厂务系统概述简单中文介绍PPT课件

IC FAB 廠務系統簡介2. Electrical power supply condition :2-1. Voltage & Loading :480V : 60Hz ±0.5Hz, 3 phase 4 wire（R,S,T,G）208V : 60Hz ±0.5Hz, 3 phase 4 wire（R,S,T,G）208V : 60Hz ±0.5Hz, 3 phase 5 wire（R,S,T,N,G）120V : 60Hz ±0.5Hz, 1 phase 3 wire（L,N,G）※If tool loading of 208V is greater than 400A, we suggest to use480V power source.※Process tool should follow IEEE standard 466 -electrical power voltage requirement.As attachment-1.2-2. Type :Normal Power : without supply when power outageEmergency Power : can sustain power failure more than 10 minutesDynamic UPS : continuously supply even thought power outage3. EMI：＜10mG dc &＜1mG ac, and maximum 0.2 mG variation over 5 minutes nearsensitive equipment.4. ESD：4-1. Raised floor and concrete floor = 10E6~5×10E8Ω/□4-2. Clean room wall = 10E6~5×10E8Ω/□4-3. Voltage : ＜100 V level4-4. Photo area : discharge time: +1000V to +100V under emitter＜40 sec.5. Grounding : ≦1Ω6. Noise : ≦60 NC7. Illumination : 750 ~ 800 lux for C/R；but photo area 500 ~ 600 lux with yellow light10. Drain :10-1.『HF-S Drain』: the waste water contain fluorine ion, [F-] ＞200 mg/l10-2.『HF-W Drain』: the waste water contain fluorine ion, [F-] ＜200 mg/l10-3.『IPA Waste』: the waste liquid contain IPA and concentration [IPA]＞80%10-4.『Solvent Waste』: the waste liquid contain solvent and concentration [Solvent] ＞80% 10-5.『DA（Waste Drain）』: DA is dedicated to followed condition.A. The waste water contain TOC and concentration [TOC]＞2mg/lB. The waste water contain acid or alkali but not first acid rinse waterC. Conductivity＞800μs/㎝but not first acid rinse water10-6.『FDA Drain』: is dedicated to first acid rinse water10-7.『DG（general drain）』: DG is dedicated to followed condition.A. The waste water doesn't contain fluorine ion.B. [TOC]＜2mg/lC. Conductivity＜800μs/㎝but not hot water10-8.『DAH Drain』: hot drain water with [TOC]＜2mg/l and conductivity＜800μs/㎝and without fluorine ion.10-9.『Oxide Slurry Drain』: is dedicated to CMP oxide waste water10-10.『Metal Slurry Drain』: is dedicated to CMP metal waste water10-11.『Cu-W Drain』: is dedicated to CMP copper waste water10-12.『Cu-S Drain』: is dedicated to electroplating waste for Cu process10-13.『H2SO4-S』: the waste liquid contain H2SO4 and concentration [H2SO4]＞80%10-14.『H3PO4-S』: the waste liquid contain H3PO4 and concentration [H3PO4]＞80%10-15. Other waste collection systems are dedicated to specialty chemical waste such as EKC, coater, T-12…etc.Typical Power Design Goals for Semiconductor Process Equipment Voltage: 120/208, 277/480 variations as defined by CEBMA curve (IEEE Standard 446)RCFSUB-FABExhaustMUAoutdoor airULPA ChamberEQ-2Clean RoomHc\潔淨室air 品質管理f2.PPT, @2002/01/08.Fab Air Quality ManagementSMIF FOUPEQ-1Local Chemical FilterRCFChemical Filtermicro-environment Chemical FilterMUA Chemical Filter23511. Wafer Operation Area.2. RCF CF 前.3. RCF CF 後.4. MUA CF 前.5. MUA CF 後.儀器與方法1. IMS. (HF,Cl2,NH4OH,VOC/ppb)2. TLD-1. (Cl2 / ppb)3. CCT/ERM. (Å/hr, Å/day)4. Cu/Silver Coupon. (Å/day, Å/week)5. Metal Wafer Queue Time.6. Others. (CD, Defect, Lens,…)1FFUChemical Filter11. Air Velocity.2. Temp./Humidity.333功能與應用1. 晶片保護. (Alarm, OCAP/MRB,…), [ERT]2. Chemical Filter 之Lifetime 管理. [治標]3. 污染洩漏源管理.(Pattern,Map,...) [治本]4. CR 微污染有效管理. (計劃實驗), [持續改善]5. MUA 空氣品質管理. [提昇品質]6. 人員衛生品質管理. [特殊應用]杜絕漏源人人有責4WwaferSMIF/FOUP: Standard Mechanical Inter-Face, Front Opening Unified Pod.Fab Layout (air quality monitor)15112552434323Hc\潔淨室air 品質管理5.ppt1. Wafer Operation Area.2. RCF/FFU CF 前.3. RCF/FFU CF 後.4. MUA CF 前.5. MUA CF 後.RCFSUB-FABExhaustMUAoutdoor airULPA ChamberEQ-2Clean RoomHc\潔淨室particl e 理f2.PPT, @2002/05/13.Fab Particle ManagementSMIF FOUPEQ-1231. Wafer Exposure Area.2. ULPA 後.3. Mfg Working Area4. MUA 後.儀器與方法1. Particle Counter. (.1um)2. Particle monitor. (.3um)3. Air Velocity Meter. (0.1-1m/sec.)4. Flow pattern monitor5. Smog Generator.6. De-bug Tool. (Item1,2 + CCTV)111. Air Velocity.2. Flow Pattern23功能與應用1. 晶片保護. (Alarm, OCAP/MRB,…), [ERT]2. Filter 之Lifetime 管理. [治標]3. Particle 來源管理.(Pattern,Map,...) [治本]4. CR 微塵有效管理. (計劃實驗), [持續改善]5. MUA Particle 品質管理. [提昇品質]微塵控管人人有責4Class 1@0.1um Class 0.1@0.1umClass 100T @0.3umClass 100, @0.3umWClass 10@0.1umWafer SMIF/FOUP: Standard Mechanical Inter-Face, Front Opening Unified Pod.Gerneral Fab Layout (particle monitor)15112523323Hc\潔淨室particl e 管理5.ppt1. Wafer Operation Area.2. Mfg Working Area.3. ULPA 前.4. ULPA 後.5. MUA 前.444。

工厂自动化/厂务系统(FMCS)日期: 2009-11-6 15:00:48 作者: Admin 来源: 上海存在自动化控制设备有限公司浏览: 3588FMCS(Facility Management and Control System)其中文意思是厂务监控系统，它是目前半导体厂内制程中所使用的监控系统，用途是将厂区内特定的，有危害的，影响制程状态或系统资料于此的监控，并将其记录，以供问题即时处理及日后问题分析。

目前的制造业已经向信息化工厂逐渐过度，整个工厂作为一个有机的整体来协调运转就需要一个有效的监控和管理，通过监控可以知道工厂所有设备所有人员所有材料的具体情况，通过管理，可以使以上各个生产环节紧密结合，协调运转。

这样，就需要一个整体的全厂自动化系统。

上海存在自动化控制设备有限公司的FMCS系统就是针对以上这些具体需求提出的完美解决方案。

存在自动化根据客户的具体设备要求和工程规范，结合我们在工厂FMCS方面的多年实践经验，运用当今主流的计算机技术和自动控制技术而进行的方案设计和工程实施设计，而量身定造完整的FMCS系统。

此监控系统，具有友善的监控界面，采用Windows作业环境，只需要使用鼠标及简单的键盘，就可以进行操作，具安全性及可扩充性。

FMCS设计目标将设施供应系统、环境系统、废弃物处理系统等监控资料利用Ethernet、PLC或RS232等通讯协议连接至不同监控计算机，形成一整合网络监控系统，以达到如下目的：1.整合各单一网络为以整体，实现信息可互通。

2.提升整体管理绩效3.简化运转维护困难度4.降低安装、运转及扩充成本5.多台电脑可相互监看、控制6.可共享磁盘资源7.可达到相互备份效果8.监控报警电话Call出及邮件功能9.历史数据查询及曲线查询10.自动生成报表11.监控系统网络管理FMCS价值所在1.大量节省管理人员：传统的仪表控制系统是通过工厂操作管理人员楼上楼下来回奔走，对分布于工厂各处的设备进行开关和调节。