GS8662R36E-250I中文资料

GS8662R08/09/18/36E-333/300/250/200/16772Mb SigmaCIO DDR-II Burst of 4 SRAM333 MHz–167 MHz1.8 V V DD1.8 V and 1.5 V I/O165-Bump BGA Commercial Temp Industrial Temp Features• Simultaneous Read and Write SigmaCIO™ Interface • Common I/O bus• JEDEC-standard pinout and package • Double Data Rate interface• Byte Write (x36 and x18) and Nybble Write (x8) function • Burst of 4 Read and Write• 1.8 V +100/–100 mV core power supply • 1.5 V or 1.8 V HSTL Interface• Pipelined read operation with self-timed Late Write • Fully coherent read and write pipelines• ZQ pin for programmable output drive strength • IEEE 1149.1 JTAG-compliant Boundary Scan• Pin-compatible with present 9Mb, 18Mb, 36Mb and future 144Mb devices• 165-bump, 15 mm x 17 mm, 1 mm bump pitch BGA package • RoHS-compliant 165-bump BGA package availableSigmaCIO ™ Family OverviewThe GS8662R08/09/18/36E are built in compliance with the SigmaCIO DDR-II SRAM pinout standard for Common I/O synchronous SRAMs. They are 75,497,472-bit (72Mb)SRAMs. The GS8662R08/09/18/36E SigmaCIO SRAMs are just one element in a family of low power, low voltage HSTL I/O SRAMs designed to operate at the speeds needed toimplement economical high performance networking systems.Clocking and Addressing SchemesThe GS8662R08/09/18/36E SigmaCIO DDR-II SRAMs are synchronous devices. They employ two input register clock inputs, K and K. K and K are independent single-ended clock inputs, not differential inputs to a single differential clock input buffer. The device also allows the user to manipulate theoutput register clock inputs quasi independently with the C and C clock inputs. C and C are also independent single-endedclock inputs, not differential inputs. If the C clocks are tied high, the K clocks are routed internally to fire the output registers instead.Common I/O x36 and x18 SigmaCIO DDR-II B4 RAMs always transfer data in four packets. When a new address is loaded, A0 and A1 preset an internal 2 bit linear addresscounter. The counter increments by 1 for each beat of a burst of four data transfer. The counter always wraps to 00 after reaching 11, no matter where it starts.Common I/O x8 SigmaCIO DDR-II B4 RAMs always transfer data in four packets. When a new address is loaded, the LSBs are internally set to 0 for the first read or write transfer, and incremented by 1 for the next 3 transfers. Because the LSBs are tied off internally, the address field of a x8 SigmaCIO DDR-II B4 RAM is always two address pins less than the advertised index depth (e.g., the 4M x 18 has a 1024K addressable index).Parameter Synopsis-333-300-250-200-167tKHKH 3.0 ns 3.3 ns 4.0 ns 5.0 ns 6.0 ns tKHQV0.45 ns0.45 ns0.45 ns0.45 ns0.5 ns165-Bump, 15 mm x 17 mm BGA 1 mm Bump Pitch, 11 x 15 Bump ArrayBottom View2M x 36 SigmaCIO DDR-II SRAM—Top View1234567891011ACQ MCL/SA (144Mb)SA R/W BW2K BW1LD SA SA CQ B NC DQ27DQ18SA BW3K BW0SA NC NC DQ8C NC NC DQ28V SS SA SA0SA1V SS NC DQ17DQ7D NC DQ29DQ19V SS V SS V SS V SS V SS NC NC DQ16E NC NC DQ20 V DDQ V SS V SS V SS V DDQ NC DQ15DQ6F NC DQ30DQ21 V DDQ V DD V SS V DD V DDQ NC NC DQ5G NC DQ31DQ22 V DDQ V DD V SS V DD V DDQ NC NC DQ14H Doff V REF V DDQ V DDQ V DD V SS V DD V DDQ V DDQ V REF ZQ J NC NC DQ32 V DDQ V DD V SS V DD V DDQ NC DQ13DQ4K NC NC DQ23V DDQ V DD V SS V DD V DDQ NC DQ12DQ3L NC DQ33DQ24 V DDQ V SS V SS V SS V DDQ NC NC DQ2M NC NC DQ34 V SS V SS V SS V SS V SS NC DQ11DQ1N NC DQ35DQ25 V SS SA SA SA V SS NC NC DQ10P NC NC DQ26SA SA C SA SA NC DQ9DQ0RTDOTCKSASASACSASASATMSTDI11 x 15 Bump BGA—13 x 15 mm 2 Body—1 mm Bump PitchNotes:1.BW0 controls writes to DQ0:DQ8; BW1 controls writes to DQ9:DQ17; BW2 controls writes to DQ18:DQ26; BW3 controls writes toDQ27:DQ352.MCL = Must Connect LowGS8662R08/09/18/36E-333/300/250/200/1674M x 18 SigmaCIO DDR-II SRAM—Top View1234567891011ACQ SA SA R/W BW1K NC LD SA SA CQ B NC DQ9NC SA NC K BW0SA NC NC DQ8C NC NC NC V SS SA SA0SA1V SS NC DQ7NC D NC NC DQ10V SS V SS V SS V SS V SS NC NC NC E NC NC DQ11 V DDQ V SS V SS V SS V DDQ NC NC DQ6F NC DQ12NC V DDQ V DD V SS V DD V DDQ NC NC DQ5G NC NC DQ13 V DDQ V DD V SS V DD V DDQ NC NC NC H Doff V REF V DDQ V DDQ V DD V SS V DD V DDQ V DDQ V REF ZQ J NC NC NC V DDQ V DD V SS V DD V DDQ NC DQ4NC K NC NC DQ14V DDQ V DD V SS V DD V DDQ NC NC DQ3L NC DQ15NC V DDQ V SS V SS V SS V DDQ NC NC DQ2M NC NC NC V SS V SS V SS V SS V SS NC DQ1NC N NC NC DQ16 V SS SA SA SA V SS NC NC NC P NC NC DQ17SA SA C SA SA NC NC DQ0RTDOTCKSASASACSASASATMSTDI11 x 15 Bump BGA—13 x 15 mm 2 Body—1 mm Bump PitchNotes:1.BW0 controls writes to DQ0:DQ8; BW1 controls writes to DQ9:DQ172.MCL = Must Connect LowGS8662R08/09/18/36E-333/300/250/200/1678M x 9 SigmaCIO DDR-II SRAM—Top View1234567891011ACQ SA SA R/W NC K NC LD SA SA CQ B NC NC NC SA NC K BW SA NC NC DQ4C NC NC NC V SS SA NC SA V SS NC NC NC D NC NC NC V SS V SS V SS V SS V SS NC NC NC E NC NC DQ5 V DDQ V SS V SS V SS V DDQ NC NC DQ3F NC NC NC V DDQ V DD V SS V DD V DDQ NC NC NC G NC NC DQ6 V DDQ V DD V SS V DD V DDQ NC NC NC H Doff V REF V DDQ V DDQ V DD V SS V DD V DDQ V DDQ V REF ZQ J NC NC NC V DDQ V DD V SS V DD V DDQ NC DQ2NC K NC NC NC V DDQ V DD V SS V DD V DDQ NC NC NC L NC DQ7NC V DDQ V SS V SS V SS V DDQ NC NC DQ1M NC NC NC V SS V SS V SS V SS V SS NC NC NC N NC NC NC V SS SA SA SA V SS NC NC NC P NC NC DQ8SA SA C SA SA NC NC DQ0RTDOTCKSASASACSASASATMSTDI11 x 15 Bump BGA—13 x 15 mm 2 Body—1 mm Bump PitchNotes:1.Unlike the x36 and x18 versions of this device, the x8 and x9 versions do not give the user access to A0 and A1. SA0 and SA1 are set to0 at the beginning of each access.2.MCL = Must Connect LowGS8662R08/09/18/36E-333/300/250/200/1678M x 8 SigmaCIO DDR-II SRAM—Top View1234567891011ACQ SA SA R/W NW1K NC LD SA SA CQ B NC NC NC SA NC K NW0SA NC NC DQ3C NC NC NC V SS SA NC SA V SS NC NC NC D NC NC NC V SS V SS V SS V SS V SS NC NC NC E NC NC DQ4 V DDQ V SS V SS V SS V DDQ NC NC DQ2F NC NC NC V DDQ V DD V SS V DD V DDQ NC NC NC G NC NC DQ5 V DDQ V DD V SS V DD V DDQ NC NC NC H Doff V REF V DDQ V DDQ V DD V SS V DD V DDQ V DDQ V REF ZQ J NC NC NC V DDQ V DD V SS V DD V DDQ NC DQ1NC K NC NC NC V DDQ V DD V SS V DD V DDQ NC NC NC L NC DQ6NC V DDQ V SS V SS V SS V DDQ NC NC DQ0M NC NC NC V SS V SS V SS V SS V SS NC NC NC N NC NC NC V SS SA SA SA V SS NC NC NC P NC NC DQ7SA SA C SA SA NC NC NC RTDOTCKSASASACSASASATMSTDI11 x 15 Bump BGA—13 x 15 mm 2 Body—1 mm Bump PitchNotes:1.Unlike the x36 and x18 versions of this device, the x8 and x9 versions do not give the user access to A0 and A1. SA0 and SA1 are set to0 at the beginning of each access.2.NW0 controls writes to DQ0:DQ3; NW1 controls writes to DQ4:DQ73.MCL = Must Connect LowGS8662R08/09/18/36E-333/300/250/200/167Pin Description TableSymbolDescriptionTypeCommentsSA Synchronous Address InputsInput —NC No Connect ——R Synchronous Read Input Active High W Synchronous Write Input Active Low BW0–BW3Synchronous Byte Writes Input Active Low x18/x36 only NW0–NW1Nybble Write Control Pin Input Active Low x8 only LD Synchronous Load PinInput Active Low K Input Clock Input Active High K Input Clock Input Active Low C Output Clock Input Active High C Output Clock Input Active LowTMS Test Mode Select Input —TDI Test Data Input Input —TCK Test Clock Input Input —TDO Test Data Output Output —V REF HSTL Input Reference Voltage Input —ZQ Output Impedance Matching InputInput —MCL Must Connect Low——DQ Data I/O Input/Output Three State Doff Disable DLL when low Input Active LowCQ Output Echo Clock Output —CQ Output Echo Clock Output —V DD Power Supply Supply 1.8 V Nominal V DDQ Isolated Output Buffer Supply Supply 1.5 V NominalV SSPower Supply: GroundSupply—GS8662R08/09/18/36E-333/300/250/200/167Note:NC = Not Connected to die or any other pinGS8662R08/09/18/36E-333/300/250/200/167BackgroundCommon I/O SRAMs, from a system architecture point of view, are attractive in read dominated or block transfer applications. Therefore, the SigmaCIO DDR-II SRAM interface and truth table are optimized for burst reads and writes. Common I/O SRAMs are unpopular in applications where alternating reads and writes are needed because bus turnaround delays can cut high speed Common I/O SRAM data bandwidth in half.Burst OperationsRead and write operations are “burst” operations. In every case where a read or write command is accepted by the SRAM, it will respond by issuing or accepting four beats of data, executing a data transfer on subsequent rising edges of K and K#, as illustrated in the timing diagrams. It is not possible to stop a burst once it starts. Four beats of data are always transferred. This means that it is possible to load new addresses every other K clock cycle. Addresses can be loaded less often, if intervening deselect cycles are inserted.Deselect CyclesChip Deselect commands are pipelined to the same degree as read commands. This means that if a deselect command is applied to the SRAM on the next cycle after a read command captured by the SRAM, the device will complete the four beat read data transfer and then execute the deselect command, returning the output drivers to high-Z.A high on the LD# pin prevents the RAM from loading read or write commandinputs and puts the RAM into deselect mode as soon as it completes all outstanding burst transfer operations.SigmaCIO DDR-II B4 SRAM Read CyclesThe status of the Address, LD# and R/W# pins are evaluated on the rising edge of K. Because the device executes a four beat burst transfer inresponse to a read command, if the previous command captured was a read or write command, the Address, LD# and R/W# pins are ignored. If the previous command captured was a deselect, the control pin status is checked.The SRAM executes pipelined reads. The read command is clocked into the SRAM by a rising edge of K. After the next rising edge of K, the SRAM produces data out in response to the next rising edge of C# (or the next rising edge of K#, if C and C# are tied high). The second beat of data is transferred on the next rising edge of C, then on the next rising edge of C# and finally on the next rising edge of C, for a total of four transfers per address load.SigmaCIO DDR-II B4 SRAM Write CyclesThe status of the Address, LD# and R/W# pins are evaluated on the rising edge of K. Because the device executes a four beat burst transfer in response to a write command, if the previous command captured was a read or write command, the Address, LD# and R/ W# pins are ignored at the next rising edge of K. If the previous command captured was a deselect, the control pin status is checked.The SRAM executes “late write” data transfers. Data in is due at the device inputs on the rising edge of K following the rising edge of K clock used to clock in the write command and the write address. To complete the remaining three beats of the burst of four write transfer the SRAM captures data in on the next rising edge of K#, the following rising edge of K and finally on the next rising edge of K#, for a total of four transfers per address load.GS8662R08/09/18/36E-333/300/250/200/167Power-Up Sequence for SigmaQuad-II SRAMsSigmaQuad-II SRAMs must be powered-up in a specific sequence in order to avoid undefined operations.Power-Up Sequence1. Power-up and maintain Doff at low state.1a.Apply V DD .1b. Apply V DDQ .1c. Apply V REF (may also be applied at the same time as V DDQ ).2. After power is achieved and clocks (K, K, C, C) are stablized, change Doff to high.3. An additional 1024 clock cycles are required to lock the DLL after it has been enabled.Note:If you want to tie Doff high with an unstable clock, you must stop the clock for a minimum of 30 seconds to reset the DLL after the clocks become stablized.DLL Constraints•The DLL synchronizes to either K or C clock. These clocks should have low phase jitter (t KCVar on page 20).•The DLL cannot operate at a frequency lower than 119 MHz.•If the incoming clock is not stablized when DLL is enabled, the DLL may lock on the wrong frequency and cause undefined errors or failures during the initial stage.Power-Up Sequence (Doff controlled)Power UP IntervalUnstable Clocking IntervalDLL Locking Interval (1024 Cycles)Normal OperationKKV DDV DDQV REFDoffPower-Up Sequence (Doff tied High)Power UP IntervalUnstable Clocking IntervalStop Clock IntervalDLL Locking Interval (1024 Cycles)Normal OperationKKV DDV DDQV REFDoff30ns MinNote:If the frequency is changed, DLL reset is required. After reset, a minimum of 1024 cycles is required for DLL lock.GS8662R08/09/18/36E-333/300/250/200/167Special FunctionsByte Write and Nybble Write ControlByte Write Enable pins are sampled at the same time that Data In is sampled. A high on the Byte Write Enable pin associated with a particular byte (e.g., BW0 controls D0–D8 inputs) will inhibit the storage of that particular byte, leaving whatever data may be stored at the current address at that byte location undisturbed. Any or all of the Byte Write Enable pins may be driven high or low during the data in sample times in a write sequence.Each write enable command and write address loaded into the RAM provides the base address for a 4 beat data transfer. The x18 version of the RAM, for example, may write 72 bits in association with each address loaded. Any 9-bit byte may be masked in any write sequence.Nybble Write (4-bit) write control is implemented on the 8-bit-wide version of the device. For the x8 version of the device, “Nybble Write Enable” and “NBx” may be substituted in all the discussion above.Example x18 RAM Write Sequence using Byte Write EnablesData In SampleTimeBW0BW1D0–D8D9–D17Beat 101Data In Don’t CareBeat 210Don’t Care Data InBeat 300Data In Data InBeat 410Don’t Care Data InResulting Write OperationByte 1 D0–D8Byte 2D9–D17Byte 1D0–D8Byte 2D9–D17Byte 1D0–D8Byte 2D9–D17Byte 1D0–D8Byte 2D9–D17Written Unchanged Unchanged Written Written Written Unchanged Written Beat 1Beat 2Beat 3Beat 4Output Register ControlSigmaCIO DDR-II SRAMs offer two mechanisms for controlling the output data registers. Typically, control is handled by the Output Register Clock inputs, C and C. The Output Register Clock inputs can be used to make small phase adjustments in the firing of the output registers by allowing the user to delay driving data out as much as a few nanoseconds beyond the next rising edges of the K and K clocks. If the C and C clock inputs isare tied high, the RAM reverts to K and K control of the outputs, allowing the RAM to function as a conventional pipelined read SRAM.A K R/W LDA 0–A nKBank 0Bank 1Bank 2Bank 3A KLD A K LD A K LD R/W R/W R/W DQDQDQ DQCC CCDQ 1–C R/WLD 0LD 1LD 2LD 3Note:For simplicity BWn (or NWn), K, and C are not shown.CQ CQ CQ CQ CQGS8662R08/09/18/36E-333/300/250/200/167Example Four Bank Depth Expansion SchematicGS8662R08/09/18/36E-333/300/250/200/167FLXDrive-II Output Driver Impedance ControlHSTL I/O SigmaCIO DDR-II SRAMs are supplied with programmable impedance output drivers. The ZQ pin must be connected to V SS via an external resistor, RQ, to allow the SRAM to monitor and adjust its output driver impedance. The value of RQ must be 5X the value of the desired RAM output impedance. The allowable range of RQ to guarantee impedance matching continuously is between 150Ω and 300Ω. Periodic readjustment of the output driver impedance is necessary as the impedance is affected by drifts in supply voltage and temperature. The SRAM’s output impedance circuitry compensates for drifts in supply voltage and temperature. A clock cycle counter periodically triggers an impedance evaluation, resets and counts again. Each impedance evaluation may move the output driver impedance level one step at a time towards the optimum level. The output driver isimplemented with discrete binary weighted impedance steps. Updates of pull-down drive impedance occur whenever a driver is producing a “1” or is High-Z. Pull-up drive impedance is updated when a driver is producing a “0” or is High-Z.Common I/O SigmaCIO DDR-II B4 SRAM Truth TableK nLDR/WDQOperationA + 0A + 1A + 2A + 3↑1X Hi-Z Hi-Z Hi-Z Hi-Z Deselect ↑00D@K n+1D@K n+1D@K n+2D@K n+2Write ↑1Q@K n+1or C n+1Q@K n+2or C n+2Q@K n+2or C n+2Q@K n+3or C n+3ReadNote:Q is controlled by K clocks if C clocks are not used.B4 Byte Write Clock Truth TableBW BW BW BW Current OperationD D D D K ↑(t n+1)K ↑(t n+1½)K ↑(t n+2)K ↑(t n+2½)K ↑(t n )K ↑(t n+1)K ↑(t n+1½)K ↑(t n+2)K ↑(t n+2½)TTTTWriteDx stored if BWn = 0 in all four data transfers D0D2D3D4T F F F WriteDx stored if BWn = 0 in 1st data transfer only D0X X XF T F F WriteDx stored if BWn = 0 in 2nd data transfer only X D1X XF F T F WriteDx stored if BWn = 0 in 3rd data transfer only X X D2XF F F T WriteDx stored if BWn = 0 in 4th data transfer only X X X D3F F F F Write AbortNo Dx stored in any of the four data transfersX X X XNotes:1.“1” = input “high”; “0” = input “low”; “X” = input “don’t care”; “T” = input “true”; “F” = input “false”.2.If one or more BWn = 0, then BW = “T”, else BW = “F”.GS8662R08/09/18/36E-333/300/250/200/167*Assuming stable conditions, the RAM can achieve optimum impedance within 1024 cycles.B4 Nybble Write Clock Truth TableNW NW NW NW Current OperationD D D D K ↑(t n+1)K ↑(t n+1½)K ↑(t n+2)K ↑(t n+2½)K ↑(t n )K ↑(t n+1)K ↑(t n+1½)K ↑(t n+2)K ↑(t n+2½)TTTTWriteDx stored if NWn = 0 in all four data transfers D0D2D3D4T F F F WriteDx stored if NWn = 0 in 1st data transfer only D0X X XF T F F WriteDx stored if NWn = 0 in 2nd data transfer only X D1X XF F T F WriteDx stored if NWn = 0 in 3rd data transfer only X X D2XF F F T WriteDx stored if NWn = 0 in 4th data transfer only X X X D3F F F F Write AbortNo Dx stored in any of the four data transfersX X X XNotes:1.“1” = input “high”; “0” = input “low”; “X” = input “don’t care”; “T” = input “true”; “F” = input “false”.2.If one or more NWn = 0, then NW = “T”, else NW = “F”.GS8662R08/09/18/36E-333/300/250/200/167x36 Byte Write Enable (BWn) Truth TableBW0BW1BW2BW3D0–D8D9–D17D18–D26D27–D351111Don’t Care Don’t Care Don’t Care Don’t Care 0111Data In Don’t Care Don’t Care Don’t Care 1011Don’t Care Data In Don’t Care Don’t Care 0011Data In Data In Don’t Care Don’t Care 1101Don’t Care Don’t Care Data In Don’t Care 0101Data In Don’t Care Data In Don’t Care 1001Don’t Care Data In Data In Don’t Care 0001Data In Data In Data In Don’t Care 1110Don’t Care Don’t Care Don’t Care Data In 0110Data In Don’t Care Don’t Care Data In 1010Don’t Care Data In Don’t Care Data In 0010Data In Data In Don’t Care Data In 1100Don’t Care Don’t Care Data In Data In 0100Data In Don’t Care Data In Data In 1000Don’t Care Data In Data In Data In 0Data InData InData InData Inx18 Byte Write Enable (BWn) Truth Table BW0BW1D0–D8D9–D1711Don’t Care Don’t Care 01Data In Don’t Care 10Don’t Care Data In 0Data InData Inx8 Nybble Write Enable (NWn) Truth Table NW0NW1D0–D3D4–D711Don’t Care Don’t Care 01Data In Don’t Care 10Don’t Care Data In 0Data InData InGS8662R08/09/18/36E-333/300/250/200/167GS8662R08/09/18/36E-333/300/250/200/167B4 State DiagramPower-UpNOPLoad New AddressDDR Read DDR WriteLOADREAD WRITE LOADLOADLOADLOADNotes:1.The internal burst address counter is a 4-bit linear counter (i.e., when first address is A0, next internal burst address is A0+1).2.“READ” refers to read active status with R/W = High, “WRITE” refers to write inactive status with R/W = Low.3.“LOAD” refers to read new address active status with LD = Low, “LOAD” refers to read new address inactive status with LD = High.LOAD Increment Read Address Increment Write AddressAlwaysAlwaysREADWRITEAbsolute Maximum Ratings(All voltages reference to V SS )SymbolDescriptionValueUnitV DD Voltage on V DD Pins –0.5 to 2.9V V DDQ Voltage in V DDQ Pins –0.5 to V DD V V REF Voltage in V REF Pins –0.5 to V DDQV V I/O Voltage on I/O Pins –0.5 to V DDQ +0.5 (≤ 2.9 V max.)V V IN Voltage on Other Input Pins –0.5 to V DDQ +0.5 (≤ 2.9 V max.)V I IN Input Current on Any Pin +/–100mA dc I OUT Output Current on Any I/O Pin +/–100mA dcT J Maximum Junction Temperature125o C T STGStorage Temperature–55 to 125oCNote:Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Recommended Operating Conditions, for an extended period of time, may affect reliability of this component.GS8662R08/09/18/36E-333/300/250/200/167Recommended Operating ConditionsPower SuppliesParameterSymbolMin.Typ.Max.UnitSupply Voltage V DD 1.7 1.8 1.9V I/O Supply Voltage V DDQ 1.7 1.8 1.9V Reference VoltageV REF0.68—0.95VNotes:1.Unless otherwise noted, all performance specifications quoted are evaluated for worst case at both 1.4 V ≤ V DDQ ≤ 1.6 V (i.e., 1.5 V I/O)and 1.7 V ≤ V DDQ ≤ 1.95 V (i.e., 1.8 V I/O) and quoted at whichever condition is worst case.2.The power supplies need to be powered up simultaneously or in the following sequence: V DD , V DDQ , V REF , followed by signal inputs. Thepower down sequence must be the reverse. V DDQ must not exceed V DD ..Operating TemperatureParameterSymbolMin.Typ.Max.UnitAmbient Temperature (Commercial Range Versions)T A 02570°C Ambient Temperature (Industrial Range Versions)T A–402585°CGS8662R08/09/18/36E-333/300/250/200/167HSTL I/O DC Input CharacteristicsParameterSymbolMinMaxUnitsNotesDC Input Logic High V IH (dc)V REF + 0.10V DD + 0.3 V V 1DC Input Logic LowV IL (dc)–0.3 VV REF – 0.10V1Notes:patible with both 1.8 V and 1.5 V I/O drivers2.These are DC test criteria. DC design criteria is V REF ± 50 mV. The AC V IH /V IL levels are defined separately for measuring timing parame-ters.3.V IL (Min) DC = –0.3 V, V IL (Min) AC = –1.5 V (pulse width ≤ 3 ns).4.V IH (Max) DC = V DDQ + 0.3 V, V IH (Max) AC = V DDQ + 0.85 V (pulse width ≤ 3 ns).HSTL I/O AC Input CharacteristicsParameterSymbolMinMaxUnitsNotesAC Input Logic High V IH (ac)V REF + 0.20—V 3,4AC Input Logic LowV IL (ac)—V REF – 0.20V 3,4V REF Peak to Peak AC VoltageV REF (ac)—5% V REF (DC)V1Notes:1.The peak to peak AC component superimposed on V REF may not exceed 5% of the DC component of V REF .2.To guarantee AC characteristics, V IH ,V IL , Trise, and Tfall of inputs and clocks must be within 10% of each other.3.For devices supplied with HSTL I/O input buffers. Compatible with both 1.8 V and 1.5 V I/O drivers.20% tKHKHV SS – 1.0 V50%V SS V IHUndershoot Measurement and TimingOvershoot Measurement and Timing20% tKHKHV DD + 1.0 V50%V DDV ILCapacitanceo C, f = 1 MH Z , V DDParameterSymbolTest conditionsTyp.Max.UnitInput Capacitance C IN V IN = 0 V 45pF Output Capacitance C OUT V OUT = 0 V67pF Clock CapacitanceC CLK—56pFNote:This parameter is sample tested.GS8662R08/09/18/36E-333/300/250/200/167AC Test ConditionsParameterConditionsInput high level V DDQ Input low level 0 V Max. input slew rate 2 V/ns Input reference level V DDQ /2Output reference levelV DDQ /2Note:Test conditions as specified with output loading as shown unless otherwise noted.DQVT = V DDQ /250ΩRQ = 250 Ω (HSTL I/O)V REF = 0.75 VAC Test Load DiagramInput and Output Leakage CharacteristicsParameterSymbolTest ConditionsMin.MaxNotesInput Leakage Current (except mode pins)I IL V IN = 0 to V DD –2 uA 2 uA DoffI INDOFF V DD ≥ V IN ≥ V IL 0 V ≤ V IN ≤ V IL –100 uA –2 uA 2 uA 2 uA Output Leakage CurrentI OLOutput Disable,V OUT = 0 to V DDQ–2 uA2 uA(T A = 25= 3.3 V)GS8662R08/09/18/36E-333/300/250/200/167Programmable Impedance HSTL Output Driver DC Electrical CharacteristicsParameterSymbolMin.Max.UnitsNotesOutput High Voltage V OH1 V DDQ /2V DDQ V 1, 3Output Low Voltage V OL1 Vss V DDQ /2V 2, 3Output High Voltage V OH2 V DDQ – 0.2V DDQ V 4, 5Output Low VoltageV OL2Vss0.2V4, 6Notes:1. I OH = (V DDQ /2) / (RQ/5) +/– 15% @ V OH = V DDQ /2 (for: 175Ω ≤ RQ ≤ 350Ω).2. I OL = (V DDQ /2) / (RQ/5) +/– 15% @ V OL = V DDQ /2 (for: 175Ω ≤ RQ ≤ 350Ω).3.Parameter tested with RQ = 250Ω and V DDQ = 1.5 V or 1.8 V4.Minimum Impedance mode, ZQ = V SS5.I OH = –1.0 mA6.I OL = 1.0 mAOperating CurrentsParameterSymbolTest Conditions-333-300-250-200-167Notes0to 70°C –40 to 85°C 0to 70°C –40 to 85°C 0to 70°C –40 to 85°C 0to 70°C –40 to 85°C 0to 70°C –40 to 85°C Operating Current (x36):DDR I DD V DD = Max, I OUT = 0 mA Cycle Time ≥ t KHKH Min TBDTBDTBDTBDTBDTBDTBDTBDTBDTBD2, 3Operating Current (x18):DDR I DD V DD = Max, I OUT = 0 mA Cycle Time ≥ t KHKH Min TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD 2, 3Operating Current (x9):DDR I DD V DD = Max, I OUT = 0 mA Cycle Time ≥ t KHKH Min TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD 2, 3Operating Current (x8):DDR I DDV DD = Max, I OUT = 0 mA Cycle Time ≥ t KHKH Min TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD 2, 3Standby Current (NOP):DDRI SB1Device deselected,I OUT = 0 mA, f = Max,All Inputs ≤ 0.2 V or ≥ V DD – 0.2 VTBD TBD TBD TBD TBD TBD TBD TBD TBD TBD 2, 4Notes:1.Power measured with output pins floating.2.Minimum cycle, I OUT = 0 mA3.Operating current is calculated with 50% read cycles and 50% write cycles.4.Standby Current is only after all pending read and write burst operations are completed.GS8662R08/09/18/36E-333/300/250/200/167AC Electrical CharacteristicsParameterSymbol-333-300-250-200-167UnitsN o t e sMin Max Min Max Min Max Min Max Min MaxClockK, K Clock Cycle Time C, C Clock Cycle Time t KHKH t CHCH 3.0 3.5 3.3 4.2 4.0 6.3 5.07.88 6.08.4ns tTKC Variablet KCVar —0.2—0.2—0.2—0.2—0.2ns 5K, K Clock High Pulse Width C, C Clock High Pulse Width t KHKL t CHCL 1.2— 1.32— 1.6— 2.0— 2.4—ns K, K Clock Low Pulse Width C, C Clock Low Pulse Width t KLKH t CLCH 1.2— 1.32— 1.6— 2.0— 2.4—ns K to K High C to C Hight KHKH 1.35— 1.49— 1.8— 2.2— 2.7—ns K, K Clock High to C, C Clock High t KHCH 0 1.30 1.450 1.80 2.30 2.8ns DLL Lock Time t KCLock 1024—1024—1024—1024—1024—cycle 6K Static to DLL resett KCReset 30—30—30—30—30—nsOutput TimesK, K Clock High to Data Output Valid C, C Clock High to Data Output Valid t KHQV t CHQV —0.45—0.45—0.45—0.45—0.5ns 3K, K Clock High to Data Output Hold C, C Clock High to Data Output Hold t KHQX t CHQX –0.45—–0.45—–0.45—–0.45—–0.5—ns 3K, K Clock High to Echo Clock Valid C, C Clock High to Echo Clock Valid t KHCQV t CHCQV —0.45—0.45—0.45—0.45—0.5ns K, K Clock High to Echo Clock Hold C, C Clock High to Echo Clock Hold t KHCQX t CHCQX –0.45—–0.45—–0.45—–0.45—–0.5—ns CQ, CQ High Output Valid t CQHQV —0.25—0.27—0.30—0.35—0.40ns 7CQ, CQ High Output Hold t CQHQX –0.25—–0.27—–0.30—–0.35—–0.40—ns 7K Clock High to Data Output High-Z C Clock High to Data Output High-Z t KHQZ t CHQZ —0.45—0.45—0.45—0.45—0.5ns 3K Clock High to Data Output Low-Z C Clock High to Data Output Low-Zt KHQX1t CHQX1–0.45—–0.45—–0.45—–0.45—–0.5—ns3Setup TimesAddress Input Setup Time t AVKH 0.4—0.4—0.5—0.6—0.7—ns Control Input Setup Time t IVKH 0.4—0.4—0.5—0.6—0.7—ns 2Data Input Setup Timet DVKH0.28—0.3—0.35—0.4—0.5—ns。