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Precision muon g-2 results and light Higgs bosons in the 2HDM(II)

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a rXiv:h ep-ph/2876v224Aug22CERN-TH/2002-184IFT -32/2002hep-ph/0208076August 2002Precision muon g −2results and light Higgs bosons in the 2HDM(II)Maria Krawczyk Theory Division,CERN,CH-1211Geneva 23,Switzerland and Institute of Theoretical Physics,Warsaw University,ul.Ho˙z a 69,00-681Warsaw,Poland Abstract We discuss the implications of the recent evaluations of the SM contribution to a µ=(g −2)µ/2in the light of the latest E821measurement,which indicate ∼3σdeviation.We derive the 95%CL interval,δa µ,to be used to constrain any additional contribution to a µ,beyond the SM ones;it has to have a positive sign.We apply the δa µto constrain the light Higgs-boson scenarios in a Two-Higgs-Doublet-Model (“Model II”).If the con-straints from the new (g −2)µresults are combined with the other existing constraints,one can exclude a light-scalar scenario at 95%CL,while a light-pseudoscalar scenario can be realized,for a pseudoscalar mass between 25and 70GeV,with tan βin the range 25<∼tan β<∼115.Dedicated to Stefan Pokorski on the occasion of his 60th birthdayTo appear in Acta Physica Polonica BCERN-TH/2002-184IFT -32/2002hep-ph/0208076August 20021IntroductionA precision measurement of the g−2for the muon at BNL is expected to test the electroweak (EW)sector of the Standard Model(SM)and at the same time to shed light on possible effects of“new physics”.After a release of the new E821result[1],based on theµ+data collected in the year2000,a current mean of experimental results for(g−2)µis([1]:(g−2)expµa expµ≡the possible implications of the(g−2)µresults to be reanalysed.The issue of whether this is a signal of supersymmetry is already being addressed[25].Here we focus on the implication of the latest(g−2)µresults for the light-Higgs boson scenarios in the non-supersymmetric, CP-conserving Two-Higgs-Doublet-Model(2HDM)in its version called“Model II”;this is a continuation of earlier studies[24,26,27].In sec.2we collect some results based on the recent calculations of a SMµ.As a referencefor the vp1contribution we take the e+e−data-driven analysis done by Jegerlehner[13],FJ02, where the new CMD-2results were used.The difference between the experimental data andthe SM prediction,∆aµ=a expµ−a SMµ,can be used to derive stringent constraints on theparameters of models,which give additional contribution(s)to aµ.We calculate the interval δaµ,which can then be used to constrain any such contribution,at95%CL.In sec.3we introduce the2HDM(II),which we wish to constrain using this interval,and discuss briefly the existing constraints.In sec.4we derive the95%CL limits on the parameters of this model, usingδaµ.Section5contains the combined constraints,while the conclusions and outlook are given in sec.6.2The g−2for the muon:the new experimental and theoretical resultsHere we collect the SM contributions(and their uncertainties),which we take into account in our analysis.First we discuss the hadronic contributions(see table1).We use the higher order contribution from[16]and,for the lbl scattering contribution,we take an estimate from [20].The leading vacuum polarization contribution is taken from a preliminary result of an analysis by Jegerlehner,FJ02[13],where the experimental input is based only on the e+e−data, including the latest ones from CMD-2[22].We sum all the hadronic contributions,adding inquadrature the corresponding errors.This leads us to the result for a hadµgiven in the last rowof table1(which we label by the author of the analysis of the vp1contribution).TABLE1Hadronic contribution[in10−11]We take the QED and EW terms from[3]and[7,8],respectively(see table2).We then calculate the total SM prediction presented in this table,by adding the QED and EW to the full hadronic contributions,and by adding in quadrature the corresponding errors.This leads us to the SM prediction(we label it,as above,by the author of the analysis of the vp1contribution):[FJ02]a SMµ=116591726.7(70.9)×10−11.(2)Taking the new world average we calculate the quantity∆aµ,defined as the difference between the central values of the experimental and theoretical(SM)predictions for aµ.The error for this quantity we estimate by adding in quadrature the corresponding experimental and theoretical errors,σ=QED116584705.7(2.9)had[FJ02]6869.0(70.7)EW152.0(4.0)lim(95%)93.8≤δaµ≤512.8vp1contribution,the ones used here,rely solely on the low-energy data for the e+e−collisions. The accuracy of these analyses increases significantly with respect to the earlier analyses of the same kind thanks to an inclusion of new,high-precision measurements[22]and the use of more refined theoretical methods.Moreover,the central value for the vp1contribution did not increase in these new analyses.Thus,the preliminary analyses by FJ02and HMNT lead to a deviation from the experimental value for the muon(g−2)larger than the published results mentioned above,which differ by“only”1.6to2.6σ,as pointed out in[1].Let us conclude this general part by the following comment.It becomes clear that already at present there is a need of a coherent and a comprehensive error analysis for all componentscontributing to the calculation ofσSMµ.It will be even more nessesary in a near future,when theBNL experiment will reach the planned accuracy.Since an estimate combining all the differentcontributions does not exist for a SMµ,and hence for∆aµ,which is needed for estimating theeffects of new physics,is not available at the moment,a simplified error analysis,as presented in this section,is unavoidable.This is sufficient for a rough estimation of new effects;however, to reach afinal conclusion,better error analyses are necessary.32HDM and existing constraints3.1The modelThe non-supersymmetric,CP-conserving2HDM(“Model II”)[28]based on two doublets of complex,scalar-fieldsφ1,φ2.This is a simple extension of the SM,in which only the Higgs sector is enlarged.To avoid possible large effects due to theflavour-changing neutral currents (FCNC),the2HDM potential can be chosen in a Z2-symmetric form,i.e.without(φ1,φ2) mixing.In the general case,the potential can have terms,characterized by a mass parameter µ,which break the Z2symmetry softly;see e.g.[30,31].The2HDM hasfive Higgs particles:two neutral Higgs scalars h and H,one neutral pseu-doscalar A,and a pair of charged Higgses H±.Their masses are free parameters of the model. Other parameters are:the angleα,which describes the mixing in the neutral Higgs-scalar sec-tor;tanβthe ratio of two vacuum expectation values of scalar doublets,tanβ=v2/v1;and the parameterµ.Small values ofµseem to be more natural from the point of view of the FCNC effects[30].It is worth noticing that for such a case,a non-decoupling of the heavy Higgs sector can be realized[30,31].In the2HDM one can choose the Yukawa couplings in a few different ways.Here we consider the Model(II)implementation,where one doublet of fundamental scalarfields couples to the u-type quarks,and the other to the d-type quarks and charged leptons.This way FCNC processes are avoided at the tree level[29,28].This Higgs sector is identical to the one in the MSSM;however,in the2HDM(II)considered by us,there are no tree-level relations between parameters as in the MSSM case.Therefore even for very heavy supersymmetric particles,the 2HDM(II)and MSSM have very different phenomenology.To be more specific,let us consider the ratios of the direct coupling constants of the Higgs boson h or H to the massive gauge bosons V=W or Z,as well as to the fermions(i.e. Yukawa couplings)for the u-type quarks and d-type quarks and the charged leptons,to the corresponding couplings for the SM.They are determined in terms of anglesαandβ[28,30]. Forχh i≡g h i/(g h i)SM(and similarly for H)we have,in a form suitable for a simultaneous discussion of h and H:χh V=sin(β−α),χH V=cos(β−α),χA V=0,(5)χh u=χh V+cotβχH V,χH u=χH V−cotβχh V,χA u=−iγ5cotβ,(6)χh d=χh V−tanβχH V,χH d=χH V+tanβχh V,χA d=−iγ5tanβ.(7) Here we have(χh V)2+(χH V)2=1.Observe a pattern relation between these couplings(for h or H):(χu−χV)(χV−χd)=1−χ2V,or(χu+χd)χV=1+χuχd,found in[30].Forχh V=1all couplings of h have the SM values,the couplings of H to gauge bosons are equal to zero,while one of the couplings of H to fermions may differ considerably from the corresponding SM one,for a small or large tanβ.IfχH V=1then the H-boson has SM couplings,while h has very different properties:χh V=0and the Yukawa couplingχh d can be large,for large values of tanβ.This is a case that may correspond to a light-scalar scenario discussed below.The Yukawa couplingχd,relevant to a Higgs boson coupling to a muon,plays a basic role in the calculation of the2HDM contribution to aµ.It is equal(up to a factor−iγ5)to tanβfor a pseudoscalar and H+.If in additionχh V=sin(β−α)=0,then the same holds for a scalar h; more precisely then|χh d|=tanβ(see eq.(7)).In the calculation of the two-loop contribution to aµ,the coupling of H+to a scalar h is involved as well,and it is given byχh H+= 1−M2h2M2H+(χh d+χh u),(8) with the same normalization as that for an elementary charged scalar particle in the SM.Forχh V=0one getsχhH+=(χhd−1/χh d)(M2h−µ2)/(2M2H+).We see that this coupling depends onthe parameterµ.In this paper we consider only the case withµ=0.A more general case will be studied elsewhere.3.2Existing constraintsMany searches for a light Higgs particle in the2HDM(II)were performed at various energies and machines;the most systematic studies were performed at LEP.All existing LEP data,see for instance[27,32,33,34,35],allows for the existence of one light neutral Higgs boson,h or A,with a mass even below20GeV.According to the results presented in the left panel of Fig. 1,the other Higgs particle(A or h,respectively)should be heavy enough to avoid the exclusion region in the(M h,M A)plane,given roughly by M h+M A≥90GeV.This is in contrast to the case of the SM Higgs boson,which should be heavier than114.4 GeV(95%CL).Also the MSSM Higgs particles should be heavier than∼90GeV[32].Anm h [GeV]m A [G e V ]0102030405060708090100DELPHI PRELIMINARY 00.20.40.60.811.21.4102030405060708090m H (GeV)c r o s s -s e c t i o n /S M SM coupling hZ Flavour Blind Figure 1:Left:The (M h ,M A )exclusion plot from OPAL [33].Right:The upper limit on the(χh V )2(DELPHI preliminary results [34]).analysis of the Bjorken process leads to an upper limit on the coupling of h to the gauge boson χh V .This limit,obtained at 95%CL,is presented in the right panel of Fig.1.We see that this coupling is much smaller than 1for M h <∼50GeV.The Yukawa couplings χd of a very light scalar or of a very light pseudoscalar,with mass below 10GeV,are constrained in the form of upper limits by the low-energy data [36,37],whereas LEP experiments [35]do that for for masses >∼4GeV (see Figs.4,5).It is only the analysis of the decay Z →h/Aγat LEP [27]that gives both the upper and lower limits for |χd |.Note that |χd |is equal to tan βfor A and,if χh V =0,also for h .The constraints from the Υ→h (A )γprocess,mentioned above,have been measured by a few groups [36].We present their results in Fig.4(lines denoted by K,N and L).Unfortunately,the corresponding predictions have large experimental and theoretical uncertainties,the latter ones both being due to the QCD and relativistic corrections.Nevertheless,as we will see below,the constraints coming from this process,even when accounting for some additional uncertainties,play an important role in closing a low mass window for the scalar h .Finally,note that in the 2HDM there is an important lower limit on the mass of H +,coming from the NLO analysis of the b →sγdata,given by M H +≥500GeV at 95%CL [39].4Constraining 2HDM(II)by g −2for the muon data We apply the δa µ,obtained in sec.2,to constrain parameters of the 2HDM (II)(see also earlier papers [26,41,40]).We assume that the lightest Higgs boson,h or A ,dominates thefull 2HDM (II)contribution,i .e .we have a 2HDM µ≈a h µ,or a A µ(a simple approach in [26]).This approach should hold for masses below50GeV,according to results presented in the left panel of Fig.1.For higher masses,which are also considered here,this is essentially equiva-lent to assuming a large mass gap between the lightest one,h or A,and the remaining Higgs bosons,which lead to a light-h or a light-A scenario.The relevant one-and two-loop diagrams, studied in[5,26,40]and[41,26],respectively,are shown in Fig.2for the h and A contributions.µµµ+,H+)Figure2:One-and two-loop(W+and H+loops are only for a h-exchange)diagrams.According to the LEP limits,discussed in sec. 3.2,we assume that h does not couple to W/Z,and therefore we neglect the W-loop in the light-h scenario.We include,however,an H+-loop with M H+equal to400,800GeV(and forµ=0).In Fig.3we present the contributions to aµobtained for an h(solid lines)and for a A (dashed lines),assuming Yukawa couplingsχd equal to1.For both h and A,the one-loop [5,26,40]and two-loop[41,26]results are shown separately.For the purpose of comparison, a one-loop H+contribution is presented.The one-loop diagram gives a positive contribution to aµfor a scalar,whereas it is negative for a pseudoscalar,independently of the value of the Higgs-boson mass.The signs of the two-loop contributions are reversed,these diagrams contribute negatively(positively)for a h(A)case[41].These two-loop diagrams can give large contributions,since they allow us to avoid one small Yukawa coupling with a muon in favor of a coupling with other,potentially heavy,particles circulating in the loop[42,41].Indeed, the contributions of two-loop diagrams dominate over the corresponding one-loop ones when the mass of h or A is above a few GeV,as shown in Fig. 3.As a result,in the two-loop analysis,based on a sum of the one-and two-loop(fermionic and bosonic)contributions,a positive(negative)contribution can be ascribed to a scalar h with mass below(above)5GeV or a pseudoscalar A with mass above(below)3GeV.In our calculation,a hµand a Aµcontain contributions proportional either toχ2d,equivalently to tan2βfor A and for h(ifχh V=0),or toχdχu=−1.Assuming a hµ=δaµfor a light-h scenario, and a Aµ=δaµfor a light-A one,and using the estimate of the intervalδaµfrom table2,we can derive constraints on tanβ,for h and A.They are,as expected,in the form of allowed regions (the area between thick lines in Fig.4)for masses below5GeV for h,shown in the left panel of Fig.4,and for masses above3GeV for A,the right panel of Fig.4(see also[41]).1e-050.00010.0010.010.111010010000.1110100d e l t a a _m u M_h(A,H+), GeV contribution to (g-2)/2 for muon h ___A - - -H+:one-loop in 10^{-11}h&A: one-loop h&A: two-loop 321Figure 3:The (absolute value of)individual contributions to a µfrom a scalar h (solid line),a pseudoscalar A (dashed line)and a charged Higgs boson H +(dotted line).The one-loop contribution for A and H +,and the two-loop one for h ,are negative.Two-loop diagram contributions for A and h (denoted “1”)are based on the down-type fermion loops only.For h also,results with an additional contribution due to the H +-loop are shown:line “2”(“3”)corresponds to M H +=800(400)GeV.5Combined 95%CL constraintsThe 95%CL constraints from the (g −2)µare presented in Fig.4(area between thick lines in the left and right panels)together with current upper limits from LEP,from the Yukawa processes [35](see ALEPH,DELPHI and OPAL results).Also the lower limits from the Z →h (A )γ[27]can be seen in Fig.4.In addition,the upper 90%CL limits from the Υdecay (lines denoted K,N and L,with the K results rescaled by a factor 2,as discussed in [26])and from the Tevatron[38],are presented as well.We see that our two-loop analysis,based on the latest (g −2)µdata and on the FJ02estimation of a had µ(vp1),if combined with constraints from other experiments,allows for the existence,in the 2HDM (II),of a pseudoscalar with mass between ∼25GeV and 70GeV,and tan βabove ∼25.The mass region for A allowed by (g −2)µdata,between ∼3and 25GeV,is excluded by the constraints from LEP,based on OPAL and DELPHI data.On the other hand the constraints from the Tevatron close the pseudoscalar-mass window above 70GeV.For a light scalar the combined constraints are even more severe;if the old constraints from the Υdecay data are taken into account,the area allowed by the latest (g −2)µdata disappears.Note that the exclusion of a light h is in agreement with the conclusion of the theoretical analysis reported in [43].0.11101000.1110100t a n (b e t a )M_h, GeV Exclusion 95%C.L. for h in 2HDM(II)Z->h gamma OpalDelphi Upsilon KTevatron allowedby g-2N etaL 0.11101000.1110100t a n (b e t a )M_A, GeVExclusion 95%C.L. for A in 2HDM(II)Z->A gamma Aleph Delphi Upsilon K Tevatron Opal N allowed by g-2L Figure 4:Current 95%CL constraints for h (left)and for A (right).The (g −2)µdata (this analysis)give the allowed area shown between thick dashed lines.Also the upper limits from LEP experiments (ALEPH,DELPHI,OPAL),Tevatron,as well as from the Υdecay into h (A )γand the ηdecay (for h only)are presented.The lower limits from LEP measurements on Z →h (A )γare shown as well.See text for details.6Conclusions and outlookUsing the latest precise measurement of the(g−2)µand comparing it with the improved, theoretical estimations of the SM contribution,we derive the95%CLδaµinterval to be used to constrain an additional contribution to aµ,beyond the SM ones.It allows one to constrain strongly the additional contribution,which arises in a CP-conserving,non-supersymmetric 2HDM(II)for a small parameterµ,studied in this paper.The additional contribution,allowed at95%CL,has to have a positive sign,and can lead to a clear prediction for a light-scalar and a light-pseudoscalar scenario in the model considered here.These two scenarios correspond to the case when one of the Higgs bosons,h or A,is very light,much lighter than the other Higgs particles of the model.It should be further noted that both of these scenarios are in agreement with existing data from other experiments.An exchange of such light particle dominates in the one-and two-loop contributions to the aµ.Constraints from(g−2)µare such that they exclude a light h with a mass above5GeV and a light A if its mass is below3GeV,as the corresponding contributions are negative in these regions.Our two-loop analysis presented in this paper is based on the newest(g−2)µdata and onthe(preliminary)FJ02estimation of a hadµ.Combining the constraints from the(g−2)µdatawith those from other experiments,a pseudoscalar with mass between∼25GeV and70GeV and25<∼tanβ<∼115is allowed.However,a light scalar is excluded.The main results will hold also if the g−2constraints are based on the HMNT results for the vp1.For the HMNT(in)case the window for a pseudoscalar will be even smaller:35≤M A≤70 GeV and tanβbetween40and120.The results will not change significantly,if the uncertainty for the lbl contribution is up two times larger than in the estimation we used in the analysis. If such an error is still added in quadrature,then the lower bounds go down,with respect to results given in Fig.4,by a factor∼1.4.There will be no visible changes in the upper bounds.Finally,we stress a need for a coherent and comprehensive error analysis for the SM con-tributions to the aµ(see a very recent paper[44]).AcknowledgementsI am grateful to Fred Jegerlehner and Thomas Teubner for many valuable discussions of the recent results on the g−2for the muon.I am especially indebted to Rohini Godbole for critical comments and important suggestions.I thank also S l awek Tkaczyk and other colleagues for useful discussions and information.I am grateful to M.Boonekamp,M.Kobel and F.Akesson for sending me results on the Yukawa process and on other searches at LEP.I acknowledge the important contribution by Suzy Vascotto.Finally,I would like to thank the organizers of this excellent and a very special meeting for their help.References[1]G.W.Bennett et al.[Muon g-2Coll.],arXiv:hep-ex/0208001.[2]H.N.Brown et al.[Muon g-2Coll.],Phys.Rev.Lett.86,2227(2001)[arXiv:hep-ex/0102017].[3]S.J.Brodsky and T.Kinoshita,Phys.Rev.D3,356(1971);T.Kinoshita et al.,Phys.Rev.D41,593(1990);T.Kinoshita,Phys.Rev.D47,5013(1993);M.A.Samuel andG.W.Li,Phys.Rev.D44,3935(1991)[Erratum-ibid.D48,1879(1993)];G.Li et al.,Phys.Rev.D47,1723(1993);S.G.Karshenboim,Phys.Atom.Nucl.56,857(1993) [Yad.Fiz.56N6,252(1993)];porta,Phys.Lett.B312,495(1993)[arXiv:hep-ph/9306324];porta and E.Remiddi,Phys.Lett.B301,440(1993);porta, Phys.Lett.B328,522(1994)[arXiv:hep-ph/9404204];T.Kinoshita,Phys.Rev.Lett.75,4728(1995);V.W.Hughes and T.Kinoshita,Rev.Mod.Phys.71,S133(1999). [4]S.J.Brodsky and J.D.Sullivan,Phys.Rev.156,1644(1967).T.Burnet and M.J.Levine,Phys.Lett.24B,467(1967);I.Bars and M.Yoshimura,Phys.Rev.D6, 374(1972);[5]R.Jackiw and S.Weinberg,Phys.Rev.D5,2396(1972).K.Fujikawa et al.,Phys.Rev.D6,2923(1972);G.Altarelli et al.,Phys.Lett.B40,415(1972);W.A.Bardeen et al., Nucl.Phys.B46,319(1972);J.P.Leveille,Nucl.Phys.B137,63(1978);H.E.Haber,G.L.Kane and T.Sterling,Nucl.Phys.B161,493(1979).H.E.Haber et al.,Nucl.Phys.B161,493(1979);J.A.Grifols and R.Pascual,Phys.Rev.D21,2672(1980).[6]T.V.Kukhto et al.,Nucl.Phys.B371,567(1992);S.Peris et al.,Phys.Lett.B355,523(1995)[arXiv:hep-ph/9505405];G.Degrassi and G.F.Giudice,Phys.Rev.D58,053007 (1998)[arXiv:hep-ph/9803384].[7]A.Czarnecki et al.,Phys.Rev.D52,2619(1995)[arXiv:hep-ph/9506256]and Phys.Rev.Lett.76,3267(1996)[hep-ph/9512369].[8]M.Knecht et al.,arXiv:hep-ph/0205102.[9]S.Eidelman and F.Jegerlehner,Z.Phys.C67,585(1995)[arXiv:hep-ph/9502298].F.Jegerlehner,Nucl.Phys.Proc.Suppl.51C,131(1996)[arXiv:hep-ph/9606484].[10]M.Davier and A.Hocker,Phys.Lett.B435,427(1998)[hep-ph/9805470];M.Davier,Nucl.Phys.Proc.Suppl.76,327(1999)[arXiv:hep-ph/9812370].[11]F.Jegerlehner,arXiv:hep-ph/0104304;K.Melnikov,Int.J.Mod.Phys.A,459116(2001)[arXiv:hep-ph/0105267];F.J.Yndurain,arXiv:hep-ph/0102312;J.Prades,arXiv:hep-ph/0108192;J.Erler and M.Luo,Phys.Rev.Lett.87,071804(2001)[arXiv:hep-ph/0101010];V.Cirigliano,et al.Phys.Lett.B513,361(2001)[arXiv:hep-ph/0104267];G.Cvetic,T.Lee and I.Schmidt,Phys.Lett.B520,222(2001)[arXiv:hep-ph/0107069].[12]S.Narison,Phys.Lett.B513,53(2001)[Erratum-ibid.B526,414(2002)][arXiv:hep-ph/0103199];J.F.De Troconiz and F.J.Yndurain,Phys.Rev.D65,093001(2002) [arXiv:hep-ph/0106025].[13]F.Jegerlehner,talk at Conference on“Hadronic Contributions to the Anomalous Mag-netic Moment of the Muon”,Marseille,March2002;private communications[14]K.Hagiwara,A.D.Martin,D.Nomura and T.Teubner,T.Teubner talk at SUSY02,DESY Hamburg,June2002[15]T.Kinoshita et al.,Phys.Rev.D31,2108(1985).[16]B.Krause,Phys.Lett.B390,392(1997)[arXiv:hep-ph/9607259];R.Alemany et al.,Eur.Phys.J.C2,123(1998)[arXiv:hep-ph/9703220].[17]M.Hayakawa et al.,Phys.Rev.Lett.75,790(1995)[arXiv:hep-ph/9503463]and Phys.Rev.D54,3137(1996)[arXiv:hep-ph/9601310];J.Bijnens,et al.,Nucl.Phys.B474, 379(1996)[arXiv:hep-ph/9511388];M.Hayakawa and T.Kinoshita,Phys.Rev.D57, 465(1998)[Erratum-ibid.D66,019902(2002)][arXiv:hep-ph/9708227].[18]M.Knecht and A.Nyffeler,Phys.Rev.D65,07303(2002)[arXiv:hep-ph/0111058];M.Knecht et al.,Phys.Rev.Lett.88,071802(2002)[arXiv:hep-ph/0111059].[19]M.Hayakawa and T.Kinoshita,arXiv:hep-ph/0112102;I.Blokland et al.,Phys.Rev.Lett.88,071803(2002)[arXiv:hep-ph/0112117];J.Bijnens et al.,Nucl.Phys.B626, 410(2002)410[arXiv:hep-ph/0112255];E.Bartos et al.,Nucl.Phys.B632,330(2002) [arXiv:hep-ph/0106084].[20]A.Nyffeler,arXiv:hep-ph/0203243.[21]M.Ramsey-Musolf and M.B.Wise,Phys.Rev.Lett.89,041601(2002)[arXiv:hep-ph/0201297].[22]R.R.Akhmetshin et al.[CMD-2Collaboration],Phys.Lett.B527,161(2002)[arXiv:hep-ex/0112031];J.Z.Bai et al.[BES Collaboration],Phys.Rev.Lett.84,594(2000) [arXiv:hep-ex/9908046];Z.G.Zhao,Int.J.Mod.Phys.A15,3739(2000);J.Z.Bai et al.[BES Collaboration],Phys.Rev.Lett.88,101802(2002)[arXiv:hep-ex/0102003];M.N.Achasov et al.[SND Collaboration],arXiv:hep-ex/9809013.[23]A.Czarnecki and W.J.Marciano,Phys.Rev.D64,013014(2001)[arXiv:hep-ph/0102122].[24]M.Krawczyk,arXiv:hep-ph/0103223v3and in Proc.of the APS/DPF/DPB SummerStudy on the Future of Particle Physics(Snowmass2001),ed.R.Davidson and C.Quigg, arXiv:hep-ph/0112112.[25]U.Chattopadhyay and P.Nath,arXiv:hep-ph/0208012.[26]M.Krawczyk and J.˙Zochowski,Phys.Rev.D55,6968(1997)[arXiv:hep-ph/9608321].[27]M.Krawczyk et al.,Eur.Phys.J.C8,495(1999)[arXiv:hep-ph/9811256];P.H.Chankowski et al.,Eur.Phys.J.C11,661(1999)[arXiv:hep-ph/9905436];P.Chankowski et al.,Phys.Lett.B496,195(2000)[arXiv:hep-ph/0009271].[28]J.F.Gunion et al.,“The Higgs Hunter’s Guide”,Addison-Wesley,1990;G.Branco etal.,”CP Violation”,Oxford Univ.Press,1999.[29]S.L.Glashow and S.Weinberg,Phys.Rev.D15,1958(1977).[30]I.F.Ginzburg et al.,arXiv:hep-ph/0101208.[31]R.Santos et al.,arXiv:hep-ph/0112202;J.F.Gunion and H.E.Haber,arXiv:hep-ph/0207010.[32]LEP Jamboree,22July2002[33]G.Abbiendi et al.[OPAL Collaboration],Eur.Phys.J.C18(2001)425[arXiv:hep-ex/0007040].[34]P.Bambade et al.[DELPHI Collaboration],DELPHI2001-070CONF498,submittedto ICHEP2002(preliminary).[35]G.Abbiendi et al.[OPAL Collaboration],Eur.Phys.J.C23(2002)397[arXiv:hep-ex/0111010];[DELPHI Collaboration],DELPHI2002-037-CONF-571,submitted to ICHEP02(preliminary);[ALEPH Collaboration],PA13-027,ICHEP96(preliminary). [36](K)S.M.Keh,“Tau physics with the Crystal Ball Detector”,DESY F31-86-6;(N)M.Narain,UMI-92-05244“Inclusive Photon Spektra fromΥDecays”,PhD Thesis,1991;(L) J.Lee-Franzini,ICHEP88,in proc.p.1432.[37]J.Prades and A.Pich,Phys.Lett.B245,117(1990);A.Pich,J.Prades and P.Yepes,Nucl.Phys.B388,31(1992).[38]M.Roco[CDF and D0Coll.],FERMILAB-CONF-00-203-E.[39]P.Gambino and M.Misiak,Nucl.Phys.B611,338(2001)[arXiv:hep-ph/0104034].[40]A.Dedes and H.E.Haber,JHEP0105,006(2001)[arXiv:hep-ph/0102297].[41]D.Chang et al.,Phys.Rev.D63,091301(2001)[arXiv:hep-ph/0009292];K.M.Cheung,C.H.Chou and O.C.Kong,Phys.Rev.D64,111301(2001)[arXiv:hep-ph/0103183];Y.L.Wu and Y.F.Zhou,Phys.Rev.D64,115018(2001)[arXiv:hep-ph/0104056];A.Arhrib and S.w.Baek,Phys.Rev.D65,075002(2002)[arXiv:hep-ph/0104225].[42]S.M.Barr and A.Zee,Phys.Rev.Lett.65,21(1990)[Erratum-ibid.65,2920(1990)].[43]S.Kanemura,et al.,Phys.Lett.B471,182(1999).[44]M.Davier et al.,hep-ph/0208177。

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杰斯科技光学产品说明书

杰斯科技光学产品说明书

OptikWellenoptikBeugung an Mehrfachspalten und GitternNACHWEIS DER WELLENNATUR DES LICHTS UND BESTIMMUNG DER WELLENLÄNGE.UE4030200 11/15 JS/UDFig. 1: Messanordnung.ALLGEMEINE GRUNDLAGENDie Beugung des Lichts an Mehrfachspalten und Gittern lässt sich durch die Überlagerung der kohärenten Ele-mentarwellen beschreiben, die nach dem Huygens’schen Prinzip von jedem beleuchteten Punkt in einem Mehr-fachspalt ausgehen. Die Überlagerung führt in bestimm-ten Richtungen zu konstruktiver oder destruktiver Interfe-renz und erklärt so das hinter dem Mehrfachspalt zu be-obachtende System aus hellen und dunklen Streifen. Hinter einem Doppelspalt ist die Intensität unter einem Be-obachtungswinkel αn maximal, wenn es zu jeder Elementar-welle aus dem ersten Spalt genau eine Elementarwelle aus dem zweiten Spalt gibt, die sich konstruktiv überlagert. Dies ist erfüllt, wenn der Gangunterschied Δs n zwischen den von den Spaltmitten ausgehenden Elementarwellen ein ganzzah-liges Vielfaches der Wellenlänge λ des Lichtes ist (siehe Fig. 2).(1) ()λ⋅=α∆n s n n,,,n 210±±=: BeugungsordnungFig. 2: Schematische Darstellung zur Beugung des Lichts aneinem Doppelspalt (b : Spaltbreite, d : Spaltabstand, L : Entfernung des Beobachtungsschirmes zum Doppel-spalt, x 2: Abstand des zweiten Maximums vom Zent-rum, α2: Beobachtungsrichtung für das zweite Maxi-mum, Δs 2: Gangunterschied der Mittelpunktstrahlen).In großer Entfernung L zum Doppelspalt besteht für kleine Beobachtungswinkel αn zwischen dem Gangunterschied Δs n und der Ortskoordinate x n eines Intensitätsmaximums der Zusammenhang(2)L xd s n n n n tan sin =α≈α=∆ d : SpaltabstandDaher liegen die Maxima im regelmäßigen Abstand(3) L dx x a ⋅λ=-=+n 1n nebeneinander.Dies gilt auch für die Beugung an einem Mehrfachspalt mit mehr als 2 äquidistanten Spalten. Gleichung (1) nennt die Bedingung für konstruktive Interferenz der Elementarwellen aus allen N Spalten. Also lassen sich die Gleichungen (2) und (3) auch auf Mehrfachspalte anwenden.Mathematisch aufwändiger ist die Bestimmung der Intensi-tätsminima: Während beim Doppelspalt in der Mitte zweier Intensitätsmaxima genau ein Intensitätsminimum liegt, findet man beim Mehrfachspalt zwischen dem n -ten und dem (n +1)-ten Maximum ein Minimum, wenn die Elementarwellen aus den N Spalten gerade so interferieren, dass die Gesamtinten-sität Null wird. Das ist der Fall, wenn der Gangunterschied zwischen den von den Spaltmitten ausgehenden Elementar-wellen die Bedingung(4) Nmn s λ+λ⋅=∆ ,,,n 210±±=, 11-=N ,,merfüllt. Man findet also N -1 Minima und dazwischen N -2 soge-nannte Nebenmaxima, deren Intensität kleiner als die der sogenannten Hauptmaxima ist.Mit zunehmender Anzahl N der Spalte verschwindet der Bei-trag der Nebenmaxima. Man spricht nicht mehr von einem Mehrfachspalt, sondern von einem Strichgitter. Ein Kreuzgitter schließlich kann man als eine Anordnung aus zwei um 90° gegeneinander gedrehten Strichgittern auffassen. Die Beu-gungsmaxima werden zu Punkten auf einem rechteckigen Netz, dessen Maschenweite durch (3) gegeben ist.Die Helligkeit in den Hauptmaxima ist durch die Helligkeitsver-teilung aus der Beugung am Einzelspalt moduliert und umso stärker auf kleine Winkel α konzentriert je größer die Spalt-breite b ist. Für eine genaue Berechnung summiert man die Amplituden aller Elementarwellen unter Berücksichtigung der Gangunterschiede zur gesamten Amplitude A auf. An einem beliebigen Ort x auf dem Schirm ist dann(5) ()222sin sin sin b x d x N L L I A f x b x d x L L ⎛⎫⎛⎫π⋅π⋅⎛⎫⎛⎫⋅⋅⋅ ⎪ ⎪ ⎪ ⎪λλ⎝⎭⎝⎭⎪ ⎪=∝⋅=π⋅π⋅ ⎪ ⎪⎛⎫⋅⋅ ⎪ ⎪ ⎪λλ⎝⎭⎝⎭⎝⎭.Die Funktion f (x ) auf der rechten Seite von Gleichung (5) istan der Stelle x = 0 im Zentrum der Helligkeitsverteilung durch den folgenden Grenzwert gegeben:(6) ()2lim x f x N →=Der erste Faktor von f (x ) beschreibt die Beugung an einem einzelnen Spalt und der zweite die Interferenz zwischen N Spalten.GERÄTELISTE1 Diodenlaser, rotU2200010032011 Optische Bank K, 1000 mm U8475240 10096962 Optikreiter K U8475350 1000862 1 Klemmhalter KU84755401 1008518 1 Halter K für Diodenlaser U8475550 1000868 1 Blende mit 3 Doppelspalten unterschiedlicher SpaltbreiteU141001000596 1 Blende mit 4 Doppelspaltenunterschiedlichen Spaltabstandes U14101 1000597 1 Blende mit 4 Mehrfachspalten und GitterU14102 1000598 1 Blende mit 3 Strichgittern U14103 1000599 1 Blende mit 2 KreuzgitternU141061000601AUFBAU UND DURCHFÜHRUNG∙ Je einen Optikreiter bei 0 und bei 70 cm auf die optische Bank setzen und fixieren (Fig. 1).∙Den Diodenlaser in den Halter für Diodenlaser einführen und fixieren. Den Halter mit dem Diodenlaser auf den Op-tikreiter in der 70-cm-Position stecken.∙Den Klemmhalter auf den Optikreiter in der 0-cm-Position stecken. Eine Blende mit Beugungsobjekten im Klemm-halter festklemmen, so dass das zu messende Beu-gungsobjekt auf der optischen Achse zentriert ist. ∙Einen Projektionsschirm in einem Abstand L ≈ 7 m vom Beugungsobjekt (Fig. 2) im rechten Winkel zur optischen Achse positionieren. Den Abstand ziwschen Beugungs-objekt und Projektionsschirm genau nachmessen und no-tieren. Position der optischen Bank nicht mehr verändern, ggf. den Abstand L bei jedem Wechsel der Blende bzw. des Beugungsobjektes erneut nachmessen.∙ Steckernetzgerät des Diodenlasers an das Stromnetz anschließen und den Diodenlaser einschalten.∙Nacheinander alle Blenden mit Beugungsobjekten im Klemmhalter festklemmen und jeweils die Helligkeitsver-teilung für alle Beugungsobjekte auf dem Schirm betrach-ten, ggf. fotografieren.∙Für die 4 Doppelspalte unterschiedlichen Spaltabstandes den Abstand x n zwischen einem Maximum der Ordnung n ≠ 0 und dem Maximum 0ter Ordnung im Zentrum der Helligkeitsverteilung (Beispiel für n = 2 siehe Fig. 2) mes-sen und in Tab. 1 (siehe Auswertung) notieren.MESSBEISPIEL100x / mmd = 0.25 mmd = 0.50 mmd = 0.75 mmd = 1.00 mm444400-100Fig. 3: Beugung am Doppelspalt mit verschiedenen Spaltab-ständen d . Berechnete Funktion f (x ) und beobachtete Intensität. Spaltanzahl N = 2, Spaltbreite b = 0,15 mm.100x / mmb = 0.10 mmb = 0.15 mmb = 0.20 mm-100444Fig. 4: Beugung am Doppelspalt mit verschiedenen Spaltbrei-ten b . Berechnete Funktion f (x ) und beobachtete In-tensität. Spaltanzahl N = 2, Spaltabstand d = 0,30 mm.100x / mmN = 2N = 3N = 4N = 5-100162549Fig. 5: Beugung an Mehrfachspalten mit verschiedenenSpaltanzahlen N . Berechnete Funktion f (x ) und beo-bachtete Intensität. Spaltabstandd = 0,25 mm, Spalt-breite b = 0,15 mm.Fig. 6: Beugung an Strichgittern mit 20 (unten), 40 (mitte) und80 Linien / cm (oben), entsprechend Gitterkonstanteng = 0,50, 0,25 und 0,125 mm.Fig. 7: Beugung an einem weißen (unten) und schwarzenKreuzgitter (oben) mit 40 Linien / cm, entsprechend ei-ner Gitterkonstante g = 0,25 mm.AUSWERTUNGFür eine ausführliche Auswertung der auf dem Schirm beo-bachteten Helligkeitsverteilungen der unterschiedlichen Spaltblenden werden die Helligkeitsverteilungen bzw. die Funktionen f(x) nach Gleichung (5) unter Verwendung der vorgegebenen Spaltbreiten, Spaltabstände und Spaltanzahlen berechnet und mit den auf dem Schirm beobachteten Hellig-keitsverteilungen verglichen (Fig. 3, 4 und 5).Bei den Spalten mit verschiedenen Spaltabständen (Fig. 3) erkennt man, dass die Anzahl der Interferenzmaxima mit zunehmendem Spaltabstand zunimmt und ihre Breite schma-ler wird, da die Breite der Beugungsmaxima (Einhüllende der Interferenzmaxima) gleich bleibt. Mit zunehmendem Spaltab-stand können immer mehr abgebeugte Wellen miteinander interferieren.Bei den Spalten mit verschiedenen Spaltbreiten (Fig. 4) er-kennt man, dass die Anzahl der Interferenzmaxima mit zu-nehmender Spaltbreite gleich bleibt und ihre Intensität für Ordnungen n≠ 0 abnimmt, weil die Breite der Beugungsma-xima (Einhüllende der Interferenzmaxima) schmaler wird. Wegen der mit zunehmender Spaltbreite immer schwächer ausgeprägten Beugung ist die Interferenz zwischen den ab-gebeugten Wellen entsprechend schwächer.Für die Mehrfachspalte (Fig. 5) beobachtet man wie erwartet N-2 Nebenmaxima, d.h. beim Doppelspalt keines, beim Drei-fachspalt eines, beim Vierfachspalt zwei und beim Fünffach-spalt drei.Genrell können an Stellen, an denen Beugungsminima vorlie-gen, keine Interferenzmaxima beobachtet werden. Das ist der Fall, wenn der erste Faktor von f(x) in Gleichung (5) Null wird, also bei ganzzahligen Vielfachen von x = (λ / b) · L. Für b = 0,15 mm ergibt sich z.B. (siehe Fig. 3 und Fig. 5):(7)650nm7m30,3mm0,15mmx Lbλ=⋅=⋅=Bei den drei Strichgittern (Fig. 6) verschwindet wie erwartet der Beitrag der Nebenmaxima, und der Abstand a der Hauptmaxima auf dem Schirm wird nach Gleichung (3) mit zunehmender Anzahl der Linien/cm, entsprechend abneh-mender Gitterkonstante g, immer größer.Bei den beiden Kreuzgittern (Fig. 7) werden die Beugungs-maxima wie erwartet zu Punkten auf einem rechteckigen Netz. Die Beugungsmaxima des weißen Kreuzgitters erschei-nen heller als die des schwarzen Kreuzgitters, weil bei dem weißen Kreuzgitter mehr Intensität transmittiert und entspre-chend weniger Intensität absorbiert wird als bei dem schwar-zen Kreuzgitter.Die Wellenlänge des gebeugten Lichts lässt sich für Doppel-spalte unterschiedlichen Spaltabstandes nach Gleichung (3) aus den regelmäßigen Abständen a der Maxima bestimmen. ∙Für die 4 Doppelspalte unterschiedlichen Spaltabstandes die Quotienten L / d bilden (Tab. 1).∙Zur Bestimmung des Abstands a der Maxima jeweils die gemessenen Abstände x n durch die Beugungsordnung n dividieren (Tab. 1).∙Die aus der Messung bestimmten Werte für a gegen L / d in einem Diagramm auftragen und eine Gerade an die Messpunkte anpassen (Fig. 8).Nach Gleichung (3) entspricht die Steigung der angepassten Geraden genau der Wellenlänge λ:(8)Lad⎛⎫=λ⋅ ⎪⎝⎭Es ergibt sich ein Wert von λ = 630 nm, der bis auf 3% mit dem spezifizierten Wert λ = 650 nm übereinstimmt.Tab. 1: B eugung am Doppelspalt mit verschiedenen Spaltab-ständen d, vergleiche Fig. 3 (L = 7 m: Abstand zumSchirm, n: Beugungsordnung, x n: gemessener Ab-stand, a: aus x n bestimmter Abstand der Maxima).a / mmL / d Fig. 8: Abstände der Maxima a in Abhängigkeit des Quotien-ten L / d aus dem Schirmabstand L = 7 m und denSpaltabständen d.3B Scientific GmbH, Rudorffweg 8, 21031 Hamburg, Deutschland, 。

QIAgility— Pure Precision 2 产品说明书

QIAgility— Pure Precision 2 产品说明书

The QIAgility provides:I Automated PCR setup in all formats I Convenient, easy-to-use softwareI Standardized results and increased productivity I Elimination of manual pipetting stepsI Seamless integration with QIAGEN ®sample technologiesThe QIAgility is operated via a computer with easy-to-use software.Simply select a program, set up the worktable, and walk away during PCR setup. Samples are ready for immediate use in downstream applications.Fully automated sample and assay technologiesThe QIAgility is a compact benchtop instrument that enables automated PCR setup in a wide range of formats, including PCR assays for the Rotor-Gene ™Q. The high precision of the QIAgility delivers the reproducible results you need in your end-point and real-time PCR assays, from sample to sample and laboratory to laboratory. Automated PCR setup is rapid and reliable and eliminates manual pipetting steps that can be prone to human error. The unmatched versatility of theQIAgility means that almost all tube and plate formats are supported as well as Rotor-Discs for the Rotor-Gene Q.Advanced technology for pure precisionDynamic liquid-level sensing enables the QIAgility to deliver high-precision, standardized pipetting (Table 1 and Figure 1). The instrument senses the meniscus during each pipetting event and retracts the tip while dispensing,enhancing accuracy and minimizing liquid carry-over. If the liquid is viscous, the QIAgility can adapt its pipetting speed accordingly.Exceptional safety featuresThe advanced design of the QIAgility delivers improved process safety, giving you peace of mind. An in-built sensor ensures that the instrument pauses when the hood is opened during a run, protecting users from moving parts.An optional UV light ensures effective worktable decontamination and an optional HEPA filter provides positive clean air pressure throughout PCR setup. These safety features are complemented by intelligent safety warnings from the instrument software, should an error occur.Table 1. Unrivaled precisionThe QIAgility was used to pipet 1, 2, 5, 10, 20, 50, 100, 150, and 200 µl water, in replicates of 16. The actual volume pipetted was determined for all aliquots based on weight (i.e., 1 g=1000 µl). The mean, standard deviation (S.D.), and coefficient of variation (CV) was calculated for each volume.Figure 1. Exceptional reproducibility and accurate series dilutions. A 2-fold series dilution of human genomic DNA (30 ng to 0.6 ng) was performed using the QIAgility. IL1R2 was amplified from these dilutions, using the Rotor-Gene Q and the QuantiFast ®Probe PCR Kit. Reactions were set up in replicates of 5. DNA yields were quantified by quantitative, real-time PCR, where the Rotor-Gene Q was also used for analysis. Plots show highly precise and reproducible replicates with a 1 cycle difference between each 2-fold dilution and the standard curve.B A 5101520253035400.050.000.100.150.200.250.300.35Cycle24262830322220concentrationBFigure 3. Automated reaction setup is more accurate than manual reaction setup.IL12RB1 was amplified fromleukocyte RNA (1, 10, and 100 ng), using the Rotor-Gene Q and the QuantiFast Probe RT-PCR Kit. Replicates of 3 were set up manually and using the QIAgility. DNA yields were quantified by quantitative, real-time RT-PCR, where the Rotor-Gene Q was also used for analysis.B A 510152025303540450.10.00.20.30.40.5Cycle510152025303540450.10.00.20.30.4N o r m . F l u o r o .CycleAbsolute reliability and reproducibilityThe QIAgility is provided with optimized protocols for unmatched reliability and reproducibility. In the future, more protocols will become available. Manual pipetting steps, which are typically prone to human error, are eliminated (Figure 2 and Figure 3). Using the software in “Virtual Mode” enables user-developed protocols to be tested in the absence of reagents, avoiding costly repetition of experiments.To reduce your workload, there is no need for time-consuming manual documentation of runs since comprehensive run reports, containing all run information, are generated before and after each protocol.Figure 2. Eliminate manual pipetting steps.Prp, HugL and Cyst were amplified from human genomic DNA (10 ng). PCR reactions were set up using the TopTaq ™Master Mix Kit, in replicates of 2, using the QIAgility and manually. After cycling, reactions were analyzed by capillary electrophoresis, using the QIAxcel ™.QIAgilityManualManualM Prp HugLCystPrpHugLCystIn addition to PCR setup, the flexibility of the QIAgility allows the user to program an unrivaled range of high-precision pipetting applications,which includes:I Normalization of DNA and RNA concentrationI Transfer of liquid samples from one tube format to another I Serial dilutions with variable dilution ratios I Restriction digest setup I Sample poolingI Selective pipetting from archived sample banksFlexible workflow with built-in versatilityThe QIAgility is compatible with all your workflow needs. The worktable is easy to set up and, for optimal versatility, isconfigured to support almost all PCR tube types and plate formats, including 96-well and 384-well plates as well as Rotor-Discs for the Rotor-Gene Q. The QIAgility can set up multiple master mixes and can process multiple PCR setups in parallel.Automated solutions from sample to result — free up your time!:O& 6YkVcXZY CjXaZ^X VX^Y ejg^ÃXVi^dc eVgi^XaZ iZX]cdad\nE8G hZije hnhiZb Gdidg"<ZcZ F Ejg^ÃXVi^dc6hhVn hZije9ZiZXi^dc VcY VcVanh^hCjXaZ^X VX^Y ejg^ÃXVi^dc :O& 6YkVcXZY MAE8G hZije hnhiZbF>6\^a^inGZVa"i^bZ E8G XnXaZg"<ZcZ FGdidg GZVa"i^bZ E8Gi^XaZ iZX]cdad\n eVg hdaji^dc jh^c\ bV\cZi^X"eEfficient, walkaway automationThe QIAgility enables rapid and efficient processing of complex reaction setups, freeing up your valuable laboratory time (Table 3). The single-channel pipet can process up to 96 samples in just 17 minutes, providing enormous time savings and eliminating tedious manual pipetting which can cause repetitive strain injury. While the QIAgility is performing reaction setup, the user can concentrate on more important laboratory tasks.Table 3. Speed and versatility.* T50=50 µl Tips. †T200=200 µl Tips.The QIAgility can be used in a wide range of liquid-handling operations. The user can control tip usage, enabling cost-efficient use of consumables. Reactions can be set up using master mix that has already been prepared, or the QIAgility canprepare the master mix.Specifications of the QIAgilityComprehensive service and supportQIAGEN Instrument Service provides flexible service support agreementstailored to your needs. We also provide Warranty PLUS extendedwarranties, giving you complete cost control and enhanced coveragethrough priority response times.Intuitive software for ease of useWith the QIAgility, specialist training is not required. QIAgility software simulates the instrument worktable, making it exceptionally easy to use by the automation novice or more experienced laboratory personnel. Fast setup and development of user protocols are facilitated by wizards, which guide the user through software procedures in a stepwise fashion. The QIAgility is preinstalled with optimized protocols for convenient and effective PCR setup. The software automatically calculates reagent volumes for the selected number of samples, giving you complete cost control. In addition, the user can develop custom protocols tailored to specific research requirements.Visit /goto/QIAgility to find out more!Ordering InformationTrademarks: QIAGEN, QIAgility™, QIAxcel™, cador™, EZ1, HotStarTaq, QuantiFast, QuantiTect, TopTaq, Type-it™; Rotor-Disc™, Rotor-Gene™(Corbett Research).The QIAgility is intended for molecular biology applications. This product is neither intended for the diagnosis, prevention, or treatment of a disease, nor has it been validated for such use either alone or in combination with other products. The Rotor-Gene Q, if used in combination with QIAGEN kits indicated for use with the Rotor-Gene Q instrument is intended for the applications described in the respective QIAGEN kit handbooks. If the Rotor-Gene Q instrument is used with kits other than QIAGEN kits, it is the user’s responsibility to validate the performance of such product combination for any particular application. Rotor-Gene K its, QuantiFast K its, QuantiTect K its, QIAGEN OneStep RT-PCR K it, Type-it PCR K its, QIAGEN LongRange K its, HotStar HiFidelity Polymerase K it, cador veterinary PCR K its, HotStarTaq K its, HotStarTaq Plus K its, QIAGEN Taq Kits, QIAGEN Fast Cycling PCR Kits and TopTaq Master Mix Kit are intended for research use. No claim or representation is intended to provide information for the diagnosis, prevention, or treatment of a disease. The cador BVDV RT-PCR Kit is approved by the Friedrich-Loeffler-Institute in Germany for veterinary diagnostic use. The cador BVDV Type 1/2 RT-PCR Kit and the cador T. equigenitalis PCR Kit is under review by the Friedrich-Loeffler-Institute in Germany for veterinary diagnostic use. TopTaq DNA Polymerase is intended for general laboratory use. No claim or representation is intended to provide information for the diagnosis, prevention, or treatment of a disease.Purchase of this product (Rotor-Gene, QuantiFast, and QuantiTect SYBR Green Kits) is accompanied by a limited, non-transferable immunity from suit to use it with detection by a dsDNA-binding dye as described in U.S. Patents Nos. 5,994,056 and 6,171,785 and corresponding patent claims outside the United States for the purchaser’s own internal research. No real-time apparatus or system patent rights or any other patent rights, and no right to use this product for any other purpose are conveyed expressly, by implication or by estoppel.This product (Rotor-Gene, QuantiFast and QuantiTect Probe and Multiplex Kits, and Type-it Probe Kits) is an Authorized 5' Nuclease Core Kit without Licensed Probe. Its purchase price includes a limited, non-transferable immunity from suit under certain patents owned by Roche Molecular Systems, Inc. or F. Hoffmann-La Roche Ltd, for using only this amount of the product in the practice of the 5' nuclease process solely for the purchaser’s own internal research when used in conjunction with Licensed Probe. No right under any other patent claims (such as apparatus or system claims) and no right to use this product for any other purpose is hereby granted expressly, by implication or by estoppel. Further information on purchasing licenses may be obtained by contacting the Director of Licensing, Applied Biosystems, 850 Lincoln Centre Drive, Foster City, California 94404, USA.Purchase of this product (Rotor-Gene, QuantiFast, and QuantiTect RT-PCR Kits) is accompanied by a limited, non-transferable license under RT and Reverse Transcription-PCR patents owned by Roche Molecular Systems, Inc. and F. Hoffmann-La Roche Ltd to use it for the purchaser’s own internal research. No real-time patent rights of any kind, no right under any other patent claims (such as apparatus or system claims), and no right to use this product for any other purpose is hereby granted expressly, by implication or by estoppel.Purchase of this product (QuantiTect Kits) is accompanied by a limited license under U.S. Patent Numbers 5,035,996; 5,945,313, 6,518,026 and 6,287,823 and corresponding foreign patents.The purchase of this product (QuantiTect SYBR Green Kits) includes a limited, non-transferable license under U.S. Patent No. 5,871,908 and all continuations and divisionals, and corresponding claims in patents and patent applications outside the United States, owned by Roche Diagnostics GmbH, for internal research use or for non-in vitro diagnostics applications with authorized reagents with regard to Melting Curve Analysis. No right is conveyed, expressly, by implication or estoppel, under any other patent or patent claims owned by Roche Diagnostics GmbH, or by any other Party.Purchase of this product (TopTaq DNA Polymerase) is not accompanied by a license under patents owned by Roche Molecular Systems, Inc. and F. Hoffmann-La Roche Ltd. No rights to real-time PCR or to any primers, probes or pathogens are conveyed expressly, by implication or by estoppel.The QIAGEN silver logo is exclusively licensed to Corbett Research.NOTICE TO PURCHASER:The purchase of this product (Rotor-Gene Q, Rotor-Disc) includes a limited, non-transferable license to certain patents (see details below) surrounding rapid polymerase chain reaction (PCR) methods and instrumentation, the use of SYBR Green I in PCR reactions, melting curve analysis, analysis methods of DNA melting data, specifically high resolution melting (HRM) and others.The purchase of this product (Rotor-Gene Q, Rotor-Disc) includes a limited, non-transferable license to one or more of US Patents Nos 6,787,338; 7,238,321; 7,081,226; 6,174,670; 6,245,514; 6,569,627; 6,303,305; 6,503,720; 5,871,908; 6,691,041; 7,387,887; and U.S. Patent Applications Nos. 2003-0224434 and 2006-0019253 and all continuations and divisionals, and corresponding claims in patents and patent applications outside the United States, owned by the University of Utah Research Foundation, Idaho Technology, Inc., and/or Roche Diagnostics GmbH, for internal research use or for non-in vitro diagnostics applications. No right is conveyed, expressly, by implication or estoppel, for any reagent or kit, or under any other patent or patent claims owned by the University of Utah Research Foundation, Idaho Technology, Inc., and/or Roche Diagnostics GmbH, or by any other Party. For information on purchasing licences for in-vitro diagnostics applications or reagents, contact Roche Molecular Systems, 4300 Hacienda Drive, Pleasanton, CA 94588, USA. ADDITIONAL NOTICE TO PURCHASER IN USA, EUROPE, AND AUSTRALIA ONLY:Practice of the polymerase chain reaction (PCR) process may require a license depending on the reagents and methods applied. Purchase of this instrument (Rotor-Gene Q) does not itself convey to the purchaser a complete license or right to perform the PCR process. The use of this instrument (Rotor- Gene Q) with Authorized Reagents such as Authorized QIAGEN kits and assays provides a limited PCR license in accordance with the label rights accompanying such reagents.Further information on purchasing licenses to practice the PCR process may be obtained by contacting the Director of Licensing at Applied Biosystems, 850 Lincoln Centre Drive, Foster City, California 94404, USA and/or Roche Molecular Systems, 4300 Hacienda Drive, Pleasanton, CA 94588, USA. No right is conveyed expressly, by implication or by estoppel under any other patent claim, such as claims to apparatus, reagents, kits, or methods such as 5' nuclease methods.Australia Orders 03-9840-9800 Fax 03-9840-9888 Technical 1-800-243-066Austria Orders 0800/28-10-10 Fax 0800/28-10-19 Technical 0800/28-10-11Belgium Orders 0800-79612 Fax 0800-79611 Technical 0800-79556Brazil Orders 0800-557779 Fax 55-11-5079-4001 Technical 0800-557779Canada Orders 800-572-9613 Fax 800-713-5951 Technical 800-DNA-PREP (800-362-7737)China Orders 0086-21-3865-3865 Fax 0086-21-3865-3965 Technical 800-988-0325Denmark Orders 80-885945 Fax 80-885944 Technical 80-885942Finland Orders 0800-914416 Fax 0800-914415 Technical 0800-914413France Orders 01-60-920-920 Fax 01-60-920-925 Technical 01-60-920-930Germany Orders 02103-29-12000 Fax 02103-29-22000 Technical 02103-29-12400Hong Kong Orders 800 933 965 Fax 800 930 439 Technical 800 930 425Ireland Orders 1800 555 049 Fax 1800 555 048 Technical 1800 555 061Italy Orders 02-33430-420 Fax 02-33430-426 Technical 800-787980Japan Telephone: 03-6890-7300 Fax 03-5547-0818 Technical 03-6890-7300Korea (South)Orders 1544 7145 Fax 1544 7146 Technical 1544 7145Luxembourg Orders 8002-2076 Fax 8002-2073 Technical 8002-2067Mexico Orders 01-800-7742-639 Fax 01-800-1122-330 Technical 01-800-7742-639The Netherlands Orders 0800-0229592 Fax 0800-0229593 Technical 0800-0229602Norway Orders 800-18859 Fax 800-18817 Technical 800-18712Singapore Orders 65-67775366 Fax 65-67785177 Technical 65-67775366Spain Orders 91-630-7050 Fax 91-630-5145 Technical 91-630-7050Sweden Orders 020-790282 Fax 020-790582 Technical 020-798328Switzerland Orders 055-254-22-11 Fax 055-254-22-13 Technical 055-254-22-12UK Orders 01293-422-911 Fax 01293-422-922 Technical 01293-422-999USA Orders 800-426-8157 Fax 800-718-2056 Technical 800-DNA-PREP (800-362-7737)1054662 01/2009Sample & Assay Technologies。

OMEGA HHLM-2数字光量表说明书

OMEGA HHLM-2数字光量表说明书

OMEGAHHLM-2Digital LightmeterOMEGAnet On-Line Service Internet e-mail **************For immediate technical or application assistance:USA and Canada:Mexico and Latin America:Sales Service: 1-800-826-6342 / 1-800-TC-OMEGA Tel: (95) 800-TC-OMEGA Customer Service: 1-800-622-2378 / 1-800-622-BEST FAX: (95) 203-359-7807Engineering Service: 1-800-872-9436 / 1-800-USA-WHEN En Español: (203) 359-7803TELEX: 996404 EASYLINK: 62968934 CABLE: OMEGAe-mail:*****************Servicing North America:USA: ISO 9001 Certified Canada:One Omega Drive, Box 4047976 Bergar Stamford, CT 06907-0047Laval (Quebec) H7L5A1Tel: (203) 359-1660Tel: (514) 856-6928FAX: (203)359-7700FAX: (514) 856-6886e-mail:**************e-mail:**************Servicing Europe:Benelux:Postbus 8034, 1180 LA Amstelveen,The NetherlandsTel: (31) 20 6418405 FAX: (31) 20 6434643Toll Free in Benelux: 06 0993344e-mail:************Czech Republic:ul. Rude armady 1868, 733 01 Karvina-Hranice, Czech RepubicTel: 420 (69) 6311627 FAX: 420 (69)6311114e-mail:***************France:9, rue Denis Papin, 78190 TrappesTel: (33) 130-621-400 FAX: (33)130-699-120Toll Free in France: 0800-4-06342e-mail:****************Germany/Austria:Daimlerstrasse 26, D-75392Deckenpfronn, GermanyTel: 49 (07056) 3017 FAX: 49 (07056) 8540TollFreeinGermany************e-mail:*****************United Kingdom: ISO 9002 Certified One Omega DriveRiverbend Technology Centre Northbank, Irlam,Manchester, M44 5EX, EnglandTel: 44 (161) 777-6611 FAX: 44 (161) 777-6622Toll Free in England: 0800-488-488e-mail:***************.ukINTRODUCTIONThis instrument is a portable easy use 3½ digit, compact-sized digital lightmeter designed for simple one hand operation. Provides selected the lux and fc units. Meter with Backlit LCD display, PEAK-HOLD (50mS pulse light) and DATA-HOLD feature.SAFETY INFORMATIONIt is recommended that you read the safety and operation instructions before using the lightmeter.WARNING•To avoid electric shock, do not operate this product in wet or damp conditions.•To avoid injury or fire hazard, do not operate this product in an explosive atmosphere.•To avoid eye injury, wear eye protection if there is a possibility of exposure to high-intensity rays.•Do not immerse in liquids, clean the sensor head using only a damp cloth.•Cover sensor head when not in use to extend silicon photodiode sensor life.The symbol on the instrument indicates that the operator must refer to an explanation in this manual.SPECIFICATIONSGENERALDisplay: 3½ digit liquid crystal display (LCD) with maximum reading of 1999. Overrange: (OL) is displayed.Low battery indication: the "below the operating level.Measurement rate: 2.5 times per second, nominal.Operating Environment: 0°C to 50°C (32°F to 122°F) at < 70% relative humidity.Storage Temperature: -20°C to 60°C (-4°F to 140°F), 0 to 80% R.H. with battery removed from meter.Accuracy: Stated accuracy at 23°C ± 5°C (73°F ± 9°F), <70% relative humidity. Analog Output: 0.1mV/countsBattery: 4 pcs 1.5V (AAA size).Battery Life: 200 hours typical.Dimensions: 170mm(H) x 44mm(W) x 40mm(D).Weight: 220g (7.76oz) including batteries.ELECTRICALPhotometric Formulas:10.764·footcandles=lux (lumens/meter 2)0.0929·lux=footcandles(lumens/foot 2)Range: 20lux,200lux,2000lux,20000lux,20fc,200fc,2000fc,20000fc Resolution: 0.01lux,0.01fcSpectral response: CIE photopicThe CIE photopic curve is an international standard for the color responseof the average human eye Acceptance angle: ¦¢2<2% cosine corrected (150°)Total accuracy for CIE standard illuminant A (2856K): ±(3%rdg + 10dgts)CIE standard illuminant A can be realised by means of CIE standard source A, which is defined as: A gas-filled tungsten-filament lampoperating at a correlated colour temperature of 2856K Temperature Coefficient: 0.1x (specified accuracy)/°C (<18°C or >28°C),0.056x(specified accuracy)/°F (<64.4°F or >82.4°F)Peak Hold response time: >50mS pulse lightOPERATING INSTRUCTIONSPush buttonsBack-Light (>2sec) and Peak-Hold Switch :" annunciator are displayed.(Response Time:>50mS)Press this button for two seconds to turn the Back-Light on. As this also activates the PEAK-HOLD mode, briefly press the button to return to normal display. To turn the Back-Light off press again for two seconds.Range Select ButtonPress "RANGE" button to select the desired lux or fc range. Each time you press "RANGE" button, the range (and the input range annunciator) incremants, and a new value is displayed.HOLD (DATA-HOLD) Buttondisplay.OPERATION1. Set the function switch to the desired lux or fc units.2. Remove the sensor head cover.3. Hold the sensor head steady and make certain that the light source completely fills the cosine correction dome.4. Move away from the sensor head to avoid shadowing it. The sensor head hasa 1.5 meter cable to allow separation between the observer and the measure-ment location.5. Read the illuminance value from the display. If magnitude of lux (or fc) is not known, press RANGE button to the highest range and reduce until a satisfac-tory reading is obtained.6. Cover sensor head to extend sensor life.SPECIAL CONSIDERATIONS•Keep the plastic domed cosine corrector clean and free of scratches. It may be cleaned with a soft cloth and isopropyl alcohol.•When light is received from many directions simultaneously, take special care to avoid reflections or shadowing the sensor with your body.•For best accuracy, repeat the measurement several times to ensure that the light source has remained stable.•Avoid flexing the cable excessively at either end of the cable.•The Inverse-square LawThe law stating that the illuminance E at a point on a surface varies directly with the intensity I of a point source, and inversely as the square of the distance d between the source and the point. If the surface at the point is normal to the direction of the incident light, the law is expressed by E=I/d2.•Cosine LawThe law that the illuminance on any surface varies as the cosine of the angle of incidence. The angle of incidence q is the angle between the normal to the surface and the direction of the incident light. The inverse-square low and the cosine law can be combined as E=(I cos q )/d2.CleaningPeriodically wipe the case with a damp cloth and detergent, do not use abrasives or solvents.CIE Photopic CurveL u m i n o u s E f f i c i e n c y C o e f f i c i e n tL u m e n /W a t t C o n v e r s i o n F a c t o rWavelength in NanometersV l C I E P h o t o p i c P h o t o p i c W a v e l e n g t h L u m i n o u s L u m e n /W a t t (n m )E f f c i e n c y C o n v e r s i o n C o e f f i c i e n tF a c t o r 3800.00000.053900.00010.134000.00040.274100.00120.824200.00402.734300.01167.914400.023015.74500.038025.94600.060040.94700.091062.14800.139094.84900.2080142.05000.3230220.05100.5030343.05200.7100484.05300.8620588.05400.9540650.05500.9950679.05551.0000683.05600.9950679.05700.9520649.05800.8700593.05900.7570516.06000.6310430.06100.5030343.06200.3810260.06300.2650181.06400.1750119.06500.107073.06600.061041.46700.032021.86800.017011.66900.00825.597000.00412.787100.00211.437200.00100.7167300.00050.3557400.00030.1707500.00010.8207600.00010.041WARRANTYOMEGA warrants this unit to be free of defects in materials and workmanship and to give satisfactory service for a period of 13 months from date of purchase. OMEGA Warranty adds an additional one (1) month grace period to the normal one (1) year product warranty to cover handling and shipping time. This ensures that OMEGA's customers receive maximum coverage on each product. If the unit should malfunction, it must be returned to the factory for evaluation. OMEGA's Customer Service Department will issue an Authorized Return (AR) number immediately upon phone or written request. Upon examination by OMEGA, if the unit is found to be defective it will be repaired or replaced at no charge. However, this WARRANTY is VOID if the unit shows evidence of having been tampered with or shows evidence of being damaged as a result of excessive corrosion; or current, heat moisture or vibration; improper specification; misapplication; misuse or other operating conditions outside of OMEGA's control. Components which wear or which are damaged by misuse are not warranted. This includes contact points, fuses, and triacs. OMEGA is glad to offer suggestions on the of use of its various products. Nevertheless, OMEGA only warrants that the parts manufactured by it will be as specified and free of defectsOMEGA MAKES NO OTHER WARRANTIES OR REPRESENTATIONS OF ANY KIND WHATSOEVER, EXPRESSED OR IMPLIED, EXCEPT THAT OF TITLE AND ALL IMPLIED WARRANTIES INCLUDING ANY WARRANTY OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE HEREBY DISCLAIMED.LIMITATION OF LIABILITY: The remedies of purchaser set forth herein are exclusive and the total liability of OMEGA with respect to this order, whether based on contract warranty, negligence, indemnification, strict liability or otherwise, shall not exceed the purchase price of the component upon which liability is based. In no event shall OMEGA be liable for consequential, incidental or special damages.Every precaution for accuracy has been taken in the preparation of this manual; however, OMEGA ENGINEERING, INC. neither assumes responsibility for any omissions or errors that may appear nor assumes liability for any damages that result from the use of the products in accordance with the information contained in the manual.SPECIAL CONDITION: Should this equipment be used in or with any nuclear installation or activity, purchaser will indemnity OMEGA and hold OMEGA harmless from any liability or damage whatsoever arising out of the use of the equipment in such a manner.It is the policy of OMEGA to comply with all worldwide safety and EMC/EMI regulations that apply. OMEGA is constantly pursuing certification of its products to the European New Approach Directives. OMEGA will add the CE mark to every appropriate device upon certification.The information contained in this document is believed to be correct but OMEGA Engineering, Inc. accepts no liability for any errors it contains, and reserves the right to alter specifications without notice.WARNING: These products are not designed for use in, and should not be used for, patient connected application.RETURN REQUESTS / INQUIRIESDirect all warranty and repair requests/inquiries to the OMEGA Customer Service Department. BEFORE RETURNING ANY PRODUCT(S) TO OMEGA, PURCHASER MUST OBTAIN AN AUTHORIZED RETURN (AR) NUMBER FROM OMEGA'S CUSTOMER SERVICE DEP ARTMENT (IN ORDER TO AVOID PROCESSING DELAYS). The assigned AR number should then be marked on the outside of the return package and on any correspondence.The purchaser is responsible for shipping charges, freight, insurance and proper packaging to prevent breakage in transit.FOR WARRANTY RETURNS, please have the following information available BEFORE contacting OMEGA: 1.P.O. number under which the product wasPURCHASED.2.Model and serial number of the product underwarranty, and3.Repair instructions and/or specific problems relativeto the product.FOR NON-WARRANTY REPAIRS, consult OMEGA for current repair charges. Have the following information available BEFORE contacting OMEGA:1.P.O. number to cover the COST of the repair.2.Model and serial number of product , and3.Repair instructions and/or specific problems relativeto the product.OMEGA's policy is to make running changes, not model changes, whenever an improvement is possible. This affords our customers the latest in technology and engineering. OMEGA is a registered trademark of OMEGA ENGINEERING, INC. © Copyright 1999 OMEGA ENGINEERING, INC. All rights reserved. This document may not be copied, photocopied, reproduced, translated, or reduced to any electronic medium or machine-readable from, in whole or in part, without prior written consent of OMEGA ENGINEERING, INC.Where Do I Find Everything I Need for Process Measurement and Control?OMEGA...Of Course!HEATERSþHeating CableþCartridge & Strip HeatersþImmersion & Band HeatersþFlexible HeatersþLaboratory HeatersPRESSURE/STRAIN AND FORCE þTransducers & Strain GaugesþLoad Cells & Pressure GaugesþDisplacement TransducersþInstrumentation & AccessoriesFLOW/LEVELþRotameters, Gas Mass Flowmeters & Flow Computers þAir Velocity IndicatorsþTurbine/Paddlewheel SystemsþTotalizers & Batch Controllers TEMPERATUREþThermocouple, RTD & ThermistorProbes, Connectors, Panels &AssembliesþWire: Thermocouple, RTD &ThermistorþCalibrators & Ice Point ReferencesþRecorders, Controllers & ProcessMonitorsþInfrared PyrometersENVIRONMENTALMONITORING AND CONTROLþMetering & Control InstrumentationþRefractometersþPumps & TubingþAir, Soil & Water MonitorsþIndustrial Water & WastewaterTreatmentþpH, Conductivity & DissolvedOxygen InstrumentspH/CONDUCTIVITYþpH Electrodes, Testers &AccessoriesþBenchtop/Laboratory MetersþControllers, Calibrators,Simulators & PumpsþIndustrial pH & ConductivityEquipmentDATA ACQUISITIONþData Acquisition & EngineeringSoftwareþCommunications-BasedAcquisition SystemsþPlug-in Cards for Apple, IBM& CompatiblesþDatalogging SystemsþRecorders, Printers & PlottersM-2856。

Nuclear Science

Nuclear Science


Nuclear Science
Big Decisions
NSAC Nuclear Science Advisory Committee Reports to both DOE and NSF
The Charge:
This letter requests that the DOE/NSF Nuclear Science Advisory Committee (NSAC) conduct a new study of the opportunities and priorities for U.S. nuclear physics research and recommend a long range plan that will provide a framework for coordinated advancement of the nation’s nuclear research programs over the next decade.
Curtis A. Meyer
National Science Foundations - Mathematical and Physical Sciences - Physics - Nuclear Physics ~ $ 45,000,000.00 per year
Nuclear Science
Nuclear Science
Nuclear Science in the United States
The Core of Matter
The Fuel of Stars
Curtis A. Meyer
Nuclear Science
The Big Questions
What is the structure of the nucleon? What is the structure of nucleonic matter? What are the properties of hot nuclear matter? What is the nuclear microphysics of the universe? What is the new standard model?