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FPGA-based Low-cost Automatic Test Equipment for Digital Integrated Circuits

FPGA-based Low-cost Automatic Test Equipment for Digital Integrated Circuits
FPGA-based Low-cost Automatic Test Equipment for Digital Integrated Circuits

IEEE International Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications 21-23 September 2009, Rende (Cosenza), Italy

FPGA-based Low-cost Automatic Test Equipment for

Digital Integrated Circuits

Luca Mostardini, Luca Bacciarelli, Luca Fanucci 1, Lorenzo Bertini, Marco Tonarelli, Marco De Marinis 2

1

Dept. of Information Engineering - University of Pisa - Via Caruso 16, I-56122, Pisa - Italy -

{name}.{surname}@iet.unipi.it

2

SensorDynamics AG - Via Giuntini 25, I-56023 Navacchio (Pisa) - Italy -

{lbe, mto, agb, mdm}@https://www.doczj.com/doc/d716922988.html,

Abstract - Digital circuits complexity and density are increasing while, at the same time, more quality and reliability are required. These trends, together with high test costs, make the validation of VLSI circuits more and more difficult. Beside high-end ATE machines, strictly necessary in ASIC production phase, low-cost ATE test systems take place into market to implement a valid support in ASIC development phase.

In this paper a case study of low-cost, reconfigurable, versatile and easy-to-use FPGA-based test environment is presented. It allows patterns to be extracted from HDL-simulation and stimuli to be generated to ASIC prototypes, especially when a high-end test machine setup isn’t foreseen or isn’t available yet. This is the ideal solution for engineers to develop test programs and perform device tests and yield analysis on their desktop and then transfer the test program directly to production. The result is low-cost automatic test equipment, able to execute a preliminary digital test, using just a Laptop and an FPGA-equipped board.

I. I NTRODUCTION Many The VLSI test problems are more and more challenging in high-reliability design and will only worsen as circuit size increases and transistor feature size decreases. Circuit complexity, possible anomalies and high test costs make the validation of VLSI circuits more and more critical.

Two main categories of ATE machines are available nowadays on the market: high-end ATE and low-cost ATE. Machines belonging to the arena of high-end ATE, for example Verigy [1], Advantest [2], Teradyne [3] ones, are usually find located in testing companies and their operation is strictly interrelated with production.

ASIC manufacturers generally resort to these companies when chip development phase has been resolved and an accurate digital test program is ready to be executed by these high-end commercial ATEs.

In these cases testing is used to distinguish between lots of good or faulty modules.

High-end ATEs are characterized by high grade of automation (such as handlers for mechanical automation), digital and analog test capability, high-current pin protections and high-speed test execution. On the other hand they are very expensive and require an accurate setup and skilled people, so ASIC manufacturers also needs some other testing solution, which can be executed in house during preliminary chip evaluation phase, when the use of an aforementioned ATE should be unnecessary in terms of time and money.

In last decade, beside this range of performing ATE machines low-cost ATEs took place in market.

Chip testing and project verifying is essential above all during preliminary chip evaluation when customer is involved [4]. Inovys [5], Nextest [6], Teseda [7] and others trademarks participate in a competition in the arena of low-cost ATE offering products able to be used directly from ASIC designers during chip development phase.

For example, Maverick Personal Tester System produced by Nextest [6] allows to check functionality of up to 64 or 128 pin ASIC, and its testing capability is oriented and optimized towards electronic devices such as microcontrollers, specialty logic and flash memory devices.

In this paper we propose a case study of a low-cost,

easy-to-use and reconfigurable automatic test machine referred as FATE (FPGA-based ATE) in the following. The FPGA development occurred in the last years allows us to project and realize a home-made low-cost ATE based on a standard commercial FPGA.

Many vendors propose into market various kinds of quick, flexible and feature-rich development boards featuring various sized FPGA. The boards can support one or more standard interfaces to add further application-specific modules.

This scenario gives engineers the flexibility to acquire a

right-sized board and the module(s) to obtain the required capability in a quite cheap way.

FATE allows executing home-made digital tests, only using a Laptop and a FPGA-based board and can be easily

modified accordingly to the DUT (Device Under Test) saving time and money [8,

9]. After this introduction Section 2 briefly introduces the FATE system. Section 3 presents FATE architectures. The operation flow for testing execution is discussed in Section 4 while testing methodology is presented in Section 5. Experimental results are discussed in Section 6, future development in Section 7, and finally, conclusions are drawn in Section 8.

II.FATE S YSTEM

Presented ATE, which joins in low-cost ATE arena, makes always available an architecture optimized to the DUT [10, 11] thanks to FPGA characteristic of dynamic configurability.

With respect to most of other low-cost ATEs, no microprocessor or microcontroller is fitted on the programmable resource. After FATE setting for target DUT testing, designer disposes of an “ad hoc” instrument, unable to perform other low-cost ATEs generality (i.e. the possibility of implementing mathematical functions), but optimized in terms of simplicity and maximum speed available.

To generate test patterns and traduce them in ASIC stimuli a software tool has been developed for FATE.

The purpose is to use this test system in an ASIC development flow linked to a production tester. FPGA based structural tester provides a lower-cost way to conduct test pattern validation, test program development, and debug-diagnosis or failure analysis that is related to fails on a production tester learning during ramp-to-volume. Moreover it provides high flexibility, portability and a better response time.

The resulting architecture allows any kind of digital test to be executed on the DUT. It is also possible to use the same testbench used during the HDL project development to automatically generate or regenerate relevant test patterns.

Besides the physical platform, a virtual one has been also realized in order to verify by means of a further simulation the automatically generated test-patterns. This tool allows generated test vectors to be cross-checked using them as stimuli for the ASIC netlist.

FATE system, (including both hardware and software components), results in an instrument allowing engineers to validate vectors and develop the test program or to trace the root causes of systemic failures in early time.

III.FATE A RCHITECTURE

The complete test system is made up of a Laptop connected with a USB cable (or RS-232) to the FATE platform. The FATE platform is then connected with an “ad hoc” module to the DUT (see Fig. 1).

In our implementation we use a commercial development board DS-KIT-3SMB1500-EURO by Memec InsightTM, featuring the XC3S1500-4FG676C [12], a Xilinx? SpartanTM 3 family FPGA with 1.5M system gates and 576Kbits of SRAM resources. The board is connected to the DUT by means of an application-specific module (InsightTM P160 prototype module) in order to allow prototyping and testing of external devices by providing them the power supply from FPGA and simplifying the physical connections.

In our case the socket hosting the DUT was directly soldered on the P160 prototype module but any other kind of connections can be used to enlink the board and DUT (see Fig. 2).

Fig. 1. Complete test system.

Fig. 2. Implemented connection between FPGA and DUT. This development board met the test system

requirements. The FPGA was able to implement all FATE hardware and its SRAM resources allow storing a large amount of test vectors. This board implements also a USB 2.0 port to establish a fast communication line between the Laptop and the FPGA.

The great advantage of using a reprogrammable resource, such as an FPGA, is that the whole architecture (hardware implemented on FPGA and software utilities) can be rapidly modified accordingly to the DUT pinout.

It is just required to modify the socket and its connections, and to change few parameters in the HDL code and in a text configuration file read run-time by the software. Then new hardware is ready to be synthesized and fitted on FPGA, and software is just configured to test a new chip.

A serial interface, three single port RAMs implemented on FPGA and four Finite State Machines (FSMs), controlled by FATE software we realized, represent the kernel of the proposed test machine (see Fig. 3).

Fig. 3. Block scheme of architecture on FPGA.

All hardware structure is synthesized accordingly to generic parameters of the HDL package; only new SRAM memories must be created again every time the DUT pinout changes. These memory elements must be generated accordingly to FPGA available resources; anyhow main FPGA development kit tools provide an automatic SRAM generator.

This test environment foresees to implement 3 optimized SRAM elements: one is organized to contain pin timing data and its size is set accordingly to DUT pinout; the second one to contain patterns to be applied and the third to collect samples. The length of the second and third memories is set accordingly to DUT pinout, but their depth is a free parameter. The depth of the aforementioned second and third memories is the same because every test vector stored in a row of pattern memory when applied on DUT produces a sample line stored in a row of sample memory.

This solution allows targeting our architecture on every board FPGA-based. The flexibility in the setting of the depth parameters allows loading the maximum number of test vectors permitted by the RAM resources of the adopted FPGA.

IV.T EST M ACRO-O PERATIONS

In this section the macro-operations executed during a complete test flow are described.

Setup operations foresee these preliminary steps: user has to compile a text configuration file containing information about pin-timing and generate or compile the patterns file. After that it is possible to execute test in a fully automatic mode. The software is in charge of sending to the FATE the above mentioned two files, automatically converted in machine format. A proper FSM implemented on FPGA (FSM1: LOAD) acquires these data and loads them into two optimized SRAM (TIMING SRAM and PATTERNS SRAM).

The communication between PC and FPGA is realized by an USB cable thanks to an USB to UART Bridge Controller available on the InsigthTM board. Data can be processed by a versatile UART interface implemented on FPGA and able to support any baud-rate in order to interface a USB converter.

If target FPGA board doesn’t support an USB to UART converter, a serial cable communication is also available. In this case, baud rate is selectable in a predefined range of discrete values.

Once the SRAMs have been loaded, the effective testing starts; a further FSM (FSM4: GEN/SAM) on FPGA will generate the stimuli to the DUT accordingly to the patterns and to the pin-timing information and save the sample in another dedicated SRAM (SAMPLES SRAM). Then a sample gathering begins and FPGA sends all logic values sampled on DUT pinout to the Laptop. In practical cases, when testing complex DUTs, the required patterns file usually exceed the depth of the PATTERNS SRAM on FPGA, so an automatic loop of loading patterns, executing test and downloading samples takes place. The patterns are split in more slices and they are applied in consecutive cycles. Finally, when last cycle has been applied, and so the sample file is complete, the software generates a report file. This file, written in a STIL (Standard Test Interface Language) format, is a list of errors containing the possible differences between expected and sampled values. Complete test flowchart execution highlighting the above mentioned macro-operations is showed in Fig. 4.

POSSIBILE LOOP

Fig. 4. Flowchart of complete test execution operations.

V. T ESTING M ETHODOLOGY

The frequency of the clock generated to stimulate the

DUT is different from the frequency of the on-board

oscillator which controls the FSMs. This solution allows

stimulating DUT pinout and acquiring samples in instants

different from the test-clock rising edge.

Test period length is selectable at run-time, by setting an

appropriate prescaler reduction value and configuring

available DCM (Digital Clock Manager) test can be executed

at the required frequency. Maximum test frequency is

however 1/10 of the on-board frequency oscillator.

An external clock source or a more performing FPGA may

be used wherever it needs to execute test at higher speed.

Pin-timing file is used to keep information about timing

edges DUT pinout. For each pin, whose name is assigned

by user, signal type (RZ, NRZ or RO), delay, duration and

sample time in the test period are specified.

Test period, indeed, is divided into 10 intervals and every

signal in the test period must be brought back to one of

these signal types: a Return to Zero (RZ), a Non Return to

Zero (NRZ) or a Return to One (RO). Fig. 5 shows the three

signal types examples and time base: (a) NRZ signal with

delay = 4; (b) RZ signal with delay = 3 and duration = 5 (it

may be, for example, the DUT clock, with a duty cycle of

50%); (c) RO signal with delay = 4 and duration = 3.

1

2

3

4

5

6

7

8

9

00

1

1

01

0(a)

(b)

(c)

Time

L o g i c l e v e l

NRZ

RZ

RO

Fig. 5. Possible signal type in time base.

Summarizing, during setup phase, user has to set signal

type, delay, duration and sample time for each pin of DUT; signal transitions and sample times have to be reproduced aligning as much as possible to the waveform

of testbench. Stimuli generation and sample logic are

driven accordingly to patterns and pin-timing file.

Software, which constantly interfaces Laptop and user, controls hardware operations. It manages data transferring, compiles others user friendly files, processes patterns and generates the machine format of source user text configuration file. User may configure test execution in debug mode or in fully automatic mode. In both solutions user may check each operation result simply reading messages out coming on screen. Debug mode allows executing one by one a pre-fixed number of test vectors. This feature is very useful in ASIC development phase, because of designer, using a standard oscilloscope, may directly control logic level and edges of

all DUT pinout during test execution.

Fully automatic mode is useful when patterns have just

be verified and designer needs to execute more than one

digital test on a single ASIC. In this case source files have

to be located in predefined path and software drives the

execution of the digital test program.

Possible errors in source text files, CRC (Cyclic

Redundancy Check) failures or others misunderstandings

(such as compiling errors) are signaled. When the FATE

software tool isn’t able to automatically correct generated

error the user is invited to solve manually the problem.

A relevant feature is that software acquires all

parameters from text files, which have to be modified

every time it needs to change settings.

This solution allows the software running without a C

compiler installed on your Laptop.

Software includes also a compression data technique,

able to reduce the size of patterns file when the same test

vector is repeated twice or more times.

As already aforementioned, the great advantage of the

proposed test-platform is that designer can use the same

testbench written during HDL project development to

generate patterns. This solution is possible because the

project includes the HDL code of an entity (text_gen) which can be compiled and directly instantiated by the testbench itself. It needs only to execute this modified testbench to obtain, as further result, the patterns generation properly formatted to be acquired by software. Fig. 6 shows the new testbench object.

Fig. 6. Automatic test patterns generation. Besides this physical platform, a virtual one has been realized too, which allows simulating again the generated patterns to check their validity. FATE environment also includes a HDL description of a machine (text_verify) to be instantiated in a new testbench and connected to the DUT netlist. Launching this new simulation is it possible to obtain a possible list of mistakes made during patterns generation.

Fig. 7 shows the further testbench to be compiled to implement this virtual platform.

Patterns generation and verification loop is now complete, designer can launch the same simulation used in ASIC project phase with the further result of obtaining patterns. After that, designer uses provided HDL-testbench to cross-check if aforementioned patterns are really consistent with DUT netlist.

Fig. 7. Automatic test patterns validation

If new simulation result generates no error, virtual platform gives place to physical one and patterns becomes real stimuli applied to ASIC. Fig. 8 schematizes test loop operations.

Fig. 8. Patterns generation and verification flow.

VI.E XPERIMENTAL R ESULTS

The proposed FATE system has been successfully used

to test tens of prototypes of two Systems on Chip (SoC) developed to realize control systems based on Micro Electro Mechanical (MEM) sensors.

These two ASIC has been produced using different technologies, but they have some common characteristics: each of them contains an analog and a digital part, a CPU, some I/O peripherals, others to control the analog part, several ADCs, DACs and memory elements: ROM, single port and dual port SRAM etc. Either SoC ASIC prototypes we tested have just 20 digital pins, but given example doesn’t loose in generality.

Memec InsightTM [12] also provides board disposing of more than one P160 interfaces and it is possible to reach up more than 128 pin connections, overcoming the limitation

of most of low-cost ATEs. In our experiment it was enough

to implement the test machine on a board supporting the aforementioned SpartanTM 3 Xilinx? FPGA. The nature

of the MEMs under test allows using a maximum test clock frequency of a few MHz, which can be easily reached by the implementation of FATE on used FPGA.

FPGA SRAM resources, as expected, aren’t able to store the whole pattern but they allow execution of a single test run loop of 10000 test vectors. Anyway, the synchronous nature of tested chip allows no precaution to

be used between every loop of test vectors.

Digital part testing of this kind of ASIC is complex, so full test has been split in two complementary tests which have been separately executed: Built In Self Test (BIST) and Automatic Test Pattern Generation (ATPG). BIST is used to check only DUT memory elements and the ATPG

is used to validate all DUT standard cells and connections.

In ASIC first phase design, FATE has been used in debug mode to circumscribe errors due to a wrong patterns generation; in the second phase a digital test program has been provided to execute in a fully automatic mode ATPG and BIST test on a single ASIC.

Time requested by executing aforementioned two digital tests of a single unit is valid for our application. Complete test run of these two tests, which globally consists of an amount of 4.500.000 test vectors, takes about 20 minutes (15 minutes ATPG and 5 minutes BIST).

Actual FATE implementation can work at a maximum frequency of 6 MHz, (1/10 of 60 MHz on-board oscillator) which guarantees to cover the addressed sensor-conditioning applications. For example aforementioned BIST and ATPG tests can be successfully realized at 1 MHz, accordingly to the specifics ordered by designers. We used the proposed architecture on tens of these ASICs for both SoCs and this approach provided to

be very useful.

VII.E XPERIMENTAL R ESULTS

The realized test environment is suitable for present applications, but an interesting reduction in the overall test duration can be achieved by using an external flash

memory to store all test patterns. The used development board supports, in fact, another standard interface to further enlarge the connectivity from the FPGA to other external devices, so the flash memory could be physically integrated in the whole system without big efforts. All test vectors should be loaded in the flash memory just the first time, skipping to reload them each time when testing equivalent parts.

To completely benefit of this development, report generation logic should be modified. In the current version all samples are sent to the Laptop to generate the report file, also when testing good modules. We are taking in account the improvement of performing a hardware logic match directly in the FPGA which could send back to the Laptop only few control data when testing good parts, or to a failure sample list when testing faulty ones.

VIII.C ONCLUSIONS

In this paper we have described a low cost FPGA-based automatic test equipment to validate the digital parts of VLSI chip. Main features of FATE environment are low cost, high flexibility and simplicity of use. It is particularly useful in the VLSI project phase to debug few tens of prototypes when setup for commercial test machine has not been developed yet.

Using FATE, engineers can validate test vectors and develop the test program to quickly trace the root causes of systemic failures, with the consequent reduction of "time-to-market", "time-to-yield" and "time-to volume”. Experimental results obtained using this test machine for the screening of digital part of complex SoCs confirmed its validity, at least for the addressed applications. Produced error report file allows both to identify project errors in the VLSI design and to select good parts of tens of chips.

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[4] C.F. Hawkins, H.T. Nagle, R.R. Fritzemeier, J.R. Guth, “The VLSI

circuit test problem-a tutorial Industrial Electronics,” IEEE

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[5]https://www.doczj.com/doc/d716922988.html,/ (Inovys website)

[6]https://www.doczj.com/doc/d716922988.html,/ (Nextest website)

[7]https://www.doczj.com/doc/d716922988.html,/ (Teseda website)

[8] E.M. Saad, I.E. Talkhan, I.M. Sayed, “A proposed ATE for digital

systems Radio Science Conference,” 1996. NRSC '96., Thirteenth National, 19-21 March, 1996, pp. 209 – 220.

[9] C. Giaconia, A. Di Stefano, G. Capponi, “Reconfigurable digital

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