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Year 2000 Test Procedures DRAFT Version 3.0 General Motors Corporation DRAFT for Review

Year 2000 Test Procedures DRAFT Version 3.0 General Motors Corporation DRAFT for Review
Year 2000 Test Procedures DRAFT Version 3.0 General Motors Corporation DRAFT for Review

DRAFT for Review

We are currently in the process of developing and piloting integrated systems testing, we expect NO changes to the component level testing, but may expand the systems testing information based on this experience.

Year 2000

Test Procedures

This version of the GM “Year 2000 Test Procedures” may be revised in the future.

1.This document is being used globally in GM as a reference for all Year 2000 Testing.

2.This document is being shared with all of our suppliers and other manufactures to raise the level of awareness

industry wide for year 2000 testing.

3.As a condition of use, we request feedback on the document including:

?Additional tests and / or examples of failures

?Test plan examples for systems, clusters, and enterprise testing.

Please e-mail any feedback to the authors. (see section 1.5)

NOTICE

This “Year 2000 Test Procedures” document contains test cases from

several sources which may be of assistance in the planning of test

activities for your operations, products and services. It is provided

solely for general informational purposes, and not as advice or specific

recommendations on how you should conduct an assessment, testing or

conversion program for your particular products or services. Neither

General Motors Corporation (GM), nor its agents or consultants, make

any representation or warranty regarding the test procedures and other

information contained in this document, or the information or results

which may be generated by your or a third party’s use of the test

procedures, processes, and other information provided in this

document.

YOU ARE SOLELY RESPONSIBLE FOR THE TESTING AND

ASSESSMENT OF YOUR OPERATIONS, PRODUCTS AND

SERVICES, AND FOR ANY INFORMATION WHICH YOU MAY

SUPPLY TO GM, OR TO ANY OTHER PARTY, REGARDING THE

“YEAR 2000”

Table of Contents

1. EXECUTIVE SUMMARY (5)

1.1 I NTRODUCTION (5)

1.2 Y EAR 2000 I NFORMATION O VERVIEW (7)

1.3 D OCUMENT H ISTORY (8)

1.4 T RANSLATIONS (8)

1.5 D OCUMENT C OMMENTS (8)

1.6 S YSTEM M ODELS & C OMPONENT T YPES (9)

1.6.1 HMI (9)

1.6.2 Weld Controller (9)

1.6.3 Instrumentation (10)

1.6.4 Specialized System (10)

1.6.5 Motion Control (10)

1.6.6 PLC (10)

1.6.7 Information Co-Processor (11)

1.6.8 Robot (11)

1.6.9 CNC (11)

1.6.10 Vision System (11)

1.6.11 BIOS (12)

1.6.12 PC/Micro/Mini (12)

1.6.13 Software (12)

1.6.14 Software Custom (13)

1.6.15 Mainframe (13)

1.6.16 Voice (13)

1.6.17 Video (13)

1.6.18 Data Comm (13)

1.7 G LOSSARY (14)

1.8 R EFERENCES (17)

1.9 T ESTING T OOLS (18)

1.9.1 PC Compatibles (18)

1.9.2 Industrial Controllers (18)

2. TEST PLANNING (19)

2.1 W HAT TO T EST (19)

2.1.1 Resource Availability (19)

2.2 W HICH T ESTS A PPLY (19)

2.3 C OMPONENT T EST P LANNING (21)

2.4 C OMBINED C OMPONENT T EST P LANNING (21)

2.5 S YSTEM T EST P LANNING (22)

2.6 C LUSTER (I NTEGRATION) T ESTING P LANNING (22)

2.7 C ROSS C LUSTER (E NTERPRISE) T EST P LANNING (23)

2.8 G ENERAL T EST E XECUTION C ONSIDERATIONS (24)

2.8.1 Pre-Test (24)

2.8.2 Testing (24)

2.8.3 Post-Test (25)

2.9 D OCUMENTATION (26)

2.9.1 Test Setup (26)

2.9.2 Test Procedures (26)

2.9.3 Test Results (26)

2.9.4 Skill Sets Required (26)

2.9.5 Equipment Required (26)

2.9.6 Tools Required (26)

3. TEST PROCEDURES (27)

3.1 T ESTING S UMMARY (27)

3.1.1 Critical Date Values for Year 2000 Testing (27)

3.1.2 Identifying Date Fields (28)

3.2 R OLLOVER, R EBOOT, D AY OF W EEK T ESTS (28)

3.2.1 Rollover - 1999 to 2000 - Power on (28)

3.2.3 Reboot - Date retention (29)

3.2.4 Rollover - 1999 to 2000 - Power Off (29)

3.3 M ANUAL D ATE S ET T EST (29)

3.3.1 Date Set - 1 Jan 2000 (29)

3.3.2 Date Set - Date retention (29)

3.3.3 Date Set - 29 Feb. 2000 (30)

3.4 L EAP Y EAR T EST (30)

3.4.1 Leap Year - Rollover 2/28 - Power On (30)

3.4.2 Leap Year - Reboot 2/29 (31)

3.4.3 Leap Year - Rollover 2/29 - Power On (31)

3.5 D ATE W INDOW T ESTS (31)

3.5.1 Date Window Test - Below Limit (31)

3.5.2 Date Window Test - Above Limit (31)

3.5.3 Date Window Test - Change Limit (31)

3.6 O THER D ATE R EPRESENTATION T ESTS (32)

3.6.1 DOY - 29 February 2000 (32)

3.6.2 DOY - 31 December 2000 (32)

3.6.3 DOY - Invalid Dates (33)

3.7 A RITHMETIC D ATE T ESTS (33)

3.7.1 Days in 2000 (33)

3.7.2 Days across 1999/2000 Boundary (33)

3.7.3 Days across leap year (33)

3.8 U PLOAD / D OWNLOAD T ESTS (33)

3.8.1 Upload (33)

3.8.2 Download (34)

3.9 S PECIAL V ALUE T EST (34)

3.10 F ILE OR D IRECTORY C REATION T EST (35)

3.10.1 File - Creation 2000 (35)

3.10.2 File - Replacement 1999-2000 (35)

3.10.3 File - Replacement 2000-2000 (35)

3.11 A UDIT L OG T EST (35)

3.11.1 Audit Log (35)

3.12 R EPORT T ESTS (36)

3.12.1 Report - Query (36)

3.12.2 Report - Sort (37)

3.12.3 Report - Merge (37)

3.12.4 Report - Search (37)

3.13 L OG FILE PURGE T EST (37)

3.14 T IMER T EST (38)

3.15 I NPUT D ATA T EST (38)

3.16 O UTPUT D ATA T EST (38)

3.17 A CTIVATION/D EACTIVATION T ESTS (38)

3.17.1 Valid access (38)

3.17.2 Expired access (39)

3.18 D ISPLAY D ATA T ESTS (39)

3.18.1 Display Data Test (39)

3.19 I NDIRECT D ATE U SAGE T ESTS (39)

3.20 C YCLE T ESTING (39)

3.21 S TRESS T ESTING (41)

3.22 R EGRESSION T ESTING (41)

4. YEAR 2000 CERTIFICATION PROCESS (41)

5. APPENDIX (42)

5.1 T EST P LAN C ONSIDERATIONS (42)

5.1.1 General Integrity (42)

5.1.2 Date Integrity (42)

5.1.3 Explicit First 2 Digits of Year (43)

5.1.4 Implicit First 2 Digits of Year (44)

5.2 Y EAR 2000 T ESTING R EPORT F ORMS (45)

5.2.2 Year 2000 Component & Combined Component Test Report Instructions (47)

5.2.3 Front (47)

5.2.4 Back (48)

5.2.5 Technical & Commercial Info (48)

5.2.6 Year 2000 System Test Report Instructions (53)

5.2.7 Front (53)

5.2.8 Back (55)

5.2.9 Technical & Commercial Info (55)

5.3 Y EAR 2000 S ITE OR P LANT / B UILDING N OTEBOOK (60)

5.4 S AMPLE S ITE OR P LANT T EST P LAN (60)

5.4.1 Body Shop (60)

5.5 S AMPLE A M ANUFACTURING S YSTEM T EST P LAN (61)

5.5.1 System Name : (61)

5.5.2 Component A (Weld Controller) Procedures (61)

5.6 S AMPLE B M ANUFACTURING S YSTEM T EST P LAN (62)

5.6.1 System Name : (62)

1. Executive Summary

The objective of the Year 2000 Test Procedures document is to:

?Introduce the process of testing software

?Publish a set of procedures and test cases for Year 2000 testing

?Formalize the vocabulary of the testing teams

?Formalize the process for reporting test results

?Publish testing references and test tool recommendations

The General Motors Year 2000 test team has developed this base document from several sources and pilot experiences. The test cases included are based on industry wide information and actual Year 2000 problems encountered during the pilot process. These test procedures can be used to test commercial off the shelf components and systems assembled from those components.

1.1 Introduction

This document contains information about year 2000 testing in several sections and an appendix. The first section contains an overview of the document, document history, a year 2000 glossary, and references. A diagram illustrates the relationships between the year 2000 inventory and test documents. The second section contains guidelines for planning testing activities. The third section contains test procedures for components and systems. The fourth section addresses the process for year 2000 compliance. The appendix contains a list of test planning considerations, sample test plans, and forms for reporting test results.

Testing systems will require judgment and knowledge of the system under test. Careful documentation of all testing will be necessary due to the large number of systems each engineer is responsible to maintain. When problems are discovered careful documentation will allow the supplier of the system or other teams to re-create the problem for analysis and /or corrective action as required.

All computing / control / information processing systems are constructed using standard or commercial off the shelf (COTS) components in combination with some custom software or configurations. The GM Year 2000 project is oriented around an inventory based on a standard naming convention for these COTS components in order that the results of testing can be shared. Sharing to both reduce duplicate effort and increase awareness of the problem. A basic assumption of the component inventory method is that “mass produced” components have shareable test results, this assumption must be questioned often, and in the case of modern PC’s has been found to be a bad assumption. In practice we have found that all PC’s must be tested where vital to operations.

Please take the time to skim the entire document. Some have followed the testing procedures without understanding that judgment must be exercised to decide which tests apply to a specific component or system. Time spent planning will be paid back many times, the test procedures are not organized in the most efficient order for actually performing the tests.

An alternative to testing is to review the computer code and look for problems manually or with another computer program. This is a popular method in the COBOL environment and many tools exist specifically for the purpose of finding Year 2000 problems in COBOL programs. This method can be adapted to the controls environment and the test team is currently investigating tools and processes for bench testing or code review in the controls environment. Code for a specific PLC can be examined to see if the year function or register is being used by cross reference listings, others may have specific configuration blocks which must be setup for the date to be used. Where these methods prove out a large reduction in test effort can be reduced to simply bench testing the PLC code. Some suppliers are developing programs to scan the logic for their more popular products, as information is collected a new section will be developed.

1.2 Year 2000 Information Overview

The following diagram illustrates the relationship between inventory and testing information. The detailed inventory information is used during the assessment process to identify systems which require testing. The test planning guidelines and testing procedures are used to create an overall test plan which may contain or reference test plans for each individual system. Test reports are used to record the tests performed. Combined Component test reports are logged for sharing in the Y2K repository. System test reports are unique to the operation where performed. System test reports may be shared to provide examples of Year 2000 failures, but can not be applied to other systems. One assumption which must be understood, “mass produced components are interchangeable and the test results will be the same.” This assumption is valid in many cases, but many software based products are revised without visible indications. A common example is the BIOS for a PC which is loaded into EEPROM (electrically erasable programmable read only memory) and can be updated easily.

1.3 Document History

The following table summarizes changes to this document.

Date of Revision Revision Summary

May 30, 19970.0Initial Draft Release for comments

July 15, 19970.1Release for comments after NAO Pilot

August 8, 1997 1.0Release to All Plants

September 15, 1997 2.0Draft incorporating input from GME Pilot incorporates

combine component concepts

September 26, 1997 2.1Insert Legal disclaimer & Executive summary

March 15, 1998 3.0Incorporate feedback and update test report forms. Included

new tests; cycle testing, regression, and stress.

1.4 Translations

The following table documents the currently available translations of this document and the current root version. Please contribute any new translations to the author via e-mail. The base document is in MS Word 6 format for general compatibility.

Language Root Version Filename

English Version 3.0tstver30.doc

German Version 2.1tstv21de.doc

Spanish Version 2.1tstv21sp.doc

Polish Version 2.1tstv21po.doc

Hungarian Version 2.1tstv21un.doc

Portuguese Version 2.1tstv21pr.doc

1.5 Document Comments

The following table documents the authors of this document. All comments should be returned to the current authors for incorporation into successive versions. All comments for the next release of this document must be received 2 weeks prior to the expiration date in the footer of this document.

Name of Author David Barber

Lotus Notes David Barber@US_DET_BPKN02

Internet Email Address LNUSBPK.CZP3M5@https://www.doczj.com/doc/b09523096.html,

Phone(313) 667-4811

Name of Author Joseph Buffa, II

Lotus Notes Joseph Buffa@US_GM_DET_BPK01

Internet Email Address LNUSBPK.PZWYNW@https://www.doczj.com/doc/b09523096.html,

Phone(313) 667-4544

1.6 System Models & Component Types

Systems are modeled in the Year 2000 inventory as a collection of components. The component based model has been adopted in an attempt to identify and share information about Year 2000 problems. In some cases a single component may not be testable standalone, but rather in combination with other components. This is the combined component concept, for example a PC with a BIOS and Operating system. The following sections describe the component types typically used to construct control / computer / or information processing systems. This information provides examples of how components may be affected by Year 2000 problems and is used in the matrix of which tests apply. As the complexity of a system increases, the probability increases that a date related problem exists. For the purpose of defining test requirements, components are grouped in the following component types:

?HMI

?Weld Controller ?Instrumentation ?Specialized Systems ?Motion Control

?PLC

?Information Co-processor ?Robot

?CNC ?Vision System ?BIOS

?PC/Micro/Mini ?Software ?Software-Custom ?Mainframe ?Voice

?Video

?Data Comm

This list is ordered generally by increasing level of complexity of component type and the level of testing required. It is not practical to test a complex system 100%, but a reasonable effort can be made to identify Year 2000 problems with a limited number of test case scenarios. ( See section 2.2 Which Tests Apply )

1.6.1 HMI

The Human Machine Interface (HMI) component type includes devices dedicated to display or input data. Increasingly intelligent HMI’s built using PC’s should be tested as PC’s and HMI’s that do not include PC’s should be tested as HMI’s. ( See section 1.6.12 PC/Micro/Mini )

Examples include:

1.Allen-Bradley PanelView 550, 900, 1200

2.Cutler-Hammer IDT PanelMate

3.Unipo

1.6.2 Weld Controller

The weld controller component type includes any controls related to welding, weld timers, weld controllers, stud welders.

Examples include:

1.Pertron Paragon G

2.Bosch PS2081

1.6.3 Instrumentation

The instrumentation component type includes data loggers, remote instrument transmitters, and analytical instruments in quality laboratories. Examples of integrating sensors that used the full date in time based calculations have been identified with year 2000 problems.

Examples include:

1.Promess EPR 12006

2.Leeds & Northrup Speedomax

1.6.4 Specialized System

The specialized system component type includes control systems which are designed and manufactured to solve a specific problem. Controls are single purpose and only allow for configuration and no programming. The number of Year 2000 problems for this class is expected to be low. However there have been problems with time stamped printouts failing to function correctly on weigh scales, and fire alarm systems which no longer report fires after the year 2000.

Examples include:

1.Wheel Alignment System

2.Head Light Aim System

3.Tire Balancing Equipment

4.Single Loop Controllers

5.HVAC controllers

6.Weigh scales

1.6.5 Motion Control

The motion control component type includes AC drives, DC drives, servo systems, and single axis controllers. There is a reported Year 2000 problem with a SERCOS drive controller card.

Examples include:

1.Allen-Bradley IMC110, 1336 AC Drive

2.GE Fanuc D3B, DC300

3.Modicon Quantum Sercos Controller

1.6.6 PLC

The Programmable Logic controller (PLC) component type, (or in Europe step process controllers - SPCs) are normally programmed in ladder logic and must have a custom application program. Most PLC controllers are Year 2000 compliant, but each controller contains a custom application program which may or may not handle date information correctly. During the inventory PLC’s should be surveyed for information co-processors.

Examples include:

1.Allen-Bradley PLC-5/40C

2.Modicon 984

3.Bosch CL500

1.6.7 Information Co-Processor

The information co-processor component type contains intelligent sub-systems or control modules which are used in PLCs or other modular systems which are designed for expansion.

Examples include:

1.CPU modules (Bosch ZS500)

2.Basic modules (Allen-Bradley 1771-DB)

3.ASCII modules (Allen-Bradley 1771-DA)

4.Real-time clock modules (Allen-Bradley 1771-DC)

5.Co-processor modules (Allen-Bradley 1771-DMC)

https://www.doczj.com/doc/b09523096.html,munications modules (Bosch DB500, Bosch RM500)

1.6.8 Robot

The robot component type includes complex motion controller which is optimized to translate tool path data into the required motion on non-orthogonal joints, some models include a PC in the control for user interface and networking. The inventory should include the robot controller, not the mechanical arm model and version.

Examples include:

1.ABB S3

2.ABB S4/PC

3.Fanuc RH, RJ, RJ-2

1.6.9 CNC

The Computer Numerical Controls (CNC) component type includes motion controls which process a part program to define part geometry and machine motion. Most modern CNC’s include a 3.5” floppy drive with associated PC compatible file system. Fault logging functions which time stamp the occurrence of machine faults are standard features. Many CNC’s are used in an environment where part programs are downloaded for every part which is processed. Typical CNC’s have PLC style logic which is used to “marry” the control to a specific machine configuration, the part-program interpreter, real-time motion control, and even graphical part-programming support functions.

Examples include:

1.GE Fanuc SERIES 15-M, SERIES 18-TB

2.Allen-Bradley 8600, Series 9/260

3.Okuma OSP 5020M/L

1.6.10 Vision System

The vision system component type includes dedicated vision systems which may be assembled from other components. If the other components at identifiable by supplier, model, and version list the individual items also.

Examples include:

1.Perceptron 1500

2.Allen-Bradley VIM2

1.6.11 BIOS

The Basic Input Output System (BIOS) component type is included to emphasize the source of several Year 2000 related problems. It may be possible to resolve some year 2000 problems by upgrading the BIOS. The BIOS of a PC can be obtained using special PC programs or during the boot sequence on older, slower PC’s. Some operating systems can display the BIOS supplier, model, and version

Examples include:

1.Award Modular 4.40

2.Phoenix 8D 486 V1.10

3.AMI 3.03

1.6.12 PC/Micro/Mini

The PC/Micro/Mini component type includes all computer systems from micro-computers to mini-computers. During the inventory process the PC BIOS, operating system, and other software should be listed where known as individual components. This is by far the most likely type of system to have Year 2000 related problems. The combination of PC hardware real-time clock (RTC), a BIOS, and operating systems is frequently present. Recently PC’s are used more with PLC application programs. Mini computers are used as well as PC’s. Documenting a control system that uses a combination of hardware and software with different versions and implementation tools may be of little use unless the information can be used to identify known problems and share information about the problems and solution. The effect of Year 2000 problems within unique Computer based Controls must be fully documented and tested where possible to ensure any Year 2000 problem is minimized.

Examples include:

1.DEC VAX 11/780, PDP-11/44

2.HP 9000/G40, HP1000, HP3000

3.IBM PC/AT, Compaq Deskpro 450

4.Texas Micro D486

1.6.13 Software

The software component type includes operating systems, software packages, and software tools used to support systems. Typical software packages are database, graphics, and specialized data collection packages. Software tools include compilers, assemblers, code management systems, ladder logic programming tools, and PLC status monitoring programs. Application software packages such as Wonderware or P-CIM have known problems dealing with the Year 2000 date transition. All packages are also potential problem areas including runtime libraries used to build an application. Some of the known problems for software packages include: locking up completely at the Year 2000 rollover, failing to write historical data after Year 2000, and incorrect sorting of alarm or history data after the year 2000.

Examples include:

1.Wonderware In-Touch 5.0b

2.Bosch MADAP

3.Microsoft Windows NT 3.51

1.6.14 Software Custom

The software custom component type includes any custom software used to support systems. Custom software programs are ladder logic programs, robot control applications in KAREL, and computer programs written using any programming language.

Examples include:

https://www.doczj.com/doc/b09523096.html,dder Logic Programs

https://www.doczj.com/doc/b09523096.html,puter Programs

?Custom software written for a specific system exists in PLC’s, Robot Controllers, CNC’s, and computers. By definition these custom applications present a risk since they are normally unique and therefore fall into the

unknown compliance category.

1.6.15 Mainframe

The Mainframe component type is included to capture large scale computing hardware.

1.6.16 Voice

The Voice component type is included to capture any computer equipment associated with the telephone or voice communications systems.

1.6.17 Video

The Video component type is included to capture any computer equipment associated with the video monitoring or communications systems.

1.6.18 Data Comm

The Data Comm component type is included to capture any computer equipment associated with the data communications or networking infrastructure.

1.7 Glossary

The following list of words may have special meaning in the context of the Year 2000 project or this document.

WORD or Phrase Definition

Application A set of computer programs designed for a particular function or set of

functions.

Black Box Testing Test case selection is based on an analysis of the specification without reference

to the internal workings of the component under test, also called functional

testing.

Calendar errors Errors typically include failing to treat 2000 as a leap year and converting

incorrectly between date representations.

Clock There is hardware or software time functionality contained in the component.

No calendar or date functionality exists; although time or timer functions are

present. eg. day-of-week (7 day counter), hours, minutes, or seconds, but not

day-of-year or date.

Cluster A cluster is a logical grouping for testing of systems that constitute a complete

manufacturing or business process, any set of cooperating computing systems.

e.g. Body Framing, Production Scheduling, Material Management. Combined Component Any grouping of Components for efficent testing. A Combined Component

may have two or more date/time functions that can affect test results. (e.g. BIOS

& PC Hardware)

Common System Internal General Motors terminology for an application that has been approved

as the corporate standard for accomplishing a given set of functions. Compliance"Year 2000 compliance means that neither performance nor functionality is

affected by dates prior to, during and after Year 2000. Compliance will be

demonstrated when the criteria of General, date, and century integrity are

satisfied."

Component Any standalone, computer-based, commercial off-the-shelf hardware device or

software package; or custom software application. A single date/time function

that can be isolated for test results, smallest unit of testing for the year 2000

project. (See Combined Component)

COTS Commercial off-the-shelf, an acronym commonly used in government

procurement, something which can be purchased as a standard product. Critical Date Any date value identified for testing, for example 1-1-2000.

Cross Cluster Testing The highest level of integration testing which is organized around a particular

function or across functions. Also called Enterprise Testing. An example is the

processing of an order for a product through to product delivery.

Date Field Any variable or constant that can contain date information.

Date Function The inventory item has a calendar, day, or date functionality. Timers or counters

may be present without calendar or date.

Date Horizon The time at which a critical date will occur.

Date Integrity All manipulations of calendar-related data (dates, duration, days of week, etc.)

will produce desired results for all valid date values within the application

domain.

Date Overflow Many software products represent dates internally as a base date/time plus an

offset in days, seconds, or microseconds since that base date/time. Hardware

integers holding the offset value can overflow past the maximum corresponding

date—an event which may lead to undefined behaviors.

Enterprise Test Test of ability to execute specific business process or scenario in a Y2K

compliant environment.

Explicit first 2 digits of year Date elements in interfaces and data storage permit specifying the first 2 digits

of the year to eliminate date ambiguity.

Extended Semantics In general, specific values for a date field are reserved for special interpretation.

The most common example is interpreting "99" in a 2-digit year field as an

indefinite end date, i.e., "does not expire." Another is embedding a date value

in a non-date data element.

First 2 digits of year ambiguity This is the most common element. Software represents dates with a 1- or 2-

digit year. When software does not recognize that dates are not all in the 19xx

range, the results are undesirable.

General Integrity No value for current date will cause interruptions in normal operation. Gregorian Calendar Revision of the Julian calendar in 1582 by Pope Gregory XIII, adopted by the

US and Great Britain in 1752. Added that centesimal leap years must be

divisible by 400 rule and suppressed 10 or 11 days during 1700.

Implicit first 2 digits of year For any date element represented without the first 2 digits, the correct first 2

digits is unambiguous for all manipulations involving that element. Inconsistent Semantics At interface between systems, software on each side assumes semantics of data

passed. Software must make same first 2 digits of date assumptions about 2-

digit years.

Integration Test Test applied to a collection of systems.

Interface A communications path or connection from component to component, or

system to an external system.

Interval Of Interest Time range associated with a particular date field, real-time systems typically

have short intervals of interest (minutes) , financial systems longer intervals of

interest (years).

Julian Calendar Introduced in Rome in 46 B.C. established 12 month year of 365 days with

every 4th year having 366 days.

Julian Date Julian Date (JD) is the number of days since Noon 4713 BC plus the fractional

part of a day for the time of day past Noon.

Leading Date Horizon Leading date horizons are the forward time difference from the current time

until last date value of a date field crosses a critical date.

Modified Julian Date Modified Julian Date (MJD) is the Julian Date minus 2,400,000.5 which

reduced the size of the number of days to 5 digits and shifted the beginning of

the time of day to Midnight. For 1997, the MJD is 50448 + DOY (day of year). Readiness Test Test applied to a suite of components or units in a Y2K compliant environment. Real-time Clock A battery operated clock which keeps time when the system is powered off. Regression Testing Re-testing a system after modification to ensure that no new faults are

introduced. The test uses the same data sets before and after to verify by

comparison that the outputs are identical.

System A system is a logical grouping of components, combined components, and / or

systems for testing that control a manufacturing process, or support a business

function. (e.g. Welding Cell Controls, Quality Control Computers, Client/

Server Application )

System Test Test applied to a system.

Test Case A test case is a documented test procedure with specific input data and expected

test results. Example - rollover Dec 31, 1999.

Test Plan A test plan is a documented set of test cases and test scripts.

Test Procedure A test procedure is a step by step description of the test to be performed.

Example - rollover.

Trailing Date Horizon Trailing date horizons are the backward time difference from the current time to

the first time a date value for a date field crosses a critical date.

Unit A Unit (component) is the minimum recognizable level to which equipment

containing a date/time function or processor can be broken down. The

Inventory will be composed of multiple Units or components.

Unit Test Test applied at the component or unit level.

Virtual Clock A software based clock used in some operating systems to maintain the time as

an operating system service.

White Box Testing Test case selection is based on an analysis of the internal workings of the

component under test, also called structural testing.

Year 2000 Ready (Y2K Ready)The inventory item is Y2K Compliant or the non-compliance is understood and

deemed acceptable and no further remediation will be completed.

1.8 References

The following list of references are pertinent to the year 2000 project.

1.ANSI X3.30 - Formatting Date Data

2.FIPS-4-1 (Revised 1996-03-25) - Federal or DoD procurements

3.ASC X12 EDI draft std for trial use, ISO 9735, UN/EDIFACT - Electronic commerce (EDI)

4The Modified Julian Date (MJD) has been officially recognized by the International Astronomical Union (IAU), and by the Consultative Committee for Radio (CCIR), the

advisory committee to the International Telecommunications Union (ITU). The

pertinent document is

CCIR RECOMMENDATION 457-1, USE OF THE MODIFIED JULIAN DATE BY THE STANDARD

FREQUENCY AND TIME-SIGNAL SERVICES.

This document is contained in the CCIR "Green Book" Volume VII.

5.The Almanac for Computers also provides information on JD & MJD.

6.Additional, extensive documentation regarding the Julian Date (JD) is contained in the Explanatory Supplement to

the Astronomical Ephemeris and Nautical Almanac, and in the yearbooks themselves, now called The Astronomical Almanac.

7.Testing Very Big Systems; David Marks, McGraw Hill 1992, ISBN 0-07-040433-X

8.Software Testing; Marc Roper, 1994, ISBN 0-07-707466-1

9.Testing Computer Software; Kaner, Tab, 1988, ISBN 0-8306-9563-X

10.Software Testing in the Real World, improving the process; Edward Kit, Addison-Wesley, 1995, ISBN 0-201-

87756-2

11.Software Testing A Craftsman’s Approach; Paul C Jorgensen, 1995, ISBN 0-8493-7345-X

12.IEEE Standard for Software Verification and Validation Plans (ANSI/IEEE Standard 1012-1986)

13.IEEE Standard 829-1983 for Software Test Documentation (updated 1991)

14.IEEE Draft Standard 2000.1 Year 2000 Terminology ( early 1998 )

15.IEEE Draft Standard 2000.2 Year 2000 Test Methods ( early 1998 )

16.BCS Standard for Software Component Testing Draft 3.3, April 1997

17.IEE Embedded Systems and Y2K

1.9 Testing Tools

For a list of potential testing tools please refer to the General Motors corporate Y2K Library.

1.9.1 PC Compatibles

Tools have been choosen that General Motors will use to test “PC Hardware” for Y2K compliance. Please refer to the General Motors corporate Y2K Library for the latest versions of these tools.

1.9.2 Industrial Controllers

At this time no test programs have been identified which apply to industrial controls. Several may be in development for scanning PLC programs for potential year 2000 problems. ( Please send information to the author about this subject.)

2. Test Planning

This section of the document provides guidelines for writing specific test plans. Example test plans for plants or sites and individual systems are included in the appendix. The resources required to conduct the tests are also described. Testing shall be conducted on large systems using the divide and conquer method. Unit testing addresses the smallest division for which tests are reasonable, the number of test cases is smaller and the likelihood of finding all the errors is increased. Once a unit has been tested, integration testing begins by assembling larger systems from tested units. At this level the number of test cases may increase and the likelihood of finding all the Year 2000 errors decreases. Balance and judgment are required of the test designer to select the system boundaries and appropriate test cases. Systems which are unique may share many common components and similar architectures. Two systems using identical hardware in a similar architecture may have different applications and use date related functions in completely different ways requiring separate testing.

Testing Levels:

https://www.doczj.com/doc/b09523096.html,ponent testing, testing a single component controller or application in isolation

https://www.doczj.com/doc/b09523096.html,bined Component testing, testing an assembly of standard components and custom application programs or

configurations

3.System testing, testing a collection of Combined Components and Components which are assembled into a complete

system. An example is a welding cell with PLC’s, Robots, HMI’s, PC’s, and weld controllers. Readiness Testing is System Testing in a Y2K compliant environment.

4.Cluster (Integration) testing, testing a collection of Systems and Common Systems and / or Business Systems that

constitute a complete process. An example is a test of the paint shop systems taken as a whole including the interfaces to any higher level support or scheduling systems.

5.Cross Cluster (Enterprise) testing, the highest level of integration testing where the test cases are organized around

specific functions, or across functional boundaries. An example is the entire process of Automobile Order through Automobile delivery.

2.1 What to Test

Prioritize test scheduling based on the inventory of controls and computers to identify the most suspect components or systems. Suspect components are those with unknown or undocumented testing results. Components that are part of a system that shares date information or that uses date information for product marking in the manufacturing process (encoded date information) should be considered suspect. Unique systems which have been locally built and programmed must be tested individually, test results for commercial off the shelf hardware or software may be shared industry wide.

2.1.1 Resource Availability

Evaluate the required resources prior to scheduling the tests:

?The system is available, not in production

?The system cannot be tested in a lab environment

?The system is functional and can be dry cycled

?Ease of dry cycle operation may influence choice of cell where similar systems exist

?Appropriate personnel are available to oversee and conduct the testing

?External Systems interfaces can be disconnected, simulated, or modified for testing purposes

?Backup has been performed prior to testing

?Support personnel are available as required

?CPU time or storage capacity available for test execution and test data storage

2.2 Which Tests Apply

The following test procedures are intended to provide a baseline for Year 2000 testing to ensure consistent and repeatable results. These tests apply to standard control components and software as well as custom applications. A matrix of component type and tests contains a recommended set of tests to perform on a particular system or standard component. These are only a recommendation. The tester should review these tests to determine which apply to the specific component or system.

( For System, Cluster, and Cross-Cluster testing careful consideration should be given to section 5.1 )

Component Type HMI Vision System

Instrumentation Specialized

System

PLC Robot PC/

Micro/

Software

Section Test Name Motion Control

Weld Controller

Mainframe

Voice

Video

DataComm

Information

Co-Processor CNC

Mini

BIOS

Software

Custom

3.2Rollover, Reboot, Day of Week

Tests

X X X X X X X 3.3Manual Date Set Test X X X X X X X 3.4Leap Year Test X X X X X X X 3.5Date Window Tests X X 3.6Other Date Representation Tests X 3.7Arithmetic Date Tests X X 3.8Upload / Download Tests X X X X X 3.9Special Value Test X X 3.10File or Directory Creation Test X X X X X 3.11Audit Log Test X X 3.12Report Tests X X 3.13Log file purge Test X X 3.14Timer Test X X X 3.15Input Data Test X X X X 3.16Output Data Test X X X X 3.17Activation/Deactivation Tests X 3.18Display Data Tests X X 3.19Indirect Date Usage Tests X X X X X 3.20Cycle Testing X 3.21Stress Testing X X 3.22Regression Testing X X 5.1Test Plan Considerations X X Legend : X - Recommended Test

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