Quantum-Limited Measurement and Information in Mesoscopic Detectors
- 格式:pdf
- 大小:278.92 KB
- 文档页数:13
常用光学期刊缩写光学与应用光学等领域常用期刊英文缩写 Acta Optica SinicaActa Photonica SinicaAIP CONFERENCE PROCEEDINGS AIP CONF PROCAPPLIED OPTICSAPPL. OPTICSAPPLIED PHYSICS LETTERSAPPL PHYS LETTChinese Journal of LasersChinese J. LasersHigh Power Laser and Particle BeamsIEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE IEEE AERO EL SYS MAG IEEE ANNALS OF THE HISTORY OF COMPUTINGIEEE ANN HIST COMPUTIEEE ANTENNAS AND PROPAGATION MAGAZINEIEEE ANTENNAS PROPAGIEEE CIRCUITS & DEVICESIEEE CIRCUITS DEVICEIEEE CIRCUITS AND DEVICES MAGAZINEIEEE CIRCUIT DEVICIEEE COMMUNICATIONS LETTERS IEEE COMMUN LETTIEEE COMMUNICATIONS MAGAZINE IEEE COMMUN MAGIEEE COMPUTATIONAL SCIENCE & ENGINEERINGIEEE COMPUT SCI ENGIEEE COMPUTER APPLICATIONS IN POWER IEEE COMPUT APPL POW IEEE COMPUTER GRAPHICS AND APPLICATIONSIEEE COMPUT GRAPHIEEE COMPUTER GROUP NEWSIEEE COMPUT GROUP NIEEE CONCURRENCYIEEE CONCURRIEEE CONTROL SYSTEMS MAGAZINEIEEE CONTR SYST MAGIEEE DESIGN & TEST OF COMPUTERSIEEE DES TEST COMPUTIEEE ELECTRICAL INSULATION MAGAZINEIEEE ELECTR INSUL MIEEE ELECTROMAGNETIC COMPATIBILITY SYMPOSIUM RECORD IEEE ELECTROMAN COMPIEEE ELECTRON DEVICE LETTERSIEEE ELECTR DEVICE LIEEE ENGINEERING IN MEDICINE AND BIOLOGY MAGAZINEIEEE ENG MED BIOLIEEE EXPERT-INTELLIGENT SYSTEMS & THEIR APPLICATIONS IEEE EXPERTIEEE INDUSTRY APPLICATIONS MAGAZINEIEEE IND APPL MAGIEEE INSTRUMENTATION & MEASUREMENT MAGAZINE IEEE INSTRU MEAS MAG IEEE INTELLIGENT SYSTEMS & THEIR APPLICATIONS IEEE INTELL SYST APP IEEE INTERNET COMPUTINGIEEE INTERNET COMPUTIEEE JOURNAL OF OCEANIC ENGINEERING IEEE J OCEANIC ENGIEEE JOURNAL OF QUANTUM ELECTRONICSIEEE J QUANTUM ELECTIEEE JOURNAL OF ROBOTICS AND AUTOMATION IEEE T ROBOTIC AUTOMIEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICSIEEE J SEL TOP QUANTIEEE JOURNAL OF SOLID-STATE CIRCUITS IEEE J SOLID-ST CIRCIEEE JOURNAL ON SELECTED AREAS IN COMMUNICATIONSIEEE J SEL AREA COMMIEEE MICROIEEE MICROIEEE MICROWAVE AND GUIDED WAVE LETTERSIEEE MICROW GUIDED WIEEE MULTIMEDIAIEEE MULTIMEDIAIEEE NETWORKIEEE NETWORKIEEE PARALLEL & DISTRIBUTED TECHNOLOGY IEEE PARALL DISTRIBIEEE PERSONAL COMMUNICATIONSIEEE PERS COMMUNIEEE PHOTONICS TECHNOLOGY LETTERSIEEE PHOTONIC TECH LIEEE ROBOTICS & AUTOMATION MAGAZINEIEEE ROBOT AUTOM MAGIEEE SIGNAL PROCESSING LETTERSIEEE SIGNAL PROC LETIEEE SIGNAL PROCESSING MAGAZINEIEEE SIGNAL PROC MAGIEEE SOFTWAREIEEE SOFTWAREIEEE SPECTRUMIEEE SPECTRUMIEEE TECHNOLOGY AND SOCIETY MAGAZINE IEEE TECHNOL SOC MAGIEEE TRANSACTIONS ON ACOUSTICS SPEECH AND SIGNAL PROCESSINGIEEE T ACOUST SPEECHIEEE TRANSACTIONS ON ADVANCED PACKAGING IEEE TRANS ADV PACKIEEE TRANSACTIONS ON AEROSPACEIEEE T AEROSPIEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS IEEE T AERO ELEC SYSIEEE TRANSACTIONS ON AEROSPACE AND NAVAL ELECTRONICS IEEE T AERO NAV ELECIEEE TRANSACTIONS ON AEROSPACE AND NAVIGATIONAL ELECTRONICSIEEE TRANS AEROSP NIEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION IEEE T ANTENN PROPAG IEEE TRANSACTIONS ON APPLICATIONS AND INDUSTRY IEEE T APPL INDIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITYIEEE T APPL SUPERCONIEEE TRANSACTIONS ON AUDIOIEEE TRANS AUDIOIEEE TRANSACTIONS ON AUDIO AND ELECTROACOUSTICS IEEE T ACOUST SPEECH IEEE TRANSACTIONS ON AUTOMATIC CONTROL IEEE T AUTOMAT CONTRIEEE TRANSACTIONS ON BIOMEDICAL ENGINEERINGIEEE T BIO-MED ENGIEEE TRANSACTIONS ON BROADCAST AND TELEVISION RECEIVERS IEEE T BROADC TELEVIEEE TRANSACTIONS ON BROADCASTINGIEEE T BROADCASTIEEE TRANSACTIONS ON CIRCUIT THEORYIEEE T CIRCUITS SYSTIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMSIEEE T CIRCUITS SYSTIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGYIEEE T CIRC SYST VIDIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONSIEEE T CIRCUITS-IIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSINGIEEE T CIRCUITS-IIIEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS IEEE T COMMUN ELECTRIEEE TRANSACTIONS ON COMMUNICATION TECHNOLOGYIEEE T COMMUN TECHNIEEE TRANSACTIONS ON COMMUNICATIONSIEEE T COMMUNIEEE TRANSACTIONS ON COMMUNICATIONS SYSTEMS IEEE T COMMUN SYSTIEEE TRANSACTIONS ON COMPONENT PARTSIEEE T COMPON PARTSIEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIESIEEE T COMPON PACK TIEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY IEEE T COMPON HYBRIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART AIEEE T COMPON PACK AIEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCEDPACKAGINGIEEE T COMPON PACK BIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSIEEE T COMPUT AID DIEEE TRANSACTIONS ON COMPUTERSIEEE T COMPUTIEEE TRANSACTIONS ON CONSUMER ELECTRONICSIEEE T CONSUM ELECTRIEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY IEEE T CONTR SYST T IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION IEEE T DIELECT EL INIEEE TRANSACTIONS ON EDUCATIONIEEE T EDUCIEEE TRANSACTIONS ON ELECTRICAL INSULATIONIEEE T ELECTR INSULIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY IEEE T ELECTROMAGN CIEEE TRANSACTIONS ON ELECTRON DEVICESIEEE T ELECTRON DEVIEEE TRANSACTIONS ON ELECTRONIC COMPUTERS IEEE TRANS ELECTRONIEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURINGIEEE T ELECTRON PA MIEEE TRANSACTIONS ON ENERGY CONVERSIONIEEE T ENERGY CONVERIEEE TRANSACTIONS ON ENGINEERING MANAGEMENT IEEE T ENG MANAGEIEEE TRANSACTIONS ON ENGINEERING WRITING AND SPEECH IEEE T PROF COMMUNIEEE TRANSACTIONS ON EVOLUTIONARY COMPUTATION IEEE T EVOLUT COMPUT IEEE TRANSACTIONS ON FUZZY SYSTEMSIEEE T FUZZY SYSTIEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSINGIEEE T GEOSCI REMOTEIEEE TRANSACTIONS ON GEOSCIENCE ELECTRONICS IEEE T GEOSCI ELECT IEEE TRANSACTIONS ON HUMAN FACTORS IN ELECTRONICS IEEE TRANS HUM FACTIEEE TRANSACTIONS ON HUMAN FACTORS IN ENGINEERING IEEE T HUM FACT ENGIEEE TRANSACTIONS ON IMAGE PROCESSINGIEEE T IMAGE PROCESSIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICSIEEE T IND ELECTRONIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS AND CONTROL INSTRUMENTATIONIEEE T IND EL CON INIEEE TRANSACTIONS ON INDUSTRY AND GENERAL APPLICATIONS IEEE TRANS IND GEN AIEEE TRANSACTIONS ON INDUSTRY APPLICATIONSIEEE T IND APPLIEEE TRANSACTIONS ON INFORMATION TECHNOLOGY IN BIOMEDICINE IEEE T INF TECHNOL BIEEE TRANSACTIONS ON INFORMATION THEORYIEEE T INFORM THEORYIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT IEEE T INSTRUM MEASIEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERINGIEEE T KNOWL DATA ENIEEE TRANSACTIONS ON MAGNETICSIEEE T MAGNIEEE TRANSACTIONS ON MAN-MACHINE SYSTEMS IEEE T MAN MACHINEIEEE TRANSACTIONS ON MANUFACTURING TECHNOLOGYIEEE T MANUF TECHIEEE TRANSACTIONS ON MEDICAL IMAGING IEEE T MED IMAGINGIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES IEEE T MICROW THEORYIEEE TRANSACTIONS ON MILITARY ELECTRONICS IEEE T MIL ELECTRONIEEE TRANSACTIONS ON NEURAL NETWORKSIEEE T NEURAL NETWORIEEE TRANSACTIONS ON NUCLEAR SCIENCEIEEE T NUCL SCIIEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS IEEE T PARALL DISTRIEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING IEEE T PARTS HYB PACIEEE TRANSACTIONS ON PARTS MATERIALS AND PACKAGINGIEEE TR PARTS MATERIEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCEIEEE T PATTERN ANALIEEE TRANSACTIONS ON PLASMA SCIENCEIEEE T PLASMA SCIIEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS IEEE T POWER AP SYSTIEEE TRANSACTIONS ON POWER DELIVERYIEEE T POWER DELIVERIEEE TRANSACTIONS ON POWER ELECTRONICS IEEE T POWER ELECTRIEEE TRANSACTIONS ON POWER SYSTEMSIEEE T POWER SYSTIEEE TRANSACTIONS ON PRODUCT ENGINEERING AND PRODUCTIONIEEE T PROD ENG PRODIEEE TRANSACTIONS ON PROFESSIONAL COMMUNICATION IEEE T PROF COMMUN IEEE TRANSACTIONS ON REHABILITATION ENGINEERING IEEE T REHABIL ENG IEEE TRANSACTIONS ON RELIABILITYIEEE T RELIABIEEE TRANSACTIONS ON ROBOTICS AND AUTOMATIONIEEE T ROBOTIC AUTOMIEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING IEEE T SEMICONDUCT MIEEE TRANSACTIONS ON SIGNAL PROCESSINGIEEE T SIGNAL PROCESIEEE TRANSACTIONS ON SOFTWARE ENGINEERINGIEEE T SOFTWARE ENGIEEE TRANSACTIONS ON SONICS AND ULTRASONICS IEEE T SON ULTRASONIEEE TRANSACTIONS ON SPACE ELECTRONICS AND TELEMETRY IEEE T SPACE EL TELIEEE TRANSACTIONS ON SPEECH AND AUDIO PROCESSING IEEE T SPEECH AUDIPIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS IEEE T SYST MAN CYB IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANSIEEE T SYST MAN CY AIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART B-CYBERNETICS IEEE T SYST MAN CY BIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART C-APPLICATIONS AND REVIEWSIEEE T SYST MAN CY CIEEE TRANSACTIONS ON SYSTEMS SCIENCE AND CYBERNETICSIEEE T SYST SCI CYBIEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROLIEEE T ULTRASON FERRIEEE TRANSACTIONS ON VEHICULAR COMMUNICATIONS IEEE T VEH COMMUN IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY IEEE T VEH TECHNOLIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION VLSI SYSTEMSIEEE T VLSI SYSTIEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS IEEE T VIS COMPUT GRIEEE VEHICULAR TECHNOLOGY GROUP-ANNUAL CONFERENCE IEEE VEH TECHNOL GRIEEE-ACM TRANSACTIONS ON NETWORKINGIEEE ACM T NETWORKIEEE-ASME TRANSACTIONS ON MECHATRONICSIEEE-ASME T MECHJournal of Optoelectronics . LaserJ. Optoelectronics . LaserJOURNAL OF THE OPTICAL SOCIETY OF AMERICAJ OPT SOC AMJOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISIONJ OPT SOC AM AJOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICSJ OPT SOC AM BOPTICAL TECHNOLOGYOPT. TECHNOL.OPTICS LETTERSOPT LETTOPTICAL TECHNICSOPT. TECH.OPTICS AND PRECISION ENGINEERINGOPT. PRECISION ENG.OPTICA ACTAOPT ACTAOPTICA APPLICATAOPT APPLOPTICAL AND QUANTUM ELECTRONICS OPT QUANT ELECTRON OPTICAL ENGINEERING OPT ENGOPTICAL FIBER TECHNOLOGYOPT FIBER TECHNOLOPTICAL IMAGING OF BRAIN FUNCTION AND METABOLISM 2 ADV EXP MED BIOLOPTICAL INFORMATION SYSTEMS OPT INF SYSTOPTICAL MATERIALSOPT MATEROPTICAL PROPERTIES OF SEMICONDUCTOR QUANTUM DOTS SPRINGER TR MOD PHYSOPTICAL REVIEWOPT REVOPTICAL SPECTRAOPT SPECTRAOPTICS & PHOTONICS NEWS OPT PHOTONICS NEWS OPTICS AND LASER TECHNOLOGY OPT LASER TECHNOL OPTICS AND LASERS IN ENGINEERINGOPT LASER ENGOPTICS AND SPECTROSCOPY OPT SPECTROSC+OPTICS AND SPECTROSCOPY-USSROPT SPECTROSC-USSROPTICS COMMUNICATIONS OPT COMMUNOPTICS EXPRESSOPT EXPRESSOPTICS LETTERSOPT LETTOPTIKOPTIKOPTIKA I SPEKTROSKOPIYA OPT SPEKTROSK+ PATTERN ANALYSIS AND APPLICATIONSPATTERN ANAL APPLPATTERN FORMATION IN GRANULAR MATERIALS SPRINGER TR MOD PHYSPATTERN RECOGNITION PATTERN RECOGNPATTERN RECOGNITION LETTERS PATTERN RECOGN LETT PROGRESS IN OPTICS PROG OPTICSPROGRESS IN OPTICS, VOL 33 PROG OPTICSPROGRESS IN OPTICS, VOL 35 PROG OPTICSPROGRESS IN OPTICS, VOL 38PROG OPTICSPROGRESS IN OPTICS, VOL XLPROG OPTICSPROGRESS IN OPTICS, VOL XXXII PROG OPTICSPROGRESS IN OPTICS, VOL XXXIXPROG OPTICSPROGRESS IN OPTICS, VOL XXXVIPROG OPTICSPROGRESS IN OPTICS, VOL. 37PROG OPTICSSpacecraft Recovery & Remote SensingSOLAR ENERGY MATERIALSSOL ENERG MATERSOLAR ENERGY MATERIALS AND SOLAR CELLS SOL ENERG MAT SOL C VISION RESEARCHVISION RESVISION TECNOLOGICAVIS TECNOL。
大学英语4 unit 2 原文及翻译(College English 4, unit 2,original text and Translation)能看到、听到、感觉、闻到和说话的智能汽车?自己开车?这听起来像是一场梦,但计算机革命将把它变成现实。
能看、能听、有知觉、具嗅觉、会说话的智能汽车?还能自动驾驶?这听起来或许像是在做梦,但计算机革命正致力于把这一切变为现实。
智能汽车Michio Kaku1,即使汽车工业在过去七十年里基本保持不变,也即将感受到计算机革命的影响。
智能汽车米其奥?卡库即便是过去70年间基本上没有多少变化的汽车工业,也将感受到计算机革命的影响。
2汽车工业是二十世纪最赚钱、最强大的行业之一。
目前地球上有5亿辆汽车,每十个人就有一辆车。
汽车工业的销售额约为一兆美元,成为世界上最大的制造业。
汽车工业是20世纪最赚钱、最有影响力的产业之一。
目前世界上有5亿辆车,或者说每10人就有1辆车汽车工业的销售额达一万亿美元左右,从而成为世界上最大的制造业。
3这辆车及其行驶的道路将在二十一世纪彻底改变。
未来“智能汽车”的关键是传感器。
我们会看到车辆和道路,看到、听到、感觉到、闻到、说话和行为,”Bill Spreitzer预言,美国通用汽车公司的程序技术总监,这是未来智能汽车和智能公路设计。
汽车及其行驶的道路,将在21世纪发生重大变革。
未来”智能汽车”的关键在于传感器。
”我们会见到能看、能听、有知觉、具嗅觉、会说话并能采取行动的车辆与道路,“正在设计未来智能汽车和智能道路的通用汽车公司其项目的技术主任比尔?斯普雷扎预言道。
4美国每年大约有40000人死于交通事故。
在车祸中丧生或重伤的人数是如此之大,以至于我们再也懒得在报纸上提起这些事了。
这些死亡人数中有一半来自醉酒司机,还有许多来自粗心大意。
一辆智能汽车可以消除大部分车祸。
它可以感知司机是否喝醉了通过电子传感器,可以拿起空气中的酒精蒸气,并拒绝启动发动机。
2023届上海高三语法填空复习难题复附&华二联考(2022年11月)-语法填空Nobel Prize in Physics Is Awarded to 3 Scientists for Work in Quantum TechnologyThe Nobel Prize in Physics was awarded to Alain Aspect, John F. Clauser and Anton Zeilinger on T uesday for work that has “laid the foundation for a new era of technology,” the Nobel Committee for Physics said.The scientists have each conducted “experiments using quantum states, (21)____________ two behave like a single unit (22)___________ _________they are separated,” the committee said in a briefing. Their results, it said, for “new technology based upon quantum information.”The ’ research builds on the work of John Stewart Bell, a physicist who to the question of whether particles, (23)_____________ (flow) too far apart for there to be normal communication between them, (24)_____________still function .Eva Olsson, (25)___________ member of the Nobel Committee for Physics, noted that quantum information science had broad in areas like secure information transfer and quantum computing.Quantum information science is a “vibrant and rapidly developing field,”she said.”Its predictions have opened doors to another world,and it has also shaken the very foundation of (26)___________we interpret measurements.”The Nobel committee said the three scientists were being honored for their experiments with entangled photons(光子), establishing the violation of Bell inequalities and pioneering quantum information science.“Being able to and manage quantum states and all their layers of properties (27)__________ (give) us access to tools with unexpected potential,” the committee said in a statement on Twitter.Dr. Zeilinger described the award as “ an encouragement to young people.”“The prize would not be possible (28)_____________more than 100 young people who worked with me over the years,”and made all this possible,” he said of the work that the award recognized. “My advice would be: Do what you find interesting, and don’t care too much about possible applications.”It was the second of several such prizes (29)_____________(award)over the coming week. The Nobels, among the highest honors in science, recognize groundbreaking contributions in a variety of fields.“I’m still kind of shocked, but it’s a very positive shock,” Dr. Zeilinger said of receiving the phone call (30)_____________(inform) him of the news.答案:21. where 22. even though/even if 23.having flown 24.can 25.a26.how 27.gives 28.without 29. to be awarded rming二、华师大二附中2022-2023学年高三英语测试-语法填空Sunscreen RecallThe burning heat of summer has us all reaching for sunscreens.But before you apply thatproduct to your skin,first to see if it is part of a voluntary recall by sunscreen brands Neutrogena and Aveeno.The companies recently pulled several sunscreens from market shelves after independenttesting had found they were contaminated (污染)with a cancer-chemical called benzene(苯).Benzene is a natural component of crude oil, gasoline and cigarette smoke. At room temperature, it is a colorless or light yellow liquid with a sweet odor.And while it evaporatesquickly, it is air and can sink into low-lying areas.“Exposureincreases the risk of developing leukemia and other blood disorders,” according to the National Cancer Institute.was not an ingredient in any of the sunscreens so experts suspect that contamination occurred during the manufacturing process.“It could be that some of those ingredient chemicals break down into benzene”said Scott Faber, the senior vice president of government affairs for the Environmental Working Group(EWG),But it’s very alarming,especially since the FDA does not require companies to testingredients for it require testing for such chemicals at a finished product stage.Consumers should stop using these specific products and appropriatelythrow them away. There is not a safe level of benzene that in sunscreen products.The vast majority of tested sunscreens, however,were free of benzene and experts stress theimportance of sunscreen use skin from the aging and cancerous effects of the sun.“It is not a reason to stop using sun protection, known to prevent skin cancer. To do so would be like hearing a particular car model was recalled and thento drive again,” dermatologist(皮肤病专家) Dr. Ranella Hirsch posted on Instagram.答案:21.check 22. causing 23. heavier 24. to 25.how26.nor 27. can 28. to protect 29.which 30.deciding三、向明中学高三月考Switzerland,15 September 2022 To my tennis family and beyond,Of all the gifts that tennis has given me over the years, the greatest, without a doubt, has been the people I’ve met along the way: my friends, my competitors, and most of all the fans who give the sport its life. Today, I want to share some news with all of you.As many of you know, the past three years present) me with challenges in the form of injuries and surgeries. I’ve worked hard to return to full competitive form. But I also know my body’s capacities and limits, and its message to me lately has been clear. I am 41 years old. I have played more than 1500 matches over 24 years. Tennis has treated me generously) than I ever would have dreamt, and now I must recognize when it is time to end my competitive career.The Laver Cup next week in London will be my final ATP event. I will play more tennis in the future, of course, but just not in Grand Slams or on the tour.This is a bittersweet decision, because I will miss everything the tour has given me. But at the same time, there is so much to celebrate. I consider myself one of the most fortunate people on Earth. I was given a special talent to play tennis, and I did it at a level that I never imagined, for much longer than I ever thought possible.I would like to especially thank my amazing wife Mirka, who has lived through every minute with me. She has warmed me up before finals, watch) countless matches even while over 8-months pregnant, and has endured my goofy side on the road with my team for over 20 years. I also want to thank my four wonderful children for supporting me, always eager to explorenew places and creating wonderful memories along the way. my family cheering me on from the stands is a feeling I will cherish forever.I would also like to thank and recognize my loving parents and my dear sister,withoutalways guided me in the right direction…you have been wonderful! And to Swiss Tennis, who believed in me as a young player and gave me an ideal start.I really want to thank and acknowledge my amazing team, Ivan, Dani, Roland, and particularly Seve and Pierre, who have given me the best advice and have always been there for me. Also Tony, for creatively managing my business for over 17 years. You are all incredible and I have loved every minute with you.I want to thank my loyal sponsors, who are really partners to me; and the hard-working teams and tournaments on the ATP Tour, who consistently welcomed all of us with kindness and hospitality.I would also like to thank my competitors on the court. I was lucky enough to play so many epic matches that I will never forget. We battled fairly, with passion and intensity, and I always tried my best to respect the history of the game. I feel extremely grateful. We pushed each other, and together we took tennis to new levels.Above all I offer a special thank you to my unbelievable fans. You will neverknow strength and belief you have given me. The inspiring feeling of walking into full stadiums and arenas has been one of the huge thrills in my life. Without you,those successes would have felt lonely, rather than filled with joy and energy.The last 24 years on tour have been an incredible adventure. While it sometimes feels like it went by in 24 hours, it has also been so deep and magical that it seems as if I’ve already lived a full lifetime. I have had the immense fortune to play in front of you in over 40 different countries.I have laughed and cried, felt joy and pain, and most of all I have felt incredibly alive. Through my travels, I have met many wonderful people who will remain friends for life, who consistently took time out of their busy schedules to come watch me play and cheer me on around the globe. Thank you.watch the players with a sense of wonder. They were like giants to me and I began to dream. My dreams led me to work harder and I started to believe in myself. Some success brought me confidence and I was on my way to the most amazing journey that has led to this day.So, I want to thank you all from the bottom of my heart, to everyone around the world whohas helped make the dreams of a young Swiss ball kidFinally, to the game of tennis: I love you and will never leave you.Roger Federer答案:21.have presented 22.more generously 23.watched 24.Seeing 25.without whom26.like 27.must 28.how much 29. When e。
DECLARATION OF CONFORMITY CONCERNING SAFETY AND ELECTROMAGNETIC COMPATIBILITYName of the manufacturer:Evolis Card PrinterAddress:29, avenue de la FontaineZ.I. Angers Beaucouzé49070 BeaucouzéFranceMaterial designation: Quantum printerI, the undersigned,Mr. Serge Olivier, Technical ManagerDeclare that I have rec eived the assumption of the above material, used and instal-led in accordance with the notice, with the essential requirements of Directives 73/23/CEE and 86/336/CEE, modified by 92/31/CEE and 93/68/CEE by the application of the following regulations:EN 60950 of January 1993 + A1 / A2 / A3 / A4EN 55022 Class A of 1998EN 55024 of 1998EN 61000-3-2 of 1995EN 61000-3-3 of 1995Supplementary Information(1) This equipment complies with a Class A digital device. In a residential environment, this equi pment may cause harmful interferences. In this case, the user will be required to take appropriate measures.(2) This equipment has been tested and found to comply with the limits for a Class A digital device, pursuant to Part 15 of the FCC Rules. These limits are designed to provide reasonable protection against harmful interferen-ce when the equipment is operated in a commercial environment. This equipment generates, uses, and can radia-te radio frequency energy and, if not installed and used in accordance with the instruction manual, may cause harmful interference in which case the user will be required to correct the interference at his own expense. Beaucouzé, April 2003Table of contentsIntroductionChapter 1 • Setting out1. Choice of a location52. Unpacking the printer53. Description of the printer and its functions64. Installation of the interface and the supply cable 75. Installation of the ribbon86. Card management9a) Configuration9b) Loading the cards10c) Removal of printed cards12d) Reject Card Boxes127. Other stages of installation13 Chapter 2 • Printing1. Driver installation 142. Configuration of the printing parameters163. Printing18 Chapter 3 • Cleaning1. Cleaning the interior of the printer 212. Cleaning the print head243. Cleaning of the cleaning roller25 Chapter 4 • Assistancee1. Interpretation of the printer control panel272. Printing and interpreting a test card303. Printing quality problems314. Resolving card jamming335. Changing a print head346. Customer assistance 36 Chapter 5• Technical specifications38 Chapter 6• Evolis Guarantee40 Chapter 7• Supplies 42 Appendix A Magnetic encoding44 Appendix B Smart Card Contact Station473IntroductionWe congratulate you for choosing a Quantum printer!The Quantum printer is the ideal solution for printing your plastic cards in areas such as Office Services, identification, access control and all other applications required large volume card printing …This product is accompanied by a wide range of assistance services from the company Evolis and its partners, specially chosen to help you effectively and professionally.453.Description of the printer and its functionsWe invite you to see the different components of your printer marked on the fol-lowing drawings, which we refer to in this manual.A Feeders 1 & 2Receives the card for printingB Flip Over Module Rotate the card 180°C Reject Boxes 1 & 2Collect the faulty cardsD Output Hoppers 1 & 2Collect the cards leaving the printerE Thermal print head Enables the cards to be printed.F Control panelIndicates the activity of the printer.G Two cleaning rollers Remove all possible dust before the card is printed.Identification label Indicates the model and serial number of the printer.IConnection Connector Enables the printer to be connected to its supply source.Switch Turns on and off.Parallel port Enables data to be received "from" and sent "to" the computer.USB port Enables data to be received "from" and sent "to" the computer.DB-9 connectorEnables a coupler for chip cards to be connected J Cover leverEnables the printer cover to be opened and closed.678910■When switching the printer power on■Error of magnetic encoding (data writing or reading)■Error of personalisation of a smart card (data writing or reading)■Error of personalisation of a contactless card (data writing or reading)NOTE!A reject boxt contains a maximum 25 cards (0.76 mm - 30 mil). The excess cards are ejected out of the printer.7.Other stages of installationYou have now completed the installation (material) of your Quantum printer. For the moment, we strongly advise you to continue to read this manual and we will inform you that there are still two extra stages to be followed to make your Quantum printer perfectly operational :■Installation of printer driver■Printer cleaning11.Select the file “younof.inf”.12.Click on OK. the name of the printer manager appears.13. Continue the installation by following the instructions displayed on the screen.Note that when you install the driver manually as above, the option “Dialog with printer” in the “Tools” tab is disable.The installation of a driver under Xp / 2000 may be subject to the authorisation of the administrator in its "login system" function.IMPORTANT !If your printer is connected via a parallel interface cable, the driver installation is now complete.If your printer is connected via a USB interface cable, go to the following section “For Windows users with a USB interface” and follow the instructions.For Windows users with a USB interface :1. Install the driver following the instructions supplied in the preceding sectionFor Windows users.2. Install the USB driver :■Check that the Quantum printer is turned on.■Connect the USB interface cable to your computer and then to the appropria-te printer port.■The window Add New Material Assistant appears. Click on the Next button.■Click on the option that invites you to seek the best driver for your peripheral and then click on Next.■Select the option Cd-rom reader and click on Next.■Choose the list corresponding to the Windows environment (NT 4.0, Xp or 2000).■Click on Next. The USB has now been installed.■Follow the instructions displayed on the screen.Checking/selecting the printer port1.Having turned your computer on and off, click on Start and in Parametersselect Printers2.In the Printers window, select the Evolis Quantum icon.3.In the File menu, select Properties.4.Click on the Ports tab and select the USB printer port from the list.5.Click on OK to close this window. The configuration is complete.Use of the on-line helpA help file guides you through the use of each of the printing management para-meters in line with the different printing modes and criteria retained. In order to familiarise you with these various parameters, we recommend that you consult this help before making any changes."Characteristics" dialog boxThis dialog box enables you to select :Orientation:the orientation of the printing in portrait or landscape and therotation of the printing to 180°Feeders configuration :the feeding mode of the cardsOutput Hoppers configuration :the reception mode of the cardsCopies :the required number of copies of the card "Graphic" dialog boxThis dialog box allows the selection of :Ribbon type :the type of ribbon usedConfiguration of the printing :simple recto or recto verso printing, with the possibility of set-ting the ribbon panels."Tools" dialog boxThis dialog box offers first level maintenance for your Quantum printer.If your Quantum printer has an option with a magnetic encoder, configure it now with the "Encoding Settings" button. For further information on this printing option, consult Annexe A of this manual.We would also recommend that you print a “Test Card”at the time of the first use and keep it safely. This cardrecords the information that could be required if you callthe after-sales service.Comment: The "Dialog with printer" option is only avai-lable if the printing driver has been installed using theinstallation program of the CD.“General” dialog boxThis dialog box is a window of Windows informationthat enables the printing of a test page only to control the communication bet-ween the computer and the printer.“Details” dialog boxThis dialog box is a Windows control window that enable the printer port to be selected and validates the use of the appropriate printer driver. The displayed para-meters must only be modified by a person with advanced competence.“Color management” dialog boxThis dialog box enables the printing to be associated with a defined profile for color management.3.PrintingA large number of windows applications allow a document to be printed (Word– Access– Excel, for instance). In order to familiarise yourselves with the setting up of a let-ter and the printer settings, we propose the following dual-sided printing example. Under Microsoft®WordAfter having registrated the Quantum printerby default :1.Run Word and in File, click on Page Setup.2.The dialog box proposes :■“Paper format“ : select Youn Card■“Orientation” select LandscapeThe “Margins” dialog box proposes “printing margins”■Select 0 cm for all margins■Then close the window by clicking “OK”To obtain a document with 2 pages, click on “Insertion” then select “Jump” and validate the option “Jump page”.Your Word window should now appear asfollows :You are ready to personalise your letter inrecto/verso by entering the various composi-tion elements :■Logo and Illustration■Identity photo■Constant and variable texts (Identity)■Etc.Exemple:It should be noted that this example is notintended to initiate the operator in the wor-king of the Word application, it is only inten-ded to establish a relationship between thedrawing of a letter and the Quantum mana-gement parameters necessary for the printing.Evolis Quantum Printer Driver SettingsChap.4 AssistanceTo satisfy the needs of its customers as far as possible, Evolis provides a full range of technical assistance available in this manual and on the internet site .This section gives information concerning the first level repairs of the Quantum printer.1.Interpreting the messages of thecontrol panelAlthough the Quantum printer has been conceived to work very reliably, some problem might, however, arise. The following section helps you to identify the cause of all possible problems in the installation or in the use of the printer and to find the way to resolve them.Description of the printer control panelA Control Panel is available on the top of the printer.Four LED’s are associated with symbols indicating the current activity of the prin-ter.2.Printing and interpretation of a test cardThe printing of a test card enables certain technical information to be collected on your printer and to validate its good operation.We advise you to print it as soon as your printer is put into service and to keep it close at hand.Printing a test card1.Make sure there is a ribbon in the printer2.Turn off the printer.3.Push the pushbutton on the control panel4.Turn on the printer while holding down the push button5.The green warning light on the control panel lights.6.Release the button as soon as the green warning light flashes.7.A test card is printed in a few seconds (in color if printer has a color ribboninstalled or in single color if it is fitted with a monochrome ribbon).8.The printed card is ejected into reject box 1.Check the settings defined for the printing■Make sure that no element of the pagination is outside the printing margins■Check the orientation of the document selected in the configuration of theprinting driver (Landscape or Portrait)2.Check the printer interface cable■If unusual characters appear, make sure you are using the right interfacecable for your printer.■Check the connection to the computer and the printer.■Test with another cable of the same type.3.Check the cleanliness of the printer■Clean the interior of the printer, the cleaning rollers and the print head ifnecessary.See section 3 Cleaning” of this manual.4.Check the card cleanliness■Make sure they have been stored in a dust-free place.5.Check the cleanliness of the print headSee the cleaning procedure of the print head in section 3 “Cleaning”.6.Check the ribbon■Its placement in the printer.■Its correct running7.Check the print head■If horizontal lines (white) appear on the card, elements of the print headmay be jammed or damaged.■Clean the print head.See section 3 “Cleaning” for more information.■If the problem is not resolved after cleaning, contact your reseller for areplacement cleaning head.4.Correcting card jammingIn the printing station :Remove the card as follows :1.Open the printer cover and remove the ribbon.2.Remove the card by pushing it manually towards the printer outlet. In the pre-sence of several cards, push the top one first.3. Refit the ribbon and close the printer cover.4.Press the pushbutton on the control panel.Access to an Evolis resellerFor all unresolved technical problems, contact an Evolis reseller. If you do not know of one, connect to and send your request.Evolis will direct you to your nearest Evolis reseller.When you call an Evolis reseller, you must be near your computer and be ready to supply the following information :■The type and serial number of your printer■The type of configuration and the operating system you use■A description of the incident that has been caused■A description of the steps you have taken to resolve the problemChap.5 Technical specificationsP r i n t i n g m o d e Color Dye Sublimation and Monochrome Thermal TransferEdge-to-edge printing as standardP r i n t e r s p e c i f i c a t i o n Integrated ribbon saverP r i n t i n g s p e e d140c a r d s/h o u r i n c o l o r(Y M C K O),o n e s i d e110c a r d s/h o u r i n c o l o r(Y M C K O/K),t w o s i d e sU p t o1000c a r d s/h o u r i n m o n o c h r o m e,o n e s i d eR e s o l u t i o n300 dpiD r i v e r s For Windows™ NT 4.0/2000 et XpG u a r a n t e e Printer: 1 yearPrint head: 1 year 1 or 500 000 passesT y p e o f r i b b o n s 6 Panel Color Ribbon (YMCKOK) : 800 cards/roll5 Panel Color Ribbon (YMCKO) : 1000 cards/roll5 Half-Panel Color Ribbon (YMCKO) : 400 cards/rollMonochrome Ribbon (KO) : 500 cards/rollMonochrome Ribbon, black: 5000 cards/rollOther Monochrome Ribbons: 1000 cards/roll(available in black, blue, red, green, white, gold, silverand scratch off)Hologram Ribbon : 350 cards/rollO t h e r p r i n t e r m o d e l s Q u a n t u m M A GPrinter with HICO/LOCO magnetic encoder – ISO 7811Q u a n t u m S M A R TPrinter with Smart Card Contact Station – ISO 7816-2Q u a n t u m C o n t a c t l e s sPrinter with encoder/reader for contactless cards(available on study)T y p e s o f c a r d s Cards in PVC and Composite PCV cardsF o r m a t o f c a r d s ISO CR-80 (53.98 mm x 85.60 mm - 3.375" x 2.125")T h i c k n e s s o f c a r d s0.76 mm (30 mil)F e e d e r c a p a c i t y1000 cards (0.76 mm-30 mil)O u t p u t h o p p e r c a p a c i t y1000 cards (0.76 mm-30 mil)P r i n t e r d i m e n s i o n s Height : 510 mm (20.07")Length : 700 mm (27.55")Depth: 300 mm (11.81")P r i n t e r w e i g h t25 Kg (55 lbs)C o n n e c t i o n USB and parallel Centronics (cables supplied)S u p p l y110~230 Volts AC, 60~50 HertzE n v i r o n m e n t Working temperatures Min / Max: 15°C / 30°CHumidity : from 20% to 65% without condensationStocking temperatures Min / Max: -5°C / +70°CStocking humidity : from 20% to 70% without condensationWorking ventilation : open air.1 Clause related to the use of Evolis consumablesChap.6 GuaranteeSeveral factors can affect the guarantee of the Evolis Quantum printer, particular-ly the use of consumables and non conform cleaning. Carefully read the condi-tions of the guarantee of the printer described below.Conditions of guaranteeEvolis guarantees its printer against all manufacturing faults for a period of one year counting from customer purchase. Customers must be able to demonstrate the purchase or must register their product on the internet site.Evolis guarantees the print head for a period of one year or 500,000 passes (equi-valent to 100,000 color cards or 500,000 single color cards).The Evolis guarantee only covers problems arising in the course of normal use of the printer and does not apply in the following cases :- Non observance of the installation instructions described in the printer manuals - Cleaning of the printer and/or print head not conform with the instructions des-cribed in the printer manuals (chapter 3)- Use of uncertified Evolis consumables. For instance, the use of uncertified Evolisribbons may affect the quality and reliability of the printing works, by causingpoor quality printouts, or may even affect the operation of the printer. The gua-rantee covers no material damage or quality problem caused by the use ofuncertified Evolis ribbons- All printer modifications or adaptations not expressly reported to and approvedby Evolis- The use of options not manufactured / supported by Evolis- The use of printing support (cards) not support by Evolis- The resending of the printer in any packing that is not the original packingIf during the guarantee period Evolis is informed of a material fault, Evolis will pro-ceed to repair or replace the product in question, at its own discretion.Evolis is not bound by any obligation to repair, replace or reimburse while the cus-tomer does not return the faulty product to Evolis.If Evolis is unable to repair the faulty material covered by the guarantee, Evolis will proceed to replace it with a new or second hand product as long as the functions are at least the same as those of the original product it replaces.If the customer has signed an extension of the Evolis guarantee, Evolis will repair the faulty material according to the clauses of the contract. To underwrite an extension of the Evolis guarantee, contact an Evolis reseller.No goods may be returned to Evolis without an RMA (Return Material Authorisation) number. To obtain an RMA number, contact an Evolis reseller. For all goods returns, the Evolis reseller may ask the customer to provide proof of purchase of the material.The customer is responsible for all damage caused in resending in unsuitable pac-king. Evolis may refuse to accept reception of the goods.Chap.7 Supplieslist of supplies available from Evolis resellers.Single color ribbonsRef. R2121Black Monochrome Ribbon5000 cards/rollRef. R2011 Black Monochrome Ribbon1000 cards/rollRef. R2012 Blue Monochrome Ribbon1000 cards/rollRef. R2013 Red Monochrome Ribbon1000 cards/rollRef. R2014 Green Monochrome Ribbon1000 cards/rollRef. R2015 White Monochrome Ribbon1000 cards/rollRef. R2016 Gold Monochrome Ribbon1000 cards/rollRef. R2017 Silver Monochrome Ribbon1000 cards/rollRef. R2018 Scratch off Monochrome Ribbon1000 cards/rollMulti-panel ribbonsRef. R3114 6 Panel Color RibbonYMCKOK (Yellow, Magenta, Cyan, Black TT, Varnish and Black TT)800 cards/rollRef. R3111 5 Panel Color RibbonYMCKO (Yellow, Magenta, Cyan, Black TT and Varnish)1000 cards/rollRef. R3013Half-Panel Color RibbonYMCKO (Yellow, Magenta, Cyan, Black TT and Varnish)400 cards/rollRef. R3012 2 Panel Color RibbonKO (Black TT and Varnish)500 cards/rollHologram ribbonRef. R4001Optoseal®hologram ribbon350 cards/rollHologram ribbonRef. A5011UltraClean Cleaning Kit5 pre-saturated cleaning cards, 5 swabs,1 box of 40 pre-saturated clothsRef. L8001 eMedia Pro SoftwareSoftware for conceiving and editing badges with connectionto databases2. Orientation of the cardsCards with a magnetic track must be installed in the feeder so that the magne-tic track is near the low and as close as possible to the back of the printer (see opposite) :3. Windows Driver SettingsWhen first installing the Windows driver, it is necessary to set the functions of the magnetic encoder. The functions of the magnetic encoder are accessible from the "Tools" dialog box of the printing driver by clicking "Encoding Definition".“Magnetic Encoder” dialog boxThe “Magnetic Encoder” dialog box opens on selecting the "Encoding Definition"button.Track format allows the choice of the required ISO standard for each track. See table in point 4 of this annexe for information concerning the ISO 7811 standards.Coercivity sets the magnetic encoder in high (HICO) or low (LOCO) coercivity. A magnetic track encoded in high coercivity is better able to withstand external dis-turbances than a magnetic track encoded in low coercivity.Direct encoding enables the direct encoding of one or several magnetic tracks from this window by simply selecting them and entering the data to be encoded.Click on the " Encode " button to launch the encoding cycle.Automatic extraction allows magnetic track cards to be encoded from applications under Windows (like Word, for instance). A text field surrounded by the charac-ters “|” and “|” (or other characters that might be defined by the user) will be interpreted as an encoding command by the printing driver.A command sequence must be sent via the printer interface to insert a card in the prin-ter and then place it under the station and establish contact.The sequence of commands is described as follows :Sending the Sis sequence :A card is moved from the feeder to the Contact Station andstops under it.The card is pushed up to come into contact with the station.The printer links the contact post with the DB-9 connector.The chip may be programmed via the series interface of the computer and the external coupling.NOTE !See the programming guide of the Quantum printer to obtain more complete information concerning the programming.。
®PN 2572573July 2006, Rev. 1, 2/07© 2006, 2007 Fluke Corporation, All rights reserved. Printed in China All product names are trademarks of their respective companies.114, 115, and 117True-rms MultimetersLIMITED WARRANTY AND LIMITATION OF LIABILITYThis Fluke product will be free from defects in material and workmanship for three years from the date of purchase. This warranty does not cover fuses, disposable bat-teries, or damage from accident, neglect, misuse, alteration, contamination, or abnor-mal conditions of operation or handling. Resellers are not authorized to extend any other warranty on Fluke’s behalf. To obtain service during the warranty period, contact your nearest Fluke authorized service center to obtain return authorization information, then send the product to that Service Center with a description of the problem.THIS WARRANTY IS YOUR ONLY REMEDY. NO OTHER WARRANTIES, SUCH AS FITNESS FOR A PARTICULAR PURPOSE, ARE EXPRESSED OR IMPLIED. FLUKE IS NOT LIABLE FOR ANY SPECIAL, INDIRECT, INCIDENTAL OR CONSEQUEN-TIAL DAMAGES OR LOSSES, ARISING FROM ANY CAUSE OR THEORY. Since some states or countries do not allow the exclusion or limitation of an implied warranty or of incidental or consequential damages, this limitation of liability may not apply to you.11/99True-rms MultimetersIntroductionThe Fluke Model 114, Model 115, and Model 117 are battery-powered, true-rms multimeters (hereafter "the Meter") with a 6000-count display and a bar graph. This manual applies to all three models. All figures show the Model 117.These meters meet CAT III IEC 61010-1 2nd Edition standards. The IEC 61010-1 2nd Edition safety standard defines four measurement categories (CAT I to IV) based on the magnitude of danger from transient impulses. CAT III meters are designed to protect against transients in fixed-equipment installations at the distribution level. Unsafe VoltageTo alert you to the presence of a potentiallyhazardous voltage, the Y symbol is displayed whenthe Meter measures a voltage ≥30 V or a voltageoverload (OL) condition. When making frequencymeasurements >1 kHz, the Y symbol is unspecified.Test Lead AlertXW WarningPersonal injury or damage to theMeter can occur if you attempt tomake a measurement with a lead in anincorrect terminal.To remind you to check that the test leads are in thecorrect terminals, LEAd is briefly displayed and anaudible beep sounds when you move the rotaryswitch to or from any A (Amps) position.1114, 115, and 117 Users Manual2Safety InformationA "XW Warning " statement identifies hazardous conditions and actions that could cause bodily harm or death. A "W Caution " statement identifies conditions and actions that could damage the Meter or the equipment under test.To avoid possible electric shock or personal injury, follow these guidelines: • Use the Meter only as specified in this manual or the protection provided by the Meter mightbe impaired. • Do not use the Meter or test leads if they appear damaged, or if the Meter is not operatingproperly. • Always use proper terminals, switch position, and range for measurements. • Verify the Meter's operation by measuring a known voltage. If in doubt, have the Meterserviced. • Do not apply more than the rated voltage, as marked on Meter, between terminals orbetween any terminal and earth ground. • Use caution with voltages above 30 V ac rms, 42 V ac peak, or 60 V dc. These voltages posea shock hazard. • Disconnect circuit power and discharge all high-voltage capacitors before testingresistance, continuity, diodes, or capacitance. • Do not use the Meter around explosive gas or vapor. • When using test leads or probes, keep your fingers behind the finger guards. • Only use test leads that have the same voltage, category, and amperage ratings as the meterand that have been approved by a safety agency. • Remove test leads from Meter before opening the battery door or Meter case.True-rms MultimetersSafety Information3•Comply with local and national safety requirements when working in hazardous locations. • Use proper protective equipment, as required by local or national authorities when working in hazardous areas. • Avoid working alone.• Use only the replacement fuse specified or the protection may be impaired.• Check the test leads for continuity before use. Do not use if the readings are high or noisy. •Do not use the Auto Volts function to measure voltages in circuits that could be damaged by this function’s low input impedance (≈3 k Ω)(114 and 117 only).SymbolsB AC (Alternating Current) I FuseF DC (Direct Current)T Double Insulated X Hazardous voltageWImportant Information; Refer to manualNBattery (Low battery when shown on thedisplay.)J Earth ground ~Do not dispose of this product as unsorted municipal waste. Contact Fluke or a qualified recycler for disposal.DAC and DC114, 115, and 117 Users Manual4True-rms MultimetersDisplay5F K Display hold enabled. Display freezes present reading.114, 115, & 117 G M VWX MIN MAX AVG mode enabled.Maximum, minimum, average or present reading displayed 114, 115, & 117 H (Red LED)Voltage presence through the non-contact VoltAlert sensor 117I LoZ The Meter is measuring voltage or capacitance with a low input impedance. 114, 115 & 117 J nµF mVµA Mk Ω kHz Measurement units.114, 115, & 117 K DC AC Direct current or alternating current 114, 115 & 117 L NBattery low warning.114, 115, & 117 M 610000 mV Indicates the Meter’s range selection. 114, 115, & 117 N (Bar graph) Analog display.114, 115, & 117 OAuto Volts Auto Manual The Meter is in the Auto Volts function.Autoranging. The Meter selects the range for best resolution. Manual ranging. User sets the Meter’s range. 114 & 117114, 115, & 117 114, 115, & 117 P +Bar graph polarity114, 115, & 117 Q 0L W The input is too large for the selected range.114, 115, & 117 RLEAdW Test lead alert. Briefly displayed whenever the Meter’s function switch is rotated to or from any A position.115 & 117114, 115, and 117Users ManualError MessagesbAtt Battery must be replaced before the Meter will operate.CAL Err Calibration required. Meter calibration is required before the Meter will operate.EEPr Err Internal error. The Meter must be repaired before it will operate.F11 Err Internal error. The Meter must be repaired before it will operate.6True-rms MultimetersRotary Switch Positions7Rotary Switch Positions Switch PositionMeasurement Function Model x Automatically selects ac or dc volts based on the sensed input with a low impedance input.114 & 117 eHz (button) AC voltage from 0.06 to 600 V. Frequency from 5 Hz to 50 kHz.114, 115 & 117115 & 117 DDC voltage from .001 V to 600 V.114, 115 & 117l AC voltage from 6.0 to 600 mV, dc-coupled. DC voltage from 0.1 to 600 mV. 114, 115 & 117Ω Ohms from 0.1 Ω to 40 M Ω.114, 115 & 117s Continuity beeper turns on at < 20 Ω and turns off at >250 Ω. 114, 115 & 117RDiode Test. Displays OL above 2.0 V. 115 & 117 S Farads from 1 nF to 9999 μF.115 & 117 jHz (button) AC current from 0.1 A to 10 A (>10 to 20 A, 30 seconds on, 10 minutes off). >10.00 A display flashes. >20 A, OL is displayed. DC-coupled.Frequency from 45 Hz to 5 kHz.115 & 117 I DC current from 0.001 A to 10 A (>10 to 20 A, 30 seconds on, 10 minutes off).>10.00 A display flashes. >20 A, OL is displayed.115 & 117 wNon-contact sensing of ac voltage.117Note: All ac functions and Auto-V LoZ are true-rms. AC voltage is ac-coupled. Auto-V LoZ, AC mV and AC amps are dc-coupled.114, 115, and 117 Users Manual8Battery Saver ("Sleep Mode")The Meter automatically enters "Sleep mode" and blanks the display if there is no function change, range change, or button press for 20 minutes. Pressing any button orturning the rotary switch awakens the Meter. To disable the Sleep mode, hold down the g button while turning the Meter on. The Sleep mode is always disabled in the MIN MAX AVG mode.MIN MAX AVG Recording ModeThe MIN MAX AVG recording mode captures the minimum and maximum input values (ignoring overloads), and calculates a running average of all readings. When a new high or low is detected, the Meter beeps.• Put the Meter in the desired measurement function and range.• Press p to enter MIN MAX AVG mode.• M and MAX are displayed and the highest reading detected since entering MIN MAX AVG is displayed.• Press p to step through the low (MIN), average (AVG), and present readings.• To pause MIN MAX AVG recording without erasing stored values, press f . K is displayed.• To resume MIN MAX AVG recording, press f again. • To exit and erase stored readings, press p for at least one second or turn the rotary switch.Display HOLDXW WarningTo avoid electric shock, when Display HOLD is activated, be aware that the display will not change when you apply a different voltage.In the Display HOLD mode, the Meter freezes the display. 1. Press f to activate Display HOLD. (K is displayed.) 2. To exit and return to normal operation, press f or turn the rotary switch. BacklightPress Q to toggle the backlight on and off. The backlight automatically turns off after 40 seconds. To disablebacklight auto-off, hold down Q while turning the Meter on.Manual and AutorangingThe Meter has both Manual and Autorange modes. • In the Autorange mode, the Meter selects the range with the best resolution.• In the Manual Range mode, you override Autorange and select the range yourself.True-rms MultimetersPower-Up Options9When you turn the Meter on, it defaults to Autorange and Auto is displayed.1. To enter the Manual Range mode, press q . Manual is displayed.2. In the Manual Range mode, press q to increment the range. After the highest range, the Meter wraps to the lowest range. NoteYou cannot manually change the range in the MIN MAX AVG or Display HOLD modes. If you press q while in MIN MAX AVG or Display Hold, the Meter beeps twice, indicating an invalid operation and the range does not change.3. To exit Manual Range, press q for at least 1 second or turn the rotary switch. The Meter returns to Autorange and Auto is displayed. Power-Up OptionsTo select a Power-Up Option, hold down the buttonindicated in the following table while turning the Meter on. Power-Up Options are canceled when you turn the Meter off and when sleep mode is activated.ButtonPower-Up Optionsf Turns on all display segments. p Disables beeper. bEEP is displayed when enabled.q Enables low impedance capacitance measurements. LCAP is displayed when enabled. See page 14.g Disables automatic power-down ("Sleep mode"). PoFF is displayed when enabled. QDisables auto backlight off. LoFF is displayed when enabled.Making Basic MeasurementsThe figures on the following pages show how to make basic measurements.When connecting the test leads to the circuit or device, connect the common (COM ) test lead before connecting the live lead; when removing the test leads, remove the live lead before removing the common test lead.114, 115, and 117 Users Manual10Measuring Resistanceedy04f.epsXW WarningTo avoid electric shock, injury, ordamage to the Meter, disconnectcircuit power and discharge all high-voltage capacitors before testing resistance, continuity, diodes, or capacitance.Testing for Continuityedy06f.epsNoteThe continuity function works best as a fast,convenient method to check for opens andshorts. For maximum accuracy in makingresistance measurements, use the Meter’sresistance (e) function.True-rms MultimetersMaking Basic Measurements11Measuring AC and DC VoltageUsing Auto Volts Selection (114 & 117 only) With the function switch in the x position, the Meter automatically selects a dc or ac voltage measurement based on the input applied between the V or + and COM jacks.This function also sets the Meter’s input impedance toapproximately 3 k Ω to reduce the possibility of false readings due to ghost voltages. Measuring AC and DC Millivoltsedy18f.epsWith the function switch in the l position, the Meter measures ac plus dc millivolts. Press g to switch the Meter to dc millivolts.114, 115, and 117 Users Manual12Measuring AC or DC Current (115 & 117)XW WarningTo avoid personal injury or damage to the Meter: • Never attempt to make an in-circuitcurrent measurement when the open-circuit potential to earth is >600 V. • Check the Meter's fuse before testing.(See “Testing the Fuse”)• Use the proper terminals, switchposition, and range for your measure-ment. • Never place the probes in parallel with acircuit or component when the leads are plugged into the A (Amps) terminals.edy08f.epsTurn circuit power off, break the circuit, insert the Meter in series with the circuit, and then turn circuit power on.True-rms MultimetersMaking Basic Measurements13Measuring Current above 10 AmpsThe millivolt and voltage function of the Meter can be used with an optional mV/A output Current Probe to measure currents that exceed the rating of the Meter. Make sure theedy14f.epsMeasuring Capacitance (115 & 117 only)edy05f.eps114, 115, and 117 Users Manual14Measuring Frequency (115 & 117 only)XW WarningTo avoid electrical shock, disregard the bar graph for frequencies >1 kHz. If thefrequency of the measured signal is >1 kHz, the bar graph and Z are unspecified.AC Voltage FrequencyAC Current FrequencyThe Meter measures the frequency of a signal by counting the number of times the signal crosses a trigger level each second. The trigger level is 0 V, 0 A for all ranges.Press g to turn the frequency measurement function on and off. Frequency works with ac functions only.In frequency, the bar graph and range annunciator indicate the ac voltage or current present.Select progressively lower ranges using manual ranging for a stable reading.Detecting AC Voltage Presence (117 only)edy13f.epsTrue-rms MultimetersMaking Basic Measurements15To detect the presence of ac voltage, place the top of the Meter close to a conductor. The Meter gives an audible as well as visual indication when voltage is detected. There are two sensitivity settings. The “Lo ” setting can be used on flush mounted wall sockets, power strips, flushmounted industrial outlets and various power cords. The “Hi ” setting allows for ac voltage detection on other styles of recessed power connectors or sockets where the actual ac voltage is recessed within the connector itself. The VoltAlert detector works in bare wire applications with voltages as low as 24 V in the “Hi ” setting.XW WarningIf there is no indication, voltage could still be present. Do not rely on the VoltAlert detector with shielded wire. Operation may be effected by differences in socket design, insulation thickness and type. Making Low Impedance Capacitance Measurements (115 & 117 only)For making capacitance measurements on cables with ghost voltage, hold q while turning on the Meter to switch the Meter into LoZ, (low input impedance) Capacitance mode. In this mode, capacitancemeasurements will have a lower accuracy and lowerdynamic range. This setting is not saved when the Meter is turned off or goes into sleep mode.Testing Diodes (115 & 117)edy07f.eps114, 115, and 117 Users Manual16Using the BargraphThe bar graph is like the needle on an analog meter. It has an overload indicator (>) to the right and a polarity indicator (+)to the left.Because the bar graph is much faster than the digital display, the bar graph is useful for making peak and null adjustments.The bar graph is disabled when measuring capacitance. In frequency, the bar graph and range annunciator indicates the underlying voltage or current up to 1 kHz.The number of segments indicates the measured value and is relative to the full-scale value of the selected range . In the 60 V range, for example (see below), the majordivisions on the scale represent 0, 15, 30, 45, and 60 V. An input of −30 V turns on the negative sign and the segmentsup to the middle of the scale.aej11f.epsTesting the Fuse (115 & 117 only) Test fuse as shown below.True-rms MultimetersMaintenance17MaintenanceMaintenance of the Meter consists of battery and fuse replacement, as well as case cleaning.Replacing the Battery and FuseXW WarningTo avoid shock, injury, or damage to the Meter:• Remove test leads from the Meterbefore opening the case or battery door. • Use ONLY a fuse with the amperage, interrupt voltage, and speed ratings specified.To remove the battery door for battery replacement: 1. Remove the test leads from the Meter 2. Remove the battery door screw.3. Use the finger recess to lift the door slightly.4. Lift the door straight up to separate it from the case. The battery fits inside the battery door, which is then inserted into the case, bottom edge first, until it is fully seated. Do not attempt to install the battery directly into the case.5. Install and tighten battery door screw.edy11f.eps114, 115, and 117 Users Manual18To open the case for fuse replacement: 1. Remove the test leads from the Meter 2. Remove the Meter from its holster.3. Remove two screws from the case bottom.4. Separate the case bottom from the case top.5. Remove the fuse from its holder and replace it with an 11 A, 1000 V, FAST fuse having a minimum interrupt rating of 17,000 A. Use only Fluke PN 803293.6. To re-assemble the Meter, first attach the case bottom to the case top, then install the two screws. Finally, insert the Meter into its holster. CleaningWipe the case with a damp cloth and mild detergent. Do not use abrasives, isopropyl alcohol, or solvents to clean the case or lens/window . Dirt or moisture in the terminals can affect readings.True-rms MultimetersGeneral Specifications19General SpecificationsAccuracy is specified for 1 year after calibration, at operating temperatures of 18 °C to 28 °C, with relative humidity at 0 % to 90 %.Maximum voltage between anyterminal and earth ground ......................................600 VSurge Protection .....................................................6 kV peak per IEC 61010-1 600V CAT III,Pollution Degree 2W Fuse for A input (115 & 117 only):....................11 A, 1000 V FAST 17 kA Fuse (Fluke PN 803293) Display .....................................................................Digital: 6,000 counts, updates 4/sec Bar Graph: 33 segments, updates 32/sec Temperature .............................................................Operating: -10 °C to + 50 °C Storage: -40 °C to + 60 °CTemperature Coefficient .........................................0.1 x (specified accuracy)/°C (<18 °C or >28 °C) Operating Altitude ...................................................2,000 metersBattery .......................................................................9 Volt Alkaline, NEDA 1604A / IEC 6LR61 Battery Life ...............................................................Alkaline: 400 hours typical, without backlightSafety Compliances plies with ANSI/ISA 82.02.01 (61010-1) 2004,CAN/CSA-C22.2 No 61010-1-04, UL 6101B (2003)and IEC/EN 61010-1 2ndEdition for measurement Category III, 600 V, Pollution Degree 2, EMC EN61326-1114, 115, and 117 Users Manual20Certifications ............................................................UL, P , CSA, TÜV, ; (N10140), VDE IP Rating (dust and water protection).........................IP42Table 1. Accuracy SpecificationsFunction Range ResolutionAccuracy± ([% of Reading] + [Counts])ModelDC millivolts 600.0 mV 0.1 mV 0.5 % + 2 114, 115, 117 DC Volts6.000 V 60.00 V 600.0 V 0.001 V 0.01 V 0.1 V 0.5 % + 2114, 115, 117DC, 45 to 500 Hz500 Hz to 1 kHzAuto-V LoZ [1] True-rms600.0 V0.1 V2.0 % + 34.0 % + 3114, 11745 to 500 Hz500 Hz to 1 kHzAC millivolts [1]True-rms600.0 mV 0.1 mV 1.0 % + 3 2.0 % + 3 114, 115, 117 A C Volts [1]True-rms6.000 V 60.00 V 600.0 V0.001 V 0.01 V 0.1 V1.0 % + 32.0 % + 3114, 115, 117True-rms MultimetersGeneral Specifications21Table 1 Accuracy Specifications (cont.)Function Range Resolution Accuracy± ([% of Reading] + [Counts])ModelContinuity 600 Ω 1 Ω Beeper on < 20 Ω, off > 250 Ω; detects opens or shorts of500 μs or longer.114, 115, 117Ohms600.0 Ω 6.000 k Ω 60.00 k Ω 600.0 k Ω 6.000 M Ω 40.00 M Ω 0.1 Ω 0.001 k Ω 0.01 k Ω 0.1 k Ω 0.001 M Ω 0.01 M Ω 0.9 % + 2 0.9 % + 1 0.9 % + 1 0.9 % + 1 0.9 % + 1 5 % + 2 114, 115, 117Diode test2.000 V0.001 V0.9 % + 2115, 117 Capacitance1000 nF 10.00 μF 100.0 μF 9999 μF1 nF 0.01 μF 0.1 μF 1 μF1.9 % + 2 1.9 % + 2 1.9 % + 2100 μF - 1000 μF: 1.9 % + 2> 1000 μF: 5 % + 20115, 117Lo-Z Capacitance (Power-up option)1 nF to 500 μF10% + 2 typical115, 117114, 115, and 117 Users Manual22Table 1 Accuracy Specifications (cont.)Function Range ResolutionAccuracy± ([% of Reading] + [Counts])ModelAC Amps True-rms[1](45 Hz to 500 Hz) 6.000 A10.00 A[3]20 A for 30 seconds max.,10 minutes rest min.0.001 A0.01 A1.5 % + 3 115, 117DC Amps 6.000 A10.00 A[3]20 A for 30 seconds max.,10 minutes rest min.0.001 A0.01 A1.0 % + 3 115, 117Hz (V or A input)[2]99.99 Hz999.9 Hz9.999 kHz50.00 kHz0.01 Hz0.1 Hz0.001 kHz0.01 kHz0.1 % + 2 115, 117Notes:[1] All ac ranges except Auto-V LoZ are specified from 1 % to 100 % of range. Auto-V LoZ is specified from 0.0 V.Because inputs below 1 % of range are not specified, it is normal for this and other true-rms meters to display non-zero readings when the test leads are disconnected from a circuit or are shorted together. For volts, crest factor of ≤3 at 4000 counts, decreasing linearly to 1.5 at full scale. For amps, crest factor of ≤3. AC volts is ac-coupled. Auto-V LoZ, AC mV, and AC amps are dc-coupled.[2] AC Volts Hz is ac-coupled and specified from 5 Hz to 50 kHz. AC Amps Hz is dc-coupled and specified from 45 Hzto 5 kHz.[3] >10 A unspecified.True-rms MultimetersGeneral Specifications23Table 2. Input CharacteristicsFunction Input Impedance(Nominal) Common Mode Rejection Ratio(1 k Ω Unbalanced)Normal ModeRejectionVolts AC >5 M Ω <100 pF >60 dB at dc, 50 or 60 HzVolts DC >10 M Ω <100 pF >100 dB at dc, 50 or 60 Hz >60 dB at 50 or 60HzAuto-V LoZ~3 k Ω <500 pF >60 dB at dc, 50 or 60 HzOpen Circuit Test VoltageFull Scale Voltage Short Circuit Current To 6.0 M Ω 40 M Ω Ohms <2.7 V dc <0.7 V dc<0.9 V dc<350 μADiode Test <2.7 V dc2.000 V dc<1.2 mA。
ForewordWithin the powerful current of global technological advancement, Quantum Information Science (QIS) has subtly emerged, heralded as a pivotal field for the future of technological industry. As countries intensify their R&D investments in quantum information technology, a global competitive landscape is taking shape. Studying global quantum policies not only enables us to interpret the strategic layouts of various countries and international organizations in the QIS domain, but also profoundly reveals core elements such as target setting, investment intensity, research focus, and partnerships. This can facilitate insightful contributions to future policy-making and investment decisions.This report is grounded in deep research into the evolution and trends of global quantum information technology policies, with particular focus on policies introduced or implemented in the first half of 2023. Through comprehensive policy summaries and data visualization, it aims to present a clear overview of the global quantum policy landscape, using the United States as a case study to delve into the organizational framework behind these policies. Moreover, while covering the latest 2023 policies, the report also deeply analyzes quantum policies from 2018 onwards, striving to offer a more complete and rich perspective on quantum policy dynamics.The report is composed of five main chapters. Chapter 1 provides an introduction to the background of global quantum information policy research, including policy classifications and the policy significance of quantum industry development. Chapter 2 summarizes the core features of global quantum information policies from the perspectives of national strategies, funding investments, and international cooperation. Chapter 3 delves into the organizational structures of major countries implementing quantum strategies, including quantum coordination mechanisms, national-level quantum centers and laboratories, and quantum industry alliances, with a deep analysis of the strategic layout of the United States in the field of quantum information. Chapter 4 summarizes the distinctive quantum policy characteristics of countries or organizations such as the United States, China, Australia, Japan, and the European Union announced in the first half of 2023. Finally, Chapter 5 highlights key areas that policymakers need to focus on, such as talent cultivation, international cooperation, standard setting, intellectual property rights, and industry regulations.Research DescriptionStudy PeriodThis report primarily focuses on policies related to quantum information that were published between January 2023 and June 2023.The policies studied in this research are public information, non-public policies are not within the scope of the research.Research MethodologyThe following methodologies are integrated into this report:•Literature Analysis: By reviewing relevant quantum literature, reports, policy documents, etc., to understand the background, objectives, content, and effects of policy implementation, thus gaining a deeper understanding of the connotations and denotations of the policies.•Empirical Research: Using quantitative or qualitative methods, data analysis, and other means to collect data and empirical materials during the policy implementation process, to verify the rationality, effectiveness, and feasibility of the policies.•Case Analysis: Selection of representative quantum policy cases for in-depth analysis of policy implementation process, influencing factors, outcomes, etc., in order to find patterns and experience to provide a reference for policy formulation and implementation.•Comparative Analysis: Comparative analysis of different regions, periods, and policy implementation situations to discover commonalities and differences, to provide insights and references for quantum policy formulation and implementation.Research Subjects•Policy Definition: The policies in this research are those issued by national governments or their relevant institutions, international alliance organizations or their relevant institutions, aimed at promoting basic research and application development in quantum information technology, promoting quantum technology industrial development and innovation, and enhancing the core competitiveness of countries in the field of quantum information technology.•Policy Classification: If divided according to the differences in policy publishing bodies, policies can be divided into national/organization-level top-level quantum information technology policies, policies on quantum information technology issued by government/organization departments, state/province or lower-level quantum information technology policies, and government/organization-led quantum information technology funding plans/projects. If divided according to policy objectives and content orientation, policies can be divided into national strategic policies, funding support policies, and international cooperation policies. It should be noted that in reality, the content of policies may intertwine. The main purpose of classifying policies is to provide readers with a clear framework.Table of ContentsI. Background of Quantum Information Policy Research1. Classification Method of Policies2. Importance of PoliciesII. Overview of Global Quantum Information Policies in the First Half of 20231. National Quantum Strategic Plans Launched by Four Countries2. Continual Increase in Government Funding Across Countries3. Signing of Bilateral or Multilateral Cooperation Agreements Among Various Countries III. Initiatives of Major Quantum Technology Participating Countries or Organizations1. Establishment of Quantum R&D Institutions2. Formation of Quantum AlliancesIV. Development Strategies of Major Quantum Information Technology Countries1. United States2. China3. United Kingdom4. Australia5. Japan6. Others7. European UnionV. Summary and Prospects1. Shortage of Quantum Talents, Implementation of Talent Training Plans2. Strengthening International Cooperation to Accelerate Technological Breakthroughs3. Establishing Standards and Regulations to Promote Ecosystem Development4. Planning Intellectual Property Layouts, Early Deployment5. Being Alert to Potential Ethical Issues Raised by Quantum Technology Development AppendixReference LinksList of FiguresFigure 1: Distribution of Countries or Organizations that Released Policies in H1 2023 Figure 2: Funding Inputs for Major Participating Countries or Organizations in H1 2023 Figure 3: Timeline of the United States National Quantum Initiative ActFigure 4: Organizational Structure of US QIST Implementation InstitutionsFigure 5: US Quantum Information Coordination Bodies and ResponsibilitiesFigure 6: Quantum Research Institutions Funded by the U.S. DOE and NSFFigure 7: Quantum Research Centers in Major Participating Countries or Organizations Figure 8: Member Types of the US Quantum Economic Development Consortium (QED-C) Figure 9: Establishment of Global Quantum AlliancesFigure 10: Policy Evaluations of Major Participating Countries in Quantum Technology Figure 11: Status of US Signing Quantum Joint Declarations with Other CountriesFigure 12: References to Quantum Information in Chinese Government Documents in H1 2023 Figure 13: National Quantum Strategies Implemented and Released in H1 2023Figure 14: Policies of Major Participating Countries in Quantum Technology in H1 2023 Figure 15: Quantum international cooperation among countries and organizationsAs a frontier field, quantum information science has largely relied on governmental funding for its early-stage development. Nations worldwide continually invest in this area, aiming to secure their leading positions or maintain an unbeatable momentum. According to publicly collected data, from January to June 2023, the United States topped the list for scale of investment globally. The funds dedicated to national-level quantum policies, governmental department issued quantum policies, government-funded quantum projects, and intergovernmental collaborative policies totaled approximately $2.5 billion USD.It is worth noting that, due to various considerations, the specific amount of investment is not fully disclosed by some countries. For instance, policy documents from China rarely disclose specific funding scales. Therefore, the actual amount of investment from each country is unknown, and the statistical data is for reference only. Some countries' investments in quantum information science are not strictly for 2023 but are planned to be dispersed over several years. In such cases, the data reflects the average annual investment. In situations where certain countries allocate funds to multiple sectors, with quantum information being just one among them, the statistics were computed based on the average funding received per sector.Quantum information investment by major countries/organizationsIn terms of international cooperation, as of June 30, 2023, the United States has signed joint statements on Quantum Information Science and Technology (QIST) cooperation with ten countries. Geographically, these countries include seven in Europe (Netherlands, France, Switzerland, Denmark, Sweden, Finland, UK), one in Australia (Australia), and two in Asia (Japan, South Korea). Notably, the Netherlands and South Korea signed joint statements on QIST cooperation with the US in the first half of 2023.Based on the established patterns of US international cooperation, we can anticipate the following potential moves:In Asia, it is predicted that the US may sign a joint statement on QIST cooperation with India. Despite recent news announcements of US-India collaboration in the quantum technology field (for instance, the post-meeting statement of the "US-India Critical and Emerging Technology Initiative" (iCET) in January 2023 announced plans to promote cooperation in cutting-edge and significant tech fields, including quantum technology), there has yet to be a document signed specifically on the quantum field.In Europe, among the ten countries that have signed cooperation agreements with the US, three are NATO members (UK, France, Netherlands). As a result, it is predicted that the US may sign quantum cooperation agreements with Germany, Canada, and Spain - three NATO member countries that also place significant emphasis on the development of quantum technology.Establishment status of global quantum alliancesAnother initiative undertaken by major countries/organizations worldwide to advance Quantum Information Science and Technology (QIST) is the establishment of Quantum Alliances. Countries such as the United States, Australia, the European Union, China, Canada, Germany, Japan, the United Kingdom, and Denmark have all set up such alliances, with the QED·C Alliance in the United States being the earliest to develop and currently having the largest number of members.In addition to internal collaboration within the alliances, these entities also cooperate with each other. In January 2023, the Canadian QIC, the American QED-C, Japan's Q-STAR, and the European Union's QuIC signed a Memorandum of Understanding (MoU), establishing the International Council of Quantum Industry Associations (ICQIA). This body aims to enhance communication and collaboration between the participating alliances in terms of the goals and methods of quantum technology development.American Q-EDCIn December 2018, the United States enacted the National Quantum Initiative Act. As part of the strategy to propel national interests, the Quantum Economic Development Consortium (QED-C), managed by the Stanford International Research Institute and supported by NIST, was established. The members of the QED-C alliance encompass six major categories, including businesses, government departments, academic institutions, Federally Funded Research and Development Centers (FFRDCs) and their managers, affiliates, among others. The alliance aims to coordinate resources among federal, academic, and industry partners to support quantum research and development work from public and private sectors as well as research institutions. This ensures the United States' leading role in global quantum research and development and promotes the emerging quantum industry in computation, communication, and sensing fields.Global Quantum Information Policy Research (H1 2023)9,200.00 USDElectronic (6-10 users)6,500.00 USDElectronic and 1 Hardcopy(1-5 users)7,250.00 USD Electronic (1-5 users)9,950.00 USDElectronic and 1 Hardcopy(6-10 users)Ordering InformationDisclaimerThe opinions expressed in this report strive to be independent and objective, and do not constitute any advertisement. The data in this report are mainly public information, as well as the collation of public data.The copyright of this report is owned by ICV TAnK. Any other form of use or dissemination, including but not limited to publications, websites, public accounts or personal use of the content of this report, needs to indicate the source.When using the content of this report, any quotation, deletion and tampering against the original intention of this report shall not be carried out. Without written permission, any institution or individual shall not reproduce, reproduce or publish in any form. If consent is obtained for quoting, reprinting, and publishing, it must be within the scope of permission. Those who use this report in violation of regulations shall bear corresponding legal responsibilities.The purpose of citing data, events and opinions in this report is to collect and summarize information, and it does not mean that we agree with all of their opinions, and we are not responsible for their authenticity.This report involves dynamic data, expresses the situation as of the time of publishing, and does not represent the future situation.The information or opinions expressed in this report do not constitute investment advice, please refer with caution.Our research team is deeply rooted in the Quantum Information Technology industry, boasting a continually updated and extensive database. Leveraging our vast experience, we provide insightful consulting services tailored to industry-specific needs. We are committed to remaining at the forefront of technological innovation, staying informed about the latest trends, and delivering relevant and actionable solutions for our clients.Customized Research ReportConsulting ServicesLong Term SubscriptionIndustry AnalysisInvestment InsightsExplore Our ServicesAt ICV, we are passionately curious about new technologies and strive to deliver the most robust market data and insights to help our customers make informed strategic decisions.We bring together deep intelligence across a wide range of capital-intensive industries and markets. By connecting data across variables, our analysts and industry specialists present our customers with a comprehensive view of their world.This is the benefit of the new intelligence. We are able to isolate cause and effect, risk and opportunity in new ways that empower our customers to make well-informed decisions with greater confidence.5250 Fairwind Dr. Mississauga, Ontario, L5R 3H4, Canada Contact Us (+1) 929 530 5901*****************。
a r X i v :c o n d -m a t /0211001v 1 [c o n d -m a t .m e s -h a l l ] 31 O c t 2002Quantum-Limited Measurement and Information in Mesoscopic DetectorsA.A.Clerk,S.M.Girvin and A.D.StoneDepartments of Applied Physics and Physics,Yale University,New Haven CT,06511,USAOct.30,2002We formulate general conditions necessary for a linear-response detector to reach the quantum limit of measurement efficiency,where the measurement-induced dephasing rate takes on its mini-mum possible value.These conditions are applicable to both non-interacting and interacting sys-tems.We assess the status of these requirements in an arbitrary non-interacting scattering based detector,identifying the symmetries of the scattering matrix needed to reach the quantum limit.We show that these conditions are necessary to prevent the existence of information in the detector which is not extracted in the measurement process.PACS numbers:I.INTRODUCTIONIssues of quantum measurement in mesoscopic sys-tems have recently garnered considerable interest,both because of their relevance to attempts at quantum computation 1and quantum-limited amplifiers 2.A gen-eral consequence of any quantum measurement is that it must induce decoherence in the system variable con-jugate to that being measured.This basic fact natu-rally leads to the issue of measurement efficiency:what conditions must a particular detector satisfy so that it induces the absolute minimum amount of dephasing re-quired by quantum mechanics?This minimum dephas-ing rate is identical to the measurement rate Γmeas ,the rate at which information is extracted during the mea-surement process;thus,the measurement efficiency ra-tio χ≤1is defined by χ=Γmeas /Γϕ,where Γϕis the measurement-induced dephasing rate.Besides be-ing of great conceptual interest,near-ideal measurement schemes are necessary to detect signatures of coherent qubit oscillations in the output noise of a detector 3,4,and are essential if one wishes to construct a quantum limited amplifier (i.e.an amplifier whose noise energy is the minimum allowed by quantum mechanics)2.While the question of measurement efficiency has received at-tention in the context of general measurement theory 5,it is only recently that it has been considered in the con-text of solid state detectors.Averin 3has considered the status of the quantum limit in a number of solid state de-tectors,while recently Pilgram and B¨u ttiker 6considered the quantum limit for a system in which a mesoscopic conductor acts as a detector.In this paper,we formulate general conditions which are needed for an arbitrary detector in the linear-response regime to reach the quantum limit of detection,where χ=1.These general conditions are valid for both inter-acting and non-interacting systems,and can be given a direct physical interpretation.We also discuss the quan-tum limit in terms of a simple concept from quantum information theory,the accessible information.To make these considerations more concrete,we apply them to a mesoscopic scattering detector similar to that consideredin Ref.6,identifying precise conditions and symmetries needed to reach the quantum limit.We find that the required symmetries are most easily understood if one considers the scattering detector in terms of information;these symmetries are not the same as those usually con-sidered in mesoscopic systems.For example,we find that time reversal symmetry is not necessary for reaching the quantum limit.We also find that,surprisingly,an adia-batic point contact 7system remains a quantum limited detector even for voltages large enough that several chan-nels contribute to transport and that the energy depen-dence of scattering is important;previous studies 8,9,10have only shown that the quantum limit is achieved in the small voltage regime.Our results for the mesoscopic scattering detector are complementary to those obtained in Ref.6.II.GENERAL CONDITIONSA.Model and Derivation of the Quantum LimitWe start by considering a generic system consisting of a qubit (i.e.a two-level system described as a spin 1/2)cou-pled to an arbitrary detector.The system Hamiltonian is H =H qubit +H detector +H int ,where H qubit =−12where the zero-frequency linear-response coefficient (or “forward gain”)λis given byλ≡−i Im∞dτ I (τ)Q (0) ρ0(3)Here,ρ0is the initial density matrix of the detector,andρQ is the initial density matrix of the qubit.We have assumed that the qubit splitting frequency Ωis much smaller than the rate which characterizes the detector,which allows us to approximate the detector’s response to the qubit as instantaneous.Alternatively,one can restrict attention to the case where the qubit is in a σz eigenstate,and thus σz (t ) is time independent.The operators on the RHS in the above equation evolve in the Heisenberg picture generated by H 0=H qubit +H detector .Next,we connect the detector noise in the output op-erator I and input operator Q to,respectively,the mea-surement rate Γmeas and the dephasing rate Γϕ.Definingthe fluctuating part of an operator A as A=A − A ρ0,the required zero-frequency noise correlators are given by:S I =2+∞−∞dt I(t ) I (0) ρ0=4πi,fP i δ(E i −E f )| I if |2(4a)S Q =2+∞−∞dt Q(t ) Q (0) ρ0=4πi,fP i δ(E i −E f )| Qif |2(4b)S IQ =2+∞−∞dt I(t ) Q (0) ρ0=4πi,fP i δ(E i −E f )( I if )( Q fi )(4c)Here,we use the short hand O if = i |O |f ,where |i ,|fare eigenstates of H detector with energies E i ,E f .The probability P i is defined as i |ρ0|i ;we assume that ρ0is diagonal in the basis of eigenstates.Taking the detector noise to be Gaussian,the standard expressions for the dephasing rateΓϕand measurementrate Γmeas are given by:1Γϕ=A 2S I(5)We briefly review the origin of Eqs.(5).The dephasing rate describes the measurement-induced decay of the off-diagonal elements of the qubit density matrix.It can be derived by looking at the decay at long times of the phase correlator V (t )= σ+(t )σ−(0) ,where σ+(σ−)isthe spin raising (lowering)operator:V (t )=exp −i t 0dt ′(Ω+2AQ (t ′)/ )(6)≃e −i Ωt exp−2A 22(σ↑(t )+σ↓(t )),(8)where σdenotes the variance of the distribution,and the √2·2S IIτmeas ,(9)which directly yields the expression in Eq.(5)for Γmeas .Note that we have taken σ↑=σ↓in the last step;this is sufficient to obtain the leading order expression for Γmeas .To relate Γϕand Γmeas ,we first note that the righthand sides of Eqs.(4a)-(4c)implicitly define an inner product(i.e.,interpret the matrix elements {˜Iif }and {˜Q if }as defining vectors).The Schwartz inequality then immedi-ately yields:S I S Q ≥|S IQ |2= 2(λ−λ′)2+(Re S IQ )2(10)where we have introduced the reciprocal response coeffi-cient (or “backwards gain”)λ′:λ′≡2Γϕ=2λ22(λ−λ′)2+(Re S IQ )2≤1(12)The best one can do is measure the qubit as quickly as one dephases it 11.Note that this derivation only requires the3validity of linear response and the weak-coupling approx-imations whichgiverise to Eqs.(5);very little is specified of the detector.Similar derivations of the quantum limit are presented in Refs.3and 5.The inequality of Eq.(12)is in many ways intuitively reasonable.Both dephasing and measurement involve entangling the state of the qubit with states in the detec-tor.In principle,there may be degrees of freedom in the detector which become entangled with the qubit without providing any detectable information in a measurement of I ;any such entanglement would lead to Γϕ>Γmeas .More precisely,imagine that when the measurement is initially turned on,the system is in a product state:|ψ(t =0) =12|↑ +|↓ ⊗|D ,(13)where |D is the initial state of the detector,and |↑ ,|↓ denote qubit σz eigenstates.At some later time t ,the state of the system may be written as:|ψ(t ) =12|↑ ⊗|D ↑(t ) +|↓ ⊗|D ↓(t ) ,(14)To say that we have measured the state of the system implies that the states |D ↑(t ) and |D ↓(t ) are distin-guishable;to say that the qubit has been dephased only implies that the detector states |D ↑(t ) and |D ↓(t ) are orthogonal.While distinguishability implies orthogonal-ity,the opposite is not true;thus,in general,Γϕ>Γmeas .Note that in this formulation,the dephasing rate will be related to the overlap between the two detector states:| D ↑(t )|D ↓(t ) |≃e −Γϕt(15)B.Necessary Conditions for Reaching theQuantum LimitWe have thus seen that on a heuristic level,reaching the quantum limit requires that the detector have no “ex-traneous”degrees of freedom which couple to the qubit.Equivalently,all information on the state of the qubit re-siding in the detector should be accessible in a measure-ment of I .The virtue of the derivation presented in the last subsection is that these statements can be given a precise meaning.One sees that three conditions are necessary to reach the quantum limit:(i)the Schwartz inequality of Eq.(10)must be optimized,(ii)the cross-correlator Re S IQ must vanish,and (iii)the backwards gain λ′must vanish.Conditions (i)and (ii)can be suc-cinctly re-expressed as a single condition,leading to the following necessary and sufficient requirements:{∀i,f |P i =0,E f =E i }, f | I|i =i C f | Q |i (16)λ′≡22+(−)Im [S IQ (0)]−1E(19)If λ′=0,it follows from the above that at E =0,the imaginary part of S IQ (E )coincides with the Hilbert transform of the real part of S IQ (E ):Im [S IQ (E )]E =0=−1E ′−EE =0(20)If this held for all E ,it would follow from the Titchmarshtheorem 12that S IQ (t )= I(t ) Q (0) ρ0is causal:it would vanish for t <0.This would clearly be sufficient to satisfy Eq.(17).More generally,the vanishing of λ′only requires the weaker condition of Eq.(20).4C.The Quantum Limit and Information TheoryWe close this section by formalizing the connection be-tween the quantum limit and information.A deviation from the quantum limit (i.e.χ<1)implies the exis-tence in the detector of “missing information”regard-ing the state of the qubit,information which is not re-vealed in a measurement of I .The dephasing rate thus corresponds to what the measurement rate would be if we could make use of all the available informa-tion.This notion can be quantified by borrowing a con-cept from quantum information theory,the accessibleinformation13,14,15,16.To define this,note first that if we choose a specific detector quantity (or set of quan-tities)Y to measure (described by,e.g.,a set of com-muting observables),we can think of our system as a noisy classical communication channel.The two possi-ble inputs to the channel are the qubit states |↑ and |↓ ;interaction with the detector for a time t then leads to two corresponding detector states |D ↑(t ) and |D ↓(t ) (c.f.Eq.(14)).17Finally,the outputs from the chan-nel are the outcomes of the measurement of Y .The “noise”here is a result of the intrinsic uncertainties of Y in the states |D ↑(t ) and |D ↓(t ) ;the output will thus be described by the conditional probability distributions p (y |↑),p (y |↓)determined by these states,where y rep-resents possible outcomes of the measurement.Letting ¯p (y )=[p (y |↑)+p (y |↓)]/2,the mutual information R of this channel is 18:R [Y ]=H [¯p (y )]−18( y (t ) ↑− y (t ) ↓)22(1+sin α(t ))log(1+sin α(t ))+(1−sin α(t ))log(1−sin α(t ))(24)This expression corresponds to having equally weightedour two input states,as we did in Eq.(21);one can check that this choice maximizes I .At small times (Γϕt ≪1),comparison against Eq.(15)yields α(t )→0,and we have:I ≃α(t )2=Γϕt(25)As expected,the growth of the accessible information isdetermined by the dephasing rate.Achieving χ=1thus implies that the rate that we actually obtain information,Γmeas ,coincides with the growth of the total accessible information.Thus,there is no “missing”information in the detector.We can also think of Eqs.(24)and (25)as providing an alternate route for deriving the quantum limit inequality Γϕ≥Γmeas ,i.e.:R [Y ]≃Γmeas t ≤I ≃Γϕt(26)The utility of thinking about back action effects and the quantum limit in terms of information will become clear in the next section,where we discuss the mesoscopic scat-tering detector.Note also that the relation between in-formation and state disturbance has been studied in a slightly different context by Fuchs et al.14III.MESOSCOPIC SCATTERING DETECTORTo make the preceding discussion more concrete,we now consider the status of the quantum limit in a slightly less general detector set-up,the mesoscopic scattering de-tector considered in Ref.6.We determine the conditions needed to reach the quantum limit of detection by di-rectly applying the general conditions derived in the last section,namely the proportionality condition of Eq.(16),and the causality condition of Eq.(17).This is in con-trast to Ref.6,which developed conditions needed for the quantum limit by directly calculating Γϕand Γmeas .We explicitly show that a violation of Eq.(16)implies the existence of unused information in the detector,informa-tion which is not extracted in the measurement process.FIG.1:Schematic of the mesoscopic scattering detector,in which the current through a phase coherent scattering region is used to detect the qubit.Q denotes the charge in the scattering region,while I R(I L)is the current in the right (left)contact.The detector here is a two terminal scattering region (see Fig.1)characterized by a scattering matrix s.Tak-ing the contact to both the right and left reservoirs to have N propagating transverse modes,s will have di-mension2N.The output operator of the detector I is simply the current through the region;the state of the qubit alters I by modulating the potential in the scat-tering region.Note that while we focus on the limit of a weak coupling between the qubit and detector,so that the linear response approach of the previous sec-tion is valid,we do not assume that the voltage is small enough that I ∝V.19The mesoscopic scattering detec-tor describes the setup used in two recent“which path”experiments20,21.These experiments used a quantum point contact to detect the presence of an extra electron in a nearby quantum dot.As the dot was imbedded in an Aharanov-Bohm ring,the dephasing induced by the measurement could be studied directly.We start by considering the simplest situation,also considered in Ref.6,where the state of the qubit pro-vides a uniform potential change in the scattering region. In this case the input operator Q is the total charge in the scattering region.Unlike Ref.6,we do not explic-itly consider the effects of screening here.Within an RPA scheme,consideration of such effects allows an ex-plicit calculation of the qubit-detector coupling strength A,but does not result in any other changes over a non-interacting approach.In the weak coupling regime,the particular value of A does not affect the approach to the quantum limit.Letting a†αn(E)represent the creation operator for an incident wave in contactα=L,R,transverse mode n, and at energy E,the detector current operator for con-tactαtakes the form22:Iα=e2πi s†(E)s(E+ ω)−s(E)2πi s†(E)dh µLµR dεdh µLµR dε j dT j(ε)Re iβ√T e iϕ−√where R=1−T.At zero temperature,the detector is described by a single many-body state|i in which all incident states in leadαwith E<µαare occupied,and all other incident states are unoccupied:|i = ΠE L≤µL a†L(E L) ΠE R≤µR a†R(E R) |vac (34)First,we consider the causality condition of Eq.(17) which requires that the backwards gainλ′vanishes.As we know the initial state of the detector and have explicit expressions for I and Q,we can directly evaluate the function S IQ(E)appearing in Eq.(18)in terms of s.A direct calculation can be performed to show that: ∞−∞dE Re[S IQ(E)]E(35)Im[S IQ(0)]=Im[F(0)](36) where,letting t≡s RL,the function F(E)is defined as:F(E)=−i e2E (37)Note that Eqs.(35)and(36)are independent of whether I is take to be I L,I R,or a linear combination of the two. Now,causality dictates that the scattering matrix s is an-alytic in the upper half complex plane,and thus so is the function F(E).The real and imaginary parts of F are thus related by a Hilbert transform,and Eqs.(20),(35) and(36)imply thatλ′=0for the scattering detector irrespective of the choice of s.Thus,the causality prop-erties of the scattering matrix s ensure that one of the conditions necessary for reaching the quantum limit is al-ways satisfied.Note that substituting these expressions for S IQ(E)in Eq.(19)does indeed yield the expected form ofλ(Eq.(32)).It is also useful to note that gauge invariance can be used to directly establish23λ′=0. The essence of the argument is that a coupling to the current(i.e.H int=Aσz I(x=0))is equivalent to intro-ducing a local vector potential.The gauge transforma-tion which removes this term will only modify the trans-mission phases in the scattering matrix s(i.e.φandφ′) in an energy-independent ing Eq.(29),one can check that Q is independent of energy-independent phase changes;thusλ′=0.Next,we turn to the condition given in Eq.(16),which requires a certain proportionality between I and Q in or-der to reach the quantum limit.Given the state|i which describes the detector(Eq.(34)),the only matrix ele-ments of I and Q which contribute to the zero frequency noise correlators(c.f.Eqs(4))involve energy-conserving transitions where a scattering state incident from the left reservoir is destroyed while a scattering state incident from the right reservoir is created.Since these transi-tions require an occupied initial state and an unoccupied final state,they can only occur in the energy interval µR<E<µL.We are thus interested in the coefficients of the operators a†R(E)a L(E)appearing in the expansion of I and Q in this energy interval.The proportional-ity requirement of Eq.(16)thus results in a necessary condition on s(ε):∀Eǫ[µR,µL],[s LR]∗(E)s LL(E)=i CN RL(E)(38) where C is a real,energy-independent ing Eq.(33),the imaginary and real parts of the above con-dition become:∀Eǫ[µR,µL],ddE(E)C(40) Similar conditions for reaching the quantum limit for this version of the scattering detector werefirst developed in Ref.6by directly calculatingΓmeas andΓϕ(note there is a sign error in Eq.(7)of Ref.6which must be corrected to obtain our Eq.(39)).24The fulfilling of these conditions does not correspond to symmetries usu-ally considered in mesoscopic systems;for example,as we will show,the presence of time-reversal symmetry is nota necessary requirement.Instead,the conditions of Eqs.(39)and(40)correspond directly to the requirement that there be no missing information in the detector,informa-tion which is not revealed in a measurement of I .We demonstrate this explicitly in what follows.1.Phase ConditionThefirst condition(Eq.(39))for reaching the quantum limit requires that the difference between transmission and reflection phases in the scattering matrix be constant in the energy interval defined by the voltage.If it holds, changing the state of the qubit will not modulate this phase difference.Eq.(39)thus constrains information–it ensures that the detector does not extract additional information about the qubit which resides in the relative phase between transmission and reflection.Such infor-mation is clearly not revealed in a measurement of I , and would necessarily lead to additional dephasing over and above the measurement rate.In principle,this addi-tional information could be extracted by performing an interference experiment.To be more specific,note that the cross-correlator S IQ(c.f.Eq.4c)is given by:S IQ=i λ+e2dE(β−ϕ) (41)By definition,the imaginary part of this correlator deter-mines the linear response coefficientλ(c.f.Eq.(3))asso-ciated with measuring I .In contrast,the real part of this correlator may be interpreted as the linear response coefficient associated with a measurement where one in-terferes reflected and transmitted electrons;the factor of T(1−T)corresponds to the fact that the magnitude of this signal will be proportional to the amplitude of both7 the reflected and transmitted beams.More explicitly,consider the Hermitian operator I mod defined by:I mod=e2h eA µLµR dεdT(ε)µLµR dεT(ε)(1−T(ε))(43)≃(δε)t dε22h j eA dT(εj)T(εj)(1−T(εj))(45)One can easily check that R tot≥R avg;this corresponds to the additional information that is generally available in the energy dependence of T.A necessary and suffi-cient condition for ensuring R tot=R avg is precisely the condition of Eq.(40).On a purely classical level,this condition ensures that no information is lost when one averages over energy.How can the problems generally posed by energy av-eraging be avoided?One possible solution would be to use voltages small enough that the scattering matrix s can be approximated as being linear in energy,that is eV(dT/dE)≪1(this is the approach of Ref.6).How-ever,as the linear response coefficientλis given by the energy derivative of the transmission(c.f.Eq.(32)),such a small voltage would imply both a small signal and es-sentially no gain.The change in current induced by the qubit,∆I=±Aλ,would be much smaller than the cur-rent associated with the coupling voltage A:λ≃e2dEe|V| ≪e2 dEeV 2 A h≪AEven though this smallness ofλdoes not theoretically af-fect the approach to the quantum limit,it does severely limit the detector’s practical value–for very slow mea-surement rates,environmental effects on the qubit will become dominant over backaction effects.If we now considerfinite voltages and fully energy-dependent scattering,Eq.(40)tells us the condition un-der which energy averaging the transmission does not impede reaching the quantum limit.The solution to Eq.(40)has the form:T(E)=12 v FdR(49)where d is the transverse width of the constriction at its center,and R is the radius of curvature of the transverse confining potential at the constriction center.B.Multichannel CaseWe now consider the situation where there are N chan-nels in each of the two contacts leading to the reservoirs. It is useful to write s in terms of its N transmission eigen-values T j(E)using the standard polar decomposition:26s(E)= s LL s LRs RL s RR = U V √T√R U′V′ (50)Here,U,U′,V,V′are N×N energy-dependent unitary matrices,and√T are diagonal matrices having entries T j(E),respectively.In the multichannel case,the backwards gainλ′again vanishes irrespective of the details of s as a result of the analytic properties of s.The relevant question then to ask is what conditions must be satisfied by s(E)so that the proportionality between I and Q required to reach the quantum limit(i.e.Eq.(16))is achieved.As in the single-channel case,the relevant matrix elements of I and Q involve destroying a scattering state incident from the left and creating an equal-energy state describing an in-cident wave from the right;the additional complication now is that these transitions could result in a change of transverse mode.One thus needs to examine the coeffi-cients of the operator products a†Rn(E)a Lm(E)appear-ing in the expansion of I and Q,in the energy interval [µR,µL].The proportionality condition of Eq.(16)again yields the requirement that Eq.(38)hold for all ener-gies in this interval;now,however,both the right and left-hand side of this equation are N×N matrices:∀Eǫ[µR,µL],[s LR(E)]†s LL(E)=i CN RL(E)(51) Here,C is again an energy-independent real -ing the polar decomposition,one can derive from Eq.(51) two necessary matrix conditions which must hold for all energies in the interval defined by the voltage:R(E)− T(E)=0(52)dTT(E)(1−T(E))=−4πdEU(ε) (54)φV(ε)=−iV†(ε) dT,φU , √of detection.This can be understood from the point of view of information.If theφU,φV matrices are not purely diagonal,information about the qubit could be gained by looking at changes in how electrons incident in a given mode are partitioned into outgoing modes.Such changes would not be detectable if all channels had the same transmission.Note that the matrices U′and V′appearing in the polar decomposition of s(Eq.(50))are irrelevant to reaching the quantum limit.As each trans-verse mode is equally populated with incoming waves in the state|i ,there is no information associated with the preferred mode structure for incoming waves(i.e.the eigenvectors of U′and V′).2.Transmission ConditionConsider now the condition imposed by Eq.(53),which constrains the form of the transmissions T j(ε)of the detector.Similar to the corresponding condition for the single-channel system,this requirement ensures that there is no additional information available in either the energy or channel structure of the{T j(ε)}which is lost upon averaging.One obtains a necessary form for the transmissions,similar to what was found in Ref.6:T j(E)=1hT(1−T)(57a)ˆSQ(ε)=e22T(1−T)+2T R(φU−φV)2+2 φU,√T R,φV+[φU,T][T,φU]+[φV,T][T,φV] (57b)ˆλ(ε)=−e2π √A2d10 Q than that given in Eq.(29).In general,we may write:Q=e dEdE′ β,γ=L,R(59)a†βn(E)Wβn,γm(E,E′)aγm(E′)where W(E,E′)is a2N×2N Hermitian matrix hav-ing dimensions of inverse energy.The situation consid-ered in the last section corresponds to choosing W to be N(E,E′)(Eq.(30)),which at E=E′is just the Wigner-Smith delay time matrix.By comparing against the current operator I(c.f.Eq.(27)),it is clear that the proportionality condition of Eq.(16)necessary for the quantum limit constrains the diagonal in energy,off-diagonal in lead index part of the potential matrix W:∀Eǫ[µR,µL],[W(E,E)]RL=i1T(1−T)=C׈1(63)√R−√T=0(64)where φU=−iU†(∆U), φV=−iV†(∆V).Importantly, the above conditions do not involve any energy averag-ing,as we have taken s and W to be energy indepen-dent.Nonetheless,there still is a non-vanishing gainλdetermined by both the voltage and the∆T j:λ=e2V11 involved in transport,and the energy dependence of scat-tering is important.We thank M.Devoret for useful conversations.Thiswork was partially supported by ARDA through theArmy Research Office,grant number DAAD19-02-1-0045,by the NSF under Grants No.DMR-0084501andDMR-0196503,and by the W.M.Keck Foundation.APPENDIX A:ACCESSIBLE INFORMATIONIn this appendix,we provide a simple proof of Eq.(24)for the accessible information I.Given the two states|D↑ and|D↓ ,the goal is to maximize the classical mu-tual information R(defined in Eq.(21))over all possiblechoices of measurements.A given choice of measurementY corresponds to a choice of basis;the probability dis-tributions p(y i|↑)and p(y i|↓)are determined by theelements of the corresponding states in this basis.Treat-ing the p(y i|σ)as independent variables restricted to theinterval[0,1],and using Lagrange multipliers,we mini-mize R subject to the following constraints:Ni=1p(y i|σ)=1(A1)Ni=1¯p(y i)+2λ↑+λ p(y i|↑)=0,(A3)with a similar equation emerging from variation with re-spect to p(y i|↓).λ,λ↑andλ↓,are Lagrange multipliers;¯p(y i)=[p(y i|↑)+p(y i|↓)]/2is the averaged distribu-tion.Subtracting the↑and↓equations yields:λ= p(y i|↑)−p(y i|↓)log p(y i|↑)1−β2i1−βi(A4)where we have definedβi viaβi=p(y i|↑)−p(y i|↓)1+(−1)j sinα1−(−1)j sinα。