FS-QAP-022 REV 06 Measurement System Analysis Procedure
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Maintenance Manual Interference Hunter MA2700AHandheld Direction Finding System9 kHz to 6 GHzAnritsu Company490 Jarvis DriveMorgan Hill, CA 95037-2809 USAPart Number: 10580-00362Revision: BPublished: August 2017 Copyright 2013 Anritsu CompanyTRADEMARK ACKNOWLEDGMENTSInterference Hunter is a trademark of Anritsu Company.NOTICEAnritsu Company has prepared this manual for use by Anritsu Company personnel and customers as a guide for the proper installation, operation and maintenance of Anritsu Company equipment and computer programs. The drawings, specifications, and information contained herein are the property of Anritsu Company, and any unauthorized use or disclosure of these drawings, specifications, and information is prohibited; they shall not be reproduced, copied, or used in whole or in part as the basis for manufacture or sale of the equipment or software programs without the prior written consent of Anritsu Company.UPDATESUpdates, if any, can be downloaded from the Documents area of the Anritsu Website at:For the latest service and sales contact information in your area, please visit:/contact.aspMA2700A MM PN: 10580-00362 Rev. B Safety-1Safety SymbolsTo prevent the risk of personal injury or loss related to equipment malfunction, Anritsu Company uses the following symbols to indicate safety-related information. For your own safety, please read the information carefully before operating the equipment.Symbols Used in ManualsDangerThis indicates a very dangerous procedure that could result in serious injury or death, and possible loss related to equipment malfunction, if not performed properly.WarningThis indicates a hazardous procedure that could result in light-to-severe injury or loss related to equipment malfunction, if proper precautions are not taken.CautionThis indicates a hazardous procedure that could result in loss related to equipment malfunction if proper precautions are not taken.Safety Symbols Used on Equipment and in ManualsThe following safety symbols are used inside or on the equipment near operation locations to provideinformation about safety items and operation precautions. Ensure that you clearly understand the meanings of the symbols and take the necessary precautions before operating the equipment. Some or all of the following five symbols may or may not be used on all Anritsu equipment. In addition, there may be other labels attached to products that are not shown in the diagrams in this manual.This indicates a prohibited operation. The prohibited operation is indicated symbolically in or near the barred circle.This indicates a compulsory safety precaution. The required operation is indicated symbolically in or near the circle.This indicates a warning or caution. The contents are indicated symbolically in or near the triangle.This indicates a note. The contents are described in the box.These indicate that the marked part should be recycled.Safety-2PN: 10580-00362 Rev. B MA2700A MMFor SafetyWarningAlways refer to the operation manual when working near locations at which the alert mark, shown on the left, is attached. If the operation, etc., is performed without heeding the advice in the operation manual, there is a risk of personal injury. In addition, the equipment performance may be reduced.Moreover, this alert mark is sometimes used with other marks and descriptions indicating other dangers.WarningWhen supplying power to this equipment, connect the accessory 3-pin power cord to a 3-pin grounded power outlet. If a grounded 3-pin outlet is not available, use a conversion adapter and ground the green wire, or connect the frame ground on the rear panel of the equipment to ground. If power is supplied without grounding the equipment, there is a risk of receiving a severe or fatal electric shock.WarningThis equipment can not be repaired by the operator. Do not attempt to remove the equipment covers or to disassemble internal components. Only qualified service technicians with a knowledge of electrical fire and shock hazards should service this equipment. There are high-voltage parts in this equipment presenting a risk of severe injury or fatal electric shock to untrained personnel. In addition, there is a risk of damage to precision components.CautionElectrostatic Discharge (ESD) can damage the highly sensitive circuits in the instrument. ESD is most likely to occur as test devices are beingconnected to, or disconnected from, the instrument’s front and rear panel ports and connectors. You can protect the instrument and test devices by wearing a static-discharge wristband. Alternatively, you can groundyourself to discharge any static charge by touching the outer chassis of the grounded instrument before touching the instrument’s front and rear panel ports and connectors. Avoid touching the test port center conductors unless you are properly grounded and have eliminated the possibility of static discharge.Repair of damage that is found to be caused by electrostatic discharge is not covered under warranty.Table of ContentsChapter 1—General Information1-2Related Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-11-5Recommended Test Equipment. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-21-6Replaceable Parts and Assemblies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-3Chapter 2—MA2700A Verification2-2Pre-Amp Gain Verification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-1Chapter 3—Assembly Replacement3-1Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-13-2Replaceable Parts List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-13-3Opening the MA2700A Case . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-13-4GPS/Compass Module Assembly Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-43-5Main PCB Module Assembly Replacement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5Appendix A—Test RecordsA-1Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A-1MA2700A MM PN: 10580-00362 Rev. B Contents-1Contents-2PN: 10580-00362 Rev. B MA2700A MMChapter 1 — General Information1-1IntroductionThis manual provides maintenance instructions for Anritsu’s Interference Hunter MA2700A. The information includes:•Chapter 1, “General Information”•Chapter 2, “MA2700A Verification”•Chapter 3, “Assembly Replacement”•Appendix A, “Test Records”Note Anritsu recommends that you make a copy of the blank test records to document the measurements each time a Performance Verification is performed. Continuing to document this process each time it is performed provides a detailed history of instrument performance, which allows you to observe trends.Throughout this manual, the following terms apply:•Interference Hunter refers to the MA2700A.•HH Controller refers to any of the Anritsu handheld RF Instruments capable of controlling the MA2700A which can be a S332E, S362E, MS2712E, MS2713E, MS2722C, MS2723C, MS2724C,MS2725C, MS2726C, MT8212E, MT8213E, MT8222A, MT8221B or MT8222B model.Familiarity with the basic operation of the front panel keys (for example, how to change measurement mode, preset the unit, or the meaning of submenu button or main menu button) is assumed. Refer to the specific HH Controller model User Guide.Product DescriptionThe MA2700A Interference Hunter is a portable handheld direction finding system. It is designed to accurately determine the direction and location of a source of interference.The MA2700A contains a GPS module, electronic compass, and a broadband pre-amp. The MA2700A has integrated functionality within the Interference Analysis mode of a HH Controller unit. Different frequency antennae can be utilized with the MA2700A for specific end user requirements.1-2Related DocumentsOther documents are available for the MA2700A at the Anritsu web site at :•Interference Hunter MA2700A Technical Data Sheet, P/N 11410-00692•Interference Hunter MA2700A User Guide, P/N 10580-00361•Interference Troubleshooting Guide, P/N 11410-00472•Spectrum Analyzer Measurement Guide, P/N 10580-002441-3Product Information, Compliance, and SafetyRead the Handheld Instruments Product Information, Compliance, and Safety Guide (PN: 10100-00065) for important safety, legal, and regulatory notices before operating the equipment. For additional information and literature covering your product, visit the product page of your instrument and select the Library tab.MA2700A MM PN: 10580-00362 Rev. B1-11-4 Anritsu Customer Service Centers Chapter 1 — General Information1-2PN: 10580-00362 Rev. B MA2700A MM1-4Anritsu Customer Service CentersFor the latest service and sales information in your area, please visit the following URL and click Contact Us:1-5Recommended Test EquipmentTable 1-1 lists the test equipment required for verifying and testing the MA2700A Interference Hunter . Table 1-1.Recommended Test Equipment for Interference Hunter VerificationEquipmentCritical SpecificationRecommended Manufacturer/Model Synthesized Signal GeneratorFrequency: 10 MHz to 6 GHz, Power Output: -30 dBm Anritsu Model MG3691C with option 4 or 5USB Power Sensor Frequency: 10 MHz to 6 GHz Power Range: -40 dB to +20 dB Anritsu Model MA24118A or MS24126A (Qty 1)USB Power Sensor PC SoftwareSupports MA24118A or MA24126A Anritsu PowerXpert V2.12 or later Spectrum AnalyzerFrequency: 9 kHz to 6 GHzAnritsu Model MS2712E orMS2722C or MT822xB with Option 25 Interference Analysis Adapter K(f) to N(f), 50 ΩAnritsu Model 34NFKF50Adapter N(f) to N(f), 50 ΩAnritsu Model 34NFNF50Adapter K(m) to K(m), 50 ΩAnritsu Model K220B RF Cable6 GHz, 50 ΩAnritsu Model 15NNF50-1.5CChapter 1 — General Information1-6 Replaceable Parts and Assemblies 1-6Replaceable Parts and AssembliesTable 1-2.List of Replaceable PartsPart Number Description3-ND75869<R>MA2700A GPS and Electronic Compass Assembly3-ND75870<R>MA2700A Main PCB Assembly3-513-117Adapter RF Flange N(m) to SMP(f)3-75105N Connector Plastic Torque Knob3-75108Cable Assembly, w/Trigger switch3-75109Cable Assembly, Interface Cable from MA2700A to Instrument Controller3-75246Cable Assembly, GPS to Main PCB3-75103Handle Housing, Left3-75104Handle Housing, Right3-75112Tripod Mount Bracket3-75128Label, Model ID MA2700A3-75130Label, Warning3-75660-1Handle Housing Gasket Neoprene 472.4 mm3-75660-2Handle Housing Gasket Neoprene 177.8 mm3-75660-3Handle Housing Gasket Neoprene 38.1 mm3-75660-4Handle Housing Gasket Neoprene 84.0 mm3-790-742Tripod Mounting Bracket O-Ring GasketMA2700A MM PN: 10580-00362 Rev. B1-31-6 Replaceable Parts and Assemblies Chapter 1 — General Information 1-4PN: 10580-00362 Rev. B MA2700A MMChapter 2 — MA2700A Verification2-1IntroductionThis chapter provides the operational verification procedures for MA2700A Interference Hunter.2-2Pre-Amp Gain VerificationThe following test is used to verify the gain of the pre-amp within the MA2700A Interference Hunter.Equipment Required•Interference Hunter, Anritsu Model MA2700A•HH Controller, Anritsu Model MT8221B with Option 25•Signal Generator, Anritsu Model MG3691C with Option 4 or 5•Adapter, N(f) to K(f), 50 Ω, Anritsu Model 34NFKF50•Adapter, K(m) to K(m), Anritsu Model K220B•Adapter, N(f) to N(f), Anritsu Model 34NFNF50•RF Cable, 6 GHz, 50 Ω, Anritsu Model 15NNF50-1.5C•USB Power Sensor, 10 MHz to 6 GHz, +20 to -40 dBm, Anritsu Model MA24118A•PC with USB connection and Anritsu PowerXpert software2-2 Pre-Amp Gain Verification Chapter 2 — MA2700A VerificationProcedure1. Confirm that all the connectors are clean as any debris or contamination may cause incorrectmeasurement results.Figure 2-1.Interference Hunter and HH Controller PC Running PowerXpert2. Press the On/Off key to turn on the HH Controller. Wait for the instrument to finish booting up.3. Connect the MA2700A USB connector to the Anritsu Handheld (HH) Controller as shown in Figure 2-1. Do not connect the RF cable from the MA2700A to the HH Controller.4. Press the Shift key and then the Mode (9) key. Use the rotary knob to highlight Interference Analysis and then press the Enter key to switch to Interference Analysis mode.5. On the HH Controller, press the Shift key and then the Preset (1) key. Press the Preset submenu key to set the instrument to the factory preset state.6. Connect the USB Sensor to the MA2700A RF Output Cable using the 34NFNF50 Adapter. Connect the Signal Generator Output to the MA2700A RF Input N connector using the RF cable, K220B and34NFKF50 adapters.7. On the HH Controller, Press the Measure function key, from the Measurements menu, select theInterference Mapping key, from the Antenna Selection menu select MA2700A Handheld.Chapter 2 — MA2700A Verification2-2 Pre-Amp Gain Verification8. On the HH Controller, Press the IA Mapping function key, from the IA Mapping menu select theDirection Finding key. From the Direction Finding menu we will use the Antenna Preamp key to toggle the MA2700A preamp On and Off.9. On the Signal Generator, ensure the RF Output is Off (disabled). Press the Frequency main menu keyand set the value F1 to 10 MHz and the Level (L1) value to -20 dBm.10. On the PC, double click the PowerXpert icon menu key and confirm that the USB Power sensor isrecognized.11. Change the PowerXpert settings to match Figure 2-2.Figure 2-2.PowerXpert Setup12. Ensure the RF Output is Off on the Signal Generator and then on the PC select the red Zero button. Afterthe USB Power Sensor is Zeroed, you can turn the Signal Generator’s RF Output On.13. On the PowerXpert application window you should see a level of approximately -20 dBm, note the valueand record it in Table A-1, “Preamp Gain Verification” on page A-2.14. On the HH Controller, press the Antenna Preamp submenu key to turn the preamp On. In the PowerXpertapplication window you should see a level of approximately -10 dBm, note the value and record it in Table A-1.15. Calculate the preamp gain by subtracting the Preamp Off value from the Preamp On value. Enter resultin the Preamp Gain column of Table A-1, verify that is within the typical value limit.16. On the HH Controller, press the Antenna Preamp submenu key to turn the preamp Off. Change the SignalGenerator to the next frequency value Table A-1.17. Repeat steps 13 through 16 until all the frequency and preamp values are verified.2-2 Pre-Amp Gain Verification Chapter 2 — MA2700A VerificationChapter 3 — Assembly Replacement3-1IntroductionThis chapter describes opening and closing the Interference Hunter MA2700A case along with basic parts replacement steps. The sections are:•“Replaceable Parts List” on page 3-1•“Opening the MA2700A Case” on page 3-1•“GPS/Compass Module Assembly Replacement ” on page 3-4•“Main PCB Module Assembly Replacement ” on page 3-53-2Replaceable Parts ListRefer to Table 1-2, “List of Replaceable Parts” on page 1-3 for the list of replaceable parts. Refer to the following sections for basic replacement instructions.Note Many of the procedures in this section are generic, and apply to many similar instruments. Photos and illustrations used are representative and may show other instruments.Caution Only qualified personnel should open the case and replace internal assemblies. Assemblies shown in Table 1-2 are typically the only items that may be replaced. As they are highly fragile, items that must be soldered may not be replaced without specialized training.Removing RF shields from PC boards or adjustment of screws on or near the shields may detune sensitive RF circuits and will result in degraded performance. All work should be performed in a static-safe work area.3-3Opening the MA2700A CaseCaution Electrostatic Discharge (ESD) can damage the highly sensitive circuits in the instrument.The MA2700A contains components that can easily be damaged by electrostatic discharge (ESD). An ESD safe work area and proper ESD handling procedures that conform to ANSI/ESDS20.20-1999 or ANSI/ESD S20.20-2007 is mandatory to avoid ESD damage when handling subassemblies or components found in the instrument.Repair of damage that is found to be caused by electrostatic discharge is not covered under warranty.This procedure provides instructions for opening the MA2700A case. With the case opened, the internal assemblies can be removed and replaced, as detailed in the following sections.1. Remove any cable connections between the MA2700A and the HH Controller.3-3 Opening the MA2700A Case Chapter 3 — Assembly Replacement2. Place the MA2700A on a stable work surface (with the screw holes facing up) that will not scratch thecase. Remove the plastic N connector torque knob by pulling it off (Figure 3-1).Figure 3-1. Case with N Connector knob removed3. Use a Phillips screwdriver to remove the top two screws securing the two halves of the Interference Huntercase to the N connector flange (Figure 3-2).Figure 3-2.Remove the 2 Screws in the Top Half (Side with the Screw Holes) of the CaseChapter 3 — Assembly Replacement 3-3 Opening the MA2700A Case4. After removing the six screws shown in Figure 3-1 and the two screws by the N connector shown in Figure 3-2, carefully lift up the top half of the case and begin to separate the two halves. Refer toFigure 3-3.Figure 3-3.The Two Halves of the InterferenceHunter Note There is gasket material between the two halves of the case. Take care not to remove or damagethis material when opening the case, replacing assemblies, and closing the case.5. Opening the MA2700A case allows access to all the assemblies and parts listed in Table 1-2, “List of Replaceable Parts” on page 1-3. Refer to the following sections of this chapter to remove and replace specific components of the instrument. Note Proper routing of the cables is important for instrument performance. Note the cable routing.6. Reverse the above steps to reassemble the case.3-4 GPS/Compass Module Assembly Replacement Chapter 3 — Assembly Replacement3-4GPS/Compass Module Assembly ReplacementThis procedure provides instructions for removing and replacing the GPS/Compass Module assembly.The GPS/Compass Module assembly is located at the top of the MA2700A Case assembly.1. Open the case as described in Section 3-3 “Opening the MA2700A Case”.2. Pull the GPS/Compass Assembly out of the slots.3. Remove the cable attached to the GPS/Compass assembly by depressing the locking tab in the center ofthe connector and sliding the connector off (Figure 3-4).4. Remove the GPS/Compass assembly.Figure 3-4.GPS/Compass Module Assembly5. Reverse the above steps to install the new GPS/Compass assembly.Chapter 3 — Assembly Replacement3-5 Main PCB Module Assembly Replacement3-5Main PCB Module Assembly ReplacementThis procedure provides instructions for removing and replacing the Main PCB assembly. The Main PCB assembly is located at the bottom of the case and includes the N Connector. Additionally, you can replace the main cable harness and the N connector if required.1. Open the case as described in Section 3-3 “Opening the MA2700A Case”.2. Use a Phillips screwdriver to remove the two screws securing the N connector flange to the bottom half ofthe instrument case (Figure 3-5).Figure 3-5.Remove 2 Screws Below N Connector Flange3. Remove the two cable connectors (one for the trigger and one for the GPS module) by depressing thelocking tab and pulling the connectors out (Figure 3-6).Figure 3-6.Remove the Cables from the Motherboard3-5 Main PCB Module Assembly Replacement Chapter 3 — Assembly Replacement4. Use a Phillips screwdriver to remove the four screws securing the Main PCB Assembly to the back half ofthe case (Figure 3-7).Figure 3-7.Remove the 4 screws on the Main PCB Assembly5. Carefully lift up and remove the Main PCB assembly and the attached cable harness assembly.6. With the Main PCB Assembly and main cable harness removed, you can now remove the SMA connectorand Mini USB connector from the Main PCB assembly (Figure 3-8).Figure 3-8.Remove the 4 screws on the Main PCB Assembly7. From here you can replace the Main Cable harness and/or the N connector.Chapter 3 — Assembly Replacement3-5 Main PCB Module Assembly Replacement8. Disconnect the N connector by gently pulling the N connector away from the Main PCB Assembly.9. Reverse the above steps to install the new Main PCB Assembly.Note There is gasket material between the two halves of the case. Take care not to remove or damage this material when removing or replacing the Main PCB Assembly and N connector flange.Note During assembly replacement procedures the plastic trigger may become dislodged. Refer to Figure 3-9 for the correct reassembly.The tension spring should be on the trigger side of the housing.Figure 3-9.Trigger AssemblyAppendix A — Test RecordsA-1IntroductionThis appendix provides test records that can be used to record the performance of the MA2700AInterference Hunter. Make a copy of the following Test Record pages and document the measured values each time performance verification is performed. Continuing to document this process each performance verification session provides a detailed history of the instrument‘s performance.Table A-1.Preamp Gain VerificationSignal Generator Frequency and Power Power Reading with Preamp OffPower Reading with Preamp OnPreamp Gain(Preamp On – Preamp Off)Preamp Gain Typical Spec10 MHz @ -20 dBm dBm dBm dB ≥ 8 dB 1000 MHz @ -20 dBm dBm dBm dB ≥ 8 dB 2400 MHz @ -20 dBm dBm dBm dB ≥ 8 dB 2410 MHz @ -20 dBm dBm dBm dB ≥ 5 dB 3000 MHz @ -20 dBm dBm dBm dB ≥ 5 dB 4000 MHz @ -20 dBm dBm dBm dB ≥ 5 dB 4010 MHz @ -20 dBm dBm dBm dB ≥ 3 dB 5000 MHz @ -20 dBm dBm dBm dB ≥ 3 dB 6000 MHz @ -20 dBmdBmdBmdB≥ 3 dBA-1 IntroductionAppendix A — Test RecordsMA2700A Firmware Rev: ______________Operator: ____________________Date: _____________Serial Number: _______________________Anritsu Company。
S p e c i f i c a t i o nsSpectrum Analyzer ¸FSPSpecificationsSpecificationsSpecifications are valid under the following conditions:15 minutes warm-up time at ambient temperature, specified environmental conditions met, calibration cycle adhered to, and total calibration performed.Data without tolerances: typical values only.Data designated "nominal" applies to design parameters and is not tested.Data designated "σ = xx dB" is shown as standard deviation.¸FSP3¸FSP7¸FSP13¸FSP30¸FSP40 FrequencyFrequency range9 kHz to 3GHz9 kHz to 7GHz9 kHz to 13.6GHz9 kHz to 30GHz9 kHz to 40GHz Frequency resolution0.01 HzInternal reference frequency (nominal)Aging per year1)1)After 30 days of operation.1 × 10–6Temperature drift 1 × 10–6With option ¸FSP-B4 (OCXO)Aging per year1) 1 × 10–7Temperature drift 1 × 10–8External reference frequency10 MHzFrequency display with marker or frequency counterMarker resolution span/500Max. deviation(sweep time >3× auto sweep time)±(frequency × reference frequency + 0.5% × span + 10% × resolution bandwidth + ½ (last digit)) Frequency counter resolution0.1 Hz to 10 kHz (selectable)Count accuracy (S/N >25 dB)±(frequency × reference frequency + ½ (last digit))Frequency span0 Hz,10 Hz to 3GHz0 Hz,10 Hz to 7GHz0 Hz,10 Hz to 13.6GHz0 Hz,10 Hz to 30GHz0 Hz,10 Hz to 40GHzMax. span deviation0.1% Spectral purity (dBc (1 Hz)) SSB phase noise, f = 500 MHz, for f > 500 MHz see diagrams belowCarrier offset100 Hz<–84, typ.–90 1 kHz<−100, typ.−108 10 kHz<−106, typ. −113100 kHz2)2)Valid for span >100 kHz.<−110, typ. −1131 MHz2)<−120, typ.−125 10 MHz typ.−145 Residual FMf = 500 MHz, RBW 1 kHz,sweep time 100 mstyp. 3 Hz2 Spectrum Analyzer ¸FSPSpectrum Analyzer ¸FSP3Sweep timeSpan ≥10 Hz 2.5 ms to 16000 sMax. deviation1%Span 0 Hz 1 µs to 16000 sResolution125 nsResolution bandwidthsBandwidths10 Hz to 10 MHz (–3 dB) in 1, 3 sequenceEMI bandwidths200 Hz, 9 kHz, 120 kHz (–6 dB)Bandwidth accuracy≤100 kHz<3%300 kHz to 3 MHz<10%10 MHz+10%, –30%Shape factor –60 dB: –3 dB≤100 kHz<5:1 (Gaussian filters)300 kHz to 3 MHz<15:1 (4-pole synchronously tuned filters)10 MHz<7:1Shape factor –60 dB: –6 dBEMI bandwidths<5:1Video bandwidths 1 Hz to 10 MHz in 1, 3 sequenceFFT filterBandwidths 1 Hz to 30 kHz (–3 dB) in 1, 3 sequenceBandwidth accuracy5%, nominalShape factor –60dB:–3 dB 2.5:1 nominalChannel filterBandwidths100; 200; 300; 500 Hz;1; 1.5; 2; 2.4; 2.7; 3; 3.4; 4; 4.5; 5; 6; 8.5; 9; 10; 12.5; 14; 15; 16; 18 (RRC); 20; 21; 24.3 (RRC); 25; 30; 50; 100;150; 192; 200; 300; 500 kHz; 1;1.228; 1.5; 2; 3; 5 MHz1.28 (RRC), 3.84 (RRC), 4.096 (RRC)LevelDisplay range displayed average noise level to 30 dBmMaximum input levelDC voltage50 V0 VRF attenuation 0 dBCW RF power20 dBmPulse spectral density97 dBµV (1 MHz)RF attenuation ≥10 dBCW RF power30 dBmMax. pulse voltage150 V50 VMax. pulse energy (10 µs) 1 mWs0.5 mWs1 dB compression of input mixer0 dB RF attenuation, f > 200 MHz0 dBm nominalIntermodulation3rd-order intermodulationIntermodulation-free dynamic range, level 2 × –30 dBm, ∆f > 5 × RBW or 10 kHz, whichever is larger20 MHz to 200 MHz>70 dBc, TOI >5 dBm200 MHz to 3 GHz>74 dBc, TOI >7 dBm (typ. 10 dBm)3 GHz to 7 GHz−>80 dBc, TOI >10 dBm (typ. 15 dBm)7 GHz to 13.6 GHz−−>80 dBc, TOI >10 dBm13.6 GHz to 30 GHz−−−>76 dBc, TOI >8dBm>80 dBc, TOI >10 dBm 30 GHz to 40 GHz−−−−>80 dBc, TOI >10 dBm With optional Electronic Attenuator ¸FSP-B25 switched on20 MHz to 200 MHz>74 dBc, TOI > 7 dBm−200 MHz to 3 GHz>80 dBc, TOI > 10 dBm−3 GHz to 7 GHz>84 dBc, TOI > 12 dBm−4 Spectrum Analyzer ¸FSPSecond harmonic intercept point (SHI)<100 MHz typ. 25 dBm100 MHz to 1.5 GHz typ. 35 dBm1.5 GHz to 7 GHz−typ. 80 dBm7 GHz to 13.6 GHz−−typ. 80 dBm13.6 GHz to 30 GHz−−−typ. 80 dBm30 GHz to 40 GHz−−−−typ.80 dBm Displayed average noise level(0 dB RF attenuation, RBW 10 Hz, VBW 1 Hz, 20 averages, trace average, span 0 Hz, termination 50 Ω)Frequency9 kHz<−95 dBm100 kHz<−100 dBm1 MHz<−120 dBm, typ. −125 dBm10 MHz to 1 GHz<−142 dBm,typ.−145 dBm<−140 dBm, typ. −145 dBm1 GHz to 3 GHz<−140 dBm,typ. −145 dBm<−138 dBm, typ. −143 dBm3 GHz to 7 GHz−<−138 dBm,typ. −143 dBm<−135 dBm, typ. −140 dBm7 GHz to 13.6 GHz−−<−132 dBm, typ. −138 dBm13.6 GHz to 22 GHz−−−<−120 dBm,typ. −128 dBm−22 GHz to 30 GHz−−−<−115 dBm,typ. −123 dBm−13.6 GHz to 20 GHz−−−−<−120 dBm,typ. −128 dBm 20 GHz to 30 GHz−−−−<−120 dBm,typ. −128 dBm 30 GHz to 40 GHz−−−−<−112 dBm,typ. −120 dBm Displayed average noise level with preamplifier on (option ¸FSP-B25)10 MHz to 2 GHz<–152 dBm−2 GHz to 7 GHz<–150 dBm−Immunity to interferenceImage frequency>70 dBIntermediate frequency (f <3 GHz)>70 dBSpurious responses (f >1 MHz, withoutinput signal, 0 dB attenuation)<−103 dBmOther spurious (with input signal, mixer level <–10 dBm, ∆f >100kHz)f <7 GHz: <−70 dBc f <13.6 GHz: <−64 dBc f <30 GHz: <−56 dBcLevel displayScreen501 × 400 pixels (one diagram), max. two diagrams with independent settingsLogarithmic level scale10 dB to 200 dB, in steps of 10 dBLinear level scale10% of reference level per level division (10 divisions)Traces max. 3, with two diagrams on screen max. 3 per diagramTrace detector max peak, min peak, auto peak, sample, quasi-peak, average, RMSTrace functions clear/write, max. hold, min hold, averageNumber of test points501, selectable in steps of approx. factor 2, 125 to 8001Setting range of reference levelLogarithmic level display–130 dBm to 30 dBm, in steps of 0.1 dBLinear level display70.71 nV to 7.07 V in steps of 1%Units of level scale dBm, dBmV, dBµV, dBµA, dBpW (log level display), mV, µV, mA, µA, pW, nW (linear level display)Max. uncertainty of level measurementAt 128 MHz, −30 dBm (RF attenuation10dB, RBW 10kHz, ref. level –20 dBm)<0.2 dB (σ = 0.07 dB)Spectrum Analyzer ¸FSP5Frequency response<50 kHz <+0.5/− 1.0 dB50 kHz to 3 GHz<0.5 dB (σ = 0.17 dB)3 GHz to 7 GHz–<2 dB(σ = 0.7 dB)7 GHz to 13.6 GHz––<2.5 dB1)13.6 GHz to 30 GHz–––<3 dB1)30 GHz to 40 GHz––––<4 dB1) Frequency response with option ¸FSP-B25 switched on (preamplifier, electronic attenuator)10 MHz to 3 GHz<1 dB(σ = 0.33 dB)–3 GHz to 7 GHz–<2 dB(σ = 0.7 dB)–Attenuator<0.2 dB (σ = 0.07 dB)Reference level switching<0.2 dB (σ = 0.07 dB)Display nonlinearity LOG/LIN (S/N >16 dB)RBW ≤100 kHz0 dB to –70 dB<0.2 dB (σ = 0.07 dB)–70 dB to –90 dB<0.5 dB (σ = 0.17 dB)RBW ≥300 kHz0 dB to –50 dB<0.2 dB (σ = 0.07 dB)–50 dB to –70 dB<0.5 dB (σ = 0.17 dB)Bandwidth switching uncertainty (ref. to RBW = 10 kHz)10 Hz to 100 kHz <0.1 dB (σ = 0.03 dB)300 kHz to 10 MHz<0.2 dB (σ = 0.07 dB)1 Hz to 3 kHz, FFT<0.2 dB (σ = 0.03 dB)Total measurement uncertainty0 GHz to 3 GHz0.5 dBTrigger functionsTriggerSpan ≥10 HzTrigger source free run, video, external, IF levelTrigger offset125 ns to 100 s, resolution 125 ns min. (or 1% of offset)Span = 0 HzTrigger source free run, video, external, IF levelTrigger offset±125 ns to 100 s, min. resolution 125 ns, dependent on sweep timeMax. deviation of trigger offset±(125 ns + (0.1% × delay time))Gated sweepTrigger source external, IF level, videoGate delay 1 µs to 100 sGate length125 ns to 100 s, min. resolution 125 ns or 1% of gate lengthMax. deviation of gate length±(125 ns + (0.05% × gate length))Inputs and outputs (front panel)RF input N female, 50 Ωtest port system 50 Ω,N female,3.5 mm female2)test port system 50 Ω,N female,K female2)VSWR (RF attenuation >0 dB)f <3 GHz 1.5:1f <7 GHz− 2.0:1f <13 GHz−− 2.5:1f <30 GHz−−− 3.0:1f <40 GHz−−−− 3.0:1 Input attenuator0 dB to 70 dB in 10 dB stepsWith option ¸FSP-B250 dB to 75 dB in 5 dB steps not availableProbe power supply+15 V DC, –12.6 V DC and ground, max. 150 mAKeyboard connector PS/2 female for MF2 keyboardAF output (only with option ¸FSP-B3) 3.5 mm mini-jackOutput impedance10 ΩOpen-circuit voltage up to 1.5 V, adjustable6 Spectrum Analyzer ¸FSPInputs and outputs (rear panel)IF 20.4 MHz Z out= 50 Ω, BNC femaleLevelRBW ≤30 kHz, FFT–10 dBm at reference level, mixer level >–60 dBmRBW ≥100 kHz0 dBm at reference level, mixer level >–60 dBmReference frequencyOutput BNC femaleOutput frequency10 MHzLevel 0 dBm, nominalInput10 MHzRequired level0 dBm into 50 ΩOthersPower supply for noise source BNC female, 0 V and 28 V, switchable, max. 100mAExternal trigger/gate input BNC female, >10 kΩTrigger voltage 1.4 V (TTL)IEC/IEEE bus remote control interface to IEC 625-2 (IEEE 488.2)Command set SCPI 1997.0Connector24-pin Amphenol femaleInterface functions SH1, AH1, T6, L4, SR1, RL1, PP1, DC1, DT1, C0Serial interface RS-232-C (COM), 9-pin sub-D connectorPrinter interface parallel (Centronics-compatible)Mouse connector PS/2 femaleConnector for ext. monitor (VGA)15-pin sub-D connectorGeneral dataDisplay21 cm TFT colour display (8.4”)Resolution640 × 480 pixels (VGA resolution)Pixel failure rate<2 × 10 –5Mass memory 1.44 MByte 3½” disk drive (built-in), hard diskData storage>500 instrument settings and tracesTemperaturesOperating temperature range+5°C to +40°CPermissible temperature range+5°C to +45°CStorage temperature range–40°C to +70°CDamp heat+40°C at 95% relative humidity (EN 60068-2-30)Mechanical resistanceVibration, sinusoidal 5 Hz to 150 Hz, max. 2 g at 55 Hz; 0.5 g from 55 Hz to 150 Hz; meets EN60068-2-6, EN60068-2-30, EN61010-1,MIL-T-28800D, class 5Vibration, random10 Hz to 100 Hz, acceleration 1 g (rms)Shock test40 g shock spectrum, meets MIL-STD-810C and MIL-T-28800D, classes 3 and 5Recommended calibration interval 2 years for operation with external reference,1 year with internal referencePower supplyAC supply100 V AC to 240 V AC, 50 Hz to 400Hz, 3.1 A to 1.3 A, class of protection I to VDE411Typical power consumption70 VA 120 VA150 VASafety meets EN61010-1, UL3111-1, CSAC22.2 No. 1010-1,RFI suppression meets EMC Directive of EU (89/336/EEC) and German EMC lawTest mark VDE, GS, CSA, CSA-NRTL/CDimensions in mm (W × H × D)412 × 197 × 417Weight10.5 kg11.3 kg12 kg1)RF attenuation 10 dB, sweep time >1s/1 GHz.2)See recommended extras for alternate connectors.Spectrum Analyzer ¸FSP7Specifications of optionsTracking Generator ¸FSP-B9Unless specified otherwise, specifications not valid for frequency range from –3 × RBW to +3 × RBW; however, at least not valid from –9 kHz to +9 kHz.The specified level accuracy of the tracking generator is valid under the following conditions: RF attenuation ≥ 20 dB and sweep time ≥2000 ms.FrequencyFrequency range9 kHz to 3 GHzFrequency offsetSetting range±150 MHzResolution 1 HzSpectral purity (dBc (1 Hz)) SSB phase noise, f = 500 MHz, carrier offset 100 kHzNormal mode typ. –90With FM modulation on typ. –70LevelLevel setting range–30 dBm to 0 dBm in steps of 0.1 dBLevel setting range with AM–30 dBm to –6 dBm in steps of 0.1 dBMax. deviation of output level, 128 MHz, 0 dBm<1 dBFrequency responseOutput level 0 dBm, 100 kHz to 2 GHz<1 dBOutput level 0 dBm to −25 dBm, 9 kHz to 3 GHz<3 dBDynamic rangeAttenuation measurement range, RBW = 1 kHz, f > 10 MHz120 dBSpuriousHarmonics, output level –10 dBm typ. –30 dBcNonharmonics, output level 0 dBm typ. –30 dBcModulationModulation format (external)I/Q, AM, FM, FM-DC, PM, ASK, FSKAM, f > 10 MHzModulation depth0% to 99%Modulation frequency range0 Hz to 1 MHzFM, f > 10 MHzFrequency deviation0 Hz to 20 MHzModulation frequency range0 Hz to 100 kHzI/Q modulation, f > 10 MHz0 Hz to 30 MHz typ. 1 dBInputs and outputs (front panel)RF output N female, 50 ΩVSWR typ. 2:1Inputs and outputs (rear panel)TG/AM IN V max(pp) = 1 V; Z in = 50 Ω, BNC femaleTG Q/FM IN V max(pp) = 1 V; Z in = 50 Ω, BNC femaleExternal Generator Control ¸FSP-B10Supported signal generators¸SME02/03/06, ¸SMG, ¸SMGL, ¸SMGU, ¸SMH, ¸SMHU,¸SMIQ02B/02E/03B/03E/04B/06B¸SML, ¸SMR20/27/30/40/60¸SMP02/22/03/04,¸SMX, ¸SMY¸SMT02/03/06LAN Interface ¸FSP-B16Connector (rear panel)RJ-45Supported protocols10Base-T (IEEE standard 10 Mbit/s 802.3)100Base-TX (IEEE standard 100 Mbit/s 802.3u)Extended Environmental Specification ¸FSP-B20Temperature range (noncondensing)Operating temperature range 0°C to +50°CPermissible temperature range0°C to +55°CMechanical resistanceVibration, random10 Hz to 300 Hz, acceleration 1.9 g (rms)8 Spectrum Analyzer ¸FSPLO/IF ports for external Mixers ¸FSP-B21 (¸FSP40 only)LO levelFrequency range 7 GHz to 13.2 GHzLevel+15.5 dBm ±3 dBIF inputIF frequency 404.4 MHzFull scale level2 port mixer, LO output/IF input (front) –20 dBmLevel deviation<1dBIF level –30 dBm, reference level –20 dBm, RBW 30 kHz,LO output/IF input (front)Full scale level3 port mixer, IF input (front) –20 dBmLevel deviationIF level –30 dBm, reference level –20 dBm, RBW 30 kHz, IF input (front)<1dBInputs and outputs (front)LO output/IF input SMA female, 50 ΩIF input SMA female, 50 ΩElectronic Attenuator ¸FSP-B25 (only for ¸FSP3 and ¸FSP7)FrequencyFrequency range10 MHz to 7 GHzInput attenuator range (mechanical)0 dB to 75 dB in 5 dB stepsElectronic attenuation range0 dB to 30 dB in 5 dB stepsPreamplifier20 dB, switchableDisplayed average noise level with preamplifier on (0 dB RF attenuation, RBW 10 Hz, VBW 1 Hz, 20 averages, trace average, span 0 Hz, termination 50 Ω) 10 MHz to 2 GHz<–152 dBm2 GHz to 7 GHz<–150 dBmIntermodulation with electronic attenuator on3rd-order intermodulation, intermodulation-free dynamic range, level 2 × –30 dBm, ∆f >5 × RBW or 10 kHz, whichever is larger20 MHz to 200 MHz>74 dBc, TOI >7 dBm200 MHz to 3 GHz>80 dBc, TOI >10 dBm3 GHz to 7 GHz>84 dBc, TOI >12 dBmMax. deviation of level measurement<0.2 dB (σ = 0.07 dB)128 MHz, –30 dBm (RF attenuation 10 dB, RBW 10 kHz,ref. level –20dBm), preamplifier onElectronic attenuator<0.2 dB (σ = 0.07 dB)Frequency response with preamplifier, electronic attenuator10 MHz to 3 GHz<1.0 dB (σ = 0.33 dB)3 GHz to 7 GHz<2 dB (σ = 0.7 dB)Trigger Port ¸FSP-B28Output voltage high ≤1.4 Vlow ≥0.7 VTrigger port connector25-pin sub-D femaleFrequency range extension 20 Hz ¸FSP-B29Frequency range 20 Hz to f maxFrequency response <9 kHz <1 dBDisplayed average noise level0 dB RF attenuation, RBW 10 Hz, VBW 1 Hz, 20 averages, trace average, span 0 Hz, termination50Ω20 Hz<–58 dBm100 Hz<–75 dBm1 kHz<–85 dBmDC Power Supply ¸FSP-B30Input voltage range10 V to 28 V DC25 A to 12.5 AOutput voltage 120 V to 360 V DC/300 WCurrent consumption (V DC = 12 V, ¸FSP without options, default settings)¸FSP3typ. 6 A¸FSP30typ. 8 AOperating temperature range 0°C to +50°CStorage temperature range–40°C to +70°CDimensions in mm (W × H × D)145 × 154 × 65Weight0.6 kgSpectrum Analyzer ¸FSP9Battery Pack ¸FSP-B31/-B32NiMH battery pack with built-in load control for all ¸FSP and ¸ESPI models with options ¸FSP-B1 and ¸FSP-B30Input voltage of battery pack10 V to 28 V DCInput voltage power supply (battery charge)24 V DC/max. 3 AOutput voltageBattery operation13.2 V DC/200 WhBypass operation10 V to 28 V DC/10 ATypical operating times (¸FSP without options)¸FSP3 2 h¸FSP30 1.5 hCharging time 5 h at 25°COperating temperature range (discharging)0°C to +50°COperating temperature range (charging)+10°C to +40°CStorage temperature range (<1 year)–20°C to +35°CStorage temperature range (<1 month)–20°C to +55°CDimensions (W × H × D)400 mm × 134 mm × 42 mmWeight 3.7 kgAC adapter (¸FSP-B31 only)Input voltage range100 V to 240 V AC ±10%Input frequency range50 Hz to 60 Hz ±5%Input power140 VAOutput voltage24 VOutput current 3 AOperating temperature range 0°C to +50°CStorage temperature range –20°C to +70°CDimensions (W × H × D)132 mm × 58 mm × 30 mmWeight0.3 kgOrdering informationOrder designation Type Order No. Spectrum Analyzer, 9 kHz to 3 GHz¸FSP31164.4391.03 Spectrum Analyzer, 9 kHz to 7 GHz¸FSP71164.4391.07 Spectrum Analyzer, 9 kHz to 13.6 GHz¸FSP131164.4391.13 Spectrum Analyzer, 9 kHz to 30 GHz¸FSP301164.4391.30 Spectrum Analyzer, 9 kHz to 40 GHz¸FSP401164.4391.40 Accessories suppliedPower cable, compact manual, CD-ROM with operating manual and service manual.¸FSP30: test port adapter with 3.5 mm female (1021.0512.00) and N female (1021.0535.00) connector.¸FSP40: test port adapter with K female (1036.4770.00) and N female (1036.4777.00) connector.OptionsOrder designation Type Order No.Retrofittable RemarksOptionsDelete Manuals¸FSP-B01129.8394.02Rugged Case, carrying handle (factory-fitted)¸FSP-B11129.7998.02noAM/FM Audio Demodulator¸FSP-B31129.6491.02yes not with ¸FSP-B15. OCXO Reference Frequency ¸FSP-B41129.6740.02yesTV Trigger/RF Power Trigger¸FSP-B61129.859.4.02yes not with ¸FSP-B21. Internal Tracking Generator 9 kHz to 3GHz, I/Q modulator, for all ¸FSP models¸FSP-B91129.6991.02yesExternal Generator Control for all ¸FSP models¸FSP-B101129.7246.02yesPulse Calibrator for ¸FSP¸FSP-B151155.1006.02yes not with ¸FSP-B3;required for ¸FS-K72/-K73 LAN Interface 100BT for all ¸FSP models with Windows XP (1164.4391.xx)¸FSP-B161129.8042.03yes10 Spectrum Analyzer ¸FSPOrder designation Type Order No.Retrofittable RemarksLAN Interface 100BT for all ¸FSP models with Windows NT (1043.4495.xx)¸FSP-B161129.8042.02yesExtended Environmental Specification ¸FSP-B201155.1606.06noLO/IF Ports for External Mixers¸FSU-B211157.1090.02yes not with ¸FSP-B6;only for ¸FSP40¸FSP-B251129.7746.02yesElectronic Attenuator, 0 dB to 30 dB, 5 dB steps, integrated preamplifier for¸FSP3 and ¸FSP7Trigger Port for ¸FSP for indication of trigger conditions¸FSP-B281162.9915.02yesFrequency Range Extension 20 Hz for ¸FSP3/7¸FSP-B291163.0663.07noFrequency Range Extension 20 Hz for ¸FSP13/30¸FSP-B291163.0663.30noFrequency Range Extension 20 Hz for ¸FSP40¸FSP-B291163.0663.40noDC Power Supply for Spectrum Analyzers ¸FSP¸FSP-B301155.1158.02yesBattery Pack for Spectrum Analyzers ¸FSP¸FSP-B311155.1258.02yes¸FSP-B1 and¸FSP-B30 required Spare Battery Pack for Spectrum Analyzers ¸FSP¸FSP-B321155.1506.02yes¸FSP-B31 required Demodulation Hardware and Memory Extension¸FSP-B701157.0559.02yes required for ¸FS-K72/-K73; ¸FSP-B15 required SoftwarePhase Noise Measurement Software¸FS-K41108.0088.02GSM/EDGE Application Firmware, Mobile¸FS-K51141.1496.02AM/FM/ϕM Measurement Demodulator¸FS-K71141.1796.02Application Firmware for Bluetooth® Measurements¸FS-K81157.2568.02Power Sensor Measurements¸FS-K91157.3006.02supports ¸NRP-Z11/-Z21with ¸NRP-Z4 USB con-nectorApplication Firmware for Noise Figure and Gain Measurements¸FS-K301300.6508.02Preamplifier ¸FSP-B25recommended3GPP BTS/Node B FDD Application Firmware¸FS-K721154.7000.02¸FSP-B15 and -B70required3GPP UE FDD Application Firmware¸FS-K731154.7252.02¸FSP-B15 required,¸FSP-B70 recommended 3GPP HSDPA BTS Application Firmware¸FS-K741300.7156.02¸FS-K72 required3GPP TD-SCDMA BTS Application Firmware¸FS-K761300.7291.023GPP TD-SCDMA UE Application Firmware¸FS-K771300.8100.02CDMA2000® (IS-95) 1xEV-DV BTS FDD Application Firmware¸FS-K821157.2316.02CDMA2000® 1xEV-DV MS Application Firmware¸FS-K831157.2416.02CDMA2000® 1xEV-DO BTS Application Firmware¸FS-K841157.2851.02CDMA2000®-1xEV-DO MS Application Firmware¸FS-K851300.6689.02WLAN 802.11a TX Measurements Application Firmware¸FSP-K901300.6650.02The Bluetooth word mark and logos are owned by the Bluetooth SIG, Inc. and any use of such marks by Rohde&Schwarz is under license.CDMA2000® is a registered trademark of the Telecommunications Industry Association (TIA -USA).Spectrum Analyzer ¸FSP11Europe:Tel:+491805124242,e-mail:*********************************.com·USA:Tel.+1410-910-7988,e-mail:*********************************.comAsia:Tel.+6568463710,e-mail:***********************************.com¸i s a r e g i s t e r e d t r a d e m a r k o f R o h d e &S c h w a r z G m b H &C o . K G · T r a d e n a m e s a r e t r a d e m a r k s o f t h e o w n e r s · P r i n t e d i n G e r m a n y (B i a s )P D 0758.1206.22 · S p e c t r u m A n a l y z e r ¸F S P · V e r s i o n 05.00 · O c t o b e r 2004 · D a t a w i t h o u t t o l e r a n c e l i m i t s i s n o t b i n d i n g · S u b j e c t t o c h a n g eCertified Quality System ISO 9001Certified Environmental SystemISO 14001Product brochure see PD 0758.1206.12 and at (search term: FSP)Recommended extrasDesignationTypeOrder No.Headphones 0708.9010.00US Keyboard with Trackball ¸PSP-Z21091.4100.02PS/2 Mouse¸FSE-Z21084.7043.02DC Block,10kHz to 18GHz (type N)¸FSE-Z41084.7443.02Colour Monitor, 15", 230 V ¸PMC31082.6004.02IEC/IEEE Bus Cable, 1 m ¸PCK 0292.2013.10IEC/IEEE Bus Cable, 2 m ¸PCK 0292.2013.2019" Rack Adapter (not for ¸FSP-B1)¸ZZA4781096.3248.00Soft Carrying Case, grey¸ZZT4731109.5048.00Printed operating manual (German)–1093.4820.11Printed operating manual (English)–1093.4820.12Printed service manual (German)–1093.4820.81Printed service manual (English)–1093.4820.82Matching Pads, 75 ΩL Section¸RAM 0358.5414.02Series Resistor, 25 Ω1)1)Taken into account in device function RF INPUT 75 Ω.¸RAZ 0358.5714.02SWR Bridge, 5 MHz to 3 GHz ¸ZRB2 0373.9017.52SWR Bridge, 40 kHz to 4 GHz ¸ZRC 1039.9492.52High-Power Attenuators, 100 W 3/6/10/20/30 dB¸RBU1001073.8495.XX (XX=03/06/10/20/30)High-Power Attenuators, 50 W 3/6/10/20/30 dB ¸RBU501073.8695.XX (XX=03/06/10/20/30)For ¸FSP30Test Port Adapter, 3.5 mm male –1021.0529.00Test Port Adapter, N male–1021.0541.00Microwave Measurement Cable and Adapter Set ¸FS-Z151046.2002.02For ¸FSP40Test Port Adapter K male –1036.4802.00Test Port Adapter N male –1036.4783.00Test Port Adapter 2.4 mm female¸FSE-Z51088.1627.02Related data sheetsTitleOrder No.TV Trigger/RF Power Trigger ¸FSP-B6PD 0757.6433Noise Measurement Software ¸FS-K3 for Spectrum Analyzers ¸FSE, ¸FSIQ and ¸FSP PD 0757.2380Phase Noise Measurement Software ¸FSE-K4PD 0757.6727GSM/EDGE Application Firmware ¸FS-K5 for ¸FSP PD 0757.6185FM Measurement Demodulator ¸FS-K7 PD 0757.6685Bluetooth Application Firmware ¸FS-K8PD 0757.7730Application Firmware for Noise Figure and Amplifier Measure-ments R&S®FS-K30PD 0758.0839.32WCDMA 3GPP Application Firmware ¸FS-K72/-K73/-K74 PD 0757.7246TD-SCDMA Test Application Firmware ¸FS-K76/-K77 PD 0758.0880.32CDMA2000® Base Station Test Application Firmware 1xEV-DO Base Station Test Application Firmware ¸FS-K82/-K84PD 0758.1712.32Mobile Station Test Application Firmware ¸FS-K83/¸FS-K85PD 0758.1729.32WLAN Application Firmwar e ¸FSQ-K91/ ¸FSP-K90PD 0758.1435.12。
北方重工QAP. No :NHI-OLC-Q-01 Rev-0COMPONENT & OPERATIONCHARATERISTICS CLASSTYPE OF CHECKQUATUM OF CHECK REFERENCE DOCUMENT ACCEPTANCE NORMS FORMAT OF RECORD 部件操作特点等级检验类型检验程度参考文件接受规范记录格式MCO12345678911110QAP. No & Rev:REL -SUMPP-VQM-135-U-0002 , Rev 00Package: OLC SASAN Date:Page No. 1 of 9LEGEND字符含义:M: MANUFACTURER (NHI)/SUB CONTRACTOR 制造商C: EPC CONTRACTOR (RINFRA)承包商O: OWNER/ (VIPL) 业主 IR : INSPECTION REPORT检查报告TC: TEST CERTIFICATE证明 P: PERFORM执行TR : TEST REPORTS检验报告V: VERIFY 核实 W*: RANDOM WITNESS随机证明W: WITNESS 证明 H : HOLD POINT有效点Name of Contractor sign & Stamp 承包商印鉴M/s NHI (Sign& Stamp)制造商 NHI 印鉴R Infra Approval by (Name, Sign & stamp)REL 认可印鉴蛇形弹簧联轴器QUALITY ASSURANCE PLAN 质量保证计划Project:6×660mw SASAN Thermal Power Project ,India 项目:6×660萨珊火电项目,印度ITEM: PULLEY for OlC package AGENCY 代理SL.NO.1REMARKS 备注MANUFACTURER'S NAME &ADDRESS:制造商名称及地址:NHI Co.Ltd, SHENYANG蛇形弹簧联轴器北方重工QAP. No :NHI-OLC-Q-01 Rev-0COMPONENT & OPERATION CHARATERISTICS CLASSTYPE OFCHECKQUATUMOF CHECKREFERENCEDOCUMENTACCEPTANCENORMSFORMATOF RECORD部件操作特点等级检验类型检验程度参考文件接受规范记录格式M C O 12345678911 22.1Forging factorysupply thechemicalcompositionreport 锻件提供化学成分报告Visual 外观Major主要的Visual 外观100%Drawing 图纸Drawing图纸Material certificate材质单P_V2.2NDT(PULLEYSHAFT)Ultrasonic Testing ofForgingMajor主要的NDT100%ASTM A388ORGB/T 10595-2009ASTM A388ORGB/T 10595-2009IR P_V3Parts test零件检测Dimensions尺寸Major主要的Measurement测量100%Drawing 图纸Drawing 图纸Log Book记录书P_VR Infra Approval by(Name, Sign & stamp)REL认可印鉴QUALITY ASSURANCE PLANProject:6×660mw SASAN ThermalPower Project ,IndiaITEM: PULLEY OlC packageAGENCY代理10SL. NO.REMARKS备注QAP. No & Rev:REL -SUMPP-VQM-135-U-0002 , Rev 00Date:Page No. 1 of 9Forging锻件LEGEND字符含义:M: MANUFACTURER (NHI)/SUB CONTRACTOR 制造商C: EPC CONTRACTOR (RINFRA)承包商O: OWNER/ (VIPL) 业主 IR : INSPECTION REPORT检查报告TC: TEST CERTIFICATE证明 P: PERFORM执行TR : TEST REPORTS检验报告V: VERIFY 核实 W*: RANDOM WITNESS随机证明W: WITNESS 证明 H : HOLD POINT有效点Name of Contractorsign & Stamp承包商印鉴M/s NHI (Sign& Stamp)制造商 NHI 印鉴MANUFACTURER'S NAME &ADDRESS:NHI Co.Ltd, SHENYANG北方重工QAP. No :NHI-OLC-Q-01 Rev-0COMPONENT & OPERATION CHARATERISTICS CLASSTYPE OFCHECKQUATUMOF CHECKREFERENCEDOCUMENTACCEPTANCENORMSFORMATOF RECORD部件操作特点等级检验类型检验程度参考文件接受规范记录格式M C O 12345678911 44.1Key sizedetection关键尺寸检测Dimension andClearance Verification尺寸检测Major主要的Measurement测量100%ManufacturingDrawing制造图纸ManufacturingDrawing制造图纸IR P_V_4.3Heat treatment热处理布氏硬度Major主要的Measurement测量1 per batch按批检测ApprovedDrawings/TechSpec 制造图ApprovedDrawings/TechSpec 制造图Log Book记录书P_V5Dynamic balance动平衡Visual外观Major主要的Measurement测量100%JB/3714JB/3714Dynamic balancerecords动平衡记录P_V6Final inspection终检Completeness全套Major主要的Verification证明100%ApprovedDrawings/TechSpec 图纸ApprovedDrawings/TechSpec 图纸TC P_VQUALITY ASSURANCE PLANProject:6×660mw SASAN ThermalPower Project ,IndiaITEM: PULLEY OlC packageAGENCY代理10半联轴节LEGEND字符含义:M: MANUFACTURER (NHI)/SUB CONTRACTOR 制造商C: EPC CONTRACTOR (RINFRA)承包商O: OWNER/ (VIPL) 业主 IR : INSPECTION REPORT检查报告TC: TEST CERTIFICATE证明 P: PERFORM执行TR : TEST REPORTS检验报告V: VERIFY 核实 W*: RANDOM WITNESS随机证明W: WITNESS 证明 H : HOLD POINT有效点Name of Contractorsign & Stamp承包商印鉴M/s NHI (Sign& Stamp)制造商 NHI 印鉴R Infra Approval by(Name, Sign & stamp)REL认可印鉴SL. NO.4.2REMARKS备注NDT(PULLEYSHAFT)Magnetic particleinspectionMTMajor主要的NDT100%GB/T5000-2007QAP. No & Rev:REL -SUMPP-VQM-135-U-0002 , Rev 00Date:Page No. 1 of 9GB/T5000-2007MT recordMT报告P V MANUFACTURER'S NAME &ADDRESS:NHI Co.Ltd, SHENYANG北方重工QAP. No :NHI-OLC-Q-01 Rev-0北方重工QAP. No :NHI-OLC-Q-01 Rev-0。
Series 900Selection GuideHPS ® VACUUM TRANSDUCERSVacuum TechnologySeries 901 Plus MicroPirani ™/ Piezo Loadlock T ransducerA unique patented transducer designed specifi cally for the loadlock environment, the 901 Plus (901P) replaces up to three sensors in one compact package. The 901P provides both pressure measurement and atmospheric switching capabilities, by integrating the MicroPirani ™ andpiezo sensor technologies. The combined sensor output measures from 1x10-5 to 1,000 T orr for monitoring pump-down cycles. The differential sensor ensures accurate atmospheric pressure sensing under varying barometric pressure conditions, for optimum loadlock performance.Series 925 MicroPirani ™ T ransducerThe Series 925 MicroPirani transducer is a thermal conductivity gauge and incorporates a MEMS MicroPirani ™ sensor technology in a compact package. The 925 features an increased pressure measurement range from 10-5 Torr to atmosphere — two decades below a standard Pirani sensor. The 925 has three optional set point relays. With its extended range, the 925 may replace multiple transducers, in certain applications.Series 910 DualT rans ™ MicroPirani ™/Absolute Piezo T ransducerThe HPS ® Series 910 is a dual sensor transducer, combining MEMS-based MicroPirani and Piezo pressure measurement technologies with integrated electronics. The 910 transducer offers a pressure measurement range of 10-5 to 1,500 T orr.The Series 910 provides a single, smoothed output from the MicroPirani and Piezo sensors. The Piezo is a direct absolute pressure sensor, ensuring accurate measurement, independent of gas type above 15 T orr. The MicroPirani provides base pressure measurements from 10-5 to 15 T orr.Series 902 Absolute Piezo T ransducerThe HPS ® Series 902 Piezo transducer combines the pressure measurement technology of a MEMS-based Piezo sensor with integrated electronics. The 902 provides an economical, absolute measurement that is independent of gas type.The sensor includes a unique temperature compensation, allowing for high accuracy over a wide measurement range. The Piezo is available with a 1000 T orr full scale range, and is typically used in applications where greater accuracy or corrosion resistance is required.Operating Pressure Ranges (Torr)IntroductionHPS ® Series 900 vacuum transducers are a complete suite of microprocessor-based, standalone gauges,offering a wide pressure measurement range from above atmosphere to ultra high vacuum. Designed for system integration, the transducers offer both analog and digital communication (RS485 & RS232). Digital transducers allow for all adjustments and monitoring to be delivered real-time, via a host computer. The transducers incorporate MEMS (Micro Electro-Mechanical Systems) basedtechnologies, including MicroPirani™ and Piezo sensors, combined with both Cold Cathode and Mini Ion BAtechnology resulting in a broad product offering for a widevariety of customer applications.DescriptionSeries 909AR Hot Cathode T ransducerThe HPS® hot cathode transducer incorporates a miniature Bayard-Alpert sensor, which utilizes afi ne wire collector located at the center of a grid. Due to its small area, few x-rays hit the collector;therefore, the gauge can measure very low pressures. The 909C transducer includes two yttria-coated iridium fi laments for increased lifetime.The 909AR also includes RS232 / RS485 digital communication as a standard feature. Foradditional process control, the 909AR has a set point relay. The Series 909AR also featuresanalog controls and analog output with 0 to 10 volts semilogarithmic output, 1 volt per decade forsimplifi ed system integration.Series 979B Atmosphere to Vacuum MicroPirani/Hot Cathode T ransducerThe Series 979B Atmosphere to Vacuum (A TV) transducer provides a wide measurement rangefrom 10-10 T orr to atmosphere. It combines the MEMS-based MicroPirani with the Mini Ion BAgauge, covering 13 decades of measurement. The 979B provides a single, smoothed output for aseamless transition between the two sensors.The Series 979B is ideal for applications requiring a single, compact transducer solution where abroad pressure range is required, such as vacuum coating systems.Series 999 Quattro™MicroPirani/Piezo/Hot Cathode T ransducerThe Series 999 Quattro™ is the ultimate transducer solution, providing pressure measurement from10-10 T orr to atmosphere, combined with atmospheric switching capabilities.The 999 combines three of HPS’ key technologies into an integrated gauge solution, and has thefunctionality of four sensors in one compact package. The Quattro™ combines the mini-BA sensor,the MEMS-based MicroPirani™ sensor and a unique Piezo sensor (offering both differential andabsolute sensor functions).The Series 999 Quattro™ has the ability to replace multiple sensors, including: ionization and Piranigauges, and sub-atmospheric and atmospheric pressure switches. This enables the end-user tosave time, money and valuable tool space.Series 970 Cold Cathode T ransducer FamilyThe 970 Series is a family of compact, low cost, general-purpose transducers that utilize from oneto three sensors- cold cathode, MicroPirani™, and Piezo technologies. Combining these sensingtechnologies enables a wide measurement range from atmosphere to 10-8 T orr. In addition to itssmall size, broad range and lower cost, the 970 Series can be operated via digital communicationor as an autonomous analog unit. The family comprises of three transducer models, the 971UniMag (cold cathode), 972 DualMag (Pirani/cold cathode) and the 974 QuadMag (Piezo/Pirani/ cold cathode).PDR900 Series 900 ControllerThe PDR900 power supply and readout unit is a stand alone, single channel controller for usewith the Series 900 digital vacuum transducers. The instrument sets new standards for vacuumgauge controllers and can be used as a standalone power supply readout unit or as a tool forconfi guration, calibration and diagnostics of system integrated transducers in OEM applications.Series 901PSeries 925Series 910Series 902Sensor Type MicroPirani/Differential Piezo MicroPiraniMicroPirani/Absolute Piezo Absolute Piezo Measuring Range 1.0 X 10-5 to 1,000 Torr 1.0 X 10-5 Torr to Atmosphere 1.0 X 10-5 to 1,500 Torr 1,000 Torr full scale Set Point Range5.0 X 10-4 to 1,000 Torr 5.0 X 10-4 Torr to Atmosphere 5.0 X 10-4 to 1,500 Torr 1 to 1,000 Torr Measuring Range - Differential -760 to +760 Torr ----- ----- -----Set Point Range - Differential -760 to +760 Torr----- ----- -----Calibration GasAir, Argon, Helium, Nitrogen, H 2, H 2O vapor. Gas independent above 65 TorrAir, Argon, Helium, Nitrogen, H 2, H 2O vaporAir, Argon, Helium, Nitrogen, H 2, H 2O vapor. Gas independent above 10 Torr Gas independentOperating Temperature Range 0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F)0° to 50°C (32° to 122°F)Maximum Bakeout Temperature 85°C (185°F), non-operating 85°C (185°F), non-operating 85°C (185°F), non-operating 85°C (185°F), non-operating Communication RS232 / RS485 / Analog RS232 / RS485 / Analog RS232 / RS485 / Analog RS232 / RS485 / AnalogControlsZero adjust, span adjust, pressure units, baud rate, address, factory default, gas type; set point functions: value, hysteresis, direction, enableZero adjust, atmosphere adjust, pressure units, baud rate, address, factory default, gas type; set point functions: value, hysteresis,direction, enableZero adjust, span adjust, pressure units, baud rate, address, factory default, set point functions: value, hysteresis, direction, enableZero adjust, span adjust, pressure units, baud rate, address, factory default, gas type; set point functions: value, hysteresis, direction, enableStatusPressure reading and units,set point, operating time, transducer temperature, user tag, model, device type, serial number, fi rmware and hardware versions Pressure reading and units,set point, operating time, transducer temperature, user tag, model, device type, serial number, fi rmware and hardware versions Pressure reading and units,set point, operating time, transducer temperature, user tag, model, device type, serial number, fi rmware and hardware versions Pressure reading and units,set point, operating time, transducer temperature, user tag, model, device type, serial number, fi rmware and hardware versionsAnalog Output 1 to 9 VDC, 1 volt/decade 1 to 9 VDC, 1 volt/decade 1 to 9.2 VDC, 1 volt/decade 0 to 5 or 0 to 10 VDC, linear or logarithmicRelays (optional)Relay Contact Rating 3 relays SPDT1 A @ 30VAC/DC, resistive 3 relays SPDT (925)1 A @ 30VAC/DC, resistive 3 relays SPDT1 A @ 30VAC/DC, resistive 1 relay SPDT1 A @ 30VAC/DC, resistive Power Requirements 9 to 30 VDC, < 1.5 watts max9 to 30 VDC, < 1.5 watts max9 to 30 VDC, < 1.5 W max 12 to 30 VDC, 30 mA, <.5 W max Accuracy (Typical)5 X 10-4 to 10-3 Torr ±10% of reading 10-3 to 50 Torr ±5% of reading 50 to 1,000 Torr ±1% of reading ± 100 Torr Diff <1% of reading 5 X 10-4 to 10-3 Torr ±10% of reading 10-3 to 100 Torr ±5% of reading 100 to atm ±25% of reading 5 X 10-4 to 10-3 Torr ±10% of reading 10-3 to 50 Torr ±5% of reading 50 to 1,000 Torr ±1% of reading Accuracy: <1% of readingTemp. Coeff. Span: ± 0.02% of FS/°C Temp. Coeff. Zero: ± 0.02% of FS/°C Resolution: 1 X 10-4 of FS Repeatability (Typical)5 X 10-4 to 10-3 Torr ±8% of reading 10-3 to 50 ± 2% of reading 50 to 1,000 ± 0.5% of reading ± 100 Torr Diff <0.5% of reading 5 X 10-4 to 10-3 Torr ±8% of reading 10-3 to 100 Torr ± 2% of reading 100 to atm ±10% of reading 5 X 10-4 to 10-3 Torr ±8% of reading 10-3 to 50 Torr ± 2% of reading 50 to 1,000 Torr ± 0.5% of reading ± 0.03% of full scaleOverpressure Limit 1500 Torr 1500 Torr1500 Torr2000 Torr Installation Orientation AnyAny Any Any Internal Volume (KF16) 2.8 cm 3 maximum2.8 cm 3 maximum2.8 cm 3 maximum3.4 cm 3Materials Exposed to VacuumSilicon, SiO 2, SiN 4, gold, epoxy resin, 304 stainless steel, Viton ®, aluminum Silicon, SiO 2, SiN 4, gold, epoxy resin, 304 stainless steel, Viton ®Silicon, SiO 2, SiN 4, gold, epoxy resin, stainless steel, Viton ®, aluminum304, 316 stainless steelElectronic Casing 304 stainless steel 304 stainless steel 304 stainless steel 304 stainless steel, aluminum Weight (KF16)170 g170 g209 g97 gCE Certifi cationEMC Directive 2004/108/ECEMC Directive 2004/108/ECEMC Directive 2004/108/ECEMC Directive 2004/108/ECMedium Vacuum T ransducersNote 1: Accuracy and repeatability are typical values measured with Nitrogen gas at ambient temperature after zero adjustment.Series 971Series 972Series 974Sensor Type Cold Cathode Cold Cathode / MicroPirani(MEMS Thermal Conductivity)Cold Cathode / MicroPirani (MEMS Thermal Conductivity) / Piezo Differential (MEMS Diaphragm)Measuring Range Absolute 1 x 10-8 Torr to 5 x 10-3 Torr 1 x 10-8 Torr to Atmosphere 1 x 10-8 Torr to 1500 Torr Measuring Range Differential N/A N/A-760 to +100 TorrSet Point Range Absolute 1 x 10-8 Torr to 5 x 10-3 Torr 1 x 10-8 Torr to Atmosphere 1 x 10-8 Torr to 1000 Torr Set Point Range Differential N/A N/A-760 to +100 Torr Calibration Gas Nitrogen Nitrogen NitrogenOperating Temperature Range0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F) Maximum Bakeout Temperature85°C (185°F), non-operating85°C (185°F), non-operating85°C (185°F), non-operating Digital Communications RS232 / RS485 / Analog RS232 / RS485 / Analog RS232 / RS485 / AnalogControls Pressure units, baud rate, address, factorydefault, user tag, RS485 test, gas correction;set point functions: value, hysteresis,direction, HV enable, protect, controlset point, gas type Pressure units, baud rate, address, factorydefault, user tag, RS485 test, gas correction;set point functions: value, hysteresis,direction, HV enable, protect, controlset point, gas typePressure units, baud rate, address, factorydefault, user tag, RS485 test, gas correction;set point functions: value, hysteresis,direction, HV enable, protect, controlset point, gas typeStatus Pressure reading and units, set point,transducer temperature, user tag, model,device type, serial number, fi rmware andhardware versions Pressure reading and units, set point,transducer temperature, user tag, model,device type, serial number, fi rmware andhardware versionsPressure reading and units, set point,transducer temperature, user tag, model,device type, serial number, fi rmware andhardware versionsAnalog Output (Absolute Pressure)0.5 VDC / decade1.5 to 4.5 VDC0.5 VDC / decade1.5 to 7 VDC0.5 VDC / decade1.5 to 7 VDCRelays (optional) 3 relays, SPDT 3 relays, SPDT 3 relays, SPDTRelay Contact Rating 1 A @ 30VAC/DC, resistive 1 A @ 30VAC/DC, resistive 1 A @ 30VAC/DC, resistive Power Requirements9-30 VDC, 2 W9-30 VDC, 2 W9-30 VDC, 2 WAccuracy (Typical) Combined Absolute 5 x 10-8 Torr to 10-3 ± 30% of reading 5 x 10-8 Torr to 10-3 ± 30% of reading10-3 to 100 ±5% of reading5 x 10-8 Torr to 10-3 ± 30% of reading10-3 to 50 Torr ±5% of reading50 to 1000 Torr ± 1% of readingRepeatability (Typical) Combined Absolute 5 x 10-8 Torr to 10-3 ± 30% of reading 5 x 10-8 Torr to 10-3 ± 30% of reading10-3 to 100 ±2% of reading5 x 10-8 Torr to 10-3 ± 30% of reading10-3 to 50 ±2% of reading50 to 1000 Torr ± 1% of readingAccuracy (Typical) Differential N/A N/A-10 to +10 Torr ±10% of reading-100 to -10 Torr ±8% of reading-760 to -100 Torr ±1% of reading+10 to 100 Torr ±5% of readingRepeatability (Typical)DifferentialN/A N/A-760 to +10 Torr ±1% of readingZero Stability (Typical)DifferentialN/A N/A±0.1% of Full Scale (F.S. = 760 Torr) Overpressure Limit1500 Torr1500 Torr1500 TorrInstallation Orientation Any Any AnyInternal Volume21 cm321 cm321 cm3Materials Exposed to Vacuum304 and 403 stainless steel, Viton®, epoxyresin, ceramic 304 and 403 stainless steel, silicon, SiO2,SiN4, gold, Viton®, epoxy resin, ceramic304 and 403 stainless steel, silicon, SiO2,SiN4, gold, Viton®, epoxy resin, ceramicElectronic Casing304 stainless steel304 stainless steel304 stainless steel Weight (KF25)360 g360 g360 gCE Certifi cation EMC Directive 2004/108/EC EMC Directive 2004/108/EC EMC Directive 2004/108/EC Cold Cathode Vacuum T ransducersNote 1: Accuracy and repeatability are typical values measured with Nitrogen gas at 20°C. Changes to gas type and temperature may effect gauge accuracy.Specifi cationsSeries 909AR Series 979B Series 999Sensor Type Bayard-Alpert Bayard-Alpert/MicroPirani Bayard-Alpert/MicroPirani/Differential Piezo Measuring Range 3.0 X 10-10 to 5.0 X 10-2 Torr 5 x 10-10 Torr to Atmosphere 5 x 10-10 Torr to AtmosphereSet Point Range 5.0 X 10-10 to 9.5 X 10-3 Torr 5.0 x 10-10 to 100 Torr 5.0 x 10-10 Torr to Atmosphere Measuring Range - Differential ----- ------760 to +100 TorrSet Point Range - Differential ----- ------760 to +100 TorrCalibration Gas Nitrogen Nitrogen NitrogenOperating Temperature Range0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F)0° to 40°C (32° to 104°F)Maximum Bakeout Temperature300°C max, electronics removed, 150°C max,withKF/Viton seal, electronics removed85°C (185°F), non-operating85°C (185°F), non-operating Communication RS232 / RS485 / Analog RS232 / RS485 / Analog RS232 / RS485 / AnalogControls Pressure units, baud rate, address, factorydefault, user tag, degas, RS485 test, gascorrection, emission current, set pointfunctions: value, hysteresis, enable; fi lamentfunctions: power, protect, selection. Filamenton/off, degas on/off, emission current range,active fi lament Pressure units, baud rate, address, factorydefault, user tag, degas, RS485 test, gascorrection, emission current, set point func-tions: value, hysteresis, direction, enable;fi lament functions: power, protect, selection,control set point, gas typePressure units, baud rate, address, factorydefault, user tag, degas, RS485 test, gascorrection, emission current, set pointfunctions: value, hysteresis, direction,enable; fi lament functions: power, protect,selection, control set point, gas typeStatus Pressure reading and units, set point, fi lament,active fi lament, fi lament operating time,transducer temperature, user tag, model,device type, serial number, fi rmware, hardwareversions, analog output Pressure reading and units, set point,fi lament, active fi lament, fi lament operatingtime, transducer temperature, user tag,model, device type, serial number, fi rmware,hardware versions, analog outputPressure reading and units, set point,fi lament, active fi lament, fi lament operatingtime, transducer temperature, user tag,model, device type, serial number, fi rmware,hardware versions, analog outputAnalog Output 0 to 10 VDC, semilogarithmic1 volt/decade0.5 to 7 VDC, 0.5 VDC / decade0.5 to 7 VDC, 0.5 VDC / decadeRelaysRelay Contact Rating 1 relay SPDT1A @ 30VAC/DC, resistive3 relays SPST1A @ 30VAC/DC, resistive load3 relays SPST1A @ 30VAC/DC, resistive loadPower Requirements24 VDC, 15 Watts24 VDC, 15 Watts24 VDC, 15 WattsAccuracy (Typical)± 20% of reading10-9 to 10-3 Torr ±20% of reading10-3 to 100 Torr ±5% of reading100 to atm ±25% of reading 10-9 to 10-3 Torr ±20% of reading 10-3 to 50 Torr ± 5% of reading 50 to 1,000 Torr ± 1% of reading ± 100 Torr Diff <1% of readingRepeatability (Typical)Approx. 5% of reading1x10-9 to 10-3 Torr ±5% of reading10-3 to 100 Torr ± 2% of reading100 to atm ±10% of reading 1x10-9 to 10-3 Torr ±5% of reading 10-3 to 50 Torr ± 2% of reading 50 to 1,000 Torr ± 0.5% of reading ± 100 Torr Diff <0.5% of readingOverpressure Limit 1500 Torr1500 Torr1500 Torr Installation Orientation Any Any Any Internal Volume (CF 2.75")23 cm323 cm325 cm3Materials Exposed to Vacuum 304 stainless steel, glass, tungsten, platinumclad molydenum, yttria-coated iridium(fi lament)304 stainless steel, silicon, SiO2, SiN4,gold, Viton®, glass, tungsten, platinumclad molydenum, yttria-coated iridium,epoxy resin304 stainless steel, silicon, SiO2, SiN4,gold, Viton®, glass, tungsten, platinum cladmolydenum, yttria-coated iridium, Invar,Sn/Ni plating, Sn/Ag solder, epoxyElectronic Casing Aluminum Aluminum AluminumWeight (KF fl ange)370 g422 g460 gCE Certifi cation EMC Directive 2004/108/EC EMC Directive 2004/108/EC EMC Directive 2004/108/EC Hot Cathode Vacuum T ransducersNote 1: Accuracy and repeatability are typical values measured with Nitrogen gas at 20°C. Changes to gas type and temperature may effect gauge accuracy.Ordering InformationDescription CodeTransducer Model 901P Load Lock 901P-925 MicroPirani 925- 971 UniMag 971- 972 DualMag 972-974 QuadMag 974- FlangeKF161 1 KF252 1/8” npt 13 VCR414 VCR815 CF1.3316 CF2.7527 KF16 extended 18 KF40 9InterfaceRS232/ Analog 1 RS485/Analog 2Analog Out Standard MKS 0Connector Relays SUBD 15pinHD male / no relay 2 SUBD 15pinHD male / 3 relays3SUBD 15pinHD male/3 relays/ Dual Aout (piezo differential)34SUBD 15pinHD male / 3 relays / Dual Aout (Absolute)3 5Enclosure Sealing Standard / Viton sealing 0UHV sealing (925 only)11Not available on 971, 972, and/or 974. 2 Not available on 901P and/or 925. 3 Consult factory for available outputs.Ordering Code Example: 901P-11030 = KF16, RS232, standard analog output, Sub D 15 pin HD male, 3 relays, Viton.Analog OutputThe above transducers have a standard 15 pin HD SUBD connector and an analog output voltage pressure signal of 0.5VDC/decade or 1VDC/decade. It can also emulate analog voltage outputs from a variety of other vacuum transducers. The emulation feature can be used to upgrade and replace other vendors’ gauges in OEM applications without changing system software. Contact MKS technical support for details.Series 901P, 925, 971, 972 and 974Series 902DescriptionCodeTransducer Model 902-1 Absolute Piezo902-1 Flange KF1614VCR-F 2 8VCR-F 3Interface Analog 0-5 VDC 04 Analog 0-10 VDC 05 Digital RS485 12 Digital RS23213Ordering Code Example: 902-1113 = KF16, RS232Series 910DescriptionCodeTransducer Model 910910- Flange KF161 KF252 1/8” NPT3 4VCR-F4 8VCR-F5 KF16 ext8Interface RS232/analog1RS485/analog2Ordering Code Example: 910-11= KF16, RS232Ordering Inf ormation。
©Welco China LimitedNOTE:This document contains information proprietary to Welco China Limited.. Any reproduction, disclosure or use of this document is prohibited unless prior permission is obtained from the originating department. Internal use of this document is restricted to the person(s) on the distribution list or their delegate(s) only.PREPARED BY: REVIEWED BY : APPROVED BY:Signature : Signature :Signature :Name : Mo Ming Name : Steven Lim Name : Joe TamPosition : Snr Engineer Position : Assistant GM Position :Acting VP Operation Date : Oct 05,2000 Date : Oct 05,2000 Date : Oct 05,2000REVISION STATUSWelco China LimitedINDEX0.0 Definition1.0 Policy2.0 Purpose3.0 Scope4.0 Responsibility5.0 Special Terms6.0 SCAR Procedure●The conditions of issue a SCAR●Request for supplier corrective action●Follow-up the effectiveness of SCAR7.0 AppendixSCAR FORM0.0 DefinitionWelco China Limited0.1 AQL - Acceptable Quality Level0.2 ASL - Approved Supplier List0.3 CCE - ConCurrent Engineering0.4 CER - Central Engineering Resource0.5 CQA - Central Quality Assurance department0.6 PUR - Purchasing department0.7 QA - Quality Assurance0.8 QAM - Quality Assurance Manager0.9 SBU - Strategic Business Unit0.10 SQAP - Supplier Quality Acceptance Policy0.11 SQR -Supplier Quality Rating0.12 SSSQ -Supplier System Survey and Qualification0.13 STS - Ship to Stock0.14 Supplier - Supplier shall mean manufacturer, agency or distributor0.15 WCL - Welco China Limited0.16 WEC - Wong‘s Electronics Co. Ltd.REFERENCE DOCUMENTQAP-0029 Supplier quality acceptance policyQAP–C0020 Corrective Action ProcedureQAP-0034 Supplier Management at SupplierSQA-058 Supplier plant auditSQA-031 Supplier System Survey QualificationSQA-050 Supplier Quality Rating1.0 PolicyThe SCAR is a tool for WCL to feedback quality issue countable to supplier.2.0 Purpose●To establish and specify systematic steps for corrective actions in the resolutionof supplier quality-related problems.● To initiate a tutorial for issuing and monitoring supplier corrective action request tosuppliers for continuous quality improvement.3.0 ScopeThis procedure applies to all suppliers of Welco.Welco China Limited4.0 Responsibility4.1 SBU QA4.1.1 To issue SCAR to supplier when find the supplied material quality deteriorated duringincoming inspection, production lines, reliability test, source inspection, supplier qualityannual audit etc.4.1.2 Follow-up the corrective action of supplier.4.1.3 Maintain the SCAR log monthly.4.2 SBU PURTo expedite supplier response of SCAR within due date.4.3 SUPPLIER4.2.1 Review problems for solution.4.2.2 Implement permanent change through documentation.4.2.3 Instantaneously feedback the issues of SCAR and submit the detail corrective action,toprevent the same problem happened within due date.4.0Special Terms5.0SCAR ProcedureThe condition of issue a SCAR5.1More than 1 major non-conformance found during supplier plant audit.5.2IQC/SI /Line Dppm are over requirement as per SQA-080.5.3Critical defect which is caused of supplier is found in IQC/ SI / Lines.Request for supplier corrective actions5.4Create a SCAR referring to Appendix SCAR Form.5.5Determine the due date●For the first time, due date is set to be two weeks from the issuance date.●For the second issue, due date is set to be one week from the issuance date.5.6SBU QA send the SCAR to supplier .5.7 Response●Supplier shall derive the corrective action plan to address the specified non-conformances and return to Welco with target implementation dates by due date.Welco China Limited5.8Expediting●If SCAR is not replied within two weeks, the relevant QA people shall send the secondissue of the SCAR to supplier to exped iting supplier’s response, inform the purchasingdept. to help expediting supplier’s response simultaneously.●Should the supplier fail to reply the SCAR within three weeks ( within the due date ofthe second issue ), SBU Purchasing dept. shall review the PO status of the supplier ,consider to cancel of the PO due to the supplier does not have intention to improve itsquality to meet with our requirement.●Follow-up the effectiveness of SCAR5.9SBU QA shall determine the methods of verifying the SCAR effectiveness .●Revisit to the supplier to follow up the corrective actions as per supplier’s response.●The performance of supplier quality rating as per SQA-050.5. 10 SBU QA shall collect enough evidence that prove the supplier has taken necessarycorrective actions .5.11 Close the SCAR if the supplier completes the corrective actions.5.12 SBU QA shall issue second ( or third ) SCAR to the supplier in case of the correctiveactions are not taken.SCAR as quality measurement of supplier5.13 STS privilege under the commodity will be disqualified in terms of the supplier receivestwo SCAR within a period of three months as per SQA-080.5.14 SCAR Log●SBU QA shall establish SCAR Log to monitor SCAR status.Appendix : SCAR FormSUPPLIER CORRECTIVE ACTION REQUESTSupplier Name:________________ Issue Date:_________ SCAR No._____________Welco China LimitedWelco China Limited。
REV DESCRIPTION DATEPREPAPPDG EC20973 7/10/23SMLT/AJOscillator Specification, Hybrid VCXOACMOS, 9x14 mm, J-Lead MOUNT HOLLY SPRINGS, PA 17065 Hi-Rel Standard THE RECORD OF APPROVAL FOR THISDOCUMENT IS MAINTAINED ELECTRONICALLYCODE IDENT NO SIZE DWG. NO.REV1. SCOPE1.1General. This specification defines the design, assembly, and functional evaluation of highreliability, VCXO’s produced by Vectron. Devices delivered to this specification represent the standardized Parts, Materials and Processes (PMP) Program developed, implemented, andcertified for advanced applications and extended environments.1.2Applications Overview. The designs represented by these products were primarily developedfor the MIL-Aerospace community. The lesser Design Pedigrees and Screening Optionsimbedded within DOC206218 bridge the gap between Space and COTS hardware by providing custom hardware with measures of mechanical, assembly and reliability assurance needed for Military or Ruggedized COTS environments.2.APPLICABLE DOCUMENTS2.1Specifications and Standards. The following specifications and standards form a part of thisdocument to the extent specified herein. The issue currently in effect on the date of quotation will be the product baseline, unless otherwise specified. In the event of conflict between thetexts of any references cited herein, the text of this document shall take precedence.MilitaryControlled, General Specification For MIL-PRF-55310 Oscillators,CrystalMicrocircuits, General Specification ForMIL-PRF-38534 HybridStandardsMIL-STD-202 Test Method Standard, Electronic and Electrical Component PartsMIL-STD-883 Test Methods and Procedures for MicroelectronicsOtherDOC206251 Test Specification, DOC206218 Hybrids, Hi-Rel StandardQSP-90100 Quality Systems Manual, VectronDocuments,Materials and Processes, Hi-Rel XOCommonDOC011627 IdentificationSpecificationDOC203982 DPAElectrostatic Discharge PrecautionsforQSP-91502 ProcedureDOC208191 Enhanced Element Evaluation for Space Level Hybrid OscillatorsDOC220429 Packaging Standards, Hi-Rel SeriesREQUIREMENTS3. GENERAL3.1 Classification. All devices delivered to this specification are of hybrid technology conformingto Type 2, Class 2 of MIL-PRF-55310. Primarily developed as a Class S equivalentspecification, options are imbedded within it to also produce Class B, Engineering Model and Ruggedized COTS devices. Devices carry a Class 2 ESDS classification per MIL-PRF-38534.3.2 Item Identification. See paragraph 7.1 for part number configuration.3.3 Absolute Maximum Ratings.a. Supply Voltage Range (V CC): -0.5Vdc to +7.0Vdcb. Storage Temperature Range (T STG): -65°C to +125°Cc. Junction Temperature (T J): +175°Cd. Lead Temperature (soldering, 10 seconds): +300°Ce. Output Source/Sink Current: ±70 mA3.4 Design, Parts, Materials and Processes, Assembly, Inspection and Test.3.4.1 Design. The ruggedized designs implemented for these devices are proven in military andspace applications under extreme environments. The design utilizes a 4-point crystal mount in compliment with Established Reliability (MIL-ER) componentry. When specified, radiationtolerant active devices up to 100krad(Si) (RHA level R) can be included without altering thedevice’s internal topography.3.4.1.1 Design and Configuration Stability. Barring changes to improve performance by reselectingpassive chip component values to offset component tolerances, there will not be fundamental changes to the design or assembly or parts, materials, and processes after first product delivery of that item without notification.3.4.1.2 Environmental Integrity. Designs have passed the environmental qualification levels of MIL-PRF-55310.3.4.2 Prohibited Parts, Materials and Processes. The items listed are prohibited for use in highreliability devices produced to this specification.a. Gold metallization of package elements without a barrier metal.b. Zinc chromate as a finish.c. Cadmium, zinc, or pure tin external or internal to the device.d. Plastic encapsulated semiconductor devices.e. Ultrasonically cleaned electronic parts.f. Heterojunction Bipolar Transistor (HBT) technology.g. ‘getter’ materials3.4.3 Assembly. Manufacturing utilizes standardized procedures, processes, and verificationmethods to produce MIL-PRF-55310 Class S / MIL-PRF-38534 Class K equivalent devices.MIL-PRF-38534 Group B Option 1 in-line inspection is included on radiation hardened partnumbers to further verify lot pedigree. Devices are handled in accordance with Vectrondocument QSP-91502 (Procedure for Electrostatic Discharge Precautions). Elementreplacement will be as specified in MIL-PRF-38534, Rev L.3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered tothis document. Inspection conditions and standards are documented in accordance with theQuality Assurance, ISO-9001 and AS9100 derived, System of QSP-90100.3.4.5 Test. The Screening test matrix of Table 4 is tailored for selectable-combination testing toeliminate costs associated with the development/maintenance of device-specific documentation packages while maintaining performance integrity.3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310. Inaddition, when devices are identified with laser marking, the Resistance to Solvents testspecified in MIL-PRF-55310 Group C, Mil-PRF-55310 Qualification or MIL-PRF-38534Group B Inspection will not be performed.3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see ¶ 5.2) use thesame robust designs found in the other device pedigrees. They do not include the provisions of traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.REQUIREMENTS4. DETAIL4.1 Components4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for thedevices. The optional use of Premium Q swept quartz can, because of its processing to remove impurities, be specified to minimize frequency drift when operating in radiation environments.In accordance with MIL-PRF-55310, the manufacturer has a documented crystal elementevaluation program.4.1.2 Passive Components.4.1.2.1 For Design Pedigree E, where available, resistors shall be Established Reliability, Failure RateR (as a minimum) and capacitors shall be Failure Rate S. Where resistors and capacitors arenot available as ER parts, and for all other passive components, the parts shall be fromhomogeneous manufacturing lots that have successfully completed the Enhanced ElementEvaluation of DOC208191 which meets the requirements of Mil-PRF-38534 Revision L forClass K.4.1.2.2 For Design Pedigrees R, V and X, where available, resistors shall be Established Reliability,Failure Rate R (as a minimum) and capacitors shall be Failure Rate S. Where resistors andcapacitors are not available as ER parts, and for all other passive components, the parts shall be from homogeneous manufacturing lots that have successfully completed the Class K Element Evaluation of Mil-PRF-38534 Revision K for Class K.4.1.2.3 For Design Pedigrees B and C, all passive elements shall comply with the Element Evaluationrequirements of Mil-PRF-55310 Class B as a minimum.4.1.2.4 For Design Pedigree D, the passive elements will be COTs level or higher.4.1.2.5 When used, inductors will be open construction and may use up to 47-gauge wire.4.1.3 Microcircuits.4.1.3.1 For Design Pedigree E, the microcircuits shall be from homogeneous wafer lots that meet theEnhanced Element Evaluation requirements in DOC208191 and meet the requirements of Mil-PRF-38534 Revision L for Class K.4.1.3.2 For Design Pedigree R, V and X, microcircuits shall be from homogeneous wafer lots that havesuccessfully completed the MIL-PRF-38534, Revision K Lot Acceptance Tests for Class K. 4.1.3.3 For Design Pedigrees B and C, microcircuits are procured from wafer lots that havesuccessfully completed the MIL-PRF-55310 Lot Acceptance Tests for Class B as a minimum.4.1.3.4 For Design Pedigree D, microcircuits can be COTs level or higher.4.1.4 Semiconductors (Varactor Diode)4.1.4.1 For Design Pedigree E, the semiconductors shall be from homogeneous wafer lots that meetthe Enhanced Element Evaluation requirements in DOC208191.4.1.4.2 For Design Pedigree R, V and X, semiconductors shall be from homogeneous wafer lots thathave successfully completed the MIL-PRF-38534, Revision K Lot Acceptance Tests for Class K devices as a minimum.4.1.4.3 For Design Pedigree B and C, semiconductors are procured from wafer lots that havesuccessfully completed the MIL-PRF-55310 Lot Acceptance Tests for Class B devices as a minimum.4.1.4.4 For Design Pedigree D, semiconductors can be COTs level or higher.4.1.5 Radiation. Microcircuits for Design Pedigrees E, R and V are certified to 100krad(Si) totalionizing dose (TID), RHA level R (2X minimum margin). NSC, as the original 54ACT designer, rates the SEU LET up to 40 MeV and SEL LET up to 120MeV for the FACT™ family (AN-932). Vectron conducted additional SEE testing in 2008 to verify this performance since our lot wafer testing does not include these parameters and determinations. Varactor diodes are considered radiation tolerant by design.4.1.6 Packages. Packages are procured that meet the construction, lead materials and finishes asspecified in MIL-PRF-55310. All leads are Kovar with gold plating over a nickel underplate.Package lots are evaluated in accordance with the requirements of MIL-PRF-38534. Vectronwill not perform Salt Spray testing as part of MIL-PRF-55310 Group C/Qualification. Inaccordance with MIL-PRF-55310, package evaluation results for salt atmosphere will besubstituted for Salt Spray testing during MIL-PRF-55310 Group C/Qualification.4.1.7 Traceability and Homogeneity. All design pedigrees except option D have active device lotsthat are traceable to the manufacturer’s individual wafer; all other elements and materials aretraceable to their manufacturer and incoming inspection lots. Design pedigrees E, R, V and Xhave homogeneous material. In addition, swept quartz crystals are traceable to the quartz barand the processing details of the autoclave lot. A production lot, as defined by Microchip, is all oscillators that have been kitted and built as a single group. The maximum deliverablequantity with a single lot date code is 225 units. Order quantities that exceed 225 units will be delivered in multiple lot date codes with deliveries separated by 2 weeks. If applicable, eachproduction lot will be kitted with homogeneous material which is then allocated acrossmultiple lot date code builds to satisfy the deliverable order quantity. When ordered, Group CInspection, lot qualifications, and/or DPA will be performed on the first build lot within theproduction lot unless otherwise stated on the purchase order.4.2 Mechanical.4.2.1 Package Outline. See Figure 1.4.2.2Thermal Characteristics. The worst-case thermal characteristics are found in Table 3.4.2.3Lead Forming. When the lead forming option is specified, the applicable leak test specified inscreening will be performed after forming.4.3 Electrical.4.3.1 Input Power. Devices are available with an input voltage of either +5.0 Vdc (±5%) or +3.3 Vdc(±5%). Current is measured, no load, at maximum rated operating voltage.4.3.2 Temperature Range. Operating range is -40°C to +85°C.4.3.3 Absolute Pull Range. Absolute pull range is defined as the minimum guaranteed amount theVCXO can be varied about the center frequency (fo). It accounts for degradations includingtemperature stability (-40°C to +85°C), aging (15 years), radiation effects, power supplyvariations (±5%) and load variations (±10%).4.3.4 Frequency Aging. When tested in accordance with MIL-PRF-55310 Group B inspection, the15-year aging projection shall not cause the minimum APR limit to be exceeded.4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the devicefrequency and are in accordance with Table 1. Waveform measurement points and logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.4.3.6Output Load. ACMOS (10kΩ, 15pF) test loads are in accordance with MIL-PRF-55310.5.QUALITY ASSURANCE PROVISIONS AND VERIFICATION5.1Verification and Test. Device lots shall be tested prior to delivery in accordance with theapplicable Screening Option letter as stated by the 15th character of the part number. Table 4tests are conducted in the order shown and annotated on the appropriate process travelers and data sheets of the governing test procedure. For devices that require Screening Options thatinclude MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group AElectrical Test are combined into one operation.5.1.1Screening Options. The Screening Options, by letter, are summarized as:A Modified MIL-PRF-38534 Class KB Modified MIL-PRF-55310 Class B Screening & Group A Quality ConformanceInspection (QCI)C Modified MIL-PRF-55310 (Rev E) Class S Screening & Group A QCID Modified MIL-PRF-38534 Class K with Group B AgingE Modified MIL-PRF-55310 Class B Screening, Groups A & B QCIF Modified MIL-PRF-55310 (Rev E) Class S Screening, Groups A & B QCIG Modified MIL-PRF-55310 Class B Screening & Post Burn-in NominalElectricalsS MIL-PRF-55310 (Rev F) Class S Screening & Groups A & B QCIX Engineering Model (EM)5.2 Optional Design, Test and Data Parameters. The following is a list of design, assembly,inspection, and test options that can be selected or added by purchase order request.a. Design Pedigree (choose one as the 5th character in the part number):(E) Enhanced Element Evaluation, (MIL-PRF-38534 Rev L for Class K components asspecified in DOC208191), 100krad die, Premium Q Swept Quartz(R) Hi-Rel design w/ 100krad Class K die, Premium Q Swept Quartz(V) Hi-Rel design w/ 100krad Class K die, Non-Swept Quartz(X) Hi-Rel design w/ Non-Swept Quartz, Class K die(B) Hi-Rel design w/ Swept Quartz, Class B die(C) Hi-Rel design w/ Non-Swept Quartz, Class B die(D) Hi-Rel design w/ Non-Swept Quartz and commercial grade componentsb. Input Voltage/APR, (L) for +3.3V/±30ppm, (N) for +5.0V/±30ppm and (W) for+5.0V/±50ppm as the 14th characterc. Not Usedd. Radiographic Inspectione. Group C Inspection: MIL-PRF-55310, Rev E (requires 8 destruct specimens)f. Group C Inspection: MIL-PRF-55310, Rev F (requires 8 destruct specimens, includesRandom Vibration, MIL-STD-883, Method 1014 Leak Test and Life Test)g. Group C Inspection: In accordance with MIL-PRF-38534, Table C-Xc, Condition PI(requires 8 destruct specimens – 5 pc. Life, 3 pc. RGA). Subgroup 1 fine leak test to beperformed per MIL-STD-202, Method 112, Condition C.h. Internal Water-Vapor Content (RGA) samples and test performancei. MTBF Reliability Calculationsj. Worst Case Circuit Analysis: (unless otherwise specified, MIL-HDBK-1547)k. Derating and Thermal Analysis (unless otherwise specified, MIL-HDBK-1547 with TjMax = +105°C; Derated Maximum Operating Temp = Tj Max – ΔTj)l. Process Identification Documentation (PID)m. Customer Source Inspection (pre-crystal mount pre-cap, post-crystal mount pre-cap and final). Due to components being mounted underneath the crystal blank, pre-crystalmount pre-cap inspection should be considered.n. Destruct Physical Analysis (DPA): MIL-STD-1580 with exceptions as specified in Vectron DOC203982.o. Qualification: In accordance with MIL-PRF-55310, Rev F, Table IV (requires 16 destruct specimens). Includes Group III, SG1 through SG6 only. ESD (SG7) notperformed.p. Qualification: In accordance with EEE-INST-002, Section C4, Table 3, Level 1 or 2 (requires 11 destruct specimens)q. High Resolution Digital Pre-Cap Photographs (20 Megapixels minimum)r. Hot solder dip of leads with Sn63/Pb37 solder prior to shipping5.2.1 NASA EEE-INST-002. A combination of Design Pedigree R, Option S Screening, andQualification per EEE-INST-002, Section C4, Table 3, meet the requirements of Level 1 and Level 2 device reliability.5.3Test Conditions. Unless otherwise stated herein, inspections are performed in accordance withthose specified in MIL-PRF-55310. Process travelers identify the applicable methods,conditions, and procedures to be used. Examples of electrical test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 2.5.3.1 When MIL-PRF-55310, Revision F was being reviewed for release by manufacturers andusers, Vectron and other organizations recommended that burn-in delta limits not beapplied to logic level measurements due to the inconsistency in attempting to measuresmall changes in logic levels which inherently have ringing in the signal. This isespecially true in higher frequency oscillators measured in automated test systems thatare affected by cable length that is not representative of the user’s application and contactresistance in test fixtures that do not provide a consistent Vcc or Ground connection. Theexact test setup conditions may vary slightly from pre-burn-in to post-burn-in and causesmall artificial deltas in logic level measurements that are not indicative of an issue. Anysignificant changes in logic levels will be reflected in supply current deltas and/or logiclevels that exceed the min/max limits. As a result, we take exception to MIL-PRF-55310,Revision F, Para. 4.4.5 and the delta limit for Output Low Level as specified in 4.4.5(c)shall not be applied to Burn-in PDA.5.4Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lotof devices:a. As applicable to the Screening Option chosen, completed assembly and screening lottravelers, screening data, including radiographic images, and rework history.b. Electrical test variables data, identified by unique serial number.c. Special items when required by purchase order such as Group C, DPA, and RGA data.d. For Design Pedigrees E, R, V, and X, traceability, component LAT, enclosure LAT,and wafer lot specific RLAT data for non-SMD active devices (if applicable).e. Certificate of Conformance.5.5Discrepant Material. All MRB authority resides with the procuring activity.5.6Failure Analysis. Any failure during Qualification or Group C Inspection will be evaluated forroot cause. The customer will be notified after occurrence and upon completion of theevaluation.6.PREPARATION FOR DELIVERY6.1Packaging. Devices will be packaged in a manner that prevents handling and transit damageduring shipping. Devices will be handled in accordance with MIL-STD-1686 for Class 1devices. Devices will be packaged for transport in accordance with DOC220429. Please note that “one unit per package” is available for a fee; however, this service must be requested aspart of the official RFQ.7.ORDERING INFORMATION7.1 Ordering Part Number. The ordering part number is made up of an alphanumeric series of15 characters. Design-affected product options, identified by the parenthetic letter on theOptional Parameters list (¶ 5.2a and b), are included within the device part number.The Part Number breakdown is described as:5116 R 10M00000 L F7.1.1 Model Number. The device model number is the four (4) digit number 5116.7.1.2 Design Pedigree. Class S variants correspond to either letter “E”, “R”, “V” or “X” and aredescribed in paragraph 5.2a. Class B variants correspond to either letter “B” or “C” and aredescribed in paragraph 5.2a. Ruggedized COTS, using commercial grade components,corresponds to letter “D”.7.1.3Output Frequency. The nominal output frequency is expressed in the format as specified inMIL-PRF-55310 utilizing eight (8) characters.7.1.4 Input Voltage (APR). “L” for +3.3V (±30ppm), “N” for +5.0V (±30ppm) and “W” for +5.0V(±50ppm) as the 14th character.7.1.5 Screening Options. The 15th character is the Screening Option (letter A thru G, S or X) selectedfrom Table 4.7.2Optional Design, Test and Data Parameters. Optional test and documentation requirementsshall be specified by separate purchase order line items (as listed in ¶ 5.2c thru s).Frequency Range: 1.0 MHz to 100.0 MHzTemperature Range: -40°C to +85°CPower Supply (Vcc): +3.3Vdc ±5% or +5.0Vdc ±5%Absolute Pull Range: ±30 ppm or ±50 ppm (+/-30 ppm only for +3.3Vdc)Control Voltage (Vc) Range: 0.3V to +3.0V with Vcc = +3.3VControl Voltage (Vc) Range: 0.5V to +4.5V with Vcc = +5.0VSlope: PositiveLinearity: 10% max.F vs. V Gain: 45 ppm/V min. to 105 ppm/V max.Start-up Time: 10.0 ms max.Frequency Range (MHz)Current (mA)(max. no load)Rise / FallTimes 1/(ns max.)Duty Cycle 1/(%)+5.25V +3.465V1 – 15 15 8 10 45 to 55>15 – 40 20 15 5 40 to 60>40 – 60 35 20 5 40 to 60>60 – 85 45 25 3 40 to 60>85 – 100 55 35 3 40 to 601/. Waveform measurement points and logic limits are in accordance with MIL-PRF-55310, Para 3.6.20.3.TABLE 1 - Electrical Performance CharacteristicsOPERATION LISTING REQUIREMENTS ANDCONDITIONS@ all Electrical TestsInput Current (no load) MIL-PRF-55310, Para 4.8.5.1 ************************.MIL-PRF-55310, Para 4.8.6 Output Logic Voltage Levels MIL-PRF-55310, Para 4.8.21.3 Rise and Fall Times MIL-PRF-55310, Para 4.8.22 Duty Cycle MIL-PRF-55310, Para 4.8.23 Frequency Deviation MIL-PRF-55310, Para 4.8.31.1 Linearity MIL-PRF-55310, Para 4.8.31.5Nominal conditions only@ Post Burn-In Electrical onlyOvervoltage Survivability MIL-PRF-55310, Para 4.8.4 Initial Freq. – Temp. Accuracy MIL-PRF-55310, Para 4.8.10.1 Freq. – Voltage Tolerance MIL-PRF-55310, Para 4.8.14 Start-up Time (fast/slow start) MIL-PRF-55310, Para 4.8.29TABLE 2 - Electrical Test ParametersModel # Thermal ResistanceJunction to Caseθjc (°C / W) Δ Junction Temp.T j(°*********)Weight(Grams)5116 31.62 9.13 1.2 Note: The maximum power from Table 2 is used to calculate the worst case Δ JunctionTemperature.TABLE 3 - Typical Thermal Characteristics and WeightTable 3a – Typical Phase Noise at 16MHz, 3.3VTable 3b – Typical Phase Noise at 16MHz, 5.0VTable 3c – Typical Phase Noise at 50MHz, 3.3VTable 3e – Typical Phase Noise at 80MHz, 3.3VTable 3g – Typical Phase Noise at 100MHz, 5.0VPin ConnectionsVoltage1 Control2 GND/Case3 Output4 VccFIGURE 1Model 5116 Package OutlineAPPENDIX A Recommended Land PatternModel 5116。
TS16949来料检验作业指导书Incoming_Inspection_Work_Instruction文件更改历史记录Amendment History版次Revision更改日期Change Date更改概要Description of Changes更改人Prepared by批准人Approved byPrepared by编制Reviewed by审核Approved by批准TS16949来料检验作业指导书Incoming_Inspection_Work_Instruction1.0Purpose目的The objective of this procedure is to define a standard inspection method in performing inspection and testing of components or materials.本程序目的在于定义对元件或材料进行检验/测试的标准操作方法。
Scope适用范围This procedure is applicable to all components and materials that require the relevant inspection and testing, as specified in the individual Part or Material Specification.本程序适用于所有按照元件和材料规格进行检验和测试的元件和材料。
2.0Sampling / Equipment Used 取样 / 使用设备2.1Per sampling plan stated in the Incoming Inspection Procedure: AQL:MA=0.4、MI=1.0按照来料检验程序所规定的抽样计划;AQL:MA=0.4、MI=1.0级别进行抽样.2.2Inspection Aids检验工具4.2.1 LCR Meter / LCR 测量仪4.2.2 Fluke Multimeter / Fluke 万用表4.2.3 Caliper / Plug Gauge / Pin Gauge / 游标卡尺/ 塞规/针规4.2.4 Magnifier / Microscope / 放大镜 / 显微镜3.0Reference Documents参考文件3.1 Customer’s AVL / 客户接受的供应商清单3.2 Manufacturer Part Specification / 供应商的元件规格3.3 Yamaoka AVL List / 本公司的AVL3.4 QAP-010 : Incoming Inspection Procedure / 来料检验程序3.5 SOP-QA-003 : Material Aging Control Procedure / 物料保质期控制程序4.0Inspection Criteria / 检验要点4.1MFG AVL Verification / 生产厂商确认Verify that the parts are from the authorized vendor per AVL list.根据AVL清单验证元件是否为承认厂商。
Technical DataFluke 1555 and 1550C Insulation Resistance TestersFluke insulation testers can now conduct the entire range of test voltages specified in IEEE 43-2000 with a best in class, 3 yearwarranty and CAT IV 600 V safety rating. With measurement storage and PC interface, the 1555 and 1550C are perfect tools for pre-ventative or predictive maintenance programs designed to identify potential equipment failures before they occur.Features include:• Test voltages to up 10 kV provides solutions for all applications • CAT III 1000 V, CAT IV 600 V safety rating• Warning function alerts the user that line voltage is present andgives the voltage reading up to 600 V ac or dc for increased user safety• Selectable test voltages in 50 V steps from 250 V to 1000 V, and 100 V steps above 1000 V• Measurements can be stored in up to 99 memory locations, with each location assigned a unique, user defined, label for easy recall• Long battery life gives the user over 750 tests between charges • Automatic calculation of Dielectric Absorption (DAR) and Polarization Index (PI) with no additional setup• Guard system eliminates the effect of surface leakage current on high-resistance measurements• Large digital/analog LCD for easy viewing• Capacitance and leakage current measurement • Ramp function for breakdown testing • Resistance measurements up to 2TΩ• Timer settings up to 99 minutes for timed tests • 3-year warrantyDigital insulation testing up to 10 kVThe new Fluke 1555 and redesigned Fluke1550C insulation resistance testers, offer digital insulation testing up to 10 kV, making them ideal for testing a wide range of high voltage equipment including switchgear, motors, generators and cables.19812 Fluke Corporation Fluke 1555 and 1550C Insulation Resistance TestersFluke CorporationPO Box 9090, Everett, WA USA 98206Fluke Europe B.V.PO Box 1186, 5602 BD Eindhoven, The NetherlandsFor more information call:In the U.S.A. (800) 443-5853 or Fax (425) 446-5116In Europe/M-East/Africa +31 (0) 40 2675 200 or Fax +31 (0) 40 2675 222In Canada (800)-36-FLUKE or Fax (905) 890-6866From other countries +1 (425) 446-5500 or Fax +1 (425) 446-5116Web access: ©2005-2010 Fluke Corporation.Specifications subject to change without notice. Printed in U.S.A. 10/2010 1629685G D-EN-N Modification of this document is not permitted without written permission from Fluke Corporation.Fluke. Keeping your world up and running.Ordering information1550C 5 kV Insulation Tester 1555 10 kV Insulation Tester 1550C/Kit 5 kV Insulation Tester Kit 1555/Kit 10 kV Insulation Tester KitOptional accessoriesTL1550EXT 25 foot extendedtest lead setIncluded accessoriesTest Cables with Alligator Clips (red, black, green)Infrared adapter with interface cable FlukeView Forms Basic CD-ROM AC Power CordSoft Carrying Case (base models only)English ManualUsers Manual on CD-ROM Quick Reference CardSoftware License Agreement Registration CardFlukeView Forms Installation Guide USB-IR Cable Installation Guide IP67 Hard Case (kit only)Certificate of Calibration (kit only)Ruggedized Alligator Clips (kit and 1555 only)Software specification sFluke ViewForms basic softwarerequires a PC running Windows 2000, Windows XP and Windows Vista.SpecificationsElectrical specificationsThe tester’s accuracy is specified for one year after calibration at operating temperatures of 0 °C to 35 °C. For operating temperatures outside the range (-20 °C to 0 °C and 35 °C to 50 °C), add ± .25 % per °C, except on the 20 % bands add ± 1 % per °C.Insulation resistance measurementTest voltage (dc)RangeAccuracy (± reading)250 V< 200 kΩ200 kΩ to 5 GΩ5 GΩ to 50 GΩ> 50 GΩunspecified 5 %20 %unspecified 500 V< 200 kΩ200 kΩ to 10 GΩ10 GΩ to 100 GΩ> 100 GΩunspecified 5 %20 %unspecified 1000 V< 200 kΩ200 kΩ to 20 GΩ20 GΩ to 200 GΩ> 200 GΩunspecified 5 %20 %unspecified 2500 V< 200 kΩ200 kΩ to 50 GΩ50 GΩ to 500 GΩ> 500 GΩunspecified 5 %20 %unspecified 5000 V< 200 kΩ200 kΩ to 100 GΩ100 GΩ to 1 TΩ> 1 TΩunspecified 5 %20 %unspecified 10000 V (1555 Only)< 200 kΩ200 kΩ to 200 GΩ200 GΩ to 2 TΩ> 2 TΩunspecified 5 %20 %unspecifiedBar graph range0 to 1 TΩInsulation test voltage accuracy -0 %, +10 % at 1 mA load current Induced ac mains current rejection 2 mA maximum Charging rate for capacitive load5 seconds per μF Discharge rate for capacitive load 1.5 s/μFRangeAccuracyLeakage current measurement1 nA to2 mA ± (5 % + 2 nA)Capacitance measurement 0.01 uF to 15.00 μF ± (15 % rdg + 0.03 μF)TimerRangeResolution0 to 99 minutesSetting: 1 minute Indication: 1 second Live circuit warningWarning rangeVoltage accuracy 30 V to 660 V ac/dc, 50/60 Hz± (15 % + 2 V)General specifications。
目的The purpose of this document is to validate measurement system. It provides guidelines of measurementsystem analysis, valuation and improvement if need.此文旨在确保测量系统的有效性。
同时提供了测量系统分析, 评价, 以至必要的改善方面的指引。
2.0Scope范围This document applies to all measurement system in Flextronics Fuyong , including continuous andattribute system.本程序适用福永伟创力所有测量系统, 包括连续的及离散的系统。
3.0Reference Document参考文件3.1MSA Manual (AIAG)测量系统分析手册 (AIAG)4.0Definition定义4.1MSA-Measurement System AnalysisMSA-测量系统分析4.2GR&R-Gauge Repeatability and ReproducibilityGR&R-量具重复性及再现性4.3Continuous measurement system - the readings are continuous and variable, i.e. ampere meter,thermometer, ruler, caliper, is a variable data.连续型测量系统—其读数是连续可变的,比如电流表,温度计,直尺,卡尺,为计量型数据。
4.4Attribute measurement system –compare products with the common spec and evaluate its result. Theresult is discrete, i.e. visual inspection, go-no-go determinant, is an attribute data.离散型测量系统—对比产品及规格并判定结果, 其结果是离散的,比如外观检查,Pass/Fail判定,为计数型数据。
5.0Responsibilities职责5.1PQE is responsible for identifying MSA experiment request and define it in Quality Control Plan.Coordinate CFT to establish MSA plan and monitor its implementation.PQE负责识别出需要做MSA的测量系统, 并规定在品质控制计划里. 同时统筹CFT制定MSA 计划并监控其完成状况。
5.2Measurement System owner( station /process owner) is responsible for respective MSA organizing andexecution. For example, for AOI, ICT, FCT and others test stations, Test Engineer organize MSAexperiment. For off line solder paste thickness measurement, QSE should organize the MSA experiment.For online SPI, ME is the owner. For all Visual Inspection stations in production line and OBA, PQE is the owner. For IQA measurement system, SQE/IQA is the owner. For Lab stations, TE is the owner.测量系统的负责人(工位/ 制程负责人)负责相应测量系统实验的组织和实施.例如, TE负责AOI, ICT, FCT和其他测试工位的MSA实验组织和实施; QSE负责离线锡膏厚度测量工位MSA实验的组织和实施; ME负责在线SPI的MSA的组织和实施;PQE负责生产线所有视检工位MSA实验的组织和实施, SQE/ IQA负责IQA区域MSA实验的组织和实施, TE 负责 Lab 区域MSA实验的组织和实施。
5.3Production is responsible to provide manpower, etc., assist to perform MSA experiment.生产部门负责提供人力或其他资源来协助完成MSA实验。
6.0Procedure程序6.1General综述Measurement System Analysis include Bias, Linearity, Stability, Repeatability&Reproducibility. Asthe Bias and Linearity have been evaluated during calibration. The procedure is focus on Stability ,R&R analysis and evaluation for measurement system. PQE complete annual MSA plan (FS-QAP-022-F3 form)base on measurement system analysis requirement defined in control plan .Refer to 7. 2 MSAMatrix to select recommended MSA method. If customer has special requirement, follow customerrequirement.测量系统分析主要分析测量系统的偏倚,线性,稳定性,重复性和再现性。
由于大部分的量具在周期校验中对其偏倚、线性进行了评估,本程序主要对测量系统的稳定性,重复性和再现性作分析和评价。
PQE根据控制计划中规定的测量系统分析要求制定年度MSA计划(FS-QAP-022-F3 表单)。
参考附件7.2测量系统分析矩阵图的建议选择测量系统分析的方法。
如客户特别要求,按照客户要求进行分析。
6.2Opportunity factors of MSAMSA执行时机1). New measurement system 新测量系统2). Gauge change 量具变动3). Appraiser change 人员变动4). Spec change 规格变动6.2.1MSA frequency of the same measurement type is no less than once per year.同一类测量设备MSA频率不少于每年一次.6.3Total Variation 总偏差total variation is combined of measurement system variation and process variation, and their relationas below:σ2 total = σ2process + σ2measurementOnly if σprocess > σmeasurement, the measurement system is acceptable. Otherwise themeasurement result can’t reflect the real process variation, and gage owner must improve themeasurement system.总偏差由测量偏差和过程偏差组成, 他们之间有如下关系:σ2 总体 = σ2 过程 + σ2 测量只有当测量偏差小于过程偏差时, 此测量系统才是可以接受的. 否则测量结果无法反映出真正的制程变差, 量具所有者必须改进测量系统.6.4Discrimination 分辨率Gauge’s minimal visual reading. Usually discrimination should be less than 1/10 of required tolerance.量具的最小可读值. 通常分辨率应小于所要求公差范围的1/10.6.5Bias 偏倚It’s the deviation between the true value and the mean value of measurement, which the same peoplemeasures the same character of the same part using the same equipment. If customer requires theanalysis, it should be less than 10%.同一人用同一设备测量同一零件的同一特性所得的测量平均值与真值之差异. 如果客户要求此分析, 偏倚应在10%以内.6.6Linearity 线性Linearity is given a narrow interpretation to indicate that gauge response increases in equalincrements to equal increments of stimulus, or, if the gauge is biased, that the bias remains constantthroughout the course of the measurement process. A test of linearity starts with a plot of thewhether or not the points fall on a straight line with slope equal to 1 -- indicating linearity. If customer requires the analysis, the slope must be within 1+/-0.1. So it is required that Gauge must be properly calibrated at the lower and upper ends of the operating range.线性所表示的是被测对象有增量时量具的量测值也相等的增量,或如果量具有偏差,而此偏差随被测量对象的增加而成比例增加.线性的测量是通过比对一组标准参考值与相应的测量值是否落在同一直线并且斜率等于1. 如果客户要求此项分析,其斜率必须在1+/-0.1范围之内. 这就要求量具必须在其量程范围内的上下限端做适当的校验.6.7Stability 稳定性6.7.1 The total variants of measure values which measurement system measures the single character ofthe same part in duration. Usually we valuate stability by control chart.测量系统在某持续时间内测量同一基准或零件的相同特性时获得的测量值的总变差. 通常我们用控制图来评估稳定性.6.7.2 Data collection数据收集The measurement system owner should organize the data collection to measure the standardsample five times once a shift(day) for 20 days. Plot the data on an X &R control chart in timeorder. Refer to attachment FS-QAP-022-F4.测量系统负责人负责组织数据的收集,每班(或每天)将标准样件测量5次,连续测量20个周期,将测量数据按照顺序画在X&R控制图上。