1-146HHigh CMR, High Speed TTL Compatible Optocouplers Technical Data6N137HCNW137HCNW2601HCNW2611HCPL-0600HCPL-0601HCPL-0611HCPL-0630CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to prevent damage and/or degradation which may be induced by ESD.Features• 5 kV/µs Minimum Common Mode Rejection (CMR) at V CM = 50 V for HCPL-X601/X631, HCNW2601 and10kV/µs Minimum CMR at V CM = 1000 V for HCPL-X611/X661, HCNW2611• High Speed: 10 MBd Typical • LSTTL/TTL Compatible • Low Input Current Capability: 5 mA• Guaranteed ac and dcPerformance over Temper-ature: -40°C to +85°C • Available in 8-Pin DIP,SOIC-8, Widebody Packages • Strobable Output (Single Channel Products Only)• Safety ApprovalUL Recognized - 2500 V rms for 1 minute and 5000V rms*for 1 minute per UL1577CSA ApprovedVDE 0884 Approved with V IORM = 630 V peak forHCPL-2611 Option 060 and V IORM =1414 V peak for HCNW137/26X1BSI Certified(HCNW137/26X1 Only)• MIL-STD-1772 Version Available (HCPL-56XX/66XX)Functional Diagram*5000 V rms/1 Minute rating is for HCNW137/26X1 and Option 020 (6N137, HCPL-2601/11/30/31, HCPL-4661) products only.HCPL-0631HCPL-0661HCPL-2601HCPL-2611HCPL-2630HCPL-2631HCPL-4661Applications• Isolated Line Receiver • Computer-Peripheral Interfaces• Microprocessor System Interfaces• Digital Isolation for A/D,D/A Conversion• Switching Power Supply • Instrument Input/Output Isolation• Ground Loop Elimination • Pulse Transformer Replacement• Power Transistor Isolation in Motor Drives• Isolation of High Speed Logic SystemsDescriptionThe 6N137, HCPL-26XX/06XX/4661, HCNW137/26X1 are optically coupled gates that combine a GaAsP light emitting diode and an integrated high gain photo detector. An enable input allows the detector to be strobed.The output of the detector IC isA 0.1 µF bypass capacitor must be connected between pins 5 and 8.CATHODEANODE GNDV V CC O ANODE 2CATHODE 2CATHODE 1ANODE 1GNDV V CC O2V E V O16N137, HCPL-2601/2611 HCPL-0600/0601/0611 HCPL-2630/2631/4661 NC NCLED ON OFF ON OFF ON OFFENABLEH H L L NC NCOUTPUTL H H H L HTRUTH TABLE (POSITIVE LOGIC)LED ON OFFOUTPUTL HTRUTH TABLE (POSITIVE LOGIC)5965-3594Ean open collector Schottky-clamped transistor. The internal shield provides a guaranteed common mode transient immunity specification of 5,000 V/µs for the HCPL-X601/X631 and HCNW2601, and 10,000 V/µs for the HCPL-X611/X661 and HCNW2611.This unique design providesmaximum ac and dc circuitisolation while achieving TTLcompatibility. The optocoupler acand dc operational parametersare guaranteed from -40°C to+85°C allowing troublefreesystem performance.The 6N137, HCPL-26XX, HCPL-06XX, HCPL-4661, HCNW137,and HCNW26X1 are suitable forhigh speed logic interfacing,input/output buffering, as linereceivers in environments thatconventional line receiverscannot tolerate and are recom-mended for use in extremely highground or induced noiseenvironments.Selection GuideNotes:1. Technical data are on separate HP publications.2. 15 kV/µs with V CM = 1 kV can be achieved using HP application circuit.3. Enable is available for single channel products only, except for HCPL-193X devices.1-1471-148Ordering InformationSpecify Part Number followed by Option Number (if desired).Example:HCPL-2611#XXX020 = 5000 V rms/1 minute UL Rating Option*060 = VDE 0884 V IORM = 630 Vpeak Option**300 = Gull Wing Surface Mount Option†500 = Tape and Reel Packaging OptionOption data sheets available. Contact Hewlett-Packard sales representative or authorized distributor for information.*For 6N137, HCPL-2601/11/30/31 and HCPL-4661 (8-pin DIP products) only.**For HCPL-2611 only. Combination of Option 020 and Option 060 is not available.†Gull wing surface mount option applies to through hole parts only.SchematicV FUSE OF A 0.1 µF BYPASS CAPACITOR CONNECTEDBETWEEN PINS 5 AND 8 IS RECOMMENDED (SEE NOTE 5).V CC V OGNDE6N137, HCPL-2601/2611 HCPL-0600/0601/0611V V CC V O1V V O2GNDHCPL-2630/2631/4661 HCPL-0630/0631/0661+ 0.076- 0.051(0.010+ 0.003)- 0.002)DIMENSIONS IN MILLIMETERS AND (INCHES).*MARKING CODE LETTER FOR OPTION NUMBERS"L" = OPTION 020"V" = OPTION 060OPTION NUMBERS 300 AND 500 NOT MARKED. Package Outline Drawings8-pin DIP Package** (6N137, HCPL-2601/11/30/31, HCPL-4661)8-pin DIP Package with Gull Wing Surface Mount Option 300(6N137, HCPL-2601/11/30/31, HCPL-4661)**JEDEC Registered Data (for 6N137 only).(0.025 ± 0.005)1.080 ± 0.320MAX.(0.100)BSCDIMENSIONS IN MILLIMETERS (INCHES).LEAD COPLANARITY = 0.10 mm (0.004 INCHES).+ 0.076- 0.051+ 0.003)- 0.002)1-1491-150Small-Outline SO-8 Package (HCPL-0600/01/11/30/31/61)8-Pin Widebody DIP Package (HCNW137, HCNW2601/11)(0.012)MIN.DIMENSIONS IN MILLIMETERS (INCHES).LEAD COPLANARITY = 0.10 mm (0.004 INCHES).1.78 ± 0.15 + 0.076 - 0.0051+ 0.003) - 0.002)1-1518-Pin Widebody DIP Package with Gull Wing Surface Mount Option 300(HCNW137, HCNW2601/11)Note: Use of nonchlorine activated fluxes is highly recommended.Solder Reflow Temperature Profile (HCPL-06XX and Gull Wing Surface Mount Option 300 Parts)240TIME – MINUTEST E M P E R A T U R E – °C2202001801601401201008060402002601.78 ± 0.15 MAX.BSCDIMENSIONS IN MILLIMETERS (INCHES).LEAD COPLANARITY = 0.10 mm (0.004 INCHES).Regulatory Information The 6N137, HCPL-26XX/06XX/ 46XX, and HCNW137/26XX have been approved by the following organizations:ULRecognized under UL 1577, Component Recognition Program, File E55361.CSAApproved under CSA ComponentAcceptance Notice #5, File CA88324.VDEApproved according to VDE0884/06.92. (HCPL-2611 Option060 and HCNW137/26X1 only)BSICertification according toBS415:1994(BS EN60065:1994),BS7002:1992(BS EN60950:1992) andEN41003:1993 for Class IIapplications. (HCNW137/26X1only)Insulation and Safety Related Specifications8-pin DIP Widebody(300 Mil)SO-8(400 Mil)Parameter Symbol Value Value Value Units Conditions Minimum External L(101)7.1 4.99.6mm Measured from input terminals Air Gap (External to output terminals, shortest Clearance)distance through air. Minimum External L(102)7.4 4.810.0mm Measured from input terminals Tracking (External to output terminals, shortest Creepage)distance path along body. Minimum Internal0.080.08 1.0mm Through insulation distance, Plastic Gap conductor to conductor, usually (Internal Clearance)the direct distance between thephotoemitter and photodetectorinside the optocoupler cavity. Minimum Internal NA NA 4.0mm Measured from input terminals Tracking (Internal to output terminals, along Creepage)internal cavity.Tracking Resistance CTI200200200Volts DIN IEC 112/VDE 0303 Part 1 (ComparativeTracking Index)Isolation Group IIIa IIIa IIIa Material Group(DIN VDE 0110, 1/89, Table 1) Option 300 - surface mount classification is Class A in accordance with CECC 00802.1-1521-153VDE 0884 Insulation Related Characteristics (HCPL-2611 Option 060 Only)*Refer to the front of the optocoupler section of the current catalog, under Product Safety Regulations section (VDE 0884), for a detailed description.Note: Isolation characteristics are guaranteed only within the safety maximum ratings which must be ensured by protective circuits in application.VDE 0884 Insulation Related Characteristics (HCNW137/2601/2611 Only)*Refer to the front of the optocoupler section of the current catalog, under Product Safety Regulations section (VDE 0884), for a detailed description.Note: Isolation characteristics are guaranteed only within the safety maximum ratings which must be ensured by protective circuits in application.Absolute Maximum Ratings* (No Derating Required up to 85°C)*JEDEC Registered Data (for 6N137 only).**Ratings apply to all devices except otherwise noted in the Package column.†0°C to 70°C on JEDEC Registration.Recommended Operating ConditionsParameter Symbol Min.Max.Units Input Current, Low Level I FL*0250µAInput Current, High Level[1]I FH**515mA Power Supply Voltage V CC 4.5 5.5VLow Level Enable Voltage†V EL00.8VHigh Level Enable Voltage†V EH 2.0V CC V Operating Temperature T A-4085°CFan Out (at R L = 1 kΩ)[1]N5TTL Loads Output Pull-up Resistor R L330 4 kΩ*The off condition can also be guaranteed by ensuring that V FL≤0.8 volts.**The initial switching threshold is 5 mA or less. It is recommended that 6.3 mA to 10 mA be used for best performance and to permit at least a 20% LED degradation guardband.†For single channel products only.1-154Electrical SpecificationsOver recommended temperature (T A = -40°C to +85°C) unless otherwise specified. All Typicals at V CC = 5 V, T A = 25°C. All enable test conditions apply to single channel products only. See note 5.*JEDEC registered data for the 6N137. The JEDEC Registration specifies 0°C to +70°C. HP specifies -40°C to +85°C.1-155Switching Specifications (AC)Over Recommended Temperature (T A = -40°C to +85°C), V CC = 5 V, I F= 7.5 mA unless otherwise specified. All Typicals at T A = 25°C, V CC = 5 V.*JEDEC registered data for the 6N137.**Ratings apply to all devices except otherwise noted in the Package column.1-156Package Characteristics= 25°C.All Typicals at T**The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous voltage rating. For the continuous voltage rating refer to the VDE 0884 Insulation Characteristics Table (if applicable), your equipment level safety specification or HP Application Note 1074 entitled “Optocoupler Input-Output Endurance Voltage.”†For 6N137, HCPL-2601/2611/2630/2631/4661 only.Notes:1. Each channel.2. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current doesnot exceed 20 mA.3. Peaking circuits may produce transient input currents up to 50 mA, 50 ns maximum pulse width, provided average current doesnot exceed 15 mA.4. Derate linearly above 80°C free-air temperature at a rate of 2.7 mW/°C for the SOIC-8 package.5. Bypassing of the power supply line is required, with a 0.1 µF ceramic disc capacitor adjacent to each optocoupler as illustrated inFigure 17. Total lead length between both ends of the capacitor and the isolator pins should not exceed 20 mm.6. The JEDEC registration for the 6N137 specifies a maximum I OH of 250 µA. HP guarantees a maximum I OH of 100 µA.7. The JEDEC registration for the 6N137 specifies a maximum I CCH of 15 mA. HP guarantees a maximum I CCH of 10 mA.8. The JEDEC registration for the 6N137 specifies a maximum I CCL of 18 mA. HP guarantees a maximum I CCL of 13 mA.9. The JEDEC registration for the 6N137 specifies a maximum I EL of –2.0 mA. HP guarantees a maximum I EL of -1.6 mA.10. The t PLH propagation delay is measured from the 3.75 mA point on the falling edge of the input pulse to the 1.5 V point on therising edge of the output pulse.11. The t PHL propagation delay is measured from the 3.75 mA point on the rising edge of the input pulse to the 1.5 V point on thefalling edge of the output pulse.12. t PSK is equal to the worst case difference in t PHL and/or t PLH that will be seen between units at any given temperature and specifiedtest conditions.13. See application section titled “Propagation Delay, Pulse-Width Distortion and Propagation Delay Skew” for more information.14. The t ELH enable propagation delay is measured from the 1.5 V point on the falling edge of the enable input pulse to the 1.5 Vpoint on the rising edge of the output pulse.15. The t EHL enable propagation delay is measured from the 1.5 V point on the rising edge of the enable input pulse to the 1.5 V pointon the falling edge of the output pulse.16. CM H is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state(i.e., V O > 2.0 V).17. CM L is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state(i.e., V O < 0.8 V).18. For sinusoidal voltages, (|dV CM | / dt)max = πf CM V CM(p-p).1-1571-158I O H – H I G H L E V E L O U T P U T C U R R E N T – µAT A – TEMPERATURE – °C1015519. No external pull up is required for a high logic state on the enable input. If the V E pin is not used, tying V E to V CC will result inimproved CMR performance. For single channel products only.20. Device considered a two-terminal device: pins 1, 2, 3, and 4 shorted together, and pins 5, 6, 7, and 8 shorted together.21. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 3000 V rms for one second(leakage detection current limit, I I-O ≤ 5 µA). This test is performed before the 100% production test for partial discharge (Method b) shown in the VDE 0884 Insulation Characteristics Table, if applicable.22. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage ≥ 6000 V rms for one second(leakage detection current limit, I I-O ≤ 5 µA). This test is performed before the 100% production test for partial discharge (Method b) shown in the VDE 0884 Insulation Characteristics Table, if applicable.23. Measured between the LED anode and cathode shorted together and pins 5 through 8 shorted together. For dual channel productsonly.24. Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. For dual channel products only.Figure 2. Typical Output Voltage vs. Forward Input Current.Figure 3. Typical Input Threshold Current vs. Temperature.Figure 1. Typical High Level Output Current vs. Temperature.1623I F – FORWARD INPUT CURRENT – mA 0V O – O U T P U T V O L T A G E – V8-PIN DIP, SO-81623I F – FORWARD INPUT CURRENT – mAV O – O U T P U T V O L T A G E – VWIDEBODY6360T A – TEMPERATURE – °C 20I T H – I N P U T T H R E S H O L D C U R R E N T – m A1458-PIN DIP, SO-86360T A – TEMPERATURE – °C20I T H – I N P U T T H R E S H O L D C U R R E N T – m A145WIDEBODY1-159706060T A – TEMPERATURE – °C5020I O L – L O W L E V E L O U T P U T C U R R E N T – m A400.80.460T A – TEMPERATURE – °C 0.20V O L – L O W L E V E L O U T P U T V O L T A G E – V0.10.50.7WIDEBODY0.30.6Figure 7. Typical Temperature Coefficient of Forward Voltage vs. Input Current.Figure 4. Typical Low Level Output Voltage vs. Temperature.Figure 5. Typical Low Level Output Current vs. Temperature.Figure 6. Typical Input Diode Forward Characteristic.0.80.4T A – TEMPERATURE – °C 0.20V O L – L O W L E V E L O U T P U T V O L T A G E – V0.10.50.78-PIN DIP, SO-80.30.6I F – F O R W A R D C U R R E N T – m A0.001V F – FORWARD VOLTAGE – V 1.010000.010.110100I F – F O R W A R D C U R R E N T – m A0.001V F – FORWARD VOLTAGE – V1.01100.010.110100d V F /d T – F O R W A R D V O L T A G E T E M P E R A T U R E C O E F F I C I E N T – m V /°C0.1110100I F – PULSE INPUT CURRENT – mA -1.4-2.2-2.0-1.8-1.6-1.2-2.48-PIN DIP, SO-8d V F /d T – F O R W A R D V O L T A G E T E M P E R A T U R E C O E F F I C I E N T – m V /°C0.1110100I F – PULSE INPUT CURRENT – mA-1.9-2.2-2.1-2.0-1.8-2.3WIDEBODY1-1604030T A – TEMPERATURE – °C 20P W D – P U L S E W I D T H D I S T O R T I O N – n s10-10Figure 8. Test Circuit for t PHL and t PLH .Figure 9. Typical Propagation Delay vs. Temperature.Figure 10. Typical Propagation Delay vs. Pulse Input Current.Figure 11. Typical Pulse Width Distortion vs. Temperature.Figure 12. Typical Rise and Fall Time vs. Temperature.10590I F – PULSE INPUT CURRENT – mA7530t P – P R O P A G A T I O N D E L A Y – n s6045OUTPUT V MONITORING NODEOOUTPUT V MONITORING NODEOI V FF*C L IS APPROXIMATELY 15 pF WHICH INCLUDES PROBE AND STRAY WIRING CAPACITANCE.10080T A – TEMPERATURE – °C600t P – P R O P A G A T I O N D E L A Y – n s4020t r , t f – R I S E , F A L L T I M E – n sT A – TEMPERATURE – °C1-161OUTPUT V MONITORING NODEOV V*C IS APPROXIMATELY 15 pF WHICH INCLUDES PROBE AND STRAY WIRING CAPACITANCE.LFigure 13. Test Circuit for t EHL and t ELH .Figure 14. Typical Enable Propagation Delay vs. Temperature.Figure 15. Test Circuit for Common Mode Transient Immunity and Typical Waveforms.V O0.5 VOV (MIN.)5 V0 V FSWITCH AT B: I = 7.5 mA FCM V HCM CM L OV (MAX.)CMV (PEAK)V Ot E– E N A B L E P R O P A G A T I O N D E L A Y – n sT A – TEMPERATURE – °C901203060+5 VOUTPUT V MONITORING NODE O PULSE GENERATOR Z = 50 ΩO+5 VOUTPUT V MONITORING NODEO PULSE GENERATOR Z = 50 ΩO1-162Figure 16. Thermal Derating Curve, Dependence of Safety Limiting Value with Case Temperature per VDE 0884.Figure 17. Recommended Printed Circuit Board Layout.O U T P U T P O W E R – P S , I N P U T C U R R E N T – I S0T S – CASE TEMPERATURE – °C400600800200100300500700ENABLE(SEE NOTE 5)OUTPUTDEVICE ILLUSTRATED.O U T P U T P O WE R – P S , I N P U T C U R R E N T – I S0T S – CASE TEMPERATURE – °C 4006008002001003005007001-163VDUAL CHANNEL DEVICE CC2*DIODE D1 (1N916 OR EQUIVALENT) IS NOT REQUIRED FOR UNITS WITH OPEN COLLECTOR OUTPUT.VCC2Figure 18. Recommended TTL/LSTTL to TTL/LSTTL Interface Circuit.Propagation Delay, Pulse-Width Distortion and Propagation Delay Skew Propagation delay is a figure of merit which describes how quickly a logic signal propagates through a system. The propaga-tion delay from low to high (t PLH) is the amount of time required for an input signal to propagate to the output, causing the output to change from low to high. Similarly, the propagation delay from high to low (t PHL) is the amount of time required for the input signal to propagate to the output causing the output to change from high to low (see Figure8).Pulse-width distortion (PWD) results when t PLH and t PHL differ in value. PWD is defined as the difference between t PLH and t PHL and often determines the maximum data rate capability of a transmission system. PWD can be expressed in percent by dividing the PWD (in ns) by the minimum pulse width (in ns) being transmitted. Typically, PWD on the order of 20-30% of the minimum pulse width is tolerable; the exact figure depends on the particular application (RS232,RS422, T-l, etc.).Propagation delay skew, t PSK, is an important parameter to consider in parallel data applica-tions where synchronization ofsignals on parallel data lines is aconcern. If the parallel data isbeing sent through a group ofoptocouplers, differences inpropagation delays will cause thedata to arrive at the outputs of theoptocouplers at different times. Ifthis difference in propagationdelays is large enough, it willdetermine the maximum rate atwhich parallel data can be sentthrough the optocouplers.Propagation delay skew is definedas the difference between theminimum and maximumpropagation delays, either t PLH ort PHL, for any given group ofoptocouplers which are operatingunder the same conditions (i.e.,the same drive current, supplyvoltage, output load, andoperating temperature). Asillustrated in Figure 19, if theinputs of a group of optocouplersare switched either ON or OFF atthe same time, t PSK is thedifference between the shortestpropagation delay, either t PLH ort PHL, and the longest propagationdelay, either t PLH or t PHL.As mentioned earlier, t PSK candetermine the maximum paralleldata transmission rate. Figure 20is the timing diagram of a typicalparallel data application with boththe clock and the data lines beingsent through optocouplers. Thefigure shows data and clocksignals at the inputs and outputsof the optocouplers. To obtain themaximum data transmission rate,both edges of the clock signal arebeing used to clock the data; ifonly one edge were used, theclock signal would need to betwice as fast.Propagation delay skew repre-sents the uncertainty of where anedge might be after being sentthrough an optocoupler. Figure20 shows that there will beuncertainty in both the data andthe clock lines. It is importantthat these two areas of uncertaintynot overlap, otherwise the clocksignal might arrive before all ofthe data outputs have settled, orsome of the data outputs maystart to change before the clocksignal has arrived. From theseconsiderations, the absoluteminimum pulse width that can besent through optocouplers in aparallel application is twice t PSK. Acautious design should use aslightly longer pulse width toensure that any additionaluncertainty in the rest of thecircuit does not cause a problem.The t PSK specified optocouplersoffer the advantages ofguaranteed specifications forpropagation delays, pulsewidthdistortion and propagation delayskew over the recommendedtemperature, input current, andpower supply ranges.1-1641-165Figure 19. Illustration of Propagation Delay Skew - t PSK .Figure 20. Parallel Data Transmission Example.I FV OI FVODATAINPUTSCLOCKDATAOUTPUTSCLOCK。