High-speed low-kickback-noise accurate comparators based on preamplifier-latch topology
- 格式:pdf
- 大小:4.12 MB
- 文档页数:6
High-Speed Low-Kickback-Noise Accurate Comparators Based on Preamplifier-Latch Topology
Obalit Shino*, Ali Baradaran Rezaeii and Tohid Moradi Department of Microelectronics Engineering, Urmia Graduate Institute *m.o.shino@urumi.ac.ir
Abstract— Implementation of many high-speed systems, such as ADCs, is dependent on high performance comparators. In this paper two structures are presented for high-speed, low-noise and accurate applications. Both of the circuits are based on a positive feedback structure of two back-to-back inverters. First circuit is an improved rail-to-rail folded cascode amplifier in which an active bias circuit is utilized for rearranging the structure appropriate to the running comparison phase. Next circuit is a new comparator which is distinguished by its novel data reception style. In this circuit, PMOS transistors of the latch structure are constructed in separate n-wells, known as hot n-well. Inputs are applied to the bulks of the mentioned PMOS transistors via two differential pairs; hence due to isolation of regenerative outputs from bulks, a sensible attenuation in kickback noise value is observed. Despite the noted advantage, employing hot n-wells enlarges the active area of comparator. Another drawback of the proposed comparator is the necessity of utilizing extra capacitors in its structure. Although the capacitors are negligibly small, their construction should be without any tolerance, otherwise, any mismatch in their structure will enhance the total offset of the circuit. An advantage that can be noted for both presented circuits is the possibility of merging the evaluation phase with reset and latch sequences which leads to an intense increase in comparison speed. The comparators have been simulated using CSMC 0.35μm CMOS process model considering process variations, VDD noise of 100mVp-p, alterations in temperature and applying the inputs for testing the comparators in worst case. Simulation results confirm recognition of a differential input with 2mV pick-to-pick amplitude at as high a clock frequency as 800MHz with power consumption about 2.6mW for first circuit and a 1mV differential input with update rate of 1GHz and power consumption about 1.6mW for the low-noise structure of the second comparator. Layout results of the circuits apprize a 55μm × 13μm and a 24μm × 15μm active area for improved folded cascode comparator and the proposed novel structure respectively.
Keywords- High Speed Comparator; Kickback Noise; High Speed ADC; High Resolution Comparator.
I. INTRODUCTION CMOS high-speed analog-to-digital converters (ADCs) are one of the best suited blocks for vast use in the growing field of digital signal processing. Many challenges in the overall design process of these ADCs had to be solved to achieve high performance systems with desirable characteristics. A high-
speed, high-resolution and low-power comparator can be assumed as the bottleneck of the high performance ADC structures, therewith a low power consumption is expected, to keep the overall power consumption of the system in a reasonable level. Voltage comparators are circuits which compare the input voltage with a particular reference value and output a "high" or "low" signal based on the comparison. Unlike the input voltage of a comparator that changes continuously, the output value changes in steps at the input clock edges. Despite the great variety, according to their main architecture, comparators can be categorized in two groups, single-stage and multi-stage structures [2]. The multi-stage comparators are usually based on an input block acting as a pre-amplifier, one or more intermediate stages for increasing the overall gain and attenuation of the kickback effect on analog input signals, [5], and finally an output latch which guaranties the complete separation of the differential output voltages. Multiplicity of internal stages in structure of the comparators increases the total delay time and hence prolongs the comparison cycle which means a great restriction for speed enhancement. Moreover, additional stages result in larger die size and extra power consumption which are wholly in conflict with integration traits. It might seem that the single stage comparators, [1][2][3][4], are more proportional with integration features, but executing the consecutive sequences of comparison process (reset, evaluation and latch), using a single block, obligates the rearrangement of block structure, using some additional controlling signals [1][2]. Variety of timing signals might increase the digital coupled noise in analog section, also generation of these controlling signals requires some extra hardware which again increases the die size and power consumption of the system. CMOS process variation is the main origin of the offset voltage introduced to the latched comparators, which extremely restricts their comparison accuracy. Coupling a pre-amplifier stage before the output latch attenuates the input-referred offset voltage of comparator, thus an accurate preamplifier-latch topology is engendered, [6][7][8], making it possible to utilize the comparator for high-resolution purposes.