STK2N80中文资料
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STK2N80N -CHANNEL ENHANCEMENT MODEPOWER MOS TRANSISTORs TYPICAL R DS(on)=5Ωs AVALANCHE RUGGED TECHNOLOGY s 100%AVALANCHE TESTEDs REPETITIVE AVALANCHE DATA AT 100o C s LOW INPUT CAPACITANCE s LOW GATE CHARGEsAPPLICATION ORIENTED CHARACTERIZATIONAPPLICATIONS s HIGH CURRENT,HIGH SPEED SWITCHING s SWITCH MODE POWER SUPPLIES (SMPS)s CONSUMER AND INDUSTRIAL LIGHTINGINTERNAL SCHEMATIC DIAGRAMTYPE V DSS R DS(on)I D STK2N80800V<7Ω2.1A123SOT-82SOT-194(option)December 1996ABSOLUTE MAXIMUM RATINGSSymbol ParameterValue Unit V D S Drain-source Voltage (V GS =0)800V V DG R Drain-gate Voltage (R GS =20k Ω)800V V GS Gate-source Voltage±20V I D Drain Current (continuous)at T c =25o C 2.1A I D Drain Current (continuous)at T c =100o C 1.3A I D M (•)Drain Current (pulsed)9.6A P tot Total Dissipation at T c =25o C 70W Derating Factor 0.56W/o CT stg Storage Temperature-65to 150o C T jMax.Operating Junction Temperature150oC(•)Pulse width limited by safe operating area1231/10THERMAL DATAR thj-cas e R thj-amb R thj-ambT l Thermal Resistance Junction-case MaxThermal Resistance Junction-ambient MaxThermal Resistance Case-sink TypMaximum Lead Temperature For Soldering Purpose1.78800.7275o C/Wo C/Wo C/Wo CAVALANCHE CHARACTERISTICSSymbol Parameter Max Value UnitI A R Avalanche Current,Repetitive or Not-Repetitive(pulse width limited by T j max,δ <1%)2.1AE AS Single Pulse Avalanche Energy(starting T j=25o C,I D=I AR,V D D=25V)80mJE AR Repetitive Avalanche Energy(pulse width limited by T j max,δ <1%)2.8mJI A R Avalanche Current,Repetitive or Not-Repetitive(T c=100o C,pulse width limited by T j max,δ <1%)1.3AELECTRICAL CHARACTERISTICS(T case=25o C unless otherwise specified)OFFSymbol Parameter Test Conditions Min.Typ.Max.Unit V(BR)DSS Drain-sourceBreakdown VoltageI D=250µA V G S=0800VI DS S Zero Gate VoltageDrain Current(V GS=0)V DS=Max RatingV DS=Max Rating x0.8T c=125o C25250µAµAI G SS Gate-body LeakageCurrent(V D S=0)V GS=±20V±100nA ON(∗)Symbol Parameter Test Conditions Min.Typ.Max.Unit V G S(th)Gate Threshold Voltage V DS=V GS I D=250µA234V R DS(on)Static Drain-source OnResistanceV GS=10V I D=1A57ΩI D(on)On State Drain Current V DS>I D(on)x R D S(on)maxV GS=10V2.1A DYNAMICSymbol Parameter Test Conditions Min.Typ.Max.Unitg fs(∗)ForwardTransconductanceV DS>I D(on)x R D S(on)max I D=1A 1.2 1.9SC iss C oss C rss Input CapacitanceOutput CapacitanceReverse TransferCapacitanceV DS=25V f=1MHz V G S=046055226007030pFpFpFSTK2N80 2/10ELECTRICAL CHARACTERISTICS(continued)SWITCHING ONSymbol Parameter Test Conditions Min.Typ.Max.Unitt d(on) t r Turn-on TimeRise TimeV DD=400V I D=1.5AR G=50ΩV GS=10V(see test circuit,figure3)38425057nsns(di/dt)on Turn-on Current Slope V DD=640V I D=2AR G=50ΩV GS=10V(see test circuit,figure5)160A/µsQ g Q gs Q gd Total Gate ChargeGate-Source ChargeGate-Drain ChargeV DD=640V I D=2A V GS=10V3161440nCnCnCSWITCHING OFFSymbol Parameter Test Conditions Min.Typ.Max.Unitt r(Vof f) t ft c Off-voltage Rise TimeFall TimeCross-over TimeV DD=640V I D=2AR G=50ΩV GS=10V(see test circuit,figure5)70251089032140nsnsnsSOURCE DRAIN DIODESymbol Parameter Test Conditions Min.Typ.Max.UnitI S D I SDM(•)Source-drain CurrentSource-drain Current(pulsed)2.19.6AAV S D(∗)Forward On Voltage I SD=2.1A V GS=02Vt rr Q rr I RRM Reverse RecoveryTimeReverse RecoveryChargeReverse RecoveryCurrentI SD=2A di/dt=100A/µsV DD=100V T j=150o C(see test circuit,figure5)92018.440nsµCA(∗)Pulsed:Pulse duration=300µs,duty cycle1.5%(•)Pulse width limited by safe operating areaSafe Operating Area Thermal ImpedanceSTK2N803/10Derating CurveTransfer CharacteristicsStatic Drain-source On Resistance Output Characteristics TransconductanceGate Charge vs Gate-source VoltageSTK2N80 4/10STK2N80 Capacitance Variations Normalized Gate Threshold Voltage vsTemperatureNormalized On Resistance vs Temperature Turn-on Current SlopeCross-over TimeTurn-off Drain-source Voltage Slope5/10STK2N80Switching Safe Operating Area Accidental Overload AreaSource-drain Diode Forward CharacteristicsFig.1:Unclamped Inductive Load Test Circuits Fig.2:Unclamped Inductive Waveforms 6/10Fig.4:Gate Charge Test CircuitFig.5:Test Circuit For Inductive Load Switching And Diode Recovery TimesFig.3:Switching Times Test Circuits For Resistive LoadSTK2N807/10DIM.mminch MIN.TYP.MAX.MIN.TYP.MAX.A 7.47.80.2910.307B 10.511.30.4130.445b 0.70.90.0280.035b10.490.750.0190.030C 2.42.70.040.106c1 1.20.047D 15.70.618e 2.20.087e3 4.40.173F 3.80.150H2.540.100F AHBD e3eb1c1CbSOT-82MECHANICAL DATAP032ASTK2N808/10DIM.mm inch MIN.TYP.MAX.MIN.TYP.MAX.A 7.47.80.2910.307B 10.511.30.4130.445b 0.70.90.0280.035b10.490.750.0190.030C 2.42.70.0940.106c1 1.20.047c2 1.30.051D 60.236e 2.20.087e3 4.40.173F 3.80.150H 2.540.100P 45°(typ.)S 40.157S120.079T0.10.004FAHBDe3eb1c2CbPTC1SS 1SOT-194MECHANICAL DATAP032BSTK2N809/10STK2N80Information furnished is believed to be accur ate and reliable.Howev er,SGS-THOMSON Microelectronics assumes no respon sability for the consequ enc es of use of such information nor for any infringem ent of paten ts or other rights of third parties which may results from its use.No license is grante d by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelec tronics.Specifications mentioned in this publication are subject to chan ge without notice.This publicat ion superse des and replaces all information previou sly supplie d.SGS-THOMSON Microelec tronics produ cts are not autho rized for use as critical compone nts in lifesupport devic es or system s without expres s written app roval of SGS-THOMSON Microelectonics.©1996SGS-THOMSON Microele ctronics-Printed in Italy-All Rights Reserve dSGS-THOMSON Microelectronics GROUP OF COMPANIESAustralia-Brazil-Canada-China-France-Germany-Hong Kong-Italy-Japan-Korea-Malays ia-Malta-Morocco-The Netherlands-Singap ore-Spain-Sweden-Switzerland-Taiwan-Thailand-United Kingdo m-U.S.A.10/10。