XPS结合能峰位峰宽等参考数据周期表

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23 V 2p3
V° V2O5
512.2 (0.79) 285.0 512.22 (0.75)
517.3 (1.32) 285.0 530.2 (1.33)
41 Nb 3d5
Nb° Nb2O5
202.1 (0.78) 285.0 202.35 (0.57)
207.4 (1.14) 285.0 530.4 (1.36)
13 Al 2p3
Al° Al2O3
72.9 (0.62) 284.7 72.82 (0.41)
74.3 (1.41) 285.0 531.1 (1.56)
Main XPS Signal for Element of Interest
Most Common Oxide or Chemical Compound of Element
709.8 (1.32) 285.0 532.9 (1.05)
778.1 (0.99) 284.9 778.26 (0.85)
779.5 (1.39) 285.0 530.1 (1.00)
852.6 (1.14) 284.8 852.65 (1.02)
853.8 (1.42) 285.0 529.4 (1.03)
73 Ta 4f7
Ta° Ta2O5
21.8 (0.80) 285.0 21.78 (0.56)
26.8 (1.12) 285.0 531.0 (1.46)
24 Cr 2p3 25 Mn 2p3 26 Fe 2p3 27 Co 2p3 28 Ni 2p3 Cr° Cr2O3 Mn° MnO2 Fe° Fe2O3 Co° Co3O4 Ni° NiO
199.8 (1.7) 285.0
199.3 (1.19) 285.0 1072.0 (1.40)
242.1 (0.90) 285.0
19 K 2p3
K° KI
293.2 (1.11) 285.0 619.2 (1.30)
20 Ca 2p3
Ca° CaO
346.5 (?) 284.6 346.5 (1.07)
155.9 (0.80) 286.0 155.92 (0.62)
156.6 (1.25) 285.0 531.0 (1.30)
179.0 (0.90) 285.3 178.80 (0.63)
182.4 (1.18) 285.0 530.3 (1.39)
55 Cs 3d5 56 Ba 3d5 57 La 3d5 72 Hf 4f7
Cs° CsCl
724.6 (2.08) 285.0 199.2
Ba° BaOAc
780.0 (1.80) 285.0 531.4 (1.83)
La° La2O3
834.7 (3.0) 285.0 529.2 (1.6)
Hf° HfO2
14.4 (0.63) 285.7 14.32 (0.62)
17.1 (1.26) 285.0 530.5 (1.68)
337.0 (0.97) 285.0 530.7 (1.35)
74 W 4f7
W° WO3
31.4 (0.58) 285.3 31.38 (0.53)
35.8 (1.01) 285.0 530.6 (1.27)
75 Re 4f7
Re° Re2O7
40.3 (0.67) 285.3 40.30 (0.54)
CaF2
685.1 (1.53) 285.0 348.1 (1.6)
10 Ne 1s
Ne+/Be Ne+/C
11 Na 1s
Na° NaCl
1072.0 (1.40) 285.0 199.3 (1.19)
12 Mg 2p
Mg° MgO
49.7 (0.58) 286.5 49.77 (0.60)
51.5 (1.63) 285.0 529.8 (1.99)
13
5 B 1s

187.5 (0.87) 285.2 187.8 (1.03)
B2O3
194.0 (2.40) 285.0 532.5 (2.22)
14 6 C 1s
HOPG Black 284.5 284.4 (0.42) (1.04)
15
7 N 1s
Kapton BN
400.9 (1.31) 285.0
P° InP
130.13 (0.67) 285.0
128.8 (0.62) 285.0 444.7 (0.78)
16 S 2p3
S° MoS2
164.0 (0.72) 285.0
162.7 (0.39)
229.7 (0.80)
17 Cl 2p3 18 Ar 2p3
PVC NaCl Ar+/Be Ar+/C
Li° LiOH
54.9 (1.65) 285.0 531.8 (1.6)
2
4 Be 1s Be° BeO
111.9 (0.79) 286.1 111.88 (0.69)
113.6 (1.73) 285.0 531.3 (1.47)
Atomic Number of Element
Abbreviation for Element Al (2p3) BE of Al° under Native Oxide Al (2p3) FWHM of Al° under Native Oxide C (1s) BE of Hydrocarbons Captured by Ion Etched Al° Reliable Reference BE for Ion Etched, Pure Al° Al (2p3) FWHM of Ion Etched , Pure Al°
All non-conductive materials were referenced to adventitious hydrocarbon with C (1s) BE at 285.0eV. Energy resolution settings for pure oxide data gave FWHM <0.75 eV for Ag (3d5) of ion etched Ag°. All non-conductors were analyzed with the Flood-Gun Mesh-Screen 0.5-1.0 mm above the specimen. C (1s) BEs for "hydrocarbons" on elements were collected from carbon captured by ion etched elements. Carbon from the cryo-pumped vacuum (3x10(-9) torr) was analyzed >10 hours after ion etching. Energy resolution settings for ion etched elements gave FWHM <0.50 eV forAg (3d5) of ion etched Ag°. Calibration was: Cu (2p3) at 932.67 ±0.05 eV, Cu (3s) at 122.45 ±0.05 eV, and Au(4f7) at 83.98 eV.
347.1 (1.81) 285.0 531.5 (1.57)
21 Sc 2p3 Sc° Sc2O3
398.6 (0.9) 285.8 398.46 (0.69)
401.9 (1.27) 285.0 530.0 (1.33)
22 Ti 2p3 Ti° TiO2
453.8 (0.90) 285.2 453.95 (0.62)
280.0 (0.67)
--280.11 (0.59)
281.1 (0.79) 285.0 529.7 (0.95)
307.2 (0.73) 284.05 307.21 (0.69)
308.9 (0.80) 285.0 530.5 (1.05)
335.1 (0.86) 284.5 335.10 (0.77)
458.7 (1.09) 285.0 530.0 (1.18)
37 Rb 3d5 38 Sr 3d5 39 Y 3d5 40 Zr 3d5
Rb° RbOAc Sr° SrCO3 Y° Y2O3 Zr° ZrO2
109.7 (1.40) 285.0 530.9 (1.6)
133.7 (1.63) 285.0 531.5 (1.9)
574.2 (1.05) 284.6 574.37 (0.89)
575.7 (1.20) 285.0 530.1 (1.24)
638.7 (1.00) 286.4 638.74 (0.89)
641.5 (1.12) 285.0 529.5 (1.02)
706.6 (0.90) 284.9 706.78 (0.99)
46.8 (1.64) 285.0 532.1 (1.58)
76 Os 4f7 Os° OsO4
77 Ir 4f7
Ir° IrO2
60.8 (0.80) 284.4 60.88 (0.82)
62.0 (0.98) 285.0 530.2 (0.97)
78 Pt 4f7
Pt° PtO2
71.0 (0.96) 284.3 71.15 (0.88)
3
4
5
6
7
8
The FWHM and BE values presented in this table were all obtained by one scientist using two SSI XPS systems, which yield a theoretical energy resolution limit of about 0.1 eV and were equipped with monochromatic Aluminum X-ray sources which have a theoretical energy resolution limit of about 0.16 eV. The BEs for the ion etched elements can be used as reliable secondary energy reference values within a standard deviation of 0.055. All other BE values are <±0.15 eV.