The Application of GaN based power devices to Power electronics

  • 格式:pdf
  • 大小:3.23 MB
  • 文档页数:28

10.0E-9 0 24 168 336 504 672 840 1008 1176 1344 1512 1680 1848 2016 2184 2352 2520 2688 2856 3024 Test Hours
Test Hours
13
First GaN Based Product: iP2010
iP2011 iP2010
Silicon Solution A Competitor A
Competitor B Silicon Solution B
15
20
25
30
Current (A)
15
Flagship High Frequency LV DC-DC performance
2 Years ago: 5 MHz, Vout = 1.8V Today: 5 MHz, Vout = 1.8V
Ion/Ioff(600 V) > 106
B r e a k d o w n V o l ta g e (V )
1.2E-06 1.0E-06
Idrain (A/mm)
1000 800 600 400 200 0 5 7 9 11 13 15 17 19 Lgd(um)
50 45 40 35 30 25 20 15 10 5 0
2009 2008
Next Si
GaN Gen 1.1 GaN Gen 2.0
GaN Gen 3.0
2009
2011 2010
2012 2011
2013 2012
2014 2013
2015 2014
17
HV HEMT Reverse Blocking Characteristics ( Wg=100 mm, Lg=2um)
Billion 5 29.~ 27% of arrels of Bavingsed s il Savuse O gy eneryear5in per 202 In2025
3
Outline
•The need for a new power device technology •Why GaN based power devices? •What are the barriers to commercialization of GaN based power devices? •How does IR’s GaNpowIR technology platform overcome these barriers? •What is current performance of GaN based Power conversion devices?
2
Potential Energy Savings Worldwide
Possible with 100 % adoption of :
• • • • efficient lighting ( 20 % electricity, 8 % energy), IT PS ( 15% electricity, 6% energy), inverterized motors ( 50 % electricity, 20 % energy) and hybrid vehicles ( 20 % energy).
From APEC 2005 Plenary Presentation
1 Quad BTU = 168 Million Barrels of crude oil
Energy Information Administration / International Energy Outlook 2004 Assumes Transportation energy savings of 60% and 25% electricity savings by 2025
Low Voltage Half-Bridge configuration on BT substrate.
14
iP2010 Enables Solution Shrink
Vin=12V, Vout=1.2V, fsw=1.2MHz
92% 90% 88% 86%
Efficiency
84% 82% 80% 78% 76% 74% 0 5 10
9
Requirements for commercially viable GaN based power devices :
Performance/Cost (GaN) > 2-3 x Performance/Cost (Si) • Epi + substrate cost < $3/ cm2 (i.e. silicon) • I leak < 0.1 µA / mm , Ion / Ioff > 106 • Truly Crack Free epi (< 1 mm from edge) • Yields >80% for 10mm2 • Stable electrical performance (eg: RDS(on), R*Qg, Isat, Vp, Ileak ) • Large diameter ( > 150 mm) substrates with < 50 µm bow after epi growth • High Volume ( > 10 k wafers/ wk) Si Wafer Fab Compatible • Supply needed: >106 150 mm wafer equivalents (to support 10% total power semiconductor market at current utilization rates)
The Application of GaN Based Power Devices to Power Electronics
APEC 2011 Plenary Session
Tim McDonald VP, Emerging Technologies Group
March 7, 2011
1
Acknowledgements
12
Device Reliability: > 10,000,000 Device-Hours
11814-24-HTRB RDSON @ 5A
2.6 2.4
RDSON in mOhms
2.2 2 1.8 1.6 1.4 1.2
1008 1176 0 168 336 504 672 840 1344 1512 1680 2016 2184 2352 2688 3024 3192 3360 3528 3696 3864 4032 4200 4368 4536 4704 4872 5040 5208 5376 5544 5712 5880 6048
Measured data Ecrit : Si = 20 V/μm , GaN = 300 V/ μm Ref: N. Ikeda et.al. ISPSD 2008 p.289
6 6
Figure of Merit: Tradeoffs
FOM = Ron*Qsw* Cost
Ron*Qsw
FOM =
Work herein presented is the fruit of 7 years labor at International Rectifier. Through most of those years, IR’s GaNpowIR program has been led by the strategic and creative inputs of Dr. Michael Briere , first as Chief Technology Officer and now as Executive Consultant to the Company. Thanks go to Dr. Briere and the other team members at IR whose efforts and creativity produced these results.
2DEG Density (10 /cm )
ΦGaN=1.0 eV
2
13
1.5 1.0 0.5 0.0 0.0
0.1
0.2 0.3 X (Al fraction)
0.4
13
2.0
Measured Calculated
a
2
a J. Van Hove, SVTA & J. Redwing, ATMI
AlGaN Thickness (A)
2 years ago 5MHz, 1.8Vout
Today: 5 MHz, Vout = 1.2V
Today: 10 MHz, Vout = 1.8V
16
16
Possible GaN LV FOM Projection vs. Time
R X Qg Figure of Merit (mOhm-nC)
Gate Dielectric
S
G
D
AlGaN GaN
2 DEG
Transition Layers Silicon Substrate
8
HEMT-FET Structure: Polarization Engineering
2D Electron Gas
ϕb
Gate Metal AlGaN
GaN
Schottky/AlxGa(1-x)N/GaN 2DEG Density (10 /cm ) 2.5 2.0 1.5 1.0 0.5 0.0 100 200 300 400 x=.35 x=.25 x=.15
Enabling higher levels of integration for dense and efficient power conversion