Graphgrep A fast and universal method for querying graphs

功函数和费米能级的公式1 功函数的定义首先，我们先看一下功函数(又称功函、逸出功)是指要使一粒电子立即从固体表面中逸出，所必须提供的最小能量(通常以电子伏特为单位)。

这里“立即”一词表示最终电子位置从原子尺度上远离表面但从宏观尺度上依然靠近固体。

功函数不是材料体相的本征性质，更准确的说法应为材料表面的性质(比如表面暴露晶面情况和受污染程度)功函数是金属的重要属性。

功函数的大小通常大概是金属自由原子电离能的二分之一。

The work function W for a given surface is defined by the difference W = - eϕ - EFwhere −e is the charge of an electron, ϕ is the electrostatic potential in the vacuum nearby the surface, and EF is the Fermi level (electrochemical potential of electrons) inside the material. The term −eϕ is the energy of an electron at rest in the vacuum nearby the surface. In words, the work function is thus defined as the thermodynamic work required to remove an electron from the material to a state at rest in the vacuum nearby the surface.我们再看下IUPAC 官网的解释：The minimum work needed to extract electrons from the Fermi level of a metal M across a surface carrying no net charge. It is equal to the sum of the potential energy and the kinetic Fermi energy taken with the reverse sign:ϕM=−(Ve+εFe)ϕM=−(Ve+εeF)where $V_{e}$ is the potential energy for electrons in metals and $\varepsilon_e^ F$ is the kinetic energy of electrons at the Fermi level.2 VASP 计算功函数的过程从前面的定义中可以看出，计算功函数我们只需要得到体系的费米能级和电子所处的静电势能，然后求差即可。

19StandardMath ToolsDisplay up to four math function traces (F1-F4). The easy-to-use graphical interface simplifies setup of up to two operations on each function trace;and function traces can be chained together to perform math-on-math.absolute value integralaverage (summed)invert (negate)average (continuous)log (base e)custom (MATLAB) – limited points product (x)derivativeratio (/)deskew (resample)reciprocaldifference (–)rescale (with units)enhanced resolution (to 11 bits vertical)roof envelope (sinx)/x exp (base e)square exp (base 10)square root fft (power spectrum, magnitude, phase,sum (+)up to 50 kpts) trend (datalog) of 1000 events floorzoom (identity)histogram of 1000 eventsMeasure ToolsDisplay any 6 parameters together with statistics, including their average,high, low, and standard deviations. Histicons provide a fast, dynamic view of parameters and wave-shape characteristics.Pass/Fail TestingSimultaneously test multiple parameters against selectable parameter limits or pre-defined masks. Pass or fail conditions can initiate actions including document to local or networked files, e-mail the image of the failure, save waveforms, send a pulse out at the rear panel auxiliary BNC output, or (with the GPIB option) send a GPIB SRQ.Jitter and Timing Analysis Software Package (WRXi-JTA2)(Standard with MXi-A model oscilloscopes)•Jitter and timing parameters, with “Track”graphs of •Edge@lv parameter (counts edges)• Persistence histogram, persistence trace (mean, range, sigma)Software Options –Advanced Math and WaveShape AnalysisStatistics Package (WRXi-STAT)This package provides additional capability to statistically display measurement information and to analyze results:• Histograms expanded with 19 histogram parameters/up to 2 billion events.• Persistence Histogram• Persistence Trace (mean, range, sigma)Master Analysis Software Package (WRXi-XMAP)(Standard with MXi-A model oscilloscopes)This package provides maximum capability and flexibility, and includes all the functionality present in XMATH, XDEV, and JTA2.Advanced Math Software Package (WRXi-XMATH)(Standard with MXi-A model oscilloscopes)This package provides a comprehensive set of WaveShape Analysis tools providing insight into the wave shape of complex signals. Includes:•Parameter math – add, subtract, multiply, or divide two different parameters.Invert a parameter and rescale parameter values.•Histograms expanded with 19 histogram parameters/up to 2 billion events.•Trend (datalog) of up to 1 million events•Track graphs of any measurement parameter•FFT capability includes: power averaging, power density, real and imaginary components, frequency domain parameters, and FFT on up to 24 Mpts.•Narrow-band power measurements •Auto-correlation function •Sparse function• Cubic interpolation functionAdvanced Customization Software Package (WRXi-XDEV)(Standard with MXi-A model oscilloscopes)This package provides a set of tools to modify the scope and customize it to meet your unique needs. Additional capability provided by XDEV includes:•Creation of your own measurement parameter or math function, using third-party software packages, and display of the result in the scope. Supported third-party software packages include:– VBScript – MATLAB – Excel•CustomDSO – create your own user interface in a scope dialog box.• Addition of macro keys to run VBScript files •Support for plug-insValue Analysis Software Package (WRXi-XVAP)(Standard with MXi-A model oscilloscopes)Measurements:•Jitter and Timing parameters (period@level,width@level, edge@level,duty@level, time interval error@level, frequency@level, half period, setup, skew, Δ period@level, Δ width@level).Math:•Persistence histogram •Persistence trace (mean, sigma, range)•1 Mpts FFTs with power spectrum density, power averaging, real, imaginary, and real+imaginary settings)Statistical and Graphical Analysis•1 Mpts Trends and Histograms •19 histogram parameters •Track graphs of any measurement parameterIntermediate Math Software Package (WRXi-XWAV)Math:•1 Mpts FFTs with power spectrum density, power averaging, real, and imaginary componentsStatistical and Graphical Analysis •1 Mpts Trends and Histograms •19 histogram parameters•Track graphs of any measurement parameteramplitude area base cyclescustom (MATLAB,VBScript) –limited points delay Δdelay duration duty cyclefalltime (90–10%, 80–20%, @ level)firstfrequency lastlevel @ x maximum mean median minimumnumber of points +overshoot –overshoot peak-to-peak period phaserisetime (10–90%, 20–80%, @ level)rmsstd. deviation time @ level topΔ time @ levelΔ time @ level from triggerwidth (positive + negative)x@ max.x@ min.– Cycle-Cycle Jitter – N-Cycle– N-Cycle with start selection – Frequency– Period – Half Period – Width– Time Interval Error – Setup– Hold – Skew– Duty Cycle– Duty Cycle Error20WaveRunner WaveRunner WaveRunner WaveRunner WaveRunner 44Xi-A64Xi-A62Xi-A104Xi-A204Xi-AVertical System44MXi-A64MXi-A104MXi-A204MXi-ANominal Analog Bandwidth 400 MHz600 MHz600 MHz 1 GHz 2 GHz@ 50 Ω, 10 mV–1 V/divRise Time (Typical)875 ps500 ps500 ps300 ps180 psInput Channels44244Bandwidth Limiters20 MHz; 200 MHzInput Impedance 1 MΩ||16 pF or 50 Ω 1 MΩ||20 pF or 50 ΩInput Coupling50 Ω: DC, 1 MΩ: AC, DC, GNDMaximum Input Voltage50 Ω: 5 V rms, 1 MΩ: 400 V max.50 Ω: 5 V rms, 1 MΩ: 250 V max.(DC + Peak AC ≤ 5 kHz)(DC + Peak AC ≤ 10 kHz)Vertical Resolution8 bits; up to 11 with enhanced resolution (ERES)Sensitivity50 Ω: 2 mV/div–1 V/div fully variable; 1 MΩ: 2 mV–10 V/div fully variableDC Gain Accuracy±1.0% of full scale (typical); ±1.5% of full scale, ≥ 10 mV/div (warranted)Offset Range50 Ω: ±1 V @ 2–98 mV/div, ±10 V @ 100 mV/div–1 V/div; 50Ω:±400mV@2–4.95mV/div,±1V@5–99mv/div,1 M Ω: ±1 V @ 2–98 mV/div, ±10 V @ 100 mV/div–1 V/div,±10 V @ 100 mV–1 V/div±**********/div–10V/div 1 M Ω: ±400 mV @ 2–4.95 mV/div, ±1 V @5–99 mV/div, ±10 V @ 100 mV–1 V/div,±*********–10V/divInput Connector ProBus/BNCTimebase SystemTimebases Internal timebase common to all input channels; an external clock may be applied at the auxiliary inputTime/Division Range Real time: 200 ps/div–10 s/div, RIS mode: 200 ps/div to 10 ns/div, Roll mode: up to 1,000 s/divClock Accuracy≤ 5 ppm @ 25 °C (typical) (≤ 10 ppm @ 5–40 °C)Sample Rate and Delay Time Accuracy Equal to Clock AccuracyChannel to Channel Deskew Range±9 x time/div setting, 100 ms max., each channelExternal Sample Clock DC to 600 MHz; (DC to 1 GHz for 104Xi-A/104MXi-A and 204Xi-A/204MXi-A) 50 Ω, (limited BW in 1 MΩ),BNC input, limited to 2 Ch operation (1 Ch in 62Xi-A), (minimum rise time and amplitude requirements applyat low frequencies)Roll Mode User selectable at ≥ 500 ms/div and ≤100 kS/s44Xi-A64Xi-A62Xi-A104Xi-A204Xi-A Acquisition System44MXi-A64MXi-A104MXi-A204MXi-ASingle-Shot Sample Rate/Ch 5 GS/sInterleaved Sample Rate (2 Ch) 5 GS/s10 GS/s10 GS/s10 GS/s10 GS/sRandom Interleaved Sampling (RIS)200 GS/sRIS Mode User selectable from 200 ps/div to 10 ns/div User selectable from 100 ps/div to 10 ns/div Trigger Rate (Maximum) 1,250,000 waveforms/secondSequence Time Stamp Resolution 1 nsMinimum Time Between 800 nsSequential SegmentsAcquisition Memory Options Max. Acquisition Points (4 Ch/2 Ch, 2 Ch/1 Ch in 62Xi-A)Segments (Sequence Mode)Standard12.5M/25M10,00044Xi-A64Xi-A62Xi-A104Xi-A204Xi-A Acquisition Processing44MXi-A64MXi-A104MXi-A204MXi-ATime Resolution (min, Single-shot)200 ps (5 GS/s)100 ps (10 GS/s)100 ps (10 GS/s)100 ps (10 GS/s)100 ps (10 GS/s) Averaging Summed and continuous averaging to 1 million sweepsERES From 8.5 to 11 bits vertical resolutionEnvelope (Extrema)Envelope, floor, or roof for up to 1 million sweepsInterpolation Linear or (Sinx)/xTrigger SystemTrigger Modes Normal, Auto, Single, StopSources Any input channel, External, Ext/10, or Line; slope and level unique to each source, except LineTrigger Coupling DC, AC (typically 7.5 Hz), HF Reject, LF RejectPre-trigger Delay 0–100% of memory size (adjustable in 1% increments, or 100 ns)Post-trigger Delay Up to 10,000 divisions in real time mode, limited at slower time/div settings in roll modeHold-off 1 ns to 20 s or 1 to 1,000,000,000 events21WaveRunner WaveRunner WaveRunner WaveRunner WaveRunner 44Xi-A 64Xi-A 62Xi-A104Xi-A 204Xi-A Trigger System (cont’d)44MXi-A64MXi-A104MXi-A204MXi-AInternal Trigger Level Range ±4.1 div from center (typical)Trigger and Interpolator Jitter≤ 3 ps rms (typical)Trigger Sensitivity with Edge Trigger 2 div @ < 400 MHz 2 div @ < 600 MHz 2 div @ < 600 MHz 2 div @ < 1 GHz 2 div @ < 2 GHz (Ch 1–4 + external, DC, AC, and 1 div @ < 200 MHz 1 div @ < 200 MHz 1 div @ < 200 MHz 1 div @ < 200 MHz 1 div @ < 200 MHz LFrej coupling)Max. Trigger Frequency with400 MHz 600 MHz 600 MHz 1 GHz2 GHzSMART Trigger™ (Ch 1–4 + external)@ ≥ 10 mV@ ≥ 10 mV@ ≥ 10 mV@ ≥ 10 mV@ ≥ 10 mVExternal Trigger RangeEXT/10 ±4 V; EXT ±400 mVBasic TriggersEdgeTriggers when signal meets slope (positive, negative, either, or Window) and level conditionTV-Composite VideoT riggers NTSC or PAL with selectable line and field; HDTV (720p, 1080i, 1080p) with selectable frame rate (50 or 60 Hz)and Line; or CUSTOM with selectable Fields (1–8), Lines (up to 2000), Frame Rates (25, 30, 50, or 60 Hz), Interlacing (1:1, 2:1, 4:1, 8:1), or Synch Pulse Slope (Positive or Negative)SMART TriggersState or Edge Qualified Triggers on any input source only if a defined state or edge occurred on another input source.Delay between sources is selectable by time or eventsQualified First In Sequence acquisition mode, triggers repeatedly on event B only if a defined pattern, state, or edge (event A) is satisfied in the first segment of the acquisition. Delay between sources is selectable by time or events Dropout Triggers if signal drops out for longer than selected time between 1 ns and 20 s.PatternLogic combination (AND, NAND, OR, NOR) of 5 inputs (4 channels and external trigger input – 2 Ch+EXT on WaveRunner 62Xi-A). Each source can be high, low, or don’t care. The High and Low level can be selected independently. Triggers at start or end of the patternSMART Triggers with Exclusion TechnologyGlitch and Pulse Width Triggers on positive or negative glitches with widths selectable from 500 ps to 20 s or on intermittent faults (subject to bandwidth limit of oscilloscope)Signal or Pattern IntervalTriggers on intervals selectable between 1 ns and 20 sTimeout (State/Edge Qualified)Triggers on any source if a given state (or transition edge) has occurred on another source.Delay between sources is 1 ns to 20 s, or 1 to 99,999,999 eventsRuntTrigger on positive or negative runts defined by two voltage limits and two time limits. Select between 1 ns and 20 sSlew RateTrigger on edge rates. Select limits for dV, dt, and slope. Select edge limits between 1 ns and 20 s Exclusion TriggeringTrigger on intermittent faults by specifying the normal width or periodLeCroy WaveStream Fast Viewing ModeIntensity256 Intensity Levels, 1–100% adjustable via front panel control Number of Channels up to 4 simultaneouslyMax Sampling Rate5 GS/s (10 GS/s for WR 62Xi-A, 64Xi-A/64MXi-A,104Xi-A/104MXi-A, 204Xi-A/204MXi-A in interleaved mode)Waveforms/second (continuous)Up to 20,000 waveforms/secondOperationFront panel toggle between normal real-time mode and LeCroy WaveStream Fast Viewing modeAutomatic SetupAuto SetupAutomatically sets timebase, trigger, and sensitivity to display a wide range of repetitive signalsVertical Find ScaleAutomatically sets the vertical sensitivity and offset for the selected channels to display a waveform with maximum dynamic range44Xi-A 64Xi-A 62Xi-A104Xi-A 204Xi-A Probes44MXi-A 64MXi-A104MXi-A 204MXi-AProbesOne Passive probe per channel; Optional passive and active probes available Probe System; ProBus Automatically detects and supports a variety of compatible probes Scale FactorsAutomatically or manually selected, depending on probe usedColor Waveform DisplayTypeColor 10.4" flat-panel TFT-LCD with high resolution touch screenResolutionSVGA; 800 x 600 pixels; maximum external monitor output resolution of 2048 x 1536 pixelsNumber of Traces Display a maximum of 8 traces. Simultaneously display channel, zoom, memory, and math traces Grid StylesAuto, Single, Dual, Quad, Octal, XY , Single + XY , Dual + XY Waveform StylesSample dots joined or dots only in real-time mode22Zoom Expansion TracesDisplay up to 4 Zoom/Math traces with 16 bits/data pointInternal Waveform MemoryM1, M2, M3, M4 Internal Waveform Memory (store full-length waveform with 16 bits/data point) or store to any number of files limited only by data storage mediaSetup StorageFront Panel and Instrument StatusStore to the internal hard drive, over the network, or to a USB-connected peripheral deviceInterfaceRemote ControlVia Windows Automation, or via LeCroy Remote Command Set Network Communication Standard VXI-11 or VICP , LXI Class C Compliant GPIB Port (Accessory)Supports IEEE – 488.2Ethernet Port 10/100/1000Base-T Ethernet interface (RJ-45 connector)USB Ports5 USB 2.0 ports (one on front of instrument) supports Windows-compatible devices External Monitor Port Standard 15-pin D-Type SVGA-compatible DB-15; connect a second monitor to use extended desktop display mode with XGA resolution Serial PortDB-9 RS-232 port (not for remote oscilloscope control)44Xi-A 64Xi-A 62Xi-A104Xi-A 204Xi-A Auxiliary Input44MXi-A 64MXi-A104MXi-A 204MXi-ASignal Types Selected from External Trigger or External Clock input on front panel Coupling50 Ω: DC, 1 M Ω: AC, DC, GND Maximum Input Voltage50 Ω: 5 V rms , 1 M Ω: 400 V max.50 Ω: 5 V rms , 1 M Ω: 250 V max. (DC + Peak AC ≤ 5 kHz)(DC + Peak AC ≤ 10 kHz)Auxiliary OutputSignal TypeTrigger Enabled, Trigger Output. Pass/Fail, or Off Output Level TTL, ≈3.3 VConnector TypeBNC, located on rear panelGeneralAuto Calibration Ensures specified DC and timing accuracy is maintained for 1 year minimumCalibratorOutput available on front panel connector provides a variety of signals for probe calibration and compensationPower Requirements90–264 V rms at 50/60 Hz; 115 V rms (±10%) at 400 Hz, Automatic AC Voltage SelectionInstallation Category: 300 V CAT II; Max. Power Consumption: 340 VA/340 W; 290 VA/290 W for WaveRunner 62Xi-AEnvironmentalTemperature: Operating+5 °C to +40 °C Temperature: Non-Operating -20 °C to +60 °CHumidity: Operating Maximum relative humidity 80% for temperatures up to 31 °C decreasing linearly to 50% relative humidity at 40 °CHumidity: Non-Operating 5% to 95% RH (non-condensing) as tested per MIL-PRF-28800F Altitude: OperatingUp to 3,048 m (10,000 ft.) @ ≤ 25 °C Altitude: Non-OperatingUp to 12,190 m (40,000 ft.)PhysicalDimensions (HWD)260 mm x 340 mm x 152 mm Excluding accessories and projections (10.25" x 13.4" x 6")Net Weight7.26kg. (16.0lbs.)CertificationsCE Compliant, UL and cUL listed; Conforms to EN 61326, EN 61010-1, UL 61010-1 2nd Edition, and CSA C22.2 No. 61010-1-04Warranty and Service3-year warranty; calibration recommended annually. Optional service programs include extended warranty, upgrades, calibration, and customization services23Product DescriptionProduct CodeWaveRunner Xi-A Series Oscilloscopes2 GHz, 4 Ch, 5 GS/s, 12.5 Mpts/ChWaveRunner 204Xi-A(10 GS/s, 25 Mpts/Ch in interleaved mode)with 10.4" Color Touch Screen Display 1 GHz, 4 Ch, 5 GS/s, 12.5 Mpts/ChWaveRunner 104Xi-A(10 GS/s, 25 Mpts/Ch in interleaved mode)with 10.4" Color Touch Screen Display 600 MHz, 4 Ch, 5 GS/s, 12.5 Mpts/Ch WaveRunner 64Xi-A(10 GS/s, 25 Mpts/Ch in interleaved mode)with 10.4" Color Touch Screen Display 600 MHz, 2 Ch, 5 GS/s, 12.5 Mpts/Ch WaveRunner 62Xi-A(10 GS/s, 25 Mpts/Ch in interleaved mode)with 10.4" Color Touch Screen Display 400 MHz, 4 Ch, 5 GS/s, 12.5 Mpts/Ch WaveRunner 44Xi-A(25 Mpts/Ch in interleaved mode)with 10.4" Color Touch Screen DisplayWaveRunner MXi-A Series Oscilloscopes2 GHz, 4 Ch, 5 GS/s, 12.5 Mpts/ChWaveRunner 204MXi-A(10 GS/s, 25 Mpts/Ch in Interleaved Mode)with 10.4" Color Touch Screen Display 1 GHz, 4 Ch, 5 GS/s, 12.5 Mpts/ChWaveRunner 104MXi-A(10 GS/s, 25 Mpts/Ch in Interleaved Mode)with 10.4" Color Touch Screen Display 600 MHz, 4 Ch, 5 GS/s, 12.5 Mpts/Ch WaveRunner 64MXi-A(10 GS/s, 25 Mpts/Ch in Interleaved Mode)with 10.4" Color Touch Screen Display 400 MHz, 4 Ch, 5 GS/s, 12.5 Mpts/Ch WaveRunner 44MXi-A(25 Mpts/Ch in Interleaved Mode)with 10.4" Color Touch Screen DisplayIncluded with Standard Configuration÷10, 500 MHz, 10 M Ω Passive Probe (Total of 1 Per Channel)Standard Ports; 10/100/1000Base-T Ethernet, USB 2.0 (5), SVGA Video out, Audio in/out, RS-232Optical 3-button Wheel Mouse – USB 2.0Protective Front Cover Accessory PouchGetting Started Manual Quick Reference GuideAnti-virus Software (Trial Version)Commercial NIST Traceable Calibration with Certificate 3-year WarrantyGeneral Purpose Software OptionsStatistics Software Package WRXi-STAT Master Analysis Software Package WRXi-XMAP (Standard with MXi-A model oscilloscopes)Advanced Math Software Package WRXi-XMATH (Standard with MXi-A model oscilloscopes)Intermediate Math Software Package WRXi-XWAV (Standard with MXi-A model oscilloscopes)Value Analysis Software Package (Includes XWAV and JTA2) WRXi-XVAP (Standard with MXi-A model oscilloscopes)Advanced Customization Software Package WRXi-XDEV (Standard with MXi-A model oscilloscopes)Spectrum Analyzer and Advanced FFT Option WRXi-SPECTRUM Processing Web Editor Software Package WRXi-XWEBProduct Description Product CodeApplication Specific Software OptionsJitter and Timing Analysis Software Package WRXi-JTA2(Standard with MXi-A model oscilloscopes)Digital Filter Software PackageWRXi-DFP2Disk Drive Measurement Software Package WRXi-DDM2PowerMeasure Analysis Software Package WRXi-PMA2Serial Data Mask Software PackageWRXi-SDM QualiPHY Enabled Ethernet Software Option QPHY-ENET*QualiPHY Enabled USB 2.0 Software Option QPHY-USB †EMC Pulse Parameter Software Package WRXi-EMC Electrical Telecom Mask Test PackageET-PMT* TF-ENET-B required. †TF-USB-B required.Serial Data OptionsI 2C Trigger and Decode Option WRXi-I2Cbus TD SPI Trigger and Decode Option WRXi-SPIbus TD UART and RS-232 Trigger and Decode Option WRXi-UART-RS232bus TD LIN Trigger and Decode Option WRXi-LINbus TD CANbus TD Trigger and Decode Option CANbus TD CANbus TDM Trigger, Decode, and Measure/Graph Option CANbus TDM FlexRay Trigger and Decode Option WRXi-FlexRaybus TD FlexRay Trigger and Decode Physical Layer WRXi-FlexRaybus TDP Test OptionAudiobus Trigger and Decode Option WRXi-Audiobus TDfor I 2S , LJ, RJ, and TDMAudiobus Trigger, Decode, and Graph Option WRXi-Audiobus TDGfor I 2S LJ, RJ, and TDMMIL-STD-1553 Trigger and Decode Option WRXi-1553 TDA variety of Vehicle Bus Analyzers based on the WaveRunner Xi-A platform are available.These units are equipped with a Symbolic CAN trigger and decode.Mixed Signal Oscilloscope Options500 MHz, 18 Ch, 2 GS/s, 50 Mpts/Ch MS-500Mixed Signal Oscilloscope Option 250 MHz, 36 Ch, 1 GS/s, 25 Mpts/ChMS-500-36(500 MHz, 18 Ch, 2 GS/s, 50 Mpts/Ch Interleaved) Mixed Signal Oscilloscope Option 250 MHz, 18 Ch, 1 GS/s, 10 Mpts/Ch MS-250Mixed Signal Oscilloscope OptionProbes and Amplifiers*Set of 4 ZS1500, 1.5 GHz, 0.9 pF , 1 M ΩZS1500-QUADPAK High Impedance Active ProbeSet of 4 ZS1000, 1 GHz, 0.9 pF , 1 M ΩZS1000-QUADPAK High Impedance Active Probe 2.5 GHz, 0.7 pF Active Probe HFP25001 GHz Active Differential Probe (÷1, ÷10, ÷20)AP034500 MHz Active Differential Probe (x10, ÷1, ÷10, ÷100)AP03330 A; 100 MHz Current Probe – AC/DC; 30 A rms ; 50 A rms Pulse CP03130 A; 50 MHz Current Probe – AC/DC; 30 A rms ; 50 A rms Pulse CP03030 A; 50 MHz Current Probe – AC/DC; 30 A rms ; 50 A peak Pulse AP015150 A; 10 MHz Current Probe – AC/DC; 150 A rms ; 500 A peak Pulse CP150500 A; 2 MHz Current Probe – AC/DC; 500 A rms ; 700 A peak Pulse CP5001,400 V, 100 MHz High-Voltage Differential Probe ADP3051,400 V, 20 MHz High-Voltage Differential Probe ADP3001 Ch, 100 MHz Differential Amplifier DA1855A*A wide variety of other passive, active, and differential probes are also available.Consult LeCroy for more information.Product Description Product CodeHardware Accessories*10/100/1000Base-T Compliance Test Fixture TF-ENET-B †USB 2.0 Compliance Test Fixture TF-USB-B External GPIB Interface WS-GPIBSoft Carrying Case WRXi-SOFTCASE Hard Transit CaseWRXi-HARDCASE Mounting Stand – Desktop Clamp Style WRXi-MS-CLAMPRackmount Kit WRXi-RACK Mini KeyboardWRXi-KYBD Removable Hard Drive Package (Includes removeable WRXi-A-RHD hard drive kit and two hard drives)Additional Removable Hard DriveWRXi-A-RHD-02* A variety of local language front panel overlays are also available .† Includes ENET-2CAB-SMA018 and ENET-2ADA-BNCSMA.Customer ServiceLeCroy oscilloscopes and probes are designed, built, and tested to ensure high reliability. In the unlikely event you experience difficulties, our digital oscilloscopes are fully warranted for three years, and our probes are warranted for one year.This warranty includes:• No charge for return shipping • Long-term 7-year support• Upgrade to latest software at no chargeLocal sales offices are located throughout the world. Visit our website to find the most convenient location.© 2010 by LeCroy Corporation. All rights reserved. Specifications, prices, availability, and delivery subject to change without notice. Product or brand names are trademarks or requested trademarks of their respective holders.1-800-5-LeCroy WRXi-ADS-14Apr10PDF。

Prometheus监控MySQL5.71. MySQL配置MySQL安装配置参考我的博客其他⽂章（安装配置参考：，主从配置参考：），这⾥只讲述如何利⽤Prometheus监控MySQL5.7数据库。

1.1 新增监控帐号在MySQL数据库中，新增Prometheus监控帐号，⽤于各类性能数据查询；mysql> GRANT PROCESS, REPLICATION CLIENT, SELECT ON *.* TO 'exporter'@'::1' IDENTIFIED BY 'exporter@123' WITH MAX_USER_CONNECTIONS 3;mysql> flush privileges;1.2 修改MySQL配置⽂件增加授权配置fcat >> /usr/local/mysqld_exporter/f << EOF[client]host=localhostport=3306user=exporterpassword=exporter@123EOF2. 安装监控客户端2.1 监控客户端安装在需要监控的MySQL数据库服务器上安装mysqld_exporter：cd /usr/local/wget https:///prometheus/mysqld_exporter/releases/download/v0.12.0/mysqld_exporter-0.12.0.linux-amd64.tar.gz# 下载不了的⾃⼰想办法哈，当然也可以留⾔给我。

tar xzf mysqld_exporter-0.12.1.linux-amd64.tar.gzln -sv mysqld_exporter-0.12.1.linux-amd64 mysqld_exporterchown -R prometheus:prometheus /usr/local/mysqld_exporter/mysqld_exporterchmod 755 /usr/local/mysqld_exporter/mysqld_exporter2.2 配置mysqld_exporter为系统服务cat >> /usr/lib/systemd/system/mysqld_exporter.service << EOF[Unit]Description=mysqld_exporterDocumentation=https://prometheus.io/After=network.target[Service]Type=simpleUser=prometheusExecStart=/usr/local/mysqld_exporter/mysqld_exporter --web.listen-address=0.0.0.0:9104 --config.my-cnf=/usr/local/mysqld_exporter/f \--log.level=error \_schema.processlist \_schema.innodb_metrics \_schema.innodb_tablespaces \_schema.innodb_cmp \_schema.innodb_cmpmemRestart=on-failure[Install]WantedBy=multi-user.targetEOF下⾯是搜集主从信息的，没有配置主从可以不加这两个选项，否则会报错：msg="Error scraping for collect.slave_hosts: Error 1227: Access denied; you need (at least one of) the REPLICATION SLAVE privilege(s) for this operation" source="exporter.go:171"--collect.slave_status \--collect.slave_hosts \2.3 设置开机启动并启动mysqld_exporterchown -R prometheus:prometheus /usr/lib/systemd/system/mysqld_exporter.servicechmod 644 /usr/lib/systemd/system/mysqld_exporter.servicesystemctl daemon-reloadsystemctl enable mysqld_exporter.servicesystemctl start mysqld_exporter.service3. 监控指标查看3.1 metrics监控内容访问：可以看到mysql的指标# HELP go_gc_duration_seconds A summary of the GC invocation durations.# TYPE go_gc_duration_seconds summarygo_gc_duration_seconds{quantile="0"} 1.0977e-05go_gc_duration_seconds{quantile="0.25"} 1.1386e-05go_gc_duration_seconds{quantile="0.5"} 1.1929e-05go_gc_duration_seconds{quantile="0.75"} 1.665e-05go_gc_duration_seconds{quantile="1"} 3.3897e-05go_gc_duration_seconds_sum 0.000189596go_gc_duration_seconds_count 12# HELP go_goroutines Number of goroutines that currently exist.# TYPE go_goroutines gaugego_goroutines 8...此处省略若⼲⾏# HELP mysql_up Whether the MySQL server is up.# TYPE mysql_up gaugemysql_up 1# HELP mysql_version_info MySQL version and distribution....此处省略若⼲⾏3.2 确认监控指标正常# curl localhost:9104/metrics | grep mysql_up% Total % Received % Xferd Average Speed Time Time Time Current Dload Upload Total Spent Left Speed100 233k 100 233k 0 0 4322k 0 --:--:-- --:--:-- --:--:-- 4410k# HELP mysql_up Whether the MySQL server is up.# TYPE mysql_up gaugemysql_up 1 #说明mysql启动，并且能正常监控到了4. 在Prometheus中配置MySQL监控在Prometheus-Server中配置MySQL数据采集修改prometheus配置⽂件：在 scrape_configs下⾯添加如下配置# vim /usr/local/prometheus/prometheus.ymlscrape_configs:- job_name: 'mysql_db'static_configs:- targets: ['10.88.8.120:9104']labels:instance: wikidb-10.88.8.120group: mysql_db- job_name: 'mysql-host'static_configs:- targets: ['10.88.8.120:9100']labels:instance: wikidb-10.88.8.120在Prometheus界⾯可以看到mysql相关指标5. 在Grafana中添加MySQL监控图表打开Grafana监控界⾯，新增MySQL监控图表在弹出界⾯中输⼊：7362然后点击Load，在新界⾯中，选择数据源，然后导⼊即可。

White PaperDFTMAX UltraNew Technology to Address Key Test ChallengesAuthorCy Hay,Marketing ManagerRohit Kapur,Synopsys ScientistIntroductionFor most design-for-test (DFT) and test engineers, achieving very high defect coverage with minimaldesign impact and low manufacturing test cost are fundamental objectives. Almost all of today’s largedigital designs require scan compression to meet these goals. This paper explains how DFTMAX™ Ultradelivers new scan compression technology that further reduces test cost and simplifies design impact,providing improvements in test quality.Achieving High Test QualityAdvanced manufacturing process nodes introduce new types of defects that require additional testpatterns to detect. There are several reasons why additional test patterns are needed, and why higherlevels of scan compression are required to manage test cost. First, the test coverage of traditional faultmodels, such as stuck-at and transition faults, needs to increase. Even a 1% increase in test coveragefor these fault models can sometimes double the number of patterns generated. ATPG coverage versuspattern count is an asymptotic function because each additional pattern detects fewer and fewerpreviously undetected faults.Second, new fault models need to be included in the test generation flow to detect defect types thatare not sufficiently covered by the established fault models already mentioned: bridging and dynamicbridging faults for metal shorts, internal cell faults for complex library cells, and slack-based transitionfaults for small delay defects. These new fault models are more difficult to sensitize, meaning the numberof detections per pattern will be lower. Thus, achieving even nominal coverage of these new fault modelsrequires a significant increase in the total number of test patterns.Delivering Higher Compression and Faster Shift SpeedsDFTMAX Ultra uses a new compression architecture to reduce total scan test data and test time by2-3X over existing compression technologies. DFTMAX Ultra also achieves higher compression whenfewer chip pins or tester channels are available for manufacturing test. The architecture uses streaming,bidirectional compressors and decompressors (CODECs) for the scan input and scan output data.This new CODEC design allows both very efficient test generation that maximizes the number of faultsdetected per pattern, as well as independent control over unknown values that typically degradecompression efficiency. Figure 1 shows a high-level view of the new architecture.September 2013Using compression to reduce the number of scan test cycles is one factor in reducing overall test time. Another factor is reducing the time for each test cycle. The DFMTAX Ultra compression architecture shown in Figure 1 is highly pipelined to minimize per-cycle timing delays from the chip pins, through the CODECs, and to the scan chains. To maximize scan shift frequency, multicycle paths are used on all signals that might require significant routing length. These optimizations mean that scan shift speeds are limited by external factors, such as timing and power limitations of the tester or the device under test, rather than by the scan compression logic. A higher scan shift frequency provides additional and significant test cost reductions.Reducing Test Cost with Multisite Testing and Fewer Test PinsThe widespread use of multisite testing has shifted the requirements for scan compression. Compared to using all available tester channels on a single die, testing multiple dies in parallel has proven to be a more effective and predictable method for reducing manufacturing test cost. This is because the former method relies on a large number of available chip pins and very wide CODEC configurations (with more routing congestion) to achieve the same total cost reduction.Several important trends are reducing the number of chip pins available for test. Smaller form factors and tighter packaging for today’s mobile electronics mean that the total number of pins is shrinking relative to the increase in device gate counts. And, more analog functions are being integrated into many of these designs,Simplified DFT Implementation on Large SoC DesignsToday’s largest designs contain tens or even hundreds of cores, each with potentially independent clockand/or power domains. For such designs, top-level integration becomes particularly cumbersome and unpredictable. DFTMAX Ultra greatly simplifies the task of top-level DFT integration. Foremost, the flexibility ofthis new architecture enables each core to have one or more dedicated CODEC, regardless of the size of thecore. This means that all of the scan compression logic for a core is fully contained within that core, and that CODECs do not need to be shared across multiple cores.Just like traditional scan, DFTMAX Ultra uses a single clock for shifting tester scan data, CODEC pipelines,and internal scan chains. Thus, no additional clock generation or clock gating is required within each core,and more importantly, at the top level. Also like traditional scan, this architecture uses a single scan-enablesignal for CODECs and scan chains. This simplifies DFT connections between each core and the top-level test control module.Because all CODECs can be fully contained within a single core, there is no dependency on completion ofother cores or top-level logic for each core’s DFT closure. The result is that ATPG and timing closure (includingall test modes) can be run on each core as soon as it is completed.ConclusionDFTMAX Ultra delivers significant new technology to simplify DFT implementation and reduce manufacturingtest cost in the face of increasing design sizes and test quality requirements. This technology builds onthe strengths of the Synopsys synthesis-based test platform and is easily deployed in the industry’s mostcommon design flows. For customers already using DFTMAX, DFTMAX Ultra requires only incrementalchanges to existing DFT synthesis scripts. Lastly, TetraMAX ATPG is fully optimized for both test pattern generation and failure diagnostics for DFTMAX Ultra designs.Synopsys, Inc. • 700 East Middlefield Road • Mountain View, CA 94043 • ©2013 Synopsys, Inc. All rights reserved. Synopsys is a trademark of Synopsys, Inc. in the United States and other countries. A list of Synopsys trademarks is。

Force Sensor (PS-2104)Force Sensor Bumper attachment Hook attachmentCart thumbscrew (M5 × 45 mm)Use to secure the sensor to a P ASCO dynamics cart. Rod clamp thumbscrew (1/4-20 × 0.75 in.)Use to secure the sensor to a rod, such as the 120 cm Stainless Steel Rod (ME-8741).Additional equipment required:•P ASPORT interface, such as the 550 Universal Interface (UI-5001) or 850 Universal Interface (UI-5000)•P ASCO Capstone or SP ARKvue data collection softwareGet the softwareY ou can use the sensor with SP ARKvue or P ASCO Capstone software. If you’re not sure which to use, visit/products/guides/software-comparison .SPARKvue is available as a free app for Chromebook, iOS, and Android devices. We offer a free trial of SP ARKvue and Capstone for Windows and Mac. T o get the software, go to/downloads or search for SPARKvue in your device’s app store.If you have installed the software previously, check that you havethe latest update:SPARKvueCheck for UpdatesPASCO CapstoneGo to Help > Check for Updates .Software setup1.T urn on SP ARKvue, then click Sensor Data .2.T urn on the P ASPORT interface if needed, then connectyour interface to SP ARKvue. For more specific details, see the manual for your chosen interface and the SP ARKvue online help.3.Plug the Force Sensor into one of the P ASPORT ports on the interface. SP ARKvue will automatically detect and identify the sensor.To collect data using SPARKvue:1.From the Select Measurements for Templates column,select the appropriate measurement for your experiment.2.From the Templates column, select Graph to enter the experiment screen. The display will automatically plot your selected measurement on the y-axis and time on the x-axis.3.Click Startto begin recording data.1.T urn on Capstone, then click Hardware Setup from the Tools palette.2.T urn on the P ASPORT interface if needed, then connect your interface to Capstone. For more specific details, see the manual for your chosen interface and the Capstone online help.3.Plug the Force Sensor into one of the P ASPORT ports on the interface. Capstone will automatically detect and identify the sensor.To collect data using Capstone:1.Double-click the Graph icon from the Displays palette to create a new Graph display.2.Click each <Select Measurement> box and select an appropriate measurement to assign that measurement to the associated axis.3.Click Recordto begin recording data.Zero the sensorPress the ZERO button on the front of the sensor to automatically adjust the sensor’s output to zero.Sample rateBy default, the sensor collects 20 samples per second. It can collect data as fast as 1000 samples per second (or up to 5000samples per second if connected to an 850 or 550 Universal Interface) or as slowly as one sample every 24 hours. Thesample rate can be changed in PASCO Capstone or SP ARKvue.Product Guide | 012-07297F1Hardware setupConnect bumper and hook attachmentsScrew the bumper or hook into the sensor as illustrated below.Sensor mountingTo mount the sensor on a PASCO cart:1.Align the hole in the sensor labeled Cart with one of the threaded holes in the accessory tray of the cart.2.Insert the included cart thumbscrew through the Cart hole in the sensor.3.Screw the thumbscrew into the threaded hole on top of thecart, as shown below.To mount the sensor on a rod:1.Slide the sensor onto a rod, as shown below.2.Tighten the thumbscrew to secure the rod in place.Software helpThe SPARKvue and P ASCO Capstone Help provide additional information on how to use this product with the software. Y oucan access the help within the software or online.SPARKvueSoftware:Online:/sparkvuePASCO CapstoneSoftware: Help > P ASCO Capstone Help Online: /capstoneSpecifications and accessoriesVisit the product page at /product/PS-2104 to view the specifications and explore accessories. Y ou can also download experiment files and support documents from the product page.Experiment filesDownload one of several student-ready activities from the P ASCO Experiment Library. Experiments include editable student handouts and teacher notes. Visit /freelabs/PS-2104.Technical supportNeed more help? Our knowledgeable and friendly T echnical Support staff is ready to answer your questions or walk you through any issues.Chat Phone 1-800-772-8700 x1004 (USA)+1 916 462 8384 (outside USA) Email*****************Force Sensor | PS-21042Regulatory informationLimited warrantyFor a description of the product warranty, see the Warranty and Returns page at /legal.CopyrightThis document is copyrighted with all rights reserved. Permission is granted to non-profit educational institutions for reproduction of any part of this manual, providing the reproductions are used only in their laboratories and classrooms, and are not sold for profit. Reproduction under any other circumstances, without the written consent of P ASCO scientific, is prohibited.TrademarksP ASCO and P ASCO scientific are trademarks or registered trademarks of PASCO scientific, in the United States and in other countries. All other brands, products, or service names are or may be trademarks or service marks of, and are used to identify, products or services of, their respective owners. For more information visit /legal.Product end-of-life disposalThis electronic product is subject to disposal and recycling regulationsthat vary by country and region. It is your responsibility to recycle yourelectronic equipment per your local environmental laws and regulationsto ensure that it will be recycled in a manner that protects human healthand the environment. T o find out where you can drop off your waste equipment for recycling, please contact your local waste recycle or disposal service, or the place where you purchased the product. The European Union WEEE (Waste Electronic and Electrical Equipment) symbol on the product or its packaging indicates that this product must not be disposed of in a standard waste container.Product Guide | 012-07297F3。

grep是一个强大的文本搜索工具，在Linux和Unix系统中广泛使用。

除了基本的字符串匹配功能外，grep还支持一些高级的逻辑用法，以下是一些示例：
1. 使用正则表达式：grep支持使用正则表达式进行更灵活的匹配。

例如，可以使用`grep -E`选项启用扩展正则表达式，并使用元字符、字符类和量词等进行更复杂的匹配。

2. 使用逻辑操作符：grep支持使用逻辑操作符来组合多个模式。

例如，可以使用`-e`选项多次指定不同的模式，并使用`-o`选项指定逻辑操作符（AND、OR、NOT）来实现更精确的匹配。

3. 反向匹配：使用`-v`选项可以实现反向匹配，即只显示不匹配指定模式的行。

4. 特定字段匹配：使用`-w`选项可以仅匹配整个单词，而不是部分匹配。

这对于需要精确匹配特定字段的情况非常有用。

5. 递归搜索：使用`-r`或`-R`选项可以在目录及其子目录中递归搜索文件。

这在需要搜索大量文件的情况下非常有用。

6. 上下文匹配：使用`-A`、`-B`和`-C`选项可以指定匹配行之前、之后
或周围的上下文行数。

这对于查看匹配行的上下文信息非常有用。

7. 输出行号：使用`-n`选项可以显示匹配行的行号，方便定位。

这只是grep的一些高级用法示例，还有更多功能和选项可供探索。

可以通过`man grep`命令在终端中查看完整的grep命令文档，了解更多用法和选项的详细信息。

一、概述在现代计算机科学领域中，图论被广泛应用于解决各种复杂的问题，而图数据库作为存储和管理图数据的重要工具，其性能和效率都受到了广泛关注。

在图数据库中，graphlookup作为一种常见的功能，其使用方法和原理对于理解图数据库的运作机制具有重要意义。

本文将对graphlookup的使用进行详解，并分析其在实际应用中的作用和影响。

二、graphlookup的基本概念graphlookup是一种用于在图数据库中进行数据查询的功能，其基本原理是通过指定的路径或条件进行数据搜索，并将符合条件的数据返回给用户。

在图数据库中，数据以节点和关系的形式存储，而graphlookup的功能则是通过遍历节点和关系的方式，查找满足指定条件的数据，并将结果返回给用户。

graphlookup可以被认为是一种数据检索的工具，其广泛应用于各种实际场景中。

三、graphlookup的使用方法1. 查询语法在使用graphlookup时，用户需要指定查询的路径或条件，以便系统能够按照指定的规则进行数据检索。

一般来说，graphlookup的查询语法包括节点的标识符、关系类型、条件等内容，用户可以根据自己的需求来灵活组合这些内容，以便获取具体的查询结果。

在查询一个人的朋友时，可以使用类似如下的语法：graphlookup("person",{"name":"Alice"})-[:FRIEND]->(friend)2. 查询参数除了查询语法外，graphlookup还支持一些参数的设定，以便用户可以对查询结果进行进一步的过滤和控制。

这些参数包括排序方式、限制条件、返回结果等内容，用户可以根据自己的需求来设置这些参数，以获得符合预期的查询结果。

用户可以通过设置limit参数来限制查询结果的数量，或者通过设置orderby参数来对结果进行排序。

3. 查询结果graphlookup会将查询的结果返回给用户，用户可以根据自己的需求来处理这些结果，包括展示、保存、分析等。

Software Quick Start GuideOceanView operates on 32- and 64-bit Windows, Macintosh and Linux operating systems. The software can control any Ocean Insight USB spectrometer.A complete OceanView Installation and Operation Manual can be found on our website at .Getting StartedMinimum System RequirementsMonitor Resolution 1024 X 768 or higher RAM1.5 GB or higherProcessor******************************************************************************************************************************************HD Space300 MB free spaceCaution:Do NOT connect the spectrometer to the computer until you install theOceanView software. Follow the instructions below to properly connect and configure your system.InstallationWindows InstallationThe total download is approximately 64 MB (32-bit) or 71 MB (64-bit).1. Download OceanView from software downloads at .2. Close all other applications running on the computer.3. Start Internet Explorer.4.Navigate to the link you received to the OceanView software in your email. Click on the OceanView software appropriate for your Windows operating system.5. Save the software to the desired location. The default installation directory is \ProgramFiles\Ocean Optics\OceanView .NOTEMost processors produced in 2010 and later work well with OceanView. OceanView does not run on tablets with ARM processors.6.The installer wizard guides you through the installation process. The OceanView iconlocation is Start | Programs | Ocean Optics | OceanView | OceanView and the desktop of the current user.Device Driver IssuesHardware device driver installation is seamless on Microsoft Windows operating systems when you connect your spectrometer to your computer. However, some Windows systems require a bit more care when connecting your spectrometer for the first time.If your spectrometer is not recognized by OceanView running on your computer, you need to manually install the spectrometer drivers using the procedure below.Windows Driver Installation ProcessUse this procedure when connecting your spectrometer to a Windows 64-bit system. Steps may vary slightly depending on the version of Windows.1.Open the Control Panel. Click DeviceManager.2.Right-click on the Ocean Insightspectrometer under Other devices. Chooseupdate driver software. This screen appears:3.Choose Browse my computer for driversoftware.4.Navigate to C:\Program Files\OceanOptics\OceanView\SystemFiles. Click OK.Then click Next.5.Choose Install this driver software anywayon this screen.The software will recognize your spectrometer if the driver installation is successful.Mac InstallationYou must be logged on as an administrative user to install OceanView on your Mac. The total download is approximately 35 MB.1. Download OceanView from software downloads at .2. Double-click the OceanView Setup_Mac.dmg file to mount the disk image. A newOceanView icon that looks like a disk drive appears on your desktop. The new icon should open automatically (if not, double-click it).3. Drag the OceanView .app icon to the Applications folder icon to install OceanView . Thenyou can launch OceanView from the Applications folder. Double-click the Applications folder and drag the OceanView icon from Applications to the Dock to be able to launch it faster.4. Drag the OceanView drive icon to the trash can once the installation has finished.Linux InstallationThe total download is approximately 75 MB (32-bit) or 67 MB (64-bit).1. Start a terminal window. Enter the following commands:a. chmod 755 ~/Desktop/OceanView Setup_Linux64.binb. sudo ~/Desktop/OceanView Setup_Linux64.binThe software prompts for your password. This allows you to execute the setup as root. Contact your system administrator if you do not have the password. If the sudo command does not work (it may not be set up for your user account), then enter the following:a. sub. (enter password for root)c. ~/Desktop/OceanView Setup_Linux64.binThe Linux version of OceanView requires some libraries that may not be installed by default, depending on the Linux distribution. The following libraries are required and are not provided as part of OceanView :• libstdc++ version 6 or newer • libXp version 6 or newer • libusb version 0.1.10Make sure that the linux libusb-0.1 exists in the system. Run either of these commands to verify that it exists:• dpkg-query -l | grep -i libusb –or NOTENewer versions of MacOSX do not ship with Java. You may need to manually install a recent Java release before installing OceanView. Instructions to download a recent Java release for different versions of OSX are here:/kb/HT5648There is also a direct link for the Java for OSX 10.7.3 and newer at:/en/download/manual.jsp#macNOTEThe example below is for a 64 bit installer downloaded to the desktop. Change 64 to 32 and the file location (if needed) for your installation.•sudo apt list –installed | grep -i liIf not found then install the library using this command (this is in Debian, and other Linux systems may have a different method to install library):a.sudo apt-get install libusb-0.12.It may be necessary to modify SELinux (Security Enhanced Linux) restrictions beforeOceanView will run. It is possible to remove SELinux auditing by running 'setenforcePermissive' as root or by customizing your SELinux policies. The OceanView installerdoes not modify system security settings.NOTEThe example below is for a 64-bit installer downloaded to the desktop. Change 64 to 32 and the file location (if needed) for the default installation directory is/usr/local/OceanOptics/OceanView.A symbolic link is put in /usr/bin so that you can enter OceanView on any command line to start the program.Product ActivationLicenseYou can activate your OceanView software conveniently online. Select Help --> Licensing. Enter the product key in the OceanView Licensing dialog box that you received when you purchased the software.If you do not have an Internet connection, click Offline Registration to display the Product Activation wizard. Use this wizard to save an activation request file and send it to Ocean Insight via an Internet-connected device. Ocean Insight will then reply with your Activation Request file. Use this in Step 3 of the Product Activation wizard.Start Your 30-Day Free TrialAll data and projects saved during your 30-day free trial will be available when the software is activated using a valid product key. Contact ********************* to purchase OceanView licenses.Double-click the OceanView icon on your Desktop to start the software. Click the Cancel button in the OceanView Product Activation dialog box that opens to start your 30-day free trial with a fully functional version of OceanView.Using Your Product Key to Activate Your SoftwareNOTEAn Internet connection is required to activate your software using a valid product key. If an Internetconnectionisnotavailable,*************************************************** procedure.1.Double-click the OceanView icon () on your desktop to start the software.2.Click Next in the OceanView Product Activation dialog box to enter your product key.3.Copy the product key from the email you received. Paste it into the product key box.4.Click the Register Software button to validate your product key.5.Click Finish to complete the software registration.If you see the message below, check your Internet connection. Then click the Register Software button again. If the computer is connected to the Internet and you still cannot register your software, contact ********************* for assistance.There is a problem with Licensing.Contact Ocean Insight for help.Quick Start GuideWhen you start OceanView, a Welcome screen appears. It asks what you want to do.Select from the following tasks:•Quick View -- Displays thespectrum in Quick Viewmode showing raw,unprocessed data. This isuncorrected for instrumentresponse vs. wavelength.Quick View shows you alive shot of what thespectrometer is “seeing.”From Quick View you canconstruct modes for different techniques.•Load a Saved Project– Loads a previously saved project. Click Restore Last Session to reload the schematic and views as they were when the software was last closed.•Spectroscopy Application Wizards– Use these functions to set up a measurement using the simple step-by-step wizards. A range of applications is available.NOTEOceanView has context sensitive help. Click the Help button in any dialog box for more details. Tooltips are available by hovering over a button or window for more information.Help is also available with the Help option in the top menu.Quick ViewSelect Quick View on the welcome screen to display spectra for all the attached devices in a raw, unprocessed data view. This mode was previously referred to as Scope mode in OceanInsights’ SpectraSuite software. This is the raw signal from the detector and is proportional to the voltage induced by the light falling on the detector.It is very important to realize that this is uncalibrated data and that a counts signal does not represent a particular power or energy from one wavelength to the next.Load a Saved ProjectOceanView can save and reload projects. You can quickly enter a processed mode by reloading a previously saved project.Spectroscopy Application WizardsThe Spectroscopy Wizards are the gateway to making measurements. Each wizard takes the user through a series of setup windows.Select the appropriate wizard to manage your measurement. This immediately enters the wizard sequence, taking you through the necessary steps to optimize your acquisition and enter the desired processing mode.The Wizard selection screen can also be accessed with the Create a new spectroscopy application button () or via the File |Create a new spectroscopy applicationmenu item.Measurement InterfaceAfter the completion of a measurementwizard, the Measurement Interface islaunched. This consists of the AcquisitionGroup window, the Graph window and theSchematic View window.Acquisition Group WindowAll acquisition controls are in theAcquisition Group Window. You can alsoselect between connected spectrometersvia the tabs at the top of the window.Click the Add/Remove Controls tab to seeand select additional features. Check theboxes next to the desired feature. This addsthe additional acquisition controls to the Main Controls tab. When the boxes are checked, the controls for these features will show on the Main Controls tab. Unchecking a feature does not disable the feature, it only hides the controls on the Main Controls tab. The spectrometer type determines which controls are available in the Add/Remove Controls tabGraph WindowThe Graph Window actively graphs spectraaccording to the selections made in theAcquisition Group window.Active graphs relating to the acquisition (e.g.,view, view-background etc.) are indicated on tabsabove the graph pane.These active graphs can be toggled between or dragged around the screen to customize the layout.Directly above the graph there are a selection of controls for sizing and scaling the axis, capturing and deleting overlay spectra, saving spectra, repeating dark and reference, and other graph functions like peak finding. Hover over the icons to indicate functionality.NOTEIf a smaller subset of functions is visible, then the operating interface is in EZ () mode.The operator can switch to advanced mode (where all icons are active), by clicking on the enter advanced mode () icon at the top left of the screen.Save SpectraSaving spectra is performed by first configuring the save , and then clicking on to perform the action that has been configured. There are various options available. The default setting is ‘save every scan’ and ‘stop after one scan,’ which takes the ac tion of saving a single scan to the designated file location.Peak FindingClick the View Spectrum Peaks button () in Graph View to find the peaks in your spectrum. The Configure Peak Metrics wizard guides you through a few quick steps to set up your peak finding parameters.1.Set the baseline level.2.Choose your peak finding method. Set peak finding criteria and optional spatial filtering.3.Select which peak parameters to display on the graph, in a table, or both.4.Make adjustments to peak finding parameters and criteria in the new Peak menu thatopens.5.Close the peak menu.6.Click the View Spectrum Peaks button () to remove peak information from thegraphQuestions?Chat with us at .*********************•US +1 727-733-2447EUROPE +31 26-3190500 • ASIA +86 21-6295-660010 MNL-1008 Rev A。