Improved Measurement of the Form Factors in the Decay Lambda_c^+ -- Lambda e^+ nu_e
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混响室校准测试李暾,袁智勇,陈水明,何金良,曾嵘(电力系统及发电设备控制和仿真国家重点实验室(清华大学电机系),北京100084)摘 要:混响室用于辐射干扰测试,以其造价便宜、测试重复性好等优点越来越受到广泛的重视,深入开展混响室的优化设计、测试方法、统计理论等方面的研究,可为更规范应用混响室测试方法提供科学的依据。
为研究混响室在使用之前需要进行的校准测试,以评估其性能,并获得几个重要的校准参数,利用清华大学建造的混响室,从场均匀性,天线校准系数,品质因数等方面评价空腔混响室的性能。
进行4次测试的结果表明设计的混响室品质因数高,电场均匀性良好。
测试的重复性非常好,建造的混响室能够很好的用于电磁兼容测试。
关键词:混响室;电磁兼容;校准;品质因数;场均匀性;测试重复性中图分类号:T M867文献标志码:A文章编号:1003-6520(2007)04-0073-04C alibration Test of Reverberation ChamberLI Tun,YUAN Zhi-y ong,CH EN Shui-ming,H E Jin-liang,ZENG Rong(State Key Lab of Control and Sim ulation of Pow er Sy stem s and Generation Equipments(Dept.of Electrical Eng ineering,T sing hua Unive rsity),Beijing100084,China)A bstract:T he Rever ber atio n Chamber(RC)testing ex hibits sev eral competitiv e adv antages ov er ex isting methods, such as the fascina ting lo w cost o f co nstr uction and the enhanced test repeatability.T he application of the rev erbera-tion chamber require s a calibratio n befo re the EM I/EM S te sts.A statistical analy sis o f the calibration data pro ves the fie ld ho moge neity in the wo rking v olume and provide s the necessar y par ame te rs fo r EM I/EM S tests.T he cali-bra tion consists o f tw o parts,field strength and pow er measurements o f the empty chamber and the same measure-ments of the chamber w ith the max imum loading.P rio r to each test,the chamber ha s to be ca libra ted in o rde r to prove that it is no t adversely lo aded by EU T.A pr oto ty pe RC w ith a measurement sy stem is built according to the simulatio n analy sis and calibrated in terms o f I EC standard.T he key parameter s such a s field unifo rmity,quality facto r,the averag e no rmalized elec tric field and the receive antenna calibr ation facto r are analyzed in detail.Fo ur dif-fer ent w o rk volumes and methods of sweeping frequency a re applied.I t is indicated that the key par ameters o f the rever ber atio n chamber have g oo d testing r epeatability and this w ill ensure g ood test repea tability for electromag netic susce ptibility test and elect romag netic emissio n test.T he test results also show that the quality facto r of the rev er-bera tion chamber is up to sever al thousands abo ve the lo west useful frequency.A ll test results reveal that this rev er-bera tion chamber co nfo rms to the specification of the IEC standard and can be used in the co mmon EM C test.Key words:Rev erberation chamber;electromag ne tic co mpatibility;calibratio n;quality facto r;field unifor mity;test repea tability0 引 言混响室是继开阔场、半波暗室、TEM小室之后出现的一种新的电磁兼容测试场地。
Advanced Pressure Module APM Mk.IIThe JOFRA APM Mk.II 2nd generation of pressure modules offers the functionality and flexibility needed to perform pressure calibrations with your multi-purpose or multifunction signal calibrator.Expand the ranges to meet all of your pressure calibration applications by using APM modules.The APM series of pressure modules are compatible with currentAMC910, ASC300, ASC301 or HPC calibrators, and the former AMC900 and APC calibrators. The pressure model span across a wide pressure range and are available for all pressure types. From vacuum to absolute pressure, AMETEK covers any application with the pressure modules to meet your calibration needs.These rugged modules are engineered for in-plant, field, or laboratory use. They are ready-to-use with the JOFRA calibrators and the protocol allows for immediate recognition and use of the module once it is con-nected to the calibrator.The APM Mk.II is temperature compensated from 0 to 50°C / 32 to 122°F for on-site operation. It is a truly superior pressure module for laboratory and field use, bringing laboratory accuracy into the field.When combined with the calibrators and pump systems these modulesmakes powerful calibration tools. And, it is always possible to add mod-ules as the calibration needs changes.FUNCTIONAL SPECIFICATIONSPressure: gauge / compound rangesbar .................................................................-0.96 to 1 or 2 bar .........................................................-0.82 to 7, 20 or 35psi .................................................................-14 to 15 or 30 psi .....................................................-12 to 100, 300 or 500Pressure: gaugebar .................1, 2, 7, 20, 35, 70, 100, 200, 350, 400 or 700 psi ................................15, 30, 100, 300, 500, 1,000, 1,500, ..................................................3,000, 5,000, 6,000, 10,000 Pressure: absolute rangesbar ..............................................................0.025 to 1.1 or 2 bar ......................................................0.07 to 1.1, 3.5, 7, 20 psi ................................................................0.35 to 16 or 30 psi ........................................................1 to 16, 50, 100, 300Pressure: differential rangesmbar ..........................................................±25, ±70 or ±350 psi .................................................................±0.35, ±1 or ±5 Engineering unitsUser selectable ..................................Host calibrators spec. (bar, mbar, MPa, kPa, inHg@0°C, mmHg@0°C, kg/cm2, mmH2O@4˚C, mmH2O@20˚C, psi, inH2O@4˚C, inH2O@20˚C, inH2O@60˚F, cmH2O@4˚C, cmH2O@20˚C)Pressure accuracy ambient temp. (18 to 28°C/65 to 82°F)±25 mbar / 0.35 psi ...........................................±0.10% F.S.±70, 350 mbar / 1, 5 psi ....................................±0.05% F.S. 700 bar / 10k psi ...................±0.025% RDG + 0.015% F.S. All other pressure ranges.........±0.025% RDG + 0.01% F.S. Vacuum ............................................................±0.025% F.S.F.S. (full scale) is the numerical value of the positive pressure range. Accuracy includes hysteresis, nonlinearity, repeatability and reference standard uncertainty, 1 Year typical long-term stability, operated inside the rated temperature span and pressure range.For optimal performance “zero” the unit for gauge/differential measure-ments or enter the reference pressure for absolute measurements.Pressure accuracy ambient temp. (0 to 50°C / 32 to 122°F)±25 mbar / 0.35 psi ...........................................±0.15% F.S.±70, 350 mbar / 1, 5 psi ....................................±0.10% F.S. 700 bar / 10k psi .....................±0.04% RDG + 0.015% F.S. All other pressure ranges...........±0.04% RDG + 0.01% F.S. Vacuum ..............................................................±0.05% F.S.F.S. (full scale) is the numerical value of the positive pressure range. Temperature effect -10 to 0°C / 14 to 32°F ±0.005% F.S./°C.Accuracy includes hysteresis, nonlinearity, repeatability and reference standard uncertainty, 1 Year typical long-term stability, operated inside the rated temperature span and pressure range.For optimal performance “zero” the unit for gauge/differential measure-ments or enter the reference pressure for absolute measurements.OutputPressure resolution ....................................................5 digits Display update ..........................................Host dependable RS232 communication interfaceConnector ..........................................................5 pin LEMO Serial ............0-5 VDC, 9600 baud, 8 data, no parity, 1 stop Protocol ......................................ASCII command languageJOFRA calibrator compabilityJOFRA AMC900* ........................................Signal calibrator JOFRA AMC910 ....................Multifunction signal calibrator ASC300 ...........................Handheld multifunction calibrator ASC301 ..........................Advanced multifunction calibrator APC series* ...........................................Pressure calibrators HPC500 series ......................................Pressure calibrators HPC502 series ......................................Pressure calibrators HPC600 series .........Pressure calibrators w/electrical pump * Obsolete productMedia compatibilityNickel plated brass or 316 stainless steel - see pressure table on page 3.EnvironmentalOperating temperature ...................-10 to 50°C/14 to 122°F Storage temperature ......................-20 to 60°C/-4 to 140°F Ingress protection rating ...............................................IP54Pressure connectionAll calibrators ..............................................1/8” BSP female Adapters to 1/4” NPT male and 1/4” BSP female are included as standard.Pressure overloadOverload alarm ..........“OL” in display at approx. +20% F.S.Power supplyPower supply .................................................Host calibratorInstrument dimensions (LxWxH)APM Mk.II .............................76x45x76 mm / 3.0x1.8x3.0 in APM Mk.II weight (incl. cable) ......................370 g / 13.1 oz APM Mk.II shipping ..........245x180x80 mm / 9.6x7.1x3.1 in APM Mk.II weight, shipping..........................670 g / 23.7 oz MiscellaneousCompliance: EN 61326 : 2006 & CISPR 11, Edition 5.0 - 2009 Class “B”.2 Advanced Pressure Module • APM Mk.IIAPM Mk.II • Advanced Pressure Module 34 Information in this document is subject to change without notice. ©2012, by AMETEK, Inc., . All rights reserved.Pub code SS-APM_MkII Issue 1203AMETEK Test & Calibration InstrumentsA business unit of AMETEK Measurement & Calibration Technologies Division offering the following industry leading brands for test and calibration instrumentation.JOFRA Calibration InstrumentsTemperature CalibratorsPortable dry-block calibrators, precision thermometersand liquid baths. Temperature ranges from-90°C(-130°F) to 1205°C(2200°F). Temperature sensorsfor industrial and marine use.Pressure CalibratorsConvenient electronic systems ranging from -25 mbar to 1000 bar - fully temperature-compensated for problem-free and accurate field use.Signal InstrumentsProcess signal measurement and simulation for easycontrol loop calibration and measurement tasks.M&G Pressure Testers & PumpsPneumatic floating-ball or hydraulic piston dead weight testers with accuracies to 0.015% of reading. Pressuregenerators delivering up to 1,000 bar.Lloyd InstrumentsMaterials testing machines and software from LloydInstruments guarantees expert materials testing solutions. The comprehensive program also covers Texture Analysers to perform rapid, general food testing and detailed texture analysis on a diverse range of foodsand cosmetics. Davenport Polymer Test EquipmentAllows measurement and characterization of moisture-sensitive PET polymers and polymer density.Chatillon Force MeasurementThe hand held force gauges and motorized testers have earned their reputation for quality, reliability and accuracy and they represent the de facto standard forforce measurement.Newage Testing InstrumentsHardness testers, durometers, optical systems andsoftware for data acquisition and analysis.UKAMETEK Calibration Instruments T el +44 (0)1243 833 302***************.uk FranceAMETEK S.A.S.Tel +33 (0)1 30 68 89 40***********************************GermanyAMETEK GmbHTel +49 (0)2159 9136 510*********************DenmarkAMETEK Denmark Tel +45 4816 8000****************USA AMETEK M ansfield & Green Tel +1 (800) 527 9999*******************IndiaAMETEK Instruments India Pvt Ltd.Tel +91 22 2836 4750****************SingaporeAMETEK Singapore Pte Ltd Tel +65 6484 2388****************ChinaAMETEK Inc. - Shanghai Tel +86 21 5868 5111AMETEK Inc. - Beijing Tel +86 10 8526 2111AMETEK Inc. - Guangzhou Tel +86 20 8363 4768**********************.cn• Pressure Module• Adapter fitting for NPT and BSP threads • Communication cable (integrated)• NIST traceable calibration certificate in Bar, Pa and PSiSTANDARD DELIVERYNumber DescriptionSPK-APM-003 APM Mk.II Communication kit for PC.USB to female 5 pin Lemo will supply power for APM Mk.II as well.Fittings to connect APM Mk.II modules with pump systemsSystem ASPK-HPC-008 Fitting APM Mk.II to T-960/T-970 pump System BSPK-HPC-008Fitting APM Mk.II to T-965/T-975 pumpSystem CIncluded fitting Fitting APM Mk.II to T-620 / T-620H pump System DSPK-HPC-004 Fitting APM Mk.II to P016 & P017 pump System ESPK-HPC-004Fitting APM Mk.II to P014 pumpSystem FIncluded fitting Fitting APM Mk.II to T-1 pumpACCESSORIES。
Forging ahead is a concept that resonates with many individuals who are striving for success and personal growth.It embodies the idea of persistently moving forward, overcoming obstacles,and continuously improving oneself.Here are some key points that can be included in an essay about forging ahead in English:1.Definition of Forging Ahead:Begin by defining what it means to forge ahead.It could be described as the act of moving forward with determination,despite challenges and setbacks.2.Importance of Perseverance:Discuss the significance of perseverance in the journey of forging ahead.Perseverance is the key to overcoming difficulties and achieving longterm goals.3.Setting Goals:Explain the role of goalsetting in the process of forging ahead.Setting clear and achievable goals provides direction and motivation.4.Embracing Challenges:Highlight the importance of viewing challenges as opportunities for growth rather than as barriers.This mindset can lead to innovation and learning from mistakes.5.Learning from Failure:Address the idea that failure is not the end but a stepping stone to success.It is through failure that we learn valuable lessons and improve our strategies.6.Adaptability:Discuss the need for adaptability in forging ahead.The ability to adjust to changing circumstances and to think creatively is crucial for progress.7.Support Systems:Mention the role of support systems such as family,friends,and mentors.These networks can provide encouragement,advice,and resources.8.Personal Development:Emphasize the importance of personal development in forging ahead.This includes continuous learning,skill enhancement,and selfreflection.9.Cultivating a Positive Attitude:A positive attitude can be a powerful force in forging ahead.It can help maintain motivation and resilience in the face of adversity.10.Examples of Forging Ahead:Provide reallife examples or case studies of individuals or groups who have successfully forged ahead in various fields,demonstrating the principles discussed.11.Overcoming Procrastination:Discuss strategies for overcoming procrastination,which can be a significant barrier to forging ahead.12.Maintaining Momentum:Offer advice on how to maintain momentum and prevent stagnation in ones journey of forging ahead.13.Conclusion:Conclude the essay by summarizing the key points and reiterating the importance of forging ahead in achieving ones full potential.Remember to structure your essay with a clear introduction,body paragraphs for each point,and a conclusion that ties everything e evidence,anecdotes,and quotes to support your arguments and make your essay engaging and persuasive.。
a r X i v :c o n d -m a t /0401631v 1 [c o n d -m a t .m e s -h a l l ] 30 J a n 2004CondMat 2004Surface Acoustic Waves probe of the p -type Si/SiGe heterostructuresG.O.Andrianov,I.L.Drichko,A.M.Diakonov,and I.Yu.SmirnovA.F.Ioffe Physicotechnical Institute of RAS,194021St.Petersburg,RussiaO.A.Mironov,M.Myronov,T.E.Whall,and D.R.LeadleyDepartment of Physics,University of Warwick,Coventry CV47AL,UK(Dated:February 2,2008)The surface acoustic wave (SAWs)attenuation coefficient Γand the velocity change ∆V /V were measured for p -type Si/SiGe heterostructures in the temperature range 0.7-1.6K as a function of external magnetic field H up to 7T and in the frequency range 30-300MHz in the hole Si/SiGe heterostructures.Oscillations of Γ(H)and ∆V /V (H)in a magnetic field were observed.Both real σ1(H)and imaginary σ2(H)components of the high-frequency conductivity have been determined.Analysis of the σ1to σ2ratio allows the carrier localization to be followed as a function of tem-perature and magnetic field.At T=0.7K the variation of Γ,∆V /V and σ1with SAW intensity have been studied and could be attributed to 2DHG heating by the SAW electric field.The energy relaxation time is found to be dominated by scattering at the deformation potential of the acoustic phonons with weak screening.PACS numbers:73.63.Kv,72.20.Ee,85.50.-nI.INTRODUCTIONFor the first time an acoustic method has been ap-plied in a study of p -type Si/SiGe heterostructures.Since Ge and Si are not piezoelectrics the only way to mea-sure acoustoelectric effects in these systems is a hy-brid method:a SAW propagates along the surface of a piezoelectric LiNbO 3while the Si/SiGe sample is be-ing slightly pressed onto LiNbO 3surface by means of a spring.In this case a strain from the SAW is not transmitted to the sample and it is only the electric field accompanying the SAW that penetrates into the sam-ple and creates currents that,in turn,produce a feed-back to the SAW.As a result,both SAW attenuation Γand velocity V appear to depend on the properties of the 2DHG.SAW-acoustics proves to be an effective probe of heterostructure parameters,especially as it is contactless and does not require the Hall-bar configura-tion of a sample.Moreover,simultaneous measurements of attenuation and velocity of SAW provide a unique possibility to determine the complex AC conductivity,σxx (ω)=σ1(ω)−iσ2(ω),as a function of magnetic field H and SAW frequency ω.Furthermore,the magnetic field dependence of σxx (ω)provides information on both the extended and localized states 1.II.EXPERIMENTAL RESULTSThe absorption Γand velocity shift ∆V/V of the SAW,that interacts with 2DHG in the SiGe channel,have been measured at temperatures T=0.7-1.6K in magnetic fields up to H=7T.DC-measurements of the resistivity compo-nents ρxx and ρxy have also been carried out in magnetic fields up to 11T in the temperature range 0.3-1.3K and have shown the integer quantum Hall effect.The samples were modulation doped Si/SiGe het-erostructures with 2DHG sheet density p =2×1011cm −2and mobility µ=10500cm 2/Vs 2.Fig.1illustrates the field dependences of Γand ∆V/V for the frequency 30MHz at T=0.7K as well as com-ponents of the magnetoresistance.One can see the ab-sorption coefficient and the velocity shift both undergo SdH-type oscillations.FIG.1:Dependences of Γ(H)and ∆V /V (H),f =30MHz,T=0.7K;ρxx and ρxy vs H,T=0.7K.High frequency conductivity σACxx =σ1−iσ2is extracted from simultaneous measurements of Γand ∆V/V ,using eqs.1-5of 1.It turns out,that at T=0.7K and filling factor ν=2(H=4.3T)σ1≃σ2(fig.2).At the same time σ1≫σdcxx .These facts suggest that only some of holes in the 2D-channel are localized,and σACxx is determined by both localized and delocalized holes.For total localization oneneeds σ1≪σ2,σDCxx =03.At ν=3(H=2.9T)localizationeffects are negligible:σ1≃σdcxx >σ2.At T=0.7K we have measured the dependences of Γ(H),∆V/V (H)and σ1(H)on the SAW intensity at2FIG.2:Magneticfield dependences ofσ1(solid),σ2(dashed)(dotted);all at T=0.7K.at f=30MHz andσDCxx30MHz.Fig.3a showsσ1versus P(the RF-sourcepower)for magneticfields of H=2.9T and4.3T.Fig.3billustrates the temperature dependence ofσ1measured inthe linear regime.One can see from these plots thatσ1increases with increasing temperature and SAW power.For delocalized holes in this magneticfield,the ob-served nonlinear effects(Fig.3a)are probably associatedwith carrier heating.One may describe2DHG heating4by means of a carrier temperature T c,greater than thelattice temperature T,provided that the following con-dition is met:τ0<<τcc<<τε.(1)Hereτ0,τcc andτεare the momentum relaxationtime,the carrier-carrier interaction time and the en-ergy relaxation time,respectively.Calculations giveτ0=1.4×10−12s;τcc=6.4×10−11s5;τεwill be dis-cussed below.The carrier temperature T c is determined using SdHthermometry by comparing the dependencesσ1(T)andσ1(P).To characterize heating process one needs to extractthe absolute energy losses as a result of the SAW inter-action with the carriers¯Q=σxx E2=4ΓW,where W isthe input SAW power scaled to the width of the soundtrack,E is the intensity of the SAW electricfield6:|E|2=K232π1+(4πσAC xx2m2ζ(5)D2ac k5B3 can determine the value of the deformation potential asD ac=5.3±0.3eV.The value of D ac calculated from DCmeasurements of phonon-drag thermopower was reportedto be5.5±0.5eV for the same2DHG Si/SiGe sample8.AcknowledgmentsThe work was supported by RFFI,NATO-CLG979355,INTAS-01-084,Prg.MinNauki”Spintronika”.1I.L.Drichko, A.M.Diakonov,I.Yu.Smirnov, Y.M.Galperin,and A.I.Toropov,Phys.Rev.B62, 7470(2000).2T.E.Whall,N.L.Mattey, A.D.Plews,P.J.Phillips, O.A.Mironov,R.J.Nicholas and M.J.Kearney,Appl.Phys. Lett.64,357(1994).3A.L.Efros,ZETF89,1834(1985)[JETP89,1057(1985)]. 4G.Ansaripour,G.Braithwaite,M.Myronov,O.A.Mironov, E.H.C.Parker and T.E.Whall,Appl.Phys.Lett.76,1140 (2000).5Yu.F.Komnik,V.V.Andrievskii,I.B.Berkutov,S.S.Kry-achko,M.Myronov and T.E.Whall,Low Temp.Phys.26609(2000)[Fiz.Nizk.Temp.26,829(2000)].6I.L.Drichko, A.M.Diakonov,V.D.Kagan, A.M.Kreshchuk,T.A.Polyanskaya,I.G.Savel’ev, I.Yu.Smirnov and A.V.Suslov.FTP31,1357(1997) [Semiconductors31,1170(1997)].7V.Karpus,FTP20,12(1986)[Sov.Phys.Semicond.20,6 (1986)].8S.Agan,O.A.Mironov,M.Tsaousidou,T.E.Whall, E.H.C.Parker,P.N.Butcher,Microelectronic Engineering 51-52,527(2000).。
评价量入为出英文作文Cost-benefit analysis is a widely used tool in decision-making processes, particularly in the public sector, where policymakers and government officials are tasked with allocating limited resources to maximize societal benefits. The fundamental premise of cost-benefit analysis is to systematically evaluate the potential consequences of a decision or policy, both in terms of the associated costs and the expected benefits. By quantifying and comparing these elements, decision-makers can make more informed choices that aim to optimize the overall outcome.The primary advantage of cost-benefit analysis is its ability to provide a structured and objective framework for evaluating complex decisions. By breaking down a problem into its constituent parts and assigning monetary values to the various costs and benefits, decision-makers can gain a clearer understanding of the trade-offs involved. This approach helps to minimize the influence of personal biases, emotions, or political considerations, and instead focuses on the tangible impacts of the decision.One of the key strengths of cost-benefit analysis is its flexibility in application. It can be used to assess a wide range of decisions, from large-scale public infrastructure projects to the implementation of new regulations or social programs. By applying a consistent methodology, decision-makers can compare the relative merits of different alternatives and make more informed choices.However, the use of cost-benefit analysis is not without its challenges and limitations. Accurately quantifying and monetizing the costs and benefits of a decision can be a complex and subjective process, particularly when dealing with intangible or long-term impacts. For example, the value of improved public health or environmental preservation may be difficult to measure in purely monetary terms.Another potential issue with cost-benefit analysis is the risk of overlooking or underestimating important factors that are not easily quantifiable. While the analysis may provide a clear numerical comparison of the costs and benefits, it may fail to capture the nuanced social, political, or ethical implications of a decision. This can lead to decisions that prioritize economic efficiency over other important considerations.Furthermore, the reliability of cost-benefit analysis is heavily dependent on the quality and accuracy of the data used in theanalysis. Incomplete or inaccurate information can lead to flawed conclusions, potentially resulting in suboptimal decisions. Additionally, the choice of discount rates, which are used to compare future costs and benefits to their present-day values, can significantly impact the outcome of the analysis.Despite these challenges, cost-benefit analysis remains a valuable tool in the decision-making process. When used judiciously and in conjunction with other forms of analysis, it can provide valuable insights and help to ensure that decisions are made with a clear understanding of the potential consequences.One way to enhance the effectiveness of cost-benefit analysis is to incorporate a more holistic approach that considers a broader range of factors beyond just the monetary costs and benefits. This could involve incorporating qualitative assessments of social and environmental impacts, as well as the consideration of long-term, indirect, or spillover effects. By expanding the scope of the analysis, decision-makers can gain a more comprehensive understanding of the potential consequences of their choices.Additionally, the use of sensitivity analysis, which involves testing the robustness of the results by varying key assumptions or inputs, can help to identify the most critical factors and address the inherent uncertainties in the analysis. This can lead to more informed andnuanced decision-making, where the potential risks and limitations of the cost-benefit analysis are explicitly acknowledged and accounted for.In conclusion, cost-benefit analysis is a valuable tool in the decision-making process, but it should be used with a critical eye and in conjunction with other forms of analysis. By acknowledging its limitations and incorporating a more holistic approach, decision-makers can leverage the strengths of cost-benefit analysis to make more informed and responsible choices that ultimately benefit society as a whole.。
Our Proposed Method:Improving Efficiency and Accuracy in Data Analysis1. IntroductionIn the era of big data, the need for efficient and accurate data analysis methods has be increasingly important. With the massive amount of data generated every day, traditional data analysis techniques have proven to be insufficient in handling the volume andplexity of modern datasets. As a result, there is a growing demand for advanced data analysis methods that can improve efficiency and accuracy. In this article, we will introduce our proposed method for data analysis, which 本人ms to address these challenges and provide a more effective solution for handling big data.2. BackgroundBefore delving into our proposed method, it is essential to discuss the existing limitations of traditional data analysis methods. Many traditional approaches rely on manual data cleaning, preprocessing, and feature extraction, which are time-consuming and error-prone processes. Additionally, the increasing diversity andplexity of modern datasets often render these methods ineffective in capturing the underlying patternsand structures within the data. As a result, there is a pressing need for advanced data analysis methods that can automate these processes, improve efficiency, and enhance the accuracy of results.3. Key ChallengesOne of the key challenges in data analysis is the processing of unstructured and high-dimensional data. Traditional methods often struggle to handle unstructured data such as text, images, and videos, which are prevalent in today's digital environment. Furthermore, high-dimensional data poses significant challenges in terms ofputationalplexity and resource requirements. These challenges highlight the need for a method that can effectively process and analyze unstructured and high-dimensional data while m本人nt本人ning high levels of efficiency and accuracy.4. Our Proposed MethodOur proposed method for data analysis is based on abination of advanced machine learning techniques, feature extraction algorithms, and deep learning models. The method leverages the power of deep learning to automatically extract meaningful features from unstructured data, reducing the manual effortrequired for feature engineering. Additionally, the method incorporates state-of-the-art algorithms for dimensionality reduction, allowing for efficient processing and analysis of high-dimensional data.5. Key FeaturesThe key features of our proposed method include:- Automation of data cleaning and preprocessing: The method automates the process of data cleaning and preprocessing, reducing the manual effort required and improving the consistency and reliability of results.- Feature extraction: Our method utilizes deep learning models to automatically extract relevant features from unstructured data, allowing for a moreprehensive analysis of diverse data types such as text, images, and videos.- Dimensionality reduction: To address the challenges of high-dimensional data, our method incorporates advanced algorithms for dimensionality reduction, enabling efficient processing and analysis of large andplex datasets.6. BenefitsThe adoption of our proposed method offers several benefits, including:- Improved efficiency: By automating data cleaning, preprocessing, and feature extraction, our method significantly reduces the time and effort required for data analysis, leading to increased efficiency and productivity.- Enhanced accuracy: The advanced machine learning and deep learning models integrated into our method enable more accurate analysis and prediction ofplex patterns and structures within the data.- Scalability: Our method is designed to be scalable, allowing for the efficient processing and analysis of large-scale datasets withoutpromising on accuracy or performance.7. Case StudiesTo demonstrate the effectiveness of our proposed method, we conducted several case studies across different dom本人ns, including finance, healthcare, and emerce. In each case study, our method demonstrated superior performance in terms of efficiency, accuracy, and scalability,pared to traditional data analysis methods. The results of these case studies further validate the potential of our method in addressing the challenges of modern data analysis.8. ConclusionIn conclusion, our proposed method for data analysis offers aprehensive and effective solution for handling the challenges of big data. By leveraging advanced machine learning and deep learning techniques, our method is able to automate data cleaning and preprocessing, extract meaningful features from unstructured data, and efficiently process high-dimensional datasets. The adoption of our method promises to improve efficiency and accuracy in data analysis, providing a valuable tool for researchers, analysts, and practitioners in various fields. We believe that our proposed method has the potential to make a significant impact in the future of data analysis and we look forward to further validating its effectiveness through ongoing research and application.。
a r X i v :h e p -e x /0501002v 1 4 J a n 2005CLNS 04/1901CLEO 04-19Improved Measurement of the Form Factors in the DecayΛ+c →Λe +νeJ.W.Hinson,1G.S.Huang,1J.Lee,ler,1V.Pavlunin,1R.Rangarajan,1B.Sanghi,1E.I.Shibata,1I.P.J.Shipsey,1D.Cronin-Hennessy,2C.S.Park,2W.Park,2J.B.Thayer,2E.H.Thorndike,2T.E.Coan,3Y.S.Gao,3F.Liu,3R.Stroynowski,3M.Artuso,4C.Boulahouache,4S.Blusk,4E.Dambasuren,4O.Dorjkhaidav,4R.Mountain,4H.Muramatsu,4R.Nandakumar,4T.Skwarnicki,4S.Stone,4J.C.Wang,4S.E.Csorna,5I.Danko,5G.Bonvicini,6D.Cinabro,6M.Dubrovin,6S.McGee,6A.Bornheim,7E.Lipeles,7S.P.Pappas,7A.Shapiro,7W.M.Sun,7A.J.Weinstein,7R.A.Briere,8G.P.Chen,8T.Ferguson,8G.Tatishvili,8H.Vogel,8M.E.Watkins,8N.E.Adam,9J.P.Alexander,9K.Berkelman,9V.Boisvert,9D.G.Cassel,9J.E.Duboscq,9K.M.Ecklund,9R.Ehrlich,9R.S.Galik,9L.Gibbons,9B.Gittelman,9S.W.Gray,9D.L.Hartill,9B.K.Heltsley,9L.Hsu,9C.D.Jones,9J.Kandaswamy,9D.L.Kreinick,9A.Magerkurth,9H.Mahlke-Kr¨u ger,9T.O.Meyer,9N.B.Mistry,9J.R.Patterson,9D.Peterson,9J.Pivarski,9S.J.Richichi,9D.Riley,9A.J.Sadoff,9H.Schwarthoff,9M.R.Shepherd,9J.G.Thayer,9D.Urner,9T.Wilksen,9A.Warburton,9M.Weinberger,9S.B.Athar,10P.Avery,10L.Breva-Newell,10V.Potlia,10H.Stoeck,10J.Yelton,10K.Benslama,11C.Cawlfield,11B.I.Eisenstein,11G.D.Gollin,11I.Karliner,11N.Lowrey,11C.Plager,11C.Sedlack,11M.Selen,11J.J.Thaler,11J.Williams,11K.W.Edwards,12D.Besson,13S.Anderson,14V.V.Frolov,14D.T.Gong,14Y.Kubota,14S.Z.Li,14R.Poling,14A.Smith,14C.J.Stepaniak,14J.Urheim,14Z.Metreveli,15K.K.Seth,15A.Tomaradze,15P.Zweber,15S.Ahmed,16M.S.Alam,16J.Ernst,16L.Jian,16M.Saleem,16F.Wappler,16K.Arms,17E.Eckhart,17K.K.Gan,17C.Gwon,17K.Honscheid,17H.Kagan,17R.Kass,17T.K.Pedlar,17E.von Toerne,17H.Severini,18P.Skubic,18S.A.Dytman,19J.A.Mueller,19S.Nam,19and V.Savinov 19(CLEO Collaboration)1Purdue University,West Lafayette,Indiana 479072University of Rochester,Rochester,New York 146273Southern Methodist University,Dallas,Texas 752754Syracuse University,Syracuse,New York 132445Vanderbilt University,Nashville,Tennessee 372356Wayne State University,Detroit,Michigan 482027California Institute of Technology,Pasadena,California 911258Carnegie Mellon University,Pittsburgh,Pennsylvania 152139Cornell University,Ithaca,New York 1485310University of Florida,Gainesville,Florida 3261111University of Illinois,Urbana-Champaign,Illinois 6180112Carleton University,Ottawa,Ontario,Canada K1S 5B6and the Institute of Particle Physics,Canada13University of Kansas,Lawrence,Kansas 6604514University of Minnesota,Minneapolis,Minnesota 5545515Northwestern University,Evanston,Illinois 6020816State University of New York at Albany,Albany,New York 1222217Ohio State University,Columbus,Ohio 4321018University of Oklahoma,Norman,Oklahoma 7301919University of Pittsburgh,Pittsburgh,Pennsylvania 15260(Dated:December 29,2004)AbstractUsing the CLEO detector at the Cornell Electron Storage Ring,we have studied the distributionof kinematic variables in the decay Λ+c →Λe +νe .By performing a four-dimensional maximumlikelihood fit,we determine the form factor ratio,R =f 2/f 1=−0.31±0.05(stat)±0.04(syst),the pole mass,M pole =(2.21±0.08(stat)±0.14(syst))GeV/c 2,and the decay asymmetry parameterof the Λ+c ,αΛc =−0.86±0.03(stat)±0.02(syst),for q 2 =0.67(GeV/c 2)2.We compare theangular distributions of the Λ+c and Λc)Λc )=0.00±0.03(stat)±0.01(syst)±0.02,where the third error is from the uncertainty in the world average of the CP -violating parameter,A Λ,for Λ→pπ−.The charm quark is unstable and decays via a first order weak interaction.In semileptonic decays,which are analogs of neutron βdecay,the charm quark disintegrates predominantly into a strange quark,a positron and a neutrino.The rate depends on the weak quark mixing Cabibbo-Kobayashi-Maskawa (CKM)matrix element |V cs |and strong interaction effects,parameterized by form factors,which come into play because the charm quark is bound with light quarks to form a meson or baryon.Charm semileptonic decays allow a measurement of the form factors because |V cs |is tightly constrained by the unitarity of theCKM matrix [1].Within the framework of Heavy Quark Effective Theory (HQET)[2],semileptonic (J P =1/2+→1/2+)transitions of Λ-type baryons are simpler than mesons as they consist of a heavy quark and a spin and isospin zero light diquark.This simplicity leads to more reliable predictions [3,4]for form factors in heavy-to-light transitions.The measurement of form factors in the Λ+c →Λe +νe transition provides a test of HQET predictions in the charm baryon sector,a test of Lattice QCD,and information for the determination of the CKM matrix elements |V cb |and |V ub |using Λ0b decays since HQET relates the form factors in Λ+csemileptonic decays to those governing Λ0b semileptonic transitions.In the limit of negligible lepton mass,the semileptonic (J P =1/2+→1/2+)transition of a Λ-type baryon is parameterized in terms of four form factors:two axial form factors,F A 1and F A 2,and two vector form factors,F V 1and FV2.These form factors are functions ofq 2,the invariant mass squared of the virtual W +.The decay can be described in terms of helicity amplitudes H λΛλW =H V λΛλW +HAλΛλW ,where λΛand λW are the helicities ofthe Λand W +.The helicity amplitudes are related to the form factors in the following way [4]20=21=q 2H A 1Q +[(M Λc −M Λ)F A1+q 2F A 2],H A 12Q +[−F A 1−(M Λc −M Λ)F V2],where Q ±=(M Λc±M Λ)2−q 2.The remaining helicity amplitudes can be obtained using the parity relations H V (A )−λΛ−λW =+(−)H V (A )λΛλW .In terms of the helicity amplitudes,the decay angular distribution can be written as [4][5]ΓS =d Γ2G 2F24M 2Λc ×{321|2(1+αΛcos θΛ)+32−1|2(1−αΛcos θΛ)(2)+320|2(1+αΛcos θΛ)+|H −12√20H ∗120H ∗−1in theΛ+c rest frame,χis the angle between the decay planes of theΛand W+,andαΛis theΛ→pπ−decay asymmetry parameter measured to be0.642±0.013[1].In HQET,the heavyflavor and spin symmetries imply relations among the form factors and reduce their number to one when the decay involves only heavy quarks.For heavy-to-light transitions,two form factors are needed to describe the hadronic current.In this Letter, we follow Ref.[4],in which the c quark is treated as heavy and the s quark as light.Two independent form factors f1and f2are related to the standard form factors in the followingway F V1(q2)=−F A1(q2)=f1(q2)+MΛMΛc f2(q2).Ingeneral,f2is expected to be negative and smaller in magnitude than f1.If the s quark is treated as heavy,f2is zero.In order to extract the form factor ratio R=f2/f1from afit to the decay rate,ΓS, an assumption must be made about the q2dependence of the form factors.The modelof K¨o rner and Kr¨a mer(KK)[4]uses the dipole form f(q2)=f(q2max)M2pole )2forboth form factors,where the pole mass is taken from the naive pole dominance model:M pole=m D∗s =2.11GeV/c2.In this Letter,we perform,for thefirst time,a simultaneousfit for the form factor ratio and pole mass in the decayΛ+c→Λe+νe,and we make afirst search for CP-violation in this decay.The data sample used in this study was collected with the CLEO II[6]and upgraded CLEO II.V[7]detectors operating at the Cornell Electron Storage Ring(CESR). The integrated luminosity consists of13.7fb−1taken at and just below theΥ(4S)resonance, corresponding to approximately18×106e+e−→cThe normalization and momentum spectrum of the e fake background is estimated using the Wrong Sign(WS)h+Λsatisfy all analysis selection criteria.The h+tracks in this sample are mostly fakes as there are few processes contributing e+Λor h−Λ)WS or(h+Λor h−Λ),and the momentum region where the e fake rate from kaons is high is excluded by requiring| p e|>0.7GeV/c.Differences that remain between the momentum spectra and particle species of hadronic tracks h+Events/.125Events/.25t = q2/q2maxcosWFIG.1:Projections of the data(points with statistical error bars)and thefit(solid histogram) onto t,cosθΛ,cosθW andχ.The dashed lines show the sum of the backgrounddistributions.IIoEvents/.25cosWFIG.2:Projections of the data(points with statistical error bars)and thefit(solid histogram) onto cosθΛ,cosθW andχfor two t regions.The plots labeled(a),(b)and(c)are for t<0.5;(d), (e)and(f)are for t>0.5.The dashed lines show the sum of the background distributions.We have considered the following sources of systematic uncertainty and give our estimate of their magnitude in parentheses for R and M pole,respectively.The uncertainty associated with the size of the search volume is measured from a statistical experiment in which a set of mock data samples,including signal and all background components,wasfit in the same way as the data(0.006,0.048).The uncertainty due to the limited size of the signal MC sample is estimated by dividing the sample into four independent equal subsamples and repeating thefit(0.007,0.012).The uncertainty due to background normalizations is determined by varying the estimated number of background events by one standard deviation separatelyfor each type of background(0.023,0.024).The uncertainty associated with the modeling ofthe background shapes,including uncertainties originating from the modeling of the e fakebackground,and the unknown form factor ratio and M pole for the decaysΞc→Ξe+ν,is estimated by varying these shapes or by using alternative background samples(0.024,0.049).The uncertainty due to the small background contribution of randomΛe+pairs from thecontinuum(e+e−→q B events,which are not modeled in thefit,is obtained from a generic MC sample and is estimated by repeating thefit with and without this background(0.013,0.038).The modesΛ+c→ΛXe+ν,where X represents additional decay products,have never been observed.The current upper limit is B(Λ+c→ΛXe+ν)dq2d cosθΛd cosθW dχ=dΓ(Λe−dq2d cosθΛd cosθW d(−χ).Following[16]and by extension,a CP-violating asymmetry of theΛ+c is defined as AΛc =(αΛc+α(αΛc−αΛ−c are governed by R and M ing the values of R and M pole obtained in a simultaneousfit to each chargeconjugate state separately and the KK model,we calculateαΛc αΛ=−0.561±0.026(stat)andαΛ=−0.544±0.024(stat).From the following expression for the CP asymmetry:αΛcαΛ−αΛΛcαamong the systematic uncertainties for the charge conjugate states are taken into account and the third error is from the uncertainty in AΛ.In conclusion,using a four-dimensional maximum likelihoodfit,the angular distributions ofΛ+c→Λe+νe have been studied.The form factor ratio R=f2/f1and M pole are found to be−0.31±0.05(stat)±0.04(syst)and(2.21±0.08(stat)±0.14(syst))GeV/c2,respectively. This is the most precise measurement of R,and it demonstrates that f2is non zero with a combined statistical and systematic significance exceeding4σ.This is also thefirst measure-ment of M pole in a charm baryon semileptonic decay.Our measurement is consistent with=−0.86±0.03(stat)±0.02(syst),for vector dominance.These results correspond toαΛcq2 =0.67(GeV/c2)paring the angular distributions forΛ+c and.|H1/21|2+|H−1/2−1|2+|H1/20|2+|H−1/20|2[16] F.Donoghue,and S.Pakvasa,Phys.Rev.Lett.55,162(1985).A CP-violating parameter,AΛ,forΛ→pπ−is defined as AΛ≡(αΛ+α(αΛ−α。