Licensing the PDF and ICDD Software
ICDD database and software products are licensed for use on a single PC. Database and software licenses grant end users a limited, nonexclusive and nontransferable license to access the contents of the product for personal or internal business purposes; and to download such contents on the hard drive of a single computer as needed to facilitate data processing. Products cannot be installed, accessed or dis-played on more than one PC without purchasing additional licenses. Use on a network server is expressly prohibited. License terms vary by product. Please see page 7 for infor-mation on WebPDF4+ licensing.
License Terms
Product License Term
PDF-2 5 years
DDView 5 years
ICDD Suite (DDView/SIeve) 5 years
PDF-4 products* 1 year
SIeve+ 1 year
*Serviced by subscription featuring automatic annual renewals. For further licensing information, please visit:
https://www.doczj.com/doc/2b4971863.html,/licenses/index.htm
Product Pricing and Policies
Academic Pricing
An academic price is awarded to degree-granting (Assoc., B.S., M.S., Ph.D.) institutions. The name of the institution must appear on the degree in order to qualify for the academic pricing. Insti-tutions may be required to submit documentation to verify eligibility. Please consult ICDD’s price list for eligible products. Multiyear License Renewal
ICDD offers multiyear license renewal pricing that provides savings on yearly license renewals, along with fixed pricing on the renewal for the purchased license term. Multiyear pricing is available for PDF-2, PDF-4+, WebPDF-4+ and PDF-4/Organics. If the price for these products increases during your multiyear license period, you will not be billed the difference.
In response to customer requests, ICDD is offering multiyear license renewal pricing for PDF-4/Minerals. The multiyear license is offered as a convenience to our customers and is not subject to the discount offered with our other multiyear licenses. Please contact ICDD’s Customer Service Depart-ment for further information.
To purchase a multiyear license, users need to purchase the current release of the PDF new, or renew their license to the present release using the current https://www.doczj.com/doc/2b4971863.html,ers may then purchase additional years for their license. All shipping charges will be billed on the original invoice. The multiyear license is serviced by subscription with yearly automatic renewals based on the anniversary of the original invoice date for both the PDF-2 and PDF-4 databases.
Since ICDD’s support software (ICDD SUITE and SIeve+) is linked to the PDF-2 and PDF-4 release year, customers utilizing this software are encouraged to purchase a multiyear license for the software along with their multiyear license for the database. Check with your software vendor annually to confirm software compatibility when purchasing a multiyear license.
Site License Policy
ICDD’s Site License Policy is designed for a multiuser labora-tory. This policy offers site licensing and pricing that allows for multiple copies of the PDF-2 or PDF-4+ databases to be licensed at a single site. Site licenses for PDF-4/Organics cannot be combined with PDF-2 or PDF-4+ databases. The site license pricing offers a discounted price on additional copies. A single site is defined by the building where the database will be installed. Multiple users in different sites (separate buildings) need to purchase separate site licenses for each building. Each site license allows for a maximum of 10 copies of the database. The number of copies is determined by the number of computers that will be running the database. An additional site license is required after the 10th copy of the database. A site license includes the purchase of a Master License, plus the purchase of Secondary Licenses (additional copies—2nd to 10th). ICDD requires that the Master License and all Second-ary Licenses be purchased concurrently on a single purchase order. ICDD does not offer licensing for local servers or networks. Site License Renewals
In order to take advantage of the site license renewal pricing on additional copies, both the Master License and the Sec-ondary Licenses of the database must be renewed yearly. To renew a site license, ICDD requires that the Master License and all Secondary Licenses be purchased concurrently on a single purchase order.
Combo Site License Subscription
ICDD offers a combination site license that allows for multiple copies of the PDF-2 and PDF-4+ database licenses at a single site. The combo site license is serviced by subscription with yearly automatic renewals based on the anniversary of the original invoice date for the PDF-2 and PDF-4+ databases. ICDD will automatically bill and ship renewal licensed prod-ucts as specified in ICDD’s then current price list. Multiyear Site License
In response to customer requests, ICDD offers multiyear site licenses. The multiyear site license is offered as a conven-ience to our customers using site license pricing. This license is serviced by subscription and is available for a PDF-2 site, a PDF-4+ site and a combo PDF-2/PDF-4+ site. Multiyear site licenses for PDF-4/Organics can not be combined with PDF-2 or PDF-4+ databases. Please contact IC DD’s Customer Service Department for further information. Product Installation and Registration
ICDD databases require registration to comply with the legal requirements of our collaborative agreements. When renewing your PDF license, IC DD recommends that you contact ICDD or your software vendor to determine your data analysis software requirements.
ICDD products (PDF-2, PDF-4+, PDF-4/Minerals, PDF-4/ Organics, DDView, SIeve and SIeve+) are automatically activated for a temporary license period (30 days) with the initial installation. Users are required to register their data-base and/or software in order to obtain a full license from ICDD to extend beyond 30 days. The integrated registration software will guide users through the registration process. The registration information may then be sent to ICDD by the web (preferred), e-mail, fax or mail. It is recommended that this be done within the first 30 days of the temporary license period. When ICDD receives the registration infor-mation, we will create a registration key for the full license and send it to the user. A registration key will be issued within 48 hours (Monday through Friday) of receipt of the registration information. If you have not heard from us within 48 hours, kindly fax us your registration (610.325.9823) noting that it is a second request or call us at 610.325.9814. Contact ICDD for WebPDF-4+ registration.
Visit our new Registration Tutorial site:
https://www.doczj.com/doc/2b4971863.html,/resources/tutorials/registration.htm
Powder Diffraction File, DDView, SIeve, DDView+ and SIeve+ are trademarks of the JCPDS—International Centre for Diffraction Data.
The PDF Databases
Release 2008 of the Powder Diffraction File contains 594,380 unique material data sets. Each data set con-tains diffraction, crystallographic and bibliographic data, as well as experimental, instrument and sampling conditions and select physical properties in a common standardized format. The PDF’s large size and compre-hensive material coverage is achieved through ICDD’s historical sources of powder diffraction data, ICDD’s Grant-in-Aid Program, contributions, and bibliographic searches, as well as collaborations with international crystallographic database organizations (see page 3).The database is designed and produced in several dif-ferent formats in order to serve different groups of users.PDF-2is a collaborative product between ICDD, FIZ and NIST and is designed for inorganic materials analyses. Many common organic materials from the IC DD are added to this database to facilitate rapid material identification.
PDF-4+is an advanced database containing the data from both the PDF-2 and ICDD’s collaboration with MPDS. This database has comprehensive material coverage for inorganic materials and it contains numer-ous features such as digitized patterns, molecular graphics and atomic parameters. Many new features have been incorporated into PDF-4+ to enhance the ability to do quantitative analysis by any of three methods: Rietveld Analysis, Reference Intensity Ratio (RIR) method or Total Pattern Analysis.
PDF-4/Minerals is a subset of PDF-4+, which includes the new features incorporated into PDF-4+.
PDF-4/Organics is a collaborative product between the ICDD and CCDC. It is designed to identify organic and organometallic materials and also contains a few thousand inorganic materials, primarily pharmaceuti-cal excipients to help with formulation analyses and identification.
Printed Books and Indexes include ICDD’s experimen-tally collected diffraction patterns and search manuals.These materials have been produced annually for 58
years and are commonly used as reference books.
The Powder Diffraction File
Data Entry Source
2008200820082008PDF-2
PDF-4+PDF-4/Minerals PDF-4/Organics 00- ICDD 102,552102,55210,88129,65301- FIZ 98,48870,764*
12,581*
2,88802- CCDC 000308,978*
03- NIST 10,0675,123*146*2104- MPDS 0106,9635,9990
Total No. of Data Sets 211,107285,40229,607341,540New Entries in 200811,53313,1703,74629,185
Total No. with atomic coordinates 0
114,630
6,696
340
* MPDS entries, containing more data, replace duplicate reference patterns and citations from FIZ and NIST entries in
PDF-4+ and PDF-4/Minerals. PDF-4+ and PDF-4/Minerals are the only two products that contain data sources from MPDS (04-LPF). PDF-4/Organics is the sole product that contains data sourced from CCDC (02-CSD).WebPDF-4+ is equivalent to PDF-4+ accessed via the Internet.
ICDD’s Mission
To be the world center for quality diffraction data, meeting the needs of the technical community.To promote the application of materials characterization methods in science and technology, by
providing a forum for the exchange of ideas and information.
The Powder Diffraction File
?Comprehensive
?Continuous Quality Analysis and Improvement ?Designed for Material Identification ?Data Mining
Comprehensive
The Powder Diffraction File (PDF) combines data from multiple database sources to ensure comprehensive coverage of solid state materials. Materials data from around the globe are critically evaluated, categorized,and standardized to maximize your ability to identify and characterize materials. The ICDD is now entering its 58th year of annual publication. The database currently represents the collective works of hundreds of thousands of authors, thousands of publications,and 594,380 published material data sets.
The growth of the PDF is due to the contributions of several database organizations. These organizations extract and edit data from global sources on a contin-uous basis.
Collaborative partners include:
?Cambridge Crystallographic Data Centre (CCDC), Cambridge, UK—Cambridge Structural Database (CSD)
?Fachinformationszentrum Karlsruhe (FIZ),Karlsruhe, Germany—Inorganic Crystal Structure Database (ICSD)
?National Institute of Standards and Technology (NIST), Gaithersburg, Maryland
?Material Phases Data System (MPDS),
Vitznau, Switzerland—Linus Pauling File (LPF)
In total, the IC DD receives and processes approxi-mately 50,000 material data sets annually. After the ICDD editorial review, which includes quality analysis,standardization, duplicate removal and material classifi-cation, approximately 90% of the data sets are published.In Release 2008, a total of 45,437 new entries were published in PDF databases. Please see the chart on page 2 to view the database contributions by source and new entries for each database product.
The steady increase in entries and comprehensive coverage is also indicated by the increase in unique author citations. The above figure shows the number of authors contributing to each database for the last five years.
Continuous Quality Analysis and Improvement
Do you appreciate quality as much as we do? Our quality is “built-in” the Powder Diffraction File. The ICDD editorial staff standardizes the data and reviews data quality from each data source and database collaborator. All the data in each PDF product are reviewed annually by a series of automated quality
analysis programs, followed by an editor review.
050,000
100,000
150,000
200,000
250,000
300,000
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1941
1966
1971
1975
1978
1980
1982
1984
1987199119941996
1998
2000
2002
2004
2006
2008
PDF Growth
PDF-4+
PDF-4/Organics
Release Year
20,000
40,000
60,000
80,000
100,000
120,000
140,000
160,000
180,000
2004
2005
20062007
2008
Release Year PDF-2
PDF-4+
PDF-4/Organics
Author Citations
Highest quality data (Star Quality) published in PDF-4+ as a function of literature publication year. Data from all sources.
The results, shown above, demonstrate the continu-ous improvement in published data quality over time.This improvement is attributed to improvements in both the hardware and software used for diffraction analysis, as well as the development of diffraction standards and standard calibration methods. However,as shown below, there is still an abundance of low quality data in recently published global literature. Although the data shown is for PDF-4+, the trends are similar for all databases.
Lowest quality data (O and B Quality) published in PDF-4+ as a function of literature publication year. Data from all sources.
A primary function of the ICDD editorial effort is to analyze the quality of each data set, analyze the root
causes of any quality issues, and provide the analysis results to the user in the form of quality marks and specific comments in each entry’s comment section.In many cases, a low quality data set may be the only published data for a particular compound. In cases where it is not the only published data, ICDD editors provide cross-references and links to related entries.
Total number of cross-references (red) and entries with edito-rial quality comments (yellow) in PDF-4+ Releases 2006–2008.
Designed for Material Identification
C omprehensive material coverage, combined with quality review,facilitates material identification. This is because the majority of commercial search/match programs are designed to identify a material, perform a residual analysis between the reference and experi-mental data, and then perform successive identifica-tions. Improper calculation of the residual pattern, due to a poor quality or incorrect reference material, can result in failure.
Cross-references can be used to direct the user to the best quality data and/or the primary reference. Cross-references and quality marks can be used to identify the most appropriate data sets for quantitation by Rietveld Refinement or I/I c values for quantitation by
the Reference Intensity Ratio (RIR) method.
50,000
100,000
150,000
200,000
250,000
2006
2007
2008
The database contains several methods for analyzing
materials by prototype classification. Such classifica-
tions include Pearson Symbols, LPF Prototype, ICDD
Prototype, ANX formulation, Mineral and Zeolite clas-
sifications. PDF databases are designed as relational
databases, with JAVA? interfaces, to help the user
apply any or all of these classification systems in
any combination.
Complimentary analytical data can also be used with
the database through searches such as the elemental
composition search (XRF, SEM), functional group search
(IR, NMR, MS), density, color, and melting point searches. Data Mining
In addition to diffraction data, PDF entries contain
bibliographic, crystallographic, and physical property
data, as well as a series of subfile and structural
classification systems. Overall, this results in >100 different data fields for each PDF entry. Any of these
fields can be used to help users research and analyze
materials problems.
PDF databases are housed in a relational database for-
mat (Sybase?10), with JAVA? interfaces to facilitate
data mining. Our most advanced databases, repre-
sented by the PDF-4 product line, have the ability to
perform 48 different searches and display 70 different
fields using our integrated DDView+ software. The
PDF-2 product, coupled with our optional DDView
software, has the ability to perform 46 searches and
display 8 fields. New and powerful ways of analyzing
data can be achieved by combining the searches and
field displays. Statistical analysis and graphic packages
were added last year to Release 2007, so that results
can be analyzed and displayed.
Many applications for data mining can be found in the
tutorial section of the ICDD web site. In addition to the
tutorial on data mining, examples are also given in the
electron diffraction, polymorph identification, XRF and
SEM analyses tutorials.
ICDD web site: https://www.doczj.com/doc/2b4971863.html,/resources/tutorials/ PDF-4 Products
Digital Experimental Patterns—New Capability
Raw data scan (PD3 in red) as compared to the reduced d,I data pair stick pattern for PDF 00-057-0011, Zeolite A. New for Release 2008—2,682 experimental powder diffraction entries (Source 00), that contain full digital data scans of the raw data, have been added to the database. An example is shown (left column) for Zeolite A, where the data were collected and analyzed by an ICDD grantee, Stanislaw Pikus, at the University of Maria Curie-Sklodowska in Lublin, Poland. ICDD grantees have submitted raw data with their grant sub-missions for several years. These data are now being processed and published in PDF-4 products.
ICDD members and product users have requested the inclusion of full digital experimental patterns for several reasons. The most common reason includes using experimental patterns for total pattern analysis and pattern fitting routines for quantitative analysis. Another significant reason for adding digital experimental pat-terns is that they can be used as reference materials for non-crystalline, semi-crystalline and amorphous materials, which are poorly described by crystalline models, yet can display characteristic and reproducible diffraction patterns. In the case of Zeolite A (left column), an experimental calculated pattern would not significantly deviate from the experimental data, because the material is crystalline. An example of devi-ation is shown below for the mineral, montmorillonite, a layered clay, which has been extensively studied. Here the interlayer d-spacings can vary as a function of chemical composition and specimen treatment. In addition, crystallite sizes vary from sub-micron to nano. Raw data scan for montmorillonite. Sample collected in Otay, California and analyzed at Pennsylvania State University.
The experimental data above was published from the Pennsylvania State University mineral pattern collec-tion, edited by Deane K. Smith. This historic reference was reviewed and edited, resulting in the publication of 41 clay patterns for Release 2008, including several montmorillonites, that were studied under varying experimental conditions.
Future releases will include experimental data additions with several important classes of semi-crystalline materials, such as additional clay minerals, celluloses, starches, and polymers. Data from ICDD grantees and important historic collections will continue to be added on an annual basis. Software required for storing, retrieving, viewing, analyzing and exporting these experimental data files have been added to the PDF-4 product line. PDF-4/Organics will contain digital
experimental patterns with Release 2009.
More graphics!
New for Release 2008—more graphing capabilities were added to the PDF-4 product line. Users can graph material composition (atomic or weight %) as a function of a large number of diffraction,crystallographic, chemical and physical property parameters.
Plots of the author’s a and c cell edges, as a function of % Ga for the photo-voltaic compound Cu(Ga,In)Se2. For any data point, either a diffraction pattern (shown) or the PDF entry can be displayed from the graph by the click of a mouse.
The plots above were generated using 32 data points from PDF-4+ for the cell edges and data that were standardized and combined from three different database sources.
In general, four additional display fields were added in Release 2008 for a total of 70 display fields, which can be displayed and plotted with graphics having links to all entries contained in each PDF-4 product.
Additionally, our powerful interactive graph-ics have been interfaced allowing users to transform diffraction data from the historic stick patterns of d’s and I’s into a fully digi-tized pattern using on-the-fly calculation technology. You have the ability to input experimental and instrumental factors into the reference patterns enabling you to simu-late a reference pattern as if it was run on your instrument. This versatile module features simulations for:
?X-ray diffraction data
?Synchrotron diffraction data ?Neutron diffraction data ?Electron diffraction data
?Electron backscatter diffraction patterns ?Electron diffraction spot patterns (including approximate intensities)
PDF-4+ Features
Numerous features were designed for PDF -4+based on the addition of atomic parameters and prototype structures from the Linus Pauling File. The expanded list of features and capabilities for Release 2008 are listed on pages 10–11.
?Prototype Structure (alphabetical order) search NEW
?LPF Protype Structure (alphabetical order) search NEW
?Atomic Coordinates search ?Author’s Cell Axial Ratio search ?Graph results (X-Y plot, category plot, and histogram)
?Automatic experimental data import for known file types
?Expanded support for experimental data import file types
?Integral Index method—based on a similarity index that compares diffrac-tion patterns to a reference, an
experimental pattern can be compared to any selected set of reference
patterns in the Results form.
Preferred Computer Specifications
PDF-4+Minerals Organics Organics 2008
2008
2008
2009
Pentium processors: or equivalent ????Supported operating systems:
Microsoft ?Windows ?2000 SP4
????Microsoft ?Windows ?XP? Professional SP2????Microsoft ?Windows ?Vista????
?(32-bit) Business Edition NTFS file system ????System Memory 2 GB 1 GB 2 GB 2 GB Installation requires free hard-disk space 6 GB 1 GB 6 GB 15 GB
Note: Please contact ICDD for further information on WebPDF4+ specifications.
right mouse click
left mouse click
285,402
conversion pricing.
PDF-4/Organics 2008/2009
You’re only unknown until you’re known.The same is true with your data. Why limit your data analysis for unknown compounds to proprietary databases? PDF-4/ Organics provides comprehensive coverage as the world’s largest X-ray powder diffraction database for organics and organometallics. PDF-4/Organics is produced, in collaboration with the Cambridge Crys-tallographic Data Centre, by combining drug active compounds calculated from the CSD with polymers (including starches and celluloses), common inorganic salts, excipients and pharmaceuticals.
?Material Identification
?Formulation Analysis
?Quantitative Analysis
?Polymorph Identification
?Crystallite Size
Material Identification—polymorph screening, quality control, drug & excipients identification
The PDF-4/Organics database excels in the identifica-tion or “fingerprinting” of crystalline and non-crystalline phases. It is designed to identify the most complex formulations. Pure organic databases do not perform well due to the common occurrence of inorganic/ organic and crystalline/semi-crystalline blends in commercial formulations. Unlike many databases, our database is not aligned along strict chemical definitions (i.e., exclusively organic, forensic or pharmaceutical entries). While PDF-4/Organics contains predominately organic and organometallic materials, it also contains thousands of reference data for polymeric and inorganic excipients, common inorganic salts, and starting mate-rials.We have added all the types of materials typically found as reaction products and formulation ingredients. Formulation Analysis
Formulation analysis by X-ray diffraction is depend-ent on identification of each major ingredient in the formulation, followed by successive stripping of the identified material from the experimental data and
Quantitative Analysis
PDF-4/Organics, used in combination with most vendor data analysis programs, can provide rapid semiquan-titative and quantitative results. Identification can be quickly followed by quantitative analysis with the combination of the database and appropriate vendor software. The PDF-4/Organics database enables quantitative analysis by calculating I/I c values for use by the Reference Intensity Ratio (RIR) method.
Every reference material can also be expressed as a digitized pattern. The digitized patterns can be used to do quantitative analysis by total pattern fitting tech-niques. In addition, every powder pattern that was derived from a single crystal analysis has a reference citation to the original article and publication, as well as the corresponding reference in the C ambridge Structural Database.
Polymorph Identification
Each polymorph contains its own signature powder pattern that is based on the changes in interplanar dis-tances due to conformational changes. The database has a large collection of polymorphs, particularly of common commercial ingredients. The combination of single crystal data, calculated from the C ambridge Structural Database, and powder data from the ICDD in the PDF-4/Organics database results in broad coverage for most common drugs. The size and extent of the database results in thousands of polymorphs. Similarly, the database contains an extensive collection of solvates, hydrates and salts.
Crystallite Size
The PDF-4/Organics database contains an interactive crystallite size calculation, useful for studying crystallite size effects in any reference material. This can be used to study and simulate nanocrystalline effects or to study the effectiveness of particle reduction techniques commonly used in the pharmaceutical industry. Digital pattern calculations can be adjusted for both instru-mental and specimen factors.
PDF-4/Organics 2009 (Available November 2008) Release 2009 is scheduled to have over 370,000 organic and organometallic entries. This database incorporates many of the features and capabilities described for PDF-4+ (see page 10–11).
New for 2009
?1,567 new experimental entries
?~27,000 new calculated entries
?~3,900 pharmaceutical entries
?~1,500 excipient entries
?1,900 new entries with assigned functional
groups
?371 newly flagged forensic entries
(total—3,260 forensic entries)
?Increased 2?for the calculated patterns from
30° to 60° in response to customer requests Features
?Display of 2-dimensional chemical structure
?Data mining capability includes:
?Active Pharmaceutical Ingredients and
Their Polymorphs
?Excipients and Their Polymorphs
?Pharmaceutical Salts
?Pharmaceutical Hydrates
?Drug Activity Materials
?Forensic Related Materials
?Pigments
?Common and Specialized Organic
Compounds
?Non-crystalline materials
?Organic Functional Group Index
?Ambient and Non-Ambient
?Space Groups
?Pearson Symbol Codes
?Chemical and Structural Formulae
?Chemical and Common Names
?Crystal System Related Information
?R Factors for Calculated Patterns
?Reference Intensity Ratio
?Quality Marks and Figure of Merit
Pricing is available for multiyear & site licenses. PDF-4 Support Software
SIeve+ 2008
SIeve+, ICDD’s search indexing software for the PDF-4 product line, provides rapid searching and identifica-tion of materials using highly automated Hanawalt, Fink and Long-8 searches. While SIeve+ contains much of the functionality of ICDD’s printed index and search manuals, it takes advantage of the dynamic computing power of modern PCs to rapidly perform permuted searches on hundreds of thousands of data entries. This enables permutations with Fink and Long-8 algorithms that are impractical with print due to their enormous size. SIeve+ features an automatic rotation of the 3 strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 longest lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). Historically, these rotation operations were anticipated and integrated into paper manual search-index method protocols. In SIeve+ 2008, automatic rotations can be switched on/off in Preferences. The paper manual search schema always offers a litmus test for searching, namely that all the lines in the unknown pattern are compared against all the lines in the reference pattern(s). To address this comparison, we have implemented a “Pattern GOM”that includes this comparison. The SIeve+ display allows a comparison between the standard GOM and the Pattern GOM. Extensive digitized data plotting functions allow comparisons between experimental data and SIeve+ search/match results.
SIeve+ works with files containing a list of peaks (d-spacing/2-theta and intensity pairs) or files con-taining full experimental data (2-theta and intensity).
A flexible text importer can read a wide variety of input files. SIeve+ is linked with Global searches and Search Preferences from DDView+ allowing users to custom define a SIeve+ input filter based on any of the 48 search method classes or combinations thereof. The results of SIeve+ can also be integrated into search criteria in DDView+.
Total Pattern Analysis Capabilities using an Integral Index for SIeve+
The Integral Index method has also been incorporated into SIeve+ as a tool for database users. This method is a total pattern analysis technique, based on a similarity index that compares diffraction patterns to a reference. In SIeve+, the input experimental data is compared to the reference pattern and an Integral Index is calculated for all candidate reference materials, based on their default digital patterns.
SIeve+, a plug-in to DDView+, is licensed for an additional cost. It activates for a free 30-day trial period or until the product is registered.
Featuring
?New display fields: “Quality Mark”, “Status”,
and “Has Atomic Coordinates”
?Total Pattern Analysis: Integral Index
?Increased speed and interactive SIeve+
Pattern GOM calculations
?Improved SIeve+ filtering with DDView+:
apply refined searches to matches results
?Import full experimental data for SIeve+
?Import full data, preview, remove
background, plot, smooth, show peaks,
import peaks into SIeve+, Integral Index
calculated for imported data
?Automatic SIeve+ data import for known
file types
?
Customizable SIeve+ search lines
PDF-4+ 2008PDF-2 Release 2008 Features:with DDView+with DDView Total entries285,402211,107 Inorganic entries256,934182,634 Organic entries32,40832,189 Entries with atomic coordinates114,6300 Search Classifications:
All Names Search for compounds: plus nomenclature fields??Ambient/Non-ambient??
ANX Structural Formula search (ICSD entries only)??Atomic Coordinates?PDF-4* Author’s Cell Axial Ratio search??Bibliographic: Author, Journal, Title, Year, CAS No., Codens??Boolean operators can be mixed with Just/Only in Periodic Table??
Cell/Volume: Author’s, Crystal, Reduced (including ESD’s)??
Color??Comments??Composition Search: weight & atomic percentages??
cross-references page with each entry display
NIST/ICSD to LPF?PDF-4* Experimental to LPF?PDF-4* Alternate patterns from Primary & Primary to Alternate??Crystal (Symmetry Allowed)??Density: Calculated & Measured??Density: Structure-derived density for LPF entries?PDF-4* Search on any combination of Dmeas, Dcalc, and Dstruc ??Empirical Formula??
I/I c??Integral Index?PDF-4* Lines: Long and Strong??
LPF Prototype Structure search?PDF-4* Chemical Formula order new PDF-4* Alphabetical order new PDF-4* Melting Point??Mineral Classification??Mineral Name??Mineral subclasses: Non-ambient and Synthetic ??Number of Elements??Organic Functional Group??Pearson Symbol Code??Periodic Table??Prototype Structure??Chemical Formula order?PDF-4* Alphabetical order new new Quality Mark??“P” quality mark—LPF prototype structure assignment?PDF-4* All calculated pattern entries??
R-factor??Reduced Cell:
Cell Axis??
Cell Volume??
Smith-Snyder Figure of Merit (SS/FOM)??
Space Groups:
International Table SPG??
Author-Defined SPG??Subfile??Zeolite Classification??
* Available only in PDF-4+
Bolded items signify new features.
PDF-4+ 2008PDF-2 Release 2008 Display & Capabilities:with DDView+with DDView
2D structures for experimental organic entries?PDF-4* 3D structures for LPF entries: unit cell views, atomic environments?PDF-4* Bond Distances/Angles display?PDF-4* Digitized patterns for experimental & calculated entries:?PDF-4* Calculated patterns: X-ray, electron and neutron?PDF-4* Automatic experimental data import for known file types??
Experimental data background subtraction (Sonneveld-Visser algorithm)?PDF-4* Experimental data smoothing (Savitzky-Golay algorithm)?PDF-4* Experimental data peak finding (2nd derivative algorithm)?PDF-4* Displayed data can be copied onto the clipboard??Electron Backscattering Pattern (prototype)?PDF-4* Simulated Electron Diffraction Pattern (prototype)?PDF-4* Approximate sizes for intensities new PDF-4* Graphing Capabilities:
1/d x-axis units??
Add/delete plots “on-the-fly”?PDF-4* Advanced custom importing:
Save custom settings?PDF-4* Graph results (x-y plot, category plot, histogram)??Graph individual composition elements new PDF-4* Particle Size profile function?PDF-4* Debye-Scherrer geometry type?PDF-4* Graph can be panned when zoomed?PDF-4* Enhanced plot settings ?PDF-4* 2-theta correction?PDF-4* Background?PDF-4* Change color of line?PDF-4* Scale intensities to highest peak?PDF-4* LPF Prototype Structure search?PDF-4*“Not” operator available for every search??
PD3 Patterns: Raw experimental data new PDF-4* PDF Entry Display:
3 strongest spacings in bold??
Atomic environment picture can be viewed on Structure tab of PDF Entry?PDF-4* Crystal (Symmetry Allowed) – X data field??
Estimated Standard Deviation (ESD) available for most numeric searches??
Footnotes for d-spacings new new
PDF card tab selections “in sync” when viewing multiple cards??
Report options: long/short, hide empty data??
User Comments Report – view all user comments??
User-editable Isotropic Temperature Factors?PDF-4* View up to 3 intensities at one time: fixed slit, variable, & integrated?PDF-4* Search Results Capabilities:
Calculations for mean, median, and ESD??
Ability to add any field directly to results from menu option ??
Flexible formulae sorting in search results??
Open multiple PDF Cards at once??Database fields for display in search results:
Ambient/Non-ambient new PDF-4* Crystal cell (full coordinates)?PDF-4* Crystal cell volume, Author’s cell volume?PDF-4* Has Atomic Coordinates new PDF-4* Reduced cell (full coordinates)?PDF-4* Smith-Snyder Figure of Merit (SS/FOM)?PDF-4* Total Pattern Analysis: Integral Index calculates/assigns a value?PDF-4* comparing experimental data to result form diffraction patterns
* Available only in PDF-4+
Bolded items signify new features.
PDF-2 Release 2008
PDF-2 Release 2008, the latest installment of the his-toric Powder Diffraction File, is designed for inorganic materials analyses using automated diffractometers. Release 2008 contains data from the ICDD experimen-tal powder data collection and data collected, edited and standardized from the NIST and ICSD databases. Many common organic materials from the IC DD are added to this database to facilitate rapid material identification.
Highlights:
?211,107 entries
(182,634 inorganic & 32,189 organic)
?102,552 experimental entries
?98,488 entries calculated from ICSD
?10,067 entries calculated from NIST
?11,533 new entries
?2,041 new experimental entries
?9,492 new entries from the ICSD
Retrieval software, such as ICDD’s DDView or vendors’software, must be used to convert the data from PDF-2 into readable forms. Customers using ICDD’s support software (DDView and SIeve) need to purchase the current versions of the support software. Retrieval soft-ware offering search/match capabilities is available from IC DD’s licensed distributors and equipment manufacturers (see pages 17–20). Check with your software vendor to confirm software compatibility when purchasing or renewing to Release 2008. Pricing is available for multiyear & site licenses.PDF-2 Support Software
DDView 2008
DDView 2008, ICDD’s retrieval and viewing software, is designed to make PDF-2 accessible as a stand-alone database operating in a Windows?environment. DDView provides display, search and data filtering capabilities for the PDF-2 database. Many customers using vendor search/match software, choose to purchase DDView as well, in order to perform further analyses. Each year, DDView is updated to reflect annual changes in the database. Licensing DDView is the best way to stay current with database changes and it strongly complements other viewing and data analysis software. The expanded list of features and capabilities for Release 2008 are listed on pages 10–11. New search classifications
?Prototype Structure search (alphabetical order) New graphing capabilities
?Open a PDF card from an x-y point
New PDF entry display
?Prototype Structure field (alphabetical order)
?Footnotes for d-spacings
ICDD SUITE 2008—DDView with SIeve
ICDD Suite offers the viewing software that you need, along with search indexing software that you want. Although available on one CD, DDView and SIeve are licensed separately. SIeve is available only in the ICDD Suite, which offers licensing for both DDView and SIeve. Both DDView 2008 and SIeve 2008 are designed to work with PDF-2 Release 2008. Customers updating their PDF-2 must update their software to match the release year update.
Multiyear pricing is available for the ICDD Suite when purchasing multiyear licenses for PDF-2.
SIeve 2008
SIeve, ICDD’s search indexing software, provides rapid searching and identification of materials using highly automated Hanawalt, Fink and Long-8 searches. While SIeve contains much of the functionality of IC DD’s printed index and search manuals, it takes advantage of the dynamic computing power of modern PCs to rapidly perform permuted searches on hundreds of thousands of data entries. This enables permutations with Fink and Long-8 algorithms that are impractical with print due to their enormous size. SIeve features an automatic rotation of the 3 strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 longest lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). Historically, these rotation operations were anticipated and integrated into paper manual search-index method protocols. In SIeve 2008, automatic rotations can be switched on/off in Preferences. The paper manual search schema always offers a litmus test for searching, namely that all the lines in the unknown pattern are compared against all the lines in the reference pattern(s). To address this comparison, we have implemented a “Pattern GOM” that includes this comparison. The SIeve display allows a further comparison between the standard GOM and the Pattern GOM.
SIeve works with files containing a list of peaks (d-spacing/2-theta and intensity pairs) or files con-taining full experimental data (2-theta and intensity).
A flexible text importer can read a wide variety of input files. SIeve is linked with Global searches and Search Preferences from DDView allowing users to custom define a SIeve input filter based on any of the 46 search method classes or combinations thereof. The results of SIeve can also be integrated into search criteria in DDView.
SIeve is available only in the ICDD SUITE.
New in 2008
?Import full experimental data
?Background smoothing
?Smoothing
?Peak finding
?New display fields: “Quality Mark”, “Status” Printed Indexes & Search Manuals
Alphabetical Indexes (Inorganic Phases) Highlights
?62,780 phases
?Phases sorted by chemical name and
chemical name fragments
?Lists three strongest lines, formula, quality
mark and PDF number for each entry
?Minerals indexed by mineralogical name
and classification
?Indexes of Cements, Common Names,
Explosives, Zeolites, Metals and Alloys
and Strukturbericht Symbols
Hanawalt Search Manual (Inorganic Phases) Highlights
?62,978 phases
?Manual identification of unknown phases
using the Hanawalt Method
?Uses d-spacings of the three most intense
lines for searches
?“Overlapped” data for experimental error
allowance
Organic & Organometallic Phases
Highlights
?27,820 phases
?Hanawalt Index
?Alphabetical Index
?Organic Formula Index
?Common Names Index
IC DD’s printed indexes and manuals allow for searches and identification of approximately 87,000 phases determined from experimental data in the Powder Diffraction File (Sets 1–58). For PC users, ICDD offers ICDD Suite, search/match software for all entries in the PDF. (see ICDD SUITE, page 12)
Alternate PDF Products
Data Books
Set 58 of the Powder Diffraction File in book form con-tains PDF card images for 2,000 new experimental patterns. Previous sets are also available in book form. Sets 1 to 15 are available in three volumes. Sets 16 through 36 can be ordered in two-volume sets. For Sets 37 through 58, the inorganic and organic subfiles have been combined in one volume each.
Set 58 Highlights
?2,000 new experimental patterns
?d-spacings and intensities
?When available:
?Chemical formula?Mineral name
?Miller Indices?Optical data
?Chemical name?Structural formula
?Physical data?Quality mark
?
Experimental conditions
Distributed Products
The following products, though related to X-ray dif-fraction, are not produced by ICDD, but are distributed under agreement with their manufacturers.
Dow Polymer Pattern Collection
This softcover publication offers more than 150 poly-mers, reproduced in the form of diffractometer traces,collected from the research laboratories of the Dow Chemical Company.
NIST Crystal Data File, Release J 1997
Available on CD-ROM, this compilation contains crys-tallographic and chemical data on more than 230,000entries. Each entry contains reduced cell data, volume,space group and unit cell data, chemical name and formula and literature references. Please contact ICDD’s Customer Service Department for a copy of the required license agreement.
Scientific Support Activities & Products
ICDD offers a variety of educational products designated to teach and instruct both the new and experienced user. ICDD Clinics are taught by experienced instructors that have a variety of scientific backgrounds. This diversity enables the attendees to receive a blend of both theory and results-oriented practical experience.The weeklong format provides in-depth training not offered in most workshops and symposia.
For educators and instructors, ICDD offers the PDF-4+database for educational instruction. Access is time limited and password protected (in some cases). The Powder Diffraction File is complemented by the Edu-cational Resource Package, which provides worked examples that utilize many database features. Please contact ICDD for further information.
ICDD Clinics
https://www.doczj.com/doc/2b4971863.html,/education/clinics.htm
XRD & XRF Clinics
Learn methods to improve your analysis,specimen preparation techniques, types and sources of error, computer methods,
instrumentation, quantitative and qualitative phase analysis through concise lectures and workshops. In pursuit of its dynamic commitment to education, the ICDD offers a limited number of tuition waivers for the clinics on X-ray Powder Diffraction and the clinic on X-ray Fluorescence Spectrometry.
XRF
Practical X-ray Fluorescence
XRD
Fundamentals of
X-ray Powder Diffraction Advanced Methods in X-ray Powder Diffraction
Specialized Workshops
Specimen preparation … the key to superior results!
Specimen Preparation for X-ray Fluorescence
https://www.doczj.com/doc/2b4971863.html,/education/spec-xrf-workshop.htm Revitalize your specimen preparation techniques with a three-day workshop taught by leading experts. You’ll discover innovative and creative techniques for powder preparation and fusion preparation as well as methods for liquids and solids. For a truly hands-on learning experience, grinders, presses, and fusion machines will be utilized during the workshop. The experience doesn’t end there! All specimens used for class exer-cises will be provided by you, the attendee. This will allow you to gain insight into the preparation of not only your material, but various others brought by your peers.
Rietveld Refinement & Indexing
https://www.doczj.com/doc/2b4971863.html,/education/rietveld-workshop.htm Learn the principles and techniques of Rietveld analysis at ICDD’s specialized three-day workshop. Reinforce your learning experiences with our hands-on data analysis training!
Discover the Rietveld method as a powerful tool for:?Extracting accurate and precise structural information from powder patterns of inorganic,organic, metal & alloy, macromolecular, and coordination compounds
?Performing quantitative phase analysis
?Obtaining microstructural information such as size strain and texture
Our collaborations with MPDS and NIST, as well as our own Grant-in-Aid Program, have provided atomic coordinates and related parameters to ICDD’s database,PDF-4+. This workshop will focus on the expanded quantitative analysis capabilities of PDF-4+. Let the experts guide and advise you through problem solving techniques to maximize the quality of your results!
On-site XRF & XRD Training Solutions
https://www.doczj.com/doc/2b4971863.html,/education/onsite.htm
The ICDD can customize our leading edge educational clinics to meet the X-ray fluorescence or powder dif-fraction training needs of your employees. For over 15years, the ICDD has provided training to the world’s most renowned corporations, academic institutions
Pharmaceutical
Powder X-ray Diffraction Symposium
https://www.doczj.com/doc/2b4971863.html,/ppxrd
8th Annual PPXRD Symposium Europe 2009
This annual symposium is designed to create a forum for the exchange of knowledge and cutting-edge ideas among those interested in the combined fields of XRD and pharmaceutical sciences. PPXRD will also include a workshop on practical applications of X-ray analysis in the study of pharmaceutical materials. Topics will include patent and regulatory issues, formulation,product development, drug delivery, polymorphs,complimentary techniques, and much more.
Educational Resource Package
ICDD’s Educational Resource Package is designed to be used individually or in combinations as an effective teaching tool for powder diffraction pattern identifica-tion. The three-volume softcover set includes
Using the Powder Diffraction File , Education Databook and
Educational Indexes .
The student workbook, Using the Powder Diffraction File , contains descriptive material, worked examples and problem sets covering various disciplines employed in powder diffraction pattern identification.(The Instructor’s Guide is available upon request.) The Education Databook contains approximately 1,000data sets of selected patterns from the PDF, specifically chosen for teaching purposes. The workbook covers various methods used in identification of unknown phases and refers to this subset of the Powder Diffraction File. The Educational Indexes is a combined Alpha-betical, Hanawalt and Fink Method search manual for use as part of the Educational Resource Package.
Denver X-ray Conference
https://www.doczj.com/doc/2b4971863.html,
58th Annual
Denver X-ray Conference
27–31 July 2009 Crowne Plaza Hotel
DXC is the world’s largest annual conference dedicated to the fields of X-ray analysis. Experts in the field of Advances in X-ray Analysis
(Proceedings of the Denver X-ray Conference)
Over 51 years of history and experience in the field of X-ray analysis have been captured on CD-ROM in the volumes of Advances in X-ray Analysis . Each annual volume contains that year’s full proceedings plus a cumulative searchable author and subject index from each Denver X-ray C onference proceedings since 1957. Volumes 1 to 51 contain 2,959 articles from experts in the field of X-ray analysis. A cumulative volume, Volumes 1–39, features page images of all the manuscripts from the Denver X-ray Conference from 1957–1995.
1957–1995Volumes 1–391996Volume 401997Volume 411998Volume 421999Volume 432000Volume 442001Volume 452002Volume 462003Volume 472004Volume 482005Volume 492006Volume 502007Volume 512008Volume 52**available summer 2009
The C D-ROM functions in the Windows ?, UNIX ?/Linux ?and Macintosh ?environments. Hyperlinks to the Adobe ?web site are provided in the setup file should you need to install the free Adobe Reader ?software.
Powder Diffraction Journal
ICDD’s quarterly international journal,Powder Diffraction , focuses on mate-rials characterization employing X-ray powder diffraction and related tech-niques. With feature articles covering a wide range of applications, from crystal-structure determination of polycrystalline materials to epitaxial growth of thin films to advances in application software and hardware,
this journal offers a wide range of practical applications.For the first time, this year Powder Diffraction is adding a supplement issue. The first supplement issue contains representative papers from the Latin American W orkshop on Applications of Powder Diffraction and Mini-Course on Methods of Powder Diffraction (held in Campinas,Brazil 16–20 April 2007). This supplement issue repre-sents not only the commitment to bring the very best in materials characterization, but also emphasizes the international scope of Powder Diffraction .
ICDD, in collaboration with the Denver X-ray Confer-ence Organizing Committee, has increased services for the subscribers of Powder Diffraction and authors of Advances in X-ray Analysis . Powder Diffraction institutional subscribers who receive both print and on-line versions will receive the CD-ROM of Volume 52,Advances in X-ray Analysis (available summer of 2009). This effectively doubles the number of articles annually available to Powder Diffraction subscribers and significantly increases the circulation for the authors in Advances in X-ray Analysis .
Subject coverage includes:
?Techniques and procedures in X-ray powder diffractometry
?Advances in instrumentation
?Study of materials including organic materials,minerals, metals and thin film superconductors ?Publication of powder data on new materials
Print &Print Online Online
Only Only 2008 Subscription Rate:
Individual—U.S. & Canada $110$90$90Individual—Overseas $140$115$90Institution—Worldwide $195$185$130Student—Worldwide
NA NA $352009 Subscription Rate:
Individual—U.S. & Canada $120$100$100Individual—Overseas $150$125$100Institution—Worldwide $205$195$140Student—Worldwide
NA
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$35
To subscribe, please contact:
American Institute of Physics Subscriber Services Suite 1NO12 Huntington Quadrangle
Melville, NY 11747-4502 U.S.A.
Phone: 1.800.344.6902 or 1.516.576.2270Fax: 1.516.349.9704
Introduction to X-ray Spectrometry
This self-study course consists of eight audio cassettes narrated by Dr. Ron Jenkins along with an integrated 200-page collection of illustrations, references and sources for further study. This self-paced course allows the student to review the theory , principles and practice of qualitative and quantitative analysis using X-ray fluorescence spectrometry.
Grant-in-Aid Program
https://www.doczj.com/doc/2b4971863.html,/grants
One of ICDD’s main objectives is to expand the range of reference materials by archiving or producing X-ray diffrac-tion patterns. To further this effort, ICDD
supports a well-developed program of grants to researchers around the world to provide high quality data and refined search techniques. Each year, ICDD extends financial support to qualified investigators in the form of grants-in-aid, awarded on a competitive proposal basis, for the preparation of reference X-ray powder diffraction data.
The duration of a Grant-in-Aid is 12 months with two cycles per year. Cycle I begins 1 April and Cycle II begins 1 October.
Benefits offered to grantees are:
?Financial support to aid current research ?Publication of pattern(s), if accepted by the Editorial Department, in the Powder Diffraction File
?Receive calibration standards
?Purchase certain products at reduced prices ?Web-based access to the list of compounds in the ICDD master database—includes published patterns as well as patterns still in the editorial process
?First-time grantees receive a complimentary one-year subscription to Powder Diffraction
Grant-in-Aid Workshop in Ulan-Ude, Russia
Antisel Selidis Bros. SA Greece
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antisel@antisel.gr
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f: 30.231.032.1912
Assing SpA.
Italy
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strumenti@assing.it
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Bede Scientific, Inc.
USA
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Bede X-ray Metrology
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Bernd Group, Inc.
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Blake Industries, Inc. USA
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USA
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Bruker AXS GmbH
Germany
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info@bruker-axs.de
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f: 49.721.595.2111
Bruker AXS SAS
France
www.bruker-axs.de
secret@bruker-axs.fr
t: 33.160.959.000
f: 33.160.175.020
China Educational
Publications Import & Export
Corp. (CEPIEC)
PR China
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Compass Engineering
USA
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DAIRIX Equipamentos
Analíticos Ltda.
Brazil
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t: 55.11.3814.0654
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Delca Consultores, S.L.
Spain
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Dias de Sousa S.A.
Portugal
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ds@dias-de-sousa.pt
t: 351.21.953.3120
f: 351.21.953.3129
Digital Data Management Corp.
Japan
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t: 81.03.5641.1771
f: 81.03.5641.1772
DKSH Technology Sdn Bhd
Malaysia
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t: 603.7954.8888
f: 603.7954.8877
EDAX Inc.
USA
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info.edax@https://www.doczj.com/doc/2b4971863.html,
t: 201.529.4880
f: 201.529.3156
EFG GmbH
Germany
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efg@efg-berlin.de
t: 49.30.809.7400
f: 49.30.802.2355
E Hong Instruments Co., Ltd.
Taiwan
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aid@https://www.doczj.com/doc/2b4971863.html,
t: 886.2.2755.2266
f: 886.2.2707.7693
ICDD continues to work with vendors to have the database work seamlessly with a wide range of commercial data analysis programs. ICDD vendors provide ICDD products throughout the world. Vendors frequently offer additional services such as state-of-the-art X-ray analysis hardware, sophisticated custom software integration and regional support services.
Customers in Japan, Korea and Russia must order through an ICDD licensed vendor.
Elexience
France
www.elexience.fr
info@elexience.fr
t: 33.1.695.38000
f: 33.1.601.19809
Epsilon Alpha
Greece
epsilona@acci.gr
t: 30210.6008.998
f: 30210.6001.803
Export Oil Field Supply Co. USA
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GBC Scientific
Equipment Pty. Ltd.
Australia
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GE Inspection Technologies Germany
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f: 49.4102.807.273
Inel Inc.
USA
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t: 603.778.9161
f: 603.778.9171
INEL Instrumentation Electronique
France
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info@inel.fr
t: 33.238.804.545
f: 33.238.800.814Internacional De Equipos
Cientificos S.A. DE C.V
Mexico
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Ital Structures s.a.s.
Italy
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t: 39.0464.55.3426
f: 39.0464.55.5270
JEOL Active Co., Ltd.
Japan
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t: 81.42.543.1111
f: 81.42.546.3353
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Saudi Arabia
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Korea I.T.S. Co., Ltd. (KITS)
Korea
kits@kits-euro.co.kr
t: 82.2.540.4360
f: 82.2.544.4456
KPT InfoTrader, Inc.
Japan
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Kratos Analytical
USA
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Labsen Scientific Co
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LABSOFT
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LightStone Corp.
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Maruzen Co., Ltd.
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Materials Data, Inc.
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OMNI Scientific
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欢迎阅读江阴电教馆云数据中心项目方案 目录 1 方案建设思路..................................................... 2方案拓扑......................................................... 3方案的优势....................................................... 3.1可靠性...................................................... 内存，3个300GB SAS硬盘组成RAID5阵列。在服务器上部署vmware vsphere 5.1虚拟化平台，将电教馆的相关业务转移到vmware vsphere 5.1虚拟化平台上去，实现上层应用与底层硬件的无关性，提高可管理性和对异构设备的兼容性。通过在浪潮ICM管理平台，对各个应用系统进行集中管理，功能上实现应用业务在本地的HA、FT、vMotion、DRS、DMP、在线业务迁移等功能，保障服务器硬件故障业务不中断。 后端采用虚拟化存储解决方案，打破实体存储设备间的疆界，构建高弹性的
存储基础架构，以最经济的方式实现存储高可用。即在一定范围内，控制器所组成的虚拟存储层以高可用集群架构存在，在服务器和存储磁盘阵列之间构建了一个虚拟逻辑磁盘，底层数据同时存放在两个存储实体中（后端存储阵列AS500H），数据同步机制通过硬件实现，无需依赖客户端软件。当存储路径上任何一个设备发生故障时，存储路径将自动切换到其他路径，保障业务数据存取连续性。配置10TB高性能SAS硬盘和30TB的大容量空间，容量分级管理，更高效地利用存储空间。为了保证本地数据的安全性和人为误操作导致的数据丢失，配置备份服务 举例说明，传统模式下，数据库部署在物理主机上，当物理机出现故障，服务停止。虚拟化模式下，数据库部署在虚机上，当此虚机的载体服务器出现故障，我们可以通过预设的策略将数据库虚拟机通过高可用、迁移等在线迁移方式迁移到其他的可用的物理服务器上，在线迁移过程中，业务不会中断；HA迁移完成后重新启动虚机继续提供服务。虚拟化模式下，业务的连续性得到了有效的保证。同时，物理机上可以部署多个虚机，运行多个业务系统，充分利用了计算资源。
GB50174--2017《数据中心设计规范》解读 GB50174--2017《数据中心设计规范》解读一、数据中心是一切信息化的基础 李克强总理在政府报告中指出：新兴产业和新兴业态是竞争高地。要实施高端装备、信息网络、集成电路、新能源、新材料、生物医药、航空发动机、燃气轮机等重大项目，把一批新兴产业培育成主导产业。制定“互联网”行动计划，推动移动互联网、云计算、大数据、物联网等与现代制造业结合，促进电子商务、工业互联网和互联网金融健康发展，引导互联网企业拓展国际市场。 云计算、互联网、物联网、大数据等现代信息技术已成为国民经济的重要支柱。信息化的基础是数据中心，可以说，没有数据中心就没有信息化的发展。 二、规范编制目的 1、电子信息技术平均2.5年发展一代，每一代IT技术的发展都意味着其支持技术的发展，即数据中心环境要求、建筑与结构、空气调节、电气、电磁屏蔽、网络系统与布线、智能化、给水排水、消防等技术的发展，这些技术的发展需要相关技术规范的支持。 2、GB50174-2008《电子信息系统机房设计规范》于2008年发布实施，到2015年《电子信息系统机房设计规范》已运
行了7年，意味着电子信息技术已发展了3代，需要规范做相应修改。 3、将《电子信息系统机房设计规范》更名为《数据中心设计规范》的主要目的是适应目前国内数据中心的建设需要以及更好地进行国际交流。 三、规范编写原则 1、可实施性原则 本规范在执行国家相关法律、法规和规范的基础上，注重设计方法的可操作性和可实施性，为设计人员提供实用的设计方法。 2、先进性原则 《数据中心设计规范》在满足中国数据中心行业发展的前提下，吸取国外有关数据中心设计的优点，结合中国数据中心行业的具体情况，增加补充具有数据中心行业特点的相关条文规定。主要围绕数据中心的可靠性、可用性、安全、节能、环保等方面的进行编写，具有一定的技术先进性和前瞻性。3、科学性原则 本规范提出的设计原则和方法归纳总结了国内外数据中心行业的经验，是众多行业专家经过多年实践总结出来的，是以现行有效的相关法规、标准、规范为基础，并充分考虑数据中心行业的特点和特殊性。 4、协调性原则
XX集团-数据中心项目管理平台实施方案_v1.1- v201403207 XX集团数据中心- 云门户运维服务管理平台实施方案 version 1.1 目录 文档信息(4) 文档目的(4) 使用范围(4) 版本控制(4) 解决方案概述(5) 设计规划(6) 架构说明(6) 必要条件(6) 防火墙埠(6) IP 配置与规划(7) 安装与配置(10) 系统与流程介绍(10)
执行OVF配置(12) 执行初始配置(15) 维护管理员帐户与邮件配置(20)创建用户与用户组(23) 创建数据中心(25) 新增网络设备(26) 新增服务器设备(28) 新增存储设备(30) 新增虚拟管理中心账户(32) 自服务门户(34) 架构支撑(34) 创建运算资源策略(36) 创建存储资源策略(37) 创建网络资源策略(39) 创建系统资源策略(43) 管理操作系统授权(45) 创建虚拟数据中心(46)
发布服务目录(48) 配置资源限定策略(51) 配置成本计算(52) 自助服务门户创建虚机(53) 文档接收人(56) 文档信息 文档目的 本文档描述了XX集团数据中心云门户运维服务管理平台详细设计，这篇文档将作为XX集团数据中心项目实施依据。本文档不包含非技术问题，只限于与XX集团数据中心设计相关的技术层面。 使用范围 本文档资料主要面向负责XX集团数据中心项目设计和实施人员、维护人员、系统集成商网络工程师、思科技术人员（项目工程师，项目经理、系统工程师）等，以便通过参考本文档资料顺利完成XX集团数据中心项目实施工作。这篇文档只包括XX集团数据中心实施方案，不包括非XX集团数据中心其他。 版本控制 解决方案概述 思科UCS Director 提供了一个统一融合基础设施的管理平台来自动化和管理多厂商的动态数据中心，并提供多协议融合的基础设施解决方案。思科UCS
中国数据中心机房等级分类及标准 数据中心（DataCenter）通常是指在一个物理空间内实现对数据信息的集中处理、存储、传输、交换、管理，一般含有计算机设备、服务器设备、网络设备、通讯设备、存储设备等关键设备。数据中心的基础设施(DataCenterInfrastructure)是指为确保数据中心的关键设备和装置能安全、稳定和可靠运行而设计配置的基础工程，也称机房工程(FacilitySiteEngineering)，数据中心机房工程的建设不仅要为数据中心中的系统设备运营管理和数据信息安全提供保障环境，还要为工作人员创造健康适宜的工作环境。 数据中心机房包含的范围太大，有银行、电信业的大的数据中心，也有企业自用的小机房，随着信息技术的发展，各行各业对机房的建设也都提出了不同的要求，如果不分级，规范遇到的最大问题将是可操作性。 数据中心机房等级分类 按照我国《电子信息系统机房设计规范》(GB50174-2008)，数据中心可根据使用性质、管理要求及其在经济和社会中的重要性划分为A、B、C三级。 A级为容错型，在系统需要运行期间，其场地设备不应因操作失误、设备故障、外电源中断、维护和检修而导致电子信息系统运行中断。A级是最高级别，主要是指涉及国计民生的机房设计。其电子信息系统运行中断将造成重大的经济损或公共场所秩序严重混乱。像国
家气象台；国家级信息中心、计算中心；重要的军事指挥部门；大中城市的机场、广播电台、电视台、应急指挥中心；银行总行等属A级机房。 B级为冗余型，在系统需要运行期间，其场地设备在冗余能力范围内，不应因设备故障而导致电子信息系统运行中断。B级定义为电子信息系统运行中断将造成一定的社会秩序混乱和一定的经济损失的机房。科研院所；高等院校；三级医院；大中城市的气象台、信息中心、疾病预防与控制中心、电力调度中心、交通（铁路、公路、水运）指挥调度中心；国际会议中心；国际体育比赛场馆；省部级以上政府办公楼等属B级机房。 C级为基本型，在场地设备正常运行情况下，应保证电子信息系统运行不中断。A级或B级范围之外的电子信息系统机房都称为C级。数据中心机房标准 目前国内外与数据中心有关的工程建设标准主要有《电子计算机机房设计规范》（GB50174-92）、《电信专用房屋设计规范》（YD/T5003-2005）、美国通信工业协会(TIA)发布的《ANSI/TIA-942–2005，Telecommunications Infrastructure Standardfor DataCenters（数据中心的通信基础设施标准）》，它们是数据中心建设定位、功能指标、设计技术、施工工艺、验收标准等的具体技术要求与体现。 在《电子计算机机房设计规范》中，涵盖了A、B、C三级机房设计要素中的各种要求和规则，如位置选择、环境要求、建筑结构、空
1.数据中心设计 数据中心是为人力资源和社会保障信息化提供技术支撑和数据支撑，提供人力资源和社会保障信息化全部数据的构建、保存、更新、集成、分发与共享，以及提供存证、容灾、备份等信息服务的基础环境，是实现数据的存放和集中处理的场所。数据中心从内容上，涉及业务资源数据库、交换资源数据库和宏观决策数据库，分别存放在生产区、交换区和决策区；从层次上，分为市、区/县、社区/镇三级。 1.1数据中心的设计原则 1．源于现系统，高于现系统 数据中心必须以现系统为基础，通过数据中心的建设，使新系统的需求得到满足。数据中心的建设将把现有相对独立的各个相关系统有机地构成一个统一的大系统。 2．业务处理分散，数据相对集中 业务部门办理业务，数据中心管理业务数据是将来系统建设的模式。这种模式满足了系统对数据的稳定性、安全性、完整性等原则的要求。 3．合理利用现有成熟技术原则 通过利用现有的成熟技术来建设数据中心，提高了系统建设的成功率，降低了系统建设的风险。 4．分步实施原则 数据中心的建设是一个阶段性强、计划性强的过程，因此，在数据中心设计时应明确系统建设分为哪几个步骤，每一个步骤包括什么内容，以什么作为阶段标志。分步实施模式可以降低投资风险，将建设资金进行分阶段划分，使每一个时期的资金投入都能够得到保证。 5．四个统一原则 数据中心的建立将解决四个统一的问题，即统一的数据平台、统一的数据接口、统一的数据通道、统一的数据管理。 （1）统一的数据平台就是为各种数据的访问、交换、使用提供一个统一的
物理支撑环境； （2）统一的数据接口就是人力资源和社会保障部门与其他相关部门之间的数据交换文件必须通过数据中心统一实现交换和共享； （3）统一的数据通道就是数据中心纵向沟通了省、市、区县三级人力资源和社会保障部门，横向沟通了人力资源和社会保障各业务部门，为构建统一的人力资源和社会保障系统提供坚实基础； （4）统一的数据管理就是集中人力资源和社会保障各业务部门的基本业务数据，并进行统一的数据安全控制和异地集中备份。 6．效益和效率协调原则 数据中心应满足现有系统向更高的层次发展，实现效益和效率的协调。 1.2数据中心的体系结构 数据中心体系的构成基于以下几点考虑： 第一，数据中心统一管理生产区、交换区、宏观决策区各数据库，以及与相关业务部门交换数据的接口数据文件。通过数据中心，接通了人力资源和社会保障个业务部门及相关业务机构，极大限度地共享了数据资源，使数据中心成为名副其实的数据中心。 第二，接口数据文件可以通过电子邮件、软盘等方式传递，但都存在安全隐患问题，如果通过数据中心转发，可以解决数据传递过程中的安全隐患、单一出/入口问题。 第三，数据集中存储，既方便了数据安全控制，又方便数据的一地集中备份，从而最大限度发挥数据中心统一管理职能的作用。 第四，保证系统现有投资，使各个业务部门存放的数据可以过渡到全市集中。 第五，考虑到将来系统的建设将分步实施，供交换和决策用的数据库将逐步从生产数据库中独立出来，但由于它们也存放在数据中心，这样更能体现数据中心的大集中职能。 1.3数据中心的主要功能 数据中心的主要功能是把各种业务数据纳入统一的管理模式，解决各个地区的数据库分布和相对集中的问题，实现数据的交换和共享。 从目前情况考虑，在保持现有数据系统的情况下，数据中心主要解决生产数据集中管理，以及各种数据库的互联、数据交换、数据共享等问题；数据中心将成为全市人力资源和社会保障信息系统统一应用的基础。 1．生产数据集中管理 在市一级建立集中式资源数据库，或采取将数据通过定期备份的方式集中存放在市级数据中心，可实现生产数据的集中管理，从而方便各业务之间实现信息共享，人力资源和社会保障部门对社会公众提供统一的管理和服务。 2．业务部门的互联互通 数据中心作为一个连接的媒介，接通了人力资源和社会保障信息系统与其他系统，在此基础上实现了人力资源各业务部门、社会保障各业务部门之间的数据共享，同时实现了与其他相关业务部门之间数据文件的接收和发送。
数据中心IT项目管理的风险控制 数据中心在项目管理中需要一套对项目进行有效监控的完善的项目管理系统，通过这个系统来规范项目经理在项目实施过程中及时识别、分析和跟踪项目的风险，对风险的及时解决提供较好的途径。本文在明确风险内涵的基础上，介绍了数据中心对项目风险的控制过程，对数据中心的it项目存在的风险进行归类总结，并提出了解决方案。希望对it项目风险的管理起到一点借鉴作用。一、风险的内涵 目前，专家学者对风险的理解基本可以归纳为两种定义：第一种，风险是损失发生的不确定性，即风险由不确定性和损失两个因素构成。第二种，风险是在一定条件下，一定期限内，某一事件的预期结果与实际结果之间的变动程度。变动程度越大，风险越大；反之则越小。项目风险是指由于项目所处环境和条件的不确定性，项目的最终目标背离项目相关利益主体的期望，给项目相关利益主体带来损失的可能性。产生项目风险的原因很多，主要是由于项目团队不能实现准确预知所有干扰项目未来发展的因素、发展方向和影响程度。项目的一次性特点导致了风险的不重复性、无法弥补性和后果的严重性。项目团队根据项目所处的不同阶段，通过对可能遇到的风险进行风险识别、风险评估，并以此为基础合理地采用多种管理方法、技术和手段对项目实施中涉及的风险施以适宜的应对策略和有效的监控，从而有力地控制风险，妥善处理风险造成的不利后果，使项目朝着有利于实现目标的方向发展。
二、数据中心it项目风险控制 与任何其他工程项目一样，系统整合项目也存在各种各样的风险，有些风险甚至是灾难性的。在软件开发过程中，人们关心的问题是，什么风险会导致软件项目的彻底失败？顾客需求、开发环境、目标、时间、成本的改变对软件项目的风险会产生什么影响？人们必须抓住什么机会，采取什么措施才能有效地减少风险、顺利完成任务？所有这些问题都是软件开发过程中不可避免并需要妥善处理的。软件工程的风险控制和管理包括：风险识别、风险分析、风险跟踪和风险关闭。 三、数据中心it项目风险类型 目前，数据中心的所有项目的风险归结起来有以下几种类型：人员人力风险、技能风险、设备资源风险、过程管理风险、技术风险、外部环境风险等六种类型。每种类型都有各自的特点，我们需要针对性的制定风险解决方案。 四、应对措施 第一，针对人员人力方面风险需要增强计划性，在项目任务的安排中不能太过理想化，要将项目成员可能担负多个项目任务的情况考虑进来，加强和项目成员的沟通，在项目任务的完成上要充分发挥项目成员的积极性和能动性。与开发部门沟通，在开发人员不足的情况下，让其尽量安排人力，或者通过其他方式增加人力。另一方面尽可能在项目工作发生延期前发出预警。对于新人比较多的项目，加强对新人技术的培训的同时要加强新人彼此和老员工之间的
中国数据中心机房等级分类及标准数据中心（DataCenter）通常是指在一个物理空间内实现对数据信息的集中处理、存储、传输、交换、管理，一般含有计算机设备、服务器设备、网络设备、通讯设备、存储设备等关键设备。数据中心的基础设施(DataCenterInfrastructure)是指为确保数据中心的关 A级为容错型，在系统需要运行期间，其场地设备不应因操作失误、设备故障、外电源中断、维护和检修而导致电子信息系统运行中断。A级是最高级别，主要是指涉及国计民生的机房设计。其电子信息系统运行中断将造成重大的经济损或公共场所秩序严重混乱。像国家气象台；国家级信息中心、计算中心；重要的军事指挥部门；大中
城市的机场、广播电台、电视台、应急指挥中心；银行总行等属A级机房。 B级为冗余型，在系统需要运行期间，其场地设备在冗余能力范围内，不应因设备故障而导致电子信息系统运行中断。B级定义为电子信息系统运行中断将造成一定的社会秩序混乱和一定的经济损失 》 ，它们是数据中心建设定位、功能指标、设计技术、施工工艺、验收标准等的具体技术要求与体现。 在《电子计算机机房设计规范》中，涵盖了A、B、C三级机房设计要素中的各种要求和规则，如位置选择、环境要求、建筑结构、空气条件、电气技术、供电电源质量要求、机房布线、环境和设备监控
系统、安全防范系统、消防等。比如，在环境要求项下的主机房开机温度标准中，A级和B级机房为23+/-1摄氏度，C级则为18~28摄氏度。 数据中心机房等级分类及标准，为国内数据中心机房建设提供了参考指标和方向。想要进行机房建设的企业或机构都应该充分参考，
数据中心建设模式分析
目录 前言 (5) 第一章数据中心发展现状与趋势 (5) 1.1 国内数据中心现状 (5) 1.2 数据中心发展趋势 (9) 第二章数据中心可持续发展能力 (13) 2.1 什么是数据中心可持续发展能力...................................................................... 错误！未定义书签。 2.2 数据中心的生命周期.......................................................................................... 错误！未定义书签。 2.3 数据中心可持续发展能力分析.......................................................................... 错误！未定义书签。 3.1 数据中心业务定位 ............................................................................................. 错误！未定义书签。 3.2 数据中心建设规模 ............................................................................................. 错误！未定义书签。 3.3 数据中心建设标准 ............................................................................................. 错误！未定义书签。 3.4 数据中心指标体系 ............................................................................................. 错误！未定义书签。 3.5 数据中心选址 ..................................................................................................... 错误！未定义书签。 3.6 数据中心技术要求 ............................................................................................. 错误！未定义书签。第四章数据中心的节能与能效评价 ........................................................................... 错误！未定义书签。 4.1 数据中心的能耗审计.......................................................................................... 错误！未定义书签。 4.2 数据中心能耗测量指标...................................................................................... 错误！未定义书签。 4.3 数据中心节能目标 ............................................................................................. 错误！未定义书签。 4.4 节能技术方案举例 ............................................................................................. 错误！未定义书签。
数据中心项目建设 可行性研究报告 目录 1概述 1.1项目背景 1.2项目意义 2建设目标与任务 数据中心的建设是为了解决政府部门间信息共享，实现业务部门之间的数据交换与数据共享，促进太原市电子政务的发展。具体目标如下：建立数据中心的系统平台。完成相应的应用软件和数据管理系统建设，实现数据的交换、保存、更新、共享、备份、分发和存证等功能，并扩展容灾、备份、挖掘、分析等功能。 (一)建立数据中心的系统平台。完成相应的应用软件和数据管理系统建设，实现社会保障数据的交换、保存、更新、共享、备份、分发和存证等功能，并扩展容灾、备份、挖掘、分析等功能。 (二)建立全市自然人、法人、公共信息库等共享数据库，为宏观决策提供数据支持。对基础数据进行集中管理，保证基础数据的一致性、准确性和完整性，为各业务部门提供基础数据支持； (三)建立数据交换共享和更新维护机制。实现社会保障各业务部门之间的数据交换与共享，以及基础数据的标准化、一致化，保证相关数据的及时更新和安全管理，方便业务部门开展工作；
(四)建立数据共享和交换技术标准和相关管理规范，实现各部门业务应用系统的规范建设和业务协同； （五）为公共服务中心提供数据服务支持，实现面向社会公众的一站式服务； (六）根据统计数据标准汇集各业务部门的原始个案或统计数据，根据决策支持的需要，整理相关数据，并提供统计分析功能，为领导决策提供数据支持； （七）为监督部门提供提供必要的数据通道，方便实现对业务部门以及业务对象的监管，逐步实现有效的业务监管支持； （八）为业务数据库的备份提供存储和备份手段支持，提高业务应用系统的可靠性。 3需求分析 3.1用户需求 从与数据中心交互的组织机构、人员方面进行说明。
数据中心搬迁项目管理 第1章对服务商要求 鉴于本项目的复杂性，要求乙方公司具备足够的数据中心搬迁能力及资质。要求乙方必须应用成熟的项目管理方法论，安排具备足够资质，并具备丰富项目管理经验和数据中心搬迁工作经验的项目管理人员负责本项目的管理工作。乙方应该充分论述其将运用在本项目上的项目管理方法，及如何结合本项目实际情况进行科学有效的项目管理工作。 乙方需要为本项目提供项目整体管理服务，包括但不限于以下内容： ●指派专门的经验丰富的项目经理采用成熟科学、经实际检验的搬迁项目 管理方法管理本项目； ●项目管理体系设计：乙方项目经理负责制定并向甲方建议适合本项目的 项目管理体系，并协助项目组建立和运行该项目管理体系； ●总体项目管理计划：乙方项目经理负责制定总体项目管理计划，并与甲 方讨论并最终确定切实可行的项目管理计划； ●项目执行管理、跟踪和检查：乙方项目经理负责根据项目管理计划与甲 方项目管理人员一起进行项目执行管理工作，对项目执行情况进行跟踪 和检查； ●管理项目沟通和协调：乙方项目经理负责协助甲方项目管理人员计划和 建立本项目沟通体系，并协助甲方项目管理人员进行项目管理协调工作； ●项目风险管理：乙方项目经理负责对项目风险进行管理，协助甲方项目 管理人员进行风险分析和风险应对，并在项目执行过程中监控和跟踪项
目风险的发展状况； 搬迁工作总体指挥和协调：乙方项目经理需根据最终确定的搬迁详细设计方案和搬迁日详细计划，协助甲方搬迁指挥人员完成搬迁的总体指挥 和协调工作； 1.1服务商资质要求 为保障甲方数据中心搬迁项目的实施质量，要求乙方公司具备足够的数据中心搬迁能力和资质： 1)在中华人民共和国境内注册的、在法律和财务上独立、能够独立承担民 事责任的企业或公司; 2)注册资本在人民币1000万元(含本数)以上; 3)在最近两年内承接过同规模的数据中心搬迁项目 4)具备IT基础设施运维团队； 5)具备提供备机备件的能力，满足项目对备机备件的要求，要求备品备件 放置在甲方新数据中心存放。 乙方仅能够针对物流运输方面邀请服务合作伙伴参与，乙方不得将本项目其他任何部分转让给其他单位或个人。邀请服务合作伙伴需遵循有关法律、法规等的规定，并需事先与甲方协商，取得甲方批准，具体规定如下： 1)服务合作伙伴必须具备IT设备运输相应的资质条件。乙方将其中部分项 目交付服务合作伙伴实施，不应解除合同约定的乙方的任何责任和义务； 2)乙方有义务依据甲方的要求向甲方提供服务合作伙伴的一切资料；
虚拟数据中心设计方案 一、现状 1、ACME Energy 公司介绍：从事可再生能源项目的开发运营， 包括风能和太阳能。 2、要求IT部门将所有的x86服务器虚拟化。原先服务器分部 在主数据中心和几个分支机构的小数据中心。使用虚拟化技术后，所有服务全部集中在主数据中心。 3、服务分为3个区域：Production, Dev/Test, QA 4、预评估方案需要考虑现大量的已有工作负载和未来的工作负 载。尽量提高服务器的利用率的同时尽量降低硬件相关总成 本。 5、需要将1000台物理进行虚拟化。 6、有2种类型服务器可用做虚拟化，虚拟机/物理机的具体比 率如下： 7、可以增加接口卡。 8、1个刀箱可容纳16个半高刀片，高度为10U；机架式服务 器高度为4U。 9、电力能源足够。 10、业务关键服务器要求具有高可用性。用于生产的资源要求具
有高可用性，可以容许多台ESX主机故障。要隔离用作管理 的虚拟机和用作生产的虚拟机。 11、1000台物理机中包括400台Linux服务器和600台windows 服 务器 总计：400台生产，400台开发/测试，200台质量控制12、Window 服务器磁盘配置：系统盘15GB（平均使用10GB）， 数据盘10GB（平均使用25G）；Linux服务器磁盘配置：60GB （平均使用40GB）。 13、预计今后3年每年10%的服务器增长需求。 14、磁盘阵列情况: (1)1台高性能FC磁盘阵列（控制器为主备模式）可用。 (2)高速缓存：该磁盘阵列有256GB的镜像高速缓存，可扩展到 512GB。 (3)磁盘数量：120块磁盘安装在中央系统存储柜，另有120快磁 盘安装在1个外接存储柜上。 (4)扩展存储柜：可另外付费购买外接存储柜，每个外接的存储柜 最多可安装240块磁盘。整个存储系统最多可安装1920块磁盘。 (5)磁盘类型：包括73GB的SSD固态磁盘，146GB的FC磁盘，300GB 的FC磁盘和500GB的SATA磁盘。 (6)现有空间3.6T的SSD固态磁盘，30T的FC磁盘，35TB的SATA 磁盘。 (7)现在只有生产服务器连到了SAN网络，其他服务器还未连接到
中信银行数据中心项目管理合同(终)
中信银行数据中心项目工程建设全过程项目管理合同 （合同号：） 工程项目名称：中信银行数据中心项目 项目建设单位：中信银行股份有限公司 项目管理单位：北京国金管理咨询有限公司
工程建设项目管理合同 项目建设单位（简称甲方）：中信银行股份有限公司 项目管理单位（简称乙方）：北京国金管理咨询有限公司 根据国家及地方颁布的有关法律、法规及条例，结合工程的具体情况，经甲、乙双方友好协商，甲方委托乙方对甲方数据中心项目进行全过程项目管理服务，并就具体事项达成如下一致协议。 第一条词语定义 1.1 建设单位：在协议书中约定，具有项目发包主体资格和支付工程价款能 力的当事人或取得该当事人资格的合法继承人。 1.2 项目管理单位：在协议中约定的，具有工程建设项目管理相应资质的和 独立法人资格的，接受甲方委托的当事人或取得该当事人资格的合法继承人。 1.3 项目经理：企业法定代表人在管理的建设工程项目管理中的具有相应资 格的委托代理人。 1.4 设计单位：指甲方委托的负责本工程设计并取得相应工程设计资质等级 证书的单位。 1.5 监理单位：指甲方委托的负责本工程监理并取得相应工程监理资质等级 证书的单位。 1.6 代理单位：指受甲方的合法委托，以甲方的名义代理实施项目或项目部 分内容发包工作，并具有相应资质等级证书的单位。
1.7 施工单位：在协议书中约定，被甲方接受的具有工程项目施工承包主体 资格的当事人或取得当事人资格的合法继承人。 1.8 造价咨询单位：指甲方委托的负责本工程造价咨询并取得相应工程造价 咨询资质等级证书的单位。 1.9 工程：指甲方和管理单位在协议书中约定的承包范围内的工程。 1.10 项目管理酬金：指管理单位为进行建设项目筹建、建设、联合试运转、 验收总结等工作发生的管理费用。 1.11 工程前期：指自工程立项起至工程设计完成止的阶段。 1.12 施工准备期：自施工图设计开始起至签发开工令为止的阶段。 1.13 施工实施期：自工程开工至按施工合同完成了项目全部任务为止的阶 段。 1.14 竣工验收期：施工单位按施工合同完成了项目全部任务，提出交工至甲 方组织验收通过为止的阶段。 1.15 造价咨询：指具有造价咨询资质的单位受甲方的委托对工程项目进行造 价控制的活动。 1.16 施工监理：指工程施工阶段监理单位对工程质量、进度、投资、安全文 明施工进行控制的监理活动。 1.17 管理期限：协议书中约定的服务期限。 1.18 开工日期：指甲方、施工单位在协议书中约定，施工单位开始施工的绝 对或相对的日期。 1.19 竣工日期：指甲方、施工单位在协议书中约定，施工单位完成承包范围 内工程的绝对或相对的日期。
数据中心机房施工设计的规范要求 机房整体解决方案 2009-12-16 22:37:57 阅读838 评论0 字号：大中小订阅计算机机房由于其特殊性，在设计中所需注意的要点较多，本文根据国家、地方规范标准，结合工程师的日常工作经验，对计算机机房施工设计要点进行了归纳，供大家参考讨论。 计算机机房由于其特殊性，在设计中所需注意的要点较多，首先应严格遵国家、地方相关工作规范标准。 《计算站场地技术要求》 GB 2887-89 《电子计算机机房设计规范》 GB 50174-2008 《电子信息系统机房施工及验收规范》GB 50462-2008 《计算机房活动地板技术条件》 GB 6650-86 《通风与空调工程施工与验收规范》 GB 50243-97 《供配电系统设计规范》 GB 50052-95 《民用建筑电器设计规范》 JGJ/T16-92 《建筑内部装修设计防火规范》 GB 50222-95 《建筑设计防火规范》 GB 16-87 《建筑内部装修设计防火规范》 GB 50222-95 《火灾自动报警系统设计规范》 GB 50116 《工业与民用供电系统设计规范》 GB J52-82 《低压配电装置及线路设计规范》 GB J54-83 《电气装置安装工程施工及验收规范》 GB J232-83 《安全防范工程程序与要求》 GA/T75-94 《建筑与建筑群综合布线系统工程设计规范》CECS72：97 《智能建筑设计标准》 EBD-03-95 一、机房建设工程设计与施工要求 1、机房建设工程总体设计要求 机房作为数据存储、传输、设备控制中心，应为计算机和网络系统的可靠运行提供合乎规范的环境条件，在温度、湿度、洁净度、电性能、防火性、承重能力、防静电能力、防漏、防雷、接地等各项指标上均应满足设备要求，设计和施工必须符合国家有关标准、规范、规定，同时也应严格遵守施工地的施工要求，并且参照国际先进规范，建设 一个现代化、规范化的计算机机房。 机房工程的设计与建设应遵循技术先进、布局合理、经济适用、安全可靠、可扩展性等原则。 机房设计总体要求： (1)指标要求
针对数据中心建设标准定义了四个级别： T1数据中心：基本型 T1数据中心可以接受数据业务的计划性和非计划性中断。要求提供计算机配电和冷却系统，但不一定要求高架地板、UPS或者发电机组。如果没有UPS或发电机系统，那么这将是一个单回路系统并将产生多处单点故障。在年度检修和维护时，这类系统将完全宕机，遇紧急状态时宕机的频率会更高，同时操作故障或设备自身故障也会导致系统中断。 T2数据中心：组件冗余 T2数据中心的设备具有组件冗余功能，以减少计划性和非计划性的系统中断。这类数据中心要求提供高架地板，UPS和发电机组，同时设备容量设计应满足N+1备用要求，单路由配送。当重要的电力设备或其他组件需要维护时，可以通过设备切换来实现系统不中断或短时中断。 T3数据中心：在线维护（全冗余系统） T3级别的数据中心允许支撑系统设备任何计划性的动作而不会导致机房设备的任何服务中断。计划性的动作包括规划好的定期的维护、保养、元器件更换、设备扩容或减容、系统或设备测试等等。大型数据中心会安装冷冻水系统，要求双路或环路供水。当其他路由执行维护或测试动作时，必须保证工作路由具有足够的容量和能力支撑系统的正常运行。非计划性动作诸如操作错误，设备自身故障等导致数据
中心中断是可以接受的。当业主有商业需求或有充足的预算追加，T3机房应可以方便升级为T4机房。 T4数据中心：容错系统 T4级别的数据中心要求支撑系统有足够的容量和能力规避任何计划性动作导致的重要负荷停机风险。同时容错功能要求支撑系统有能力避免至少1次非计划性的故障或事件导致的重要负荷停机风险，这要求至少两个实时有效地配送路由，N+N是典型的系统架构。对于电气系统，两个独立的（N+1）UPS是一定要设置的。但根据消防电气规范的规定，火灾时允许消防电力系统强切。T4机房要求所有的机房设备双路容错供电。同时应注意T4机房支撑设备必须与机房IT设备的特性相匹配。 建筑定级 建筑T1级别 对于可能引起数据中心瘫痪的人为地或自然灾害不做任何建筑防护措施；设备区地面活荷载不小于7.2kPa，同时楼面另需满足1.2kPa 的吊挂活荷载。 建筑T2级别 T2机房应满足所有T1机房的要求外应有建筑防护用于避免由于自然灾害或人为破坏造成的机房瘫痪；机房区域的隔墙吊顶应能阻止湿气侵入并破坏机械设备的使用；所有安防门应为金属框实心木门，安防设备间和安保室的门应提供180度全视角观察孔；所有的安防门必须为全高门（由地面到吊顶）；安保设备间及安保室的隔墙必须为硬质
江阴电教馆云数据中心项目方案 目录 1 方案建设思路........................................... 2方案拓扑............................................... 3方案的优势............................................. 可靠性 ............................................ 服务器硬件高可用.............................. 虚拟化集群高可用.............................. 存储系统高可用................................ 数据备份高可用................................ 可扩展性 .......................................... 动态添加虚拟化集群............................ 容灾升级扩展.................................. 降低成本，提高效率和服务水平....................... 简化管理 .......................................... 浪潮云海OS的管理平台ICM概述................. 浪潮ICM管理特性.............................. 浪潮ICM主要功能.............................. 整体架构和管理界面............................ 4方案配置清单........................................... 5公司简介...............................................
数据中心建设项目可行性研究报告
目录 1概述 (4) 1.1项目背景 (4) 1.2项目意义 (4) 2建设目标与任务 (4) 3需求分析 (6) 3.1用户需求 (6) 3.2数据需求 (6) 3.2.1数据资源现状 (6) 3.3系统及应用需求分析 (10) 3.3.1节点管理 (12) 3.3.2主题管理 (12) 3.3.3元数据管理 (12) 3.3.4公共代码管理 (12) 3.3.5数据采集 (13) 3.3.6数据整理比对 (13) 3.3.7数据交换 (13) 3.3.8数据访问 (13) 3.3.9数据备份与恢复 (13) 3.3.10标准管理 (13) 3.3.11应用支持 (14) 3.3.12运行管理 (14) 3.4性能需求分析 (14) 3.4.1业务处理量分析 (14) 3.5安全保障体系需求分析 (16) 3.5.1系统安全可靠性需求 (16) 3.5.2数据安全保密性需求 (17) 3.5.3数据完整性需求 (17) 3.5.4实体的可鉴别性需求 (17) 3.5.5不可否认性需求 (17) 3.5.6对象和行为的可授权性需求 (17) 3.5.7统一信任与授权策略需求 (18) 3.5.8数据中心统一安全监管性需求 (18) 3.6保障机制需求分析 (18) 4数据中心设计方案 (19) 4.1设计原则 (19) 4.1.1统一建设 (19) 4.1.2相对独立 (19) 4.1.3共建共享 (19) 4.1.4安全可靠 (19) 4.2数据中心平台设计 (20) 4.2.1平台总体架构 (20)
4.2.2信息资源 (21) 4.2.3支撑平台 (25) 4.2.4数据共享交换平台 (30) 4.2.5共享数据管理系统 (35) 4.2.6保障机制 (37) 4.2.7标准法规体系 (39) 4.2.8安全保障体系 (39) 4.2.9数据接口系统 (41) 4.2.10运行环境 (42) 4.3数据中心成效应用 (45) 4.3.1综合治税专题共享应用系统 (45) 4.3.2企业基础信息共享系统功能 (48) 4.3.3社会保障信息共享应用 (48) 4.4工程建设分期及规模 (49) 5数据中心预算经费 (49) 5.1总投资概算 (49) 5.2投资概算明细 (50) 6风险分析和控制 (52) 7经济及社会效益 (54)
数据中心建设项目完整实施方案
目录 1.人员组织计划 (5) 1.1 人员配置 (5) 1.1.1 项目组主要人员配备清单 (5) 1.2 设备、材料及检验方法 (6) 1.2.1 设备、材料存放 (6) 1.2.2 设备采购 (6) 1.2.3 设备、材料领用 (6) 1.2.4 设备、材料检验记录 (6) 1.3 机具组织计划 (7) 2.项目管理 (7) 2.1施工条例 (7) 3.质量保证措施 (9) 3.1质量控制原则 (9) 3.1.1 施工准备阶段 (10) 3.1.2施工过程中的质量控制 (10) 3.1.3 施工后的质量控制 (10) 3.2施工项目质量控制具体内容 (11) 3.3 安装工程质量达优的保证措施 (12) 3.4 工期保证措施 (13) 3.4.1．施工工期控制方法 (13) 3.4.2．施工工期安排及保障措施 (13)
4.施工技术 (14) 4.1 施工工序 (14) 4.2系统设备安装 (14) 4.2.1工艺流程 (14) 4.2.2施工要求 (15) 4.3设备安装技术 (15) 4.3.1 HP机柜安装 (15) 4.3.2 SAN交换机安装 (16) 4.3.3 HP服务器安装 (17) 4.3.4 HP存储安装 (22) 4.3.5 整体布局图与光纤链接示意图 (27) 5.质量检查的组织、记录及表格形式 (31) 6.施工进度计划 (34) 6.1. 施工工期计划 (35) 6.2．施工工期控制方法 (35) 6.3．施工工期安排及保障措施 (35) 7. 成品保护措施 (36) 8. 安全施工保证措施 (36) 8.1．安全生产组织管理体系及职责 (36) 8.2．安全防范重点 (37) 8.3．安全措施 (37) 8.4．坚持安全管理六项原则 (38)
竣工资料组成： 1、施工图及说明 2、施工承包合同 3、施工组织设计 4、开工报告 5、设备、材料报审表 6、隐蔽工程检查记录 装修：隐蔽工程检查验收记录 (01-18)/03-02/(04-02/05-16/06-17/08-20/09-01) 电气：隐蔽工程检查验收记录 (01-18/03-02/04-02/05-16)/06-17/(08-20/09-01) 弱电：智能建筑隐蔽工程（随工序检查）验收表07-01 7、施工试验记录：电气接地电阻测试（接地电阻测试记录06-09/(07-09/09-02)）， 8、电气绝缘电阻测试（电缆敷设及绝缘电阻测试记录06-05/(07-05)； 9、电线绝缘电阻测试记录06-06/(07-06/09-03)）， 10、精密空调给水管的试压（管道（设备）强度、严密性试验记录05-02/(08-07)） 11、工程质量检验记录 a检验批质量验收验收记录 装修：活动地板面层检验批质量验收记录030119；木门窗安装分项工程检验批质量验收记录030301；030305；暗龙骨吊顶工程检验批质量验收记录；板材隔墙分项工程检验批质量验收记录030501；骨架隔墙工程检验批质量验收记录030502；玻璃隔墙工程检验批质量验收记录030504；饰面板安装工程检验批质量验收记录030601
电气：成套配电柜、控制柜（屏、台）和动力、照明配电箱（盘）安装检验批质量验收记录（III）；不间断电源安装检验批质量验收记录060603；电缆桥架安装和桥架内电缆敷设检验批质量验收记录060302、060404；电线导管、电缆导管和线槽敷设安装检验批质量验收记录（I）室内060304、060405、060502、060605；电线、电缆穿管和线槽敷线060105，060305，060406，060503，060606；电缆头制作、接线和线路绝缘测试060106，060205，060306，060407，060506，060607；普通灯具安装060507；专用灯具安装060508；开关、插座、风扇安装060408，060510 精密空调：室内给水管道及配件安装工程检验批质量验收记录050101 弱电：综合布线系统安装检验批质量验收记录；综合布线系统性能检测检验批质量验收记录；防雷及接地系统检验批质量验收记录 分项工程质量验收验收记录 12、竣工验收记录 分部工程质量验收验收记录 竣工验收审请报验单 竣工验收报告 竣工图