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USB2.0-HOST/SYSTEM测试方案参考资料：1．USB Spec2.02．Intel ICH4 USB Electrical Test Method( APAC Lab Workshop Q1/2002 ) 3．USBIF Full and Low Speed Compliance Test Procedure Rev.1.0rc2 4．USBIF High-speed Electrical Test Toolkit Setup Instruction Rev.1.01 5．USBIF Host High-speed Electrical Test Procedure Rev.1.0 6．Tektronix USB2.0 Compliance Test Fixture7．Tektronix USB Measurements Package说明：1.本测试方案适用于USB2.0 HOST/SYSTEM级测试，包括主板；2.进行USB测试，所使用的连接电缆线规格：信号线：28 AWG；电源线：22或24AWG；本测试全部采用此种规格电缆线测试。
目录：一、信号质量测试1.高速信号质量测试2.全速信号质量测试3.低速信号质量测试二、Drop、Droop测试1.Drop测试2.Droop测试三、TDR测试一、信号质量测试1．高速信号质量测试1.1目的验证高速传输时，信号的质量；1.2标准通过高速传输眼图测试；1.3器材示波器：Tek 7404（加载软件：Tek USB2.0 Test Package）；差分探头：Tek P7330×1个；夹具：Tek USB2.0 Test Fixture（SQIDD板）；测试软件：USBHSET.EXE (从USBIF网站下载、升级) ；USB电缆线：1米×1根；1.4步骤(1)连接如下，差分探头与夹具暂不连接：(2)设置夹具上开关S6在Init位置，通电；(3)被测设备(Host Under Test)预安装要求：•安装Win2000操作系统；•安装芯片组、ICH4驱动程序；•安装测试软件USBHSET.EXE；(4)设置示波器：•按示波器面板按键“default setup”，将示波器置于出厂设置；•进入菜单File---Run Application，运行程序USB2.0 Test Package；•选择“High Speed”，选中“Eye Diagram”；在“Device ID”中输入被测设备的编号（系统自动生成的报告将以此命名）；点击“Config”，选择tier1，Down Stream，Near End，设置差分探头所在的通道；•点击图标，示波器进行自动设置，进入等待触发状态；(5)设置被测设备：•进入Win2000，运行USBHSET.EXE，选中“HostController/System”，点击“Test”，进入测试界面；•点击“Enumerate Bus”，程序将列举所连接的高速USB设备；•选中设备，由下拉菜单设置Port Control为“TEST PACKET”；•将差分探头的正、负极与夹具上D+、D-相对应连接；•点击“EXECUTE”，程序将控制USB EHCI控制器，产生高速时测试包；(6)示波器采样到准确信号后，点击“OK”，完成信号测试，检查测试结果；(7)进入TDSUSB2 USB2.0 Test Package菜单Utilities，选择“Plug－FestSpecific”格式（此为通用的USB报告形式）和所希望的路径，点击“Generate”，系统将自动生成报告；(8)依次将被测设备的不同USB端口通过1米电缆线与夹具相连，测量每一个端口的信号；1.5说明1．：测试项通过测试；：测试项不能通过测试；：测试结果在限定的条件（waiver limits）内通过。
USB2.0-HOST/SYSTEM测试方案参考资料：1．USB Spec2.02．Intel ICH4 USB Electrical Test Method( APAC Lab Workshop Q1/2002 )3．USBIF Full and Low Speed Compliance Test Procedure Rev.1.0rc24．USBIF High-speed Electrical Test Toolkit Setup Instruction Rev.1.015．USBIF Host High-speed Electrical Test Procedure Rev.1.06．Tektronix USB2.0 Compliance Test Fixture7．Tektronix USB Measurements Package说明：1.本测试方案适用于USB2.0 HOST/SYSTEM级测试，包括主板；2.进行USB测试，所使用的连接电缆线规格：信号线：28 AWG；电源线：22或24AWG；本测试全部采用此种规格电缆线测试。
目录：一、信号质量测试1.高速信号质量测试2.全速信号质量测试3.低速信号质量测试二、D rop、Droop测试1.Drop测试2.Droop测试三、T DR测试一、信号质量测试1．高速信号质量测试1.1目的验证高速传输时，信号的质量；1.2标准通过高速传输眼图测试；1.3器材示波器：Tek 7404（加载软件：Tek USB2.0 Test Package）；差分探头：Tek P7330×1个；夹具：Tek USB2.0 Test Fixture（SQIDD板）；测试软件：USBHSET.EXE (从USBIF网站下载、升级) ；USB电缆线：1米×1根；1.4步骤(1)连接如下，差分探头与夹具暂不连接：(2)设置夹具上开关S6在Init位置，通电；(3)被测设备(Host Under Test)预安装要求：安装Win2000操作系统；安装芯片组、ICH4驱动程序；安装测试软件USBHSET.EXE；(4)设置示波器：按示波器面板按键“default setup”，将示波器置于出厂设置；进入菜单File---Run Application，运行程序USB2.0 Test Package；选择“High Speed”，选中“Eye Diagram”；在“Device ID”中输入被测设备的编号（系统自动生成的报告将以此命名）；点击“Config”，选择tier1，Down Stream，Near End，设置差分探头所在的通道；点击图标，示波器进行自动设置，进入等待触发状态；(5)设置被测设备：进入Win2000，运行USBHSET.EXE，选中“HostController/System”，点击“Test”，进入测试界面；点击“Enumerate Bus”，程序将列举所连接的高速USB 设备；选中设备，由下拉菜单设置Port Control为“TEST PACKET”；将差分探头的正、负极与夹具上D+、D-相对应连接；点击“EXECUTE”，程序将控制USB EHCI控制器，产生高速时测试包；(6)示波器采样到准确信号后，点击“OK”，完成信号测试，检查测试结果；(7)进入TDSUSB2 USB2.0 Test Package菜单Utilities，选择“Plug－Fest Specific”格式（此为通用的USB报告形式）和所希望的路径，点击“Generate”，系统将自动生成报告；(8)依次将被测设备的不同USB端口通过1米电缆线与夹具相连，测量每一个端口的信号；1.5说明1．：测试项通过测试；：测试项不能通过测试；：测试结果在限定的条件（waiver limits）内通过。
USB2.0的供电标准如下：
1.供电电压范围为4.4V到5.25V。
2.更大供电电流为500mA。
USB设备可以分为自供电和总线供电两种设备类型。
其中，自供电USB设备不需要使用USB主机或集线器的电源，自身有电源供应；总线供电指USB设备的电源来自USB电缆中VBUS线。
如果是总线供电设备，USB规范按照设备工作时汲取的电流大小将USB设备分为低功耗设备和高功耗设备。
在USB2.0规范中规定，低功耗设备任何情况下不得汲取超过100mA的电流；高功耗设备在正确配置之前不得汲取超过100mA的电流，如果已经配置，任何情况下不得汲取超过500mA的电流。
如果设备进入挂起状态，在任何情况下低功耗设备不得使用超过500µA的电流，高功耗设备不得使用超过2.5mA的电流。
每个USB2.0设备需要在自己的配置描述符中声明其对VBUS上电流的要求，由USB主机来进行统一管理。
USB2.0-HOST/SYSTEM测试方案参考资料：1．USB Spec2.02．Intel ICH4 USB Electrical Test Method( APAC Lab Workshop Q1/2002 ) 3．USBIF Full and Low Speed Compliance Test Procedure Rev.1.0rc2 4．USBIF High-speed Electrical Test Toolkit Setup Instruction Rev.1.01 5．USBIF Host High-speed Electrical Test Procedure Rev.1.0 6．Tektronix USB2.0 Compliance Test Fixture7．Tektronix USB Measurements Package说明：1.本测试方案适用于USB2.0 HOST/SYSTEM级测试，包括主板；2.进行USB测试，所使用的连接电缆线规格：信号线：28 AWG；电源线：22或24AWG；本测试全部采用此种规格电缆线测试。
目录：一、信号质量测试1.高速信号质量测试2.全速信号质量测试3.低速信号质量测试二、Drop、Droop测试1.Drop测试2.Droop测试三、TDR测试一、信号质量测试1．高速信号质量测试1.1目的验证高速传输时，信号的质量；1.2标准通过高速传输眼图测试；1.3器材示波器：Tek 7404（加载软件：Tek USB2.0 Test Package）；差分探头：Tek P7330×1个；夹具：Tek USB2.0 Test Fixture（SQIDD板）；测试软件：USBHSET.EXE (从USBIF网站下载、升级) ；USB电缆线：1米×1根；1.4步骤(1)连接如下，差分探头与夹具暂不连接：(2)设置夹具上开关S6在Init位置，通电；(3)被测设备(Host Under Test)预安装要求：∙安装Win2000操作系统；∙安装芯片组、ICH4驱动程序；∙安装测试软件USBHSET.EXE；(4)设置示波器：∙按示波器面板按键“default setup”，将示波器置于出厂设置；∙进入菜单File---Run Application，运行程序USB2.0 Test Package；∙选择“High Speed”，选中“Eye Diagram”；在“Device ID”中输入被测设备的编号（系统自动生成的报告将以此命名）；点击“Config”，选择tier1，Down Stream，Near End，设置差分探头所在的通道；∙点击图标，示波器进行自动设置，进入等待触发状态；(5)设置被测设备：∙进入Win2000，运行USBHSET.EXE，选中“HostController/System”，点击“Test”，进入测试界面；∙点击“Enumerate Bus”，程序将列举所连接的高速USB设备；∙选中设备，由下拉菜单设置Port Control为“TEST PACKET”；∙将差分探头的正、负极与夹具上D+、D-相对应连接；∙点击“EXECUTE”，程序将控制USB EHCI控制器，产生高速时测试包；(6)示波器采样到准确信号后，点击“OK”，完成信号测试，检查测试结果；(7)进入TDSUSB2 USB2.0 Test Package菜单Utilities，选择“Plug－FestSpecific”格式（此为通用的USB报告形式）和所希望的路径，点击“Generate”，系统将自动生成报告；(8)依次将被测设备的不同USB端口通过1米电缆线与夹具相连，测量每一个端口的信号；1.5说明1．：测试项通过测试；：测试项不能通过测试；：测试结果在限定的条件（waiver limits）内通过。
USB2.0-HOST/SYSTEM测试方案参考资料：1．USB Spec2.02．Intel ICH4 USB Electrical Test Method( APAC Lab Workshop Q1/2002 ) 3．USBIF Full and Low Speed Compliance Test Procedure Rev.1.0rc2 4．USBIF High-speed Electrical Test Toolkit Setup Instruction Rev.1.01 5．USBIF Host High-speed Electrical Test Procedure Rev.1.0 6．Tektronix USB2.0 Compliance Test Fixture7．Tektronix USB Measurements Package说明：1.本测试方案适用于USB2.0 HOST/SYSTEM级测试，包括主板；2.进行USB测试，所使用的连接电缆线规格：信号线：28 AWG；电源线：22或24AWG；本测试全部采用此种规格电缆线测试。
目录：一、信号质量测试1.高速信号质量测试2.全速信号质量测试3.低速信号质量测试二、Drop、Droop测试1.Drop测试2.Droop测试三、TDR测试一、信号质量测试1．高速信号质量测试1.1目的验证高速传输时，信号的质量；1.2标准通过高速传输眼图测试；1.3器材示波器：Tek 7404（加载软件：Tek USB2.0 Test Package）；差分探头：Tek P7330×1个；夹具：Tek USB2.0 Test Fixture（SQIDD板）；测试软件：USBHSET.EXE (从USBIF网站下载、升级) ；USB电缆线：1米×1根；1.4步骤(1)连接如下，差分探头与夹具暂不连接：(2)设置夹具上开关S6在Init位置，通电；(3)被测设备(Host Under Test)预安装要求：•安装Win2000操作系统；•安装芯片组、ICH4驱动程序；•安装测试软件USBHSET.EXE；(4)设置示波器：•按示波器面板按键“default setup”，将示波器置于出厂设置；•进入菜单File---Run Application，运行程序USB2.0 Test Package；•选择“High Speed”，选中“Eye Diagram”；在“Device ID”中输入被测设备的编号（系统自动生成的报告将以此命名）；点击“Config”，选择tier1，Down Stream，Near End，设置差分探头所在的通道；•点击图标，示波器进行自动设置，进入等待触发状态；(5)设置被测设备：•进入Win2000，运行USBHSET.EXE，选中“HostController/System”，点击“Test”，进入测试界面；•点击“Enumerate Bus”，程序将列举所连接的高速USB设备；•选中设备，由下拉菜单设置Port Control为“TEST PACKET”；•将差分探头的正、负极与夹具上D+、D-相对应连接；•点击“EXECUTE”，程序将控制USB EHCI控制器，产生高速时测试包；(6)示波器采样到准确信号后，点击“OK”，完成信号测试，检查测试结果；(7)进入TDSUSB2 USB2.0 Test Package菜单Utilities，选择“Plug－FestSpecific”格式（此为通用的USB报告形式）和所希望的路径，点击“Generate”，系统将自动生成报告；(8)依次将被测设备的不同USB端口通过1米电缆线与夹具相连，测量每一个端口的信号；1.5说明1．：测试项通过测试；：测试项不能通过测试；：测试结果在限定的条件（waiver limits）内通过。
PRODUCT SPECIFICATION SPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name PRODUCT SPECIFICATION Amended Date 05-29-2003TYPEPLUG&RECEPTACLE Page 1 Sum To 8 PagesA&BTitle USB2.0１．SCOPEThis specification covers performance, methods and quality requirements forUniversal Serial Bus (USB) plug and receptacle connectors. These connectorsare cable mounted plug and printed circuit board mounted receptacle connectors.2. REQUIREMENTS2.1 Design and ConstructionProduct shall be of the design , construction and physical dimensions specifiedThe in applicable product drawing.2.2 Materials and PlatingThey are specified on applicable product drawing.2.3 RatingsA.Voltage: 30 VAC (rms)B.Current: 1.5A per contact, not to exceed 30℃ temperature riseC.Operating temperature: -20℃ to +85℃D.Storage temperature: -25℃ to +85℃E.Nominal Temperature Rating: +20℃2.4 Test Requirements and Procedures SummaryD Amended 05-29-2003Check Director Tab C Amended 10-17-2001A Approved 02-26-2001陈永飞Description DateItem ChangePRODUCT SPECIFICATIONSPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 NamePRODUCT SPECIFICATIONAmended Date05-29-2003Title USB2.0 A&B TYPE PLUG&RECEPTACLE Page 2 Sum To 8 PagesNote:Shall meet visual requirements ,show no physical damage ,and shall meet requiremFigure 1 (conn.)Test DescriptionRequirement ProcedureLow level contact resistance for Lower and Middle stack 30mΩ maximum initial EIA 364-23 Subject mated contacts assembled in housing to 20 mV maximum open circuit at 100 mA maximum. See figure ALow level contact resistance for Upper stack 50mΩ maximum initial EIA 364-23 Subject mated contacts assembled in housing to 20 mV maximum open circuit at 100 mA maximum. See figure AInsulation resistance 1000 MΩ minimum EIA 364 – 21 Test voltage 500±50V/DC between adjacent contacts of mated and unmated connector assemblies.Dielectric withstanding Voltage No flashover&sparkover&excess leakage&breakdownEIA 364 – 20 Test voltage 500V/AC between adjacent contacts of mated and unmated connector assemblies.Vibration , random No discontinuities of 1u s orLonger duration.See Note.EIA 364 – 28A-83 Condition V Test Letter A. Subject mated connectors to 5.35 G's rms. 15 minutes in each of three mutually perpendicular planes ,See Figure B.Physical shock No discontinuities of 1u s or Longer duration.See Note. EIA 364 – 27 Condition H. Subject mated connectors to 30 Gs half-sine shock' pulses of 11 ms duration. three shocks in each direction applied along three mutually perpendicular planes ,18 total shocks ,See Figure C first test setup.Durability Contact Resistance:10 mΩ maximum change from initial value. EIA 364 – 09. 1500cycles insertion/extraction at a maximum rate of 200cycles per hour, then see note. Solderability USB contact solder tails shall pass95% coverage after one hour steam aging as specified in category 2.EIA364--52Cable pull-out Applied a load of 40 Newtons for one minute.EIA364-38 Test condition APRODUCT SPECIFICATION SPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name PRODUCT SPECIFICATION Amended Date 05-29-2003 Title USB2.0A&BTYPEPLUG&RECEPTACLE Page 3 Sum To 8 Pages Test Description Requirement ProcedureMating force 35 Newtons maximumEIA 364 – 13 Measure forcenecessary to mate connector Assembliesat maximum rate of 12.5 mm/min.Unmating force 10 Newtons minimumEIA 364 – 13 Measure forcenecessary to unmate connectorassemblies at maximum rate of 12.5mm/min.Thermal shock Contact Resistance:10 mΩ maximumchange from initial value.EIA 364 –32 Test Condition I.10Cycles –55℃ and +85℃,The USBconnectors under test must be mated.Critical Dimension 8 total measurement within tolerance.EIA 364-18Humidity Life Contact Resistance:10 mΩ maximumchange from initial value. The USB connectors under test must betested in accordance with EIA 364 – 31Condition A. method Ш. 168 Hours minimum (seven complete cycles).Temperature life Contact Resistance:10 mΩ maximumchange from initial value. See NoteEIA 364 – 17A-87 Condition 2 MethodA. Subject mated connectors totemperature Life at 85℃ for 250 hoursMixed Flowing Gas See NoteEIA 364-65-92 Class II, Exposures(1)U nmated for 1 day(2)M ated for 10 dayFlammability Require its thermoplastic resin vendorto supply a detailed C of C with eachresin shipment. The C of C shallclearly show the resin’s UL listingnumber, lot number, date code, etc.UL 94 v-0Note:Shall meet visual requirements ,show no physical damage ,and shall meet requirement.Figure 1 (conn.)PRODUCT SPECIFICATION SPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name PRODUCT SPECIFICATION Amended Date 05-29-2003 Title USB2.0A&BTYPEPLUG&RECEPTACLE Page 4 Sum To 8 Pages Test Description Requirement ProcedureContact capacitance 2 pF maximum unmated percontact.EIA 364 –30The object of this test is to detail a standardmethod to determine the capacitance betweenconductive elements of a USB connector.Contact current rating 1.5A at 250vAC minimumwhen measured at an ambienttemperature of 25℃, withpower applied to the contacts,the temperature change shallnot exceed +30 at any point inthe USB connector under test.EIA 364 – 70—method BThe object of this test procedure is to detail astandard method to assess the currentcarrying capacity of mated USB connectorcontacts.Differential impedance 90±15%Ω(76.5~~103.5Ω)Connect the Time Domain Reflectometer(TDR). TDR is setup the differential mode.Common mode impedance 30±30%Ω(21~~39Ω)Connect the Time Domain Reflectometer(TDR). TDR is setup the differential mode.Propagation Delay 26ns(maximum for full speed cable)Connect the Time Domain Reflectometer(TDR). TDR is setup the differential mode.Propagation delay skew 100ps/cable(maximum for full speed cable)Connect the Time Domain Reflectometer (TDR). TDR is setup the differential mode.Signal pair attenuation (Maximum) 0.064 MHz 0.08 dB/Cable1. Connect the Network Analyzer output port(port1) to the input connector on theattenuation test fixture(note).2. Connect the series “A” plug of the cable obe tested to the test fixture, leaving theother end open-circuited.3.Calibrate the network analyzer andfixture using the appropriate calibrationstandards over the desired frequencyrange.0.256 MHz 0.11 dB/Cable0.512 MHz 0.13 dB/Cable0.772 MHz 0.15 dB/Cable1.000 MHz 0.20 dB/Cable4.000 MHz 0.39 dB/Cable8.000 MHz 0.57 dB/Cable12.00 MHz 0.67 dB/Cable24.00 MHz 0.95 dB/Cable48.00 MHz 1.35 dB/Cable96.00 MHz 1.90 dB/Cable200.00 MHz 3.2 dB/Cable400.00 MHz 5.8 dB/CableNote: Shall meet visual requirements ,show no physical damage ,and shall meet requirementFigure 1 (conn.)PRODUCT SPECIFICATION SPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name PRODUCT SPECIFICATION Amended Date 05-29-2003 Title USB2.0A&BTYPEPLUG&RECEPTACLE Page 5 Sum To 8 Pages 2.5 Product qualification test sequence:Test ExaminationTest Group (a)1 2 3 4 5 6 8Test Sequence (b)Examination 1,10 1,6 1,6 1,9 1,3 1,6 1,3 Low level contactresistance3,7 2,5 2,5Capacitance 2Critical Dimension 2 Insulation resistance 3,7DWV 4,8Vibration 5Physical shock 6Durabillity 4 3 3Mating and unmatingforce2,8Thermal shock 5Humidity 6Temperature life 4Cable pull-out 9Mixed Flowing Gas 4Solderability 2Impedance 2Attenuation 3 Propagation delay 4Skew 5Number of samplesPlug 8pcs 8pcs 8pcs 8pcs 5pcs 5pcs 8pcs socket 8pcs 8pcs 8pcs 8pcs 5pcs 5pcs8pcs3. Sample Selection:Samples shall be prepared in accordance with applicable manufacturers instructions and shall be selected at random form current productions.PRODUCT SPECIFICATIONSPEC.NO. SPEC-USB 2.0Approved Date 02-26-2001 Name PRODUCTSPECIFICATION Amended Date05-29-2003TitleUSB2.0 A&B TYPE PLUG&RECEPTACLEPage 8 Sum To 8 Pages1.0 USB connector termination data:provide the standardized contact terminating assignments by number and electricalvalue for series “A” and series “B” connectors.1.1 USB connector termination assignment:Contact numberSignal nameTypical wiring Assignment1 Vbus Red2 D- White3 D+ Green4 GND Black shell Shield Drain Wire。
