TB254中文资料

MSA893
IF (mA) 10
2
(1) (2) (3)
10
10
1
(1)
(2)
(3)
1
(3)
10 1
10 1
0 0.4 0.8 VF (V) 1.2
0
10
20
VR (V)
30
(1) Tamb = 125 °C. (2) Tamb = 85 °C. (3) Tamb = 25 °C.
(1) Tamb = 125 °C. (2) Tamb = 85 °C. (3) Tamb = 25 °C.
BAT254
UNIT mV mV mV mV mV µA ns
Cd Note
diode capacitance
10
pF
1. Pulse test: tp = 300 µs; δ = 0.02. THERMAL CHARACTERISTICS SYMBOL Rth j-a Note 1. Refer to SOD110 standard mounting conditions. PARAMETER thermal resistance from junction to ambient note 1 CONDITIONS VALUE 315 UNIT K/W
2002 May 28
3
Philips Semiconductors
Product specification
Schottky barrier diode
GRAPHICAL DATA
MSA892
BAT254
3 10 handbook, halfpage
10 3 IR (µA) 10 2
(2) (1)

62
内外定位环
Inner ring and outer ring
IR/OR
63
内定位环
Inner ring
IR
64
外定位环
Outer ring
OR
65
螺栓
Bolt
B
66
螺柱
Stud bolt
SB
67
螺母
Nut
NU
68
花蓝螺母
Turnbuckle
TB
69
垫圈
Washer
WSR
70
弹簧垫圈
Spring washer
79
安全阀
Safety valve
SV
80
减压阀
Pressure reducing valve
RV
81
蒸汽疏水阀
Steam trap
ST
82
泄压阀
Pressur relief valve
PRV
83
呼吸阀
Breather valve
BV
84
针形阀
Needle valve
NV
85
角阀
AV
86
隔膜阀
DV
87
Flat metallic gasket
FMG
58
齿形金属垫片
Solid metal serrated gasket
SMSG
59
透镜式金属环垫
Lens ring gasket
LER
60
八角形金属环垫
Octagonal ring gasket
OCR
61
椭圆形金属环垫
Oval ring gakset

中文图书分类工作细则一、总则1.文献分类工作既具体、繁杂、细密，又要求有很强的系统性、连续性、一致性，是一项富有科学性和技术性的工作。

只有科学有效地组织，规范化管理，才能保障文献分类工作的质量。

因此分类人员必须有较全面的图书情报学基础知识修养，要掌握文献分类、编目、检索的基础理论，熟练掌握文献分类的规则、技术方法，有较高的文献检索技能和利用工具书的技能；要有较高的文化水平和广博的学科知识，要有较强的逻辑分析、判断、归纳、综合能力和独立解决问题的能力。

分类时必须科学、认真，力求归类正确，前后一致，方便读者使用。

2.图书馆中文图书自1999年9月开始使用《中图法》第四版，类目细分至最详细级，《资料法》类号（既“+”以后的类号）除外。

除有必要延续原有类号的文献外，原则上采取与第三版“一刀切”的做法。

3.类目的仿分和复分，依照各具体类目的注释和说明进行。

4.一书在手，分类人员首先要分类查重，查明待分类的文献与已入藏图书的关系：是否为已入藏文献的复本，是否为已入藏图书的不同版本，包括不同译本，不同版次、多卷书的不同卷次或续编、不同载体形式等，然后分别不同的情况加以处理。

其次分析文献内容，从题名、文摘、内容提要、正文或借助工具书了解文献论述的范围、重点及其学科属性等。

在了解全书的基础上，对文献主题进行提炼和选择，最后确定该文献的分类号码。

5.为保证分类的质量，必须进行分类复查。

复查包括文献主题分析的正确性、充分性，归入类目是否准确。

使用套录数据，要对其分类号进行复审，以确定图书馆是否采用，以及是否增加新的互见分类号或分析类号等。

二、基本规则1.文献分类应按文献内容的学科或专业属性归类，只有按文献的学科内容分类不适用时，才能按文献的其它特征分类。

例：《当代人口迁移与城镇化》，是从人口地理学的角度研究中国人口的迁移，属人口学的范畴，应归入人口地理学，分类号为C922.2。

2.文献分类必须体现系统性和逻辑性，处理好分类法上下位类的从属关系、同位类的并列关系、类目涵义受类目体系限定的逻辑关系、总论与专论的关系等。

MILITARY AND COMMERCIAL TEMPERATURE RANGESJANUARY 1995©1995 Integrated Device Technology, Inc.6.17DSC-4203/5The FCT543T/FCT2543T is a non-inverting octal trans-ceiver built using an advanced dual metal CMOS technology.This device contains two sets of eight D-type latches with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (CEAB ) input must be LOW in order to enter data from A 0–A 7 or to take data from B 0–B 7, as indicated in the Function Table. With CEAB LOW,a LOW signal on the A-to-B Latch Enable (LEAB ) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs.With CEAB and OEAB both LOW, the 3-state B output buffers are active and reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses the CEBA , LEBA and OEBA inputs.The FCT2543T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot and controlled output fall times-reducing the need for external series terminating resistors. FCT2xxxT parts are plug-in replacements for FCTxxxT parts.1•Common features:–Low input and output leakage ≤1µA (max.)–CMOS power levels–True TTL input and output compatibility – V OH = 3.3V (typ.)– V OL = 0.3V (typ.)–Meets or exceeds JEDEC standard 18 specifications –Product available in Radiation Tolerant and Radiation Enhanced versions–Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked)–Available in DIP, SOIC, SSOP, QSOP, CERPACK and LCC packages •Features for FCT543T:–Std., A, C and D speed grades–High drive outputs (-15mA I OH , 64mA I OL )–Power off disable outputs permit “live insertion”•Features for FCT2543T:–Std., A, and C speed grades–Resistor outputs (-15mA I OH , 12mA I OL Com.)(-12mA I OH , 12mA I OL Mil.)–Reduced system switching noiseFAST CMOS OCTAL LATCHED TRANSCEIVERMILITARY AND COMMERCIAL TEMPERATURE RANGES6.172PIN CONFIGURATIONSDIP/SOIC/SSOP/QSOP/CERPACKTOP VIEWGNDA 0A 1A 2VccB 0A 3A 4A 5A 6A 7B 1B 2B 3B 4B 5B 6B 7OEABCEBA LCC TOP VIEWG N N CNC B 1B 2B 3B 4B 5B 6A C E AB B L E A B O E A B 2613 drw 022613 drw 03FUNCTION TABLE (1, 2)For A-to-B (Symmetric with B-to-A)2613 tbl 021.* Before LEAB LOW-to-HIGH TransitionH = HIGH Voltage Level L = LOW Voltage Level— = Don’t Care or Irrelevant2.A-to-B data flow shown; B-to-A flow control is the same, except usingCEBA , LEBA and OEBA .(1)NOTES:1.Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed V CC by +0.5V unless otherwise noted.2.Input and V CC terminals only.3.Outputs and I/O terminals only.1. This parameter is measured at characterization but not tested.DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGEFollowing Conditions Apply Unless Otherwise Specified:NOTES:1.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.2.Typical values are at Vcc = 5.0V, +25°C ambient.3.Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.4.The test limit for this parameter is ±5µA at T A = –55°C.5.This parameter is guaranteed but not tested.6.173NOTES:2613 tbl 081.For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.2.Typical values are at V CC = 5.0V, +25°C ambient.3.Per TTL driven input (V IN = 3.4V). All other inputs at V CC or GND.4.This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.5.Values for these conditions are examples of the I CC formula. These limits are guaranteed but not tested.6.I C = I QUIESCENT + I INPUTS + I DYNAMICI C = I CC + ∆I CC D H N T + I CCD (f CP/2 + f i N i)I CC = Quiescent Current∆I CC = Power Supply Current for a TTL High Input (V IN = 3.4V)D H = Duty Cycle for TTL Inputs HighN T = Number of TTL Inputs at D HI CCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)f CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)f i = Input FrequencyN i = Number of Inputs at f iAll currents are in milliamps and all frequencies are in megahertz.6.1742513 tbl 092513 tbl 101.See test circuits and waveforms.2.Minimum limits are guaranteed but not tested on Propagation Delays.3.This limit is guaranteed but not tested.6.1756.176TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTSSET-UP, HOLD AND RELEASE TIMES PULSE WIDTHENABLE AND DISABLE TIMESPROPAGATION DELAY 7.0V3V 1.5V 0V3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V DATA INPUTPRESET CLEAR ETC.1.5V1.5VSAME PHASE INPUT TRANSITION3V 1.5V 0V 1.5V V OH OUTPUTINPUT TRANSITION3V 1.5V 0VV OL 3V1.5V 0V 3.5V 0VV OLENABLEDISABLEV OH PRESET CLEARCLOCK ENABLEETC.C L =Load capacitance: includes jig and probe capacitance.R T =Termination resistance: should be equal to Z OUT of the PulseGenerator.NOTES:1.Diagram shown for input Control Enable-LOW and input Control Disable-HIGH2.Pulse Generator for All Pulses: Rate ≤ 1.0MHz; t F ≤ 2.5ns; t R ≤ 2.5ns2513 drw 052513 drw 062513 drw 072513 drw 082513 drw 096.177ORDERING INFORMATIONXXXXX X X Blank CommercialB MIL-STD-883, Class BP D SO L E PY Q Plastic DIP CERDIPSmall Outline ICLeadless Chip Carrier CERPACKShrink Small Outline PackageQuarter-size Small Outline Package 543T 543AT 543CT 543DT Octal Latched Transceiver-55°C to +125°C 0° to +70°C5474IDTFCTXHigh DriveBalanced Drive Blank 22613 drw 10。