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USER GUIDESCB-100A100-Pin Shielded Screw Terminal DAQ AccessoryThe NI SCB-100A is a shielded I/O connector block with 100 screw terminals for easy signal connection to National Instruments Digital I/O products (PCI-DIO-96, NI 6508, NI 6509,NI 6511, NI 6512, NI 6513, NI 6514, NI 6515, NI 6528, and NI 6529), Counter/Timer products (NI 6624), or other products with a 100-pin 0.050 series shielded D-type I/Oconnector. This document describes how to connect and use the SCB-100A with 100-pin data acquisition (DAQ) products, and lists specifications.Figure 1. SCB-100A Parts Locator Diagram1.Top Cover (Required)2.Quick Reference Label3.Enclosure Base4.SCB-100A Board Assembly5.Strain-Relief Screw6.Strain-Relief BarCaution This icon denotes a caution, which advises you of precautions to take toavoid injury, data loss, or a system crash. When this symbol is marked on a product,refer to the Safety Guidelines section for information about precautions to take.Safety GuidelinesThe following cautions contain important safety information concerning hazardous voltages and connector blocks.Caution Do not connect hazardous voltages (>30 V RMS/42 V peak/60 V DC).Refer to your product documentation for information about the electrical limits ofyour device or module.Caution Install cover prior to use. To avoid electrical shock, do not removeSCB-100A covers unless you are qualified to do so. Before removing the cover,disconnect any live circuit from the connector block. Replace cover for use.Caution The chassis ground lug on your SCB-100A is for groundinghigh-impedance sources, such as a floating source (1 mA maximum) and forterminating the shields of connected cables. Do not use the chassis ground lug as asafety earth ground.Electromagnetic Compatibility GuidelinesThis product was tested and complies with the regulatory requirements and limits for electromagnetic compatibility (EMC) as stated in the product specifications. These requirements and limits are designed to provide reasonable protection against harmful interference when the product is operated in its intended operational electromagnetic environment.This product is intended for use in residential, commercial, and industrial locations. However, harmful interference may occur in some installations or when the product is connected to a peripheral device or a test object. To minimize interference with radio and television reception and prevent unacceptable performance degradation, install and use this product in strict accordance with the instructions in the product documentation.Furthermore, any changes or modifications to the product not expressly approved by National Instruments could void your authority to operate it under your local regulatory rules.Caution To ensure the specified EMC performance, operate this product only withshielded cables and accessories.Caution To ensure the specified EMC performance, signal wires routed outside ofthe enclosure must be contained within a shielded cable and connected to shieldedaccessories. Cable shields must be terminated to the chassis ground lug using asshort a connection as is practical.2| | SCB-100A User GuideWhat Y ou Need to Get StartedTo set up and use your SCB-100A, you need the items shown in the following figure. You can find quick reference labels, which specify accessory pinout information for many compatible products, by going to /info and entering the Info Code scb100alabels .Figure 2.SCB-100A Installation Supply List1.SCB-100A 100-pin Shielded Connector Block Kit2.100-pin DAQ Device/Module and Documentation3.(Optional) Quick Reference Label PDF4.SH100-100-F Cable (Part Number 185095-0x)5.#2 Phillips Screwdriver6.0.125 in. Flathead Screwdriver7.16 AWG to 30 AWG Signal Wire8.Wire Cutters9.Wire Insulation StripperGetting Started with the SCB-100AThe following figure shows the SCB-100A printed circuit board (PCB) parts locator diagram.If the kit is missing any of the components in the figure, contact NI.SCB-100A User Guide | © National Instruments | 3Figure 3. SCB-100A PCB Diagram1.Screw Terminals2.100-Pin I/O Connector3.PCB Mount Screw4.Chassis Ground Lug and PCB Mount ScrewCaution The chassis ground lug on your SCB-100A is for groundinghigh-impedance sources, such as a floating source (1 mA maximum) and forterminating the shields of connected cables. Do not use the chassis ground lug as a safety earth ground.To get started with the SCB-100A, complete the following steps while referring to theprevious figures. If you have not already installed your DAQ device or module, refer to the4 | | SCB-100A User Guidegetting started guide that came with your product for instructions. Remove all cables from the SCB-100A before getting started.1.(Optional) Mount the SCB-100A to a panel or DIN rail, as described in the Mounting theSCB-100A section.2.Remove the cover.3.Remove the film from both sides of the cover.4.(Optional) Attach the quick reference label to the inside of the cover. For quick referencelabels for most compatible products, go to /info and enter the Info Codescb100alabels.Tip You can stand the cover in the SCB-100A for easy reference.5.Loosen the strain-relief bar by removing the strain-relief screws with a #2 Phillipsscrewdriver.6.Connect the wires to the screw terminals by stripping off the wire insulation, inserting thewires into the screw terminals, and securely tightening the screws with the flatheadscrewdriver. Refer to the Specifications section for screw-terminal wiring gauge andtorque information.Caution To ensure the specified EMC performance, signal wires routedoutside of the enclosure must be contained within a shielded cable andconnected to shielded accessories. Cable shields must be terminated to thechassis ground lug using as short a connection as is practical.7.Reinstall the strain-relief (if removed) and tighten the strain-relief screws. If the shieldedcable is too large to route through the strain-relief hardware, either use multiple,smaller-diameter cables or remove the top strain-relief bar and add insulation or padding if necessary to constrain the cable.8.Replace the cover.Caution You must install cover prior to use.Caution Do not connect input voltages >30 V RMS/42 V peak/60 V DC tothe SCB-100A. Input voltages >30 V RMS/42 V peak/60 V DC can damage theSCB-100A, all devices or modules connected to it, and the host computer.9.Connect the SCB-100A to the DAQ device or module using the SH100-100-F cable.Refer to the Specifications section for information about the SCB-100A I/O connector.Note To ensure the specified EMC performance, operate this product onlywith shielded cables.unch Measurement & Automation Explorer (MAX). In the left panel, expand Devicesand Interfaces to confirm that your DAQ device or module is recognized, and thenconfigure your device settings.SCB-100A User Guide| © National Instruments| 511.(Optional) Configure the DAQ device or module connected to the SCB-100A bycompleting the following steps.a.In MAX, right-click your DAQ device or module and select Configure.b.Configure the device or module properties and click OK.12.Test specific device functionality. Run a Test Panel in MAX by right-clicking your DAQdevice or module and selecting Test Panels. Click Start to test the device or modulefunctions.Note When you have finished using the SCB-100A, power off any external signalsconnected to the SCB-100A before you power off your computer.Mounting the SCB-100AYou can use the SCB-100A on a desktop, or mount it to a panel or a standard DIN rail. For two-dimensional drawings and three-dimensional models of the SCB-100A, visit / dimensions and search by product name.Panel MountingThree keyholes are located on the back of the SCB-100A for mounting it to a panel or wall. To mount the SCB-100A to a board or panel, complete the following steps.1.Download and print the panel mounting template PDF by going to /info andentering the Info Code scb100amounting.ing the template, mark the three points on the panel. Verify that the narrow ends of thepanel mounting screw keyholes are pointing up.3.Screw #6-32 panhead machine screws or M3 panhead machine screws into the pointsmarked on the panel, leaving room to easily remove the SCB-100A from the panel.Installed screw height for both screw types (from the wall to the top of the screw) is5 mm (0.2 in.).DIN Rail MountingThe NI 9913 DIN rail mounting kit (part number 781740-01) contains one clip for mounting the SCB-100A on a standard 35 mm DIN rail. Fasten the DIN rail clip to the accessory using two FLH #6-32 x 5/16" screws (included in the kit) with a #2 Phillips screwdriver, as shown in the following figure.Note The threaded holes on the SCB-100A for DIN rail mounting should not beused more than five times. Unscrewing and reinstalling the DIN rail clip willproduce a compromised connection between the DIN rail clip and accessory.6| | SCB-100A User GuideFigure 4. SCB-100A DIN Rail Clip InstallationClip the chassis onto the DIN rail with the larger lip of the DIN rail clip positioned up, as shown in the following figure.Figure 5. DIN Rail Clip Parts Locator Diagram1.DIN Rail Clip2.DIN Rail Spring3.DIN RailSecuring the Cover on the SCB-100AIn most cases, attaching the cover with the integrated magnets is sufficient. To permanently secure the cover to the SCB-100A base, you will need two M3 × 6 (#4-40 × 5/16")thread-forming Phillips panhead screws, such as Taptite® Trilobular® screws. You can purchase Taptite screws from many vendors.SCB-100A User Guide| © National Instruments| 7Complete the following steps.ing a 3.5 mm (9/64 in.) diameter drill bit, drill two holes through the silkscreenedcrosshairs on the label side of the cover. When drilling, place the cover on a flat surface, such as a drill press, and drill slowly to minimize burrs.2.Replace the cover on the base, lining up the drill holes with the holes in the enclosure.3.Screw the M3 × 6 (#4-40 × 5/16") screws in with a torque of 0.90 N · M to 1.13 N · M(8 in. · lb to 10 in. · lb). Screwing within the recommended torque range avoids strippingthe threads of the enclosure holes.Removing the SCB-100A PCB from the Base Complete the following steps to remove the SCB-100A from the base.1.Disconnect the cable from the SCB-100A, if connected, and remove the top cover.2.Loosen the strain-relief screws, shown in Figure 1, with a #2 Phillips screwdriver.3.Remove any signal wires from screw terminals with a flathead screwdriver.4.Remove the printed circuit board mount screws and chassis ground lug, shown inFigure 2, with a #1 Phillips screwdriver.5.Remove the connector screws, shown in the following figure, with a flathead screwdriver.6.Tilt the PCB up and pull it out of the enclosure base.Figure 6. SCB-100A Back View1.Connector Screws2.100-Pin I/O ConnectorNote The threaded holes on the SCB-100A for the PCB mounting should not beused more than five times. Unscrewing and reinstalling the PCB will produce acompromised connection.SpecificationsThe following specifications are typical at 25 °C, unless otherwise noted.Caution Do not connect hazardous voltages (>30 V RMS/42 V peak/60 V DC) tothe SCB-100A.8| | SCB-100A User GuidePower RequirementsMaximum current at screw terminalsTerminals 1-48, 51-980.5 ATerminals 49-50, 99-100 1 ACaution Maximum current allowed at screw terminals may be less than specifieddepending on the DAQ device or module connected to the SCB-100A. Refer to thedevice specifications for maximum ratings of your device or module. Physical CharacteristicsDimensions (including feet)14.7 cm × 14.7 cm × 3.0 cm(5.8 in. x 5.8 in. × 1.2 in.)Weight670 g (1 lb 7.6 oz)I/O connector One 100-pin male 0.050 series shielded D-typeconnectorNumber of screw terminals100, all I/O signals are available at screwterminalsScrew-terminal wiringGauge0.25 mm2 to 1.29 mm2 (30 AWG to 16 AWG)solid or stranded wireWire strip length 6 mm (0.24 in.)Temperature rating90 °C minimumTorque0.5 N · m to 0.6 N · m(4.4 in. · lb to 5.3 in. · lb)Wires per screw terminal One wire per screw terminalNote It may not be possible to connect wires to all screw terminals through theopening of the enclosure when using wire larger than 1.02 mm2 (18 AWG). Safety VoltagesMaximum voltage30 V RMS, 42 V peak, 60 V DCCaution Not for use for measurements of MAINS circuits or MeasurementCategories II, III, or IV.EnvironmentalOperating temperature0 °C to 70 °CStorage temperature-18 °C to 82 °CSCB-100A User Guide| © National Instruments| 9Operating humidity5% to 90% RH, noncondensingStorage humidity5% to 90% RH, noncondensingPollution Degree2Maximum altitude2,000 mIndoor use only.SafetyThis product is designed to meet the requirements of the following standards of safety for electrical equipment for measurement, control, and laboratory use:•IEC 61010-1, EN 61010-1•UL 61010-1•CAN/CSA-C22.2 No. 61010-1Note For UL and other safety certifications, refer to the product label, or visit/certification, search by model number or product line, and clickthe appropriate link in the Certification column.Electromagnetic CompatibilityThis product meets the requirements of the following EMC standards for electrical equipment for measurement, control, and laboratory use:•EN 61326-1 (IEC 61326-1): Class A emissions; Basic immunity•EN 55011 (CISPR 11): Group 1, Class A emissions•EN 55022 (CISPR 22): Class A emissions•EN 55024 (CISPR 24): Immunity•AS/NZS CISPR 11: Group 1, Class A emissions•AS/NZS CISPR 22: Class A emissions•FCC 47 CFR Part 15B: Class A emissions•ICES-001: Class A emissionsNote In the United States (per FCC 47 CFR), Class A equipment is intended foruse in commercial, light-industrial, and heavy-industrial locations. In Europe,Canada, Australia and New Zealand (per CISPR 11) Class A equipment is intendedfor use only in heavy-industrial locations.Note Group 1 equipment (per CISPR 11) is any industrial, scientific, or medicalequipment that does not intentionally generate radio frequency energy for thetreatment of material or inspection/analysis purposes.Note For EMC declarations and certifications, and additional information, refer tothe Online Product Certification section.10| | SCB-100A User GuideCE ComplianceThis product meets the essential requirements of applicable European Directives, as follows:•2014/35/EU; Low-V oltage Directive (safety)•2014/30/EU; Electromagnetic Compatibility Directive (EMC)Online Product CertificationRefer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit / certification, search by model number or product line, and click the appropriate link in the Certification column.Environmental ManagementNI is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous substances from our products is beneficial to the environment and to NI customers.For additional environmental information, refer to the Minimize Our Environmental Impact web page at /environment. This page contains the environmental regulations and directives with which NI complies, as well as other environmental information not included in this document.Waste Electrical and Electronic Equipment (WEEE)EU Customers At the end of the product life cycle, all NI products must bedisposed of according to local laws and regulations. For more information abouthow to recycle NI products in your region, visit /environment/weee.电子信息产品污染控制管理办法（中国RoHS）中国客户National Instruments符合中国电子信息产品中限制使用某些有害物质指令(RoHS)。
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1000个最常用的英语单词以下1000个最常用的英语单词是从使用英式英语、美式英语和澳大利亚英语的报纸、杂志中以及真实的生活对话中提炼而来的。
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【导语】社会犹如⼀条船，每个⼈都要有掌舵的准备。
整理了英语名⼈名⾔，快来看看吧！希望能帮助到你~更多相关讯息请关注！1、深窥⾃⼰的⼼，⽽后发觉⼀切的奇迹在你⾃⼰。
——培根deep insights into their own heart, and then find all the miracles in yourself.2、先相信你⾃⼰，然后别⼈才会相信你。
——屠格涅夫believe in yourself first, and then others will believe you.3、⽣命在闪耀中现出绚烂，在平凡中现出真实。
——伯克life in the shining in gorgeous, in the ordinary real.4、⾃信是英雄的本质。
——爱默⽣self-trust is the essence of heroism.5、⼈⽣如同道路。
最近的捷径通常是最坏的路。
——培根life is like a road. recent shortcut is usually the worst road.6、世界上的⼀切光荣和骄傲，都来⾃母亲。
——⾼尔基all glory and pride of the world, all come from the mother.7、希望是坚强的勇⽓，是新⽣的意志。
——马丁·路德hope is a strong courage, is the will of the newborn.8、幸福的⼈由希望援助。
——⽶南德happiness by hope.9、信⼼是⼈的征服者；它战胜了⼈，⼜存在于⼈的⼼中。
——马·法·塔伯confidence is the conqueror of people; it beat, and exists in the hearts of people.10、希望的灯⼀旦熄灭，⽣活刹那间变成了⼀⽚⿊暗。
安全管理技术文献检索方法实习指导一、MEDLINE1.2012安全科学与技术国际会议。
请写出第一篇文献的原文出处。
3.清除检索式点击Clear按钮，选ALL，点击OK。
4.安全评价进展5.触电救治的规范化主题词是什么？主题词有几个？6.安全检查表的应用7.查Alan Boris Smith发表的文献（姓在前，名首字母在后。
姓、名之间、名首字母之间都用连字符，后加作者字段限定）9.检索有关尘肺患者做CT检查方面的综述文献。
）10.检索有关铅中毒患者检查鉴定的文献。
11.检索福岛核辐射的有关文献。
12.检索化工爆炸方面的文献。
13.检索有关危险品运输方面的文献。
网络实习指导免费电子邮件的申请和使用1. 上网后，在地址栏里输入2. 点击屏幕上方的“电邮”图标，进入后点击请马上注册，阅读yahoo 服务协议条款（拉动滚动条至最后），点击“我接受”按钮。
3．按要求输入你的个人信息，（注：“密码提示问题”和“答案”，可输入如“birth place”和“shanghai”。
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5352012,24(4):535-540DOI: 10.1016/S1001-6058(11)60275-8NUMERICAL STUDY OF THE RELATIONSHIP BETWEEN APPARENT SLIP LENGTH AND CONTACT ANGLE BY LATTICE BOLTZMANN METHOD*ZHANG Ren-liang, DI Qin-feng, WANG Xin-liang, DING Wei-peng, GONG WeiShanghai Institute of Applied Mathematics and Mechanics and Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai University, Shanghai 200072, China, E-mail: zhrleo@(Received December 9, 2011, Revised March 1, 2012)Abstract: The apparent slip between solid wall and liquid is studied by using the Lattice Boltzmann Method (LBM) and the Shan-Chen multiphase model in this paper. With a no-slip bounce-back scheme applied to the interface, flow regimes under different wall wettabilities are investigated. Because of the wall wettability, liquid apparent slip is observed. Slip lengths for different wall wettabilities are found to collapse nearly onto a single curve as a function of the static contact angle, and thereby a relationship between apparent slip length and contact angle is suggested. Our results also show that the wall wettability leads to the formation of a low-density layer between solid wall and liquid, which produced apparent slip in the micro-scale.Key words: Lattice Boltzmann Method (LBM), wettability, apparent slip, contact angle, nano-particles adsorbing methodIntroductionThe no-slip boundary condition, which states that the fluid velocity at a fluid-solid interface equals that of the solid surface has been proven valid at macro- scopic scales, but is not fulfilled at microscopic scales[1]. A series of experiments[2,3] and numerical results[4,5] have found fluid slip at the boundaries of the flow channels in microfluidics. As the typical length scale of the micro-fluid flows gets smaller, the effect of boundary slip becomes more prominent, and has been paid more attention in engineering applica- tions[6]. Based on this slip boundary effect, artificial super-hydrophobic surfaces have been widely used in industrial production and daily life. For example, self- *Project supported by the National Natural Science Foun- dation of China (Grant No. 50874071), the National High Technology Research and Development of China (863 Program, Grant No. 2008AA06Z201), the Key Program of Science and Technology Commission of Shanghai Municipality (Grant No. 071605102) and the Leading Talent Funding of Shanghai. Biography: ZHANG Ren-liang (1982-), Male,Ph. D. CandidateCorresponding author: DI Qin-feng,E-mail: qinfengd@ cleaning paints, roof tiles, fabrics and glass windows that can be cleaned by a simple rainfall and the nano- particles adsorbing method[2] in improving oil reco- very are all in practice.Slip length is of great importance in calculation of drag and other hydrodynamic properties of fluid flowing through micro-channels or over nano-scale patterned surfaces, but it is very difficult to directly measure the apparent slip length accurately in experi- ments. In 1823, Navier proposed a slip boundary con- dition that the fluid velocity at a point on a surface is proportional to the shear rate at the same point, but the value of slip length is hard to be determined. Chen et al.[7] investigated the Couette flows by means of a two-phase mesoscopic Lattice Boltzmann Method (LBM), and the results showed that there is a strong relationship between the magnitude of slip length and the solid-fluid interaction, but it is a very difficult or even impossible task to compute the exact slip length in dependence of interaction and it is also difficult to be applied to engineering.In this work, we focus on investigating the effe- cts of wall wettabilities on the slip length in order to get a slip length model governed by contact angle. Using this model, it is easy to estimate the slip length because the contact angle is a parameter that can be536 easily measured.1. Numerical modelTo simulate non-ideal multiphase fluid flows, the attractive or repulsive interaction among molecules, which is referred to as the non-ideal interaction, should be included in the LBM. There are many app- roaches to incorporate non-ideal interactions, such as the color-fluid model, interparticle-potential model, free-energy model, mean-field theory model and so on. The interparticle-potential model proposed by Shan and Chen [8,9] is to mimic microscopic interaction forces between the fluid components. This model modified the collision operator by using an equili- brium velocity that includes an interactive force. This force guarantees phase separation and introduces sur- face-tension effects. This model has been applied with considerable success in measuring contact angles [10] and examining the effect of wall wettabilities, topo- graphy and micro-structure on drag reduction of fluid flow through micro-channels [11]. As an extension of the Shan-Chen model, Benzi et al.[12] first derived an analytical expression for the contact angle and the sur- face energy between any two of the liquid, solid and vapor phases.The LBM, which involves a single relaxation time in the Bhatnagar-Gross-Krook (BGK) collision operator, is used here. The time evolution of this model can be written as+,+,i i i =f t t t f t '' x c x1(,)(,)eq i i f t f t W ª ¬x x º¼(1) herew (,)i f t x r fluid p i is the single-particle distribution fun-ction fo articles moving in the direction i c at (,)t x , (,)eq f t x the equilibrium distribution un- ' e step of simulation, and parameter f ction, t the tim W the relaxation time characterizing the collision pro- sses by which the distribution functions relax to- wards their equilibrium distributions.In the two-dimensional (2-D) squ ce are lattice with nine velocities model [13], the equilibrium distribution function, (,)eq i f t x , d pends only on local density and veloci n be chosen as the following forme ty and ca 224()=1++22i i eqii s s f c c c Z U ªº«» «»¬¼c u c u u u 2s (2)rewhe=0,0i c c (= 0)i 1)1)=cos ,sin 22i i i c S S ªº«»¬¼c (3b) (=1,...,4)i2-92-9=cos ,sin 44i i i c S S º»¼c(=5,...,8)i (3c)4=9i Z (=0)i(4a)1=9i Z (=1,2,3,4)i (4b)1=36i Z (=5,6,7,8)i (4c)221=3s c c (5)t =/c x '' is the lattice velocity, x ' the lattice dis- tance, and t ' the time step of simulation, and U the fluid density, which can be ned from obtai =Uiif¦.The macroscopic velocity u is given by=++i i ads if U W ¦u c F F (6)Eq In .(6), F and ads F are th d-fluid interact e flui ionforce and fluid-solid inter y. The fluid-fluid interaction is obtained by using an ctive short-range force [8]action force, respectivel attra()=(,)+,i i i iG t t t \ 'w \¦F x x x c c (7)where G is the interaction strength, which is used to ontrol the two-phase liqui in c d teraction, and is nega- tive for icle attraction, part \ is the in ntial, which is defined as [14]teraction pote-/0(,)e t =UU\\ x (8)0\ and 0U are constants As in Ref.[14] i w istaken as 1/9 for =1,2,4i , (3a). as 0 fo It is simple to and a wall by introducing an extra force, and thise as T to induce hase separatio in this pape ond equation is [14],3i w 1/36 for i =5,6,7,8, and r =0i .describe the interaction between a luid f m thod w first used by Martys and Chen [15].he idea is to create an analogue to the particle-particle in- teraction force used p n, and r the corresp ing537()=(,)(+,)ads ads i i i iG t w s t t \ '¦x x x c c (9)Here =0,1s for the fluid and the solid phase, respe- ctively, and the adhesion parameter ads G is used to control the wettability behavior of the li u F q surfaces. I t can be seen that Eq.(9) incor dhesive interaction between fluid and surfaces.nd the as id at solid porates an a A relaxation time tunes the kinematic vis- cosity21=2s v c t W §· '¨¸©¹ (10)The equation of state in the Shan-Chen model s [14] i>@2,)=+(36G P t U \x (11)where P isthe pressure.ig erent value.in a 2-D o simula- on-sl sche s employed for the solid-fluid interfaces, nd periodic boundary conditions were applied at both let and outlet ends along the horizontal direction. A he middle betwFig.1 Static contact angleF .2 Contact angles as a function of absG for diff of GNumerical simulation of contact angleThe LBM simulations were carried out main. The grid mesh used is 50×200. In the2d tion, as in Ref.[11], the general n ip bounce-back me [16] wa a in droplet with the diameter of 30, is set at t een two ends. After 30 000 time steps, the result tends to be stabilized. Figure 1 shows an example ofstatic contact angle, which is 127.6o when =120G , =130abs G and 200/(,)=4e x t U \ in Eqs.(7) and (9). The values of parameters G and abs G and the simulated contact angles for each case are listed in Fig.2.As is shown in Fig.2, abs G and G determine the value of contact angle. abs G represen - action d solid surface andG the strength of interaction tweenparticles. A negative abs G indicates attractive interaction. When ts fluid e ma the stre gnitude of ngth of inter G between fluid an be ven, the greater th is gi abs G , the stronger the reac , thus resulting in smaller contact angle. The act angle is a static parameter of measuring the wettability of a liquid on a lid surface, and it can be easily measured. I n our simulation, we also change the parameter abs G to simulat rbitrary contact angle, and then easily obtain ent wall wettabilities. Form Fig.2, we also see that both parameters of abs G and G have signifi- cant impact on the simulated contact angle.tion cont n ed in Figs.3 and 4 (g so diff ca e a er ig.3 V ig.4 . Nu wettabi- ti mu- ti ensity Poiseuilleows are displayF elocity profiles with different contact anglesF Density profiles with different contact anglesmerical simulation of slip lengthIn order to investigate the effects of wall es on the slip length, we conducted numerical si ons for the 2-D Poiseuille flows. Typical d3li la and velocity profiles of the pressure-driven fl iven G =120 ).538 The ordinate in both figures represents the distanceto the other. The from one of the solid surface boundary abscissa in Fig.3 is the normalized velocity, where 0v is the max velocity measured at the center in the channel for the case of no slip. The abscissa in Fig.4 is the normalized fluid density, where 0U is the liquid density for the case of no slip. The pressure gra- dient is specified as 5×10–3 in lattice unit for both cases. Different contact angles (as shown in both Figs.3 and 4) can be simulated by specifying different values of the adhesion parameter (abs G ). All simula- tions were run until static equilibrium was nearly attained, and then a pressure gradient of 5×–3 was applied in the x -direction (flow direction).10ary d at y i e bo ig.5 V A pproa-hes ) or nt with e bo the o bo daries. However, the flu locit ncrea- th undary. he l the b plotted in Fig.3 e obtained from LBM i the contact the intera-t ter ). s, mb of reseF elocity profiles of simulated and fitteds is shown in Fig.3, the fluid velocity a zero as 24.5y o (the lower bound (the upper boundary), which is consiste unce-back boundary condition specifiec y o th tw un id ve ses dramatically in a very thin layer near T ayer is so thin that it is hard to see its details nearoundary, and velocity at the boundary looks likenon-zero when a larger scale, as shown in . I n a macro-scale, velocity at a boundary is nearly zero, but in a micro-scale, the velocity appears non-zero (so called apparent slip). Plots shown in Fig.3 clearly indicate that the slip velocity at the boun- dary increases as contact angle increases. I n order to understand the physical mechanism of such kind ofphenomenon, the density profiles of fluid with diffe-rent contact angles is drawn in Fig.4. One should notethat the density of the fluid with zero contact angle isconstant (as shown by the circle symbol vertical linein Fig.4). However, a sharp reduction of fluid densitynear the boundary is observed for a fluid with non-zero contact angle, which clearly indicates a layer ofmuch less dense fluid (most probably gas) is inducedbetween the dense liquid and solid surface. Fitting forthe velocity data points where the density is approxi- mately constant, we can get a parabolic of velocity profiles, and extrapolating the fitted profiles to zerovelocity yields a slip length as shown in Fig.5. Given an interaction strength (G ), different slip lengths can be obtained by using a series values of the adhesion parameter (abs G ), as shown in Fig.6. As was discussed above, the parameter of abs G controls the interactionbetween the fluid and solid surface. I ncreasing abs G decreases the attraction (or increases the repulsion) between the liquid and solid surface, and thus attracts more gas to the surface. The less dense of the fluid at the surface, less viscous shear force, and the more significant slippage appeaFrom Figs.3 and 4 one can see that the wetting properties of the wall have an important influenc the velocity profile, especially the slip velocity at the boundary. There is a low-density layer between the bulk liquid and the wall, and the more hydrophobic the wall is, the lower density of fluid is (see Fig.4). This result is similar to thos the rs. e onother simulation [17] and observed in MDS [18]. Compa- red with the macroscopic flow, the ratio of the low- density layer region to the inner region is larger in the microscopic flow, and this is the main difference between micro-flow and macro-flow. Thus, the slip cannot be ignored in the micro-flow.F g.6 Slip length as a function of absG for different From Figs.2 and 6, we can see that ngle and slip length are associated with ion strength (G ) and adhesion parame umerical results of contact angles and slip lengt G a c (abs G h Fig.7,N represented by different sy ols shown in orrespond to different values G , respectively, re-c p nted by squares (=120G ), circle (=125G ),delta (=130G ) and gradient (=135G ). The numerical results shown in Fig.7 cover a wide range of contact angles, ranging from 18o to 150o . Results shown in Fig.7 clearly indicate that slip length is a function of contact angle. The relationship between slip length and contact angle can b easily obtained by fitting those numerical Eq.(12)) a y the solid Fig.7.e data (see s shown b curve in539/56.06=0.1441e 1L T G (12)where T is contact angle and L G is slip length.i on i o a gle h ed above, the slip length is the result of interaction ace, and it depe- ds on the properties of the liquid (e.g., ) and the lu n fluid articles (controlled by a parameter of ) and the in- raction between a fluid and a soli ontrolled by al ng, SHEN Chen and WANG Zhang-hong et al.Experimental research on drag reduction of flow in micro-channels of rocks using nano-particle adsorption . Acta Petrolei Sinica, 2009, 30(1): 125- ese).[4] [5] AT T. and WANG Y. Slip effects on[6] 2008, 25(1): [8] [9] [10] ., THORNE D. T. Jr and SCHAAP M. G. et07, 76(6): on drag reduction effect in micro-channel flow [12] of boundaries: The contact angle[J]. Physical [14] [15] lation of multicompo-F g.7 The slip length against contact angleForm Fig.7 we can see that the slip lengths fferent surfaces are found to collapse nearly ont ngle curve as a function of the static contact an aracterizing the surface wettability. As was discu-d si c ss between the liquid and the wall surf n G wall surface (e.g., abs G ). So the simulation of slip length should take into account all parameters of the interaction objects, but it is a very hard task [19] to do this. I n fact, the contact angle is a more comprehe- nsive expression of interactions between liquid and solid surface, and the weaker the solid-f id intera- ction is, the larger the contact angle is. So it may be a feasible and advisable way to use contact angle as control parameter to simulate the slip length.4. ConclusionThe LBM has been successfully applied in this work to simulate contact angle of a fluid on a solid surface and slip length of a fluid flowing over a solid surface. Both the non-ideal interaction betwee p G d (c te another parameter of abs G ) have significant impact on the contact angle and slip length. However, they have little influence on the relationship between the contact angle and slip length. Our numerical results confirm that there is a low-density layer between the bulk liquid, and that the wetting properties of the wall have an important influence on the velocity profile. The more hydrophobic the w l is, the lower density of fluid is. Thus, the slip cannot be ignored in the micro- flow.References[1] HYVALUOMA J., HARTI NG J. Slip flow over stru-ctured surfaces with entrapped microbubbles[J]. Physi- cal Review Letters, 2008, 100(24): 246001.[2]DI Qin-fe method[J]128(in Chin [3] BURTON Z., BHUSHAN B. Hydrophobicity, adhesion,and friction properties of nanopatterned polymers and scale dependence for micro-and nanoelectromechanical systems[J]. Nano Letters, 2005, 5(8): 1607-1613.ZHANG J. Lattice Boltzmann method for microfluidics:Models and applications[J]. Microfluidics and Nano- fluidics, 2010, 10(1): 1-28.KHAN M., HAY shearing flows in a porous medium[J]. Acta Mechan- nic Sinica, 2008, 24(1): 51-59.WANG Xin-liang, DI Qin-feng and ZHANG Ren-lianget al. Progress in theories of super-hydrophobic surface slip effect and its application to drag reduction techno- logy[J]. Advances in Mechanics, 2010, 40(3): 241- 249(in Chinese).[7] CHEN Yan-yan, YI Hou-hui and LI Hua-bing Boun-dary slip and surface interaction: A lattice Boltzmann simulation[J]. Chinese Physics Letters,184-187.SHAN X., CHEN H. Lattice Boltzmann model for simu-lating flows with multiple phases and components[J]. Physical Review E, 1993, 47(3): 1815-1819.SHAN X., CHEN H. Simulation of nonideal gases andliquid-gas phase transitions by the lattice Boltzmann equation[J]. Physical Review E, 1994, 49(4): 2941- 2948.HUANG H al. Proposed approximation for contact angles in Shan- and-Chen-type multicomponent multiphase lattice Boltzmann models[J]. Physical Review E, 201-6.[11] ZHANG Ren-liang, DI Qin-feng and WANG Xin-liang,et al. Numerical study of wall wettabilities and topo- graphy by lattice Boltzmann method[J]. Journal of Hydro- dynamics, 2010, 22(3): 366-372.BENZI R., BIFERALE L. and SBRAGAGLIA M. et al.Mesoscopic modeling of a two-phase flow in the pre- sence Review E, 2006, 74(2): 021509.[13] QIAN Y. H., DމHUMIERES D. and LALLEMAND P.Lattice BGK models for Navier-Stokes equations[J]. Europhysics Letters, 1992, 17(6): 479-484.SUKOP M. C., THORNE D. T. Lattice Boltzmannmodeling: An introduction for geoscientists and engineers [M]. Berlin, Heidelberg, Germany: Springer- Verlag, 2006.MARTYS N. S., CHEN H. Simu nent fluids in complex three-dimensional geometries by the lattice Boltzmann method[J]. Physical Review E, 1996, 53(1): 743-750.[16] GUO Zhao-li, ZHENG Chu-guang. The principle andapplication of the method [M]. Beijing: Science Press, 2009(in Chinese).540[17]04, 70(5): 1-4.06, 55(10): 5305-5310(in Chinese). 9] HARTI NG J., KUNERT C. and HERRMANN H. J.Lattice Boltzmann simulations of apparent slip in hydrophobic microchannels[J]. Europhysics Letters,2006, 75(2): 328-334.ZHANG J., KWOK D. Y. Apparent slip over a solid-liquid interface with a no-slip boundary condition[J].Physical Review E, 20[18] CAO Bing-Yang, CHEN Min and GUO Zeng-Yuan.Velocity slip of liquid flow in nanochannels[J]. ActaPhysica Sinica, 20[1。
美国FDA分析⽅法验证指南中英⽂对照--6XI. METHODOLOGYSections II through IX provide general information on the submission of analytical procedures and methods validation information, including validation characteristics. Additional information on certain methodologies is provided below.XI．⽅法学II章到第IX章提供了分析⽅法和分析⽅法验证资料⽅⾯的基本信息，包括验证项⽬。
下⽂就⼀些具体的⽅法给出了说明：A. High-Pressure Liquid Chromatography (HPLC)The widespread use of HPLC analytical procedures and the multitude of commercial sources of columns and packings frequently have created problems in assessing comparability. Many of the following points may also apply to other chromatographic analytical procedures.⾊谱(HPLC)⾼效液相⾊谱A．⾼效液相HPLC分析⽅法的⼴泛应⽤及⾊谱柱和柱填充的众多来源都经常会给可⽐性评估带来很多问题。
如下这些要点中，很多都适⽤于其它⾊谱分析⽅法。
1. ColumnThe following characteristics are useful for defining a particular column and, if known, should be included in the analytical procedure description. If method development has indicated that columns from only one commercial source are suitable, this information should be included as part of the analytical procedure. If more than one column is suitable, a listing of columns found to be equivalent should be included.1.⾊谱柱在定义某⼀⾊谱柱时，如下这些性质是很有⽤的，也应当要包括在分析⽅法描述中。
