Document No. D11220EJ1V0DS00 (1st edition)
Date Published June 1996 P
Printed in Japan
1996
2
SWITCHING TIME MEASUREMENT CIRCUIT AND CONDITIONS (Resistive Load)
V in
Duty cycle ≤ 1 %
L
V DD
2SK1824
3
TYPICAL CHARACTERISTICS (T A = 25 ?C)
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
10080604020
0206080140160T C - Case Temperature - ?C d T - D e r a t i n g F a c t o r - %
40120100TOTAL POWER DISSIPATION vs.AMBIENT TEMPERATURE
2001601208040
0306090180
T A - Ambient Temperature - ?C P T - P o w e r D i s s i p a t i o n - m W
1203.0 cm 2 × 0.64 mm
Using ceramic substrate
240
TRANSFER CHARACTERISTICS
10010
1.0
0.1
0.01
0.001
V GS - Drain to Source Voltage - V
I D - D r a i n C u r r e n t - m A
300FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
200100502010I D - Drain Current - mA
|y f s | - F o r w a r d T r a n s f e r A d m i t t a n c e - m S
600
25DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
V GS - Gate to Source Voltage - V
R D S (o n ) - D r a i n t o S o u r c e O n -S t a t e R e s i s t a n c e - ?
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
I D - Drain Current - mA
R D S (o n ) - D r a i n t o S o u r c e O n -S t a t e R e s i s t a n c e - ?
4
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
I D - Drain Current - mA R D S (o n ) - D r a i n t o S o u r c e O n -S t a t e R e s i s t a n c e - ?
3010
3
0.5
V DS - Drain to Source Voltage - V C i s s , C o s s , C r s s - C a p a c i t a n c e - p F
501CAPACITANCE vs.
DRAIN TO SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
300100
30
100
10
30
100
300
I D - Drain Current - mA
t d (o n ), t r , t d (o f f ), t f - S w i t c h i n g T i m e - m s
V DD = 5 V V GS = 5 V R in = 10 ?
t d(off)
t f
t r
t d(on)
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
2003030.3
0.40.60.9 1.1
V SD - Source to Drain Voltage - V
I S D - D i o d e F o r w a r d C u r r e n t
1001010.10.3
0.50.70.8 1.0V GS = 0Pulsed
REFERENCE
Document Name Document No.
NEC semiconductor device reliability/quality control system TEI-1202
Quality grade on NEC semiconductor devices IEI-1209 Semiconductor device mounting technology manual C10535E
Guide to quality assurance for semiconductor devices MEI-1202 Semiconductor selection guide X10679E
5
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard:Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special:Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific:Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11