDt SDt SCEt SA t HAt AWt PWEt WCBWDATAI/OADDRESSCEWEBHE,BLEt Notes17.Data I/O is high-impedance if OE or BHE and/or BLE = V IH .18.If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.CY7C1041DV33Write Cycle No. 2 (BLE or BHE Controlled)Write Cycle No. 3 (WE Controlled, OE HIGH During Write)[17, 18]Switching Waveforms (continued)t HDt SDt BWt SA t HAt AWt PWEt WCt SCEDATAI/OADDRESSBHE,BLEWECEt HDtSDt PWEt SAt HAt AWt SCEt WCtHZOEDATA IN VALIDCEADDRESSWEDATA I/OOENOTE 19BHE,BLENote19.During this period the I/Os are in the output state and input signals should not be applied.CY7C1041DV33Write Cycle No. 4 (WE Controlled, OE LOW)Truth TableCE OE WE BLE BHE I/O 0–I/O 7I/O 8–I/O 15ModePower H X X X X High-Z High-Z Power-down Standby (I SB )L L H L L Data Out Data Out Read All Bits Active (I CC )L L H L H Data Out High-Z Read Lower Bits Only Active (I CC )L L H H L High-Z Data Out Read Upper Bits Only Active (I CC )L X L L L Data In Data In Write All Bits Active (I CC )L X L L H Data In High-Z Write Lower Bits Only Active (I CC )L X L H L High-Z Data In Write Upper Bits Only Active (I CC )LHHXXHigh-ZHigh-ZSelected, Outputs DisabledActive (I CC )Switching Waveforms (continued)t HDt SDt SCEt HAt AWt PWEt WCt BWDATA I/OADDRESSCEWEBHE,BLEt SAt LZWEt HZWENOTE 19BHE,BLE Ordering InformationSpeed (ns)Ordering Code Package Diagram Package TypeOperating Range 10CY7C1041DV33-10BVI 51-8515048-ball VFBGAIndustrialCY7C1041DV33-10BVXI 48-ball VFBGA (Pb-Free)CY7C1041DV33-10VXI 51-8508244-lead (400-mil) Molded SOJ (Pb-Free)CY7C1041DV33-10ZSXI51-8508744-pin TSOP II (Pb-Free)CY7C1041DV3312CY7C1041DV33-12BVXE 51-8515048-ball VFBGA (Pb-Free)AutomotiveCY7C1041DV33-12VXE 51-8508244-lead (400-mil) Molded SOJ (Pb-Free)CY7C1041DV33-12ZSXE51-8508744-pin TSOP II (Pb-Free)Please contact your local Cypress sales representative for availability of these partsOrdering InformationSpeed (ns)Ordering Code Package Diagram Package TypeOperating Range Package DiagramsCY7C1041DV33Package Diagrams(continued)Figure 2. 44-lead (400-mil) Molded SOJ (51-85082)51-85082-*BCY7C1041DV33Document #: 38-05473 Rev. *D Page 13 of 14© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use All products and company names mentioned in this document may be the trademarks of their respective holders.Figure 3. 44-pin TSOP II (51-85087)Package Diagrams (continued)51-85087-*ACY7C1041DV33Document History PageDocument Title: CY7C1041DV33 4-Mbit (256K x 16) Static RAMDocument Number: 38-05473REV.ECN NO.Issue Date Orig. ofChange Description of Change **201560See ECN SWI Advance Data sheet for C9 IPP*A233729See ECN RKF 1.AC, DC parameters are modified as per EROS(Spec # 01-2165)2.Pb-free offering in the ‘Ordering information’*B351117See ECN PCI Changed from Advance to PreliminaryRemoved 15 and 20 ns Speed binCorrected DC voltage (min) value in maximum ratings section from - 0.5 to- 0.3VRedefined I CC values for Com’l and Ind’l temperature rangesI CC (Com’l):Changed from 100, 80 and 67 mA to 90, 80 and 75 mA for 8, 10and 12ns speed bins respectivelyI CC (Ind’l): Changed from 80 and 67 mA to 90 and 85 mA for 10 and 12nsspeed bins respectivelyAdded Static Discharge Voltage and latch-up current specAdded V IH(max)spec in Note# 2Changed Note# 4 on AC Test LoadsChanged reference voltage level for measurement of Hi-Z parameters from±500 mV to ±200 mVAdded Data Retention Characteristics/Waveform and footnote # 11, 12Added Write Cycle (WE Controlled, OE HIGH During Write) Timing DiagramChanged Package Diagram name from 44-pin TSOP II Z44 to 44-pin TSOPII ZS44 and from 44-lead (400-mil) Molded SOJ V34 to 44-lead (400-mil)Molded SOJ V44Changed part names from Z to ZS in the Ordering Information TableAdded 8 ns Product InformationAdded Lead-Free Ordering InformationShaded Ordering Information Table*C446328See ECN NXR Converted from Preliminary to FinalRemoved -8 speed binRemoved Commercial Operating Range product informationIncluded Automotive Operating Range product informationUpdated Thermal Resistance tableUpdated footnote #8 on High-Z parameter measurementUpdated the ordering information and replaced Package Name column withPackage Diagram in the Ordering Information Table *D480177See ECN VKN Added -10BVI product ordering code in the Ordering Information table。