Vol. 40, No. 6航 天 器 环 境 工 程第 40 卷第 6 期650SPACECRAFT ENVIRONMENT ENGINEERING2023 年 12 月https:// E-mail: ***************Tel: (010)68116407, 68116408, 68116544先进制程芯片在轨飞行验证通用系统设计王红霞1，刘鸿瑾1,2*，张绍林1,2，李 宾1，徐 建2，马远航1，于薇薇1，付宝玲1，刘迎辉3，邓 峥3，张雷浩3（1. 北京轩宇空间科技有限公司，北京 100104； 2. 北京控制工程研究所； 3. 中国空间技术研究院：北京 100094）摘要：中国空间站的建立为国产先进制程芯片提供了真实的在轨飞行验证条件。
为实现不同种类、不同型号国产先进制程电子元器件在空间辐射环境中的验证，设计了一种通用的在轨飞行验证系统。
系统采用“主控单元+试验单元”的平台架构，运用在轨可更换模块和可重构的系统设计，支持航天员定期在轨更换试验模块以完成验证任务的在轨升级。
文中给出系统的硬件设计、软件数据管理机制以及在轨飞行验证结果。
结果表明，该系统设计有效，成功完成了16 nm FinFET、28 nm亿门级FPGA、高速DAC 等10类20余款国产先进制程芯片的在轨工作监测，可为国产先进制程芯片空间适用性研究提供参考。
关键词：先进制程芯片；空间辐射环境；空间适用性；在轨飞行验证；系统设计中图分类号：V417+.3文献标志码：A文章编号：1673-1379(2023)06-0650-07 DOI: 10.12126/see.2023044Design of a universal system for in-orbit flight verification ofadvanced process chipsWANG Hongxia1, LIU Hongjin1,2*, ZHANG Shaolin1,2, LI Bin1, XU Jian2, MA Yuanhang1, YU Weiwei1,FU Baoling1, LIU Yinghui3, DENG Zheng3, ZHANG Leihao3(1. Beijing Sunwise Space Technology Co., Ltd., Beijing 100104, China;2. Beijing Institute of Control Engineering;3. China Academy of Space Technology: Beijing 100094, China)Abstract: The establishment of China’s space station provides real in-orbit flight verification conditions for domestic advanced process chips. To realize the verification of different types and models of advanced process domestic chips in space radiation environment, a universal in-orbit verification system was designed. The system adopts a platform architecture of “main control unit + test unit”, as well as a scheme of in-orbit replaceable module and reconfigurable system design, allowing astronauts to regularly complete in-orbit upgrades of chips. This paper describes the hardware design of the system, the software data management mechanism and the in-orbit flight verification results. It is indicated that the proposed design is effective, for with the design, in-orbit monitoring of more than twenty types of domestic chips in ten categories were successfully completed, including the 16 nm FinFET, the 28 nm billion gate FPGA, and the high-speed DAC. This study may provide a reference for the research on the aerospace applicability of domestic advanced process chips.Keywords: advanced process chips; space radiation environment; space applicability; flight verification; system design收稿日期：2023-04-06；修回日期：2023-11-30基金项目：空天高性能处理器芯片北京市工程研究中心创新能力建设项目（编号：202110102651302615）引用格式：王红霞, 刘鸿瑾, 张绍林, 等. 先进制程电子元器件在轨飞行验证通用系统设计[J]. 航天器环境工程, 2023, 40(6): 650-656WANG H X, LIU H J, ZHANG S L, et al. Design of a universal system for in-orbit flight verification of advanced process chips[J]. Spacecraft Environment Engineering, 2023, 40(6): 650-6560 引言空间环境充满来自各种高能粒子和射线的辐射，辐射效应可能导致某些航天器集成电路（IC）芯片的失效。
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