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ESD培训手册

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Towards Zero Defect caused by ESD 1

ESD 培训手册

Towards Zero Defect Caused by ESD

ESD 介绍

Towards Zero Defect Caused by ESD

ESD 介绍

Towards Zero Defect Caused by ESD

ESD 介绍

Towards Zero Defect Caused by ESD

摩擦产生电荷

Towards Zero Defect Caused by ESD

摩擦产生电荷

Towards Zero Defect Caused by ESD

典型静电电压/V

Towards Zero Defect Caused by ESD 拖动椅子

感应产生电荷

Towards Zero Defect Caused by ESD

典型的ESD损伤

Towards Zero Defect Caused by ESD

ESD 损伤

Towards Zero Defect Caused by ESD

ESD 失效实例

Towards Zero Defect Caused by ESD

ESD 失效实例

Towards Zero Defect Caused by ESD

ESD 模式

Towards Zero Defect Caused by ESD

HBM 模式

Towards Zero Defect Caused by ESD

HBM 模式

Towards Zero Defect Caused by ESD 个体放电（未接地）攻击在工作台表面上

的器件（放电从手指-引脚-器件-模块）

HBM 模式

Towards Zero Defect Caused by ESD

人体模式（HBM）测试回路

17

HBM 模式

Towards Zero Defect Caused by ESD

MM 模式

Towards Zero Defect Caused by ESD

MM 模式

Towards Zero Defect Caused by ESD

CDM 模式

Towards Zero Defect Caused by ESD 的静电电容

CDM 模式

Towards Zero Defect Caused by ESD 典型的CDM放电事件

金属表面CDM=充电+快速放电

CDM 模式

Towards Zero Defect Caused by ESD

CDM 测试设置

有效的接地

接地平面

CDM 模式

Towards Zero Defect Caused by ESD

The low ohmic discharge of a charged device (CDevice) –e.g. charged by sliding in a production line is described by

带电器件的低阻值放电-如在生产线上的滑动充电可以认为是CDM。充电器件模式失效是一种在自动生产线上主要的失效机制。

CDM 模式

Towards Zero Defect Caused by ESD

Time / ns

使用中的ESD模式和ESD引力

Towards Zero Defect Caused by ESD

HBM –标准

Towards Zero Defect Caused by ESD

MM –标准

Towards Zero Defect Caused by ESD

CDM –标准

Towards Zero Defect Caused by ESD

静电沾污的随想

Towards Zero Defect Caused by ESD

ESD基本知识

Towards Zero Defect Caused by ESD 静电可以认为是一种沾污问题。

ESD 控制

Towards Zero Defect Caused by ESD

ESD 控制的基本概念

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD •Complete Room Ionization

ESD 的控制

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD

ESD 的控制

Towards Zero Defect Caused by ESD 表面阻抗在10和以下的材料适合于EMI/RFI防护

ESD 的控制

Towards Zero Defect Caused by ESD

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