X射线萤光光谱仪(XRF)检验规范分解
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AG-0801-M006-F2 Rev.:A1Amendment RecordsAG-0801-M006-F3 Rev.:A1目錄Content一、目的Purpose二、適用範圍Scope三、樣品檢測條件及方法Test condition & method for sample四、零件及產品測試原則Testing Rule五、測試方法Test Method六、注意事項Attention item七、附件Attachment1.XRF測試零件及產品類別之有害物質限值表限值表EHS threshold value of component type for XRF test2.拆解治工具管理流程The management process for disassembly tools of the component.3. XRF治工具季驗證紀錄表(AT-0801-M427-F1)The record of disassembly tools in quarter inspection by XRF (AT-0801-M427-F1).目的：Purpose本規範在建立進料之XRF檢驗標準，以確保品質合乎既定之標準。
The purpose of this program is to establish the specification of the XRF inspection for incoming materials to assure the quality of materials and comply with specified criteria.一、適用範圍：Scope適用於各大類零件之檢驗。
Apply to all types of materials.二、樣品檢測條件及方法：Test condition & method1.分析方法分為檢量線法及FP法，說明如下：Test methods can be separated to the method of calibration curve and FP method.1.1. 檢量線法：對應於XRF之分析條件為”Cd, Pb, Hg, Br, Cr.bcc”，適用之材質為塑料、紙張、木材及Mg, Al, Si 較輕元素)為主材質之樣品。
Method of calibration curve: The method is used for plastic, paper, wood and somematerials mainly composing of Mg, Al, and Si. The analys is condition is ”Cd, Pb, Hg, Br, Cr.bcc”.1.2. FP法：對應於XRF之分析條件為”metal 2.bfb”，適用之材質為金屬(較重元素)為主材質之樣品。
FP method: The method is used for some materials mainly composing of heavy metal.The analysis condition is ”metal 2.bfb” .四、零件及產品測試原則：Testing Rule1.金屬及塑料共存者: 平鋪於測試台並裁切至適當尺寸測試之。
The sample composed of metallic and plastic materials: Cut the sample to be suitablesize in the test platform.2.形狀凹凸不平者：測試點過高(超過0.5cm)時須拆解樣品，再取平整面測試(約1cm×1cm)。
The surface not bumpy: Separate the sample while the test point is higher than testplatform (0.5 cm).3.條狀金屬線者: 依其縱方向排列於測試台測試之。
The metallic sample shaped into bar type : Arrange it vertically in test platform.4.鮮豔紅、黃、橙色者: 應優先量測(如油墨、塑膠類、PVC等)。
The sample painted by brightly red, yellow and orange color: Measure the point first(such as ink, plastic and PVC).五、測試方法：Test Method: Method 1：1.DIP 類測試方法：以檢量線法測試。
DIP: test by the method of calibration curve.1.1.本體大於1cm 時：以本體為主並包括部分接腳進行測試(請參閱圖1) 。
Sample size > 1 cm: Focus on body and includes partial terminal (Refer to figure 1). 1.2.本體小於1cm 時：包含本體及接腳測試(請參閱圖2)。
Sample size < 1 cm: Including the whole body and terminal (Refer to figure 2).Method 2：以檢量線法測試。
Test by the method of calibration curve.2.SMD 類：分為長(L)，寬(W)，高(H)<2mm 類及其他尺寸類。
SMD : Divide sample into two types, one is Length (L), width (W), or height (H)<2mm, and another is other dimension 。
2.1.長(L)，寬(W)，高(H)<2mm ：裝滿1/2樣品杯測試(請參閱圖3)。
Length (L), width (W), or height (H) <2mm: Fill up the 1/2 test cup with samples. (ReferDIP 類 DIP type本體包含接腳之影像視窗圖 The test image including body and partial terminal.縱方向平鋪於測試台 Put the sample in test platform vertically圖2 DIP 類(本體<1cm)量測流程Figure 1 The test procedure for DIP type(sample size > 1 cm)DIP 類 DIP type縱方向平鋪於測試台Put the sample in test platform vertically本體含接腳之影像視窗圖 The test image including body and partial terminal.圖1 DIP 類(本體>1cm)量測流程Figure 1 The test procedure for DIP type(sample size > 1 cm)to figure 3)2.1.其他尺寸類：以pad 或接腳為優先量測面(請參閱圖4)。
Other dimension: Focus on pad or terminal. (Refer to figure 3)Method 3：以檢量線法測試。
Test by the method of calibration curve.3.PCB 類：測試點以涵蓋pad 、文字、印刷線路為優先選擇,否則應依序分開測試(請參閱圖5)。
PCB: Test the pad 、word 、printed line by the method of calibration curve. (Refer to figure 5)Method 4：4.電感，變壓器類：Inductor and Transformer:4.1.DIP 類：分為漆包線外露(純金屬材質)所組成及外覆塑料之零件之兩種。
DIP: Divide into two types, one is Enamel-insulated wire that is obvious to display; and空樣品杯Φ=2.7cmTest Cup填裝1/2樣品杯 Fill up 1/2 cup with samples含pad 之影像視窗圖Test image including pad其他尺寸類 Other DimensionL ，W ，H<2mm 類 L ，W ，H<2mm typePCB 板PCB 圖3 SMD 類填裝於1/2樣品杯之流程 Figure 3 Procedure for fill up 1/2 cup with SMDtype圖4 測試含pad 面之SMD 類Figure4 Procedure for SMD type includingpad圖5 含pad 、文字、印刷線路點之PCB 板測試部位Figure 5 Test point including pad 、word 、printed line for PCB偵測點之影像視窗圖Test imageanother is covered with plastic.4.1.1.漆包線外露之零件：FP 法測試(請參閱圖6)。
Enamel-insulated wire is obvious to display: test by FP method (Refer to figure 6) 4.1.2.外覆塑料之零件：本體以檢量線法測試，接腳以FP 法測試(請參閱圖7)。
The inductor with the plastic jacket: Test the body by the method of calibration curve, and the terminal by FP test method separately (Refer to figure 7)4.2.SMD 類：SMD type:4.2.1.長(L)，寬(W)，高(H)<5mm ：裝滿1/2樣品杯測試，並使用檢量線法。
Length (L), width (W), or height (H) <5mm: Fill up the 1/2 test cup with samples, and then test by the method of calibration curve.4.2.2.長(L)，寬(W)，高(H)任一邊>5mm ，則量測方式分為：Any side on length (L), width (W), or height (H) >5mm: The test methods as the followings,4.2.2.1.漆包線外露之零件：FP 法測試(請參閱圖8)。
