TSP-4-1-photons

Supplementary MethodsOptical configuration:A diagram of the optical configuration used for the photobleaching experiments is shown insupplemental figure 1 below.Supplemental Figure 1. Diagram of the optical configuration of the side-port for photobleaching.e. he d or the YFP bleaching experiment shown in figure 1, the microscope filter cube used for bleaching rom 0DCSXscanning mirrorsView is from above, and the scanning mirrors are at the rear of a Nikon TE-300 inverted microscop The dichroic mirror near the tube lens is a long-pass extended reflection mirror (650 DCXRU). The light from an argon-ion laser (Coherent Sabre) was coupled into an optical fiber and connected to the side-port at the connector shown at the right side of the figure. To preview the fluorescence and select cells, an in-house developed fiber-optic coupled high-power blue light emitting diode (LED) source (patent pending) was connected in place of the laser coupling fiber. Depending on the experiment a band-pass filter was sometimes included before coupling the LED emission to the fiber. In some experiments an additional dichroic mirror, 440 nm long-pass (440DCLP), was included between t fiber-optic coupler and the divergence-correcting lens to allow the additional coupling of a liquid-fille light guide (Oriel) to permit the use of a xenon arc lamp (Cairn).F contained a 545nm long-pass dichroic (545DCLP) and a 540-600nm band-pass emission filter(HQ570/30). A portion of the YFP emission could be monitored visually while scattered light f the 514.5 nm laser excitation was blocked. For bleaching experiments using laser lines shorter than 514.5, a filter cube containing a 510 long pass dichroic and a 510-560 band-pass emission filter (510DCLP and HQ535/50 respectively) was used. The filter cube for the 2-photon excitationcontained a 700 nm short-pass, UV reflecting, dichroic and a 710 short pass emission filter (70and E710SP respectively).YFP photoconversion revisited: confirmation of the CFP-like speciesMichael T Kirber, Kai Chen & John F Keaney JrIn experiments to check if the fluorescent decay product was visible with arc lamp illumination, a filter experiments to check if bleaching using arc lamp illumination produced the fluorescent decay ht , and en rlabs. ther than observing that the fluorescent decay product of YFP could be excited using a configuration ell culture and plasmid transfection: cube containing a 405-445 band-pass excitation filter, a 455 long-pass, extended reflection dichroic, and a 460-500 nm band-pass emission filter (D425/40X, 455DCXRU, and D480/40M respectively) was used. Infrared light was removed from the arc lamp output using a short wavelength visible and UV reflecting cold mirror (Thorlabs).In product, the fiber coupler was removed from the side port and the output from the liquid-filled lig guide and a collimating lens were coupled directly in place of the fiber-optic coupler. The 440DCLP dichroic was left in place. The filter cube used for bleaching contained, a 460-500nm band passemission filter inserted in reverse direction in the excitation position, a 510 nm long-pass dichroic a 510-560 nm band-pass emission filter ( HQ480/40M, 510DCLP, and HQ535/50M respectively) Bleaching YFP about 50% took 2 hours and when the 440DCLP mirror was removed and the CFP filter cube (D425/40X, 455DCXRU, and D480/40M) selected, the fluorescent decay product was se with the arc lamp illumination. All filters and dichroic mirrors were purchased from ChromaTechnology. Optical fiber, lenses, and optomechanical components were purchased from ThoO appropriate for exciting CFP using single photon (arc lamp) or 2-photon excitation, we did not try to determine the excitation spectrum of this byproduct. Such experiments might well be worthwhile but we are not presently set up to carry them out.Cvitrogen) and transfection with overexpression plasmids was ) was age acquisition and display:COS-7 cells were cultured in DMEM (In carried out using Fugene 6 (Roche) in cells at 70% confluency according to the manufacturer’sinstructions. PTP1B trapping mutant expression vector pcDNA6.2/YFP-PTP1B (D181A/Q262A constructed by using PCR subcloning technique with pcDNA6.2/N-YFP vector (Invitrogen) and pJ3H-PTP1B (D181A/Q262A)(kindly provided by Dr. Zhong-Yin Zhang, Indiana University). Cells were grown on glass cover slides and fixed with 4% paraformaldehyde.Imas designed and built in-house in collaboration with the laboratory of inal irror d between the number of counted photons and the brightness of the display.The 2-photon microscope used w Dr. Peter So at the Massachusetts Institute of Technology. The optical microscope portion of the system was a Nikon TE300 and the objective used was a 100X, 1.3 NA, oil-immersion type. Orig images obtained with 2-photon excitation (800 or 916 nm excitation) were 384x384 pixels with each pixel imaging 130 by 130 nm in the sample, which is beyond the resolution capability of the system. The dwell time at each pixel was 2 ms. Images shown in figure 1 are cropped from the originals and are 280 by 280 pixels. The fluorescence at each channel was measured with photon counting photomultiplier tubes (Hamamatsu R4700P-01 for the green channel and R4700P for the bluechannel). The green channel was separated from the red using an extended reflection dichroic m 565 nm long-pass (565DCXR) and the blue and green channels were separated using a 500nm long-pass extended reflection dichroic mirror (500DCXR). The pass-bands of the filters are given in the body of the text. The number of counts at each location in the sample was stored as a 16 bit unsigne integer. Images were imported into ImageJ as raw data. The colors for images in figure 1a-f were chosen to approximate the actual color of the fluorescence. The scale bars indicate the relationshipColocalization:In quantitatively assessing the degree of colocalization of two distinctly fluorescently labeled (or the different colored images each as a sample of a e or expressed) compounds in a cell, it is useful to treat random process which accurately represents it statistically (ergodicity). The normalized covarianc correlation coefficient between 2 sets of data, which in this case are images E and F which are N i x N j in size and contain elements e ij and f ij respectively, can be written as}Where E{ } denotes the “expected value” and E ¯ is the arithmetic mean of the pixel values in image E nd F ¯ is the mean of image F. This calculation has been applied to quantitatively assess colocalization E ()()ij ij e E f F ρ−−a (Vereb et al .). Because expectation is a linear operator, this expression can be rearranged so that the contribution at each pixel pair to the correlation coefficient is clear.ρ==We can then display an image G* with pixel values g*ij , the sum of all the pixels being the correlationoefficient. c*ij ij ij e f E F N N g −=or simplicity we normalize this so that we display images where the mean of all of the pixels, G ¯, is e correlation coefficient.F thij g =ll of the values can be easily calculated using ImageJ (Wayne Rasband, NIH).this manner we can easily compare different size sets of images and not lose the quantitative ove comparing the degree of colocalization under different experimental conditions some caution is oth ference:atko J, Vamosi G, Ibrahim SM, Magyar E, Varga S, Szollosi J, Jenei A, Gaspar R Jr, AIn information. Areas where the normalized covariance image is positive indicate colocalization ab that predicted by random uniform distributions of the 2 fluorescent species. Additionally, there are generally some regions where the pixels have a negative value. These regions correspond to areas where the colocalization of the 2 labeled compounds is less than would be predicted by a uniform random distribution.In needed. For example the regions for which the computation is performed should be similar under b sets of conditions (i.e. ratio of area of background to area of cell interior).re Vereb G, M Waldmann TA, Damjanovich S. Proc Natl Acad Sci U S A. 2000 May 23;97(11):6013-8.。

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Hearreviews of the European Innovation landscape highlightinggeographical areas of strengths in areas such as business R&D,knowledge transfer and demonstrate the outcomes from recentsuccessful European-funded industry programmes.Industry Perspectives Programme Included with Conference registration.Individual Sessions can be purchased at the Cashier. Individual sessions, €100. The sessions will deliver a strategic perspective into each application area, allowing you to uncover and confirm the future prospects for your business. Benchmark your aspirations for your business and technology against some of Europe’s leading companies and engage with them as a potential supplier or partner. You will hear presentations from Philips, Audi, PCO, Coherent Scotland, GlaxoSmithKline, Carl Zeiss, Yole Development, Koheras and Fraunhofer on their successes and strategic priorities. Tuesday 8 April Morning SessionPhotovoltaics10.15 to 10.45 hrs.Photovoltaics - Market and Technology TrendsGaëtan Rull, Market Analyst for New Energy Technologies,Yole Développement 10.45 to 11.15 hrs.High Throughput Manufacturing for BulkHeterojunction PVsMarkus Scharber, Head of Materials Group, Konarka 11.15 to 11.45 hrs.Managing JGrowth in the Production of Thin Films(To be confi rmed.)Dr. Immo Kotschau, Director of Research and Development,Centrotherm GmbH 11.45 to 12.30 hrs.End to End Mass Production of Silicon Thin FilmModulesDetlev Koch, Head of BU Solar Thin Films & Senior Vice President,O C Oerlikon Balzers AG Break – 12.30 to 14.00 hrs.Afternoon SessionMEMS/MOEMS14.00 to 14.30 hrs.Market Trends and Technical Advances in M(O)EMSDr. Eric Mounier, Manager for MEMS & Optoelectronics andMicronews Chief Editor, Yole Développement14.30 to 15.00 hrs.Inorganic/Organic Hybrid Polymers (ORMOCER) forOptical InterconnectsDr. Michael Popall, Head of Microsystems and Portable PowerSupply, Fraunhofer ISC15.00 to 15.30 hrs.Future MOEMS and Photonic MicrosystemsDr. Thomas Hessler, Director Axetris, Leister Process Technologies15.30 to 16.15 hrs.Innovations in MOEMS product developmentProf. Hubert Karl, Director, Fraunhofer IPMSWednesday 9 AprilMorning Session Multimedia, Displays and Lighting 10.15 to 10.45 hrs.Plasmonics for Photonics: Challenges and Opportunities Ross Stanley, Section Head: MOEMS & Nanophotonics, CSEM 10.45 to 11.15 hrs.Photonic Microsystems for Displays Edward Buckley, VP Business Development, Light Blue Optics Ltd.11.15 to 11.45 hrs.Matrix-Beam – the antiglaring LED-high beam Benjamin Hummel, Research for Concept Lighting T echnologies, Audi 11.45 to 12.30 hrs.High Brightness OLEDs for Next Generation LightingPeter Visser, Project Manager, OLLA Project, The Netherlands Break –12.30 to 14.00 hrs.Photonics Europe 2008 · /pe · info@ · TEL: +44 29 2089 4747 7Thursday 10 AprilMorning SessionImaging10.15 to 10.45 hrs.High Resolution Imaging detectors for invisiblelight –Development and IndustrialisationHans Hentzell, CEO, Acreo10.45 to 11.15 hrs.(Presentation to be confi rmed.)11.15 to 11.45 hrs.Raman Spectroscopy, Raman Imaging and FutureTrendsSopie Morel, Sales Manager, Molecular & Microanalysis Division,HORIBA Jobin Yvon 11.45 to 12.30 hrs.World Markets for Lasers and Their Application Steve Anderson, Associate Publisher/Editor-in-Chief,Laser Focus World Break – 12.30 to 14.00 hrs. Afternoon SessionBiomedical and Healthcare Photonics 14.00 to 14.30 hrs.Photonic Systems for Biotechnology Research Karin Schuetze, Director of R&D, Carl Zeiss Microimaging 14.30 to 15.00 hrs.Photonics 4 Life Prof. Jeürgen Popp, Director, IPHT Germany 15.00 to 15.30 ser System Development for Biophotonics Chris Dorman, Managing Director, Coherent Scotland15.30 to 16.15 hrs.Supercontinuum Light - a paradigm shift in lasersources for biophotonicsJakob Dahlgren Skov, CEO, Koheras Husain Imam, Business Development Manager, Koheras Industrial Perspectives ProgrammeWednesday 9 April Afternoon Session OPERA 2015: European Photonics - Corporate and Research Landscape 13.30 to 13.45 hrs.Optics and Photonics in the 7th Framework ProgrammeGustav Kalbe, Head of Sector - Photonics, Information Society andMedia, Directorate General, European Commission 13.45 to 14.00 hrs.OPERA 2015: Aims, Results and link to Photonics 21Markus Wilkens, VDI 14.00 to 14.20 hrs.European Photonics Industry Landscape Bart Snijders, TNO 14.20 to 14.40 hrs.European Photonics Research Landscape Marie-Joëlle Antoine, Optics Valley 14.40 to 15.00 hrs.Resources for Photonics Development Peter Van Daele, IMEC Break – 15.00 to 15.15 hrs. 15.15 to 15.35 hrs.Towards the Future on Optics and Photonics ResearchDr. Eugene Arthurs, SPIE Europe (UK)15.35 to 16.15 hrs.Strategic Opportunities for R&D in EuropeMike Wale, Bookham, UK16.15 to 16.45 hrs.A Sustainable Business Model for Optics andPhotonicsDavid Pointer, Managing Director, Point Source (Pending)16.45 to 17.15 hrs.Final Open DiscussionChaired by: Gustav Kalbe, Head of Sector - Photonics, InformationSociety and Media, Directorate General, European Commission8Photonics Europe 2008 · /pe · info@ · TEL: +44 29 2089 4747Photonics Innovation Village Tuesday to Thursday during Exhibition HoursThe Photonics Innovation Village will showcase the latest projects and breakthroughs from optics-photonics researchers at universities, research centres and start-up companies. This is a great opportunity to see how EU R&D and project funds are being used by some of the great young innovators in Europe.A window on creative products developed by universities and research centres. Under the patronage of the European Commission, fi fteen entrants from across Europe complete to win categories ranging from Best Marketability to Best Design, Best Technology, and Best Overall Product.Low power remote sensing system Y. A. Polkanov, Russia (Individual work)New approach is based on use of a low-power radiation source with specifi ed gating, when time of source radiation interruption is equal to a pulse duration of ordinary lidar. We propose to reconstruct the average values of these characteristics over the parts commensurable with the sounding path length. As scanning systems is offered with speed of circular scanning is determined by time of small linear moving of a laser beam. It allows to predict a reduction of the meteorological situation stability from an anticipatory change of the revealed structure character of optical heterogeneities of a atmosphere ground layer atmosphere.Point of care sensor for non-invasive multi-parameter diagnostics of blood biochemistry Belarusian State University, Belarus; Ruhr-Universität-Bochum, Germany; Second Clinical Hospital, Belarus Compact fi bre optical and thermal sensor for noninvasive measurement of blood biochemistry including glucose, hemoglobin and its derivatives concentrations is developed as a prototype of the point-of-care diagnosticdevices for cardiologic, tumour and diabetic patients. Integrated platform for data acquisition, data processing and communication to remote networks has been developed on the pocket PC.Polarization-holographic gratings and devices on their basisLaboratory of Holographic Recording & Processing of Information, Institute of Cybernetics, GeorgiaWe have developed the technology of obtaining of polarization-holographic gratings that have anisotropic profi le continuously changing within each spatial period and also the technology of obtaining of polarization-holographic elements on the basis of such gratings. Special highly effective polarization-sensitive materials developed by us are used for obtaining such gratings and elements. We can present samples of gratings and elements and give a demonstration of their work.Ultra-miniature omni-view camera moduleImage Sensing group of the Photonics Division of CSEM (Centre Suisse d’Electronique et de Microtechnique), SwitzerlandA live demonstration with a working prototype of a highly integrated ultra-miniature camera module with omni-directional view dedicated to autonomous micro fl ying devices is presented.Femtosecond-pulse fi bre laser for microsurgery and marking applicationsMultitel, BelgiumMultitel presents a new prototype of an all-fi bred femtosecond amplifi ed laser. The device has been specifi cally developed for micromachining and microsurgery applications and operates at 1.55µm, which corresponds to a high absorption peak of water (molecule contained in large quantity in living tissue and cells). Since no free-space optics is used for pulse compression or amplifi cation the prototype is compact and very stable. Moreover, the seed laser source has a high repetition rate therefore enabling multiphoton absorption applications and use in multi-pulse and burst modes.Flexible artifi cial optical robotic skinsDepartment of Applied Physics and Photonics (VUB-TONA) and Robotics & Multibody Mechanics Research Group (VUB-R&MM) of the Vrije Universiteit Brussel, Belgium; Thin Film Components Group (UG-TFCG) and Polymer Chemistry & Biomaterials Research Group (UG-PBM) of the Universiteit Gent, BelgiumWe will present a paradigm shifting application for optical fi bre sensors in the domain of robotics. We propose fi bre B ragg gratings (FB Gs) written in highly-birefringent microstructured optical fi bres integrated in a fl exible skin-like foil to provide a touch capability to a social pet-type robot for hospitalized children named “Probo”. The touch information is complementary to vision analysis and audio analysis and will be used to detect where Probo is being touched and to differentiate between different types of affective touches such as tickling, poking, slapping, petting, etc.Co-Sponsored by: Location: Galleri de Marbre Under the patronage of the European Commission, Photonics Unit Join us for the Photonics Innovation Village Awards 2008 which will take place on Wednesday, 9th April 2008, from 17.00 hrs. in the Galerie de Marbre.3D tomographic microscopeLauer Technologies, FranceThe 3D tomographic microscope generates 3D high-resolution images of non-marked samples. The demonstration will show 3D manipulation of images obtained with this microscope.Polar nephelometerInstitute of Atmospheric Optics of Tomsk, RussiaMaterial comprising a matrix, apatite and at least one europium composite compound with particle medium sizes more 4-5 micron. The composition for the production of the material comprises (wt. %) apatite 0.01-10.0; composite compound. 0.01-10.0, and the balance is a matrix-forming agent, such as a polymer, a fibre, a glass-forming composition, or lacquer/adhesive-forming substance.High speed Stokes portable polarimeterMIPS Laboratory of the Haute Alsace University, FranceThe implementation of an imaging polarimeter able to capture dynamic scenes is presented. Our prototype is designed to work at visible wavelengths and to operate at high-speed (a 360 Hz framerate was obtained), contrary to commercial or laboratory liquid crystal polarimeters previously reported. It has been used in the laboratory as well as in a natural environment with natural light. The device consists of commercial components whose cost is moderate. The polarizing element is based on a ferroelectric liquid crystal modulator which acts as a half-wave plate at its design wavelength.Diffractive/refractive endoscopic UV-imaging system Institut für Technische Optik (ITO) of the University of Stuttgart, GermanyWe present a new optical system with an outstanding high performance despite of demanding boundary conditions of endoscopic imaging to enable minimal invasive laser-based measurement techniques. For this purpose the system provides a high lens speed of about 10 times the value of a conventional UV-endoscope, a multiple broad band chromatic correction and small-diameter but wide-angle access optics. This was realized with a new design concept including unconventional, i.e. diffractive components. An application are UV-LIF-measurements on close-to-production engines to speed up the optimization of the combustion and produce aggregates with less fuel consumption and exhaust gases like CO2.Light-converting materials and composition: polyethylene fi lm for greenhouses, masterbatch, textile, sunscreen and aerosolUsefulsun Oy, Finland; Institute Theoretical and Experimental Biophysics Russian Academy of Sciences, RussiaThe composition for the production of the material comprises (wt. % ) composite compound (inorganic photoluminophore particles with sizes 10-800nm) -0.01-10.0; coordination compound of metal E (the product of transformation of europium, samarium, terbium or gadolinium ) - 0,0-10,0 and the balance is a matrix-forming agent, such as, a polymer, a fi ber, a glass-forming composition or gel, aerosol, lacquer/adhesive-forming substance. The present invention relates to composite materials, in particular to light-converting materials used in agriculture, medicine, biotechnology and light industry.HIPOLAS - a compact and robust laser sourceCTR AG (Carinthian Tech Research AG), AustriaThe prototype covers a robust, compact and powerful laser ignition source for reciprocating gas and petrol engines that could be mounted directly on the cylinder.We have developed a diode pumped solid-state laser with a monolithic Neodymium YAG resonator core. A ring of 12 high power laser diodes pumps the resonator. Due to the adjustment-free design, the laser is intrinsically robust to environmental vibrations and temperature conditions. With overall dimensions of Æ 50 x 70 mm the laser head is small enough to be fi tted at the standard spark plug location on the cylinder head. The dimensions can be reduced for future prototypes. OLLA OLED lighting tile demonstratorOLLA project-consortiumOLED technology is not only a display technology but also suited for lighting purposes. The OLLA project has the goal to demonstrate viability of OLED technology for general lighting applications. The demonstrator tile shown here combines the current results of the project : a large sized (15x15cm2) white OLED stack with high effi cacy (up to 50 lm/W), combined with long lifetime (>10.000 hours).During Photonics Europe, we will show several OLEDs tiles in different colors. The demonstrators are made by the OLLA project-consortium members. The large OLED demonstrator tile was fabricated on the inline tool at Fraunhofer IPMS in Dresden.Analyze-IQNanoscale Biophotonics Laboratory, School of Chemistry,and Machine Learning / Data Mining Group, Department ofInformation Technology, National University of Ireland, Galway, IrelandAnalyze-IQ is the next generation spectral analysis software tool for optical and molecular spectroscopies such as Raman, Mid-IR, NIR, and Fluorescence. The Analyze-IQ software is based on patented machine-learning algorithms and a model based approach in which the software learns to recognise the relevant information in complex mixtures from sample spectra. It then uses these models to rapidly and accurately identify or quantify unknown materials such as narcotics and explosives, in complex mixtures commonly found in law-enforcement and industrial applications.Micro-optical detection unit for lab-on-a-chipDepartment of Applied Physics and Photonics (VUB-TONA) of the Vrije Universiteit Brussel, BelgiumWe present a detection unit for fl uorescence and UV-VIS absorbance analysis in capillaries, which can be used for chromatography. By usinga micro-fabrication technology (Deep Proton Writing) the optics aredirectly aligned onto the micro-fl uidic channel. This integration enables the development of portable and ultimately disposable lab-on-a-chip systems for point-of-care diagnosis. We will explain the working principle of our detection system in a proof-of-concept demonstration set-up while focusing on some specifi c applications of micro-fl uidics in low-cost lab-on-a-chip systems.Photonics Innovation Village。

PHOTON RTUniversal Scanning SpectrophotometerOperation ManualPKTH.033.000.0001IMPORTANT NOTICECopyright InformationThis document contains proprietary information that is protected by copyright. All rights are reserved. Neither the whole document nor any part of this document may be reproduced in any form or by any means or translated into any language without the prior and written permission of EssentOptics Ltd. Copyright © 2012-2016 EssentOptics Ltd.TrademarksAll brand names, trademarks, etc. used in this document, even when not specifically marked as such, are protected by law. EssentOptics and PHOTON RT are trademarks of EssentOptics Ltd.Contents1 SAFETY MEASURES (4)2 DESCRIPTION AND OPERATION OF PHOTON RT SPECTROPHOTOMETER (5)2.1 P URPOSE (5)2.2 P RODUCT S PECIFICATIONS (6)2.3 C OMPLETE SET OF SPECTROPHOTOMETER (6)2.4 C ONFIGURATION OF SPECTROPHOTOMETER (7)2.5 M ARKING AND SEALING (9)2.6 P ACKING (9)3 INSTALLATION (10)3.1 P REPARING FOR OPERATION (10)3.2 P HOTON S OFT I NSTALLATION (11)3.2.1 PC REQUIREMENTS (11)3.2.2 S OFTWARE INSTALLATION (11)3.3 O PERATION OF THE SPECTROPHOTOMETER (12)3.3.1 M EASUREMENT OF TRANSMITTANCE. (13)3.3.2 M EASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE. (14)3.3.3 M EASUREMENT OF ABSORPTANCE SPECTRA (15)3.3.4 P OLARIZATION-DEPENDENT MEASUREMENTS AT VARIABLE ANGLES IN PS MODE. (16)3.3.5 T RANSMITTANCE MEASUREMENT OF THICK SAMPLES AT HIGH ANGLES OF INCIDENCE. (18)3.3.6 M EASUREMENT OF COMPLEX REFRACTIVE INDEX AND LAYER THICKNESS (19)3.3.7 B ATCH MEASUREMENTS (21)3.3.8 V ERIFICATION OF WAVELENGTH CALIBRATION OF THE SPECTROPHOTOMETER (22)3.4 P HOTON S OFT S OFTWARE (24)3.4.1 C ONTROL COMMANDS (24)3.4.2 S ETTINGS OF MEASURING PARAMETERS (26)3.4.3 S PECTRAL GRAPHS (27)3.4.4 S AVING OF SPECTRA (28)3.4.5 O PTICAL DENSITY (29)3.4.6 K INETIC MEASUREMENT (29)3.4.7 P RINTING OF REPORT (32)3.4.8 B EAM DISPLACEMENT CALCULATOR (36)3.4.9 M EASUREMENT OF COMPLEX REFRACTIVE INDEX AND LAYER THICKNESS. (37)3.4.10 M ETHODS (39)3.4.11 B ATCH MEASUREMENTS (40)3.4.12 I NTERFACE SETTINGS (44)4 MAINTENANCE AND REPAIRS (46)4.1 R EPLACEMENT OF LIGHT SOURCES (46)4.1.1 R EPLACEMENT OF HALOGEN LAMP (46)4.1.2 R EPLACEMENT OF DEUTERIUM LAMP (48)5 STORAGE (50)6 TRANSPORTATION (50)7 UTILIZATION (50)8 ACCEPTANCE CERTIFICATE (51)9 PACKING CERTIFICATE (52)10 WARRANTY (53)11 APPENDIX 1. PRODUCT SPECIFICATION (54)12 APPENDIX 2. COMPLETE SET OF SPECTROPHOTOMETER (56)13 APPENDIX 3. WAVELENGTH CALIBRATION TABLE (57)1Safety measuresThe spectrophotometer complies with the safety standard IР STB 14254-96 standard.Prior to the operation, read the safety rules and regulations for electric equipment carefully and follow the necessary instructions for operation of the spectrophotometer. One should be clearly aware of danger of hazardous internal and external voltages.CAUTION!It is PROHIBITED to operate the spectrophotometer with the removed housing.It is PROHIBITED to operate the spectrophotometer after ingress of water.It is PROHIBITED to operate the spectrophotometer without proper grounding.2Description and operation of Photon RT spectrophotometer2.1PurposeThe Photon RT universal scanning spectrophotometer (further referred to as spectrophotometer) is designed to measure optical characteristics of absolute specular reflectance, transmittance, absorptance, and optical density of planar optical samples with thin film coatings at variable angles and in the polarized light.The spectrophotometer is developed on the basis of the Czerny-Turner monochromator. The spectrophotometer is intended for operation in laboratory conditions in accordance with the following requirements:∙ambient temperature – from +10 0С to +28 0С;∙relative humidity – below 80 % at the temperature + 25 оС;∙atmospheric pressure – from 84 kPa to 106.7 kPa∙proper grounding at the connection point of spectrophotometer and computer2.2Product SpecificationsSee Appendix 1for specifications of your individual spectrophotometer.2.3Complete set of spectrophotometerSee Appendix 2 for complete set of your individual spectrophotometer.2.4Configuration of spectrophotometerFigure 2.4.1 shows the spectrophotometer (front view) with an open lid.The lid of the measuring compartment 1 ensures protection against ambient illumination. In the process of measurement a sample is placed on the sample holder 3 of the sample stage 2 and is fastened with clamps 4. When the spectrophotometer is switched on, red-color flickering of indicator light-emitting diode (LED) 7 continues until the end of the spectrophotometer initialization and self-check procedure. When the spectrophotometer is in the off-measuring mode (“ready” mode), flickering of the indicator LED is green. The indicator LED 7 flickers red during the measurement process, and red-yellow during the change of diffraction gratings. The spectrophotometer is switched on and off by switch 6.Photodetector unit 5 is positioned at a supporting holder of the photodetector drive. The drive provides for positioning of photodetectors along the optical axis for the angles from 16˚ to 183˚: in the case of reflectance measuring -synchronously or non-synchronously with the stage rotation, in the case of transmittance measuring - photodetectors are positioned at normal angle of incidence or any angle within 0˚ - 75˚ range selected by the user.Rotation of stage 2 in the horizontal plane around the optical axis is realized from 0˚ to 75˚. Both rotations are executed with 0,10 step.The value of the incidence angle on the measured surface is set in the field «Measuring parameters» (see Subsection 2.4.2). The position of photodetector is adjusted automatically with the measuring mode («TRANSMITTANCE» or «REFLECTANCE») and depending on the rotation angle of sample stage 2. Rotation angles of sample stage 2 and photodetector unit 5 can be also realized independently in the manual mode for measurement of complex prismatic units. The motorized displacement of photodetector unit perpendicular to the axis of the light beam allows measuring the transmittance of thick samples at high angles up to 75˚. Operation of the beam displacement calculator is described in section 2.4.For the adequate measurement of reflectance, the sample’s surface must be pressed to the stage surface. The measuring area is at the opening center of stage 2.1. Lid of measuring compartment;2. Sample stage;3. Holder;4. Clamps;5. Photodetector unit;6. Power switch;7. Indicator LED;Figure 2.4.1 Photon RT spectrophotometer, front view, with open lid.Figure 2 shows a rear view of the spectrophotometer. The rear panel has USB connector 1 for connection of PC, power supply connector 2, and fuse 3 (including the spare fuse inside). Cover 4 of the compartment with light sources is fastened to the side surface of the instrument by screws 5. The procedure for replacement of the light sources is described in Subsection 4.11. USB connector;2. Power supply connector;3. Fuse (including spare fuse inside);4. Cover;5. Screws.Figure 2.4.2 Photon RT spectrophotometer, rear view.2.5Marking and sealingMarking of the spectrophotometer includes:∙brand name (description) of the device;∙manufacturer’s trademark;∙legends for the elements of connection to external devices are given on the rear panel of the spectrophotometer;∙serial number of the tool is provided on the rear panel;∙marking on the shipment package2.6PackingThe spectrophotometer is packed in accordance with the manufacturer’s requirements and specifications.3Installation3.1Preparing for operation1)Open the packing container, take out the operation manual (OM), take out the spectrophotometer. Whentransportation of the spectrophotometer is handled at temperature below 5оС, leave it unpacked for no less than 24 hours.2)Install the spectrophotometer on the solid horizontal surface.3)Check for the set completeness (see Subsection 2.3).4)Inspect the instrument to make sure that there is no mechanical damage.5)Install «PhotonSoft» Software using PC in accordance with Subsection 3.2.6)Provide effective grounding of the spectrophotometer and PC.7)Connect the spectrophotometer to power mains using the power cable.8)Connect the spectrophotometer to PC with the help of USB cable (see Figure 2.4.2).9)Switch-on the spectrophotometer.10)Start «PhotonSoft» Software.IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.3.2PhotonSoft Installation3.2.1PC requirements∙Microsoft Windows XP/ Windows7/Windows 8operating system;∙SVGA monitor with the resolution no less than 1024x768 (optimum 1280х1024) dots;∙Video adapter memory capacity no less than 32Мb (optimum 64Мb) and color depth no less than 16 bit; ∙No less than 128 Мb of memory (RAM);∙Keyboard, mouse-type manipulator;∙Hard disk (HDD) with free capacity no less than 10 Gb.3.2.2 Software installationTo install the Software, perform the following operations:∙make sure the spectrophotometer is NOT connected to PC∙insert the Software CD-disk (or USB-flash) into CD-ROM (or USB port) of PC ;∙start the installation software setup.exe and follow its instructions;∙press the «Next» button in the installation window ;∙press «Next» in the installation window;∙after successful installation of the software, press the «Finish» button in the window;∙find quick start tag of «PhotonSoft» on the desktop of your PC;∙connect the spectrophotometer to PC;The spectrophotometer is ready for operation.3.3Operation of the spectrophotometer3.3.1Measurement of transmittance.∙Switch on the spectrophotometer.∙Start «PhotonSoft» from your desktop.IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the necessary measuring parameters (see Subsection 3.4.1).1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) sample stage angle setting;6) polarization.∙Open the lid and make sure that the optical channel in the measuring compartment has no objects.∙Close the lid.∙Press the button «Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Open the lid. Place a sample to be measured on the sample stage. Close the lid.∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for a transmittance spectrum of the sample.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:∙Staring wavelength: 400 nm;∙Ending wavelength: 1600 nm;∙Sampling pitch: 10 nm;∙Averaging count: 10;∙Smoothing mode: 0;2)Select the wavelength scanning range applicable to the measured sample.3)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.)4)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, or 1000-1600 nm or 1000-3000 nm etc).5)When measurements are conducted over the complete effective wavelength range of thespectrophotometer, it is recommended to perform the baseline calibration directly before measuring the spectrum of the sample.Figure 3.3.1 Transmittance and optical density spectrum.Figure 3 illustrates transmittance and optical density spectrum. The transmittance scale is on the left and the optical density scale is on the right. The optical density graph may be displayed or hidden (see Subsection2.4.4).3.3.2Measurement of absolute specular reflectance.∙Switch on the spectrophotometer.∙Start «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the required measuring parameters (see Subsection 3.4.1)1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) polarization.∙Make sure that the optical channel in the measuring compartment has no objects.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Select «REFLECTANCE» from the drop-down menu to change for measurement of absolute specular reflectance.∙Open the lid. Place a sample to be measured on the sample stage. The coated surface shall be facing the sample stage for measurement of absolute specular reflectance. Close the lid.∙Set the angle for sample stage.∙Press the button«Apply».∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the absolute reflectance spectrum of the sample.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:∙Staring wavelength: 400 nm;∙Ending wavelength: 1600 nm;∙Sampling pitch: 10 nm;∙Averaging count: 10;∙Smoothing mode: 0;2)Select the wavelength scanning range applicable to the measured sample.3)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.4)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, 1000-3000 nm, 1000-1650 nm etc.)5)When measurements are conducted over the complete effective wavelength range of thespectrophotometer, perform baseline calibration directly before measuring the spectrum of the sample.3.3.3Measurement of absorptance spectraThe Photon RT spectrophotometer provides the possibility to measure absorptance spectra of the unknown transparent substrate. The measurement of the absorptance spectra is realized by sequential measurements of transmittance and reflectance, and subsequent processing of the measurement results.∙Switch on the spectrophotometer.∙Start «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Select «TRANSMITTANCE» from the drop-down menu.∙Set the required measuring parameters (see Subsection 3.4.1)1) scanning range;2) sampling pitch;3) averaging count;4) smoothing mode;5) polarization.∙Make sure that the optical channel in the measuring compartment has no objects.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Select «ABSORPTANCE» from the drop-down menu to change for measurement of absorptance.∙Place a sample to be measured on the sample stage.NOTE: One can use the same sample to measure both transmittance and reflectance, if the sample has thickness of 40 mm and above. Otherwise, for reflectance measurementone should prepare and use a 50 wedge sample made of the same material.∙Input the value of the sample thickness in the line “Sample thickness, mm” (See Fig. 3.4.4).∙Press the button«Apply».∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the transmittance spectrum of the sample. After that, thedetectors unit and sample stage will synchronously rotate for reflectance measurement at 80.∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for the internal attenuation DA which represents the value of total internal losses for absorptance and scattering of the signal in the measured sample.3.3.4Polarization-dependent measurements at variable angles in PS mode.The spectrophotometer has built-in high-contrast polarizers that operate unattended. This configuration provides for polarization-dependent measurement of transmittance, absolute specular reflectance at variable angles of incidence, and measurement/calculation of optical constants (refractive index, layer thickness and extinction coefficient).During the PS mode of measurement, the spectrum is measured subsequently for S polarization and for P polarization without any involvement of operator. Next, the (S+P)/2 value of random polarization is calculated and displayed instantly for transmittance or absolute specular reflectance.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Set the required measuring parameters (see Subsection 3.4.1)(1) scanning range;(2) sampling pitch;(3) averaging count;(4) smoothing mode;(5) polarization - PS.(6) slid width∙Open the lid, make sure that the optical channel in the measuring compartment has no objects. Close the lid.∙Press the button«Apply».∙Press the button «CALIBRATION».∙Open the lid. Place a sample to be measured on the sample stage. The coated surface shall be facing the sample table for measurement of reflectance. Close the lid.∙Select «TRANSMITTANCE» or “REFLECTANCE” measurement mode from the drop-down menu. ∙Set the angel for the sample stage.∙Press the button«Apply».∙To start the measuring process, press the button «MEASUREMENT».In the «PS» polarization mode the baseline calibration is performed twice: in «S» position of the polarizer and in «P» position of the polarizer. The displayed spectrum for «S» polarization is dark blue and that for «P» polarization is dark green in color. The calculation of average polarization «(S+P)/2» is performed after completion of subsequent measurements for the spectra associated with «S» and «P» polarizations. The resultant spectrum is displayed in white color on the screen immediately.∙When the process is finished, the screen displays a transmittance or reflectance spectrum at the specified angle of incidence at (S+P)/2 average polarization.IMPORTANT NOTES:1)When starting the instrument on the new day, it is recommended to repeat baseline calibration beforeactual measurements for breaking-in after 30 minutes warm-up time. This ensures small bit adjustments of the moving parts after idle time.Recommended parameters:2)Staring wavelength: 400 nm;3)Ending wavelength: 1600 nm;4)Sampling pitch: 10 nm;5)Averaging count: 10;6)Smoothing mode: 0;7)Select the wavelength scanning range applicable to the measured sample.8)For more precise measurements in UV-VIS or VIS range, set scanning range and run baselinecalibration up to 990 nm. (For example, 180-990 nm or 380-990 nm respectfully.)9)For more precise measurements in IR range, set scanning range and run baseline calibration starting1000 nm. (For example, 1000-3000 nm, 1000-1650 nm etc.)10)W hen measurements are conducted over the complete effective wavelength range of thespectrophotometer, perform calibration directly before measuring the spectrum for a sample.11)S elect the slit width approximately 1.5 times bigger compared to regular (not PS) measurementprocedure. Make sure the maximum signal value does not exceed 65 000 units after baseline calibration (refer to the Signal window of the main interface).Figure 3.3.2 Transmittance spectrum in «PS» mode.Figure 3.3.2 shows a transmittance spectrum of the optical coating at the 45˚ angle of incidence in «PS» mode. The spectra for «S» and «P» polarizations are displayed in darkened colors.3.3.5Transmittance measurement of thick samples at high angles of incidence.When measuring transmittance of thick optical samples at high angles of incidence, the parallel displacement of transmitted beam occurs. The value of beam displacement depends on three factors: angle of incidence, physical thickness of the sample and refractive index of the sample material.The PHOTON RT spectrophotometer offers a possibility for correct transmittance measurement of thick sample at high angles using the built-in “Beam displacement calculator” option (See also Section 3.4.8). The actual value of beam displacement can be within 0-10 mm range.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».IMPORTANT NOTE:After “PhotonSoft” software starts, the instrument runs self-check and initialization procedure of all controlled elements. This may take about 1 minute.It is PROHIBITED to switch off / switch on the instrument, close / open the software or activate any elements of the software during the self-check and initialization procedure. Otherwise this may damage the instrument.∙The warm-up time of the spectrophotometer shall be no less than 30 minutes.∙Set the required measuring parameters (see Subsection 3.4.1)(1) scanning range;(2) sampling pitch;(3) averaging count;(4) smoothing mode;(5) sample table angle setting(6) polarization - PS.∙Open the lid. Make sure that the optical channel in the measuring compartment has no objects. Close the lid.∙Press the button«Apply».∙Press the button «Calibration» for baseline calibration. When scanning of a spectrum is finished, the screen displays the horizontal spectral graph serving as 100% transmittance level.∙Open the lid. Place a sample to be measured on the sample stage.∙Select desired angle of incidence. Close the lid.∙Select «BEAM DISPLACEMENT CALCULATOR» from the drop-down menu «Tools”. The “Beam displacement calculator” window opens (see Figure 3.4.21).∙In the “Beam displacement calculator” window, fill in appropriate fields “Thickness” (in mm) and “Refractive index” for the measured sample. The angle of sample table is uploaded from the “Sample table angle setting” field (see Figure 3.4.4).∙The value of beam displacement (in mm) is calculated immediately.∙Press the button«APPLY» in the “Beam displacement calculator” window. The value of beam displacement (in mm) will be immediately displayed in the “Detector displacement, mm” field of the “Display options” menu (see Figure 3.4.4).∙Press the button«APPLY» in the “Display options” menu (see Figure 3.4.4).∙Start the measuring process by pressing the button «MEASUREMENT». When the process is finished, the screen displays the graph for transmittance spectra of the sample at a user-selected angle of incidence.∙Change the beam displacement value for “0” in the “Detector displacement, mm” field of the “Display options” menu (see Figure 3.4.4) if no further transmittance measurements of thick samples at highangles of incidence are required.∙Press the button«APPLY» in the “Display options” menu (see Figure 3.4.4).The beam displacement of the detectors can also be realized by setting the check box in the field "Detector autodisplacement" (see. Figure 3.4.3). The following lines become active: "Sample thickness, mm" and "Refractive index n”. The value of the sample thickness and the average refractive index of the sample material for the selected wavelength range shall be indicated in the appropriate fields. After clicking the "Apply" button, the value of detector displacement will be displayed in the "Detector displacement, mm" field. The detectors will immediately move at the calculated value of displacement.3.3.6Measurement of complex refractive index and layer thicknessOptical constants of the material layers are characterized with a number of parameters. Several of them are important for experts involved in optical design of the multilayer coatings – refractive index (n), layer thickness (d) and extinction coefficient (k).The NKD calculation software is designed to calculate the refractive index (n), extinction coefficient (k) and layer thickness (d) of the single homogenous layers on the known substrate using the photometric reverse engineering method. Calculations of optical parameters of the thin film layers is based on measuring the reflectance of the coated substrate in a polarized light (Rp and Rs values) for several angles of incidence. Typically, 3 to 8 angles of incidence are sufficient for correct measurement and calculation. Recommended sampling pitch is from 5 to 20 nm. The wedged substrate (with not less than 5 deg wedge angle) must be used for correct measurement to exclude reflectance from the back surface. BK7 and SiO2 substrates are recommended as test substrates for described measurement. It is necessary to increase the slid with 1,5 times to compensate for decreased signal in the PS measurement mode.∙Switch on the spectrophotometer.∙Start the «PhotonSoft».。