LCD Driver IC
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LCD Driver IC 测试基础OUTLINELCD 显示设备LCD Driver简介LCD Driver的测试LCD Driver 测试的要求和对应方法T6371 简介结论LCD 显示设备·LCD 是当前最有发展前景的显示器件·比较常用的LCD器件为STN（超扭曲型）和TFT（薄膜晶体管型）·有机电致发光（有机EL）器件是成本最低的显示器件，因此也是值得关注的发展方向Mobile (STN,TFT)Note PC(TFT)Game(STN)cellular Phone(STN,TFT)(TFT)LCD 显示设备LCD 工作原理TN/STNTFTS uper-T wisted N ematic 超扭曲向列型LCDT hin F ilm T ransistor 薄膜晶体管型LCD (属于三端有源矩阵型)LCD 显示设备STN 和TFT 显示器件比较表LCD Driver 简介LCD Driver TFT DriverController DriverSource Driver(X)Gate Driver(Y)STN DriverLCD 面板LCD Driver ICLCD Driver 简介TFT Panel 和Driver之相对应，可以设为ON或OFF状态（示例电压：35V）通过对三原色（RGB）进行控制而实现丰富1024 x 3 ÷384pin ＝8DUT Gate Driver 芯片的使用数：768 ÷256pin ＝3DUTRGB TFT Source Driver 的特点①高速逻辑部分(超过150MHz）②高速低电压接口电路③大量的输出pin(480pin)④模拟的输出信号（6或8位的DAC)LCD Driver 简介TFT Panel和DriverController Driver输出pin的数目：单色驱动芯片需要120 + 160 = 280pin( 彩色驱动芯片需要360 + 160 = 520pin )TFT/TFDSTNController DriverController Driver的特征:大量的输出pin（超过700pin）COG typeTCP typeSystem module(All in one)高色彩度高速通信( 播放动画)High-pin count, 1Chip, Color360(120 x R G B) + 160 Pixels396(132 x R G B) + 162528(176 x R G B) + 208 or 228720(240 x R G B) + 320测试项目Tester 部件OPEN/SHORTFunction ----Per-pin LCD comparator(1280ch max)High Voltage compare capability(+/-40V)VIH/VILSTATIC IDD(IDDq)----High Speed IDDq testing by RVS(Fast settling & Logic synchronize)DYNAMIC IDD----DPS has average current measurement capabilityInput & Output Leakage ----HVDCVOH/VOLDC-DC Level ----MDGT,HVDCVLCD VLC1-4 Level ----MDGT,HVDCD/A Converter ----MDGTOSC frequency ----Every Logic pins have frequency measurement capability Drive Current ----MDGT & per-pin current loadAC Function----Per-pin LCD comparator(1280ch max)数字测试部件高精度基准电压源（RVS ）高精度Digitizer （MDGT ）P1P2P3P4P383P384用于补正的基准电源数字信号LCD Driver 输出R1R2R16示例芯片：256色384输出pin点数＝256（颜色深度）ｘ384（pin 数）ｘ2(Dot 翻转）＝196,608<输出偏差测试>对每一个色阶中各管脚参差不齐的输出电压进行测试000102输入码commonLCD 输出偏差特性FFV90020406080A0C0E0FF V0V1V2V3V4V5V6V9输入码VDDVSScommonLCD 输出电压特性（256色Dot翻转）输出pin 多于700低振幅驱动电压降低测试时间大于150MHz改善测试环境High speed logicLow amplitude logic I/FHigh pin count(LCD output)Test timeTesting EnvironmentSource DriverController Driver, Source DriverController Driver, Source DriverController Driver, Source DriverHigh speed logicLow amplitude logic I/FHigh pin count(LCD output)Test timeTesting EnvironmentSource DriverController Driver, Source DriverController Driver, Source DriverController Driver, Source DriverSolution #1(测试频率125/250MHz)Solution #2(最多1280pin)(200mVp -p 驱动电压)Solution #3(Multi Channel Digitizer& Parallel test)Solution #4(viewpoint LCD, Siteseer ,TIM)T est I ntegration M anagerT6371 LCD Driver 测试系统1250mm1800mm950mm650mm720mm 800mm1)SpecificationsT6371：125 MHz （Pin Mux250MHz）T6361：62.5 MHz （Pin Mux125MHz）T6331：31.25MHz （Pin Mux62.5MHz）I /O ：128ch or 256chLCD ：512ch / 768ch / 1024ch / 1280ch 2)WeightBody ：850kg (Max)Test Head ：260Kg (450kg include TH-stand）3)Power Consumption8.6KVA（512ch）～14KVA（1280ch）: Same as T6500 Unit: T6300 Original UnitT6371 LCD Driver 测试系统高速逻辑功能部件和低振幅驱动Test Rate 125/250MHz I/O channelMAX256ch Driver/Comparator Skew +/-250pS O ver-all T iming A ccuracy +/-500pS T6371 has the enough capability for logic speed.Solution #1T6371/61/31AmplitudeMin 200mVp-pRSDS already done.RSDS I/F is Logic amplitude(0.2V, 0.1V)(R educed S wing D ifferential S ignaling)T6371 LCD Driver 测试系统T6371 LCD Driver 测试系统RSDS Waveforms(270Mbit Data Rates)1.3VCLOCK1.1V1.3VData1.1V3.7nsT6371 LCD Driver 测试系统250M b it 50mV Waveforms 26mV/div1.225V1.175V4.0ns2nS/div2 DUT Parallel test (640x640)2 DUT Parallel test (512x512)2 DUT Parallel test (384x384)T6371 has the enough LCD pin.(Max 1280ch )T6371 has the capability of 2 DUT parallel test.(600pin LCD output device)4 DUT Parallel test(256x256)Solution #2T6371 LCD Driver 测试系统High Pin countSupported Test Mode1DUT test (1280x1280)1 Testhead contain 1280chReduce test timeSHMOO PlotPattern EditorWafer Map Data LogOscilloscopeLogic AnalyzerViewpoint LCDSolution #4-Wave Scope tool -Solution #4Viewpoint LCD 图形聚焦功能和放大缩小功能波形可以层叠显示（Over lay 功能）Waveform DataH side limit dataＬside limit data1. F_idd.alg ：Dynamic Reference Power Current Test (Keep PG running)–For RVS-2. Function_OneVector_ND1：Function Test 3. LogicMeasCurrent_Active ：DC Test (VSIM)4. LogicPinCon_DC_ND1.alg ：Contact Test5. MeasIdd_ND1.alg ：Dynamic Power Current Test6. MeasIdd_avr_ND1.alg ：Average Power Current Test7.kaicho.alg ：Gradation Test8.MeasAC2_ND1：AC TestTiming chart editorFlow editorSolution #4Siteseer LCDCCD<Prober>P8-XL UF200S EG4090<Handler>AHM-861ET-1030T6371 LCD Driver 测试系统Docking<MJC><JEM>T6371 LCD Driver 测试系统Universal Probe CardT6371 LCD Driver 测试系统OLED Test Option OLED 选件板块图LCD Pin-card(128ch x 6 = 768ch : Max)结论•LCD是极具发展前景的显示器件•LCD Driver是LCD显示器中非常关键的部分，它将决定显示器的响应时间、画面解析度、色彩深度和对比度等重要指标•LCD Driver芯片的测试对测试系统有诸如：高频（>150MHz）、低振幅、大量LCD输出引脚以及缩短测试时间等等的要求•Advantest的T63XX系列是高性能的LCD Driver测试系统，全球的知名LCD Driver生产厂商都是使用其进行产品测试的•我们拥有尖端的芯片测试设备和测试技术，同时非常希望与在座的各位交流合作，为促进中国半导体产业的发展提供最佳的技术支持。
